JPH0788935A - Tapered gauge for high-temperature die and method for measuring lip clearance of high-temperature die - Google Patents

Tapered gauge for high-temperature die and method for measuring lip clearance of high-temperature die

Info

Publication number
JPH0788935A
JPH0788935A JP5240113A JP24011393A JPH0788935A JP H0788935 A JPH0788935 A JP H0788935A JP 5240113 A JP5240113 A JP 5240113A JP 24011393 A JP24011393 A JP 24011393A JP H0788935 A JPH0788935 A JP H0788935A
Authority
JP
Japan
Prior art keywords
gauge
high temperature
temperature die
wedge
lip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5240113A
Other languages
Japanese (ja)
Other versions
JP2733432B2 (en
Inventor
Katsunori Fukano
勝則 深野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujimori Kogyo Co Ltd
Original Assignee
Fujimori Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujimori Kogyo Co Ltd filed Critical Fujimori Kogyo Co Ltd
Priority to JP5240113A priority Critical patent/JP2733432B2/en
Publication of JPH0788935A publication Critical patent/JPH0788935A/en
Application granted granted Critical
Publication of JP2733432B2 publication Critical patent/JP2733432B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C48/00Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor
    • B29C48/25Component parts, details or accessories; Auxiliary operations
    • B29C48/92Measuring, controlling or regulating
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00Indexing scheme relating to extrusion moulding
    • B29C2948/92Measuring, controlling or regulating
    • B29C2948/92009Measured parameter
    • B29C2948/92114Dimensions
    • B29C2948/92152Thickness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00Indexing scheme relating to extrusion moulding
    • B29C2948/92Measuring, controlling or regulating
    • B29C2948/92323Location or phase of measurement
    • B29C2948/92361Extrusion unit
    • B29C2948/92409Die; Nozzle zone
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00Indexing scheme relating to extrusion moulding
    • B29C2948/92Measuring, controlling or regulating
    • B29C2948/92504Controlled parameter
    • B29C2948/92609Dimensions
    • B29C2948/92647Thickness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00Indexing scheme relating to extrusion moulding
    • B29C2948/92Measuring, controlling or regulating
    • B29C2948/92819Location or phase of control
    • B29C2948/92857Extrusion unit
    • B29C2948/92904Die; Nozzle zone

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Extrusion Moulding Of Plastics Or The Like (AREA)

Abstract

PURPOSE:To reduce an error of a scale caused by a temperature increase of a gauge to enhance a measuring accuracy by a method wherein a tapered gauge for a high-temperature die is made of metal having a specific thermal expansion coefficient. CONSTITUTION:A gauge 10 is a wedge-form body having two faces which are opposed to each other at a predetermined angle. A front face 11 of the gauge 10 is calibrated at predetermined intervals along the longitudinal direction thereof with respect to a distance between the two faces in the orthogonal direction to the longitudinal direction of the wedge-form body. The front face 11 is calibrated, for example, from 0.6 to 0.85mm in 10mum with respect to a distance between the two faces in the orthogonal direction to the longitudinal direction of the wedge-form body. A support part 12 of the order of 5mm thickness is provided at the base end of the gauge 10. As the material of the gauge 10, a metal having a thermal expansion coefficient of 4X10<-2>/ deg.C or less is used. As a result, an error of a lip clearance can be suppressed to the extent that it can be substantially ignored. As the material, for example, an iron-nickel alloy having an FCDLE3 standard listed in JIS-J-5511 is used.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、高温に加熱された状態
で被成形物をフィルム状に押出成形する高温ダイのリッ
プクリアランスを測定するための高温ダイ用テーパゲー
ジおよびこの高温ダイ用テーパゲージを用いた高温ダイ
のリップクリアランス測定方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a high temperature die taper gauge for measuring the lip clearance of a high temperature die for extruding a molding object into a film in a state of being heated to a high temperature, and a taper gauge for the high temperature die. The present invention relates to a method for measuring lip clearance of a high temperature die.

【0002】[0002]

【従来の技術】プラスチック等をフィルム状に成形する
場合、これらプラスチック等の被成形物を溶融状態とす
る一方、溝状をなす隙間を介して対向する一対のリップ
部が下端に形成されたダイを100〜400℃に加熱
し、このダイ(高温ダイ)に充填された溶融状態の被成
形物を、リップ部の隙間から下方に向けフィルム状に押
出成形する方法が一般的である。
2. Description of the Related Art When a plastic or the like is formed into a film, a die having a pair of lip portions facing each other with a groove-like gap formed at the lower end while the plastic or the like is melted. Is generally heated to 100 to 400 ° C., and the melted object to be filled in this die (high temperature die) is extruded into a film shape downward from the gap of the lip portion.

【0003】ここで、成形されたフィルムの品質のう
ち、特に重要な要素としてフィルムの厚みが挙げられ
る。フィルムの厚みは、主としてリップ部の幅、すなわ
ちリップクリアランスにより決定されるが、このリップ
クリアランスは、高温ダイに充填された被成形物の内圧
により数10〜数100μmの変動を生じ、かつ加熱に
伴う高温ダイの熱歪みにより数〜数10μmの変動を生
じる。
Among the quality of the formed film, the thickness of the film is a particularly important factor. The thickness of the film is mainly determined by the width of the lip portion, that is, the lip clearance. This lip clearance causes a fluctuation of several tens to several hundreds of μm due to the internal pressure of the molding target filled in the high temperature die, and the Due to the thermal strain of the high temperature die, a fluctuation of several to several tens of μm occurs.

【0004】そこで、リップクリアランスを一定に維持
する目的で、高温ダイ用テーパゲージ(以下、ゲージと
略称する。)を用いてリップクリアランスを測定し、そ
の結果に基づき、リップクリアランスの変動分を修正し
ている。
Therefore, in order to maintain the lip clearance constant, the lip clearance is measured by using a taper gauge for high temperature die (hereinafter, abbreviated as gauge), and the variation of the lip clearance is corrected based on the result. ing.

【0005】図6および図7は、このゲージ1の形状の
例を示すものである。このゲージ1は、所定角で対向す
る2面を有する楔状体であって、その正面2には、前記
2面間の前記楔状体の長手方向と直交する向きの距離
が、その長手方向に沿って所定間隔で目盛られている。
図の場合、正面2には、前記2面間の前記楔状体の長手
方向と直交する向きの距離が、0.5mm〜2.5mm
まで、50μm刻みで目盛られている。
FIG. 6 and FIG. 7 show examples of the shape of the gauge 1. The gauge 1 is a wedge-shaped body having two surfaces facing each other at a predetermined angle, and the front surface 2 has a distance in the direction perpendicular to the longitudinal direction of the wedge-shaped body between the two surfaces along the longitudinal direction. Are graduated at a predetermined interval.
In the case of the figure, on the front surface 2, the distance between the two surfaces in the direction orthogonal to the longitudinal direction of the wedge-shaped body is 0.5 mm to 2.5 mm.
Up to 50 μm increments.

【0006】そして、ゲージ1を、前記2面が高温ダイ
のリップ部と平行となるよう下方からリップ部間の隙間
に挿入し、前記2面がそれぞれリップ部の下端縁に当接
した位置、すなわちゲージ1をそれ以上リップ部間の隙
間に挿入できなくなった位置で、リップ部との当接部位
におけるゲージ1の目盛りを読み取る。この数値がリッ
プクリアランスの測定値となる。
Then, the gauge 1 is inserted into the gap between the lip portions from below so that the two surfaces are parallel to the lip portion of the high temperature die, and the two surfaces are in contact with the lower end edges of the lip portions, respectively. That is, at the position where the gauge 1 cannot be inserted into the gap between the lip portions any more, the scale of the gauge 1 at the contact portion with the lip portion is read. This value becomes the measured value of the lip clearance.

【0007】[0007]

【発明が解決しようとする課題】このゲージ1には、素
材として例えばSUS304等のステンレス焼入れ鋼が
用いられている。しかしながら、これらの素材は熱膨張
係数が20×10-6/℃程度と比較的大きいため、リッ
プクリアランスの測定中における高温ダイとの接触等に
よりゲージ1の温度が上昇すると、ゲージ1自身が膨張
してゲージ1の目盛りが不正確となり、リップクリアラ
ンスの測定精度が低下するという問題がある。しかも、
ゲージ1の熱膨張が大きいため目盛りを例えば50μm
刻みと粗くせざるを得ず、その結果、読み取り誤差が大
きくなってリップクリアランスの測定精度が更に低下す
るという問題もある。
The gauge 1 is made of stainless hardened steel such as SUS304 as a material. However, since these materials have a relatively large coefficient of thermal expansion of about 20 × 10 −6 / ° C., when the temperature of the gauge 1 rises due to contact with a high temperature die during measurement of lip clearance, the gauge 1 itself expands. Then, there is a problem that the scale of the gauge 1 becomes inaccurate and the measurement accuracy of the lip clearance decreases. Moreover,
Since the gauge 1 has a large thermal expansion, the scale is, for example, 50 μm.
There is also a problem in that it is unavoidable that the pitch is rough and, as a result, the reading error becomes large and the measurement accuracy of the lip clearance further deteriorates.

【0008】また、押出成形中におけるリップクリアラ
ンスの変動のうち、加熱に伴う高温ダイの熱歪みによる
変動は測定可能であるものの、高温ダイに充填された被
成形物の内圧によるリップクリアランスの変動は、リッ
プ部から下方に向けフィルム状に押出成形された被成形
物の存在が邪魔となり、かつこの被成形物が高温で危険
なため測定することができない。すなわち、実際に被成
形物を押出成形中におけるリップクリアランスを高精度
で測定することは、上記従来のゲージ1およびこのゲー
ジ1を用いたリップクリアランス測定方法では事実上不
可能となっている。
Further, among the variations in lip clearance during extrusion molding, although variations due to thermal strain of the high temperature die due to heating can be measured, variations in lip clearance due to the internal pressure of the object to be molded filled in the high temperature die do not occur. However, the presence of an object to be molded extruded in the form of a film downward from the lip portion is an obstacle and cannot be measured because the object to be molded is dangerous at a high temperature. That is, it is practically impossible to measure the lip clearance during the extrusion molding of the object to be molded with high accuracy by the conventional gauge 1 and the lip clearance measuring method using the gauge 1.

【0009】[0009]

【課題を解決するための手段】本発明は、上記事情に鑑
みてなされたもので、所定角で対向する2面を有する楔
状体であって、前記2面間の前記楔状体の長手方向と直
交する向きの距離が、前記2面のうち少なくとも一方の
面に、その長手方向に沿って所定間隔で目盛られてお
り、特に、その材質が、熱膨張係数が4×10-6/℃以
下の金属であることを特徴とするゲージおよびこのゲー
ジを用いた高温ダイのリップクリアランス測定方法であ
る。
SUMMARY OF THE INVENTION The present invention has been made in view of the above circumstances, and is a wedge-shaped body having two surfaces facing each other at a predetermined angle, and a longitudinal direction of the wedge-shaped body between the two surfaces. The distance in the direction orthogonal to each other is graduated on at least one of the two surfaces at predetermined intervals along the longitudinal direction, and in particular, the material has a coefficient of thermal expansion of 4 × 10 −6 / ° C. or less. And a gauge for measuring the lip clearance of a high temperature die using the gauge.

【0010】また、本発明に係る高温ダイのリップクリ
アランス測定方法は、上方に凸なる半筒状をなし、かつ
その最上端部に、その軸方向と直交する向きの幅が可変
式とされた溝状の空隙が前記軸方向に沿って延設された
カバーを有する治具を用意し、前記ゲージを、前記2面
の両端を前記空隙を介して対向する前記カバーの端縁に
それぞれ当接させた状態で前記空隙から上方に突出さ
せ、更に、前記空隙から上方に突出した前記高温ダイ用
テーパゲージを、前記2面がそれぞれ高温ダイのリップ
部の下端縁に当接するまで前記リップ部間の隙間に挿入
し、前記リップ部との当接部位における前記高温ダイ用
テーパゲージの目盛りを測定することをその特徴として
いる。
Further, in the lip clearance measuring method for a high temperature die according to the present invention, a semi-cylindrical shape which is convex upward is formed, and the width in the direction perpendicular to the axial direction is variable at the uppermost end thereof. A jig having a cover in which a groove-shaped void is extended along the axial direction is prepared, and the gauge is brought into contact with the edges of the cover, which are opposed to each other at both ends of the two surfaces with the void interposed therebetween. In this state, the taper gauge for the high temperature die protruding upward from the gap is further provided between the lip portions until the two surfaces contact the lower end edges of the lip portions of the high temperature die. It is characterized in that it is inserted into the gap and the scale of the taper gauge for the high temperature die at the contact portion with the lip portion is measured.

【0011】[0011]

【作用】本発明のゲージは、その材質に、熱膨張係数が
4×10-6/℃以下である金属が用いられているため、
リップクリアランスの測定中における高温ダイとの接触
等によりゲージの温度が上昇した場合でも、ゲージの熱
膨張が殆ど無視できる程度に抑制される。従って、ゲー
ジの温度上昇に伴い生じるゲージの目盛りの誤差が小さ
くなり、リップクリアランスの測定精度が向上する。更
に、ゲージの熱膨張が小さくなるため目盛りを細かくす
ることが可能で、その結果、目盛りの読み取り誤差が低
下する。
In the gauge of the present invention, a metal having a coefficient of thermal expansion of 4 × 10 −6 / ° C. or less is used as the material,
Even when the temperature of the gauge rises due to contact with the high temperature die during measurement of the lip clearance, the thermal expansion of the gauge is suppressed to a negligible extent. Therefore, the error of the gauge scale caused by the temperature rise of the gauge is reduced, and the measurement accuracy of the lip clearance is improved. Further, since the thermal expansion of the gauge is small, the scale can be made fine, and as a result, the reading error of the scale is reduced.

【0012】また、本発明に係る高温ダイのリップクリ
アランス測定方法は、上方に凸なる半筒状をなす治具の
上端に形成された空隙から、前記ゲージを、その所定角
で対向する2面の両端をカバーの端縁と当接させた状態
で上方に突出し、この上方に突出した部分を用いてリッ
プクリアランスを測定するものである。従って、被成形
物を押出成形中の高温ダイに対しても、そのリップ部か
ら下方にフィルム状に押出成形された溶融状態の被成形
物を前記治具およびゲージにより排除しつつ、リップク
リアランスの測定を行うことができる。
Further, in the method for measuring lip clearance of a high temperature die according to the present invention, the gauge is provided with two surfaces facing each other at a predetermined angle from a gap formed at an upper end of a jig having a semi-cylindrical shape protruding upward. With both ends of the cover abutting against the edges of the cover, the cover is projected upward, and the lip clearance is measured by using the part protruding upward. Therefore, even with respect to the high temperature die during extrusion molding of the molding target, while excluding the molten molding target extruded in the form of a film downward from the lip portion by the jig and the gauge, A measurement can be made.

【0013】[0013]

【実施例】以下、図面に基づき、本発明の実施例につい
て更に詳しく説明する。本発明に係るゲージ10は、例
えば図1および図2に示すような、所定角で対向する2
面を有する楔状体で、その正面11には、前記2面間の
前記楔状体の長手方向と直交する向きの距離が、その長
手方向に沿って所定間隔で目盛られている。図の場合、
正面11には、前記2面間の前記楔状体の長手方向と直
交する向きの距離が、0.6mm〜0.85mmまで、
10μm刻みで目盛られている。また、ゲージ10の基
端部には、厚さ5mm程度の支持部12が形成されてい
る。
Embodiments of the present invention will now be described in more detail with reference to the drawings. The gauge 10 according to the present invention has a structure in which the gauges 10 face each other at a predetermined angle as shown in FIGS.
On the front surface 11 of the wedge-shaped body having a surface, the distance between the two surfaces in the direction orthogonal to the longitudinal direction of the wedge-shaped body is graduated at predetermined intervals along the longitudinal direction. In the case of the figure,
On the front surface 11, the distance between the two surfaces in the direction orthogonal to the longitudinal direction of the wedge-shaped body is from 0.6 mm to 0.85 mm,
It is graduated in 10 μm increments. A support portion 12 having a thickness of about 5 mm is formed at the base end of the gauge 10.

【0014】ここで、ゲージ10には、素材として熱膨
張係数が4×10-6/℃以下である金属が用いられてい
る。これは、熱膨張係数が4×10-6/℃以下に維持さ
れれば、ゲージ10を用いて測定したリップクリアラン
スの誤差が実用状殆ど無視できる程度に抑制されるため
である。本実施例の場合、ゲージ10の素材としては、
JIS J−5511記載の、FCDLE3規格の鉄−
ニッケル合金(熱膨張係数:2〜4×10-6/℃)が用
いられている。
Here, the gauge 10 uses a metal having a coefficient of thermal expansion of 4 × 10 −6 / ° C. or less as a material. This is because if the coefficient of thermal expansion is maintained at 4 × 10 −6 / ° C. or less, the error in the lip clearance measured using the gauge 10 is suppressed to a practically negligible level. In the case of this embodiment, as the material of the gauge 10,
FCDLE3 standard iron according to JIS J-5511-
A nickel alloy (coefficient of thermal expansion: 2 to 4 × 10 −6 / ° C.) is used.

【0015】次いで、本発明のゲージ10を用いたリッ
プクリアランスの測定方法について、特に、100〜4
00℃に加熱された状態で被成形物をフィルム状に押出
成形中の高温ダイのリップクリアランスを測定する場合
を例として、以下に説明する。
Next, regarding the method for measuring the lip clearance using the gauge 10 of the present invention, particularly 100 to 4
The case of measuring the lip clearance of a high temperature die during extrusion molding of a molding target into a film in the state of being heated to 00 ° C. will be described below as an example.

【0016】被成形物をフィルム状に押出成形中の高温
ダイのリップクリアランスを測定する場合には、例えば
図3および図4に示すような治具13を用いる。このう
ち、符号14は、上方に凸なる半筒状をなすカバーで、
カバー14の最上端には、溝状をなす空隙Sがカバー1
4の軸方向に沿って延設されている。また、カバー14
は、その下端部にて、カバー14の軸と直交するバー1
5に、バー15の軸に沿って移動自在に軸支され、その
結果、空隙Sの、カバー14の軸と直交する向きの幅H
は可変式となっている。
When measuring the lip clearance of the high temperature die during extrusion molding of the object to be molded into a film, for example, a jig 13 as shown in FIGS. 3 and 4 is used. Of these, reference numeral 14 is a cover having a semi-cylindrical shape that is convex upward,
At the uppermost end of the cover 14, a groove-like void S is provided in the cover 1.
4 is extended along the axial direction. In addition, the cover 14
Is a bar 1 which is orthogonal to the axis of the cover 14 at its lower end.
5, the shaft 15 is movably supported along the axis of the bar 15 and, as a result, the width H of the space S in the direction orthogonal to the axis of the cover 14.
Is variable.

【0017】リップクリアランスを測定する場合には、
まず、ゲージ10の所定角で対向する2面の両端が空隙
Sを介して対向するカバー14の端縁とそれぞれ当接す
るよう空隙Sの幅Hを調節し、その状態でゲージ10の
先端部を空隙Sから上方に突出させる。次いで、一方の
手でバー15を、他方の手で支持部12を持ち、図5に
示すように、被成形物Fをフィルム状に押出成形中の高
温ダイ16の下方から、カバー14の上端を高温ダイ1
6のリップ部の下端縁16aに押し付ける。
When measuring the lip clearance,
First, the width H of the gap S is adjusted so that both ends of the two surfaces facing each other at a predetermined angle of the gauge 10 come into contact with the opposite edges of the cover 14 via the gap S, respectively. The space S is projected upward. Next, holding the bar 15 with one hand and the support portion 12 with the other hand, as shown in FIG. 5, from below the high temperature die 16 during extrusion molding of the molding target F into the upper end of the cover 14. The high temperature die 1
The lower end edge 16a of the lip portion of 6 is pressed.

【0018】更に、ゲージ10の先端部を、前記2面が
それぞれ前記リップ部の下端縁16aに当接するまで前
記リップ部間の隙間に挿入し、前記リップ部の下端縁1
6aとの当接部位Pにおけるゲージ10の目盛りを測定
する。この値がすなわち被成形物Hをフィルム状に押出
成形中の高温ダイ16のリップクリアランスに相当す
る。
Further, the tip end portion of the gauge 10 is inserted into the gap between the lip portions until the two surfaces come into contact with the lower end edges 16a of the lip portions.
The scale of the gauge 10 at the contact portion P with 6a is measured. This value corresponds to the lip clearance of the high temperature die 16 during extrusion molding of the molding target H into a film.

【0019】ここで、本発明のゲージ10には、その材
質に、熱膨張係数が4×10-6/℃以下である金属が用
いられているため、リップクリアランスの測定中、高温
ダイ16と接触してゲージ10の温度が上昇した場合で
も、ゲージ10の熱膨張が殆ど無視できる程度に抑制さ
れる。従って、ゲージ10の温度上昇に伴い生じるゲー
ジ10の目盛りの誤差が小さくなり、リップクリアラン
スの測定精度が向上する。更に、ゲージ10の熱膨張が
小さくなるため、ゲージ10の目盛りを従来のゲージ1
に対して1/5程度にまで細かくすることが可能で、そ
の結果、目盛りの読み取り誤差が低下する。
Here, the gauge 10 of the present invention uses a metal having a coefficient of thermal expansion of 4 × 10 −6 / ° C. or less as a material thereof, so that the gauge 10 and the high temperature die 16 are used during the measurement of the lip clearance. Even if the temperature of the gauge 10 rises due to contact, the thermal expansion of the gauge 10 is suppressed to a negligible extent. Therefore, the error in the scale of the gauge 10 caused by the temperature rise of the gauge 10 is reduced, and the measurement accuracy of the lip clearance is improved. Furthermore, since the thermal expansion of the gauge 10 is reduced, the scale of the gauge 10 is changed to the conventional gauge 1.
However, the reading error of the scale is reduced.

【0020】また、本発明に係る高温ダイ16のリップ
クリアランス測定方法は、ゲージ10を、その所定角で
対向する2面の両端が空隙Sを介して対向するカバー1
4の端縁とそれぞれ当接させつつ空隙Sから上方に突出
させ、この上方に突出した部分を用いて前記リップ部間
の隙間を塞ぎつつリップクリアランスを測定するもので
ある。
Further, in the lip clearance measuring method for the high temperature die 16 according to the present invention, the cover 1 in which the both ends of the two faces of the gauge 10 which face each other at a predetermined angle are opposed to each other through the space S.
4 is made to project upward from the space S while making contact with the respective edges of 4, and the upwardly projecting portion is used to measure the lip clearance while closing the gap between the lip portions.

【0021】従って、前記リップ部から下方にフィルム
状に押出成形された溶融状態の被成形物Hは、治具13
およびゲージ10により治具13の外方に排除され、そ
の結果、リップクリアランスの測定中、被成形物Hがゲ
ージ10の目盛りを読み取る際の邪魔となったり、測定
者の手にかかったりすることはない。すなわち、本発明
に係る高温ダイ16のリップクリアランス測定方法によ
れば、被成形物Hを押出成形中の高温ダイ16に対して
も、安全にリップクリアランスの測定を行うことができ
る。
Therefore, the molten object H to be extruded downward in the form of a film from the lip portion is the jig 13
And the gauge 10 removes the jig 13 from the outside, and as a result, the object H to be molded becomes an obstacle when reading the scale of the gauge 10 or touches the measurer's hand during measurement of the lip clearance. There is no. That is, according to the lip clearance measuring method of the high temperature die 16 according to the present invention, the lip clearance can be safely measured even for the high temperature die 16 during extrusion molding of the molding target H.

【0022】なお、被成形物Hの押出成形を行っていな
い高温ダイ16のリップクリアランスを測定する場合に
は、治具13は不要である。この場合、単にゲージ10
を、前記2面がそれぞれ前記リップ部の下端縁16aに
当接するまで下方から前記リップ部に挿入し、下端縁1
6aとの当接部位Pにおけるゲージ10の目盛りを測定
する。
The jig 13 is not necessary when measuring the lip clearance of the high temperature die 16 which has not been subjected to extrusion molding of the molding object H. In this case, simply gauge 10
Are inserted into the lip portion from below until the two surfaces come into contact with the lower edge 16a of the lip portion, respectively.
The scale of the gauge 10 at the contact portion P with 6a is measured.

【0023】[0023]

【発明の効果】以上説明した通り、本発明に係るゲージ
およびこのゲージを用いた高温ダイのリップクリアラン
ス測定方法によれば、実際に被成形物を押出成形中の高
温ダイのリップクリアランスを高精度で測定することが
可能となる。
As described above, according to the gauge of the present invention and the method for measuring the lip clearance of a high temperature die using this gauge, the lip clearance of the high temperature die during extrusion molding of the object to be molded is highly accurate. It becomes possible to measure with.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係るゲージの形状の例を示す矢印Iに
沿った正面図である。
FIG. 1 is a front view along an arrow I showing an example of the shape of a gauge according to the present invention.

【図2】本発明に係るゲージの形状の例を示す矢印II
に沿った側面図である。
FIG. 2 is an arrow II showing an example of the shape of a gauge according to the present invention.
It is a side view which followed.

【図3】本発明に係る高温ダイのリップクリアランス測
定に使用される治具の構造の例を示す矢印IIIに沿っ
た側面図である。
FIG. 3 is a side view along an arrow III showing an example of the structure of a jig used for measuring lip clearance of a high temperature die according to the present invention.

【図4】本発明に係る高温ダイのリップクリアランス測
定に使用される治具の構造の例を示す矢印IVに沿った
上面図である。
FIG. 4 is a top view taken along arrow IV showing an example of the structure of a jig used for measuring lip clearance of a high temperature die according to the present invention.

【図5】本発明に係る高温ダイのリップクリアランス測
定方法によるリップクリアランスの測定状況を示す図で
ある。
FIG. 5 is a diagram showing a measurement situation of lip clearance by a high temperature die lip clearance measuring method according to the present invention.

【図6】従来のゲージの形状の例を示す矢印VIに沿っ
た正面図である。
FIG. 6 is a front view taken along an arrow VI showing an example of the shape of a conventional gauge.

【図7】従来のゲージの形状の例を示す矢印VIIに沿
った側面図である。
FIG. 7 is a side view taken along the arrow VII showing an example of the shape of a conventional gauge.

【符号の説明】[Explanation of symbols]

1,10 ゲージ(高温ダイ用テーパゲージ) 2,11 正面 12 支持部 13 治具 14 カバー 15 バー 16 高温ダイ 16a 高温ダイの下端縁 F 被成形物 H 空隙の幅 S 空隙 P ゲージとリップ部の下端縁との当接部位 1,10 gauge (taper gauge for high temperature die) 2,11 front face 12 support portion 13 jig 14 cover 15 bar 16 high temperature die 16a lower edge of high temperature die F molded object H void width S void P lower edge of gauge and lip portion Contact area with the edge

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 所定角で対向する2面を有する楔状体を
なし、前記2面間の前記楔状体の長手方向と直交する向
きの距離が、前記2面のうち少なくとも一方の面に、そ
の長手方向に沿って所定間隔で目盛られている高温ダイ
用テーパゲージであって、その材質が、熱膨張係数が4
×10-6/℃以下の金属であることを特徴とする高温ダ
イ用テーパゲージ。
1. A wedge-shaped body having two surfaces facing each other at a predetermined angle is formed, and a distance between the two surfaces in a direction orthogonal to a longitudinal direction of the wedge-shaped body is at least one of the two surfaces. A taper gauge for a high temperature die, which is graduated at predetermined intervals along the longitudinal direction, and whose material has a thermal expansion coefficient of 4
A taper gauge for a high temperature die, which is a metal of × 10 -6 / ° C or less.
【請求項2】 前記金属が鉄−ニッケル合金であること
を特徴とする請求項1記載の高温ダイ用テーパゲージ。
2. The taper gauge for a high temperature die according to claim 1, wherein the metal is an iron-nickel alloy.
【請求項3】 100〜400℃に加熱された状態で被
成形物を、所定幅の隙間を介して対向する一対のリップ
部から下方に向けフィルム状に押出成形する高温ダイの
リップクリアランス測定方法であって、上方に凸なる半
筒状をなし、かつその最上端部に、その軸方向と直交す
る向きの幅が可変式とされた溝状の空隙が前記軸方向に
沿って延設されたカバーを有する治具を用意し、 前記空隙から、所定角で対向する2面を有する楔状体を
なし、前記2面間の前記楔状体の長手方向と直交する向
きの距離が、前記2面のうち少なくとも一方の面に、そ
の長手方向に沿って所定間隔で目盛られている高温ダイ
用テーパゲージを、前記2面の両端を前記空隙を介して
対向する前記カバーの端縁にそれぞれ当接させた状態で
前記空隙から上方に突出させ、更に、前記空隙から上方
に突出した前記高温ダイ用テーパゲージを、前記2面が
前記一対のリップ部の下端縁にそれぞれ当接するまで前
記隙間に挿入し、前記リップ部との当接部位における前
記高温ダイ用テーパゲージの目盛りを測定することを特
徴とする高温ダイのリップクリアランス測定方法。
3. A lip clearance measuring method for a high temperature die, wherein a molded object is extruded downward in a film shape from a pair of lip portions facing each other with a gap of a predetermined width in a state of being heated to 100 to 400 ° C. A groove-like void having a semi-cylindrical shape protruding upward and having a variable width in the direction orthogonal to the axial direction is provided at the uppermost end thereof along the axial direction. A jig having a cover is prepared, and a wedge-shaped body having two surfaces facing each other at a predetermined angle is formed from the void, and a distance between the two surfaces in a direction orthogonal to the longitudinal direction of the wedge-shaped body is the two surfaces. A taper gauge for high temperature die, which is graduated at a predetermined interval along the longitudinal direction on at least one of the two surfaces, is brought into contact with both ends of the two surfaces to the edges of the cover facing each other through the gap. Protruding upward from the gap In addition, the high temperature die taper gauge that protrudes upward from the gap is inserted into the gap until the two surfaces come into contact with the lower end edges of the pair of lip portions, respectively. A method for measuring lip clearance of a high temperature die, comprising measuring a scale of the taper gauge for the high temperature die.
JP5240113A 1993-09-27 1993-09-27 High temperature die taper gauge and high temperature die lip clearance measurement method Expired - Fee Related JP2733432B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5240113A JP2733432B2 (en) 1993-09-27 1993-09-27 High temperature die taper gauge and high temperature die lip clearance measurement method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5240113A JP2733432B2 (en) 1993-09-27 1993-09-27 High temperature die taper gauge and high temperature die lip clearance measurement method

Publications (2)

Publication Number Publication Date
JPH0788935A true JPH0788935A (en) 1995-04-04
JP2733432B2 JP2733432B2 (en) 1998-03-30

Family

ID=17054687

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5240113A Expired - Fee Related JP2733432B2 (en) 1993-09-27 1993-09-27 High temperature die taper gauge and high temperature die lip clearance measurement method

Country Status (1)

Country Link
JP (1) JP2733432B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108226216A (en) * 2016-12-22 2018-06-29 株式会社三丰 Linear expansion coefficient determining method and measurement device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108226216A (en) * 2016-12-22 2018-06-29 株式会社三丰 Linear expansion coefficient determining method and measurement device
CN108226216B (en) * 2016-12-22 2021-11-16 株式会社三丰 Method and apparatus for measuring linear expansion coefficient

Also Published As

Publication number Publication date
JP2733432B2 (en) 1998-03-30

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