JPH0758721B2 - Pressure contact type semiconductor device - Google Patents

Pressure contact type semiconductor device

Info

Publication number
JPH0758721B2
JPH0758721B2 JP62208585A JP20858587A JPH0758721B2 JP H0758721 B2 JPH0758721 B2 JP H0758721B2 JP 62208585 A JP62208585 A JP 62208585A JP 20858587 A JP20858587 A JP 20858587A JP H0758721 B2 JPH0758721 B2 JP H0758721B2
Authority
JP
Japan
Prior art keywords
main electrode
semiconductor device
pressure contact
anode
contact type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62208585A
Other languages
Japanese (ja)
Other versions
JPS6450537A (en
Inventor
徳光 坂本
讓 小西
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP62208585A priority Critical patent/JPH0758721B2/en
Publication of JPS6450537A publication Critical patent/JPS6450537A/en
Publication of JPH0758721B2 publication Critical patent/JPH0758721B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は大電力用加圧接触型半導体装置に関し、特に半
導体素子の取付け構造に関するものである。
The present invention relates to a high-power pressure contact type semiconductor device, and more particularly to a semiconductor element mounting structure.

〔従来の技術〕[Conventional technology]

従来、この種半導体装置は第2図に示すように構成され
ている。第2図は大電力用加圧接触型ダイオードを示す
側断面図であり、同図において、1は第一の主電極とし
ての陽極を示し、この陽極1は後述するダイオード素子
を収納するケース部1aと、ダイオード素子と接続される
電極面1bが形成されたねじ部1cとから構成されている。
2はエレメントで、このエレメント2は第3図に示すよ
うに上面に合金用アルミ層2aが形成されたモリブデン板
2bおよびこの合金アルミ層2aに固着されたダイオード素
子2cとからなり、前記陽極1のケース部1a内に設置され
ている。また、前記ダイオード素子2cはモリブデン板2b
側にP層2dが形成され、このP層2dの上側にN層2eが形
成されており、かつ周側部がベベリングされパツシベー
シヨン2fによつて封止されると共に、上面にはアルミ電
極2gが形成されている。4は第二の主電極としての陰極
棒で、その下端部に形成された電極面4aは前記ダイオー
ド素子2cのアルミ電極2g上に設置された熱補償用陰極モ
リブデン板5に接触している。6は前記陰極棒4の電極
面4aを熱補償用陰極モリブデン板5に圧接するための皿
ばねで、前記陽極1のケース部1a内であつて陰極棒4に
おける電極面4aの上側と前記ケース部1aの上端部に形成
された係止片1dとの間に平座金7,8および絶縁用マイカ
ワツシヤ9a,9bを介して弾装されている。10は前記陽極
1に溶接され絶縁筒を形成するセラミツクシールであ
る。
Conventionally, this type of semiconductor device has been constructed as shown in FIG. FIG. 2 is a side sectional view showing a high-power pressure contact type diode. In FIG. 2, reference numeral 1 indicates an anode as a first main electrode, and this anode 1 is a case portion for housing a diode element described later. 1a and a screw portion 1c formed with an electrode surface 1b connected to the diode element.
2 is an element, and this element 2 is a molybdenum plate having an aluminum layer 2a for alloy formed on the upper surface as shown in FIG.
2b and a diode element 2c fixed to the alloy aluminum layer 2a, and is installed in the case portion 1a of the anode 1. The diode element 2c is a molybdenum plate 2b.
The P layer 2d is formed on the side, the N layer 2e is formed on the upper side of the P layer 2d, the peripheral side portion is beveled and sealed by the passivation 2f, and the aluminum electrode 2g is formed on the upper surface. Has been formed. Reference numeral 4 is a cathode rod as a second main electrode, and an electrode surface 4a formed at the lower end portion thereof is in contact with a heat compensating cathode molybdenum plate 5 provided on the aluminum electrode 2g of the diode element 2c. Reference numeral 6 denotes a disc spring for pressing the electrode surface 4a of the cathode rod 4 against the heat-compensating cathode molybdenum plate 5, which is inside the case portion 1a of the anode 1 and above the electrode surface 4a of the cathode rod 4 and the case. It is mounted by means of plain washers 7 and 8 and insulating Maikawa washers 9a and 9b between itself and a locking piece 1d formed at the upper end of the portion 1a. 10 is a ceramic seal which is welded to the anode 1 to form an insulating cylinder.

このように構成された加圧接触型ダイオードにおいて電
流はダイオード素子2cの極性により陽極1から陰極棒4
へ向かつて流れるが、これと逆の極性を有する、換言す
れば陰極棒4から陽極1へ向けて電流が流れるダイオー
ドを得るには、第4図に示すように、ダイオード素子の
モリブデン板2b側にN層2eを形成し、そのN層2eの上側
にP層2dを形成することにより前記ダイオード素子とは
極性の異なるダイオード素子を形成し、このダイオード
素子を使用することによつて前記ダイオードとは逆の極
性を有するダイオードを得ていた。
In the pressure contact type diode configured as described above, the current flows from the anode 1 to the cathode rod 4 depending on the polarity of the diode element 2c.
In order to obtain a diode which has a polarity opposite to that which flows toward the anode 1, that is, a current flows from the cathode rod 4 to the anode 1, as shown in FIG. An N layer 2e is formed on the N layer 2e, and a P layer 2d is formed on the upper side of the N layer 2e to form a diode element having a polarity different from that of the diode element. By using this diode element, Obtained a diode with opposite polarity.

〔発明が解決しようとする問題点〕[Problems to be solved by the invention]

しかるに、極性の異なる二種類の加圧接触型ダイオード
を得るために極性の異なるダイオード素子を二種類製造
しなければならず、その製造コストが嵩むという問題が
あつた。
However, in order to obtain two types of pressure contact type diodes with different polarities, it is necessary to manufacture two types of diode elements with different polarities, which causes a problem that the manufacturing cost increases.

〔問題点を解決するための手段〕[Means for solving problems]

本発明に係る加圧接触型半導体装置は、半導体素子の周
縁部を覆い、かつ第一の主電極および第二の主電極が挿
入される開口部を有し、全体が絶縁材によつて形成され
たガイドリングを備えてなり、このガイドリングに、第
一の主電極のケース部内に臨み、第二の主電極を半導体
素子側へ付勢するばね部材の周囲を覆う筒体を一体に設
けると共に、第二の主電極におけるばね部材と対応する
部位にこの第二の主電極の周囲を覆う絶縁部材を装着し
たものである。
A pressure contact type semiconductor device according to the present invention has an opening portion that covers a peripheral portion of a semiconductor element and has a first main electrode and a second main electrode inserted therein, and is entirely formed of an insulating material. And a cylindrical body that faces the inside of the case portion of the first main electrode and covers the periphery of the spring member that biases the second main electrode toward the semiconductor element. At the same time, an insulating member that covers the periphery of the second main electrode is attached to a portion of the second main electrode that corresponds to the spring member.

〔作用〕[Action]

ガイドリングが半導体素子における第一,第二の主電極
との接触面以外の部位を絶縁するから、半導体素子を反
転させることによつて半導体装置の極性を変えることが
できる。
Since the guide ring insulates a portion of the semiconductor element other than the contact surface with the first and second main electrodes, the polarity of the semiconductor device can be changed by reversing the semiconductor element.

〔実施例〕〔Example〕

以下、その構成等を図に示す実施例により詳細に説明す
る。
Hereinafter, the configuration and the like will be described in detail with reference to the embodiments shown in the drawings.

第1図(a,b)は本発明に係る加圧接触型ダイオードを
示す側断面図であり、同図(a)と(b)とでは極性が
異なるようにダイオード素子が反転され装着されてい
る。同図において前記従来例と同一もしくは同等部材に
ついては同一符号を付し、詳細な説明は省略する。同図
において、符号11は前記エレメント2および熱補償用陰
極モリブデン板5を固定し、陽極1のケース部1aに対し
て絶縁するガイドリングで、このガイドリング11は前記
ケース部1aの内側に嵌挿されて皿ばね6の周囲を覆う筒
体としての筒部11aと、前記エレメント2の周縁部を覆
うと共に前記陽極1の電極面1bおよび陰極棒4の電極面
4aが挿入される開口部11bを形成する凸部11cとからな
り、全体を絶縁材例えばふつ素樹脂,ふつ素ゴム,けい
素ゴムあるいはマイカ等によつて一体に形成されてお
り、エレメント2が装着されやすいよう軸方向に沿つて
二分割形成されている。また、このガイドリング11の上
端部には陽極1におけるケース部1aの上端部に形成され
た係止片1dと嵌合しかつ内側において平座金8と当接す
る突起11dが形成されている。12は陰極棒4と陽極1と
の絶縁性を向上させるための絶縁リングで、絶縁材によ
つて形成され、陰極棒4に取付けられている。
FIG. 1 (a, b) is a side sectional view showing a pressure contact type diode according to the present invention. In FIG. 1 (a) and (b), diode elements are inverted and mounted so as to have different polarities. There is. In the figure, the same or equivalent members as those in the conventional example are designated by the same reference numerals, and detailed description thereof will be omitted. In the figure, reference numeral 11 is a guide ring for fixing the element 2 and the heat compensating cathode molybdenum plate 5 and insulating the case 1a of the anode 1 from the guide ring 11. The guide ring 11 is fitted inside the case 1a. A cylindrical portion 11a as a cylindrical body that is inserted and covers the periphery of the disc spring 6, and a peripheral surface of the element 2 and an electrode surface 1b of the anode 1 and an electrode surface of the cathode rod 4.
4a and a convex portion 11c forming an opening portion 11b into which the element 4a is inserted, and the entire element is integrally formed by an insulating material such as fluororesin, fluororubber, silicon rubber or mica. It is divided into two parts along the axial direction for easy mounting. A protrusion 11d is formed on the upper end of the guide ring 11 so as to fit with the locking piece 1d formed on the upper end of the case 1a of the anode 1 and contact the flat washer 8 inside. Reference numeral 12 is an insulating ring for improving the insulating property between the cathode rod 4 and the anode 1, which is formed of an insulating material and is attached to the cathode rod 4.

なお、本実施例においてエレメント2のダイオード素子
2cは、前記第3図に示したようにモリブデン板2b側にP
層2dが形成されたものが使用されている。12は本発明に
係る絶縁部材としての絶縁リングで、この絶縁リング12
は、陰極棒4における皿ばね6を貫通する部分に陰極棒
4の周囲を覆うように取付けられている。
In this embodiment, the diode element of the element 2
2c is P on the molybdenum plate 2b side as shown in FIG.
A layer 2d is used. 12 is an insulating ring as an insulating member according to the present invention.
Is attached to the portion of the cathode rod 4 that penetrates the disc spring 6 so as to cover the periphery of the cathode rod 4.

したがつて、第1図(a)に示すようにエレメント2
を、そのモリブデン板2bが陽極1の電極面1bに接触する
ようガイドリング11に装着した場合には、陽極1から陰
極棒4へ電流は流れ、また第1図(b)に示すように、
このエレメント2を反転させてガイドリング11に装着す
れば、電流は陰極棒4から陽極1へ流れることになる。
この際、熱補償用陰極モリブデン板5は陽極1の電極面
1bとダイオード素子2cとの間に介装させることはいうま
でもない。したがつて、エレメント2はガイドリング11
によつて陽極1の電極面1bおよび陰極棒4の電極面4aと
の接触面以外の部位が絶縁されているから、エレメント
2を反転させても陽極1のケース部1aとエレメント2の
モリブデン板2bが接触するようなことはないので、エレ
メント2を反転させることによつて半導体装置の極性を
変えることができる。
Therefore, as shown in FIG. 1 (a), the element 2
When the molybdenum plate 2b is attached to the guide ring 11 so that the molybdenum plate 2b contacts the electrode surface 1b of the anode 1, a current flows from the anode 1 to the cathode rod 4, and as shown in FIG. 1 (b),
If this element 2 is inverted and attached to the guide ring 11, current will flow from the cathode rod 4 to the anode 1.
At this time, the heat compensating cathode molybdenum plate 5 is the electrode surface of the anode 1.
It goes without saying that it is interposed between 1b and the diode element 2c. Therefore, the element 2 has a guide ring 11
As a result, the parts other than the contact surface between the electrode surface 1b of the anode 1 and the electrode surface 4a of the cathode rod 4 are insulated, so that the case portion 1a of the anode 1 and the molybdenum plate of the element 2 are reversed even if the element 2 is inverted. Since the elements 2b do not come into contact with each other, the polarity of the semiconductor device can be changed by reversing the element 2.

さらに、ガイドリング11の筒部11aが陽極1のケース部1
a内に嵌挿され、かつ絶縁リング12が陰極棒4に取付け
られているから、陽極1におけるケース部1aの内周面と
陰極棒4との間を完全に絶縁することができる。
Further, the cylindrical portion 11a of the guide ring 11 is the case portion 1 of the anode 1.
Since the insulating ring 12 is inserted into the inside of a and the insulating ring 12 is attached to the cathode rod 4, it is possible to completely insulate the inner peripheral surface of the case portion 1a of the anode 1 from the cathode rod 4.

また、本実施例においてエレメント2のダイオード素子
2cは、モリブデン板2b側にP層2dが形成されたものを使
用した例を示したが、この逆の極性を有するダイオード
素子を使用しても同等の効果が得られる。
Further, in this embodiment, the diode element of the element 2 is used.
2c shows an example in which the P layer 2d is formed on the molybdenum plate 2b side, but the same effect can be obtained by using a diode element having the opposite polarity.

〔発明の効果〕〔The invention's effect〕

以上説明したように本発明によれば、半導体素子の周縁
部を覆い、かつ第一の主電極および第二の主電極が挿入
される開口部を有し、全体が絶縁材によつて形成された
ガイドリングを備えてなり、このガイドリングに、第一
の主電極のケース部内に臨み、第二の主電極を半導体素
子側へ付勢するばね部材の周囲を覆う筒体を一体に設け
ると共に、第二の主電極におけるばね部材と対応する部
位にこの第二の主電極の周囲を覆う絶縁部材を装着した
ため、ガイドリングが半導体素子における第一および第
二の主電極との接触面以外の部位を絶縁するから、半導
体素子を反転させて装着することによつて半導体装置の
極性を変えることができる。
As described above, according to the present invention, the semiconductor element is provided with an opening that covers the peripheral edge and has the first main electrode and the second main electrode inserted therein, and is entirely formed of an insulating material. A guide ring, which is provided integrally with the guide ring and covers the periphery of the spring member which faces the case portion of the first main electrode and biases the second main electrode toward the semiconductor element. Since the insulating member covering the periphery of the second main electrode is attached to the portion of the second main electrode corresponding to the spring member, the guide ring is provided on the semiconductor element other than the contact surface with the first and second main electrodes. Since the parts are insulated, the polarity of the semiconductor device can be changed by reversing and mounting the semiconductor element.

したがつて、二種類の半導体装置に対して一種類の半導
体素子を製造するだけでよいから、半導体装置の製造コ
ストを低く抑えることができる。また、半導体装置を組
立てるにあたり、従来二種類製造されていた半導体素子
が一種類に減少されるため、半導体装置を組立て工程が
簡略化され、工期が短縮されるという効果もある。さら
に、第二の主電極を半導体素子側に付勢するばね部材
は、第一の主電極のケース部に対してはガイドリングの
筒体によって絶縁されかつ第二の主電極に対しては絶縁
部材によって絶縁されるから、極性変更が容易な半導体
装置の絶縁性を高めることができる。
Therefore, it is only necessary to manufacture one kind of semiconductor element for two kinds of semiconductor devices, so that the manufacturing cost of the semiconductor device can be kept low. Further, when assembling a semiconductor device, the number of semiconductor elements conventionally manufactured in two types is reduced to one type, so that the process of assembling the semiconductor device is simplified and the manufacturing period is shortened. Further, the spring member that biases the second main electrode toward the semiconductor element is insulated from the case portion of the first main electrode by the tubular body of the guide ring and is insulated from the second main electrode. Since it is insulated by the member, the insulating property of the semiconductor device whose polarity can be easily changed can be enhanced.

【図面の簡単な説明】[Brief description of drawings]

第1図(a,b)は本発明に係る加圧接触型ダイオードを
示す側断面図、第2図は従来の加圧接触型ダイオードを
示す側断面図、第3図および第4図は半導体素子の極性
を説明するための図である。 1……陽極、1b……ケース部、2……エレメント、4…
…陰極棒、11……ガイドリング、11b……開口部。
1 (a, b) is a side sectional view showing a pressure contact type diode according to the present invention, FIG. 2 is a side sectional view showing a conventional pressure contact type diode, and FIGS. 3 and 4 are semiconductors. It is a figure for demonstrating the polarity of an element. 1 ... Anode, 1b ... Case part, 2 ... Element, 4 ...
… Cathode, 11 …… guide ring, 11b …… opening.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】第一の主電極のケース部内に収納された半
導体素子に、第二の主電極をケース部内のばね部材によ
って押圧し圧接させてなる加圧接触型半導体装置におい
て、前記半導体素子の周縁部を覆い、かつ前記第一の主
電極および第二の主電極が挿入される開口部を有し、全
体が絶縁材によって形成されたガイドリングを備えてな
り、このガイドリングに、第一の主電極のケース部内に
臨み前記ばね部材の周囲を覆う筒体を一体に設けると共
に、第二の主電極におけるばね部材と対応する部位にこ
の第二の主電極の周囲を覆う絶縁部材を装着したことを
特徴とする加圧接触型半導体装置。
1. A pressure contact type semiconductor device in which a second main electrode is pressed and brought into pressure contact with a semiconductor element housed in a case portion of a first main electrode by a spring member in the case portion. A guide ring that covers the peripheral edge of the first main electrode and the second main electrode and has an opening into which the whole is formed of an insulating material. An insulating member that covers the periphery of the spring member is integrally provided in the case portion of the one main electrode, and an insulating member that covers the periphery of the second main electrode is provided at a portion of the second main electrode corresponding to the spring member. A pressure contact type semiconductor device, which is mounted.
JP62208585A 1987-08-21 1987-08-21 Pressure contact type semiconductor device Expired - Lifetime JPH0758721B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62208585A JPH0758721B2 (en) 1987-08-21 1987-08-21 Pressure contact type semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62208585A JPH0758721B2 (en) 1987-08-21 1987-08-21 Pressure contact type semiconductor device

Publications (2)

Publication Number Publication Date
JPS6450537A JPS6450537A (en) 1989-02-27
JPH0758721B2 true JPH0758721B2 (en) 1995-06-21

Family

ID=16558625

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62208585A Expired - Lifetime JPH0758721B2 (en) 1987-08-21 1987-08-21 Pressure contact type semiconductor device

Country Status (1)

Country Link
JP (1) JPH0758721B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4696465B2 (en) * 2004-04-09 2011-06-08 パナソニック電工株式会社 Step warning light system

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55132945U (en) * 1979-03-13 1980-09-20
JPS56149449U (en) * 1980-04-04 1981-11-10
JPS57201842U (en) * 1981-06-17 1982-12-22

Also Published As

Publication number Publication date
JPS6450537A (en) 1989-02-27

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