JPH0829798A - Electronic parts connecting device - Google Patents

Electronic parts connecting device

Info

Publication number
JPH0829798A
JPH0829798A JP16720294A JP16720294A JPH0829798A JP H0829798 A JPH0829798 A JP H0829798A JP 16720294 A JP16720294 A JP 16720294A JP 16720294 A JP16720294 A JP 16720294A JP H0829798 A JPH0829798 A JP H0829798A
Authority
JP
Japan
Prior art keywords
optical system
substrate
semiconductor element
alignment
liquid crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16720294A
Other languages
Japanese (ja)
Other versions
JP3664752B2 (en
Inventor
Osamu Osada
治 長田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP16720294A priority Critical patent/JP3664752B2/en
Publication of JPH0829798A publication Critical patent/JPH0829798A/en
Application granted granted Critical
Publication of JP3664752B2 publication Critical patent/JP3664752B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/303Surface mounted components, e.g. affixing before soldering, aligning means, spacing means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/321Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives

Landscapes

  • Liquid Crystal (AREA)

Abstract

PURPOSE:To provide a connecting device for electronic parts with which a connecting state having high accuracy is always stably obtained without strictly aligning an optical axis of the positioning optical system. CONSTITUTION:An electrode 22 of IC 21 for driving the liquid crystal and a wiring electrode pattern 26 formed on a glass substrate 25 are temporarily aligned each other by an optical system 39 for confirming the connected state. In the state where temporary alignment is executed, the optical axis of an optical system 38 for alignment is adjusted by the optical system 39 for confirming the connected state. The relation of the connected locations can be checked without actually executing the connecting work, thus simplifying the alignment of the optical axis of the optical system 38 for positioning. When a thermocompression bonding is connected by an anisotropic adhesive 27, the positional relation between the electrode 22 and the wiring electrode pattern 26 is confirmed by the optical system 38 for positioning provided on the side opposite to a transparent stage 35 which fixes the glass substrate 25. Even if the misalignment of the optical axis of the optical system 38 for positioning occurs, the execution of the connecting work is achieved while observing the connected parts by the optical system 39 for confirming the connected state.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体素子の電極と基
板の配線電極パターンとの電気的および機械的な接続に
用いられる電子部品の接続装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a connecting device for electronic parts used for electrical and mechanical connection between electrodes of a semiconductor element and wiring electrode patterns of a substrate.

【0002】[0002]

【従来の技術】一般に、半導体素子を基板に実装する電
子部品において、電子部品の実装方法としては、半導体
素子の電極上に形成されたバンプと基板上に形成された
取り出し用の配線電極パターンとを直接接続するフェイ
スボンディング法が知られている。そして、接続材料と
して、異方性接着剤を用いて電気的、機械的に接続する
方法は、低コストで高密度実装を実現する方法として新
たに提案されている。
2. Description of the Related Art Generally, in an electronic component for mounting a semiconductor element on a substrate, a method for mounting the electronic component is to use a bump formed on an electrode of the semiconductor element and a wiring electrode pattern for extraction formed on the substrate. There is known a face bonding method for directly connecting to each other. Then, a method of electrically and mechanically connecting using an anisotropic adhesive as a connecting material has been newly proposed as a method of realizing high-density mounting at low cost.

【0003】この異方性接着剤を用いるものとしては、
たとえば特公昭62−6652号公報に記載され、たと
えば図5に示すように、半導体素子11を基板12上に実装
する場合、半導体素子11を基板12に対して機械的に固着
するとともに、半導体素子11に設けられた電極13を基板
12上に形成された配線電極パターン14に対して電気的に
接続する必要がある。このような場合、半導体素子11の
電極13および基板12の配線電極パターン14間を異方性接
着剤15により一体に結合している。
The one using this anisotropic adhesive is
For example, when the semiconductor element 11 is mounted on a substrate 12 as disclosed in Japanese Patent Publication No. 62-6652, for example, as shown in FIG. 5, the semiconductor element 11 is mechanically fixed to the substrate 12 and the semiconductor element is also mounted. The electrode 13 provided on the substrate 11
It is necessary to electrically connect to the wiring electrode pattern 14 formed on the wiring 12. In such a case, the electrodes 13 of the semiconductor element 11 and the wiring electrode patterns 14 of the substrate 12 are integrally bonded by the anisotropic adhesive 15.

【0004】また、異方性接着剤15は、周知のように、
絶縁性の接着剤16内に導電粒子17を混入分散させたもの
で、厚み方向には導電性を有し、面方向には絶縁性を有
している。そして、半導体素子11と基板12との結合の際
は、この異方性接着剤15を、図示のように半導体素子11
の下面および周辺部全域にわたるように介在させ、電極
13と配線電極パターン14との間は導電粒子17により電気
的に導電接続している。
The anisotropic adhesive 15 is, as is well known,
Conductive particles 17 are mixed and dispersed in an insulating adhesive 16, which has conductivity in the thickness direction and insulation in the surface direction. Then, at the time of bonding the semiconductor element 11 and the substrate 12, the anisotropic adhesive 15 is applied to the semiconductor element 11 as shown in the figure.
The bottom surface of the
The conductive particles 17 electrically connect the 13 and the wiring electrode pattern 14 to each other.

【0005】次に、電気部品の接続工程を図6および図
7を参照して説明する。なお、半導体素子11の電極13に
は確実な接続を得るため、電極13の表面にバンプ19を一
体に設けているが、基本的には図5に示す構成と同様で
ある。
Next, the process of connecting the electric parts will be described with reference to FIGS. 6 and 7. In order to obtain a reliable connection to the electrode 13 of the semiconductor element 11, the bump 19 is integrally provided on the surface of the electrode 13, but it is basically the same as the configuration shown in FIG.

【0006】まず、図6に示すように、半導体素子11の
下面には電極13が形成され、この電極13の表面にはバン
プ19が一体に形成されている。なお、基板12はリジット
またはフレキシブルなもののいずれでもよく、基板12の
表面には、エッチングなどにより配線電極パターン14が
形成されている。
First, as shown in FIG. 6, an electrode 13 is formed on the lower surface of the semiconductor element 11, and a bump 19 is integrally formed on the surface of the electrode 13. The substrate 12 may be either rigid or flexible, and the wiring electrode pattern 14 is formed on the surface of the substrate 12 by etching or the like.

【0007】そして、半導体素子11を基板12上に所定の
位置関係で実装する場合、まず、半導体素子11の上面を
図示しないヘッドにより真空吸着し、基板12を図示しな
いステージ上に設置する。また、半導体素子11および基
板12の間に導電異方性を有する異方性接着剤15を介在さ
せる。なお、この異方性接着剤15は、半導体素子11の外
形寸法より若干大きいサイズに切断したシート状のもの
で、このシート状の異方性接着剤15を基板12上の所定位
置に貼り付ける。また、この異方性接着剤15は粘着性を
持っており、基板12の表面や配線電極パターン14の表面
に密着した状態で貼り付けられる。
When mounting the semiconductor element 11 on the substrate 12 in a predetermined positional relationship, first, the upper surface of the semiconductor element 11 is vacuum-sucked by a head (not shown), and the substrate 12 is placed on a stage (not shown). Further, an anisotropic adhesive 15 having conductive anisotropy is interposed between the semiconductor element 11 and the substrate 12. The anisotropic adhesive 15 is a sheet-shaped one cut into a size slightly larger than the outer dimensions of the semiconductor element 11, and the sheet-shaped anisotropic adhesive 15 is attached to a predetermined position on the substrate 12. . The anisotropic adhesive 15 has adhesiveness and is attached in a state of being in close contact with the surface of the substrate 12 or the surface of the wiring electrode pattern 14.

【0008】次に、これら半導体素子11と基板12との対
向面間に図示しない光学系を挿入し、これら対向面の画
像をそれぞれ取り込む。そして、これら半導体素子11お
よび基板12の画像により、半導体素子11の電極13と基板
12上の配線電極パターン14との相互位置を検出し、これ
ら半導体素子11の電極13および基板12の配線電極パター
ン14が所定の接続関係となるように、図示しないステー
ジをX−Y−θ方向に補正して位置合わせする。
Next, an optical system (not shown) is inserted between the facing surfaces of the semiconductor element 11 and the substrate 12, and the images of these facing surfaces are captured. Then, based on the images of the semiconductor element 11 and the substrate 12, the electrode 13 of the semiconductor element 11 and the substrate
The mutual position with the wiring electrode pattern 14 on the wiring 12 is detected, and a stage (not shown) is moved in the XY-θ direction so that the electrode 13 of the semiconductor element 11 and the wiring electrode pattern 14 of the substrate 12 have a predetermined connection relationship. Correct and align.

【0009】そして、位置合わせの完了後には、光学系
を対向面間から退去させ、図示しないヘッドに固着され
た半導体素子11を異方性接着剤15を介して基板12上に圧
着させる。そして、ヘッドにより半導体素子11の図示上
面側から加熱し、加圧する。この加熱・加圧により、異
方性接着剤15の絶縁性の接着剤16が溶融し、図7で示す
ように半導体素子11と基板12との間を接着し、電極13と
配線電極パターン14との間を導電粒子17により電気的に
導電接続する。その後、加熱を解除することにより接着
剤16が硬化して一体化される。
After the alignment is completed, the optical system is withdrawn from between the facing surfaces, and the semiconductor element 11 fixed to the head (not shown) is pressure-bonded onto the substrate 12 via the anisotropic adhesive 15. Then, the head is heated and pressed from the upper surface side of the semiconductor element 11 in the drawing. By this heating and pressurization, the insulating adhesive 16 of the anisotropic adhesive 15 is melted and the semiconductor element 11 and the substrate 12 are bonded to each other as shown in FIG. And conductive particles 17 are electrically connected. After that, by releasing the heating, the adhesive 16 is cured and integrated.

【0010】ところで、このような半導体素子11やこの
半導体素子11を支持する基板12からなる電子部品では、
回路構成が高密度化して、電極13や配線電極パターン14
は微細化されいる。このように微細化された多くの電極
同士を接続するためには、位置合わせ用の光学系の光軸
を厳密に合わせる必要がある。また、光学系を必要とす
るのは、半導体素子11と基板12との位置合わせの際に、
光学系を半導体素子11および基板12の背面に位置して観
察することが困難なためである。すなわち、半導体素子
11は光不透過であり、基板12には異方性接着剤15が設け
られているためこの異方性接着剤15が光を乱反射するた
めである。
By the way, in such an electronic component including the semiconductor element 11 and the substrate 12 supporting the semiconductor element 11,
The circuit structure has been densified, and the electrodes 13 and wiring electrode patterns 14
Is miniaturized. In order to connect many miniaturized electrodes to each other, it is necessary to align the optical axis of the alignment optical system exactly. Further, an optical system is required when aligning the semiconductor element 11 and the substrate 12,
This is because it is difficult to observe the optical system at the back surface of the semiconductor element 11 and the substrate 12. That is, the semiconductor element
This is because 11 is non-transparent and the anisotropic adhesive 15 diffusely reflects light because the substrate 12 is provided with the anisotropic adhesive 15.

【0011】そして、この光学系を用いた位置合わせと
しては、図示しない光学系を半導体素子11および基板12
の間に挿入し、半導体素子11および基板12の電極の位置
合わせを行ない、半導体素子11および基板12の位置から
光学系を後退させて、電極間を接続させている。
For alignment using this optical system, an optical system (not shown) is used for the semiconductor element 11 and the substrate 12.
The electrodes of the semiconductor element 11 and the substrate 12 are aligned with each other, the optical system is retracted from the positions of the semiconductor element 11 and the substrate 12, and the electrodes are connected.

【0012】ところで、この光学系はこの光学系の上側
および下側のいずれの電極をも同時に観察しなければな
らないため、ミラーなどが必要になり、このミラーの角
度がずれることにより正確な位置合わせが困難になる。
すなわち、光軸がずれていると、この光学系により取り
込まれた画像により位置合わせしても、実際の位置関係
にずれが生じてしまうためである。
By the way, since this optical system must observe both the upper and lower electrodes of this optical system at the same time, a mirror or the like is required, and an accurate alignment can be achieved by shifting the angle of the mirror. Becomes difficult.
That is, if the optical axis is deviated, the actual positional relationship will be deviated even if the image is taken in by the optical system for alignment.

【0013】そして、光学系の光軸を合わせるために
は、実際に接続試料を作成し、精度を評価しては光軸を
微調整するという試行錯誤を繰り返し行なわざるを得な
かった。また、接続時にずれが生じた場合には、評価す
ることができなかった。さらに、光学系の光軸にずれが
生じても、実際の接続部を観察しないと、光軸のずれの
発生が分からない。
In order to align the optical axis of the optical system, it was necessary to repeat trial and error in which a connection sample was actually prepared, the accuracy was evaluated, and the optical axis was finely adjusted. In addition, it was not possible to evaluate when there was a deviation at the time of connection. Further, even if the optical axis of the optical system is deviated, the occurrence of the optical axis deviation cannot be recognized unless the actual connection portion is observed.

【0014】[0014]

【発明が解決しようとする課題】このように、従来の電
子部品の接続装置では、位置合わせ用の光学系の光軸を
厳密に合わせる必要があり、また、接続時にずれが生じ
た場合、その評価ができず、さらに、光軸にずれが生じ
てもその発生が分からないという問題を有している。
As described above, in the conventional connecting device for electronic parts, it is necessary to precisely align the optical axis of the optical system for alignment, and if a deviation occurs during connection, There is a problem that the evaluation cannot be performed and, even if the optical axis is deviated, the occurrence is not known.

【0015】本発明の目的は、位置合わせ用の光学系の
光軸を厳密に合わせることなく、高精度の接続状態を常
に安定して得ることができる電子部品の接続装置を提供
することにある。
An object of the present invention is to provide a connecting device for electronic parts, which can always obtain a highly accurate connection state stably without strictly aligning the optical axis of an optical system for alignment. .

【0016】[0016]

【課題を解決するための手段】本発明は、半導体素子と
この半導体素子の電極に対応する配線電極パターンが形
成された基板との間に位置合わせ用の光学系を挿入し、
この位置合わせ用の光学系により前記半導体素子および
前記基板の画像を取り込み、これら両画像に基づいて前
記半導体素子と前記基板とを位置合わせし、これら半導
体素子および基板の相互を熱圧着接続する電子部品の接
続装置において、前記基板を一面に固定する透明なステ
ージと、前記基板の配線電極パターンおよび前記半導体
素子の電極の位置関係をとらえる光学系とを具備したも
のである。
According to the present invention, an alignment optical system is inserted between a semiconductor element and a substrate on which a wiring electrode pattern corresponding to an electrode of the semiconductor element is formed,
An electron for capturing the images of the semiconductor element and the substrate by the alignment optical system, aligning the semiconductor element and the substrate on the basis of these images, and thermocompression-bonding the semiconductor element and the substrate to each other. A component connecting device includes a transparent stage for fixing the substrate on one surface, and an optical system for capturing a positional relationship between a wiring electrode pattern of the substrate and electrodes of the semiconductor element.

【0017】[0017]

【作用】本発明は、半導体素子の電極と基板上に形成さ
れた配線電極パターンとを互いに位置合わせし、異方性
接着剤により熱圧着を接続する際に、基板を固定した透
明なステージの反対面側に設けた接続状態確認用の光学
系により、電極と配線電極パターンとの位置関係を確認
し、実際の接続を行なうことなく接続位置の関係を見る
ことができ、半導体素子および基板間に挿入する位置合
わせ用の光学系の光軸合わせを簡便にすることができ
る。また、状態を観察しながら接続できるので、ずれが
発生した場合の評価が可能になり、位置合わせ用の光学
系の光軸にずれが生じた場合でも、接続状態確認用の光
学系で位置合わせ用の光学系の光軸を調整して接続でき
るので、高精度の接続を常に安定する。
According to the present invention, when the electrodes of the semiconductor element and the wiring electrode patterns formed on the substrate are aligned with each other and the thermocompression bonding is performed using the anisotropic adhesive, the transparent stage on which the substrate is fixed is used. The optical system for checking the connection status provided on the opposite surface side allows you to check the positional relationship between the electrodes and the wiring electrode pattern, and to see the relationship of the connecting positions without making actual connections. It is possible to simplify the optical axis alignment of the optical system for alignment that is inserted into the. Also, since you can connect while observing the state, it is possible to evaluate when deviation occurs, and even if there is a deviation in the optical axis of the alignment optical system, you can use the optical system for checking the connection state to perform alignment. Since the optical axis of the optical system can be adjusted and connected, high-precision connection is always stable.

【0018】[0018]

【実施例】以下、本発明の電子部品の接続装置の一実施
例を図面に示す液晶表示装置の製造装置を参照して説明
する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of an electronic component connecting device according to the present invention will be described below with reference to a liquid crystal display manufacturing apparatus shown in the drawings.

【0019】図1に示すように、半導体素子としての液
晶駆動用IC21は出力数を120とし、大きさはおよそ
2mm×10mm程度とする。そして、液晶駆動用IC
21の一面である下面には、アルミニウム(Al)による
電極22と、液晶駆動用IC21の表面保護層であるパッシ
ベーション膜23とが形成され、電極22の表面には図示し
ていないが、たとえばチタン(Ti)、ニッケル(N
i)および金(Au)を順次形成したバリアメタル層が
形成されている。そして、このバリアメタル層の表面に
は金によるバンプ24がメッキ法などにより形成され、こ
のバンプ24としては、高さ22μm、面積50μmのも
のを用い、接続ピッチは80μmとする。また、このバ
ンプ24が設けられた面の他の表面部分は、前述のように
パッシベーション膜23で覆われているが、このパッシベ
ーション膜23は窒化シリコンなどからなる。
As shown in FIG. 1, the liquid crystal driving IC 21 as a semiconductor element has 120 outputs and a size of about 2 mm × 10 mm. And a liquid crystal driving IC
An electrode 22 made of aluminum (Al) and a passivation film 23 which is a surface protection layer of the liquid crystal driving IC 21 are formed on the lower surface which is one surface of the electrode 21. (Ti), nickel (N
A barrier metal layer in which i) and gold (Au) are sequentially formed is formed. Then, a bump 24 made of gold is formed on the surface of the barrier metal layer by a plating method or the like. The bump 24 has a height of 22 μm and an area of 50 μm, and the connection pitch is 80 μm. The other surface portion of the surface provided with the bumps 24 is covered with the passivation film 23 as described above, and the passivation film 23 is made of silicon nitride or the like.

【0020】一方、ガラス基板25は、液晶表示装置の主
な構成要素で、ガラス基板25の一面となる上面には配線
電極パターン26がエッチングなどによって形成されてい
る。また、この配線電極パターン26は、液晶駆動用IC
21の電極22と導電接続されるもので、ガラス基板25上の
所定位置に形成される。
On the other hand, the glass substrate 25 is a main component of the liquid crystal display device, and the wiring electrode pattern 26 is formed on the upper surface which is one surface of the glass substrate 25 by etching or the like. The wiring electrode pattern 26 is a liquid crystal driving IC.
It is electrically conductively connected to the electrode 22 of 21 and is formed at a predetermined position on the glass substrate 25.

【0021】また、異方性接着剤27は、図2に示すよう
にシート状をなしており、液晶駆動用IC21の図示下面
よりやや大きな面積に形成されている。また、この異方
性接着剤27は粘着性を持っており、図3に示すように、
ガラス基板25上の所定位置、すなわち、液晶駆動用IC
21の実装位置に貼り付けられる。なお、異方性接着剤27
はエポキシ系の熱硬化性樹脂の接着剤28をベースとした
もので、175℃を約30秒間保持することにより硬化
が進む特性を有する。また、この接着剤28中の導電粒子
29には、金属膜をコートしたプラスチックボールを用い
ている。
The anisotropic adhesive 27 is in the form of a sheet as shown in FIG. 2, and is formed in an area slightly larger than the lower surface of the liquid crystal driving IC 21 shown in the drawing. Further, this anisotropic adhesive 27 has tackiness, and as shown in FIG.
A predetermined position on the glass substrate 25, that is, a liquid crystal driving IC
Attached to 21 mounting positions. Anisotropic adhesive 27
Is based on an epoxy-based thermosetting resin adhesive 28, and has a characteristic that curing proceeds by holding 175 ° C. for about 30 seconds. Also, the conductive particles in this adhesive 28
For 29, a plastic ball coated with a metal film is used.

【0022】また、35は自動ボンディング装置のステー
ジで、このステージ35の上部の所定位置には、ガラス基
板25が載支される。そして、このステージ35は、図示し
ない駆動機構によりX−Y−θの各方向に補正可能に構
成されており、ガラスなどにより作られた透明なもので
ある。
Further, 35 is a stage of an automatic bonding apparatus, and a glass substrate 25 is mounted on a predetermined position above the stage 35. The stage 35 is made of glass or the like and is transparent so that it can be corrected in each direction of XY-θ by a drive mechanism (not shown).

【0023】さらに、36は支持ヘッドで、この支持ヘッ
ド36は液晶駆動用IC21の上面部を真空吸着により保持
し、この液晶駆動用IC21を、ガラス基板25上に加圧す
る機能を有する。また、この支持ヘッド36は、液晶駆動
用IC21を所定温度に加熱する機能をも有する。
Further, 36 is a supporting head, and this supporting head 36 has a function of holding the upper surface of the liquid crystal driving IC 21 by vacuum suction and pressing the liquid crystal driving IC 21 onto the glass substrate 25. The support head 36 also has a function of heating the liquid crystal driving IC 21 to a predetermined temperature.

【0024】さらに、38は位置合わせ用の光学系で、こ
の位置合わせ用の光学系38は支持ヘッド36に支持された
液晶駆動用IC21とステージ35上に載支されたガラス基
板25との間に挿入され、これら互いに対向する接続面の
画像をそれぞれ取り込む。そして、これら画像は、接続
面相互のずれ検出に用いられるもので、これらずれ量お
よびその方向は、駆動機構に対して、ステージ35をX−
Y−θの各方向に補正するための制御指令となる。
Further, 38 is an optical system for alignment, and this optical system 38 for alignment is between the liquid crystal driving IC 21 supported by the support head 36 and the glass substrate 25 mounted on the stage 35. Images of the connection surfaces facing each other are captured. Then, these images are used for detecting the displacement between the connecting surfaces, and the displacement amount and the direction thereof are determined by the X-direction of the stage 35 with respect to the drive mechanism.
It becomes a control command for correction in each direction of Y-θ.

【0025】一方、39は接続状態確認用の光学系で、こ
の接続状態確認用の光学系39はステージ35のガラス基板
25の載支面に対する反対面側に設けられ、透明なステー
ジ35を介して、ガラス基板25と液晶駆動用IC21との接
続状態の画像をとらえる。
On the other hand, 39 is an optical system for checking the connection state, and this optical system 39 for checking the connection state is the glass substrate of the stage 35.
An image of the connection state between the glass substrate 25 and the liquid crystal driving IC 21 is captured via the transparent stage 35 provided on the side opposite to the mounting and supporting surface of 25.

【0026】次に、上記実施例の動作について説明す
る。
Next, the operation of the above embodiment will be described.

【0027】まず、ガラス基板25および液晶駆動用IC
21の間に位置合わせ用の光学系38を挿入しない状態で、
液晶駆動用IC21をガラス基板25方向に向けて下降さ
せ、ガラス基板25および液晶駆動用IC21の電極を近付
けた状態で、接続状態確認用の光学系39で確認しなが
ら、ガラス基板25および液晶駆動用IC21の仮合わせを
行なう。なお、液晶駆動用IC21は、図示しないIC供
給部に予めセットされており、このIC供給部から支持
ヘッド36に供給され、支持ヘッド36は液晶駆動用IC21
を真空吸着して図示状態に保持する。また、ガラス基板
25はステージ35上の所定位置に載支されている。なお、
仮合わせに際しては、異方性接着剤27がガラス基板25に
貼着されていない状態の方が光の散乱が小さいため、確
認が容易にできる。
First, the glass substrate 25 and the liquid crystal driving IC
In the state that the alignment optical system 38 is not inserted between 21,
While the liquid crystal driving IC 21 is lowered toward the glass substrate 25 and the electrodes of the glass substrate 25 and the liquid crystal driving IC 21 are brought close to each other, the glass substrate 25 and the liquid crystal driving are driven while checking with the optical system 39 for checking the connection state. Temporarily align the IC21 for use. The liquid crystal driving IC 21 is preset in an IC supply unit (not shown) and is supplied to the support head 36 from the IC supply unit.
Is vacuum-adsorbed and held in the illustrated state. Also, glass substrate
25 is mounted at a predetermined position on the stage 35. In addition,
At the time of temporary alignment, since the scattering of light is smaller when the anisotropic adhesive 27 is not attached to the glass substrate 25, the confirmation can be easily performed.

【0028】そして、仮合わせ終了後に液晶駆動用IC
21を上昇させ、液晶駆動用IC21とガラス基板25との対
向面間に、図示のように位置合わせ用の光学系38を挿入
する。仮合わせされた液晶駆動用IC21の電極およびガ
ラス基板25の電極の位置に基づき、挿入された位置合わ
せ用の光学系38の光軸を調整し、初期調整が終了する。
After the temporary alignment is completed, the liquid crystal driving IC
21 is raised, and an optical system 38 for alignment is inserted between the facing surfaces of the liquid crystal driving IC 21 and the glass substrate 25 as shown in the figure. The optical axis of the inserted alignment optical system 38 is adjusted based on the positions of the electrodes of the liquid crystal driving IC 21 and the glass substrate 25 that have been provisionally aligned, and the initial adjustment is completed.

【0029】実際の実装に際しては、液晶駆動用IC21
が実装される所定位置には、シート状の液晶駆動用IC
21の実装面よりやや大きな面積の異方性接着剤27が貼り
付けられたガラス基板25をステージ35上の所定位置に載
支する。
At the time of actual mounting, the liquid crystal driving IC 21
A sheet-shaped liquid crystal driving IC is placed at a predetermined position where
A glass substrate 25 to which an anisotropic adhesive 27 having an area slightly larger than the mounting surface of 21 is attached is mounted at a predetermined position on a stage 35.

【0030】そして、初期調整により光軸が調整された
位置合わせ用の光学系38で、電極22が形成された液晶駆
動用IC21の接合面の画像と、配線電極パターン26が形
成されたガラス基板25の実装面の画像とをそれぞれとら
える。また、図示しない制御装置は、これら2つの画像
から互いに導電接続される電極22と配線電極パターン26
との位置ずれを検出する。この検出された位置ずれは、
図示しない駆動機構によりステージ35をX−Y−θ方向
に駆動することにより補正され、位置合わせが完了す
る。
Then, in the alignment optical system 38 whose optical axis is adjusted by the initial adjustment, an image of the bonding surface of the liquid crystal driving IC 21 on which the electrode 22 is formed and the glass substrate on which the wiring electrode pattern 26 is formed The images of 25 mounting surfaces are captured respectively. In addition, the control device (not shown) uses an electrode 22 and a wiring electrode pattern 26 that are conductively connected to each other from these two images.
The positional deviation between and is detected. This detected displacement is
It is corrected by driving the stage 35 in the XY-θ directions by a drive mechanism (not shown), and the alignment is completed.

【0031】上述のようにして位置合わせが完了する
と、位置合わせ用の光学系38は液晶駆動用IC21とガラ
ス基板25との対向面間から退去する。
When the alignment is completed as described above, the alignment optical system 38 retreats from between the facing surfaces of the liquid crystal driving IC 21 and the glass substrate 25.

【0032】次に、液晶駆動用IC21を保持した支持ヘ
ッド36が下降し、この液晶駆動用IC21を反接合面であ
る上面側からガラス基板25上に約9kgで加圧し、17
5℃で加熱しながら約30秒間保持する。なお、このと
きステージ35は約60℃に加熱されており、ガラス基板
25も裏側から加熱されている。
Next, the supporting head 36 holding the liquid crystal driving IC 21 descends, and the liquid crystal driving IC 21 is pressed against the glass substrate 25 from the upper surface side which is the non-bonding surface by about 9 kg, and 17
Hold for about 30 seconds while heating at 5 ° C. At this time, the stage 35 is heated to about 60 ° C.
25 is also heated from the back side.

【0033】そして、この加圧、加熱操作により、異方
性接着剤27は溶融硬化し、液晶駆動用IC21側の電極22
に形成されたバンプ24とガラス基板25側の配線電極パタ
ーン26とは、図4で示すように、異方性接着剤27の導電
粒子29により導電接続される。また、熱硬化性樹脂をベ
ースとした接着剤28は175℃の加熱により硬化し始
め、この状態を30秒間保持することにより硬化が進
み、液晶駆動用IC21のパッシベーション膜23やガラス
基板25の表面に強固に密着し、液晶駆動用IC21の全体
をガラス基板25上に強固に実装する。この後、支持ヘッ
ド36を液晶駆動用IC21から取り外すことにより実装工
程が終了する。
By this pressurization and heating operation, the anisotropic adhesive 27 is melted and hardened, and the electrode 22 on the liquid crystal driving IC 21 side is formed.
As shown in FIG. 4, the bumps 24 and the wiring electrode patterns 26 on the glass substrate 25 side are conductively connected by the conductive particles 29 of the anisotropic adhesive 27. Further, the thermosetting resin-based adhesive agent 28 starts to cure by heating at 175 ° C., and the curing proceeds by holding this state for 30 seconds, and the surface of the passivation film 23 of the liquid crystal driving IC 21 and the surface of the glass substrate 25. Then, the entire liquid crystal driving IC 21 is firmly mounted on the glass substrate 25. After that, the mounting process is completed by removing the support head 36 from the liquid crystal driving IC 21.

【0034】このように、実装工程を繰り返し、工程中
に位置合わせ用の光学系38の光軸がずれた場合には、初
期設定をやり直した後に、再度実装工程に移る。
In this way, when the mounting process is repeated and the optical axis of the alignment optical system 38 is deviated during the process, the initial setting is performed again, and then the mounting process is performed again.

【0035】また、上述した接続時の状態は、ステージ
35の反対側に設けられた接続状態確認用の光学系39によ
り、ステージ35を通して観察できる。また、接続後にお
けるガラス基板25と液晶駆動用IC21の電極22との位置
関係を確認することもできる。
Further, the above-mentioned state at the time of connection is the stage.
An optical system 39 for confirming the connection state provided on the opposite side of 35 allows observation through the stage 35. Further, the positional relationship between the glass substrate 25 and the electrode 22 of the liquid crystal driving IC 21 after connection can be confirmed.

【0036】このように、ステージ35の反対側に接続状
態確認用の光学系39を設けたので、透明なステージ35を
通してガラス基板25とこのガラス基板25に実装される液
晶駆動用IC21との相互関係をとらえることができる。
このため、実際の接続を行なうことなくガラス基板25と
液晶駆動用IC21の両者の接続位置関係を見極めること
ができ、位置合わせ用の光学系38の光軸合わせを簡便に
することができる。また、接続状態を監視しながら接続
作業を行なうこともできるので、ずれが発生した場合の
評価を行なえるとともに、このずれを解消するべく操作
できるので、高精度の接続状態を常に安定して得ること
が可能となる。
Since the optical system 39 for confirming the connection state is provided on the opposite side of the stage 35 as described above, the glass substrate 25 and the liquid crystal driving IC 21 mounted on the glass substrate 25 are mutually connected through the transparent stage 35. You can capture the relationship.
Therefore, the connection positional relationship between the glass substrate 25 and the liquid crystal driving IC 21 can be determined without making an actual connection, and the optical axis alignment of the alignment optical system 38 can be simplified. Also, since the connection work can be performed while monitoring the connection state, it is possible to evaluate when deviation occurs and the operation can be performed to eliminate this deviation, so that a highly accurate connection state can always be obtained stably. It becomes possible.

【0037】なお、上記実施例に限定されるものではな
く、たとえば支持ヘッド36による加圧中に加熱を取り止
め、支持ヘッド36および液晶駆動用IC21を冷却して加
圧工程を終了させてもよい。
It should be noted that the present invention is not limited to the above embodiment. For example, heating may be stopped during pressurization by the support head 36, the support head 36 and the liquid crystal driving IC 21 may be cooled, and the pressurization step may be ended. .

【0038】また、液晶駆動用IC21とガラス基板25と
の位置合わせは、ガラス基板25を載支するステージ35を
X−Y−θ方向に駆動することによって行なっている
が、相対的なものであり、反対に液晶駆動用IC21を保
持した支持ヘッド36を同方向に駆動したり、あるいは、
それぞれを互いに駆動したりして補正を行なってもよ
い。
The alignment of the liquid crystal driving IC 21 and the glass substrate 25 is performed by driving the stage 35, which supports the glass substrate 25, in the XY-θ directions, but it is relative. Yes, on the contrary, the support head 36 holding the liquid crystal driving IC 21 is driven in the same direction, or
The corrections may be performed by driving each other.

【0039】さらに、図1で示すように、支持ヘッド36
に保持された液晶駆動用IC21とステージ35上のガラス
基板25との対向面間に挿入される位置合わせ用の光学系
38としては、たとえばCCDカメラのようなものでもよ
く、あるいは、ハーフミラーやプリズムなどのような光
路を構成するものを挿入し、外部に設けた撮像カメラま
で画像を導出するものでもよい。
Further, as shown in FIG.
Positioning optical system to be inserted between the facing surfaces of the liquid crystal driving IC 21 held on the substrate and the glass substrate 25 on the stage 35.
38 may be, for example, a CCD camera, or may be one in which an optical path such as a half mirror or a prism is inserted and the image is led to an externally provided imaging camera.

【0040】なお、上記実施例は、液晶表示装置での実
装について説明したが、もちろん液晶表示装置に限定さ
れるものではなく、ICなどの半導体素子を基板上に実
装する電子部品の全てに適用可能である。
Although the above embodiment has been described with respect to mounting on a liquid crystal display device, the present invention is not limited to the liquid crystal display device, and is applied to all electronic components for mounting a semiconductor element such as an IC on a substrate. It is possible.

【0041】[0041]

【発明の効果】本発明の電子部品の接続装置によれば、
半導体素子の電極と基板上に形成された配線電極パター
ンとを互いに位置合わせし、異方性接着剤により熱圧着
を接続する際に、基板を固定した透明なステージの反対
面側に設けた接続状態確認用の光学系により、電極と配
線電極パターンとの位置関係を確認できるので、実際の
接続を行なうことなく接続位置の関係を見ることがで
き、位置合わせ用の光学系の光軸合わせを簡便化でき
る。また、状態を観察しながらの接続もできるので、ず
れが発生した場合の評価が可能になり、位置合わせ用の
光学系の光軸にずれが生じた場合でも、接続部の観察を
行ないつつの接続もできるので、高精度の接続状態で常
に安定ができる。
According to the connecting device for electronic parts of the present invention,
When the electrodes of the semiconductor element and the wiring electrode pattern formed on the substrate are aligned with each other and the thermocompression bonding is performed using an anisotropic adhesive, the connection is provided on the opposite surface side of the transparent stage on which the substrate is fixed. The optical system for checking the status allows you to check the positional relationship between the electrodes and the wiring electrode pattern, so you can see the relationship of the connection positions without making actual connections, and adjust the optical axis of the optical system for positioning. Can be simplified. Also, since the connection can be performed while observing the state, it is possible to evaluate when a deviation occurs, and even when the optical axis of the alignment optical system is deviated, the connection part can be observed. Since it can be connected, it can always be stable in a highly accurate connection state.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明による電子部品の接続装置の一実施例の
全体を示す側面図である。
FIG. 1 is a side view showing an entire embodiment of an electronic component connecting device according to the present invention.

【図2】同上図1で示した基板と異方性接着剤との関係
の貼り付け前の状態を示す側面図である。
FIG. 2 is a side view showing a state before attachment of the relationship between the substrate and the anisotropic adhesive shown in FIG. 1 above.

【図3】同上図1で示した基板と異方性接着剤との関係
の貼り付け後の状態を示す側面図である。
FIG. 3 is a side view showing a state after attachment of the relationship between the substrate and the anisotropic adhesive shown in FIG. 1 above.

【図4】同上電子部品の接続状態を示す側面図である。FIG. 4 is a side view showing a connection state of the electronic components of the above.

【図5】同上異方性接着剤を用いた一般的な接続状態を
示す側面図である。
FIG. 5 is a side view showing a general connection state using the same anisotropic adhesive.

【図6】同上異方性接着剤により半導体素子と基板とを
接続する場合の接着前の状態を示す側面図である。
FIG. 6 is a side view showing a state before bonding when the semiconductor element and the substrate are connected by an anisotropic adhesive.

【図7】同上異方性接着剤により半導体素子と基板とを
接続する場合の接着後の状態を示す側面図である。
FIG. 7 is a side view showing a state after bonding when a semiconductor element and a substrate are connected by an anisotropic adhesive.

【符号の説明】[Explanation of symbols]

21 半導体素子としての液晶駆動用IC 22 電極 25 ガラス基板 26 配線電極パターン 35 ステージ 38 位置合わせ用の光学系 39 接続状態確認用の光学系 21 Liquid crystal driving IC as semiconductor element 22 Electrode 25 Glass substrate 26 Wiring electrode pattern 35 Stage 38 Optical system for alignment 39 Optical system for checking connection status

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 半導体素子とこの半導体素子の電極に対
応する配線電極パターンが形成された基板との間に位置
合わせ用の光学系を挿入し、この位置合わせ用の光学系
により前記半導体素子および前記基板の画像を取り込
み、これら両画像に基づいて前記半導体素子と前記基板
とを位置合わせし、これら半導体素子および基板の相互
を熱圧着接続する電子部品の接続装置において、 前記基板を一面に固定する透明なステージと、 前記基板の配線電極パターンおよび前記半導体素子の電
極の位置関係をとらえる接続状態確認用の光学系とを具
備したことを特徴とする電子部品の接続装置。
1. An alignment optical system is inserted between a semiconductor element and a substrate on which a wiring electrode pattern corresponding to an electrode of the semiconductor element is formed, and the alignment optical system is used to insert the semiconductor element and the semiconductor element. In an electronic component connection device for capturing an image of the substrate, aligning the semiconductor element and the substrate based on these images, and thermocompression-bonding the semiconductor element and the substrate to each other, the substrate is fixed on one surface. And a transparent stage, and an optical system for confirming a connection state for grasping a positional relationship between the wiring electrode pattern of the substrate and the electrodes of the semiconductor element.
JP16720294A 1994-07-19 1994-07-19 How to connect electronic components Expired - Fee Related JP3664752B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16720294A JP3664752B2 (en) 1994-07-19 1994-07-19 How to connect electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16720294A JP3664752B2 (en) 1994-07-19 1994-07-19 How to connect electronic components

Publications (2)

Publication Number Publication Date
JPH0829798A true JPH0829798A (en) 1996-02-02
JP3664752B2 JP3664752B2 (en) 2005-06-29

Family

ID=15845322

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16720294A Expired - Fee Related JP3664752B2 (en) 1994-07-19 1994-07-19 How to connect electronic components

Country Status (1)

Country Link
JP (1) JP3664752B2 (en)

Also Published As

Publication number Publication date
JP3664752B2 (en) 2005-06-29

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