JPH0824109B2 - Quartz glass wafer boat transfer jig - Google Patents

Quartz glass wafer boat transfer jig

Info

Publication number
JPH0824109B2
JPH0824109B2 JP61203149A JP20314986A JPH0824109B2 JP H0824109 B2 JPH0824109 B2 JP H0824109B2 JP 61203149 A JP61203149 A JP 61203149A JP 20314986 A JP20314986 A JP 20314986A JP H0824109 B2 JPH0824109 B2 JP H0824109B2
Authority
JP
Japan
Prior art keywords
jig
quartz glass
wafer boat
transparent
semi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP61203149A
Other languages
Japanese (ja)
Other versions
JPS6358822A (en
Inventor
恭一 稲木
博至 木村
一雄 中村
克彦 剣持
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Quartz Products Co Ltd
Original Assignee
Shin Etsu Quartz Products Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Quartz Products Co Ltd filed Critical Shin Etsu Quartz Products Co Ltd
Priority to JP61203149A priority Critical patent/JPH0824109B2/en
Priority to KR1019870001655A priority patent/KR900003252B1/en
Publication of JPS6358822A publication Critical patent/JPS6358822A/en
Publication of JPH0824109B2 publication Critical patent/JPH0824109B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、横型炉用石英ガラス製ウエーハボート搬送
治具の改良に関し、特に、端縁保持部の昇温を効果的に
抑制した実用性の優れたウエーハボート搬送治具に関す
るものである。
Description: TECHNICAL FIELD The present invention relates to improvement of a quartz glass wafer boat transport jig for a horizontal furnace, and in particular, practicality of effectively suppressing a temperature rise of an edge holding portion. The present invention relates to an excellent wafer boat transfer jig.

〔従来の技術〕[Conventional technology]

横型炉内にウエーハボートを搬送する石英ガラス製ウ
エーハボート搬送治具は、半導体ウエーハボートの多数
を載置した石英ガラスボートを炉内に出し入れする治具
で、炉芯管壁に接触せずに搬送を行うことによってシリ
カパーティクルの発生を防止するための治具である。
A quartz glass wafer boat transport jig for transporting a wafer boat into a horizontal furnace is a jig for loading and unloading a quartz glass boat on which a large number of semiconductor wafer boats are placed, without contacting the core tube wall. It is a jig for preventing the generation of silica particles by carrying.

この操作状態を添付図面により説明する。第5図は、
該搬送治具を炉芯管内に挿入した状態の模式的部分断面
図で、石英ガラス製ウエーハボート搬送治具1は、その
非切欠状円筒部の端縁が駆動装置6の接続金具7に片持
ち状に保持、固定されて軸方向に水平に移動するように
構成され、以下のように使用される。その切欠部分3に
多数のウエーハ4を並列隔置状に積載したウエーハボー
ト5を搭載した治具1は、加熱体8を有する熱処理用電
気炉内の所定温度に加熱された炉芯管9内に挿入され、
搭載ボートを該炉芯管9内に設置したのち、搬送治具1
自身のみが取り出される。半導体ウエーハの炉芯管内で
の所定熱処理が完了すると、搬送治具1は炉芯管9内に
再び挿入されて熱処理ウエーハ4を積載した上記設置ボ
ート5を持ち上げ、これを後退移動により搬出する。
This operation state will be described with reference to the accompanying drawings. Figure 5 shows
FIG. 2 is a schematic partial cross-sectional view showing the state where the carrier jig is inserted into the furnace core tube. In the quartz glass wafer boat carrier jig 1, the end edge of the non-notched cylindrical portion is attached to the connecting fitting 7 of the driving device 6. It is configured to be held and fixed in a cantilever shape and moved horizontally in the axial direction, and is used as follows. A jig 1 having a wafer boat 5 in which a large number of wafers 4 are loaded in parallel in a notched portion 3 is mounted in a furnace core tube 9 heated to a predetermined temperature in an electric furnace for heat treatment having a heating body 8. Inserted in the
After the loading boat is installed in the furnace core tube 9, the transfer jig 1
Only itself is taken out. When the predetermined heat treatment of the semiconductor wafer in the furnace core tube is completed, the transfer jig 1 is reinserted into the furnace core tube 9 and lifts the installation boat 5 loaded with the heat treatment wafer 4 and carries it out by backward movement.

該治具1の駆動部への取付は片持ちであり、一般に複
数の取付接続金具7で強固に固定,保持されるが、それ
らの接続金具と該治具表面との間には、特に図には示さ
れていないが、極めて一般的な常套手段である適切な弾
性と剛性を有する有機材料が介在部材として適用され
る。これらの材料は、比較的耐熱性の優れた有機材料が
使用されるが、搬送治具1を炉芯管9内に挿入した際
に、その保持部が赤外線の輻射熱により高い温度に加熱
されて劣化し易く片持ちを維持できなくなって、搬送治
具が炉芯管をこすってしまうという不利があり、この点
が半導体ウエーハ熱処理における重要な改善課題であっ
た。
The jig 1 is attached to the driving portion by a cantilever, and is generally firmly fixed and held by a plurality of attachment connecting fittings 7. Although not shown in FIG. 1, an organic material having appropriate elasticity and rigidity, which is a very common conventional method, is applied as the interposition member. As these materials, organic materials having relatively high heat resistance are used. However, when the carrying jig 1 is inserted into the furnace core tube 9, its holding portion is heated to a high temperature by radiant heat of infrared rays. It has a disadvantage that it easily deteriorates and cantilever cannot be maintained, and the carrier jig rubs the furnace core tube. This is an important issue to be solved in heat treatment of semiconductor wafers.

この対策として、本発明者らは、上記搬送治具1を全
体的に微細気泡入り半透明石英ガラスで構成させ、赤外
線輻射熱を均一化する試みを行った。しかし、この治具
の保持部の昇温は多少緩和されたが、搬送治具をエッチ
ング洗浄すると表面部の気泡が容易に開泡してその開放
気泡に不純物が取り込まれ、これが炉内を汚染するばか
りでなく、ウエーハボートを高温炉芯管内に挿入すると
き、積載されたウエーハのボート側、すなわち下側部分
の温度が高くなってウエーハ表面の温度分布が不均一と
なり、実用に供し得ないことが判った。
As a countermeasure against this, the present inventors made an attempt to make the infrared radiant heat uniform by configuring the above-mentioned carrying jig 1 entirely by semi-transparent quartz glass containing fine bubbles. However, although the temperature rise in the holding part of this jig was moderated, when the transport jig was cleaned by etching, the bubbles on the surface were easily opened and impurities were taken into the open bubbles, which contaminate the inside of the furnace. Not only that, when the wafer boat is inserted into the high temperature furnace core tube, the temperature of the boat side of the loaded wafers, that is, the lower side temperature becomes high and the temperature distribution on the wafer surface becomes non-uniform, so it cannot be put to practical use. I knew that.

〔発明が解決しようとする課題〕[Problems to be Solved by the Invention]

従って、本発明の課題は、上記のような不利を伴わ
ず、半導体ウエーハ熱処理を長期にわたって安定に行い
得る改善されたウエーハボート搬送治具を提供すること
にある。
SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide an improved wafer boat transfer jig that can stably perform semiconductor wafer heat treatment for a long period of time without the above disadvantages.

〔課題を解決するための手段〕[Means for solving the problem]

本発明者らは、上記課題を解決すべく、特に透明石英
ガラス製搬送治具自体に関して多くの試作研究を重ねた
結果、極めて実用性優れた治具を開発した。
In order to solve the above problems, the inventors of the present invention have developed many jigs, which are extremely practical, as a result of conducting many trials and researches on a transparent quartz glass carrying jig itself.

すなわち、本発明は、横型炉内に半導体ウエーハボー
トを搬送する透明石英ガラス製ウエーハボート搬送治具
において、その治具の搬送入用装置駆動部に取り付けら
れる側の端部に微細気泡入り半透明石英ガラス層を形成
したことを特徴とする横型炉用石英ガラス製ウエーハボ
ート搬送治具を提供する。
That is, the present invention is a transparent quartz glass wafer boat transport jig for transporting a semiconductor wafer boat into a horizontal furnace, in which semi-transparent transparent glass micro-bubbles are attached to the end of the jig that is attached to the transporting device driving unit. Provided is a quartz glass wafer boat transfer jig for a horizontal furnace, wherein a quartz glass layer is formed.

本発明の横型炉用石英ガラス製ウエーハボート搬送治
具は、その駆動装置取付側の端部に微細気泡入り半透明
石英ガラス層を形成させることが重要である。
In the quartz glass wafer boat transport jig for a horizontal furnace of the present invention, it is important to form a semi-transparent quartz glass layer containing fine bubbles at the end portion on the drive device mounting side.

このような微細気泡入り半透明石英ガラス層を形成さ
せると、炉芯管内の加熱域における赤外線は透明ガラス
体内では全反射しながら全体にゆきわたるが、半透明層
に衝突すると散乱,吸収が生じ、その輻射熱により透明
/半透明の炉側境界部が発熱して昇温する。しかし半透
明層においては、大きな温度降下勾配により温度が境界
部から端縁部側方向に急激に低下し、端縁保持部におい
ては充分な温度降下が得られ、その微細気泡入り半透明
石英ガラス層による顕著な遮熱性によって有機系介在緩
衝剤の安定性が大幅に改善されることが確認された。
When such a semi-transparent quartz glass layer containing fine bubbles is formed, the infrared rays in the heating region in the furnace core tube are totally reflected in the transparent glass body and spread to the whole, but when they collide with the semi-transparent layer, scattering and absorption occur, The radiant heat causes the transparent / semi-transparent furnace side boundary portion to generate heat and raise the temperature. However, in the semi-transparent layer, the temperature drops sharply from the boundary to the edge side due to the large temperature drop gradient, and a sufficient temperature drop is obtained in the edge holding part. It was confirmed that the stability of the organic intervening buffer was significantly improved by the remarkable heat shielding property of the layer.

本発明における微細気泡入り半透明石英ガラス層を形
成させる端部は、上記から容易に理解されるように、半
透明層の炉側の境界部が駆動装置の固定保持部より、赤
外線輻射熱の充分な降下が得られる炉側であればよく、
従って本発明において端部とは、このような温度降下が
達成される端部領域を包含する。このような観点から、
治具の駆動装置に取付けられる部分は、半透明でもよい
し透明であってもよい。
As will be easily understood from the above, the end portion forming the semi-transparent quartz glass layer containing fine bubbles in the present invention is such that the boundary portion of the semi-transparent layer on the furnace side has a sufficient infrared radiant heat from the fixed holding portion of the driving device. If it is on the furnace side that can obtain such a descent,
Therefore, in the present invention, the end portion includes the end portion region where such a temperature drop is achieved. From this perspective,
The portion of the jig attached to the driving device may be semitransparent or transparent.

このような微細気泡入り半透明石英ガラス層の気泡
は、例えば径が15〜1000μmの球状もしくは楕円球が好
適で、この範囲より小さいと製造が困難であり、一方大
きいと機械的強度が低下するので好ましくない。
The bubbles of such a semi-transparent quartz glass layer containing fine bubbles are preferably spherical or ellipsoidal spheres having a diameter of 15 to 1000 μm, for example, if it is smaller than this range, it is difficult to manufacture, and if it is large, the mechanical strength decreases. It is not preferable.

本発明の治具は、例えば微細気泡入り半透明石英ガラ
ス管を製造し、これを適当な厚さもしくは長さにカット
したものを治具の取付け側端部に融着一体化することに
より容易に形成させることができる。また、要すれば、
更にその微細気泡入り半透明石英ガラス管の端部に透明
石英ガラスを融着一体化してよい。
The jig of the present invention can be easily manufactured, for example, by producing a semi-transparent quartz glass tube containing fine bubbles, and cutting this into an appropriate thickness or length and fusing and integrating the end on the attachment side of the jig. Can be formed. Also, if necessary,
Further, transparent quartz glass may be fused and integrated with the end portion of the semi-transparent quartz glass tube containing the fine bubbles.

〔作用〕[Action]

本発明のウエーハボート搬送用治具は、これを炉芯管
内に挿入した場合にも、搬送駆動装置の保持固定部が異
常な高温にさらされることがなく、一度取り付けると、
長期にわたって安定に治具を片持ち支持することができ
る。
The wafer boat transportation jig of the present invention, even when it is inserted into the furnace core tube, the holding and fixing portion of the transportation drive device is not exposed to abnormally high temperature, once attached,
The jig can be supported in a cantilever manner over a long period of time.

次に、添付図面により、本発明の治具を更に詳細に説
明する。
Next, the jig of the present invention will be described in more detail with reference to the accompanying drawings.

第1図は、本発明の治具の一例の使用状態を示す模式
図、第2図は、その治具の取付け端部の拡大斜視図であ
る。また、第3図の図(a),図(b)は、本発明の持
ち上げ式治具(フォーク)の微細気泡入り半透明石英ガ
ラス層の異なる形成箇所を示す側面図であり、第4図の
図(a)〜(d)は、本発明の治具の上持ち式治具(フ
ォーク)の異なる例の斜視図である。
FIG. 1 is a schematic diagram showing a usage state of an example of a jig of the present invention, and FIG. 2 is an enlarged perspective view of a mounting end portion of the jig. 3 (a) and 3 (b) are side views showing different locations of the semi-transparent quartz glass layer containing fine bubbles in the lifting jig (fork) of the present invention, and FIG. (A) to (d) are perspective views of different examples of the jig (fork) of the jig of the present invention.

図において、石英ガラス製の搬送治具1は、その端部
に微細気泡入り半透明石英ガラス層2が一体形成され、
その端縁部が駆動部材6の接続金具7により有機部材を
介して接続固定されている。石英ガラス製搬送治具1
は、切欠部3に石英ガラス製ボート(図示せず)を載
せ、炉内の加熱体8において加熱される石英ガラス製炉
芯管9内に挿入,搬出される。この場合、ウエーハのそ
りやスリップの発生を防止するため石英ガラス製フォー
クの搬送はゆっくり行われる。それ故、輻射熱の一部は
透明石英ガラスを透過して、容易にフォークの搬送取付
け端部に達するが、上記赤外線輻射は、取付け端部2に
形成された半透明石英ガラス4に含まれる無数の微細気
泡により、散乱、乱反射される。その結果、透明/半透
明の炉側境界部で発熱が起こるが、その代り保持部の有
機材料の温度上昇は防止される。
In the figure, a conveying jig 1 made of quartz glass has a semi-transparent quartz glass layer 2 containing fine bubbles integrally formed at an end thereof.
The edge portion is connected and fixed by the connecting fitting 7 of the driving member 6 via the organic member. Quartz glass transport jig 1
A quartz glass boat (not shown) is mounted on the notch 3, and the quartz glass is inserted into and discharged from a quartz glass furnace core tube 9 heated by a heating body 8 in the furnace. In this case, the quartz glass fork is conveyed slowly in order to prevent the warp and slip of the wafer. Therefore, a part of the radiant heat passes through the transparent quartz glass and easily reaches the transport attachment end of the fork, but the infrared radiation is innumerable contained in the semitransparent quartz glass 4 formed at the attachment end 2. Scattered and irregularly reflected by the fine bubbles of. As a result, heat is generated at the transparent / semitransparent furnace side boundary portion, but instead, the temperature rise of the organic material in the holding portion is prevented.

半透明石英ガラス層4は、第3図(b),第4図
(b)及び(d)に示されるように、端縁部よりやや内
側の端部近傍に設けることができる。
The semi-transparent quartz glass layer 4 can be provided in the vicinity of the end portion slightly inside the edge portion, as shown in FIGS. 3 (b), 4 (b) and (d).

〔実施例〕〔Example〕

次に、具体例により本発明を更に詳細に説明する。 Next, the present invention will be described in more detail with reference to specific examples.

実験に使用した下記四種の石英ガラスウエーハボート
搬送治具は、全て長さ約2000mm,外径120mm、肉厚5mmの
同一形状のもである。
The following four types of quartz glass wafer boat jigs used in the experiment all have the same shape with a length of about 2000 mm, an outer diameter of 120 mm and a wall thickness of 5 mm.

実施例1 搬出入保持側端縁より100mmまでを微細気泡を含む半
透明とした前記第3図の図(a)のような治具。
Example 1 A jig as shown in FIG. 3 (a) of FIG. 3 in which a portion up to 100 mm from the carry-in / out holding side edge was made semitransparent containing fine bubbles.

実施例2 同端縁より100mm〜200mmの間を、微細気泡入り半透明
石英ガラス層とした前記第3図の図(b)のような治
具。
Example 2 A jig as shown in FIG. 3B, in which a semi-transparent quartz glass layer containing fine bubbles was formed between 100 mm and 200 mm from the same edge.

比較例1 全体を透明ガラスで構成した従来品。Comparative Example 1 A conventional product which is entirely made of transparent glass.

比較例2 全体を半透明ガラスで構成した治具。Comparative Example 2 A jig which is entirely made of translucent glass.

上記各例のフォークを1,050℃に加熱した炉長2000mm,
均熱長1000mmの半導体ウエーハ熱処理用横型炉内に搬入
し、30分経過後の搬送治具端部の温度を測定した。
The fork of each of the above examples was heated to 1,050 ° C, furnace length 2000 mm,
The semiconductor wafer was loaded into a horizontal furnace for heat treatment of a semiconductor wafer having a soaking length of 1000 mm, and the temperature of the end of the transport jig after 30 minutes was measured.

各例における測定結果を表1に示した。 The measurement results in each example are shown in Table 1.

このように、本発明に係る実施例1及び実施例2は、
従来品等の比較例1及び比較例2に比べて取付け端縁部
の温度が明らかに低いことが判る。また、比較例2で
は、ウエーハを積載したボートを実際に搭載した場合、
ウエーハのそりやスリップの発生が実施例1,2と比較し
て三倍程度多いことが判った。
As described above, the first and second embodiments according to the present invention are
It can be seen that the temperature of the mounting edge portion is clearly lower than that of Comparative Examples 1 and 2 of the conventional product or the like. Further, in Comparative Example 2, when the boat loaded with the wafer is actually loaded,
It was found that the occurrence of warpage and slippage of the wafer was about three times as large as that in Examples 1 and 2.

〔発明の効果〕〔The invention's effect〕

以上説明したように、本発明の石英ガラス製ウエーハ
ボート搬送治具は、端部近傍の温度上昇が抑えられ、加
熱エネルギーのロスが少なくなる。従って、上記治具の
駆動部材や保持部材に用いられるポリマー材等の有機系
材料の劣化を効果的に防止することができる。また、ウ
エーハ表面での温度分布にむらが発生しないから、反り
やスリップの発生を防止することができ、産業上の価値
は高い。
As explained above, in the quartz glass wafer boat transport jig of the present invention, the temperature rise in the vicinity of the end is suppressed, and the loss of heating energy is reduced. Therefore, it is possible to effectively prevent the deterioration of the organic material such as the polymer material used for the driving member and the holding member of the jig. Further, since the temperature distribution on the surface of the wafer does not have unevenness, it is possible to prevent the occurrence of warpage and slip, which is of high industrial value.

【図面の簡単な説明】[Brief description of drawings]

第1図は、本発明の治具の一例の使用状態を示す模式
図、第2図は、その治具の取付け端部の拡大斜視図であ
る。第3図は、本発明に係る持ち上げ式治具の側面図、
第4図は上持ち式治具の部分省略斜視図である。また、
第5図は搬送治具の使用状態を示す部分断面模式図であ
る。 図中の符号: 1……石英ガラス製ウエーハボート搬送治具 2……半透明石英ガラス層 3……切欠部、4……半導体ウエーハ 5……ボート、6……駆動部材 7……接続金具、8……加熱体 9……炉芯管
FIG. 1 is a schematic diagram showing a usage state of an example of a jig of the present invention, and FIG. 2 is an enlarged perspective view of a mounting end portion of the jig. FIG. 3 is a side view of a lifting jig according to the present invention,
FIG. 4 is a partially omitted perspective view of the upper holding jig. Also,
FIG. 5 is a schematic partial cross-sectional view showing a usage state of the transfer jig. Reference numerals in the figure: 1 ... Quartz glass wafer boat transport jig 2 ... Semi-transparent silica glass layer 3 ... Notch, 4 ... Semiconductor wafer 5 ... Boat, 6 ... Driving member 7 ... Connection fitting , 8 ... Heating body 9 ... Furnace core tube

───────────────────────────────────────────────────── フロントページの続き (72)発明者 中村 一雄 東京都新宿区西新宿1丁目22番2号 信越 石英株式会社内 (72)発明者 剣持 克彦 福島県郡山市田村町金屋字川久保88 信越 石英株式会社石英技術研究所内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Kazuo Nakamura 1-22, Nishishinjuku, Shinjuku-ku, Tokyo Shinetsu Quartz Co., Ltd. Quartz Technology Laboratory Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】横型炉内に半導体ウエーハボートを搬送す
る透明石英ガラス製ウエーハボート搬送治具において、
その治具の搬送入用装置駆動部に取り付けられる側の端
部に微細気泡入り半透明石英ガラス層を形成したことを
特徴とする横型炉用石英ガラス製ウエーハボート搬送治
具。
1. A wafer boat transfer jig made of transparent quartz glass for transferring a semiconductor wafer boat into a horizontal furnace.
A quartz glass wafer boat carrying jig for a horizontal furnace, wherein a semi-transparent quartz glass layer containing fine bubbles is formed at an end of the jig that is attached to a driving unit for a feeding apparatus.
JP61203149A 1986-08-29 1986-08-29 Quartz glass wafer boat transfer jig Expired - Fee Related JPH0824109B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP61203149A JPH0824109B2 (en) 1986-08-29 1986-08-29 Quartz glass wafer boat transfer jig
KR1019870001655A KR900003252B1 (en) 1986-08-29 1987-02-26 Wafer conveying and retaining jig made of silica glass

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61203149A JPH0824109B2 (en) 1986-08-29 1986-08-29 Quartz glass wafer boat transfer jig

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2099800A Division JPH0648679B2 (en) 1990-04-16 1990-04-16 Quartz glass wafer boat holding jig

Publications (2)

Publication Number Publication Date
JPS6358822A JPS6358822A (en) 1988-03-14
JPH0824109B2 true JPH0824109B2 (en) 1996-03-06

Family

ID=16469237

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61203149A Expired - Fee Related JPH0824109B2 (en) 1986-08-29 1986-08-29 Quartz glass wafer boat transfer jig

Country Status (2)

Country Link
JP (1) JPH0824109B2 (en)
KR (1) KR900003252B1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01162233U (en) * 1988-04-26 1989-11-10
JPH0614480Y2 (en) * 1988-04-26 1994-04-13 信越石英株式会社 Semiconductor heat treatment equipment

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5623741A (en) * 1979-08-06 1981-03-06 Toshiba Ceramics Co Ltd Quartz glass furnace core tube for manufacturing semiconductor
JPS62259434A (en) * 1986-04-14 1987-11-11 Shinetsu Sekiei Kk Quartz glass jig

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5623741A (en) * 1979-08-06 1981-03-06 Toshiba Ceramics Co Ltd Quartz glass furnace core tube for manufacturing semiconductor
JPS62259434A (en) * 1986-04-14 1987-11-11 Shinetsu Sekiei Kk Quartz glass jig

Also Published As

Publication number Publication date
KR880003394A (en) 1988-05-16
KR900003252B1 (en) 1990-05-12
JPS6358822A (en) 1988-03-14

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