JPH0743672Y2 - Electronic clock - Google Patents

Electronic clock

Info

Publication number
JPH0743672Y2
JPH0743672Y2 JP1987032209U JP3220987U JPH0743672Y2 JP H0743672 Y2 JPH0743672 Y2 JP H0743672Y2 JP 1987032209 U JP1987032209 U JP 1987032209U JP 3220987 U JP3220987 U JP 3220987U JP H0743672 Y2 JPH0743672 Y2 JP H0743672Y2
Authority
JP
Japan
Prior art keywords
circuit board
chip
slit
crystal resonator
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1987032209U
Other languages
Japanese (ja)
Other versions
JPS63139591U (en
Inventor
達雄 守屋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP1987032209U priority Critical patent/JPH0743672Y2/en
Priority to GB8804759A priority patent/GB2202994B/en
Priority to US07/164,352 priority patent/US4876677A/en
Priority to KR1019880002288A priority patent/KR910008673B1/en
Priority to CH849/88A priority patent/CH674117B5/fr
Publication of JPS63139591U publication Critical patent/JPS63139591U/ja
Priority to SG42294A priority patent/SG42294G/en
Priority to HK40494A priority patent/HK40494A/en
Application granted granted Critical
Publication of JPH0743672Y2 publication Critical patent/JPH0743672Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【考案の詳細な説明】 〔産業上の利用分野〕 本考案は温度や圧力等を半導体センサーを用いて測定す
る機能を持つ電子時計に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to an electronic timepiece having a function of measuring temperature, pressure and the like using a semiconductor sensor.

〔従来の技術〕[Conventional technology]

従来、電子腕時計のチェック端子部の形成例を第5図及
び第6図に示す。それぞれの図に於いて、(a)は平面
図、(b)は断面図であり、また3は回路基板、3eは銅
箔をエッチングして形成したチェック端子用パターンで
ある。
Conventionally, an example of forming a check terminal portion of an electronic wristwatch is shown in FIGS. 5 and 6. In each drawing, (a) is a plan view, (b) is a sectional view, 3 is a circuit board, and 3e is a check terminal pattern formed by etching a copper foil.

〔考案が解決しようとする問題点〕[Problems to be solved by the invention]

半導体センサーに於いては特性のばらつきを吸収するた
めにオフセット調整や傾き調整をする必要があるが、調
整用のモニター端子やデータ転送端子及び書き込み端子
等のチェック端子が第5図や第6図の様に形成されてい
ると、第7図及び第8図に示した様に、調整のためピン
プローブ22がチェック端子用パターン3eに当たると必ず
回路基板3が曲がる。回路基板が曲がるとボンディング
部やモールドを通じてICチップも曲がり、半導体センサ
ーを形成するトランジスターのチャンネル長やチャンネ
ル幅の形状変化すなわちセンサーの特性変化を引き起こ
す。つまり従来の構造はセンサーの特性を正確に測定で
きず調整後のセンサーの値が理想値とずれてしまうとい
う致命的な欠点を有していた。
In semiconductor sensors, it is necessary to perform offset adjustment and tilt adjustment in order to absorb variations in characteristics, but check terminals for adjustment such as monitor terminals, data transfer terminals, and write terminals are provided in FIGS. 5 and 6. When the pin probe 22 hits the check terminal pattern 3e for adjustment as shown in FIGS. 7 and 8, the circuit board 3 is always bent. When the circuit board is bent, the IC chip is also bent through the bonding portion and the mold, causing a change in the channel length and channel width of the transistor forming the semiconductor sensor, that is, a change in the sensor characteristics. That is, the conventional structure has a fatal defect that the sensor characteristics cannot be accurately measured and the adjusted sensor value deviates from the ideal value.

本考案はかかる問題点を除去するものであり、その目的
とする所は、半導体センサーの調整後にセンサーの特性
を正確に測定できず調整後のセンサーの値が理想値とず
れない品質の高い電子時計を提供することにある。
The present invention eliminates such problems, and its purpose is to provide a high-quality electronic device in which the sensor characteristics cannot be accurately measured after adjustment of the semiconductor sensor and the adjusted sensor value does not deviate from the ideal value. To provide a clock.

〔問題点を解決するための手段〕[Means for solving problems]

本考案の電子時計は、半導体センサーを内蔵したICチッ
プを装着した回路基板と、 前記回路基板に導電接続される水晶振動子とを有する電
子時計に於いて、 前記回路基板は電気回路を形成する導電配線が配置さ
れ、 前記導電配線はチェック端子部と前記水晶振動子が導電
接続される水晶振動子接続部とを有し、 前記チェック端子部は前記回路基板の外形より内側に形
成された透孔内に片持ばり形状に張り出し形成され、 前記水晶振動子接続部は前記回路基板の外周部から内部
に向かって切り込まれるスリットによって形成された片
持形状の部位の端部近傍に配置され、 前記ICチップの接続端子と前記水晶振動子接続部とを接
続する導電配線は前記スリット上に前記スリットの長手
方向に斜め又は平行に配置されてなることを特徴とす
る。
The electronic timepiece of the present invention is an electronic timepiece having a circuit board on which an IC chip having a semiconductor sensor is mounted, and a crystal oscillator conductively connected to the circuit board, wherein the circuit board forms an electric circuit. Conductive wiring is disposed, the conductive wiring has a check terminal portion and a crystal resonator connecting portion to which the crystal resonator is conductively connected, and the check terminal portion is a transparent member formed inside an outer shape of the circuit board. The crystal resonator connecting portion is formed in a cantilever shape in the hole, and the crystal unit connecting portion is arranged near an end portion of a cantilever portion formed by a slit cut inward from the outer peripheral portion of the circuit board. The conductive wiring connecting the connection terminal of the IC chip and the crystal resonator connecting portion is arranged on the slit obliquely or parallel to the longitudinal direction of the slit.

〔作用〕[Action]

本考案の電子時計は、チェック端子を透孔内部に張り出
した片持ばり形状に形成しているため、半導体センサー
の特性のばらつきを吸収するための調整時にピンプロー
ブが当たっても、パターン(銅箔)のみが変位し回路基
板は曲がらない。従って、調整時と調整後に半導体セン
サーの特性変化は起こらない。
Since the electronic timepiece of the present invention is formed in the shape of a cantilever with the check terminal projecting inside the through hole, even if the pin probe hits the pattern (copper pattern) when adjusting to absorb the variation in the characteristics of the semiconductor sensor. Only the foil) is displaced and the circuit board does not bend. Therefore, the characteristics of the semiconductor sensor do not change during and after adjustment.

〔実施例〕〔Example〕

以下、ICチップ内の半導体温度センサーにより水晶発振
器の温度補償を行なう高精度電子腕時計を例に本考案を
詳細に説明する。
Hereinafter, the present invention will be described in detail by taking a high-precision electronic wrist watch that performs temperature compensation of a crystal oscillator by a semiconductor temperature sensor in an IC chip as an example.

本実施例の電子腕時計に於いては、半導体温度センサー
に特性変化がおこった状態で水晶発振器の歩度温度特性
を補償すると、温度特性が傾いたり上下に凸になったり
して、年差10秒〜20秒といった高精度を保証できなくな
ってしまうため、半導体温度センサーの特性変化は極力
押える必要がある。
In the electronic wristwatch of this embodiment, if the rate temperature characteristic of the crystal oscillator is compensated in the state where the semiconductor temperature sensor changes in characteristic, the temperature characteristic may be tilted or convex and downward, and the annual difference is 10 seconds. It is impossible to guarantee a high accuracy of ~ 20 seconds, so it is necessary to suppress the characteristic changes of the semiconductor temperature sensor as much as possible.

本実施例の電子腕時計の平面図を第1図に断面図を第2
図に示す。第1図及び第2図に於いて、1は1a部に内蔵
している半導体温度センサーの情報に基づいて水晶振動
子2の2次温度特性を補償する機能を有するアナログ電
子時計用のCMOS-ICチップ、2は約32768Hzで発振し2次
温度特性を有する音叉型水晶振動子、3はICチップ1を
フェイスダウンボディングでまた水晶振動子2を半田付
けで装着したフレキシブル回路基板、4は合成樹脂で成
形され各部品の位置決め用のダボや各部品を受けたり逃
げたりするためのさらいを有し、さらに各部品を固定す
るための金属製ねじピンが打ちこまれている時計体のベ
ースとなる地板、5は水晶振動子2,回路基板3,コイル6,
ステータ9等の部品をねじ14,15,16,17により地板4に
固定する回路押え板、6はコイル、7はコイル6の磁
心、8はコイルリード基板、9はステータ、10は時計用
酸化銀電池、11は巻真、12は規正レバー、13は輪列受、
14〜18はねじ、19は電池マイナス端子、20は電池絶縁
板、21はICチップ1を回路基板3に確実に装着するため
のモールドである。
FIG. 1 is a plan view of the electronic wrist watch of this embodiment, and FIG.
Shown in the figure. In FIGS. 1 and 2, reference numeral 1 denotes a CMOS-for analog electronic timepiece having a function of compensating for the secondary temperature characteristic of the crystal unit 2 based on the information of the semiconductor temperature sensor built in the 1a portion. A tuning fork type crystal unit having an IC chip, 2 which oscillates at about 32768Hz and has a secondary temperature characteristic, a flexible circuit board on which the IC chip 1 is mounted by face down boding and a crystal unit 2 is soldered. A base for a watch body that is molded from synthetic resin and has a dowel for positioning each part, a body for receiving and escaping each part, and a metal screw pin for fixing each part. The ground plane 5 is a crystal unit 2, a circuit board 3, a coil 6,
A circuit retainer plate for fixing parts such as the stator 9 to the main plate 4 with screws 14, 15, 16 and 17, 6 is a coil, 7 is a magnetic core of the coil 6, 8 is a coil lead board, 9 is a stator, and 10 is an oxidation for a watch. Silver battery, 11 is a winding stem, 12 is a train wheel setting lever, 13 is a train wheel bridge,
14 to 18 are screws, 19 is a battery negative terminal, 20 is a battery insulating plate, and 21 is a mold for surely mounting the IC chip 1 on the circuit board 3.

第3図に回路基板3の詳細な平面図を示す。第3図に於
いて3aはスリット、3bは水晶振動子装着部、3c,3dは水
晶振動子用リードパターン、3e,3f,3g,3h,3i,3j,3kはチ
ェック端子用パターンである。チェック端子用パターン
3e,3f,3h,3i,3jは回路基板3に穿設された透孔内に張出
すように形成され、チェック端子用パターン3g,3kは回
路基板3の外縁から切り込まれたスリットの内部に張出
すように形成されている。
FIG. 3 shows a detailed plan view of the circuit board 3. In FIG. 3, 3a is a slit, 3b is a crystal unit mounting portion, 3c and 3d are crystal unit lead patterns, and 3e, 3f, 3g, 3h, 3i, 3j and 3k are check terminal patterns. Check terminal pattern
3e, 3f, 3h, 3i, 3j are formed so as to project into the through hole formed in the circuit board 3, and the check terminal patterns 3g, 3k are inside the slit cut from the outer edge of the circuit board 3. It is formed so as to overhang.

平断面図や第3図の詳細図に示した様に本実施例の回路
基板3は、ICチップ1の1a部に形成される半導体温度セ
ンサーと水晶振動子2のそれぞれの温度特性を測定する
ためのモニター端子や、水晶振動子2の温度特性に併せ
て半導体温度センサーのオフセット調整や傾き調整をす
るためのデータ転送端子、及び転送されたデータをやは
りICチップ1内に内蔵されている半導体不揮発性メモリ
ーに書き込むための書き込み端子等のチェック端子用パ
ターン3e,3f,3g,3h,3i,3j,3kを片持ちばり形状のオーバ
ーハングパターンとしているため、第4図に示した様
に、半導体温度センサーの温度特性を測定する時や調整
する時にピンプローブ22がチェック端子用パターンに当
たっても、パターン(銅箔)のみが変位し回路基板自身
は曲がらない。従ってICチップ1も曲がらず1a部に半導
体温度センサーを形成するトランジスターの形状変化も
起きないため、調整後のセンサーの温度特性は水晶振動
子2の温度特性に合致したものとなる。尚、3e〜3kは片
持ちばりの支持部付近を細くして、ピンプローブが接触
した時にこの部分に応力集中が起こり確実にパターンの
みが変位するようにしている。
As shown in the plan sectional view and the detailed view of FIG. 3, the circuit board 3 of this embodiment measures the temperature characteristics of each of the semiconductor temperature sensor and the crystal unit 2 formed in the 1a portion of the IC chip 1. For monitoring, a data transfer terminal for adjusting the offset and inclination of the semiconductor temperature sensor in accordance with the temperature characteristics of the crystal unit 2, and a semiconductor in which the transferred data is also incorporated in the IC chip 1. Since the check terminal patterns 3e, 3f, 3g, 3h, 3i, 3j, 3k such as writing terminals for writing in the non-volatile memory are cantilevered overhang patterns, as shown in FIG. Even when the pin probe 22 hits the check terminal pattern when measuring or adjusting the temperature characteristics of the semiconductor temperature sensor, only the pattern (copper foil) is displaced and the circuit board itself is not bent. Therefore, since the IC chip 1 is not bent and the shape of the transistor forming the semiconductor temperature sensor is not changed in the portion 1a, the temperature characteristic of the sensor after adjustment matches the temperature characteristic of the crystal unit 2. In addition, 3e to 3k are thinned in the vicinity of the support portion of the cantilever so that when the pin probe comes into contact, stress concentration occurs in this portion and only the pattern is surely displaced.

また本実施例の電子腕時計に於いては、回路基板3の固
定をねじ14周辺及びねじ15の周辺で行ない、ICチップ1
の周辺の基板は完全にフリーになるように地板4aの高さ
及び回路押え板5の曲げ高さを設定し、固定部からICチ
ップ1までの距離を長くして、ねじ14及び15がゆるんだ
とき、ICチップ1近辺の回路基板の曲がり具合が変化し
ないようにしている。
In the electronic wristwatch of this embodiment, the circuit board 3 is fixed around the screw 14 and the screw 15, and the IC chip 1
Set the height of the base plate 4a and the bending height of the circuit retainer plate 5 so that the board around is completely free, and increase the distance from the fixed part to the IC chip 1 so that the screws 14 and 15 are loose. At this time, the bending condition of the circuit board near the IC chip 1 is not changed.

さらに本実施例の回路基板は、ICチップ1の装着部と水
晶振動子2の間にICチップ1に沿ったスリット3aを設け
ているため、水晶振動子2の固定状態が変化し回路基板
の3b部の高さが変化しても、ICチップ1装着部の回路基
板が変化しないようにしている。また、スリット3aをオ
ーバーハングしている水晶振動子用リードパターン3c及
び3dを、スリット3aとほぼ平行に配線し長くすることに
よって、やはり水晶振動子装着部3bに生じる高さの変化
がICチップに影響を与えないようにしている。
Further, in the circuit board of this embodiment, since the slit 3a along the IC chip 1 is provided between the mounting portion of the IC chip 1 and the crystal oscillator 2, the fixed state of the crystal oscillator 2 changes and the circuit board Even if the height of the 3b part changes, the circuit board of the IC chip 1 mounting part does not change. Further, by making the crystal oscillator lead patterns 3c and 3d overhanging the slit 3a substantially parallel to the slit 3a and lengthening them, the change in height caused in the crystal oscillator mounting portion 3b is also caused by the IC chip. I try not to affect.

以上詳細に説明してきた様に、本実施例の高精度電子腕
時計は、回路基板3の固定状態の変化やピンプローブの
接触の影響により半導体温度センサーの特性が変化しな
いため、機械的要因によりセンサーの特性が経時変化し
ない信頼性の高い高精度電子時計を歩留り良く生産でき
る。
As described in detail above, in the high-precision electronic wrist watch of the present embodiment, the characteristics of the semiconductor temperature sensor do not change due to the change in the fixed state of the circuit board 3 and the contact of the pin probe, and therefore the sensor is caused by mechanical factors. It is possible to produce a highly reliable high-precision electronic timepiece whose characteristics do not change over time with high yield.

又、回路基板単体の状態でも時計体に組み込まれた状態
とほぼ同様の固定状態をつくってやれば、回路基板3を
時計体に組み込んだ時に半導体温度センサーの特性変化
が起こらないので、回路基板単体の状態で水晶発振器と
センサーの温度特性を測定し温度特性の調整することが
できるため、測定及び調整のための装置を小型,簡易化
できる。本実施例の場合、回路基板3がフレキシブルで
ありテープ(フイルム)キャリア方式を用いて温度特性
の測定や調整をライン化できるため、測定及び調整の自
動化と装置の簡易化が容易にできる。
Even if the circuit board alone is made into a fixed state that is almost the same as the state where the circuit board 3 is incorporated into the watch body, the characteristics of the semiconductor temperature sensor do not change when the circuit board 3 is incorporated into the watch body. Since it is possible to measure the temperature characteristics of the crystal oscillator and the sensor in a single state and adjust the temperature characteristics, the device for measurement and adjustment can be downsized and simplified. In the case of the present embodiment, the circuit board 3 is flexible and the temperature characteristics can be measured and adjusted in a line by using the tape (film) carrier method, so that automation of the measurement and adjustment and simplification of the apparatus can be facilitated.

また、本実施例の高精度電子腕時計は回路基板単体の状
態で温度特性をつくり込むことができるため、市場での
アフターサービスも回路基板の交換で対応でき、修理費
の低減と修理期間の短縮化が可能である。
Further, since the high-precision electronic wrist watch of this embodiment can create temperature characteristics in the state of the circuit board alone, after-sales service in the market can also be handled by exchanging the circuit board, reducing the repair cost and the repair period. Is possible.

〔考案の効果〕[Effect of device]

本考案の電子時計は、半導体センサーの調整用のチェッ
ク端子を回路基板の外形内に形成された透孔内部に張出
した片持ばり形状に形成したため、半導体センサーの特
性のばらつきを吸収するための調整時にピンプローブが
当たっても、パターン(銅箔)のみが変形し回路基板自
体は曲がらない。従ってICチップも曲がらず半導体セン
サーの特性変化が起きないため、センサーの特性を正確
に測定でき、調整後の半導体センサーの特性は理想的な
ものとなり、品質の高い半導体センサーを有する電子時
計を歩留まりよく提供することができる。
Since the electronic watch of the present invention has the check terminal for adjusting the semiconductor sensor formed in the shape of a cantilever protruding inside the through hole formed in the outer shape of the circuit board, it is possible to absorb the variation in the characteristics of the semiconductor sensor. Even if the pin probe hits during adjustment, only the pattern (copper foil) is deformed and the circuit board itself is not bent. Therefore, the IC chip will not bend and the characteristics of the semiconductor sensor will not change, so the characteristics of the sensor can be measured accurately, and the characteristics of the adjusted semiconductor sensor will be ideal, yielding an electronic watch with a high-quality semiconductor sensor. Can be well served.

更に、パターンのうち水晶振動子が導電接続される水晶
振動子接続部は、回路基板の外周部から内部に向かって
切り込まれ形成されるスリットによって片持形状に形成
された部位の端部近傍に配置されることにより、回路ブ
ロックとして完成して時計体に組込んだ後ばかりでな
く、時計体に組込む際に、水晶振動子が他の部材例えば
地板や中枠に接触しても、基板の曲りを片持形状に形成
された部位の基部で吸収することができる。
Further, in the pattern, the crystal resonator connecting portion to which the crystal resonator is conductively connected is near the end of the cantilevered portion formed by the slit formed by cutting inward from the outer peripheral portion of the circuit board. When the crystal unit comes into contact with other members such as the base plate or the middle frame not only after being completed as a circuit block and assembled into the timepiece body by being arranged in the timepiece body, Can be absorbed by the base of the cantilevered portion.

従って、基板の変形によるICチップの電極であるパッド
部やICチップ自体への機械的負荷を軽減し、ICチップの
導通の信頼性やICの内蔵半導体センサー等の内部動作を
安定させる事ができるものである。
Therefore, it is possible to reduce the mechanical load on the pad portion which is the electrode of the IC chip and the IC chip itself due to the deformation of the substrate, and to stabilize the reliability of conduction of the IC chip and the internal operation of the IC built-in semiconductor sensor and the like. It is a thing.

また、ICチップのパッドと水晶振動子接続部はスリット
上にスリットの長手方向に斜め又は平行に配置された導
電配線により接続されることにより、回路ブロック組込
み時の水晶振動子接続部とICチップ装着部との間に生じ
る断面的な高さの違いを、スリット上の導電配線で吸収
し、ICチップ装着部に基板変形を伝えないようにするこ
とができるものである。
In addition, the IC chip pad and the crystal unit connection section are connected to each other by conductive wiring that is arranged diagonally or parallel to the slit longitudinal direction, so that the crystal unit connection section and the IC chip when the circuit block is installed The difference in cross-sectional height between the mounting portion and the mounting portion can be absorbed by the conductive wiring on the slit to prevent the substrate deformation from being transmitted to the IC chip mounting portion.

従って、前述したチェック端子が回路基板の透孔内にオ
ーバーハングして形成されていることとあいまって、基
板の片持形状部に水晶振動子を接続するとともに、回路
基板に形成されたスリット上に水晶振動子用導電配線を
配置することにより、ICチップ装着部の回路基板の変形
を防ぎICチップに内蔵された半導体センサーの動作も安
定するという効果を最大限に引き出せるものである。
Therefore, together with the fact that the above-mentioned check terminals are formed by overhanging in the through holes of the circuit board, the crystal unit is connected to the cantilever shape part of the board and the slits formed on the circuit board By arranging the conductive wiring for the crystal oscillator in the, it is possible to maximize the effect of preventing the deformation of the circuit board of the IC chip mounting part and stabilizing the operation of the semiconductor sensor built in the IC chip.

なお、実施例ではICチップ内の半導体温度センサーによ
り水晶発振器の温度補償を行なう電子腕時計を例に説明
したが、本考案は温度や圧力等を測定するための半導体
センサーを有する電子卓上計算機や電子温度計等の小型
電子機器にも適用できるものである。
In the embodiment, the electronic wristwatch in which the temperature of the crystal oscillator is compensated by the semiconductor temperature sensor in the IC chip is described as an example, but the present invention is an electronic desk calculator or electronic device having a semiconductor sensor for measuring temperature, pressure, etc. It can also be applied to small electronic devices such as thermometers.

【図面の簡単な説明】[Brief description of drawings]

第1図は本考案の一実施例を示す電子腕時計の平面図、
第2図は第1図の回路部の断面図、第3図は本考案の回
路基板3の詳細な平面図、第4図は本考案のチェック端
子用パターンにピンプローブがあたったときの断面図、
第5図及び第6図は従来のチェック端子の平断面図、第
7図及び第8図は従来のチェック端子部にピンプローブ
が当たったときの断面図である。 1……ICチップ 1a……センサー部 2……水晶振動子 3……回路基板 3a……スリット 3b……水晶振動子装着部 3c,3d……水晶振動子用リードパターン 3e〜3k……チェック端子用パターン 4……地板 5……回路押え板 5a……回路押え板の水晶固定部 5b,5c……回路押え板の曲げ位置 6……コイル 7……磁心 8……コイルリード基板 9……ステータ 10……時計用酸化銀電池 11……巻真 12……規正レバー 13……輪列受 14〜18……ねじ 19……電池マイナス端子 20……電池絶縁板 21……モールド
FIG. 1 is a plan view of an electronic wrist watch showing an embodiment of the present invention,
2 is a sectional view of the circuit portion of FIG. 1, FIG. 3 is a detailed plan view of the circuit board 3 of the present invention, and FIG. 4 is a sectional view when the pin probe hits the check terminal pattern of the present invention. Figure,
5 and 6 are plan sectional views of the conventional check terminal, and FIGS. 7 and 8 are sectional views when the pin probe hits the conventional check terminal portion. 1 …… IC chip 1a …… Sensor section 2 …… Crystal resonator 3 …… Circuit board 3a …… Slit 3b …… Crystal resonator mounting section 3c, 3d …… Crystal resonator lead pattern 3e to 3k …… Check Terminal pattern 4 ...... Base plate 5 ...... Circuit holding plate 5a ...... Circuit holding plate crystal fixing part 5b, 5c ...... Circuit holding plate bending position 6 ...... Coil 7 ...... Magnetic core 8 ...... Coil lead board 9 ... … Stator 10 …… Silver oxide battery for watch 11 …… Winding stem 12 …… Straining lever 13 …… Wheel train holder 14 ~ 18 …… Screw 19 …… Battery negative terminal 20 …… Battery insulating plate 21 …… Mold

フロントページの続き (56)参考文献 特開 昭58−7584(JP,A) 特開 昭50−120870(JP,A) 実開 昭57−692(JP,U) 実開 昭61−184973(JP,U) 実開 昭60−23787(JP,U) 実開 昭59−104562(JP,U) 実開 昭61−63864(JP,U)Continuation of the front page (56) Reference JP-A-58-7584 (JP, A) JP-A-50-120870 (JP, A) Actual opening 57-692 (JP, U) Actual opening 61-184973 (JP , U) Actually open 60-23787 (JP, U) Actually open 59-104562 (JP, U) Actually open 61-63864 (JP, U)

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】半導体センサーを内蔵したICチップを装着
した回路基板と、 前記回路基板に導電接続される水晶振動子とを有する電
子時計に於いて、 前記回路基板は電気回路を形成する導電配線が配置さ
れ、 前記導電配線はチェック端子部と前記水晶振動子が導電
接続される水晶振動子接続部とを有し、 前記チェック端子部は前記回路基板の外形より内側に形
成された透孔内に片持ばり形状に張り出し形成され、 前記水晶振動子接続部は前記回路基板の外周部から内部
に向かって切り込まれるスリットによって形成された片
持形状の部位の端部近傍に配置され、 前記ICチップの接続端子と前記水晶振動子接続部とを接
続する導電配線は前記スリット上に前記スリットの長手
方向に斜め又は平行に配置されてなることを特徴とする
電子時計。
1. An electronic timepiece having a circuit board on which an IC chip incorporating a semiconductor sensor is mounted, and a quartz oscillator conductively connected to the circuit board, wherein the circuit board is a conductive wiring forming an electric circuit. And the conductive wiring has a check terminal portion and a crystal resonator connecting portion to which the crystal resonator is conductively connected, and the check terminal portion is inside a through hole formed inside the outer shape of the circuit board. The crystal resonator connecting portion is formed in a cantilever shape, and is arranged in the vicinity of an end portion of a cantilever-shaped portion formed by a slit cut inward from the outer peripheral portion of the circuit board, An electronic timepiece characterized in that a conductive wiring connecting a connection terminal of an IC chip and the crystal resonator connecting portion is arranged on the slit obliquely or in parallel with a longitudinal direction of the slit.
JP1987032209U 1987-03-05 1987-03-05 Electronic clock Expired - Lifetime JPH0743672Y2 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP1987032209U JPH0743672Y2 (en) 1987-03-05 1987-03-05 Electronic clock
GB8804759A GB2202994B (en) 1987-03-05 1988-02-29 Circuit assembly, e.g. for an electronic timepiece
US07/164,352 US4876677A (en) 1987-03-05 1988-03-04 Sensor mount for an electronic timepiece
KR1019880002288A KR910008673B1 (en) 1987-03-05 1988-03-05 Electronic clock
CH849/88A CH674117B5 (en) 1987-03-05 1988-03-07
SG42294A SG42294G (en) 1987-03-05 1994-03-22 Circuit assembly, e.g. for an electronic timepiece
HK40494A HK40494A (en) 1987-03-05 1994-04-28 Circuit assembly e.g. for an electronic timepiece

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987032209U JPH0743672Y2 (en) 1987-03-05 1987-03-05 Electronic clock

Publications (2)

Publication Number Publication Date
JPS63139591U JPS63139591U (en) 1988-09-14
JPH0743672Y2 true JPH0743672Y2 (en) 1995-10-09

Family

ID=30838670

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987032209U Expired - Lifetime JPH0743672Y2 (en) 1987-03-05 1987-03-05 Electronic clock

Country Status (1)

Country Link
JP (1) JPH0743672Y2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2519900Y2 (en) * 1989-06-16 1996-12-11 シチズン時計株式会社 Electronic watch test pattern structure
JPH0729514Y2 (en) * 1989-11-07 1995-07-05 セイコーエプソン株式会社 Electronic timepiece circuit board and electronic timepiece

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5758637B2 (en) * 1974-03-09 1982-12-10 Citizen Watch Co Ltd
JPS57692U (en) * 1980-06-03 1982-01-05
JPS587584A (en) * 1981-07-07 1983-01-17 Citizen Watch Co Ltd Electronic timepiece with temperature compensation
JPS61184973U (en) * 1985-05-09 1986-11-18

Also Published As

Publication number Publication date
JPS63139591U (en) 1988-09-14

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