JPH0819159A - Ct circuit bypass apparatus for relay test - Google Patents

Abstract

PURPOSE:To minimize function disabled range including power failure and reduce the time of such condition by bypassing the CT circuit with the relay test of the power transmission line protecting apparatus. CONSTITUTION:The apparatus body X is composed of three sections of terminals A, B, C. The 4-pole terminal A in the input side is connected with the CT input of the test target apparatus R via the input side cable AA. The 4-pole terminal B in the output side is connected with the CT input of the non-test target apparatus S via the output side cable BB. The 8-pole terminal C for connecting relay tester is connected with the terminal of the test target apparatus R after it is disconnected (without illustration of relay tester). Moreover, contacts of the terminals A, B, C are formed of the 4-pole or 8-pole changeover plug.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a relay test CT circuit bypass device used for disconnecting only a device under test from a CT circuit in a relay test of a transmission line protection relay device. Note that CT means a current transformer (current transformer) and CT circuit means a current transformer circuit.

[0002]

2. Description of the Related Art A CT secondary / tertiary circuit is constructed by connecting devices such as a protective relay device and a measuring device in series.
The T circuit is in serial (serial mode).

As a result, a common current proportional to the primary current (current actually flowing in the electric wire) is supplied to each device.

By the way, there is maintenance and inspection of the transmission line protection relay device within the scope of work of the electric utility company, and at the time of the relay test here, it is necessary to send a test current to the device to confirm the operation, and therefore, in general, the above-mentioned The actual current equivalent to is blocked (locked) by the CT input circuit of the device under test.

Therefore, in addition to the device under test, the relays and the like constituting the CT circuit will stop functioning thereafter. (See Fig. 5)

In order to complement this function stop, a backup relay is used, the power system configuration is changed, etc.
I have dealt with the operation side.

[0007]

Generally, relays and the like are C
Only the input side of the T circuit can be taken out to the outside. Therefore, the bypass circuit can be configured by directly connecting the CT input circuit of the device under test and the CT input circuit of the device connected immediately after the device outside the device with a cable or the like. However, with this method, it is impossible to configure the bypass circuit without changing the current flowing through the CT circuit.

Also, some recent relays and the like have a structure in which both the input side and the output side of the CT circuit can be taken out to the outside, which is effective as such, but the number is small, and the device will be slim in the future. It is difficult to standardize this structure when it is desired.

To summarize the problems of the prior art, since the CT circuit is serial, the relays and the like that are not the subject of testing are also locked.

[0010] This is a problem that leads to a decline in service, which is seen from the side of the user who has a contract with the electric power company, because of being affected by the power outage range.

The present invention has been made in view of the above circumstances, and solves the above-mentioned problems and bypasses the CT circuit in a relay test or the like of a transmission line protection device, thereby providing a function including a power failure accompanying a test work. An object of the present invention is to provide a CT circuit bypass device for relay test, which can minimize the stop range and shorten the time.

[0012]

In order to achieve the above object, the present invention provides a relay test CT circuit bypass used to disconnect only a device under test from a CT circuit in a relay test of a transmission line protection relay device or the like. In the apparatus, the apparatus main body includes an input side terminal section, an output side terminal section, and a relay tester connection terminal section.

Here, the input side terminal unit is connected to the CT input unit of the device under test via the input side cable, and the output side terminal unit is connected to the CT of the device not under test via the output side cable. It is connected to the input part, and the terminal part for connecting the relay tester is connected to the device under test and the relay tester after disconnection.

Further, the contacts at each of the above-mentioned terminal parts are switching plugs, a four-pole plug is used for each of the input-side and output-side terminals, and an eight-pole plug is used for the terminal part for connecting the relay tester. There is a case.

[0015]

As a portable external device, the CT input circuit of the existing device is used as it is, the device under test is disconnected from the CT circuit without changing the CT circuit current, and all the current flowing through the device outside the test is removed. It can be via a bypass circuit.

That is, a normal CT is transmitted through the apparatus of the present invention.
A bypass circuit can be incorporated into the circuit to bypass the test target device CT input section → this apparatus input side → this apparatus → this apparatus output side → the non-test target apparatus CT input section.
(The procedure and the circuit configuration will be described in the embodiments described later.)

[0017]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described in the following order with reference to the accompanying drawings. 1. Circuit configuration diagram of the present invention 1. Bypass switching plug 3. Bypass circuit switching procedure 1) Before bypass 2) Bypass circuit configuration 3) Circuit separation 4) Relay test 4. Performance

1. Circuit Configuration Diagram of the Present Invention FIG . 1 is a circuit configuration diagram of a CT circuit bypass device. Here, A is an input side 4 pole terminal part, B is an output side 4 pole terminal part, C is an 8 pole terminal part for connecting a relay tester, AA is an input side cable, BB is an output side cable, and R is a device under test. , S is a device not to be tested, and X is a relay test CT circuit bypass device (device body).

As shown in the figure, the apparatus body (X) is composed of three terminal portions (A, B, C). Input side 4 pole terminal part (A) is CT of the device under test (R)
It is connected to the input section via the input side cable (AA). The output-side four-pole terminal section (B) is connected to the CT input section of the apparatus (S) that is not the test target via the output-side cable (BB). The 8-pole terminal (C) for connecting the relay tester is the device under test (R) after disconnection.
And a relay tester (not shown). Further, the contacts at each terminal portion (A, B, C) are assumed to be 4-pole or 8-pole switching plugs.

2. Bypass switching plug Schematic and circuit (contact structure) of 4-pole plug on the input / output side terminal and 8-pole plug on the terminal for relay tester connection
Is shown in FIG. The conditions for using these plugs are that the circuit is simple (4 poles, 8 poles) and that the external terminals of the plug can be used as test terminals (8 poles).

3. Bypass Circuit Switching Procedure FIGS. 3A to 3D are schematic circuit configuration diagrams illustrating the switching procedure.

1) Before bypassing As shown in FIG. 3 (a), the existing CT secondary
The tertiary circuit is configured by connecting the respective devices (R, S) in series, and the CT circuit is in a serial mode (serial mode).

2) Bypass Circuit Configuration As shown in the circuit configuration of FIG. 3B, a bypass circuit is incorporated in a normal CT circuit [FIG. 3A]. At this time, the current flowing through the device under test (R) changes, but the device under test (S) does not change.

3) Circuit Separation As shown in FIG. 3C, the device under test (R) is separated from the CT circuit. At this time, all the current flowing through the device (S) that is not the test target goes through the bypass circuit.

4) Relay Test As shown in the circuit configuration of FIG. 3D, a relay tester is connected to the device under test (R) separated from the CT circuit.

4. CT circuit configuration of the actual transmission line relay, implement backup protection relays tested in regular inspection backup protection → connected transmission line protective relay device in the order of primary protection, as expected, there in conventional test methods It was possible to reduce the number of users (users other than the device area under test) that would be affected to zero. FIG. 4 is a conceptual diagram of the test method of the present invention, and FIG. 5 is a conceptual diagram of the conventional test method.

[0027]

The present invention is constituted as described above, and has the following beneficial effects. (1) During the relay test in the periodic inspection of the transmission line protection relay device, the function stop range including the power failure is reduced, and the power supply reliability is improved.

(2) There is no need to change the bus bar or the system,
Since the working time can be shortened, it can contribute to the efficiency of the work.

(3) It is a portable external device and can be standardized as a CT circuit bypass device for relay test. Also,
Since a general 4-pole plug is used for connection with the relay board, it has versatility that it can be used for other CT circuits.

(4) Since the manufacturing cost is reduced, it is expected to be widely used as a relay test device in the periodic inspection of the transmission line protection relay device.

[Brief description of drawings]

FIG. 1 is a circuit configuration diagram of a CT circuit bypass device of the present invention.

FIG. 2 is a schematic diagram of 4-pole and 8-pole plugs in the device of the present invention.

FIG. 3 is a schematic circuit configuration diagram for explaining a bypass circuit switching procedure using the device of the present invention, where (a) is before bypass, (b) is bypass circuit configuration, (c) is circuit isolation and (d). Indicates a relay test.

FIG. 4 is a conceptual diagram of a test method by the device of the present invention.

FIG. 5 is a conceptual diagram of a conventional test method.

[Explanation of symbols]

 A Input 4-pole terminal B Output 4-pole terminal C Relay tester connection 8-pole terminal AA Input cable BB Output cable R Test target device S Non-test target device X Relay test CT circuit bypass device

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Hirofumi Irie Inventor Hiroshi Yasuda 4-33 Komachi Naka-ku, Hiroshima City, Hiroshima Prefecture (72) Inventor Katsuhiko Yasuda 4-33 Komachi Naka-ku, Hiroshima City, Hiroshima Prefecture Co., Ltd. (72) Inventor Noboru Azumi 433 Komachi, Naka-ku, Hiroshima-shi, Hiroshima Prefecture China Electric Power Co., Ltd. (72) Hiroshi Toyama 4-33 Komachi, Naka-ku, Hiroshima City, Hiroshima Prefecture 72) Inventor Kazuhiro Yamada 4-33 Komachi, Naka-ku, Hiroshima City, Hiroshima Prefecture, Chugoku Electric Power Co., Inc. (72) Inventor Hiroyuki Endo 4-33, Komachi, Naka-ku, Hiroshima City, Hiroshima City (72) Inventor Koichi Etani 4-33 Komachi, Naka-ku, Hiroshima-shi, Hiroshima Prefecture China Electric Power Company (72) Inventor Kazue Hayashi 4-33 Komachi, Naka-ku, Hiroshima City, Hiroshima City

Claims (2)

[Claims] 1. A bypass device used to disconnect only a device under test from a CT circuit in a relay test or the like of a transmission line protection relay device, wherein the device body is a CT of the device under test via an input side cable. Input side terminal part connected to input part, output side terminal part connected to CT input part of non-test target device via output side cable, test target device after disconnection and terminal connection with relay tester And a relay tester connection terminal portion, the relay test CT circuit bypass device. 2. The CT circuit bypass device for relay test according to claim 1, wherein the contact in each terminal portion is formed by a switching plug.