JPH0810785Y2 - 広視野磁場掃引装置 - Google Patents

広視野磁場掃引装置

Info

Publication number
JPH0810785Y2
JPH0810785Y2 JP1990018453U JP1845390U JPH0810785Y2 JP H0810785 Y2 JPH0810785 Y2 JP H0810785Y2 JP 1990018453 U JP1990018453 U JP 1990018453U JP 1845390 U JP1845390 U JP 1845390U JP H0810785 Y2 JPH0810785 Y2 JP H0810785Y2
Authority
JP
Japan
Prior art keywords
sample
magnetic field
light
wide
yoke
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1990018453U
Other languages
English (en)
Japanese (ja)
Other versions
JPH03109157U (cs
Inventor
和憲 蛯沢
三行 重久
知行 深沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jasco Corp
Original Assignee
Jasco Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jasco Corp filed Critical Jasco Corp
Priority to JP1990018453U priority Critical patent/JPH0810785Y2/ja
Publication of JPH03109157U publication Critical patent/JPH03109157U/ja
Application granted granted Critical
Publication of JPH0810785Y2 publication Critical patent/JPH0810785Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP1990018453U 1990-02-26 1990-02-26 広視野磁場掃引装置 Expired - Lifetime JPH0810785Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990018453U JPH0810785Y2 (ja) 1990-02-26 1990-02-26 広視野磁場掃引装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990018453U JPH0810785Y2 (ja) 1990-02-26 1990-02-26 広視野磁場掃引装置

Publications (2)

Publication Number Publication Date
JPH03109157U JPH03109157U (cs) 1991-11-08
JPH0810785Y2 true JPH0810785Y2 (ja) 1996-03-29

Family

ID=31521609

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990018453U Expired - Lifetime JPH0810785Y2 (ja) 1990-02-26 1990-02-26 広視野磁場掃引装置

Country Status (1)

Country Link
JP (1) JPH0810785Y2 (cs)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55112545A (en) * 1978-12-20 1980-08-30 Hitachi Ltd Spectroscopic analyzer utilizing magnetorotation
JPS60243539A (ja) * 1984-05-18 1985-12-03 Nec Corp 磁気光学効果測定装置

Also Published As

Publication number Publication date
JPH03109157U (cs) 1991-11-08

Similar Documents

Publication Publication Date Title
Rave et al. Quantitative observation of magnetic domains with the magneto-optical Kerr effect
Soldatov et al. Advanced, Kerr-microscopy-based MOKE magnetometry for the anisotropy characterisation of magnetic films
US6927853B2 (en) Method and arrangement for optical stress analysis of solids
US3741661A (en) Universal polarimeter
CN118671177B (zh) 一种基于瞬态差分式的磁光成像方法、设备及介质
JPH0810785Y2 (ja) 広視野磁場掃引装置
JP2004294293A (ja) 複数の異なる試料の光学特性を一括して観察・測定する方法
US4298284A (en) Method and apparatus for measuring magnetooptic anisotropy
Chen et al. Method to measure spectra of both the magneto-optical Kerr and the Faraday effect
US11906604B2 (en) Method for extracting a transverse magneto-optic effect signal
Das et al. Polar magneto-optical Kerr effect spectroscopy with a microscope arrangement for studies on 2D materials
JP2938501B2 (ja) 磁場掃引エリプソメータ
JP4010760B2 (ja) 測定装置
JPH06221993A (ja) 偏光子の消光比測定方法及び測定装置
JPH0322595B2 (cs)
KR100222320B1 (ko) 광자기.타원 분광기
RU2560148C1 (ru) СПОСОБ ИЗМЕРЕНИЯ МАГНИТООПТИЧЕСКИХ ЭФФЕКТОВ in situ
US20240272245A1 (en) Semiconductor manufacturing device and semiconductor manufacturing method
JPH05834Y2 (cs)
JPH03135515A (ja) 光アイソレータ
Thompson AN ELECTRO-OPTIC LIGHT SCATTERING PHOTOMETRIC POLARIMETER.
JPH05203564A (ja) 偏光解析装置における光学系および試料支持体
JP3041637B2 (ja) 光応用直流電流変成器
Daveze et al. A new automatized device for high-precision measurements of optical retarder plates
Peek Dynamic polarization detection