JPH07294237A - Method for measuring profile of hole using three-dimensional measuring apparatus - Google Patents

Method for measuring profile of hole using three-dimensional measuring apparatus

Info

Publication number
JPH07294237A
JPH07294237A JP10750894A JP10750894A JPH07294237A JP H07294237 A JPH07294237 A JP H07294237A JP 10750894 A JP10750894 A JP 10750894A JP 10750894 A JP10750894 A JP 10750894A JP H07294237 A JPH07294237 A JP H07294237A
Authority
JP
Japan
Prior art keywords
hole
measuring
measurement
profile
coordinate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10750894A
Other languages
Japanese (ja)
Inventor
Hisashi Hori
尚志 堀
Naoya Kikuchi
直也 菊池
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Mitsutoyo Kiko Co Ltd
Original Assignee
Mitutoyo Corp
Mitsutoyo Kiko Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp, Mitsutoyo Kiko Co Ltd filed Critical Mitutoyo Corp
Priority to JP10750894A priority Critical patent/JPH07294237A/en
Publication of JPH07294237A publication Critical patent/JPH07294237A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To provide a method for measuring the profile of a hole using a three-dimensional measuring apparatus in which the profile of a hole can be measured accurately by determining the projection surface reliably at high rate. CONSTITUTION:The surface profile of a hole 32 in a predetermined surface 31 of a work 14 is measured by projecting a measuring point on the inner wall thereof onto a corresponding projection surface using a three-dimensional measuring apparatus with a touch probe. In such measuring method, the coordinate positions of two points A and B on the inner wall of the hole 32 are measured at a predetermined depth delta. Subsequently, the outer product (c) in two measuring directions (a) and (b) is determined in the measuring operation and a surface having a normal vector closest to the outer product (c) is determined as a projection surface 33.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、タッチ式プローブを持
つ三次元測定機を用いて、ワークの所定面にある円や楕
円等の孔の表面形状を測定する方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for measuring the surface shape of a hole such as a circle or an ellipse on a predetermined surface of a work by using a coordinate measuring machine having a touch probe.

【0002】[0002]

【従来の技術】タッチ式プローブを持つ三次元測定機を
用いて、ワーク形状を測定する場合、図5に示すよう
に、プローブ50によりワークの各面の座標データを求
め、ワーク上に作られたワーク座標系(x,y,z)を
基準として、寸法計算が行われる。但し、図5に示すよ
うに、ワークのある面51に垂直にあいた円や楕円等の
孔52の表面形状を測定する場合には、原理的にその孔
52があいている面51上では孔形状を計算するための
必要な座標データを得ることはできない。
2. Description of the Related Art When a work shape is measured by using a coordinate measuring machine having a touch probe, coordinate data of each surface of the work is obtained by a probe 50 as shown in FIG. The dimension calculation is performed on the basis of the workpiece coordinate system (x, y, z). However, as shown in FIG. 5, when measuring the surface shape of a hole 52 such as a circle or an ellipse that is perpendicular to the surface 51 on which the work is present, in principle, a hole is not formed on the surface 51 where the hole 52 is open. It is not possible to obtain the necessary coordinate data to calculate the shape.

【0003】従って図6に示すように、孔52の面51
の位置よりδだけ内部にずれた内壁で座標データを求め
ることになる。三点A,B,Cの座標データが求められ
ても、その座標データはズレ量δを持っているから、測
定点A,B,Cを面51に対応する投影面61に投影し
て、ズレ量δをなくしてから形状計算(要素計算)を行
う必要がある。
Therefore, as shown in FIG. 6, the surface 51 of the hole 52 is
The coordinate data will be obtained from the inner wall which is deviated from the position of by δ. Even if the coordinate data of the three points A, B, and C are obtained, since the coordinate data has the deviation amount δ, the measurement points A, B, and C are projected on the projection surface 61 corresponding to the surface 51, It is necessary to perform the shape calculation (element calculation) after eliminating the deviation amount δ.

【0004】投影面61を決める方法として、上述した
孔内壁での座標データを求める前に、予め投影面を指定
する方法があるが、孔の測定動作により求められた座標
データを利用して投影面を自動的に決定する方法も提案
されている。これは、図6に示すように、三つの測定点
A,B,Cが求められると、これらの測定点を含む面が
決まるから、その面をまず計算してその法線ベクトルP
を求め、この法線ベクトルPに最も近い法線ベクトルを
持つ面を投影面と判定するものである。
As a method of determining the projection plane 61, there is a method of designating the projection plane in advance before obtaining the coordinate data on the inner wall of the hole, but the coordinate data obtained by the measurement operation of the hole is used for projection. A method of automatically determining the surface has also been proposed. This is because, as shown in FIG. 6, when three measurement points A, B, and C are obtained, a plane including these measurement points is determined. Therefore, the plane is first calculated and its normal vector P is calculated.
Is obtained, and the surface having the normal vector closest to the normal vector P is determined as the projection surface.

【0005】[0005]

【発明が解決しようとする課題】しかし、図6で説明し
た従来法では、投影面を判定するために三点の測定デー
タを必要とする。また、その三点A,B,Cが例えば図
7に示すようにワーク面51からのズレ量が互いに異な
る位置であったとすると、三点A,B,Cにより決まる
面の法線ベクトルPは、図示のようになり、これに最も
近い法線ベクトルを持つ投影面は、実際に必要とするワ
ークの面51に対応するものでなくなるといった事態が
生じ兼ねない。
However, the conventional method described with reference to FIG. 6 requires the measurement data of three points to determine the projection plane. If the three points A, B, and C are at positions where the deviation amounts from the work surface 51 are different from each other as shown in FIG. 7, the normal vector P of the surface determined by the three points A, B, and C is As shown in the drawing, the projection plane having the closest normal vector to this may not correspond to the surface 51 of the workpiece actually required.

【0006】本発明は、この様な事情を考慮してなされ
たもので、高速且つ確実に投影面を求めて正確な孔形状
の測定を可能とした三次元測定機を用いた孔形状の測定
方法を提供することを目的としている。
The present invention has been made in consideration of such circumstances, and the hole shape measurement using a coordinate measuring machine capable of obtaining the projection surface at high speed and reliably and accurately measuring the hole shape. It is intended to provide a way.

【0007】[0007]

【課題を解決するための手段】本発明は、タッチ式プロ
ーブをもつ三次元測定機を用いて、ワークの所定面にあ
る孔の表面形状を、その内壁での測定点を前記所定面に
対応する投影面に投影して測定する方法であって、前記
孔の内壁の2点の座標位置を測定し、その測定動作にお
ける二つの測定方向の外積を求め、その外積に最も近い
法線ベクトルをもつ面を投影面として求めることを特徴
としている。
According to the present invention, a three-dimensional measuring machine having a touch probe is used to determine the surface shape of a hole on a predetermined surface of a workpiece and the measurement point on the inner wall of the hole to correspond to the predetermined surface. And measuring the coordinate positions of two points on the inner wall of the hole, obtaining the outer products of the two measurement directions in the measurement operation, and determining the normal vector closest to the outer product. The feature is that the plane that has is obtained as the projection plane.

【0008】[0008]

【作用】本発明によると、円や楕円の要素計算に利用さ
れる投影面の判定が孔内の2点の測定データに基づいて
行われるため、3点の測定データを必要とする従来方式
に比べてより高速の投影面判定が可能になる。また、2
点の測定点の測定方向のベクトル外積を演算する本発明
の方法によると、2点の測定点の深さ位置(ズレ量)が
異なったとしても、その影響を受けることなく、正しい
投影面判定ができる。
According to the present invention, the determination of the projection plane used for the calculation of the element of a circle or an ellipse is performed based on the measurement data of two points in the hole, so that the conventional method requiring the measurement data of three points is used. Compared with this, a faster projection plane determination is possible. Also, 2
According to the method of the present invention for calculating the vector cross product of the measurement points of the measurement points, even if the depth positions (deviation amounts) of the two measurement points are different, they are not affected and the correct projection plane determination is made. You can

【0009】[0009]

【実施例】以下、図面を参照して、本発明の実施例を説
明する。図1は、本発明の一実施例に用いる三次元測定
機の全体構成を示す。三次元測定機本体11は、制御駆
動部は省略したが、テーブル13上の(X,Y,Z)座
標系での三次元移動が可能である。三次元測定機本体1
1の先端にタッチ式プローブ12が着脱自在に設けられ
て、これによりテーブル13に置かれたワーク14の三
次元座標値測定が行われる。測定された座標値はデータ
処理装置15に送られて、要素計算等の必要なデータ処
理がなされ、測定結果は表示装置16に表示される。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 shows the overall configuration of a coordinate measuring machine used in an embodiment of the present invention. Although the control drive unit is omitted in the coordinate measuring machine main body 11, it is possible to perform three-dimensional movement in the (X, Y, Z) coordinate system on the table 13. CMM main unit 1
A touch-type probe 12 is detachably provided at the tip of the workpiece 1, so that the three-dimensional coordinate value of the workpiece 14 placed on the table 13 is measured. The measured coordinate values are sent to the data processing device 15, where necessary data processing such as element calculation is performed, and the measurement result is displayed on the display device 16.

【0010】ワーク14のある面に垂直に開けられた円
または楕円の形状を測定する場合、前述のように要素計
算のための投影面を必要とする。この実施例での投影面
判定法は、次のようになる。図3に示すように、ワーク
14の面31に開けられた孔32に所定深さδまでプロ
ーブを挿入して、孔32の内壁の2点A,Bの座標値を
測定する。孔32に挿入したプローブ先端を孔32の内
壁に接触するまで移動させる座標測定動作での二つの測
定方向a,bは、例えば孔32の軸に垂直の方向であっ
て、且つそれらのなす角θが0°または180°になら
ないように選べばよい。この二つの測定方向a,bが投
影面判定用の入力データとしてデータ処理装置に15に
取り込まれる。
When measuring the shape of a circle or an ellipse opened perpendicularly to a surface of the work 14, a projection surface for element calculation is required as described above. The projection plane determination method in this embodiment is as follows. As shown in FIG. 3, the probe is inserted into the hole 32 formed in the surface 31 of the work 14 to a predetermined depth δ, and the coordinate values of two points A and B on the inner wall of the hole 32 are measured. The two measurement directions a and b in the coordinate measuring operation for moving the probe tip inserted into the hole 32 until it contacts the inner wall of the hole 32 are, for example, the directions perpendicular to the axis of the hole 32 and the angles formed by them. It may be selected so that θ does not become 0 ° or 180 °. These two measurement directions a and b are taken into the data processor 15 as input data for determining the projection plane.

【0011】データ処理装置15ではまず、入力された
二つの測定方向a,bの外積が求められる。図3に示す
ように、外積cはこれら二つの測定方向a,bに対して
共に垂直になるベクトルで表される。即ち二つの測定方
向a,bのなす角度θが0°または180°でなけれ
ば、これら二つの測定方向a,bを含む一つの面が一義
的に決まり、外積cはこの面に垂直という関係になる。
そして、求められた外積cに最も近い法線ベクトルを持
つ面が投影面33として判定され、その判定された投影
面33上で孔32の形状を求める要素計算がなされる。
In the data processor 15, first, the cross product of the two input measurement directions a and b is obtained. As shown in FIG. 3, the outer product c is represented by a vector that is perpendicular to both of these two measurement directions a and b. That is, if the angle θ formed by the two measurement directions a and b is not 0 ° or 180 °, one plane including these two measurement directions a and b is uniquely determined, and the outer product c is perpendicular to this plane. become.
Then, the surface having the normal vector that is closest to the obtained outer product c is determined as the projection surface 33, and element calculation for determining the shape of the hole 32 on the determined projection surface 33 is performed.

【0012】図2は、データ処理装置15における上述
した投影面判定と要素計算の処理ブロック構成を示す。
入力された二つの測定方向a,bの外積が外積演算部2
1で求められ、法線ベクトル判定部22において求めら
れた外積に最も近い法線ベクトルを持つ面が投影面とし
て選択され、要素計算部23で投影面での要素計算がな
される。法線ベクトル判定部22で求められた投影面
は、表示装置16上に表示して操作者が確認できるよう
にすることが好ましい。
FIG. 2 shows a processing block configuration of the above-described projection plane determination and element calculation in the data processing device 15.
The outer product of the two input measurement directions a and b is the outer product calculation unit 2
The surface having the normal vector that is obtained in 1 and closest to the outer product obtained by the normal vector determination unit 22 is selected as the projection surface, and the element calculation unit 23 performs element calculation on the projection surface. The projection plane obtained by the normal vector determination unit 22 is preferably displayed on the display device 16 so that the operator can confirm it.

【0013】この実施例によると、従来のように3個の
座標測定を行う方式に比べて、投影面判定処理が高速に
なる。しかもこの実施例の場合、図4に示すように二つ
の測定点A,Bの表面31から深さ(ズレ量)δ1,δ
2が異なったとしても問題ない。即ち、二つの測定方向
a,bがいずれも孔の軸に対して垂直であれば、それら
の外積cは図3の場合と同様のベクトルとなり、図7で
説明した従来方式の場合のように誤った投影面判定を行
うおそれはない。
According to this embodiment, the projection plane determination process becomes faster than the conventional method of measuring three coordinates. Moreover, in the case of this embodiment, as shown in FIG. 4, depths (deviation amounts) δ1 and δ from the surface 31 of the two measurement points A and B are measured.
There is no problem even if 2 is different. That is, if the two measurement directions a and b are both perpendicular to the axis of the hole, the outer product c of them is the same vector as in the case of FIG. 3, and as in the case of the conventional method described in FIG. There is no risk of making an incorrect projection plane determination.

【0014】[0014]

【発明の効果】以上述べたように本発明によれば、タッ
チ式プローブを持つ三次元測定機を用いてワークの孔の
形状測定を行う場合の要素計算に利用される投影面の判
定処理が、孔内の2点の測定データに基づいて高速に行
われる。また、2点の測定点の測定方向のベクトル外積
を演算する本発明の方法によると、2点の測定点の深さ
位置が異なったとしても、その影響を受けることなく、
正しい投影面判定ができる。
As described above, according to the present invention, the projection surface determination process used for element calculation in the case of measuring the shape of a hole of a work by using a coordinate measuring machine having a touch probe. , Is performed at high speed based on the measurement data of two points in the hole. Further, according to the method of the present invention for calculating the vector cross product of the measurement directions of the two measurement points, even if the depth positions of the two measurement points are different, they are not affected, and
The correct projection plane can be determined.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の一実施例に用いる三次元測定機の概
略構成を示す。
FIG. 1 shows a schematic configuration of a coordinate measuring machine used in an embodiment of the present invention.

【図2】 同実施例の投影面判定処理系のブロック構成
を示す。
FIG. 2 shows a block configuration of a projection plane determination processing system of the same embodiment.

【図3】 同実施例の投影面判定処理の方法を説明する
為の図である。
FIG. 3 is a diagram for explaining a projection plane determination processing method according to the embodiment.

【図4】 同実施例の投影面判定の有効性を説明するた
めの図である。
FIG. 4 is a diagram for explaining the effectiveness of the projection plane determination of the embodiment.

【図5】 三次元測定機によるワークの孔形状測定の原
理を説明するための図である。
FIG. 5 is a diagram for explaining the principle of hole shape measurement of a work by a coordinate measuring machine.

【図6】 従来法による投影面判定法を説明するための
図である。
FIG. 6 is a diagram for explaining a projection plane determination method according to a conventional method.

【図7】 従来法の問題を説明するための図である。FIG. 7 is a diagram for explaining a problem of the conventional method.

【符号の説明】[Explanation of symbols]

11…三次元測定機本体、12…タッチ式プローブ、1
3…テーブル、14…ワーク、15…データ処理装置、
16…表示装置、21…外積演算部、22…法線ベクト
ル判定部、23…要素計算部、31…面、32…孔、3
3…投影面、A,B…測定点、a,b…測定方向、c…
外積。
11 ... CMM main body, 12 ... Touch probe, 1
3 ... table, 14 ... work, 15 ... data processing device,
16 ... Display device, 21 ... Outer product calculation unit, 22 ... Normal vector determination unit, 23 ... Element calculation unit, 31 ... Surface, 32 ... Hole, 3
3 ... Projection plane, A, B ... Measuring point, a, b ... Measuring direction, c ...
Cross product.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 タッチ式プローブをもつ三次元測定機を
用いて、ワークの所定面にある孔の表面形状を、その内
壁での測定点を前記所定面に対応する投影面に投影して
測定する方法であって、 前記孔の内壁の2点の座標位置を測定し、 その測定動作における二つの測定方向の外積を求め、 その外積に最も近い法線ベクトルをもつ面を投影面とし
て求めることを特徴とする三次元測定機を用いた孔形状
の測定方法。
1. A coordinate measuring machine having a touch probe is used to measure the surface shape of a hole on a predetermined surface of a workpiece by projecting a measurement point on the inner wall of the hole onto a projection surface corresponding to the predetermined surface. Measuring the coordinate positions of two points on the inner wall of the hole, obtaining the outer products of the two measurement directions in the measurement operation, and obtaining the surface having the normal vector closest to the outer product as the projection surface. A method for measuring the shape of a hole using a coordinate measuring machine.
JP10750894A 1994-04-22 1994-04-22 Method for measuring profile of hole using three-dimensional measuring apparatus Pending JPH07294237A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10750894A JPH07294237A (en) 1994-04-22 1994-04-22 Method for measuring profile of hole using three-dimensional measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10750894A JPH07294237A (en) 1994-04-22 1994-04-22 Method for measuring profile of hole using three-dimensional measuring apparatus

Publications (1)

Publication Number Publication Date
JPH07294237A true JPH07294237A (en) 1995-11-10

Family

ID=14460990

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10750894A Pending JPH07294237A (en) 1994-04-22 1994-04-22 Method for measuring profile of hole using three-dimensional measuring apparatus

Country Status (1)

Country Link
JP (1) JPH07294237A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011043475A (en) * 2009-08-24 2011-03-03 Nissan Motor Co Ltd Device and method for measuring tapered seating face
WO2013121595A1 (en) * 2012-02-15 2013-08-22 三菱重工業株式会社 Normal detection method, normal detection device, and machining machine provided with normal detection function
CN108253912A (en) * 2018-04-02 2018-07-06 广西玉柴机器股份有限公司 A kind of method for examining each stylus correlation of three coordinate measuring machine

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011043475A (en) * 2009-08-24 2011-03-03 Nissan Motor Co Ltd Device and method for measuring tapered seating face
WO2013121595A1 (en) * 2012-02-15 2013-08-22 三菱重工業株式会社 Normal detection method, normal detection device, and machining machine provided with normal detection function
EP2827098A4 (en) * 2012-02-15 2015-12-30 Mitsubishi Heavy Ind Ltd Normal detection method, normal detection device, and machining machine provided with normal detection function
US10132624B2 (en) 2012-02-15 2018-11-20 Mitsubishi Heavy Industries, Ltd. Normal detection method, normal detection device, and machining machine provided with normal detection function
CN108253912A (en) * 2018-04-02 2018-07-06 广西玉柴机器股份有限公司 A kind of method for examining each stylus correlation of three coordinate measuring machine

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