JPH078025Y2 - Image furnace - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION Industrial Field of the Invention The present invention relates to an image furnace for irradiating a sample with light from a heat source such as an arc lamp to heat it.

2. Description of the Related Art In a conventional image furnace, for example, as shown in FIG. 3, a lower storage chamber 31 and an upper sample chamber 32 are connected to each other via a communication portion 33. In the storage chamber 31, a vertically-arranged arc lamp 34 is fixed to _one position f _{1 of a} semi-ellipsoidal condenser mirror 35 via a mount 36, and the optical axis l of the condenser mirror 35 is upward. Is formed from the communicating portion 33 toward the sample chamber 32. A shutter 37, a shutoff valve 38, and a transmission window 39 are sequentially arranged in the communication section 33 from the bottom, and the reflected light from the condenser mirror 35 is focused in the communication section 33 of the other focus f ₂ and then the sample chamber 32 It enters the inside in a diffused state. An irradiation mirror 40 that focuses the incident light is arranged in the sample chamber 32, and the sample is placed at the focal point f _{3 of the} irradiation mirror 40.
A test member 42 that holds 41 is provided. This test member 42
A cooling pipe 43 is connected to the lower back surface in order to prevent the light from being heated by the light. Further, the inside of the sample chamber 32 is used in an inert gas atmosphere or in a vacuum state.

Problems to be Solved by the Invention According to the above-described conventional configuration, the sample chamber 32 having a size capable of housing the irradiation mirror 40 is required, and the light passing through the other focus f ₂ is collected by the irradiation mirror 40. It is necessary to increase the distance between the optical mirror 35 and the irradiation mirror 40, which increases the total length of the image furnace. Moreover, although the lid 44 is opened and closed for loading and unloading the sample, it takes time to return to the inert gas atmosphere or the vacuum, it is inconvenient to continuously heat the sample 41, and the operating cost becomes high. . Further, the manufacturing cost of the cooling pipe 43 to the test member 42 is also high. An object of the present invention is to solve the above problems and to provide an image furnace in which the sample chamber can be downsized, the size of the entire image furnace can be reduced, and the operating cost and the manufacturing cost can be reduced.

Means for Solving the Problems In order to solve the problems, the present invention is provided with a semi-ellipsoidal condensing mirror for reflecting light from a heat source arranged at one focal point to the other focal point side. In an image furnace that irradiates and heats a sample, in a storage chamber that stores the heat source and the condenser mirror, a plane mirror inclined by 45 degrees with respect to the optical axis between the condenser mirror and the other focus is provided. An opening is formed on the side wall of the sample chamber on the optical axis reflected by the plane mirror, and the sample chamber is detachably provided outside the opening, and the light reflected by the plane mirror is transmitted through the transmission window of the sample chamber. It is configured to irradiate the sample at the other focal position in the sample chamber.

Function In the above configuration, the light from the heat source is reflected and projected by the condenser mirror in the optical axis direction in the storage chamber, is reflected by the plane mirror in the direction perpendicular to the optical axis, and is transmitted through the side wall opening of the storage chamber. The light enters the sample chamber through the window and is irradiated on the sample at the other focal position in the sample chamber. Therefore, it is necessary to significantly reduce the length of the image furnace in the optical axis direction of the condenser mirror, as compared with the conventional case where the sample to be irradiated is arranged on the optical axis of the condenser mirror and the irradiation mirror is used. You can Further, since the irradiation mirror is not used as in the conventional case, the capacity of the sample chamber can be reduced, and the operating cost can be significantly reduced when the sample chamber is in a vacuum or an inert gas atmosphere. Furthermore, when the sample chamber is to be in a vacuum or an inert gas atmosphere, a spare sample chamber can be prepared to quickly replace the sample.
Work efficiency can be improved.

Embodiment An embodiment of the present invention will be described below with reference to FIGS. 1 and 2.

In FIG. 1, reference numeral 1 denotes a semi-ellipsoidal condensing mirror which is disposed in the storage chamber 2 and whose inner surface is a spheroidal surface, and is arranged so that the optical axis L ₁ is in the vertical direction. One focus F ₁ of this condenser mirror ₁
At the position, a vertically-arranged arc lamp 4 is arranged via a vertically movable support base 3A and a support body 3B. Reference numeral 5 denotes a shutter device which is horizontally arranged above the arc lamp 4.
The amount of reflected light from the condenser mirror 1 can be adjusted by opening and closing. The condenser mirror 1 is provided above the shutter device 5.
A plane mirror 6 tilted by 45 degrees with respect to the optical axis L ₁ of the condenser mirror 1 is provided at an intermediate position between the other focus F ₂ and the other focus F ₂ . This storage chamber 2 has a cutout portion 7 formed on the side of the horizontal optical axis L ₂ reflected by the upper plane mirror 6, and the optical axis of the vertical wall 7 a of the cutout portion 7 is formed.
A circular opening 8 is formed on L ₂ , and a mounting frame 8a is mounted around the opening 8.

A horizontally-arranged cylindrical small-capacity sample chamber 9 is detachably attached to the mounting frame 8a, and a transparent window 10 in which quartz glass is fitted on the front surface facing the opening 8 is attached to the sample chamber 9. It is formed and is supported on the plane wall 7b of the cutout portion 7 via the support leg 11. As shown in FIG. ₂ , a sample 13 detachably supported by a sample holder 12 is disposed in the sample chamber 9 at the other focal point F ₂ position on the optical axis L ₂ , and the transmission window 10 is provided. Between the sample support 12 and the sample support 12, a truncated cone-shaped (megaphone type) guide mirror 14 having a smaller diameter on the sample 13 side is arranged. By this guide mirror 14, the light radiated to the periphery of the sample 13 can be concentrated and radiated from the large diameter opening 14a to the sample 13 on the small diameter opening 14b side. A heat insulating material 15 is provided on the side of the sample support 12 opposite to the transmission window 10.
The open / close lid 16 that can be opened and closed is bolted, and the sample 13 is taken in and out through the open / close lid 16. The heat insulating material 15 is provided with a measurement passage 17 formed by cutting out the rear side of the sample 13, and the opening / closing lid 16 is provided with a measurement window 18 facing the measurement passage 17 and fitted with transparent glass. Through the window 18, the temperature of the sample 13 can be detected using a radiation thermometer 22 or the like. Further, the sample chamber 9 has a vacuum exhaust port 19
And an inert gas supply port 20 and a discharge port 21 are formed, a vacuum pump (not shown) is connected to the vacuum discharge port 19 via a hose, and an inert gas cylinder has a hose at the inert gas supply port 20. Connected through. A spare sample chamber 9'is prepared for the sample chamber 9. The sample chamber 9 is mounted in the spare sample chamber 9'with an inert gas filled or evacuated. After the heating test in the inside is completed, the sample chamber 9 is removed from the mounting frame 8a and the spare sample chamber 9'is mounted, so that the sample 13 can be removed and attached, the vacuum exhaust, the inert gas filling work, etc. can be omitted. The heating test can be performed efficiently.

According to the above-described embodiment, the sample 13 is arranged at the second focal point F ₂ , and the guide line 14 is used to concentrate the light radiated to the periphery on the sample. axis
Since the sample chamber 9 is arranged at the other focal point F ₂ on the side of L ₁ ,
The overall height of the image furnace (total length in the case of horizontal installation) can be significantly reduced. Further, the sample chamber 9 can be made compact by arranging the sample chamber 9 in the cutout portion 7 with a small capacity, and a mounting frame for the opening portion 8
Since it is detachably attached to the 8a, the spare sample chamber 9'can be used to quickly exchange the sample 13 for efficient testing. Since only the sample chamber 9 having a relatively small volume needs to be in a vacuum or an inert gas atmosphere, the vacuum pump can be downsized, the amount of the inert gas used is small, and the operating cost can be reduced. Further, since the sample 13 is irradiated with light only on one side and does not hit the back side unlike the conventional case, no cooling device is required. For example, a measurement window is provided on the back side.
18 can be formed to measure temperature and other devices can be attached, which is extremely versatile.

As described above, according to the present invention, a plane mirror inclined by 45 degrees is provided between the condenser mirror and the other focal point to reflect light by 90 degrees with respect to the optical axis of the condenser mirror, Since the sample chamber for irradiating the sample with light at the other focal position of the subsequent optical axis is provided, the length of the image furnace in the optical axis direction of the condenser mirror can be greatly shortened and the size can be reduced. Also, since no irradiation mirror is used, the sample chamber can be downsized to reduce the volume, and the preparation time and operating cost when the sample chamber is in a vacuum or an inert gas atmosphere can be shortened and reduced. By using the chamber, the next test can be started just by exchanging the chamber, and it can be used very efficiently. Furthermore, since the sample does not receive light from the back side,
A cooling device is no longer required as in the conventional case, and a measurement window such as a radiation thermometer can be provided on the back side, thus ensuring versatility.

[Brief description of drawings]

1 and 2 show an embodiment of the present invention. FIG. 1 is a vertical sectional view of an image furnace, FIG. 2 is a vertical sectional view of a sample chamber, and FIG.
The figure is a longitudinal sectional view of a conventional image furnace. DESCRIPTION OF SYMBOLS 1 ... Condensing mirror, 2 ... Storage chamber, 4 ... Arc lamp, 6 ... Plane mirror, 7a ... Vertical wall, 8 ... Opening part, 8a ... Mounting frame, 9 ... Sample chamber, 10 ... Transmission window, 13 ... Sample, 14 … Guide mirror, 16… Open / close lid, 18… Measuring window, 19… Vacuum exhaust port, 20… Inert gas supply port, 21… Inert gas exhaust port, L ₁ … Optical axis of condensing mirror, L ₂ … Planar mirror Optical axis, F ₁ ... one focus, F ₂ ... the other focus.

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Minoru Saito 1-6-14 Edobori, Nishi-ku, Osaka-shi, Osaka Prefecture Hitachi Shipbuilding Co., Ltd. (72) Jikuni Matsuyama 1-6-14 Edobori, Nishi-ku, Osaka-shi, Osaka Issue Hitachi Shipbuilding Co., Ltd.

Claims (1)

[Scope of utility model registration request] 1. An image furnace, comprising: a semi-ellipsoidal condensing mirror for reflecting light from a heat source arranged at one focal point to the other focal point side and irradiating the sample with reflected light for heating. A plane mirror tilted by 45 degrees with respect to the optical axis between the condenser mirror and the other focal point is provided in the storage chamber that houses the heat source and the condenser mirror, and the side wall of the sample chamber on the optical axis reflected by the plane mirror A sample chamber is detachably provided outside the opening, and the light reflected by the plane mirror is applied to the sample at the other focal position in the sample chamber through the transmission window of the sample chamber. Image furnace characterized by being configured as follows.