JPH08136452A - Moisture meter - Google Patents

Moisture meter

Info

Publication number
JPH08136452A
JPH08136452A JP29593494A JP29593494A JPH08136452A JP H08136452 A JPH08136452 A JP H08136452A JP 29593494 A JP29593494 A JP 29593494A JP 29593494 A JP29593494 A JP 29593494A JP H08136452 A JPH08136452 A JP H08136452A
Authority
JP
Japan
Prior art keywords
moisture
signal
measured
light
wavelength band
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP29593494A
Other languages
Japanese (ja)
Inventor
Isao Hishikari
功 菱刈
Katsuyuki Miyauchi
克之 宮内
Takao Shimizu
孝雄 清水
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chino Corp
Original Assignee
Chino Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chino Corp filed Critical Chino Corp
Priority to JP29593494A priority Critical patent/JPH08136452A/en
Publication of JPH08136452A publication Critical patent/JPH08136452A/en
Pending legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE: To accurately measure moisture regardless of change in material and the like for an object and the like to be measured. CONSTITUTION: The light of a light source 1 is projected to a measured object 3 through a projecting lens 2, transmitted light or reflected light is injected to a detection element 6 by a condensing lens 4 through filters 51 and 52 provided for a rotating sector 5, which have the comparison wave lengths of λ1 and λ3 free from moisture and the like, and the measuring wave length of λ2, its output signal is amplified by an amplifier 7, it is then transformed into signals R1, S and R2 corresponding to the respective wave lengths by a signal separation and rectifier 8 so as to be separately taken out by a synchronous signal generator 9, and its moisture percentage is then operated by an operating means 10 through an integrated analytical curve.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、赤外線を利用して被
測定対象の水分率を測定する水分計に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a moisture meter for measuring the moisture content of an object to be measured using infrared rays.

【0002】[0002]

【従来の技術】従来、赤外線を利用して水分率を測定す
るには、水分の吸収波長帯における被測定対象からの反
射光ないし透過光の測定信号と、水分の非吸収帯におけ
る反射光ないし透過光の1または2の比較信号との比率
信号から被測定対象の水分率を求める2色または3色赤
外線水分計が知られている。
2. Description of the Related Art Conventionally, in order to measure the moisture content by using infrared rays, the measurement signal of the reflected light or transmitted light from the object to be measured in the absorption wavelength band of moisture and the reflected light in the non-absorption band of moisture or There is known a two-color or three-color infrared moisture meter that obtains the moisture content of an object to be measured from a ratio signal of transmitted light to one or two comparison signals.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、紙等の
被測定対象物の品種が異なると出力特性が変化してしま
う問題点がある。この原因の1つとして、材質等が変化
するため、分光特性が変化し、出力特性が変化するため
であると考えられ、この影響を取り除くため、出願人
は、特公昭61−61623号公報で補正方式を提案し
ているが、十分ではない面があった。
However, there is a problem that the output characteristic changes when the kind of the object to be measured such as paper is different. It is considered that one of the causes for this is that the spectral characteristics and the output characteristics change due to changes in the materials and the like. To eliminate this effect, the applicant has disclosed in Japanese Patent Publication No. 61-61623. We have proposed a correction method, but there were aspects that were not sufficient.

【0004】この発明の目的は、以上の点に鑑み、被測
定対象の材質等の変化があっても、高精度の測定が可能
な水分計を提供することである。
In view of the above points, an object of the present invention is to provide a moisture meter capable of highly accurate measurement even if the material or the like of the object to be measured changes.

【0005】[0005]

【課題を解決するための手段】この発明は、水分の吸収
波長帯に測定波長帯を設けこの波長帯における被測定対
象からの透過光ないし反射光を第1の信号とし、前記水
分の吸収波長帯以外に少なくとも1つの波長帯を設けこ
の波長帯における被測定対象からの透過光ない反射光を
第2の信号とし、第1の信号と少なくとも1つの第2の
信号との比率信号から水分率を求める水分計において、
被測定対象の複数の種別について各々2つの基準水分率
を測定したときの前記比率信号出力が2つの基準水分率
について一致する検量線を求め、この検量線から水分率
を演算するようにした水分計。
According to the present invention, a measurement wavelength band is provided in an absorption wavelength band of moisture, and transmitted light or reflected light from an object to be measured in this wavelength band is used as a first signal, and the absorption wavelength of the moisture is At least one wavelength band other than the band is provided, and the transmitted light or the reflected light from the measurement target in this wavelength band is used as the second signal, and the moisture content is calculated from the ratio signal of the first signal and at least one second signal. In a moisture meter that requires
A moisture content is obtained by obtaining a calibration curve in which the ratio signal output when measuring two reference moisture contents for each of a plurality of types of objects to be measured matches the two reference moisture contents, and calculating the moisture content from the calibration curve. Total.

【0006】[0006]

【実施例】図1は、この発明を透過式の赤外線水分計に
適用した一実施例を示す構成説明図である。1は投光用
の光源で、この光源1の光は投光用レンズ2より被測定
対象3に投光され、その透過光または反射光は集光レン
ズ4により回転セクタ5に設けられたそれぞれ透過波長
λ1、λ2、λ3をもつフィルタ51、52、53を介
しPbS、PbSe、Ge、サーミスタボロメータ、S
i、InGaAs等よりなる検出素子6に入射される。
この検出素子6の検出信号は増幅器7により増幅され、
信号分離・整流器8において、回転セクタ5のフィルタ
51、52、53の上記波長λ1、λ2、λ3に対する
信号R1、S、R2を回転セクタ5に設けられた同期信
号発生器9の同期信号により分離し、整流して取り出
す。この信号R1、S、R2は、マイクロコンピュータ
のような演算手段10により、第1の信号Sと少なくと
も1つの第2の信号R1、R2との比率信号等から水分
率を求め、出力端子11より水分信号を取り出すことが
できる。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a structural explanatory view showing an embodiment in which the present invention is applied to a transmission type infrared moisture meter. Reference numeral 1 denotes a light source for projecting light, and the light from this light source 1 is projected onto an object 3 to be measured by a projecting lens 2, and its transmitted light or reflected light is provided on a rotating sector 5 by a condenser lens 4, respectively. PbS, PbSe, Ge, thermistor bolometer, S through filters 51, 52, 53 having transmission wavelengths λ1, λ2, λ3.
The light enters the detection element 6 made of i, InGaAs or the like.
The detection signal of the detection element 6 is amplified by the amplifier 7,
In the signal separation / rectifier 8, the signals R1, S, R2 for the wavelengths λ1, λ2, λ3 of the filters 51, 52, 53 of the rotating sector 5 are separated by the synchronizing signal of the synchronizing signal generator 9 provided in the rotating sector 5. Then, rectify and take out. The signals R1, S, R2 are calculated from a ratio signal of the first signal S and at least one second signal R1, R2, etc., by a calculation means 10 such as a microcomputer, and the moisture content is calculated from an output terminal 11. The moisture signal can be retrieved.

【0007】また、図2は反射式の赤外線水分計の一実
施例を示し光源1の光が集光レンズ2により回転セクタ
5のフィルタ51、52、53を透過してミラーM1に
より波長λ1、λ2、λ3の光が被測定対象3に投光さ
れ、反射光が凹面鏡M2により検出素子6に入射され
る。この検出素子6の出力信号は増幅器7により増幅さ
れ、信号分離・整流器8より信号R1、S、R2が取り
出され、演算手段10により演算を行い、出力端子11
より水分信号を取り出すことができる。
FIG. 2 shows an embodiment of a reflection type infrared moisture meter, in which the light from the light source 1 is transmitted through the filters 51, 52 and 53 of the rotating sector 5 by the condenser lens 2 and the wavelength λ1, by the mirror M1. Lights λ2 and λ3 are projected onto the object 3 to be measured, and reflected light is incident on the detection element 6 by the concave mirror M2. The output signal of the detecting element 6 is amplified by the amplifier 7, the signals R1, S and R2 are taken out from the signal separating / rectifying device 8, the calculating means 10 performs the calculation, and the output terminal 11
More moisture signal can be taken out.

【0008】つまり、図3で示すように、図1、図2の
演算手段10よりも前の構成部分を検出部Aとし、被測
定対象3の種々の品種のサンプルについてあらかじめ測
定し、検量線を求めておく。たとえばある第1の種別に
ついて、X1(=0%)とX2(=10%)ような2つ
の基準水分率の基準体31、32を測定したときの上記
比率信号出力yから図4(a)で示す検量線aを作成す
る。次いで、他の第2、第3の複数の種別のサンプルに
ついて各々2つの基準水分率を測定したときの上記出力
から図4(a)を示す検量線b、cを作成する。そし
て、これら3本の検量線a、b、cの出力yが、2つの
基準点x1、x2の各々について一致させるように規格
化し、あらかじめ一本の図4(b)で示す検量線dを求
める。
That is, as shown in FIG. 3, the constituent portion before the arithmetic means 10 of FIGS. 1 and 2 is used as the detection unit A, and various kinds of samples of the object 3 to be measured are preliminarily measured to obtain a calibration curve. Ask for. For example, for a certain first type, from the ratio signal output y when measuring the reference bodies 31 and 32 having two reference moisture contents such as X1 (= 0%) and X2 (= 10%), FIG. A calibration curve a shown by is created. Next, calibration curves b and c shown in FIG. 4A are created from the above outputs when two reference moisture contents are measured for each of the other second and third plural types of samples. Then, the outputs y of these three calibration curves a, b, and c are standardized so as to match each of the two reference points x1 and x2, and one calibration curve d shown in FIG. Ask.

【0009】このことにより、この一本の検量線dに基
き、上記種別の水分測定が可能となる。また、その他の
種別についても測定を実施し、検量線を一本で測定可能
とすることができる。これらの種別の数は多いほどよ
く、基準点x1、x2(ゼロ点、スパン点)は、絶乾状
態とした0%H2 O、および所定の10%H2 Oの他に
任意の2点でもよい。また、2点でなく、それ以上の点
について一致するよう補正してもよい。
This makes it possible to measure the water content of the above type based on this one calibration curve d. In addition, it is possible to perform measurement for other types as well, so that it is possible to measure with one calibration curve. The larger the number of these types, the better. The reference points x1 and x2 (zero point, span point) are 0% H 2 O in the absolutely dry state, and any 2 points other than the specified 10% H 2 O. But it's okay. Further, the correction may be performed so that the points are not equal to two points, but more points.

【0010】たとえば、3本の検量線a、b、cが次式
で表わせたとする。
For example, assume that three calibration curves a, b, and c are expressed by the following equation.

【0011】 y=a1x+b1 (1) y=a2x+b2 (2) y=a3x+b3 (3) (2)式に(1)、(3)を一致させるには、b2−b
1、又はb2−b3を加算し、次いで係数a2/a1、
a2/a3を乗算する等の演算処理を行うとよい。この
ように、ゼロ点、スパン点補正を行った信号を用いるこ
とで検量線を一本化しおけば、さまざまな種別のものに
ついて、一本の検量線で十分精度よく測定できる。な
お、これらの演算は、演算手段10で実施される。
Y = a1x + b1 (1) y = a2x + b2 (2) y = a3x + b3 (3) To match equations (1) and (3) with equation (2), b2-b
1 or b2-b3, then the coefficients a2 / a1,
It is preferable to perform arithmetic processing such as multiplication by a2 / a3. In this way, if the calibration curve is unified by using the signals for which the zero point and the span point are corrected, it is possible to measure various types with a sufficient accuracy with one calibration curve. Note that these calculations are carried out by the calculation means 10.

【0012】[0012]

【発明の効果】以上述べたように、この発明は、被測定
対象の複数の種々について各々2個の基準水分率を測定
したときの比率信号出力が2つの基準水分率について一
致する検量線を求めこの検量線から被測定対象の水分率
を測定するようにした水分計である。
As described above, according to the present invention, a calibration curve in which the ratio signal output when two reference moisture percentages are measured for each of a plurality of types of objects to be measured is the same for the two reference moisture percentages is obtained. This is a moisture meter that is used to measure the moisture content of the measurement target from this calibration curve.

【0013】従って、紙等の被測定対象の坪量等の材質
が変化したとしても、上記補正を行うことで品種が変わ
っても、あらかじめ求めた最適な一本化された検量線に
より高精度の正しい水分測定信号が常に得られ、紙等の
品種の変化に自動的に対応でき、大幅な工数低減が図れ
る。またこれを利用して、多品種少量生産工程におい
て、完全に近い自動化が図れ、常に高品質の製品が生産
でき、実用的効果はきわめて大きい。
Therefore, even if the material such as the grammage of the object to be measured such as paper is changed, even if the kind is changed by the above correction, high accuracy can be obtained by the optimum integrated calibration curve obtained in advance. A correct moisture measurement signal can always be obtained, and it can automatically respond to changes in paper and other product types, and can significantly reduce man-hours. Also, by utilizing this, in a high-mix low-volume production process, nearly complete automation can be achieved, and high quality products can always be produced, and the practical effect is extremely large.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の一実施例を示す構成説明図である。FIG. 1 is a structural explanatory view showing an embodiment of the present invention.

【図2】この発明の一実施例を示す構成説明図である。FIG. 2 is a structural explanatory view showing an embodiment of the present invention.

【図3】この発明の一実施例を示す構成説明図である。FIG. 3 is a structural explanatory view showing an embodiment of the present invention.

【図4】この発明の一実施例を示す動作説明図である。FIG. 4 is an operation explanatory diagram showing an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 光源 3 被測定対象 5 回転セクタ 51、52、53 フィルタ 6 検出素子 7 増幅器 8 信号・分離整流器 9 同期信号発生器 10 演算手段 DESCRIPTION OF SYMBOLS 1 light source 3 object to be measured 5 rotating sector 51, 52, 53 filter 6 detection element 7 amplifier 8 signal / separation rectifier 9 synchronization signal generator 10 computing means

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】水分の吸収波長帯に測定波長帯を設けこの
波長帯における被測定対象からの透過光ないし反射光を
第1の信号とし、前記水分の吸収波長帯以外に少なくと
も1つの波長帯を設けこの波長帯における被測定対象か
らの透過光ない反射光を第2の信号とし、第1の信号と
少なくとも1つの第2の信号との比率信号から水分率を
求める水分計において、被測定対象の複数の種別につい
て各々2つの基準水分率を測定したときの前記比率信号
出力が2つの基準水分率について一致する検量線を求
め、この検量線から水分率を演算することを特徴とする
水分計。
1. A measurement wavelength band is provided in a water absorption wavelength band, and transmitted light or reflected light from an object to be measured in this wavelength band is used as a first signal, and at least one wavelength band other than the water absorption wavelength band. In the moisture meter for measuring moisture content from the ratio signal of the first signal and at least one second signal, the reflected light from the object to be measured in this wavelength band is used as the second signal. A moisture content is characterized in that a calibration curve is obtained in which the ratio signal outputs when two reference moisture contents are measured for each of a plurality of target types are matched for the two reference moisture contents, and the moisture content is calculated from this calibration curve. Total.
JP29593494A 1994-11-04 1994-11-04 Moisture meter Pending JPH08136452A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29593494A JPH08136452A (en) 1994-11-04 1994-11-04 Moisture meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29593494A JPH08136452A (en) 1994-11-04 1994-11-04 Moisture meter

Publications (1)

Publication Number Publication Date
JPH08136452A true JPH08136452A (en) 1996-05-31

Family

ID=17827015

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29593494A Pending JPH08136452A (en) 1994-11-04 1994-11-04 Moisture meter

Country Status (1)

Country Link
JP (1) JPH08136452A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010004999A1 (en) * 2008-07-07 2010-01-14 新日本製鐵株式会社 Method for measuring water content in a compound and water content measuring device
CN104246477A (en) * 2012-03-28 2014-12-24 横河电机株式会社 Substance properties measuring device
CN113841040A (en) * 2019-06-20 2021-12-24 松下知识产权经营株式会社 Sensitivity adjustment plate and method for manufacturing sensor device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010004999A1 (en) * 2008-07-07 2010-01-14 新日本製鐵株式会社 Method for measuring water content in a compound and water content measuring device
JP4890645B2 (en) * 2008-07-07 2012-03-07 新日本製鐵株式会社 Moisture measurement method for blended raw materials
CN104246477A (en) * 2012-03-28 2014-12-24 横河电机株式会社 Substance properties measuring device
JPWO2013147038A1 (en) * 2012-03-28 2015-12-14 横河電機株式会社 Material property measuring device
CN113841040A (en) * 2019-06-20 2021-12-24 松下知识产权经营株式会社 Sensitivity adjustment plate and method for manufacturing sensor device
CN113841040B (en) * 2019-06-20 2024-03-22 松下知识产权经营株式会社 Sensitivity adjustment plate and method for manufacturing sensor device

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