JPH0755946A - Quantum counting device - Google Patents

Quantum counting device

Info

Publication number
JPH0755946A
JPH0755946A JP20773793A JP20773793A JPH0755946A JP H0755946 A JPH0755946 A JP H0755946A JP 20773793 A JP20773793 A JP 20773793A JP 20773793 A JP20773793 A JP 20773793A JP H0755946 A JPH0755946 A JP H0755946A
Authority
JP
Japan
Prior art keywords
pulse
signal
detector
energy
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20773793A
Other languages
Japanese (ja)
Inventor
Masaaki Ukita
昌昭 浮田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP20773793A priority Critical patent/JPH0755946A/en
Publication of JPH0755946A publication Critical patent/JPH0755946A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Radiation (AREA)

Abstract

PURPOSE:To measure photon energy by providing a circuit means where a pulse of higher waveheight than specified one of an output signal of the detector is modulated by a pulse with a shorter cycle than the pulse duration, and a counting device. CONSTITUTION:A semiconductor radiation detector 1 generates a pulse signal with a waveheight corresponding to the energy of incident X-ray photon. After the pulse signal is led to an amplifier 2 to be converted/amplified into a voltage signal, only a pulse signal whose waveheight is larger than a specified value Vref is extracted, and the discriminated effective pulse is led to an AND gate 5. In the gate 5, a clock pulse, whose cycle is made in advance to be shorter than the duration (pulse width) of effective pulse outputting from a comparator 3, is introduced, so outputting of the gate 5 becomes a signal that the output signal of the comparator 3 is modulated by a clock pulse and the number of pulses after modulation is counted 4. The energy information on incident photon can be obtained from the counted values.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、例えば医療用X線撮像
装置等に利用される量子計数装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a quantum counting device used in, for example, a medical X-ray imaging device.

【0002】[0002]

【従来の技術】X線を利用して対象物の像を得る技術と
して最も広く利用されているものは、被写体透過後のX
線がもつ強度分布の差を、写真濃度の濃淡分布としてレ
ントゲンフィルム上に再現するX写真である。
2. Description of the Related Art The most widely used technique for obtaining an image of an object using X-rays is X-ray after passing through an object.
It is an X-ray photograph that reproduces the difference in the intensity distribution of the lines as a light and shade distribution of photographic density on an X-ray film.

【0003】また、このような強度情報をフィルム上に
表現する以外に、複数の画素が1次元もしくは2次元状
に配列されてなる検出器アレイに、線源からの被写体の
情報を含んだX線束を入射させ、その強度情報を例えば
CRT上に表現するX線撮像装置も一般に利用されてい
る。
In addition to expressing such intensity information on a film, a detector array in which a plurality of pixels are arranged one-dimensionally or two-dimensionally includes an X containing information on an object from a radiation source. An X-ray imaging device that makes a ray bundle incident and expresses intensity information thereof on, for example, a CRT is also commonly used.

【0004】そして、この種のX線撮像装置では、従
来、X線フォトンの入射により検出器から発生するパル
ス信号を計数し、その計数値を画像情報とする、いわゆ
るフォトン(量子)計数方式が採用されている。その量
子計数装置の基本的な回路構成を図4に示す。X線が検
出器1に入射することにより発生するパルス信号は、ア
ンプ2を介して比較器3に導かれ、ここで所定波高値
(Vref )以上のパルスのみが弁別され、その弁別後の
パルスが後段のカウンタ4によって計数され、このフォ
トン計数値が画像情報として出力される。
In the X-ray image pickup apparatus of this type, conventionally, there is a so-called photon (quantum) counting method in which pulse signals generated from a detector upon incidence of X-ray photons are counted and the counted value is used as image information. Has been adopted. The basic circuit configuration of the quantum counter is shown in FIG. The pulse signal generated when the X-ray enters the detector 1 is guided to the comparator 3 through the amplifier 2, where only the pulse having a predetermined peak value (Vref) or more is discriminated, and the pulse after the discrimination. Are counted by the counter 4 in the subsequent stage, and the photon count value is output as image information.

【0005】[0005]

【発明が解決しようとする課題】ところで、X線撮像装
置において、線源として通常使用されるX線管は制動放
射を利用した構造であることから、測定対象となるX線
は広いX線スペクトル分布を持つ場合が殆どである(図
5参照)。
In an X-ray image pickup device, an X-ray tube which is usually used as a radiation source has a structure utilizing bremsstrahlung, so that an X-ray to be measured has a wide X-ray spectrum. In most cases, it has a distribution (see FIG. 5).

【0006】そこで、X線のエネルギ情報を加えて画像
を作成すれば、画質の高い画像を得ることができるが、
上記した量子計数装置では、X線エネルギ情報をレント
ゲンフィルムやイメージインテンシファイアのように単
純かつ短時間で得ることは困難である。
Therefore, if an image is created by adding X-ray energy information, an image of high quality can be obtained.
In the above quantum counter, it is difficult to obtain X-ray energy information simply and in a short time like an X-ray film or an image intensifier.

【0007】すなわち、量子計数方式によると、検出器
に入射した1個のX線フォトンに対応する計数値は、そ
のフォトンのエネルギの大小に関係なく必ず「1」とな
るため、基本的には入射X線フォトンの個数の計数(強
度測定)以外の測定は不可能である。
That is, according to the quantum counting method, the count value corresponding to one X-ray photon incident on the detector always becomes "1" regardless of the magnitude of the energy of the photon. Measurements other than counting the number of incident X-ray photons (intensity measurement) are impossible.

【0008】本発明はそのよう事情に鑑みてなされたも
ので、X線などのフォトンを計数する装置において、そ
のフォトンのエネルギ測定も可能な量子計数装置の提供
を所期の目的とする。
The present invention has been made in view of such circumstances, and an object thereof is to provide a quantum counting device capable of measuring the energy of photons such as X-rays.

【0009】[0009]

【課題を解決するための手段】上記の目的を達成するた
め、本発明の量子計数装置は、実施例に対応する図1に
示すように、X線や光のフォトンの入射によりパルス状
の信号を出力する検出器1と、この検出器1の出力信号
の所定波高値以上のパルスを、そのパルス持続時間より
も短い周期のパルスで変調する回路手段(例えば比較器
3,ANDゲート5および高周波パルス発生器6)と、
この変調後のパルス数を計数する計数器(カウンタ)4
を備えていることによって特徴づけられる。
In order to achieve the above object, the quantum counting device of the present invention, as shown in FIG. 1 corresponding to the embodiment, has a pulsed signal generated by the incidence of X-rays or photons of light. And a circuit means (for example, a comparator 3, an AND gate 5 and a high frequency wave) for modulating a pulse having a predetermined peak value or more of an output signal of the detector 1 with a pulse having a cycle shorter than the pulse duration. Pulse generator 6),
Counter 4 for counting the number of pulses after this modulation
It is characterized by having.

【0010】[0010]

【作用】検出器1の出力パルスはX線等のフォトンのエ
ネルギに応じた信号であることから、所定波高値(Vre
f )以上の信号のパルス持続時間(パルス幅)は入射フ
ォトンのエネルギに比例することになる。従って、その
パルス幅を測定すれば入射フォトンのエネルギを知るこ
とができる。そこで、本発明では、検出器1からの信号
の所定波高値以上の有効パルスを、例えば高周波クロッ
クで変調して、そのパルス数を計数することで、上記し
たパルス持続時間を、いわばA/D変換的な方式でもっ
て測定する。
Since the output pulse of the detector 1 is a signal corresponding to the energy of photons such as X-rays, the predetermined peak value (Vre
The pulse duration (pulse width) of the signal above f) will be proportional to the energy of the incident photon. Therefore, the energy of the incident photon can be known by measuring the pulse width. Therefore, in the present invention, the effective pulse having a predetermined peak value or more of the signal from the detector 1 is modulated by, for example, a high-frequency clock, and the number of pulses is counted, so that the above-described pulse duration is A / D. Measure with a conversion method.

【0011】[0011]

【実施例】本発明の実施例を、以下、図面に基づいて説
明する。図1は本発明実施例の回路構成図である。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a circuit configuration diagram of an embodiment of the present invention.

【0012】検出器1は、半導体放射線検出器で、入射
したX線フォトンのエネルギに応じた波高のパルス信号
を発生する。この検出器1からのパルス信号は、アンプ
2に導かれ電圧信号に変換・増幅された後、比較器3に
よって所定波高値Vref 以上のパルス信号のみが抽出さ
れる。
The detector 1 is a semiconductor radiation detector and generates a pulse signal having a wave height corresponding to the energy of incident X-ray photons. The pulse signal from the detector 1 is guided to the amplifier 2, converted into a voltage signal and amplified, and then the comparator 3 extracts only the pulse signal having a predetermined peak value Vref or more.

【0013】比較器3によって弁別された有効パルスは
ANDゲート5に導かれる。このANDゲート5には、
もう一方の入力として高周波パルス発生器6からのクロ
ックパルスが導入されており、従って、このゲート通過
後のAND出力は、比較器3の出力信号をクロックパル
スで変調した信号となり、その変調後のパルス数がカウ
ンタ4で計数される。ここで、高周波パルス発生器6か
らのクロックパルスの周期は、比較器3が出力する有効
パルスの持続時間(パルス幅)よりも小さくしておく。
The effective pulse discriminated by the comparator 3 is led to the AND gate 5. This AND gate 5 has
The clock pulse from the high-frequency pulse generator 6 is introduced as the other input. Therefore, the AND output after passing through this gate becomes a signal obtained by modulating the output signal of the comparator 3 with the clock pulse, and after the modulation. The number of pulses is counted by the counter 4. Here, the cycle of the clock pulse from the high frequency pulse generator 6 is set smaller than the duration (pulse width) of the effective pulse output by the comparator 3.

【0014】なお、以上の構成では、1個の検出器とそ
の信号処理系のみを示しているが、例えばX線撮像装置
などに適用する場合には、検出器1を1次元もしくは2
次元状に配列して使用することは言うまでもない。
In the above configuration, only one detector and its signal processing system are shown. However, when applied to an X-ray image pickup device, for example, the detector 1 is one-dimensional or two-dimensional.
It goes without saying that they are arranged in a dimension and used.

【0015】次に、本発明実施例の作用を図2のタイム
チャートを参照しつつ述べる。まず、検出器1にエネル
ギの異なる2個のX線フォトンが間隔をおいて入射した
と仮定すると、従来の計数法では、図2(b) に示すよう
に、その入射フォトンのエネルギの大小には関係なく計
数値は「2」となる。これに対し、本発明実施例では、
同図(a) に示すように、入射フォトンのエネルギが大き
い場合つまり比較器3を経た有効パルスの持続時間が長
い場合には、1個のフォトン入射に対して計数値が
「2」以上になり、その計数値から入射フォトンのエネ
ルギ情報を得ることができる。
Next, the operation of the embodiment of the present invention will be described with reference to the time chart of FIG. First, assuming that two X-ray photons having different energies are incident on the detector 1 at intervals, in the conventional counting method, as shown in FIG. The count value is "2" regardless of. On the other hand, in the embodiment of the present invention,
As shown in (a) of the figure, when the energy of the incident photon is large, that is, when the duration of the effective pulse passed through the comparator 3 is long, the count value becomes "2" or more for one photon incident. Therefore, energy information of incident photons can be obtained from the count value.

【0016】ここで、有効パルスの持続時間を測定する
手段としては、上記したように、比較器3の出力パルス
を高周波クロックで変調する手法のほか、例えば、比較
器3に導入する比較電圧Vref を高周波クロックで変調
するか、あるいは比較電圧発生器にD/A変換器を用
い、比較電圧を高周波パルス状に発生する等の手法を採
用して、有効パルスの持続時間を測定するようにしても
よい(図3のタイムチャートを参照)。
Here, as a means for measuring the duration of the effective pulse, as described above, in addition to the method of modulating the output pulse of the comparator 3 with a high frequency clock, for example, the comparison voltage Vref introduced to the comparator 3 is used. Is modulated with a high frequency clock, or the D / A converter is used as the comparison voltage generator and a method of generating the comparison voltage in the form of high frequency pulse is adopted to measure the duration of the effective pulse. (See the time chart in Fig. 3).

【0017】なお、以上の実施例では、いずれも、アン
プ2の出力パルスの信号処理により入射フォトンのエネ
ルギの測定を可能とする例を示したが、このほか、例え
ば、バイアス用電源1a(図1参照)から検出器1に印
加する高圧バイアスをクロックパルス等で変調するとい
った手法を採用しても、フォトンエネルギの測定は可能
である。
In the above embodiments, the energy of the incident photon can be measured by the signal processing of the output pulse of the amplifier 2, but in addition to this, for example, the bias power supply 1a (see FIG. The photon energy can also be measured by adopting a method in which the high-voltage bias applied to the detector 1 from (see 1) is modulated with a clock pulse or the like.

【0018】また、本発明は、X線フォトンの計数のほ
か、光のフォトンを計数するための装置にも適用可能で
ある。
The present invention is also applicable to an apparatus for counting photons of light, in addition to counting X-ray photons.

【0019】[0019]

【発明の効果】以上説明したように、本発明の量子計数
装置によれば、検出器へのフォトン入射により発生する
パルス状の信号の所定波高値以上の信号を、クロックパ
ルス等で変調することで、そのパルス持続時間を測定す
るように構成したから、入射フォトンの個数(強度)に
加えてエネルギの測定が可能になる。従って、例えばX
線撮像装置に本発明の量子計数装置を適用すれば、画質
の高いX線撮影画像を得ることできる。
As described above, according to the quantum counting device of the present invention, a signal having a predetermined peak value or more of a pulse-like signal generated by the incidence of photons on the detector is modulated by a clock pulse or the like. Since it is configured to measure the pulse duration, the energy can be measured in addition to the number (intensity) of incident photons. So, for example, X
If the quantum counting device of the present invention is applied to the X-ray imaging device, it is possible to obtain an X-ray image having high image quality.

【0020】また、本発明によると、従来の量子計数装
置の回路構成に、例えばANDゲートとクロック発生源
等を付加するだけで、簡単な構成のもとに上記した効果
を達成できるといった利点もある。
Further, according to the present invention, the above effect can be achieved with a simple structure only by adding, for example, an AND gate and a clock generation source to the circuit structure of the conventional quantum counter. is there.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明実施例の構成を示すブロック図FIG. 1 is a block diagram showing the configuration of an embodiment of the present invention.

【図2】本発明実施例の作用説明図で、各部の信号波形
を示すタイムチャート
FIG. 2 is a time chart showing the signal waveform of each part, which is an explanatory view of the operation of the embodiment of the present invention.

【図3】本発明の他の実施例のタイムチャートFIG. 3 is a time chart of another embodiment of the present invention.

【図4】従来の量子計数装置の一般的な構成例を示すブ
ロック図
FIG. 4 is a block diagram showing a general configuration example of a conventional quantum counting device.

【図5】放射X線スペクトルを示すグラフFIG. 5 is a graph showing a radiation X-ray spectrum.

【符号の説明】[Explanation of symbols]

1 検出器 2 アンプ 3 比較器 4 カウンタ 5 ANDゲート 6 高周波パルス発生器 1 Detector 2 Amplifier 3 Comparator 4 Counter 5 AND Gate 6 High Frequency Pulse Generator

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 X線や光のフォトンの入射によりパルス
状の信号を出力する検出器と、この検出器の出力信号の
所定波高値以上のパルスを、そのパルス持続時間よりも
短い周期のパルスで変調する回路手段と、この変調後の
パルス数を計数する計数器を備えた量子計数装置。
1. A detector which outputs a pulsed signal upon incidence of X-rays or photons of light, and a pulse having a period shorter than a pulse duration of a pulse having a predetermined peak value or more of an output signal of the detector. A quantum counting device provided with a circuit means for modulating by the above and a counter for counting the number of pulses after this modulation.
JP20773793A 1993-08-23 1993-08-23 Quantum counting device Pending JPH0755946A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20773793A JPH0755946A (en) 1993-08-23 1993-08-23 Quantum counting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20773793A JPH0755946A (en) 1993-08-23 1993-08-23 Quantum counting device

Publications (1)

Publication Number Publication Date
JPH0755946A true JPH0755946A (en) 1995-03-03

Family

ID=16544708

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20773793A Pending JPH0755946A (en) 1993-08-23 1993-08-23 Quantum counting device

Country Status (1)

Country Link
JP (1) JPH0755946A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006118965A (en) * 2004-10-21 2006-05-11 Seiko Epson Corp Photodetection circuit, electro-optical device, and electronic equipment
US7948483B2 (en) 2004-10-12 2011-05-24 Seiko Epson Corporation Photo detection circuit, method of controlling the same, electro-optical panel, electro-optical device, and electronic apparatus
JP2011123503A (en) * 2005-12-01 2011-06-23 Hitachi Displays Ltd Display device
CN102339412A (en) * 2011-06-23 2012-02-01 安徽量子通信技术有限公司 Coincidence counting system for entangled photon detection experiment
WO2021199195A1 (en) * 2020-03-30 2021-10-07 国立大学法人静岡大学 Radiation detector

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7948483B2 (en) 2004-10-12 2011-05-24 Seiko Epson Corporation Photo detection circuit, method of controlling the same, electro-optical panel, electro-optical device, and electronic apparatus
JP2006118965A (en) * 2004-10-21 2006-05-11 Seiko Epson Corp Photodetection circuit, electro-optical device, and electronic equipment
JP4599985B2 (en) * 2004-10-21 2010-12-15 セイコーエプソン株式会社 Photodetection circuit, electro-optical device, and electronic apparatus
JP2011123503A (en) * 2005-12-01 2011-06-23 Hitachi Displays Ltd Display device
CN102339412A (en) * 2011-06-23 2012-02-01 安徽量子通信技术有限公司 Coincidence counting system for entangled photon detection experiment
WO2021199195A1 (en) * 2020-03-30 2021-10-07 国立大学法人静岡大学 Radiation detector

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