JPH0797024B2 - Reflection image distortion measurement method - Google Patents
Reflection image distortion measurement methodInfo
- Publication number
- JPH0797024B2 JPH0797024B2 JP62322710A JP32271087A JPH0797024B2 JP H0797024 B2 JPH0797024 B2 JP H0797024B2 JP 62322710 A JP62322710 A JP 62322710A JP 32271087 A JP32271087 A JP 32271087A JP H0797024 B2 JPH0797024 B2 JP H0797024B2
- Authority
- JP
- Japan
- Prior art keywords
- reflection image
- distortion
- measuring
- image distortion
- curvature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Description
【発明の詳細な説明】 ［産業上の利用分野］ 本発明は反射像歪測定方法に関するものである。The present invention relates to a reflection image distortion measuring method.
［従来の技術］ 従来、ガラス反射像歪の評価には、景色・屋内照明灯・
格子パターンボード灯に対し、適当な距離・角度にガラ
スを位置し、目視あるいは写真撮影により歪量の大小・
分布等を定性的に判定していた。しかし、この方法では
反射像歪の大小が距離・角度で変化したり、判定の着目
点が、判定者によって異なる等、定量的判定ができなか
った。[Prior Art] Conventionally, for evaluation of glass reflection image distortion, scenery, indoor lighting,
Position the glass at an appropriate distance and angle with respect to the lattice pattern board lamp, and check the amount of distortion by visual observation or photography.
The distribution etc. were judged qualitatively. However, with this method, the magnitude of the reflection image distortion varies depending on the distance and angle, and the point of interest in the determination differs depending on the determiner.
［発明が解決しようとする問題点］ 本発明は前述の目視による定性的判定を定量化し、自動
測定する事を目的とするものである。[Problems to be Solved by the Invention] The present invention aims to quantify and automatically measure the above-mentioned qualitative judgment by visual inspection.
［問題点を解決するための手段］ 本発明は前述の問題を解決すべくなされたものであり、
ガラス等の鏡面を有する物体表面における周囲、景色の
反射像歪の測定方法において、景色に代えて直線格子パ
ターンを使用し、鏡面物体・格子パターン・観測点の相
互位置を一定に保った状態でその表面反射格子像を撮像
し、この格子像の格子線の曲率を求め、反射像歪の有無
・大小・分布を測定することを特徴とする反射像歪測定
方法を提供するものである。[Means for Solving Problems] The present invention has been made to solve the above problems,
In the method of measuring the reflection image distortion of the surroundings and scenery on the surface of an object having a mirror surface such as glass, use a linear grid pattern instead of the scenery and keep the mutual position of the mirror surface object, the grid pattern and the observation point constant. An object of the present invention is to provide a reflection image distortion measuring method characterized in that the surface reflection grating image is imaged, the curvature of the grid line of the grating image is obtained, and the presence / absence, magnitude, and distribution of the reflection image distortion are measured.
以下、本発明を実施例に従って説明する。第１図は本発
明の基本構成であり、１は鏡面を有する例えばガラスの
ような物体、２はスクリーン、３はレーザースキャナ
ー、４はビデオカメラ、５は画像処理装置、６はホスト
コンピュータ、７はディスプレイ、８はプリンター、９
はキーボード、10は鏡面物体支持台を示している。Hereinafter, the present invention will be described according to examples. 1 is a basic configuration of the present invention, 1 is an object such as glass having a mirror surface, 2 is a screen, 3 is a laser scanner, 4 is a video camera, 5 is an image processing device, 6 is a host computer, 7 Is a display, 8 is a printer, 9
Is a keyboard, and 10 is a mirror object support.
第２図は鏡面物体１、スクリーン２、レーザースキャナ
３、カメラ４の位置関係を示している。鏡面物体１の中
心部分の面法線12とスクリーン２をほぼ直交させ、か
つ、スクリーン２の中心付近の開口部に置かれたカメラ
４の光軸と面法線12をほぼ一致させる。鏡面物体１とス
クリーン２・カメラ４との距離を所定の距離例えば2mと
する。レーザースキャナ３はスクリーン２に格子パター
ンを歪なく投影できる位置に置く。FIG. 2 shows the positional relationship between the mirror surface object 1, the screen 2, the laser scanner 3, and the camera 4. The surface normal 12 of the central portion of the mirror-like object 1 and the screen 2 are made substantially orthogonal to each other, and the optical axis of the camera 4 placed in the opening near the center of the screen 2 and the surface normal 12 are made substantially coincident with each other. The distance between the specular object 1 and the screen 2 / camera 4 is set to a predetermined distance, for example, 2 m. The laser scanner 3 is placed at a position where the lattice pattern can be projected on the screen 2 without distortion.
次に測定方法について説明する。スキャナー３によりス
クリーン２上へ直線格子パターン11を投影する。投影パ
ターンは鏡面物体１により反射され、反射像がビデオカ
メラ４によって撮像される。撮像された反射像は、画像
処理装置５でS/N比の改善、線巾の縮小等の画像処理が
行われた後、線の中心部の位置データがホストコンピュ
ータ６へ送られ反射像各部の曲率が計算される。計算さ
れた曲率は、ディスプレイ７、プリンター８に出力され
る。キーボード９は、これら一連の測定の開始や測定条
件の入力等を行う為に用いられる。Next, the measuring method will be described. The scanner 3 projects the linear grid pattern 11 onto the screen 2. The projection pattern is reflected by the specular object 1, and the reflected image is captured by the video camera 4. The captured reflection image is subjected to image processing such as improvement of the S / N ratio and reduction of the line width in the image processing device 5, and then the position data of the center of the line is sent to the host computer 6 and each part of the reflection image. The curvature of is calculated. The calculated curvature is output to the display 7 and the printer 8. The keyboard 9 is used to start these series of measurements and input measurement conditions.
本発明において格子パターン11の発生方法は、上記実施
例の他にスクリーン２とレーザースキャナ３に代えてパ
ターンを直接、ボード上に描いたものを用いても良い。
あるいはボード上に発光素子、光ファイバーを配列させ
たもの又はCRT表示管でも良い。また、レーザースキャ
ナ３に代えて、スライドプロジェクター、OHP等により
パターンを順次投影しても良く、パターンを描くものと
して、スライド、フィルムの他に液晶素子を用いること
も可能である。In the present invention, the grid pattern 11 may be generated by directly drawing the pattern on the board instead of the screen 2 and the laser scanner 3 in addition to the above embodiment.
Alternatively, a light emitting element, an optical fiber arrayed on a board, or a CRT display tube may be used. Further, instead of the laser scanner 3, patterns may be sequentially projected by a slide projector, OHP or the like, and liquid crystal elements other than slides and films may be used to draw the patterns.
更に、また、用いるパターンは直接に限らず、画像処理
上都合のよいものであれば、パターンの一部を塗りつぶ
した市松模様やドット等でも良い。画像の入力方法につ
いてはビデオカメラ４に代えて写真機を用い、フィルム
又は印画紙上の像について、ドラムスキャナー等により
像をデジタイズして画像データを作成するようにしても
良い。Furthermore, the pattern to be used is not limited to the direct one, and may be a checkered pattern or a dot in which a part of the pattern is filled, as long as it is convenient in image processing. As a method of inputting an image, a camera may be used instead of the video camera 4, and an image on film or photographic paper may be digitized by a drum scanner or the like to create image data.
さらに、レーザースキャナ３をスクリーン２に投影せ
ず、鏡面物体１へ投影し、その反射光をスクリーン２へ
受けて、スクリーン２上の像を撮像する方法を用いても
良い。Further, a method may be used in which the laser scanner 3 is not projected onto the screen 2 but is projected onto the specular object 1, the reflected light is received by the screen 2, and an image on the screen 2 is captured.
なお、鏡面物体１の鏡面が予め所定の形状を持ってお
り、反射像がこの鏡面物体の形状により生ずる固有の歪
と格子パターンの反射像歪とが重複しているときは、計
測された曲率から前記の固有の歪に起因する曲率を差し
引くことにより、鏡面物体の反射像歪を測定することが
できる。When the specular surface of the specular object 1 has a predetermined shape in advance and the reflection image overlaps with the inherent distortion caused by the shape of the specular object and the reflection image distortion of the lattice pattern, the measured curvature By subtracting the curvature due to the above-mentioned inherent distortion from, it is possible to measure the reflection image distortion of the specular object.
［発明の効果］ 本発明は前述の様に、従来安定的に行われていた反射像
歪判定において、反射像歪の有る部位、大きさを定量的
に測定することができる様になり、製造工程上の品質管
理、製法改善の評価の定量化を可能とする。あるいは取
り付け応力による鏡面物体の形状歪が反射歪として現わ
れる事を利用する事により取付け状況の評価ができると
いう効果を有する。[Advantages of the Invention] As described above, the present invention makes it possible to quantitatively measure a site and a size of a reflection image distortion in the reflection image distortion determination which has been conventionally performed stably. It enables quantification of quality control in the process and evaluation of manufacturing process improvement. Alternatively, it is possible to evaluate the mounting situation by utilizing the fact that the shape distortion of the mirror surface object due to the mounting stress appears as the reflection distortion.
第１図は本発明装置の一実施例を示す斜視図、第２図は
この装置の部分側面図を示す。 図において、１は鏡面物体、２はスクリーン、３はレー
ザースキャナー、４はビデオカメラ、５は画像処理装
置。FIG. 1 is a perspective view showing an embodiment of the device of the present invention, and FIG. 2 is a partial side view of this device. In the figure, 1 is a mirror surface object, 2 is a screen, 3 is a laser scanner, 4 is a video camera, and 5 is an image processing apparatus.
Claims (4)
反射像歪の測定方法において、鏡面物体に相対して所定
の格子パターンを配置し、核格子パターンの鏡面におけ
る表面反射格子像を撮像し、この格子像の格子線の曲率
を計測することにより、反射像歪を測定することを特徴
とする反射像歪の測定方法。1. A method of measuring a reflection image distortion on a surface of an object having a mirror surface such as glass, in which a predetermined lattice pattern is arranged relative to the mirror surface object, and a surface reflection lattice image on the mirror surface of the nuclear lattice pattern is taken. A reflection image distortion measuring method characterized by measuring a reflection image distortion by measuring a curvature of a lattice line of the lattice image.
鏡面におけるその反射像をビデオカメラで入力して格子
線の曲率を画像処理により計測することを特徴とする特
許請求の範囲第１項記載の反射像歪の測定方法。2. A pattern is projected onto a flat screen grid,
The reflection image distortion measuring method according to claim 1, wherein the reflection image on the mirror surface is input by a video camera and the curvature of the lattice line is measured by image processing.
固有の歪を有しており、格子パターンの反射像歪がこの
固有の歪と重複して生じるときは、計測された曲率から
鏡面物体の固有の曲率を差し引いた曲率により測定する
ことを特徴とする特許請求の範囲第１項記載の反射像歪
の測定方法。3. When the reflection image has an inherent distortion due to the original surface shape of the mirror surface object, and when the reflection image distortion of the lattice pattern overlaps with this inherent distortion, the mirror image is obtained from the measured curvature. The method for measuring the reflection image distortion according to claim 1, wherein the measurement is performed by the curvature obtained by subtracting the inherent curvature of the object.
又は複数の水平・垂直・斜めな直線であり、それぞれを
同時又は分割して投影できる様光源としてレーザースキ
ャナを用いた特許請求の範囲第２項記載の反射像歪の測
定方法。4. A lattice pattern projected onto a screen is a single or a plurality of horizontal / vertical / diagonal straight lines, and a laser scanner is used as a light source so that each of them can be projected simultaneously or separately. The method for measuring the reflection image distortion according to the item.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62322710A JPH0797024B2 (en) | 1987-12-22 | 1987-12-22 | Reflection image distortion measurement method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62322710A JPH0797024B2 (en) | 1987-12-22 | 1987-12-22 | Reflection image distortion measurement method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01165907A JPH01165907A (en) | 1989-06-29 |
| JPH0797024B2 true JPH0797024B2 (en) | 1995-10-18 |
Family
ID=18146755
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62322710A Expired - Fee Related JPH0797024B2 (en) | 1987-12-22 | 1987-12-22 | Reflection image distortion measurement method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0797024B2 (en) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102005019367A1 (en) * | 2005-04-26 | 2006-11-09 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Method for measuring a solar thermal concentrator |
| JP4730836B2 (en) | 2005-09-15 | 2011-07-20 | Ｊｆｅスチール株式会社 | Apparatus and method for measuring surface distortion |
| DE102006006876A1 (en) * | 2006-02-15 | 2007-08-16 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Method of detecting the contour of a reflective surface using a virtual image of the reflective points |
| DE102006012432B3 (en) * | 2006-03-17 | 2007-10-18 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Method for detecting the surface shape of a partially reflecting surface |
| US7711182B2 (en) * | 2006-08-01 | 2010-05-04 | Mitsubishi Electric Research Laboratories, Inc. | Method and system for sensing 3D shapes of objects with specular and hybrid specular-diffuse surfaces |
| JP4957291B2 (en) * | 2006-09-08 | 2012-06-20 | Ｊｆｅスチール株式会社 | Apparatus and method for measuring surface distortion |
| JP4998711B2 (en) * | 2007-03-12 | 2012-08-15 | Ｊｆｅスチール株式会社 | Apparatus and method for measuring surface distortion |
| JP5453352B2 (en) * | 2011-06-30 | 2014-03-26 | 株式会社東芝 | Video display device, video display method and program |
| JP5185424B1 (en) * | 2011-09-30 | 2013-04-17 | 株式会社東芝 | Calibration method and video display device |
| JP6420205B2 (en) * | 2015-05-26 | 2018-11-07 | 富士フイルム株式会社 | Inspection method and apparatus |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5875531A (en) * | 1981-10-28 | 1983-05-07 | 株式会社トプコン | Apparatus for measuring curvature |
| JPS59231403A (en) * | 1983-06-14 | 1984-12-26 | Sanwa Seiki Kk | Non-contact type three-dimensional measuring device |
-
1987
- 1987-12-22 JP JP62322710A patent/JPH0797024B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01165907A (en) | 1989-06-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |