JPH0742126Y2 - ISFET inspection tool - Google Patents
ISFET inspection toolInfo
- Publication number
- JPH0742126Y2 JPH0742126Y2 JP2540092U JP2540092U JPH0742126Y2 JP H0742126 Y2 JPH0742126 Y2 JP H0742126Y2 JP 2540092 U JP2540092 U JP 2540092U JP 2540092 U JP2540092 U JP 2540092U JP H0742126 Y2 JPH0742126 Y2 JP H0742126Y2
- Authority
- JP
- Japan
- Prior art keywords
- isfet
- liquid reservoir
- inspection tool
- inspection
- gate portion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
【考案の詳細な説明】[Detailed description of the device]
【0001】[0001]
【産業上の利用分野】本考案は、半導体イオンセンサの
一種であるISFET(イオン感応性電界効果形トラン
ジスタ)のVDSをパラメータとするIDS−VGS特性又は
VGSをパラメータとするIDS−VDS特性等のFET特性
及びこれらの特性のpH変化に対する特性変化であるp
H特性を、特にアセンブリ前に測定するためのISFE
Tの検査具に関するものである。BACKGROUND OF THE INVENTION The present invention relates to an I DS -V GS characteristic having V DS of an ISFET (ion-sensitive field effect transistor) which is a kind of semiconductor ion sensor as a parameter or an I DS having V GS as a parameter. FET characteristic such as −V DS characteristic and characteristic change p with respect to pH change
ISFE for measuring H characteristics, especially before assembly
The present invention relates to a T inspection tool.
【0002】[0002]
【従来の技術】この種の検査方法としては、FETのゲ
ート以外の部分を絶縁性の樹脂等でカバーして完成品と
してアセンブリし、各電極に接続する検査装置のリード
線も絶縁処理した後に、容器内の電解質液に浸漬させて
検査したり、或は検査具の先端部の脱脂綿等に液を浸し
て手で持ってゲート部に接触させる方法がある。2. Description of the Related Art As an inspection method of this type, a portion other than a gate of an FET is covered with an insulating resin or the like and assembled as a finished product, and a lead wire of an inspection device connected to each electrode is also insulated. There is a method of immersing in an electrolyte solution in a container for inspection, or a method of immersing the solution in absorbent cotton or the like at the tip of the inspection tool and holding it by hand to bring it into contact with the gate section.
【0003】[0003]
【考案が解決しようとする課題】しかしながら、前者の
方法のようにアセンブリを行ってから測定するのでは、
手間もかかり、簡易な検査は不可能である。後者の方法
の場合、検査具を手で持ってゲート部に液を接触させる
ために、検査具の接触角度、液の乾燥又は過多によって
測定精度を低下又は測定不能にする可能性があった。よ
って、本考案は、アセンブリ前にISFETのFET特
性又はpH特性を簡易、かつ精度良く測定可能にするI
SFETの検査具を提供することを目的とする。[Problems to be Solved by the Invention] However, if the measurement is performed after the assembly as in the former method,
It takes time and labor, and a simple inspection is impossible. In the case of the latter method, since the liquid is brought into contact with the gate portion by holding the inspection tool by hand, there is a possibility that the measurement accuracy may be lowered or the measurement may be impossible due to the contact angle of the inspection device, the liquid being dried, or the liquid being excessive. Therefore, the present invention makes it possible to easily and accurately measure the FET characteristics or pH characteristics of the ISFET before assembly.
It is an object to provide an inspection tool for SFET.
【0004】[0004]
【課題を解決するための手段】本考案は、この目的を達
成するために、請求項1により、液溜の先端部に、液溜
に貯えられた検査用電解質液を毛細管現象によりゲート
部に供給し、かつISFETのゲート部に相応した形状
の芯材を装着すると共に、ゲート部に電圧を印加するリ
ード線を芯材から液溜を通して導出したことを特徴とす
る。In order to achieve this object, the present invention provides, according to claim 1, a tip portion of a liquid reservoir and an electrolyte solution for inspection stored in the liquid reservoir to a gate portion by a capillary phenomenon. The present invention is characterized in that a core material having a shape suitable for the gate portion of the ISFET is attached and a lead wire for applying a voltage to the gate portion is led out from the core material through a liquid reservoir.
【0005】液溜に電解質液を簡単に供給するには、請
求項2により、液を圧入するための輸液チュ−ブを液溜
から導出する。測定精度を一層向上させるには、請求項
3により、液溜を着脱自在に保持する保持台を付属させ
る。In order to easily supply the electrolyte solution to the liquid reservoir, the infusion tube for press-fitting the liquid is drawn out from the liquid reservoir according to the second aspect. In order to further improve the measurement accuracy, according to claim 3, a holder for detachably holding the liquid reservoir is attached.
【0006】[0006]
【作用】ISFETのゲート部に、液溜に電解質液を充
填した検査具の芯材を接触させると、芯材の毛細管現象
により、対接したゲート部のみに電解質液が液溜から絶
えず供給される。[Operation] When the gate of the ISFET is brought into contact with the core material of the inspection tool in which the electrolyte is filled in the liquid reservoir, the capillary fluid of the core causes the electrolyte to be constantly supplied from the liquid reservoir only to the facing gate portion. It
【0007】[0007]
【実施例】図1は本考案の一実施例によるISFETの
検査具を示す。検査具10は、保持台20に保持される
円筒状基部11に、同軸状に前方へ液溜12を取付け、
この液溜の小さな径に変形した円筒状の先端部12aに
芯材13を挿入して構成されている。保持台20は、横
方向に可動で、かつ基部11が挿入される半円より大き
めの断面で、弾性を呈する係合部21bを形成されたハ
ンドル21a付スライダ21、前後方向に可動のハンド
ル22a付スライダ22及び上下方向に可動のロックね
じ23a付スライダ23とを直交3軸方向へスライド調
整可能に組合わされている。1 shows an ISFET inspection tool according to an embodiment of the present invention. In the inspection tool 10, a liquid reservoir 12 is coaxially attached to a front side of a cylindrical base portion 11 held by a holding table 20,
A core material 13 is inserted into a cylindrical tip portion 12a which is deformed to a small diameter of the liquid reservoir. The holding table 20 is laterally movable, and has a cross section larger than a semicircle into which the base 11 is inserted. The slider 21 has a handle 21a formed with an elastic engaging portion 21b, and a handle 22a movable in the front-rear direction. The slider 22 with a slider and the slider 23 with a lock screw 23a that is movable in the vertical direction are combined so as to be slidable in three orthogonal directions.
【0008】芯材13は、毛細管現象を呈するように、
例えば多孔質吸水性のPVA(ポリビニールアルコー
ル)により一本の中空糸として形成されている。この芯
材は、僅かに露出されると共に、ISFET1aのゲー
ト部5(図2)の幅に相当する直径に設定されている。
芯材13にはAg/Agcl線が接続しており、また液
溜12からは差込み端子16のリード線17が導出さ
れ、このリード線及び前述のAg/Agcl線間は検査
具10内で接続されている。液溜12からは、輸液チュ
ーブ14が導出されている。The core material 13 has a capillary phenomenon,
For example, it is formed as one hollow fiber from porous water-absorbing PVA (polyvinyl alcohol). The core material is slightly exposed and is set to have a diameter corresponding to the width of the gate portion 5 (FIG. 2) of the ISFET 1a.
An Ag / Agcl wire is connected to the core member 13, and a lead wire 17 of a plug-in terminal 16 is led out from the liquid reservoir 12. The lead wire and the Ag / Agcl wire described above are connected in the inspection tool 10. Has been done. An infusion tube 14 is drawn out from the liquid reservoir 12.
【0009】図2において、1は、複数のカット前のI
SFET1aが配列されたアセンブリ前のウエハであ
り、各チップはそれぞれダイオード電極2、ソース電極
3、ドレイン電極4及びゲート部5を備えている。In FIG. 2, reference numeral 1 is I before a plurality of cuts.
It is a wafer before assembly in which SFETs 1a are arranged, and each chip has a diode electrode 2, a source electrode 3, a drain electrode 4 and a gate portion 5, respectively.
【0010】検査に際しては、図1に示すように、ウエ
ハ1を検査台にセットすると共に、ソース電極3及びド
レイン電極4に検査装置から導出されたリード線の端子
を接続する。一方、ウエハ1に対面する保持台20の係
合部21bには、液溜12に輸液チューブ14を通して
注射器等の圧入具で検査用の電解質液を充填され、かつ
差込み端子16も検査装置に接続させた検査具10の基
部11をセットする。輸液チューブ14を通しての圧入
で電解質液を芯材13から確実に泌み出させ、検査すべ
きISFET1aのゲート部5に接触させるように、保
持台20を3軸方向へ位置調整する。At the time of inspection, as shown in FIG. 1, the wafer 1 is set on the inspection table, and the source electrode 3 and the drain electrode 4 are connected to the terminals of the lead wire led out from the inspection apparatus. On the other hand, the engaging portion 21b of the holding table 20 facing the wafer 1 is filled with the electrolyte solution for inspection with a press fitting tool such as a syringe through the liquid reservoir 12 through the infusion tube 14, and the insertion terminal 16 is also connected to the inspection device. The base 11 of the inspection tool 10 thus set is set. The holding table 20 is positionally adjusted in the three axial directions so that the electrolyte solution is surely exuded from the core material 13 by press fitting through the infusion tube 14 and is brought into contact with the gate portion 5 of the ISFET 1a to be inspected.
【0011】検査を開始させると、ゲート部5は、容器
内に浸漬されたのと同等に検査用の電解質液で浸され、
FET特性或はpH特性が測定される。測定中に、ゲー
ト部5の電解質液が乾燥しようとすると、芯材13の毛
細管現象により自動的に液が泌み出し、ゲート部5に対
して正確な位置関係で絶えず浸され、毛細管現象により
液が過多になることもない。When the inspection is started, the gate portion 5 is dipped with the electrolyte solution for inspection in the same manner as when it is dipped in the container,
The FET characteristic or pH characteristic is measured. If the electrolyte solution in the gate section 5 is about to dry during the measurement, the solution automatically oozes out due to the capillary action of the core material 13 and is constantly immersed in the gate section 5 in an accurate positional relationship. There is no excess liquid.
【0012】別のISFET1aを測定する場合にはウ
エハ1をシフトさせ、また必要により保持台20の微調
整を行って、測定を再開する。繰返しの測定で、電解質
液が消耗した場合、輸液チューブ14を通して補給する
ことができる。pH特性を測定する場合、予めpH値の
異る電解質液を個別の検査具10の液溜12に充填して
おき、測定の際に個別の保持台20にセットする等で行
う。液溜12の液を交換する場合には、輸液チューブ1
4を通して電解質液を圧入する。When another ISFET 1a is measured, the wafer 1 is shifted, and if necessary, the holding table 20 is finely adjusted to restart the measurement. When the electrolyte solution is exhausted by repeated measurement, it can be replenished through the infusion tube 14. When the pH characteristic is measured, electrolyte solutions having different pH values are filled in advance in the liquid reservoir 12 of the individual inspection tool 10 and set on an individual holding table 20 at the time of measurement. When replacing the liquid in the liquid reservoir 12, the infusion tube 1
The electrolyte solution is pressed in through No. 4.
【0013】尚、前述の実施例において、検査具10の
液溜12から導出された輸液チューブ14は、場合によ
っては廃止することもでき、この場合液溜12を基部1
1から外して背後から液を充填した後、基部11に液密
状態で装着させ得るようにする。芯材13には、毛細管
現象を呈する繊維束等を用いることも可能である。検査
具10を保持台20にセットすることなく、手で持って
測定する場合でも、従来の手持ち検査具に比べて液溜1
2からの毛細管現象による安定した液供給が保証され
る。In the above-described embodiment, the infusion tube 14 led out from the liquid reservoir 12 of the inspection tool 10 can be omitted depending on the circumstances, and in this case, the liquid reservoir 12 is used as the base portion 1.
After removing from 1, and filling the liquid from the back, the base 11 can be mounted in a liquid-tight state. For the core material 13, it is possible to use a fiber bundle that exhibits a capillary phenomenon. Even when the test tool 10 is held by hand without being set on the holding table 20, a liquid pool 1 is provided as compared with the conventional hand-held test tool.
A stable liquid supply by the capillary phenomenon from 2 is guaranteed.
【0014】[0014]
【考案の効果】以上、請求項1の考案によれば、電解質
液に浸せる段階までアセンブリしないで簡単にゲート部
のみを検査用の電解質液で浸すことができ、また毛細管
現象により液溜からゲート部に乾燥又は過多にさせるこ
となく、絶えず安定して供給できる。したがって、容器
内の液に浸漬させなくても測定精度も高度に確保でき、
乾燥しないことにより繰返しの測定も可能になる。請求
項2の考案によれば、輸液チュ−ブを通して液溜へ電解
質液が簡単、かつ確実に圧入可能になる。請求項3の考
案によれば、検査具の位置が固定され、測定操作が簡単
になり、測定精度も一層向上する。As described above, according to the invention of claim 1, it is possible to easily immerse only the gate portion with the electrolyte solution for inspection without assembling it until the step of immersing it in the electrolyte solution. It can be constantly and stably supplied without being dried or excessive in the gate portion. Therefore, it is possible to secure a high degree of measurement accuracy without immersing it in the liquid in the container.
Repeated measurement is also possible by not drying. According to the second aspect of the invention, the electrolyte solution can be easily and surely press-fitted into the liquid reservoir through the infusion tube. According to the invention of claim 3, the position of the inspection tool is fixed, the measurement operation is simplified, and the measurement accuracy is further improved.
【図1】本考案の一実施例によるISFETの検査具の
斜視図である。FIG. 1 is a perspective view of an ISFET inspection tool according to an embodiment of the present invention.
【図2】同ISFETのウエハの正面図である。FIG. 2 is a front view of a wafer of the ISFET.
1a ISFET 10 検査具 12 液溜 13 芯材 14 輸液チューブ 20 保持台 1a ISFET 10 Inspection tool 12 Liquid reservoir 13 Core material 14 Infusion tube 20 Holding table
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/66 B 7630−4M L 7630−4M V 7630−4M ─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 6 Identification code Office reference number FI Technical display location H01L 21/66 B 7630-4M L 7630-4M V 7630-4M
Claims (3)
のISFETの検査具であって、 液溜の先端部に、前記液溜に貯えられた検査用電解質液
を毛細管現象によりゲート部に供給し、かつISFET
のゲート部に相応した形状の芯材を装着すると共に、前
記ゲート部に電圧を印加するリード線を前記芯材から前
記液溜を通して導出したことを特徴とするISFETの
検査具。1. An ISFET inspection tool for measuring FET characteristics or pH characteristics, wherein the inspection electrolyte solution stored in the liquid reservoir is supplied to the gate portion by capillary action at the tip of the liquid reservoir. , And ISFET
An inspection tool for ISFET, characterized in that a core material having a shape corresponding to the gate portion is attached, and a lead wire for applying a voltage to the gate portion is led out from the core material through the liquid reservoir.
ューブが、液溜から導出されていることを特徴とする請
求項1のISFETの検査具。2. The ISFET inspection tool according to claim 1, wherein an infusion tube for press-fitting the electrolyte solution into the liquid reservoir is led out from the liquid reservoir.
することを特徴とする請求項1のISFETの検査具。3. The ISFET inspection tool according to claim 1, further comprising a holding table for detachably holding the liquid reservoir.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2540092U JPH0742126Y2 (en) | 1992-03-27 | 1992-03-27 | ISFET inspection tool |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2540092U JPH0742126Y2 (en) | 1992-03-27 | 1992-03-27 | ISFET inspection tool |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0622966U JPH0622966U (en) | 1994-03-25 |
JPH0742126Y2 true JPH0742126Y2 (en) | 1995-09-27 |
Family
ID=12164859
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2540092U Expired - Lifetime JPH0742126Y2 (en) | 1992-03-27 | 1992-03-27 | ISFET inspection tool |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0742126Y2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5237728B2 (en) * | 2008-08-29 | 2013-07-17 | 日本電子株式会社 | Particle beam equipment |
-
1992
- 1992-03-27 JP JP2540092U patent/JPH0742126Y2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0622966U (en) | 1994-03-25 |
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