JPH08168950A - Method and device for adjusting abrasive grain - Google Patents

Method and device for adjusting abrasive grain

Info

Publication number
JPH08168950A
JPH08168950A JP30927494A JP30927494A JPH08168950A JP H08168950 A JPH08168950 A JP H08168950A JP 30927494 A JP30927494 A JP 30927494A JP 30927494 A JP30927494 A JP 30927494A JP H08168950 A JPH08168950 A JP H08168950A
Authority
JP
Japan
Prior art keywords
abrasive grains
abrasive
cutting
drum
container
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP30927494A
Other languages
Japanese (ja)
Other versions
JP2976828B2 (en
Inventor
Takashi Kuboki
孝 久保木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP30927494A priority Critical patent/JP2976828B2/en
Publication of JPH08168950A publication Critical patent/JPH08168950A/en
Application granted granted Critical
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  • Grinding-Machine Dressing And Accessory Apparatuses (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

PURPOSE: To secure cutting accuracy while performing cutting operations repeatedly by causing a centrifugal force to act on a machining fluid for the separation of unground abrasive grains from chips of a workpiece to be cut and from ground abrasive grains, and reusing the unground abrasive grains separated. CONSTITUTION: A lid-equipped cylindrical container 13 is rotated at high speed so that an abrasive fluid is continuously fed from a tank 16 to a center portion through a feeder pipe 14 by a certain amount of flow by use of a pump 17. Since fine grains cause a centrifugal force that is smaller than their surface force, they overflow from the top of the container 13, are discharged into an overflow collecting container 15, and returned into the tank 16 through an abrasive-fluid return opening 18. As a result, a machining-fluid circulation system is formed, and only abrasive grains with large diameters are accumulated on the side face of the container 13, while chips and ground abrasive grains are accumulated in the machining fluid in the circulation system. The abrasive grains on the side face of the rotating container 13 are remixed with support oil and used for re-cutting.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体材料、セラミッ
クス等の材料をワイヤと砥粒により薄板状の多数のウエ
ハーに切断するマルチワイヤーソー(以下「ワイヤーソ
ー」と略称する)に用いる砥粒調整方法および装置に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an abrasive grain used for a multi-wire saw (hereinafter abbreviated as "wire saw") for cutting a material such as a semiconductor material or a ceramics into a large number of thin plate wafers with a wire and abrasive grains. The present invention relates to an adjusting method and device.

【0002】[0002]

【従来の技術】ワイヤーソーは、所定ピッチのワイヤー
列に被切断物(以下「ワーク」と称する)を押しつけ、
砥粒を含む加工液(以下「砥液」と称する)を注ぎつつ
ワイヤーとワークを相対運動せしめ、研削作用によって
多数のウエハーに切断する装置である。
2. Description of the Related Art A wire saw presses an object to be cut (hereinafter referred to as "workpiece") against a wire row having a predetermined pitch,
This is an apparatus for cutting a large number of wafers by a grinding action by pouring a working liquid containing abrasive grains (hereinafter referred to as “abrasive liquid”) and causing a wire and a work piece to move relative to each other.

【0003】第1図は、一般的なワイヤソーの切断部を
斜視図で例示したもので、回転自在に保持された3個の
溝ローラ1、2、3の外周面に所定のピッチで刻設され
た多数のリング状の溝に1本のワイヤ4を順次巻き付け
て所定ピッチのワイヤ列5を形成し、このワイヤ列5を
往復あるいは一方向に走行せしめ、ワーク6或いはワイ
ヤ列5に砥液供給ノズル12からの砥液7をかけながらワ
ーク押上台10を徐々に上昇させて切断していく。なお、
ワーク6はダミー板8を介してベース10に取り付けら
れ、ベース固定ボルト11によって固定されている。
FIG. 1 shows a perspective view of a cutting portion of a general wire saw, which is engraved at a predetermined pitch on the outer peripheral surfaces of three rotatably held groove rollers 1, 2, 3. One wire 4 is sequentially wound around the formed numerous groove grooves to form a wire row 5 having a predetermined pitch, and the wire row 5 is made to reciprocate or travel in one direction, and the work 6 or the wire row 5 is subjected to an abrasive liquid. While the polishing liquid 7 from the supply nozzle 12 is being applied, the work push-up base 10 is gradually raised and cut. In addition,
The work 6 is attached to a base 10 via a dummy plate 8 and fixed by a base fixing bolt 11.

【0004】砥液7はSiCなどの砥粒とラッピングオ
イルなどの支持油との混合物であり、適宜、分散剤や増
粘剤を加えて、図示しないタンク内で攪拌しながら凝集
を防ぐように蓄えられている。砥液7は、タンクからワ
イヤソーが備えられた加工室にポンプで供給されたの
ち、タンク内に戻され、再び加工室に供給されるという
ように、循環使用される。
The abrasive liquid 7 is a mixture of abrasive grains such as SiC and a supporting oil such as lapping oil. A dispersant and a thickener are appropriately added to prevent agglomeration while stirring in a tank (not shown). It is stored. The polishing liquid 7 is circulated and used, for example, after being supplied from the tank to the processing chamber provided with the wire saw by a pump, returned to the tank, and then supplied to the processing chamber again.

【0005】砥液は走行するワイヤとワークの間で破砕
されながらワークを少しずつ削りとっていく。すなわ
ち、連続的な切断の過程で、数ミクロンからミリミクロ
ン、あるいはそれ以下の砥粒の微細粉やワークの研削微
細粉が発生し、これらもタンクと加工室の間を循環す
る。しかし、砥粒微細粉やワーク研削粉は切断には寄与
せず、これらが増加すると、砥粒に付着し、切断作用の
妨げとなり、研削能率が悪化していくばかりでなく、ワ
イヤに無理な力が作用する結果、反りに代表される切断
精度が悪化していく。これらの微細粒の影響を緩和する
ためにタンク内の砥液量を多くするなどの対策が取られ
るが、切断回数が増加するにつれて同様の問題が生じて
くることには変わりがない。
The grinding liquid scrapes the work little by little while being crushed between the traveling wire and the work. That is, in the course of continuous cutting, fine powder of abrasive grains of several microns to millimicrons or less or grinding fine powder of the work is generated, and these also circulate between the tank and the processing chamber. However, the fine abrasive powder and the work grinding powder do not contribute to cutting, and if they increase, they adhere to the abrasive and hinder the cutting action, which not only deteriorates the grinding efficiency but also makes it impossible for the wire. As a result of the force acting, the cutting accuracy represented by the warp deteriorates. Measures such as increasing the amount of the abrasive liquid in the tank are taken in order to mitigate the influence of these fine particles, but the same problem still occurs as the number of cuttings increases.

【0006】従来法は、所定の切断回数毎に砥液を交換
したり、新たな砥粒を追加するなどの方法でこの問題に
対処しているが、経済性の面で好ましくない。特公平4
−16309 号公報のように、大量の水を媒質液として用い
て切断中に加工室から戻ってきた砥液から浮遊微細粒を
取り除く方法もあるが、サブミクロンの超微細粒の除去
はできても、数ミクロンの微細粒の除去は難しい。ま
た、水系の砥液では、切断能率と切断精度に限界があ
り、装置も大がかりになるという問題がある。
The conventional method has dealt with this problem by a method such as exchanging the abrasive liquid or adding new abrasive grains every predetermined number of times of cutting, but it is not economically preferable. Tokufair 4
There is also a method of removing a large amount of suspended fine particles from the polishing liquid returned from the processing chamber during cutting using a large amount of water as a medium liquid as in Japanese Patent Publication No. 16309, but it is not possible to remove submicron ultrafine particles. However, it is difficult to remove fine particles of several microns. In addition, the water-based abrasive liquid has a problem in that the cutting efficiency and the cutting accuracy are limited and the apparatus becomes large.

【0007】[0007]

【発明が解決しようとする課題】シリコンに代表される
ような半導体材料は大型化される方向にあり、1回の切
断によって砥液中に混入する微細粒の量が増加する一
方、切断精度はますます厳しくなる。加えて生産性を上
げるために連続切断操業の実現が求められている。本発
明は、使用した砥液から微細粒を取り除き、繰り返し切
断を行いながらも切断精度を確保できる技術の開発を目
的とする。
A semiconductor material typified by silicon tends to be increased in size, and the amount of fine particles mixed in the abrasive liquid increases with one cutting, while the cutting accuracy is improved. It will be more and more severe. In addition, continuous cutting operation is required to increase productivity. It is an object of the present invention to develop a technique capable of removing fine particles from a used polishing liquid and ensuring cutting accuracy while repeatedly cutting.

【0008】[0008]

【課題を解決するための手段】ここに、本発明に要旨と
するところは、砥粒を含む加工液を供給しつつ走行する
ワイヤ列を被切断物に押しつけて複数の切り込みを設け
たり、複数のスライス片に切断するワイヤーソーの加工
液の砥粒調整方法において、前記加工液に遠心力を作用
させて未破砕の砥粒を被切断物の切粉と破砕した砥粒と
から分離し、この分離された未破砕の砥粒を再利用する
ことを特徴とするワイヤーソーの砥粒調整方法である。
SUMMARY OF THE INVENTION Here, the gist of the present invention is to provide a plurality of incisions by pressing a wire row running while supplying a working fluid containing abrasive grains against an object to be cut, In the abrasive adjusting method of the working fluid of the wire saw for cutting into sliced pieces, centrifugal force is applied to the working fluid to separate the uncrushed abrasive from the chips of the material to be cut and the crushed abrasive, This is a method for adjusting the abrasive grains of a wire saw, characterized in that the separated uncrushed abrasive grains are reused.

【0009】別の面からは、本発明は、竪置き円環状の
遠心分離ドラムと前記ドラムの内側に加工液を供給する
供給管と、前記ドラムの上側からオーバーフローする加
工液を再度ドラムに供給する加工液循環系とから構成さ
れ、未破砕の砥粒を前記ドラムの内側面に堆積させ、被
切断物の切粉と破砕した砥粒とを前記供給管とドラムと
加工液循環系とを循環する加工液に濃縮させまたは加工
液とともに系外に排出させることを特徴とするワイヤー
ソーの砥粒調整装置である。
From another aspect, the present invention provides a vertical annular centrifuge drum, a supply pipe for supplying a working fluid to the inside of the drum, and a working fluid overflowing from the upper side of the drum to the drum again. Comprising a machining fluid circulation system to deposit uncrushed abrasive grains on the inner surface of the drum, cutting chips of the workpiece and crushed abrasive grains to the supply pipe, the drum and the machining fluid circulation system. It is an abrasive grain adjusting device for a wire saw, characterized in that it is concentrated in a circulating working liquid or discharged together with the working liquid to the outside of the system.

【0010】[0010]

【作用】次に、添付図面に基づいて本発明の作用を説明
する。図2は新しいグリーンカーボランダムSiC#60
0 砥粒の粒度分布の一例を示し、平均砥粒径は、25μm
前後、分布範囲は10〜60μm である。
Next, the operation of the present invention will be described with reference to the accompanying drawings. Figure 2 shows the new Green Carborundum SiC # 60
0 An example of particle size distribution of abrasive grains is shown, and the average abrasive grain size is 25 μm.
Before and after, the distribution range is 10-60 μm.

【0011】図3は、ワイヤソーで直径200 ×200mm 長
さのシリコンを1回切断した後の砥液中に含まれる粒子
の粒度分布を測定した結果の一例を示し、5μm をピー
クに1〜10μm の範囲に分布を持つ粒子とそれ以下のサ
ブミクロン、ミリミクロンの粒子が増加している。これ
ら10μm 以下の微粒子は、砥粒微細粉、或いはワーク研
削粉である。
FIG. 3 shows an example of the result of measuring the particle size distribution of the particles contained in the polishing liquid after the silicon having a diameter of 200 × 200 mm was cut once by a wire saw, and having a peak at 5 μm of 1 to 10 μm. The number of particles having a distribution in the range and sub-micron and milli-micron particles below that are increasing. These fine particles of 10 μm or less are fine abrasive powder or work grinding powder.

【0012】図4は、同シリコンの切断回数と10μm 以
下の微細粒の量の関係を示し、切断回数の増加と共に微
細粒が蓄積されていくのが分かる。図5は、容量100 リ
ットルのタンクを使用した場合の切断回数と反りの関係
を示す一例で、切断回数が5回を超えると反りが急激に
悪化するのが分かる。例えば、20μm 以下の反りで切断
しようとすれば、切断回数5回が限度となる。この時の
10μm 以下の微細粒の比率は図4より約5vol%である。
FIG. 4 shows the relationship between the number of times of cutting the same silicon and the amount of fine particles of 10 μm or less, and it can be seen that the fine particles accumulate as the number of times of cutting increases. FIG. 5 shows an example of the relationship between the number of cuts and the warp when a tank having a capacity of 100 liters is used. It can be seen that the warp sharply deteriorates when the number of cuts exceeds 5. For example, if an attempt is made to cut with a warp of 20 μm or less, the number of cuts will be 5 times. At this time
The ratio of fine particles of 10 μm or less is about 5 vol% from FIG.

【0013】従って、微粒子量が5%に達するまでにな
んらかの方法で10μm 以下の微細粒を取り除けば、その
砥液は繰り返して使用することが可能になる。ここで、
10μm 以下の微細粒を取り除くとしているのは、図2に
示す新品砥粒の最小粒径が10μm であるためで、これが
例えば20μm の場合には使用後の砥液から20μm 以下の
微細粒を取り除けばよい。砥粒径が小さくなるほどその
砥粒の研削能率は低下するが、10μm 〜20μm の微細粒
も許容するのであれば、10μm 以下の微細粒を除去すれ
ばよい。なお、ワーク研削粉は一般に5μm 以下である
ので、これの除去を主たる目的にするのであれば、5μ
m 以下の微細粒を除去すればよい。そのような微細粒を
取り除く方法としては、遠心分離法を使用する。
Therefore, if the fine particles of 10 μm or less are removed by some method until the amount of fine particles reaches 5%, the polishing liquid can be used repeatedly. here,
The reason for removing fine particles of 10 μm or less is that the minimum grain size of the new abrasive grains shown in FIG. 2 is 10 μm. If this is 20 μm, remove fine particles of 20 μm or less from the used polishing liquid. Good. The smaller the abrasive grain size, the lower the grinding efficiency of the abrasive grains, but if fine grains of 10 μm to 20 μm are allowed, fine grains of 10 μm or less may be removed. Note that the work grinding powder is generally 5 μm or less, so if the main purpose is to remove it, 5 μm
Fine particles of m or less may be removed. A centrifugal separation method is used as a method for removing such fine particles.

【0014】図6に遠心分離機の一例を示すが、図中、
竪置き円環状の遠心分離ドラムを構成する、ドーナツ状
の蓋を持つ円筒容器13(以下回転体容器と呼ぶ)を高速
回転させ、タンク16からポンプ17を用いて中心部に供給
管14から砥液をある流量で連続的に供給する。砥液は円
筒容器13内を上向きに流れる際に遠心力の作用を受け
る。回転体容器13の具体的形状は遠心分離作用が発揮さ
れれば特定のものに制限されない。
FIG. 6 shows an example of a centrifuge. In the figure,
A cylindrical container 13 having a donut-shaped lid (hereinafter, referred to as a rotary container) that constitutes a vertical annular centrifuge drum is rotated at high speed, and a tank 16 is used to pump a pump 17 to a central portion of a supply pipe 14 to be ground. Liquid is continuously supplied at a certain flow rate. The polishing liquid is subjected to the action of centrifugal force when flowing upward in the cylindrical container 13. The specific shape of the rotator container 13 is not limited to a particular one as long as the centrifugal action is exerted.

【0015】微細粒は、表面力より遠心力が小さいため
に回転体容器13側面に捕らえられることなく回転体容器
13の上部よりオーバーフローの流れとしてオーバーフロ
ー回収容器15に排出され砥液戻り口18を経てタンク16に
戻る。その結果、加工液循環系が形成され、回転体容器
13の側面には、粒径の大きい砥粒だけが蓄積され、一方
循環系内の加工液には切粉と破砕した砥粒が蓄積する。
この回転体容器13側面に砥粒は再び支持油と混合して再
切断に使用する。
Since the fine particles have a centrifugal force smaller than the surface force, they are not trapped on the side surface of the rotating body container 13 and are not caught.
It is discharged from the upper part of 13 as an overflow flow into the overflow recovery container 15 and returns to the tank 16 via the polishing liquid return port 18. As a result, the working fluid circulation system is formed, and the rotating container
On the side surface of 13, only the abrasive grains having a large grain size are accumulated, while the cutting fluid and the crushed abrasive grains are accumulated in the working fluid in the circulation system.
The abrasive grains on the side surface of the rotary container 13 are mixed again with the supporting oil and used for re-cutting.

【0016】遠心分離機の分級点(回転体容器13側面に
捕らえられる粒子と流れだされる粒子の境界粒子径)
は、回転体容器13の角速度と砥液の供給流量によって設
定すればよい。それにより任意の大きさで砥粒を分ける
ことができる。
Classification point of the centrifuge (boundary particle diameter between particles captured on the side surface of the rotary container 13 and particles flowing out)
May be set according to the angular velocity of the rotating body container 13 and the supply flow rate of the polishing liquid. Thereby, the abrasive grains can be divided into any size.

【0017】なお、遠心分離する前に砥液に支持油を加
えて希釈すると、砥粒と微細粒とが分散し易くなるの
で、遠心分離の効果は大きくなる。遠心分離を1回実施
しても、分級が不完全な場合には、回収した砥粒に支持
油を加えて希釈し、再び遠心分離機にかければよい。も
ちろんこれを繰り返してもよい。新品砥粒の粒度分布を
希望するものに調整する場合にも上記方法が適用できる
ことは言うまでもない。
If the supporting fluid is added to the polishing liquid to dilute it before centrifuging, the abrasive grains and fine grains are easily dispersed, so that the centrifugal separation effect is enhanced. If the classification is incomplete even after the centrifugation is performed once, it is sufficient to add the supporting oil to the recovered abrasive grains to dilute them, and then re-execute the centrifugal separator. Of course, this may be repeated. It goes without saying that the above method can also be applied when adjusting the particle size distribution of new abrasive grains to a desired one.

【0018】例えば、図11に示すような加工室と遠心分
離機への砥液供給系を用いれば切断加工と遠心分離がで
きる。切断時は弁22-aを開き、弁22-bを閉じた状態でポ
ンプ21を用いて加工室に砥液を供給する。遠心分離する
には、まず弁22-aを閉じ、弁22-bを開いた状態で遠心
分離用タンク16に砥液を溜める。次に、弁20-aを開
き、弁20-bを閉じた状態で遠心分離用ポンプ17を用いて
砥液を循環させながら回転体容器13を回転させて遠心分
離を行う。回転体容器13に砥粒が一杯になれば、回転
体容器13を停止し砥粒を取り出す。回転体容器13に砥
粒が溜まらなくなるまでを繰り返す。その後、弁
20-aを閉じ、弁20-bを開いて切粉や破砕した砥粒を含む
加工液を排出する。砥液タンク23の砥液がなくなるま
で〜を繰り返す。なお、符号19、24は攪拌機を示
し、その他図6と同一符号は同一部材を示す。
For example, cutting processing and centrifugation can be performed by using a grinding chamber and a polishing liquid supply system for the centrifuge as shown in FIG. At the time of cutting, the valve 22-a is opened and the valve 22-b is closed, and the pump 21 is used to supply the abrasive liquid to the processing chamber. To centrifuge, first the valve 22-a is closed and the valve 22-b is opened, and the polishing liquid is stored in the centrifugal separation tank 16. Next, with the valve 20-a open and the valve 20-b closed, the rotary container 13 is rotated while circulating the polishing liquid using the centrifugal pump 17 to perform centrifugal separation. When the rotary container 13 is filled with the abrasive grains, the rotary container 13 is stopped and the abrasive grains are taken out. The process is repeated until the abrasive grains are not accumulated in the rotating body container 13. Then the valve
20-a is closed and valve 20-b is opened to discharge the working fluid containing chips and crushed abrasive grains. The steps from to are repeated until the polishing liquid in the polishing liquid tank 23 is exhausted. In addition, reference numerals 19 and 24 denote agitators, and the same reference numerals as those in FIG. 6 denote the same members.

【0019】図12に回転体容器13から砥粒を取り出す操
作の例を示す。図12(a) のように、回転体容器13内部に
布袋26を装着しておき、遠心分離し、回転体容器停止
後、布袋26ごと砥粒を取り出す方法がある。また、図12
(b) のように、底に穴の開いたオーバーフロー回収容器
15と回転体容器13を使用すれば、遠心分離後、回転体容
器を低速で回転させながら掻取装置27で砥粒を下方へ掻
き落とすことができる。次に、実施例によって本発明の
作用効果をさらに詳細に説明する。
FIG. 12 shows an example of an operation of taking out the abrasive grains from the rotary body container 13. As shown in FIG. 12 (a), there is a method in which the cloth bag 26 is mounted inside the rotary body container 13, is centrifuged, and after the rotary body container is stopped, the abrasive grains are taken out together with the cloth bag 26. Also, FIG.
Overflow collection container with a hole in the bottom as shown in (b)
If 15 and the rotator container 13 are used, the abrasive particles can be scraped downward by the scraping device 27 after the centrifugal separation while rotating the rotator container at a low speed. Next, the function and effect of the present invention will be described in more detail with reference to Examples.

【0020】[0020]

【実施例】【Example】

(実施例1)図4に示す如く、10回連続して切断に使用
した砥液には、10μm 以下の砥粒が約13wt%含まれる。
この砥液を希釈して比重を1.30に調整した後、図6に示
す内径a=150mm の遠心分離ドラムである回転体円筒13
を用いて遠心分離し、ドラム内側に堆積した砥粒中の10
μm 以下の砥粒の割合を調べた結果を表1に示す。 遠心分離回転ドラム寸法:a=150 、b=200 、h=15
0 (mm) 上段:10μm 以下の砥粒の含有率(%) 下段:砥粒の回収率(%)
(Example 1) As shown in FIG. 4, the abrasive liquid used for cutting 10 times in succession contained about 13 wt% of abrasive grains of 10 μm or less.
After the specific gravity was adjusted to 1.30 by diluting this polishing liquid, the rotor cylinder 13 shown in FIG. 6 which is a centrifugal separation drum with an inner diameter a = 150 mm.
10 of the abrasive grains deposited inside the drum after centrifugation using a
Table 1 shows the results of examining the proportion of abrasive grains having a size of μm or less. Centrifuge rotary drum dimensions: a = 150, b = 200, h = 15
0 (mm) Upper: content of abrasive grains of 10 μm or less (%) Lower: recovery of abrasive grains (%)

【0021】[0021]

【表1】 [Table 1]

【0022】ドラム回転数が800rpmと高いと遠心力増加
のため、10μm 以下の砥粒がドラム内側に堆積する。ま
た、ドラムの回転数が600rpmと低い場合、流量が多くな
ると砥粒の回収率が悪くなる。
When the rotation speed of the drum is as high as 800 rpm, centrifugal force is increased, and thus abrasive grains of 10 μm or less are deposited inside the drum. Further, when the rotation speed of the drum is as low as 600 rpm, the recovery rate of the abrasive grains becomes poor as the flow rate increases.

【0023】10回連続して切断に使用した砥液を希釈し
て比重を1.30に調整した後、内径a=400mm の遠心分離
ドラムを用いて遠心分離し、ドラム内側に堆積した砥粒
中の10μm 以下の砥粒の割合を調べた結果を表2に示
す。 遠心分離回転ドラム寸法:a=400 、b=530 、h=20
0 (mm) 上段:10μm 以下の砥粒の含有率(%) 下段:砥粒の回収率(%)
After the abrasive liquid used for cutting was continuously diluted 10 times to adjust the specific gravity to 1.30, it was centrifuged using a centrifuge drum having an inner diameter a = 400 mm to remove the abrasive grains in the inside of the drum. Table 2 shows the results of examining the ratio of abrasive grains having a size of 10 μm or less. Centrifuge rotary drum dimensions: a = 400, b = 530, h = 20
0 (mm) Upper: content of abrasive grains of 10 μm or less (%) Lower: recovery of abrasive grains (%)

【0024】[0024]

【表2】 [Table 2]

【0025】様々なドラム寸法でのドラム内側に堆積し
た砥粒中の10μm 以下の砥粒の割合を表3に示す。
Table 3 shows the ratio of the abrasive grains of 10 μm or less in the abrasive grains deposited on the inner side of the drums at various drum sizes.

【0026】[0026]

【表3】 [Table 3]

【0027】ドラム寸法が増加するにつれて砥液の攪拌
状態が良くなるため、10μm 以下の砥粒の含有量が減少
する。しかし、ドラム寸法が増加し過ぎると、循環砥液
の量が増加し過ぎ、安定した循環が困難となり、逆に分
離能力が低下する。従って、ドラム寸法aは、150 〜40
0 mmが適当である。
As the size of the drum increases, the agitation state of the abrasive liquid improves, so that the content of abrasive grains of 10 μm or less decreases. However, if the drum size increases too much, the amount of the circulating abrasive liquid increases too much, which makes stable circulation difficult, and conversely reduces the separation ability. Therefore, the drum dimension a is 150-40
0 mm is suitable.

【0028】(実施例2)断面直径200mm 、長さ180 mm
のシリコンインゴットをグリーンカーボランダムSiC
#600 砥粒130kg とラッピングオイルからなる砥液100
リットルを用い、ワイヤ直径0.18mm、ワイヤピッチ1.15
mm、ワイヤ列数150 の条件で4回連続して切断した後、
(分級点10μm の設定で)遠心分離し、回収した砥粒と
ラッピングオイルと混合して砥液を作り、その後の切断
を行った。このとき、遠心分離ドラムの寸法、a=400
、b=500 、h=200 回転数600rpm、流量50リットル/
分とした。
(Embodiment 2) Sectional diameter 200 mm, length 180 mm
Silicon ingot of green carborundum SiC
# 600 Abrasive 100 consisting of 130 kg of abrasive grains and lapping oil
Using liter, wire diameter 0.18mm, wire pitch 1.15
mm, the number of wire rows is 150, after cutting 4 times continuously,
After centrifugation (with a classification point of 10 μm), the recovered abrasive grains were mixed with lapping oil to make a polishing liquid, and the cutting was performed thereafter. At this time, the size of the centrifuge drum, a = 400
, B = 500, h = 200, rotation speed 600 rpm, flow rate 50 liters /
Minutes

【0029】図7は各切断回数毎に砥液中の10μm 以下
の微細粒の割合を測定した結果で、7回目の切断まで5v
ol%以下に制御することができた。8回目の切断を実施
するためには、再び遠心分離により10μm 以下の微細粒
を取り除く必要がある。図8は、各切断回数毎の反りの
平均値を示し、これからも分かるように、本例では17μ
m 以下の反りで切断を続けることができた。
FIG. 7 shows the result of measuring the ratio of fine particles of 10 μm or less in the polishing liquid for each cutting number, which is 5v until the 7th cutting.
It was possible to control below ol%. In order to carry out the eighth cutting, it is necessary to remove fine particles of 10 μm or less by centrifugation again. FIG. 8 shows the average value of the warpage for each number of cuts. As can be seen from this, in this example, 17 μ
We were able to continue cutting with a warp of m or less.

【0030】これに対し、従来法では4回目の切断後に
砥液を更新して7回の切断を行うために合計260kg の砥
粒を必要とした。すなわち、本発明の方法を採用するこ
とによって、砥粒の使用量を半減することができた。
On the other hand, in the conventional method, a total of 260 kg of abrasive grains was required to replace the abrasive liquid after the fourth cutting and perform the cutting seven times. That is, by using the method of the present invention, the amount of abrasive grains used could be reduced by half.

【0031】(実施例3)断面直径170mm 、長さ300mm
の石英インゴットをグリーンカーボランダムSiC#60
0 砥粒130kg とラッピングオイルからなる砥液100 リッ
トルを用い、ワイヤ直径0.20mm、ワイヤピッチ1.6mm 、
ワイヤ列数150 の条件で4回連続して切断した。その
後、砥液にラッピングオイルを100 リットル加えて希釈
し、遠心分離した。遠心分離ドラム寸法と回転数、流量
は、実施例1と等しくした。回収した砥粒とラッピング
オイルとを混合して砥液を作り、引き続き切断を行っ
た。
Example 3 Cross-sectional diameter 170 mm, length 300 mm
Of quartz ingot of green carborundum SiC # 60
0 Using 100 liter of abrasive liquid consisting of 130 kg of abrasive grains and lapping oil, wire diameter 0.20 mm, wire pitch 1.6 mm,
It cut | disconnecting 4 times continuously on condition of the wire row number 150. Then, 100 liters of lapping oil was added to the polishing liquid to dilute it and then centrifuged. The centrifuge drum size, rotation speed, and flow rate were the same as in Example 1. The recovered abrasive grains and lapping oil were mixed to prepare a polishing liquid, and the cutting was subsequently performed.

【0032】図9は各切断回数毎に砥液中の10μm 以下
の微細粒の割合を測定した結果で、実施例1と比べると
5回目に用いた砥液中の10μm 以下の微細粒の割合は1v
ol%と小さいが、これは遠心分離前に砥液を希釈した効
果である。このため、実施例1より1回多い8回目の切
断まで、砥液中の10μm 以下の微細粒の割合を5vol%以
下に抑制することができた。図10は各切断回数毎の反り
の平均値を示し、これからも分かるように本例では20μ
m 以下の反りで切断を続けることができた。
FIG. 9 shows the results of measuring the proportion of fine particles of 10 μm or less in the polishing liquid for each number of cuts. Compared with Example 1, the proportion of fine particles of 10 μm or less in the polishing liquid used for the fifth time was measured. Is 1v
Although it is as small as ol%, this is the effect of diluting the polishing liquid before centrifugation. For this reason, the proportion of fine particles of 10 μm or less in the polishing liquid could be suppressed to 5 vol% or less until the eighth cutting, which is one more than in Example 1. Figure 10 shows the average value of the warpage for each number of cuts.
We were able to continue cutting with a warp of m or less.

【0033】[0033]

【発明の効果】従来法では高切断精度を保ちつつ連続す
るためには、数回切断毎に砥液を全て交換する必要があ
り、砥粒に関するランニングコストが大きかった。本発
明に従えば、φ200 以上の大口径切断に対してもコスト
のかからない、安定した高速度連続切断をすることがで
きる。
According to the conventional method, in order to maintain high cutting accuracy and to continue the cutting, it is necessary to replace the abrasive liquid every several cuttings, and the running cost for the abrasive grains is large. According to the present invention, stable high-speed continuous cutting can be performed at low cost even for large diameter cutting of φ200 or more.

【図面の簡単な説明】[Brief description of drawings]

【図1】円形断面を持つワークの切断状況を例示した正
面斜視図である。
FIG. 1 is a front perspective view illustrating a cutting state of a work having a circular cross section.

【図2】新しいグリーンカーボランダムSiC#600 砥
粒の粒度分布の一例を示す粒度分布グラフである。
FIG. 2 is a particle size distribution graph showing an example of the particle size distribution of new green carborundum SiC # 600 abrasive grains.

【図3】1回切断した後の砥液中の粒度分布を測定した
結果の一例を示す粒度分布グラフである。
FIG. 3 is a particle size distribution graph showing an example of the result of measuring the particle size distribution in the polishing liquid after cutting once.

【図4】従来法による連続切断における10μm 以下の微
粒子の割合の変化を示すグラフである。
FIG. 4 is a graph showing changes in the proportion of fine particles of 10 μm or less in continuous cutting by a conventional method.

【図5】従来法による連続切断における反りの変化を示
すグラフである。
FIG. 5 is a graph showing changes in warpage during continuous cutting according to a conventional method.

【図6】本発明において用いる遠心分離機の略式説明図
である。
FIG. 6 is a schematic explanatory view of a centrifuge used in the present invention.

【図7】本発明法によるシリコン連続切断における10μ
m 以下の微粒子の割合の変化の一例を示すグラフであ
る。
FIG. 7: 10μ in continuous cutting of silicon by the method of the present invention
6 is a graph showing an example of changes in the proportion of fine particles of m or less.

【図8】本発明法によるシリコン連続切断における反り
の変化の一例を示すグラフである。
FIG. 8 is a graph showing an example of changes in warpage during continuous silicon cutting according to the method of the present invention.

【図9】本発明法による石英連続切断における10μm 以
下の微粒子の割合の変化の一例を示すグラフである。
FIG. 9 is a graph showing an example of changes in the proportion of fine particles of 10 μm or less in continuous quartz cutting according to the method of the present invention.

【図10】本発明法による、石英連続切断における反り
の変化の一例を示すグラフである。
FIG. 10 is a graph showing an example of changes in warpage during continuous quartz cutting according to the method of the present invention.

【図11】加工室と遠心分離機への砥液供給系の一例を
示す説明図である。
FIG. 11 is an explanatory diagram showing an example of a polishing liquid supply system to a processing chamber and a centrifuge.

【図12】砥粒を遠心分離機から取り出す操作の一例を
示す説明図である。
FIG. 12 is an explanatory diagram showing an example of an operation of taking out abrasive grains from the centrifugal separator.

【符号の説明】[Explanation of symbols]

1、2、3:溝ローラ 16:遠心分離用タンク 4:ワイヤ 17:遠心分離用ポンプ 5:ワイヤ列 18:砥液戻り口 6:ワーク 19:攪拌機 7:砥液 20:弁 8:ダミー板 21:ポンプ 9:ベース 22:弁 10:押上台 23:砥液タンク 11:ベース固定ボルト 24:攪拌機 12:砥液供給ノズル 25:砥液戻り口 13:回転体容器 26:布袋 14:砥液供給管 27:砥粒掻取装置 15:オーバーフロー回収容器 1, 2, 3: Groove roller 16: Centrifuge tank 4: Wire 17: Centrifuge pump 5: Wire row 18: Abrasive fluid return port 6: Workpiece 19: Stirrer 7: Abrasive fluid 20: Valve 8: Dummy plate 21: Pump 9: Base 22: Valve 10: Push-up base 23: Abrasive fluid tank 11: Base fixing bolt 24: Stirrer 12: Abrasive fluid supply nozzle 25: Abrasive fluid return port 13: Rotating body container 26: Cloth bag 14: Abrasive fluid Supply pipe 27: Abrasive scraping device 15: Overflow collection container

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 砥粒を含む加工液を供給しつつ走行する
ワイヤ列を被切断物に押しつけて複数の切り込みを設け
たり、複数のスライス片に切断するワイヤーソーの加工
液の砥粒調整方法において、前記加工液に遠心力を作用
させて未破砕の砥粒を被切断物の切粉と破砕した砥粒と
から分離し、この分離された未破砕の砥粒を再利用する
ことを特徴とするワイヤーソーの砥粒調整方法。
1. A method for adjusting an abrasive grain of a working fluid of a wire saw, in which a wire row running while supplying a working fluid containing abrasive grains is pressed against an object to be cut to provide a plurality of cuts or a plurality of sliced pieces are cut. In, the centrifugal force is applied to the working liquid to separate the uncrushed abrasive grains from the chips of the object to be cut and the crushed abrasive grains, and the separated uncrushed abrasive grains are reused. How to adjust the abrasive grain of the wire saw.
【請求項2】 竪置き円環状の遠心分離ドラムと、前記
ドラムの内側に加工液を供給する供給管と、前記ドラム
の上側からオーバーフローする加工液を再度ドラムに供
給する加工液循環系とから構成され、未破砕の砥粒を前
記ドラムの内側面に堆積させ、被切断物の切粉と破砕し
た砥粒とを前記供給管とドラムと加工液循環系とを循環
する加工液に濃縮させまたは該加工液とともに系外に排
出させることを特徴とするワイヤーソーの砥粒調整装
置。
2. A vertical annular centrifuge drum, a supply pipe for supplying the working liquid to the inside of the drum, and a working liquid circulation system for supplying the working liquid overflowing from the upper side of the drum to the drum again. The uncrushed abrasive grains are deposited on the inner surface of the drum, and the chips of the object to be cut and the crushed abrasive grains are concentrated into a working fluid that circulates through the supply pipe, the drum, and the working fluid circulation system. Alternatively, an abrasive grain adjusting device for a wire saw, which is discharged out of the system together with the working liquid.
JP30927494A 1994-12-13 1994-12-13 Abrasive grain adjustment method and apparatus Expired - Lifetime JP2976828B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30927494A JP2976828B2 (en) 1994-12-13 1994-12-13 Abrasive grain adjustment method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30927494A JP2976828B2 (en) 1994-12-13 1994-12-13 Abrasive grain adjustment method and apparatus

Publications (2)

Publication Number Publication Date
JPH08168950A true JPH08168950A (en) 1996-07-02
JP2976828B2 JP2976828B2 (en) 1999-11-10

Family

ID=17991028

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30927494A Expired - Lifetime JP2976828B2 (en) 1994-12-13 1994-12-13 Abrasive grain adjustment method and apparatus

Country Status (1)

Country Link
JP (1) JP2976828B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990010445A (en) * 1997-07-16 1999-02-18 윤종용 Method for preparing a chemical mechanical polishing composition
CN110883609A (en) * 2019-12-06 2020-03-17 福建工程学院 Magnetorheological polishing device convenient to operate

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990010445A (en) * 1997-07-16 1999-02-18 윤종용 Method for preparing a chemical mechanical polishing composition
CN110883609A (en) * 2019-12-06 2020-03-17 福建工程学院 Magnetorheological polishing device convenient to operate

Also Published As

Publication number Publication date
JP2976828B2 (en) 1999-11-10

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