JPH08220242A - Conductive light emitting body to diagnose ion beam - Google Patents

Conductive light emitting body to diagnose ion beam

Info

Publication number
JPH08220242A
JPH08220242A JP2396095A JP2396095A JPH08220242A JP H08220242 A JPH08220242 A JP H08220242A JP 2396095 A JP2396095 A JP 2396095A JP 2396095 A JP2396095 A JP 2396095A JP H08220242 A JPH08220242 A JP H08220242A
Authority
JP
Japan
Prior art keywords
ion beam
light emitting
light
thin film
conductive material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2396095A
Other languages
Japanese (ja)
Other versions
JP3576242B2 (en
Inventor
Kiyoshi Mizuhashi
清 水橋
Kiyonori Ogoshi
清紀 大越
Satoshi Tajima
訓 田島
Tsuneo Takaya
恒男 貴家
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Atomic Energy Agency
Original Assignee
Japan Atomic Energy Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Atomic Energy Research Institute filed Critical Japan Atomic Energy Research Institute
Priority to JP2396095A priority Critical patent/JP3576242B2/en
Publication of JPH08220242A publication Critical patent/JPH08220242A/en
Application granted granted Critical
Publication of JP3576242B2 publication Critical patent/JP3576242B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE: To stabilize light emission, and precisely measure an ion beam by arranging a thin film layer of a light emitting material on a surface of a conductive material. CONSTITUTION: A conductive light emitting body 1 is obtained by forming a thin film layer by a light emitting material 3 on a surface of a conductive material 2. The material 2 prevents accumulation of electric charge by releasing electric charge of an ion beam, and for example, iron, copper, aluminium or the like are used. A material visualized by emitting light by an ion beam, for example, a material such as glass powder having proper mechanical strength nondisruptive even if it is pressed in the material 2 is used as the material 3. The material 3 forms a thin film layer uniformly high in adhesion strength by being pressed in a surface of the material 2. In its thickness, as long as electric conductivity is secured, thicker one is suitable in respect of preventing light diffusion. In this way, the light emitting body 1 to uniformly and stably emit light can be obtained.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、イオンビームの診断に
用いられる、安定性が高く、均一発光が可能な導電性発
光体及びその作成方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a conductive luminescent material which is used for diagnosing an ion beam and which is highly stable and capable of uniform light emission, and a method for producing the same.

【0002】[0002]

【従来の技術】近年、高機能性材料の開発や物理現象の
究明実験等にイオン加速器が使用されている。イオン加
速器は、イオンビームの特性を利用したものであり、こ
れらの実験、開発作業の際、イオンビームの輸送や均一
度を確認する必要がある。
2. Description of the Related Art In recent years, ion accelerators have been used for development of highly functional materials and experiments for investigating physical phenomena. The ion accelerator utilizes the characteristics of the ion beam, and it is necessary to confirm the transport and uniformity of the ion beam during these experiments and development work.

【0003】そこで、目に見えないイオンビームを、可
視化することが好都合であるが、そのため、イオンビー
ムにより発光現象が励起される発光体を用いることが一
般に行われている。
Therefore, it is convenient to visualize the invisible ion beam, but for this reason, it is common practice to use a luminescent material whose luminescence phenomenon is excited by the ion beam.

【0004】かかる発光体としては、従来、不純物を含
むアルミナや石英ガラス、あるいは酸化マグネシウム等
の材料が使用されていた。
Materials such as alumina containing impurities, quartz glass, or magnesium oxide have been used as the light emitter.

【0005】しかしながら、これらの材料は、電気絶縁
性であるため、電荷蓄積や電荷蓄積に起因する放電現象
を起こしやすく、そのために、後続するイオンビームを
反射して、安定した発光が得られなかったり、発光体が
破壊されやすい等の問題が見られた。
However, since these materials are electrically insulating, they are apt to cause charge accumulation and a discharge phenomenon due to charge accumulation, so that the subsequent ion beam is reflected and stable light emission cannot be obtained. However, there were problems such as the luminescent body being easily broken.

【0006】さらに、これらの材料は一般に機械的強度
や靭性に欠け、発光体を薄膜化することが困難なため、
発光体内での光散乱現象を有効に防止することができ
ず、イオンビームの大きさや掃引幅を正確に測定するこ
とが困難という問題も見られた。
Further, these materials generally lack mechanical strength and toughness, and it is difficult to form a thin film of the light emitting body.
There was also a problem that it was not possible to effectively prevent the light scattering phenomenon in the light emitter, and it was difficult to accurately measure the size and sweep width of the ion beam.

【0007】そこで、絶縁物の表面を導電性のメッシュ
状物で覆った発光体も提案されている。
Therefore, a light-emitting body has been proposed in which the surface of the insulating material is covered with a conductive mesh material.

【0008】しかしながら、かかるメッシユ状物で覆っ
た発光体は、作成が困難なばかりか、発光が不連続にな
り、イオンビームの精密かつ容易な観察が困難となると
いう問題が見られた。
However, the luminescent material covered with such a mesh-like material is not only difficult to prepare, but also has a problem that the light emission becomes discontinuous, which makes it difficult to observe the ion beam precisely and easily.

【0009】[0009]

【発明が解決しようとする課題】従って、本発明は、発
光体の電荷蓄積や電荷蓄積に起因する放電およびイオン
ビームの反発を防止し、発光を安定化させ、イオンビー
ムの精密測定が可能な発光体及びその作成方法を提供す
ることを目的とする。
Therefore, according to the present invention, it is possible to prevent the charge accumulation of the light emitting body, the discharge due to the charge accumulation and the repulsion of the ion beam, stabilize the light emission, and perform the precise measurement of the ion beam. It is an object of the present invention to provide a light emitting body and a method for making the same.

【0010】[0010]

【課題を解決するための手段】従来の課題は、本発明の
導電性材料の表面に発光性材料の薄膜層を設けたことを
特徴とするイオンビーム診断用導電性発光体により解決
される。
Means for Solving the Problems The conventional problems can be solved by a conductive light-emitting body for ion beam diagnosis which is characterized in that a thin film layer of a light-emitting material is provided on the surface of the conductive material of the present invention.

【0011】なお、本発明において、イオンビーム診断
用とは、イオンビームの可視化が可能で、結果として、
イオンビームの大きさや掃引幅およびイオンビームの位
置測定が可能なことを意味する。
In the present invention, "for ion beam diagnosis" means that the ion beam can be visualized, and as a result,
This means that the size and sweep width of the ion beam and the position of the ion beam can be measured.

【0012】また、導電性発光体とは、導電性材料の表
面に発光性材料による薄膜層が形成されたものを意味す
る。
The conductive luminescent material means a conductive material having a thin film layer formed on the surface of the conductive material.

【0013】さらに、発光体材料による薄膜層とは、導
電性材料と発光体材料が混在し、概ね導電性材料の表面
に層状に存在しているものをいう。
Further, the thin film layer made of a light emitting material means a layer in which a conductive material and a light emitting material are mixed and which are generally present on the surface of the conductive material in a layer form.

【0014】以下、本発明を詳細に説明する。The present invention will be described in detail below.

【0015】(導電性材料)本発明に導電性材料を用い
るのは、発光体全体を、導電性にすることにより、発光
体の電荷蓄積を有効に防止し、放電や後続するイオンビ
ームの反発をなくして、連続的に発光を安定化させるた
めである。
(Conductive Material) The use of a conductive material in the present invention makes the entire luminescent material conductive to effectively prevent charge accumulation in the luminescent material and to repel discharge and subsequent ion beam repulsion. This is because the light emission is eliminated and the light emission is continuously stabilized.

【0016】すなわち、導電性材料は、イオンビームの
電荷を、発光体からアースをとることにより逃がし、容
易に電荷蓄積を防止することが可能ならしめているもの
である。
That is, the conductive material allows the charge of the ion beam to escape by taking a ground from the light-emitting body and easily prevent charge accumulation.

【0017】また、導電性材料は電荷蓄積に起因する放
電現象のために、発光性材料が破壊されるのを防止した
り、あるいは発光性材料を機械的に保持する機能も担保
している。
Further, the conductive material has a function of preventing the light emitting material from being destroyed due to a discharge phenomenon caused by the accumulation of electric charges, or ensuring a function of mechanically holding the light emitting material.

【0018】本発明に好適な導電性材料としては、例え
ば、鉄、銅、アルミニウム、ステンレス等の金属材料が
挙げられる。
Examples of the conductive material suitable for the present invention include metal materials such as iron, copper, aluminum and stainless steel.

【0019】これらは、電気の良導体であり、また、機
械的強度にすぐれ、発光体の薄膜化が可能であるととも
に、加工性にすぐれ、表面平滑性が得られやすいためで
ある。
This is because these are good conductors of electricity, have excellent mechanical strength, can form a thin film of the light-emitting body, have excellent workability, and can easily obtain surface smoothness.

【0020】ここで、本発明の導電性材料の、好適な導
電率の範囲は、電化蓄積のより優れた防止効果等を考慮
して、1.6x10-6〜2.0x10-5S/mの範囲であるが、本発明
の目的からすれば、絶縁物でなければ、電化蓄積がおこ
ることが少なく、導電率の面からは、導電性材料の種類
に関する制限は少ない。
Here, the preferable range of conductivity of the conductive material of the present invention is in the range of 1.6x10 -6 to 2.0x10 -5 S / m in consideration of the better prevention effect of charge accumulation. However, from the viewpoint of the present invention, if it is not an insulator, electrical charge is less likely to occur, and in terms of conductivity, there are few restrictions on the type of conductive material.

【0021】但し、熱伝導性、加工性、機械的強度等の
観点から、特に鉄、アルミニウム、銅、ステンレス材料
が好適であり、使用目的により、タングステン、モリブ
テン等の材料も好適である。
However, from the viewpoint of thermal conductivity, workability, mechanical strength and the like, iron, aluminum, copper and stainless materials are particularly preferable, and materials such as tungsten and molybdenum are also preferable depending on the purpose of use.

【0022】次に、本発明の導電性材料の形状について
説明する。
Next, the shape of the conductive material of the present invention will be described.

【0023】かかる形状は用途に従い任意に加工可能で
あるが、例えば四角または円形の平板状が好適である。
Although such a shape can be processed arbitrarily according to the use, a square or circular flat plate shape is preferable.

【0024】表面への発光性材料の圧入を均一にならし
め、またイオンビームを有効にかつ均一に発光可能とす
るためである。
This is because the luminescent material is uniformly pressed into the surface and the ion beam can be effectively and uniformly emitted.

【0025】また、導電性材料を加工して、図3に示す
ようないわゆるアパーチャーの形状に対応したものでも
良い。
Alternatively, a conductive material may be processed to have a so-called aperture shape as shown in FIG.

【0026】導電性材料と発光体材料とあいまってアパ
ーチャーを作成すれば、容易にイオンビームの位置修正
が可能となり、小さい穴にイオンビームを通過させるこ
とも可能となるためである。
This is because the position of the ion beam can be easily corrected and the ion beam can be passed through a small hole by forming an aperture together with the conductive material and the light emitting material.

【0027】(発光性材料)本発明の発光性材料は、イ
オンビームにより、発光現象を生じ、イオンビームの可
視化が可能なものであれば良く、例えば、ガラス粉末等
が該当するが、かかる発光性材料は、金属等の導電性材
料に圧入しても破壊されないような適度な機械的強度を
有するものが好適である。
(Light-Emitting Material) The light-emitting material of the present invention may be any material as long as it can generate a light emission phenomenon by an ion beam and can visualize the ion beam, and examples thereof include glass powder. It is preferable that the conductive material has an appropriate mechanical strength so as not to be broken even if it is pressed into a conductive material such as metal.

【0028】本発明に使用可能なガラス粉末としては、
ビーズ状のものやパウダー状のものがあり、組成、形
状、大きさ等が多種類存在し、使用目的に応じて選択性
が広い点で好適である。
The glass powder usable in the present invention includes:
There are beads and powders, and there are many types of compositions, shapes, sizes, etc., and it is suitable in terms of wide selectivity according to the purpose of use.

【0029】すなわち、イオンビームに関して、低エネ
ルギー、少電流用にはより発光効率が良いものを選択
し、高エネルギー、大電流用には発光効率はそれほど高
くないが、安定した発光特性を持った、ガラス粉末を使
用することが好適である。
That is, with regard to the ion beam, one having a low luminous energy and a high luminous efficiency is selected, and a luminous energy having a high luminous energy is not so high, but it has a stable luminous characteristic. It is preferable to use glass powder.

【0030】また、これらのガラス粉末のうち、特に、
不定形のガラスパウダーは、表面に鋭利な部分を有し、
導電性材料表面に食い込みやすく、安定した発光体層を
形成可能な点で好適である。
Among these glass powders, especially,
The amorphous glass powder has a sharp part on the surface,
It is preferable because it can easily penetrate into the surface of the conductive material and form a stable light emitting layer.

【0031】本発明において、発光体材料が、導電性材
料表面に薄膜形成されていることが特徴である。
The present invention is characterized in that the light emitting material is formed as a thin film on the surface of the conductive material.

【0032】但し、この薄膜層内では、一般に発光性材
料と導電性材料が混在した状態にあり、発光性材料が導
電性材料とが必ずしも分離独立している状態にはない。
However, in this thin film layer, the light emitting material and the conductive material are generally mixed, and the light emitting material and the conductive material are not necessarily separated and independent.

【0033】よって、薄膜層の厚さが厚くなることによ
って、著しく導電性が失われることはない。
Therefore, the conductivity of the thin film layer is not significantly lost due to the increase of the thickness of the thin film layer.

【0034】また、薄膜層の厚さや発光性材料の圧入密
度により、発光特性が変化し、圧入密度が高く、一般に
薄膜層の厚さが厚いほど、発光効率の高い発光体が形成
される。
Further, the luminescent characteristics change depending on the thickness of the thin film layer and the press-fitting density of the light-emitting material, and the press-fitting density is high. Generally, the thicker the thin film layer, the higher the luminous efficiency of the light-emitting body is formed.

【0035】ここで、具体的な薄膜層の厚さとしては、
観測しようとするイオンの種類やエネルギーによっても
異なるが、0.1um以上の厚さが好適である。
Here, as a specific thickness of the thin film layer,
Although it depends on the type and energy of the ion to be observed, a thickness of 0.1 μm or more is suitable.

【0036】例えば、400Kevのアルゴンイオンの場合
の、ガラス中での飛程が約0.3umであること等を具体的
に考慮したものであり、また、薄膜層の厚さが、0.1um
未満では、発光光量が少なく、その視認性が低下するお
それがあるためである。
For example, in the case of 400 Kev of argon ions, the range in glass is about 0.3 μm, and the like is taken into consideration. Further, the thickness of the thin film layer is 0.1 μm.
If it is less than 1, the amount of emitted light is small and the visibility may be reduced.

【0037】また、薄膜層の厚さは、薄膜層において、
導電性が確保される限り、導電性材料との混在状態で、
透明性はなく、光散乱等による光の広がりも防止できる
点で、厚いほうが好適である。
The thickness of the thin film layer is
As long as conductivity is ensured, in a mixed state with a conductive material,
A thicker layer is preferable because it has no transparency and can prevent light from spreading due to light scattering.

【0038】但し、厚膜を作成する場合には、使用する
発光性材料としの、ガラス粉末等の平均粒径もいきおい
大きくなり、打ち込み上の取り扱いが困難となるため、
一般的には、数10um以下の厚さが好適である。
However, in the case of forming a thick film, the average particle size of the glass powder or the like used as the luminescent material to be used becomes too large, and the handling during implantation becomes difficult.
Generally, a thickness of several tens of um or less is suitable.

【0039】(作成方法)本発明の発光体は、例えば、
図1に示す導電性材料の表面に発光性材料を圧入して薄
膜形成することにより作成することが好適である。
(Preparation Method) The luminescent material of the present invention is, for example,
It is preferable that the light emitting material is pressed into the surface of the conductive material shown in FIG. 1 to form a thin film.

【0040】薄膜を均一にかつ密着力高く成形可能のた
めである。
This is because the thin film can be formed uniformly and with high adhesion.

【0041】ここで、圧入の圧力としては、1〜10kgf/c
m2の範囲が好適である。
Here, the press-fitting pressure is 1 to 10 kgf / c.
A range of m 2 is preferred.

【0042】圧入圧力が1kgf/cm2未満となると、導電
性材料と発光性材料との密着力が低下する恐れがあるた
めであり、一方、圧力が10kgf/cm2を越えると、摩擦熱
や圧入圧力により、導電性材料が変形しやすくなり、そ
れを防止するため、その分、機械的強度を持たせる為
に、発光体が厚くなるためである。
This is because if the press-fitting pressure is less than 1 kgf / cm 2 , the adhesive force between the conductive material and the luminescent material may be reduced, while if the pressure exceeds 10 kgf / cm 2 , frictional heat or This is because the conductive material is easily deformed by the press-fitting pressure, and in order to prevent it from being deformed and to have mechanical strength correspondingly, the luminous body becomes thick.

【0043】また、圧力が高すぎると、発光性材料の圧
入される量に対して、導電性材料の削り取られる量も多
くなり、圧力を高める効果が減少するためでもある。
This is also because if the pressure is too high, the amount of the electrically conductive material scraped off increases with respect to the amount of the light emitting material pressed in, and the effect of increasing the pressure decreases.

【0044】さらに、圧入圧力の好適な範囲は、3〜8kg
f/cm2であり、最適には、5〜7kgf/cm2の範囲である。
Further, the suitable range of press-fitting pressure is 3 to 8 kg.
f / cm 2 , optimally in the range 5-7 kgf / cm 2 .

【0045】なお、本発明の圧入装置としては、薄膜形
成が均一容易可能な点で、サンドブラストマシーン等が
好適である。
As the press-fitting device of the present invention, a sand blast machine or the like is suitable because it allows uniform thin film formation.

【0046】その他、発光性材料の導電性材料への密着
力を高め、発光面積を大きくするため、あらかじめ、コ
ランダム(平均粒径50〜200um)等を用いて、導電性材料
表面を粗くした後、発光性材料であるガラス粉末等を圧
入することが好適である。
In addition, after the surface of the conductive material is roughened by using corundum (average particle diameter 50 to 200 μm) in advance in order to increase the adhesion of the light emitting material to the conductive material and increase the light emitting area. It is preferable to press-fit glass powder or the like, which is a luminescent material.

【0047】[0047]

【実施例】以下に実施例を挙げて、本発明を更に具体的
に説明する。
EXAMPLES The present invention will be described more specifically with reference to the following examples.

【0048】(実施例1)図2は、本発明の発光体にイ
オンビームを掃引し、発光させ、イオンビームの均一性
を確認するとともに、XスキャナーとYスキャナーのオ
フセット制御によって、イオンビームの軌道修正等を示
す図である。
(Embodiment 1) FIG. 2 shows that the illuminant of the present invention is swept with an ion beam to cause it to emit light, and the uniformity of the ion beam is confirmed. It is a figure which shows a trajectory correction.

【0049】ここで、本発明の発光体は、導電性材料と
して、タテ5cm、ヨコ5cm、厚さ1mmのステンレス製の金
属板を用い、発光性材料としては、平均粒径106umのガ
ラスパウダーを用い、圧入装置としては、直圧式サンド
ブラストを使用して、圧入圧力6kgf/cm2の条件で、発光
性材料を導電性材料表面に圧入して作成したものであ
る。
Here, in the luminous body of the present invention, a stainless metal plate having a length of 5 cm, a width of 5 cm, and a thickness of 1 mm is used as a conductive material, and a glass powder having an average particle diameter of 106 μm is used as the light emitting material. A direct pressure type sand blast was used as the press-fitting device, and the luminescent material was press-fitted onto the surface of the conductive material under the condition of press-fitting pressure of 6 kgf / cm 2 .

【0050】そして、光源から発せられたイオンビーム
は、XスキャナーとYスキャナーのオフセット制御を通
過し、発光体に照射させたところである。
Then, the ion beam emitted from the light source has just passed through the offset control of the X scanner and the Y scanner and has been irradiated onto the light emitter.

【0051】発光体表面のイオンビームが照射されたと
ころは、目視にて、発光面の位置、発光状態等が視認可
能となり、それをもとに、オフセット制御により、イオ
ンビームの位置修正が任意に行えることになる。
Where the surface of the light emitter is irradiated with the ion beam, the position of the light emitting surface, the light emitting state, etc. can be visually confirmed, and the position of the ion beam can be arbitrarily corrected by offset control based on this. You can do it.

【0052】(実施例2)図3は、本発明品をアパーチ
ャーの形態にしたものである。
(Embodiment 2) FIG. 3 shows the product of the present invention in the form of an aperture.

【0053】ここで、本発明の発光体は、導電性材料と
して、直径5cm、厚さ1mmのステンレス製の金属円板であ
つて、直径1mmのイオンビーム通過孔つきを用い、発光
性材料として、平均粒径106umのガラスパウダーを用
い、アパーチャー全面に、圧入装置として、直圧型サン
ドブラストを使用して、圧力6kgf/cm2の条件で、発光性
材料を導電性材料表面に圧入して作成したものである。
Here, the light-emitting body of the present invention is a metal circular plate made of stainless steel having a diameter of 5 cm and a thickness of 1 mm as a conductive material, using an ion beam passage hole having a diameter of 1 mm as a light-emitting material. , A glass powder having an average particle size of 106 um was used, and a luminescent material was press-fitted onto the conductive material surface under the condition of a pressure of 6 kgf / cm 2 using a direct pressure sandblast as a press-fitting device on the entire surface of the aperture. It is a thing.

【0054】なお、本図で、通過孔の周囲のハツチング
部分は、発光部分であり、イオンビーム中心が通過孔の
中心位置となるよう、イオンビームの位置調整が可能と
なる。
In this figure, the hatched portion around the passage hole is a light emitting portion, and the position of the ion beam can be adjusted so that the center of the ion beam is at the center position of the passage hole.

【0055】[0055]

【発明の効果】本発明によれば、イオンビーム照射によ
る電荷蓄積がなく、放電の発生や後続のインビームの反
射がなく、発光体も破壊されることなく、均一な安定し
た発光が持続する。
According to the present invention, there is no charge accumulation due to ion beam irradiation, no discharge is generated, no subsequent in-beam reflection occurs, and the light emitter is not destroyed, and uniform and stable light emission is maintained. .

【0056】また、発光性が良好で視認性が高いという
利点もあり、発光体としての熱伝導も良好なため、熱に
よる発光体の劣化や、発光度の低下を防止することも可
能である。
Further, there is an advantage that the light emitting property is good and the visibility is high, and since the heat conduction as the light emitting body is also good, it is possible to prevent the light emitting body from being deteriorated and the luminous intensity from being lowered by heat. .

【0057】さらに、本発明は、発光体としての機械的
強度や化学的安定性が高いため、加工性が良好で、水冷
することも可能となるなどの利点もある。
Further, since the present invention has high mechanical strength and chemical stability as a light emitting body, it has good processability and can be cooled with water.

【0058】その他、複雑に加工された高価な発生特性
が劣化した場合には、容易に再生可能という利点もあ
る。
In addition, there is also an advantage that when the complicatedly processed and expensive generating characteristic is deteriorated, it can be easily reproduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の発光体の作成方法の一例を示す。FIG. 1 shows an example of a method for producing a luminous body of the present invention.

【図2】本発明の発光体を用いてイオンビームの均一性
を確認する一使用例を示す。
FIG. 2 shows a usage example for confirming the uniformity of an ion beam using the light emitting body of the present invention.

【図3】本発明の発光体をアパーチャーの形態にして、
イオンビームの位置を修正する一使用例を示す。
FIG. 3 is a diagram showing the luminescent material of the present invention in the form of an aperture,
An example of use for correcting the position of the ion beam will be shown.

【符号の説明】[Explanation of symbols]

1:発光体 2:導電性材料 3:発光性材料の薄膜層 4:圧入装置 5:xスキャナー 6:Yスキャナー 7:イオンビーム 8:発光部分 9:アパーチャー 1: Luminous body 2: Conductive material 3: Thin film layer of luminescent material 4: Press-fitting device 5: x scanner 6: Y scanner 7: Ion beam 8: Light emitting part 9: Aperture

───────────────────────────────────────────────────── フロントページの続き (72)発明者 貴家 恒男 群馬県高崎市綿貫町1233番地 日本原子力 研究所高崎研究所内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Tsuneo Kiya 1233 Watanuki-cho, Takasaki-shi, Gunma Japan Atomic Energy Research Institute Takasaki Research Institute

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 導電性材料の表面に発光性材料の薄膜層
を設けたことを特徴とするイオンビーム診断用導電性発
光体。
1. A conductive light-emitting body for ion beam diagnosis, comprising a thin film layer of a light-emitting material provided on the surface of a conductive material.
【請求項2】 前記導電性材料の表面に前記発光性材料
の薄膜層を圧入して作成したことを特徴とする請求項1
に記載のイオンビーム診断用導電性発光体の作成方法。
2. The thin film layer of the light emitting material is press-fitted onto the surface of the conductive material to prepare the thin film layer.
The method for producing a conductive light-emitting body for ion beam diagnosis according to [4].
JP2396095A 1995-02-13 1995-02-13 Conductive phosphor for ion beam diagnostics Expired - Lifetime JP3576242B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2396095A JP3576242B2 (en) 1995-02-13 1995-02-13 Conductive phosphor for ion beam diagnostics

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2396095A JP3576242B2 (en) 1995-02-13 1995-02-13 Conductive phosphor for ion beam diagnostics

Publications (2)

Publication Number Publication Date
JPH08220242A true JPH08220242A (en) 1996-08-30
JP3576242B2 JP3576242B2 (en) 2004-10-13

Family

ID=12125123

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2396095A Expired - Lifetime JP3576242B2 (en) 1995-02-13 1995-02-13 Conductive phosphor for ion beam diagnostics

Country Status (1)

Country Link
JP (1) JP3576242B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009192313A (en) * 2008-02-13 2009-08-27 Kobe Steel Ltd Beam detection member and beam detector using it

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009192313A (en) * 2008-02-13 2009-08-27 Kobe Steel Ltd Beam detection member and beam detector using it

Also Published As

Publication number Publication date
JP3576242B2 (en) 2004-10-13

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