JPH07270470A - Matrix type selector circuit - Google Patents

Abstract

PURPOSE:To simplify the constitution of a matrix type selector circuit for reducing the number of parts, required space and cost, and detecting a diode to prevent the propagation of a shortcircuit error. CONSTITUTION:Regarding a matrix type selector circuit to select desired relay elements RY11 to RY22 through switch operation, the cathode side voltage of shortcircuit error propagation preventing diodes D11 to D22 connectable to the elements RY11 to RY22 is compared via comparators CP0 to CP3 connected to a direct current power supply E on the basis of a high and low reference voltage E01 and E02, and the result of the comparison is outputted. Then, a shortcircuit propagation preventing diode is detected on the basis of the output signal and the mode of relay element selection.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a matrix type selection circuit in which a plurality of actuating means which are activated by energization and a sneak prevention diode are incorporated, and in particular, a short circuit abnormality of the sneak prevention diode can be detected. The present invention relates to a matrix type selection circuit.

[0002]

2. Description of the Related Art As a circuit configuration diagram of a conventional matrix type selection circuit, for example, one having a configuration shown in FIG. 2 is known. In the figure, in the circuit portion A, each relay element RY11a, RY2 as an operating means that is activated by energization is provided in the vicinity of the intersection of the first power supply lines LV1, LV2 and the second power supply lines LH1, LH2 that intersect each other.
1a, RY12a and RY22a, and the cathode side is the second
A series circuit of sneak prevention diodes D11a, D21a, D12a and D22a on the power supply lines LH1 and LH2 side is inserted between the first power supply lines LV1 and LV2 and the second power supply lines LH1 and LH2. Further, the first power supply lines LV1 and LV2 are individually connected to the positive electrode side line P of the DC power supply E through the first power supply line selection switches S10 and S20 serving as selection switch means, and the second power supply lines LH1 and LH2 is a second power supply line selection switch S as selection switch means.
The circuit portion A is configured by being individually connected to the negative electrode side line N via 01 and S02.

A circuit portion B having the same circuit configuration as the circuit portion A is connected in parallel with the circuit portion A between the positive electrode side line P and the negative electrode side line N. Relay elements RY11b and RY which are circuit elements of the circuit portion B
21b, RY12b and RY22b, and sneak prevention diodes D11b, D21b, D12b and D22b.
Is the relay elements RY11a and RY21 of the circuit part A.
a, RY12a and RY22a and sneak-prevention diodes D11a, D21a, D12a and D22a, which correspond to the first power supply line selection switches S10 and S20.
And the second power supply line selection switches S01 and S02 are linked in the circuit portion A and the circuit portion B.

That is, the conventional matrix type selection circuit has a dual structure of the circuit portion A and the circuit portion B having the same circuit configuration, and the first power source line selection switches S10 and S20 and the second power source line are provided. Select switch S01,
At S02, each pair of relay elements RY11a and RY11b of circuit portion A and circuit portion B, RY21a and RY21, respectively.
b, RY12a and RY12b, RY22a and RY22b
It is configured so that any one of the above is selected and energized to operate.

Further, the conventional matrix type selection circuit includes relay elements RY11a, RY21a, RY12.
a, RY22a, RY11b, RY21b, RY12b
And contacts r11a, r for detecting the operating state of RY22b
12a, r21a, r22a, r11b, r21b, r
The operation abnormality detection circuit 1 including 12b and r22b is connected. The operation abnormality detecting circuit 1 is provided between the positive electrode side line P ₁ and the negative electrode side line N ₁ of the DC power source E ₁ .
Each contact point r11a, r21a, r12a and r22a,
A series circuit in which the contacts r11b, r21b, r12b and r22b and the check devices CH1, CH2, CH3 and CH4 are connected in series is connected in parallel. Each of the check devices CH1, CH2, CH3, CH4 has a contact point r.
11a, r12a, r21a and r22a and contact point r11
It is configured to operate only when a pair of b, r12b, r21b, and r22b are both turned on.

In the conventional example having the above-mentioned configuration, the matrix type selection circuit has a dual configuration of the circuit portion A and the circuit portion B, and the probability that the circuit elements in the same portion of both circuit portions A and B will simultaneously fail. If both circuit parts A and B perform the same circuit operation based on the judgment that is very small, both circuit parts A and B
Each circuit element of B is operating normally, and both circuit parts A,
If B operates differently, it is considered that the circuit is abnormal.

Further, the relay elements RY11a, RY21
a, RY12a, RY22a, RY11b, RY21
The operating states of b, RY12b and RY22b are detected by the check devices CH1, CH2, CH3 and CH4. For example, a pair of relay elements RY11a and RY11b
If the check device CH1 operates when is selected, it is detected that both the contact r11a and the contact r11b are in the ON state, and the pair of relay elements RY11a and RY11b are both selected and are operating normally. To be detected.

On the other hand, relay elements RY11a and RY11b
Is selected and the check device CH1 does not operate,
It is detected that one or both of the relay elements RY11a and RY11b has a malfunction.

[0009]

However, in the above-mentioned conventional matrix type selection circuit, since the circuit configuration has the dual configuration of the circuit portion A and the circuit portion B,
There is an unsolved problem that a large number of parts of circuit elements are required, a required space becomes large, and the cost becomes high.

Further, when the circuit operation is different between the circuit portion A and the circuit portion B, a circuit abnormality is detected. At this time, is it due to a short circuit abnormality of the sneak-in prevention diode or another cause? There is an unsolved problem that it is difficult to judge and maintenance work becomes difficult. further,
Check device CH1, CH2, C of the operation abnormality detection circuit 1
An abnormal operation of one or both of the pair of relay elements of the circuit portion A and the circuit portion B is detected by H3 and CH4, but there is an unsolved problem that which relay element is abnormal cannot be specified. .

Therefore, the present invention has been made in view of the above-mentioned unsolved problems, and by simplifying the circuit structure, the number of parts of circuit elements is reduced, the required space is reduced, and the cost is reduced. It is an object of the present invention to provide a matrix type selection circuit capable of detecting a short circuit abnormality of a sneak-in prevention diode and an operating means such as a relay element having an operation abnormality.

[0012]

In order to achieve the above object, a matrix type selection circuit according to a first aspect of the invention is individually connected to a positive side line and a negative side line of a DC power source and arranged so as to intersect each other. A plurality of first power source lines and second power source lines, and an actuating means and a cathode side which are activated in the vicinity of the intersection of the two power source lines by the energization interposed between the first power source line and the second power source line. A series circuit of sneak prevention diodes on the side of the second power supply line, and a selection switch means arranged at a connection portion between the positive and negative side lines and the respective first and second power supply lines. In the provided matrix type selection circuit, first comparing means for comparing the voltage of each of the second power supply lines with a high-potential reference voltage, and the voltage of each of the second power supply lines is of a low-potential basis. Abnormality for detecting a short circuit abnormality of the sneak prevention diode based on second comparing means for comparing with a voltage, comparison outputs from the first comparing means and the second comparing means, and a selection state of the selection switch. And a location detecting means.

The matrix type selection circuit according to a second aspect of the present invention is an operation in which a series circuit of a switching element and an additional resistor, which individually respond to the operating state of each of the operating means connected to the DC power source, is connected in parallel. A series circuit of a detection circuit and a base resistance; a third comparison means for comparing an operating voltage at a connection point of the operation detection circuit and the base resistance of the series circuit with a low-potential reference voltage; Fourth comparing means for comparing the operating voltage with a high-potential reference voltage, the third comparing means, the fourth comparing means, and the fifth comparing means. It is also characterized in that an operation abnormality detecting means for detecting an abnormal operation state of the selective operation of the actuating means is provided on the basis of the comparison output from and the selected state of the selection switch.

Further, in the matrix type selection circuit according to a third aspect of the present invention, the first comparing means for comparing the voltage of each of the second power supply lines with the high-potential reference voltage and the voltage of each of the second power supply lines are low. A short circuit abnormality of the sneak prevention diode is detected based on a second comparing means for comparing with a reference voltage of a potential, a comparison output from the first comparing means and the second comparing means, and a selection state of the selection switch. An operation detecting circuit and a base resistance which are connected in parallel with a series circuit of a switching element and an additional resistor, which are provided with an abnormal point detecting means for detecting, and which further respond individually to the operating state of each operating means connected to the DC power supply. And a third comparison means for comparing the operating voltage at the connection point of the operation detection circuit and the base resistor of the series circuit with a low-potential reference voltage, and the operating voltage as a medium-potential reference voltage. A fourth comparison means for compare, a fifth comparison means for comparing the operating voltage and the reference voltage of the high potential,
An operation abnormality detecting means for detecting an abnormal operation state of the selection operation of the actuating means based on the comparison outputs from the third comparing means, the fourth comparing means and the fifth comparing means and the selection state of the selection switch is provided. It is also characterized.

[0015]

In the matrix type selection circuit according to the first aspect, the first power source line and the second power source line different from the first power source line and the second power source line in which desired operation means selected by operating the selection switch are inserted. If there is no short circuit abnormality in the sneak prevention diode inserted between the two power supply lines,
Although only the desired actuating means operates, if there is a short circuit abnormality in the sneak prevention diode, the operating means connected to this sneak prevention diode also operates, so when there is no short circuit abnormality in the sneak prevention diode. In comparison, the voltage of the second power supply line changes. The voltage change of the second power supply line is detected by the first and second comparing means for comparing with the reference voltage of the high potential and the low potential, and the wraparound which is abnormal by the abnormal portion detecting means from the comparison output and the switch state. Identify the prevention diode.

Further, in the matrix type selection circuit according to the second aspect, if the selected operating means is normal, the switching element is turned on in response to the operating state thereof, so that the operation detecting circuit includes this switching element. Only the series circuit is conducting. On the other hand, if the selected actuation means is abnormal, the switching element will not turn on,
No current flows through the operation detection circuit, and the operation voltage at the connection point between the operation detection circuit and the base resistance is different from that when the operating means is normal. Third and fourth comparisons of this change in operating voltage with reference voltages of low potential, medium potential and high potential
Then, the fifth comparing means detects the abnormality, and the operation abnormality detecting means detects the presence or absence of abnormality of the operating means from the comparison output and the switch state.

Further, as in the matrix type selection circuit according to the third aspect, in the case where the first to fifth comparing means, the abnormal portion detecting means and the operation abnormality detecting means are provided, the abnormal portion is as described above. The detection means identifies the sneak-in prevention diode that has become abnormal, and the operation abnormality detection means detects whether or not there is an abnormality in the operation means.

[0018]

Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a circuit configuration diagram showing an embodiment of the present invention. In the figure, first power supply lines LV1 and LV2 and second power supply lines LH1, which are arranged so as to intersect with each other.
In the vicinity of the intersection with LH2, relay elements RY11, RY21, RY as actuating means that are activated by energization.
12 and RY22 and the relay elements RY11, RY21,
Leakage prevention diodes D11, D21, D12 and D2 for preventing the sneak current to RY12 and RY22.
A series circuit with 2 is inserted so that the cathode side of the sneak-in prevention diode faces the second power source line and connects the both power source lines.

One end sides of the first power source lines LV1 and LV2 are individually connected to the positive electrode side line P of the DC power source E, and the first power source line selection switches S10 and S20 as selection switch means are connected to this connection portion. Has been inserted. One end sides of the second power supply lines LH1 and LH22 are
Second power supply line selection switches S01 and S02 as selection switch means are individually connected to the negative electrode side line N of the DC power supply E.

That is, the first power supply line selection switch S1
0, S20 and second power supply line selection switches S01, S0
The desired relay elements RY11, R can be selected by selecting 2
A matrix type selection circuit for selecting and operating Y21, RY12, and RY22 is configured. The other end sides of the second power supply lines LH1 and LH2 are connected to the diode abnormality location detection circuit 1. The diode abnormality location detection circuit 1 is connected between the resistors R1 and R2 interposed between the second power supply lines LH1 and LH2 and the positive electrode side line P, and the positive electrode side line P and the negative electrode side line N. Voltage dividing resistors R3 and R5 for producing a high potential reference voltage E _01, and voltage dividing resistors R4, R6 connected between the positive electrode side line P and the negative electrode side line N for producing a low potential reference voltage E ₀₂ , Second power line L
Comparators CP0 and CP2 as first comparing means for comparing the voltages of H1 and LH2 with the high-potential reference voltage E ₀₁ formed by the voltage dividing resistors R3 and R5, and the second power supply line LH.
Comparators CP1 and CP3 as second comparing means for comparing the voltages of L1 and LH2 with the low-potential reference voltage E ₀₂ formed by the voltage dividing resistors R4 and R6; and the first power supply line selection switches S10 and S20. Selection states of the second power supply line selection switches S01 and S02 and the comparator CP
0, CP1, CP2 and CP3 comparison outputs S0, S
1, S2 and S3, and an abnormal part detecting circuit 2 as an abnormal part detecting means for detecting a connection part of a diode for preventing a short circuit abnormality from flowing around.

Here, when the high-potential reference voltage E ₀₁ has a short circuit abnormality in a predetermined sneak-in prevention diode and a current also flows in the second power supply line to which the cathode side of the sneak-in prevention diode is connected. It is set to a value higher than the voltage of the second power supply line and lower than the voltage of the DC power supply E. Specifically, in this embodiment, the DC power supply voltage is 5 V, and each relay element RY11, RY21, RY1
2, the coil resistance values of RY22 are all equal, the resistance values of the resistors R3 and R5 are set so that the reference voltage E ₀₁ has a high potential of 3.3 V <E ₀₁ <5 V, and the reference voltage E ₀₂ is Resistor R is set so that the potential is as low as 0V <E ₀₂ <1V.
The resistance values of R4 and R6 are set. In addition, the resistance R1,
When the second power supply line selection switch S01 or S02 is turned on, the value of R2 is the sneak prevention diode D.
Even if at least one of 11, D21, D12, D22 has a short circuit abnormality, relay elements RY11, RY21, RY1
2, each resistance value is set to a large resistance value of 10 kΩ (kilo ohm) so that RY22 does not operate.

On the other hand, the comparators CP0 and CP2 are
The voltage VP1 at the connection P1 between the second power supply line LH1 and the resistor R1 and the voltage VP2 at the connection P2 between the second power supply line LH2 and the resistance R2 are compared with the reference voltage E _01, and VP1 ≧ E ₀₁ and VP2 ≧ When E ₀₁ , the logical value “1” is output, and when VP1 <E ₀₁ and VP2 <E ₀₁ , the comparison outputs S0 and S2 having the logical value “0” are output. The comparators CP1 and CP3 output the voltage VP1 and the voltage VP2.
Compared with the reference voltage E ₀₂ , VP1 ≦ E ₀₂ and VP2 ≦
The logical value "1" when the E _02, also comparing the output of logic value "0" when the VP1> E ₀₂ and VP2> E ₀₂ S1
And S3 are output.

In addition, the abnormal point detection circuit 2 includes first and second power supply line selection switches S10, S20, S01,
Switch contacts r11, r21, r12 that interlock with S02
And r22 are connected. The abnormal point detection circuit 2
The comparison output S0, S1, S2, S3 and the outputs from the switch contacts S10a, S20a, S01a, S02a are used to identify the short-circuiting abnormality preventive diode.

For example, the first power supply line selection switch S1
0 and the second power supply line selection switch S01 are turned on to operate the relay element RY11, the relay element RY
If there is no short-circuit abnormality in the sneak-prevention diode D22 inserted between the first power supply line LV2 and the second power supply line LH2 to which 11 is not connected, the current spills through the first power supply line selection switch S10 and the relay element RY11. It flows through the protection diode D11 and the second power supply line selection switch S01. Therefore, the voltage VP1 at the connecting portion P1 between the second power supply line LH1 and the resistor R1 becomes 0V, and the voltage VP2 at the connecting portion P2 between the second power supply line LH2 and the resistor R2 becomes 5V. Next, in the diode abnormality location detection circuit 1, the voltage VP1
And the voltage VP2 are compared with the high-potential reference voltage E ₀₁ by the comparators CP0 and CP2 and the low-potential reference voltage E ₀₂ by the comparators CP1 and CP3.
Comparative outputs S0, S1, from CP1, CP2 and CP3
S2 and S3 have logical values "0", "1", "1" and "0", respectively.

Further, the sneak prevention diode D2
If there is a short circuit abnormality in 2, the current will flow through the above path, and the current will flow through the relay element RY1 as indicated by the dotted line in the figure.
2, sneak-prevention diode D12, sneak-prevention diode D22, relay element RY22, relay element R
Y21 and sneak-prevention diode D21 also flow in this order. Therefore, the voltage VP1 remains 0V, but the voltage VP2 changes to 5V × 2 / 3≈3.3V. And
The comparison outputs S0, S1, S2 and S3 have logical values "0", "1", "0" and "0", respectively.

Similarly, the first power supply line selection switches S10 and S20 and the second power supply line selection switch S0 are similarly processed.
When the desired relay element is operated by selecting 1 and S02, the first power source line LV1 or LV2, the second power source line LH1 or LH to which the relay element is not connected
Depending on the presence or absence of a short circuit abnormality of the sneak-in prevention diode connected to No. 2, the voltage VP1 at the connection points P1 and P2 with the resistors R1 and R2 of the second power supply lines LH1 and LH2, respectively.
VP2 changes, and naturally the comparison outputs S0, S1, S2, S3
Also changes. When the sneak-in prevention diode is normal with no short-circuit abnormality, a comparison output as shown in Table 1 is obtained, and when there is a short-circuit abnormality in the sneak-prevention diode, a comparison output as shown in Table 2 is obtained. can get.

[0027]

[Table 1]

[0028]

[Table 2]

Therefore, for example, the relay element R is selected by selecting the first and second power supply line selection switches S20 and S01.
When Y21 is operated, the comparison outputs S1 and S2 both have a logical value of "1" and the comparison outputs S0 and S3 have a logical value of "0". The prevention diode D12 detects that there is no short circuit abnormality and is normal, and when the relay element RY21 is similarly operated, the logical value of only the comparison output S1 is "1",
If all the logical values of the comparison outputs S0, S2, S3 are "0", the abnormal point detection circuit 2 is configured to detect the short circuit abnormality of the sneak-in prevention diode D12 as corresponding to No. 2 in Table 2. There is.

On the other hand, in the matrix type selection circuit of this embodiment, relay elements RY11, RY21, RY12 and R are provided.
A relay operation abnormality detection circuit 3 including contacts r11, r21, r12 and r22 as switching elements which respond to the operating state of Y22 is connected. This relay operation abnormality detection circuit 3 is a DC power supply. A series circuit of a motion detection circuit PA and groups resistor R8 connected between the positive side line P ₁ of E ₁ and the negative electrode side line N _1, between the positive electrode side line P ₁ and the negative electrode side line N ₁ Voltage dividing resistors R11 and R14 that are connected to generate a low potential reference voltage E ₀₃ and a voltage dividing resistor that is connected between the positive electrode side line P ₁ and the negative electrode side line N ₁ to generate a medium potential reference voltage E _04. R12, R15 and dividing resistors making reference voltage E ₀₅ of the connected high voltage between the positive electrode side line P ₁ and the negative electrode side line N ₁ R13, R16
And a comparator CP4 as a third comparison means for comparing the operating voltage VP5 at the connection point P5 between the operation detection circuit PA and the base resistor R8 with the low-potential reference voltage E ₀₃ formed by the voltage dividing resistors R11 and R14. And a comparator CP5 as a fourth comparison means for comparing the operating voltage VP5 with a reference voltage E ₀₄ having a medium potential formed by the voltage dividing resistors R12 and R15.
And a comparator CP6 as fifth comparing means for comparing the operating voltage VP5 with a high-potential reference voltage E ₀₅ formed by the voltage dividing resistors R13 and R16, the first power supply line selection switches S10 and S20, and 2 Selection states of power supply line selection switches S01 and S02 and the comparator CP
4, comparison outputs S4, S5 and S from CP5 and CP6
6 and an abnormality detecting circuit 4 as an operation abnormality detecting means for detecting a relay element having an operation abnormality.

Here, the operation detection circuit PA has contacts one of the contacts r11, r21, one end of which is connected in parallel to the positive electrode side line P ₁ .
Additional resistors R17, R18, R are provided at the other ends of r12 and r22.
19 and R20 are connected in series, and additional resistors R17 to R2
The other ends of 0 are connected to each other. Further, the comparators CP4, CP5 and CP6 compare the operating voltage VP5 with the reference voltages E ₀₃ , E ₀₄ and E _05, and VP5 ≦ E ₀₃ ,
Logical value “1” when VP5 ≧ E ₀₄ and VP5 ≧ E ₀₅
Comparison outputs S4, S5 and S6 of VP5>
When E ₀₃ , VP5 <E ₀₄ and VP5 <E ₀₅ , the comparison outputs S4, S5 and S6 having the logical value “0” are output.

Regarding the concrete values of the reference voltages E _03, E _04, E ₀₅ , in this embodiment, the voltage of the DC power source E ₁ is 5 V,
The resistance value of the base resistor R8 is set to 1 kΩ and the resistance values of the resistors R17 to R20 are set to 4 kΩ, and the reference voltages E ₀₃ , E ₀₄ , E are set.
The values of ₀₅ are 0 V <E ₀₃ <0.5 V, 0.5 V <E ₀₄ <
Resistor R11 so that 1V, 1V <E ₀₅ <1.6V
Each resistance value of ~ R16 is set. That is, one of the relay elements RY11, RY21, RY12, RY22
The operating voltage VP5 at the connection point P5 is 0V when no one is selected and operating, and the operating voltage VP5 is 5V when only one selected relay element is operating normally.
× 1/5 = 1V, and when two relay elements operate, the operating voltage VP5 is 5V × 1/3 = 1.66V, and there are two or more relay elements due to a short circuit abnormality of the sneak prevention diode. When operating, the operating voltage VP5 is 1.66V
Based on the above, each reference voltage E _03, E _04, E
₀₅ is set.

Further, the abnormality detection circuit 4 has switch contacts r11, r21, r1 for detecting the operating states of the first and second power supply line selection switches S10, S20, S01, S02.
2 and r22 are individually connected. Abnormality detection circuit 4
Are comparison outputs S4, S5 and S6 from the comparators CP4, CP5 and CP6, and switch contacts S10a and S10.
Using the outputs from 20a, S01a, S02a, the operating states of the relay elements RY11, RY21, RY12, RY22, that is, the first and second power supply line selection switches S1.
It is configured to detect whether or not the desired relay element selected by operating 0, S20, S01, and S02 is operating normally.

For example, when the relay element RY11 is operated by selecting the first and second power source line selection switches S10 and S01, if the relay element RY11 is normal, the contact r1 responsive to the operating state of the relay element RY11.
1 is turned on, and the sneak prevention diode D2
If there is no short circuit abnormality in 2, in the operation detection circuit PA,
Since only the series circuit including the contact point r11 is conductive, the operating voltage VP5 at the connection point P5 between the operation detection circuit PA and the base resistor R8 is 5V × 1/5 = 1V in this embodiment.
The logical values of the comparison outputs S4, S5 and S6 from the comparators CP4, CP5 and CP6 are "0", "1" and "0", respectively.

Similarly, when the relay element RY11 is operated, when the relay element RY11 has an abnormal operation, the contact r11 remains off, so that the voltage VP5 remains 0 V and each comparison output S4. , S5 and S6 are "1", "0" and "0", respectively. Further, similarly, when the relay element RY11 is operated and the short-circuit prevention diode D22 has a short circuit abnormality, a contact r1 for detecting the operating state of the relay element RY11.
1 is turned on, the current flows through the relay element RY11, and as described above, the relay elements RY12, RY22, R
It also flows into Y21. Therefore, all the series circuits constituting the operation detection circuit PA are turned on, and the operation voltage VP5 at the connection point P5 is 5V × 1/2 = 2.5V. The logical values of the comparison outputs S4, S5 and S6 from the comparators CP4, CP5 and CP6 are "0",
It becomes "1" and "1".

As described above, the respective comparison outputs output from the comparators CP4, CP5 and CP6 correspond to the operating state of the selected relay element and the presence / absence of a short circuit abnormality of the predetermined sneak-in prevention diode with respect to this relay element. Become. In the abnormality detection circuit 4, the relay elements RY11 to RY having an operation abnormality are based on the selection mode of the first and second power supply line selection switches S10, S20, S01 and S02 and the comparison output from the comparators CP4, CP5 and CP6.
22 is specified and detected, and a sneak-prevention diode D1
The presence or absence of a short circuit abnormality of 1 to D22 is detected. For example,
When the relay element RY11 is operated by selecting the first and second power supply line selection switches S10 and S01, the comparison outputs from the comparators CP4, CP5 and CP6 are logical values "1", "0" and "0", respectively. When a comparative output indicating that the relay element is not operating is output, the relay element RY11 is detected to have an abnormal operation.

Next, the circuit operation of the matrix type selection circuit having the above configuration will be described. For example, the first power supply line selection switch S10 and the second power supply line selection switch S01 are turned on to operate the relay element RY11. At this time, if the relay element RY11 operates normally and there is no short circuit abnormality in the sneak prevention diode D22, the voltage VP1 becomes 0V and the voltage VP1 becomes 5V. CP1,
Comparative outputs S0, S1, S2 and S from CP2 and CP3
3 as logical values “0”, “1”, “1” and “0” respectively
Is output, and the abnormal point detection circuit 2 determines that the circuit corresponds to No. 1 in Table 1 and detects that the sneak prevention diode D22 is not short-circuited abnormally. In the relay operation abnormality detection circuit 3, the operating voltage VP5 is 1
Since it becomes V, comparators CP4, CP5 and CP6
The comparison outputs S4, S5, and S6 have logical values "0", "1", and "0", respectively, and the relay element RY11 is operating normally in the abnormality detection circuit 4, and the sneak-prevention diode D22 is short-circuited. It is detected that there is no abnormality.

On the other hand, when the operation of the relay element RY11 is normal and there is a short circuit abnormality in the sneak prevention diode D22, the voltage VP1 becomes 0V and VP2 becomes 3.
Since it becomes 3 V, the comparison outputs S0, S1, S2, and S3 from the comparators CP0, CP1, CP2, and CP3 in the diode abnormal point detection circuit 1 are logical values "0", "1",
It becomes "0" and "0", and the abnormal portion detection circuit 2 judges that it corresponds to the number 1 in Table 2 and detects that the sneak-prevention diode D22 has a short circuit abnormality. Further, the operation voltage VP5 in the relay operation abnormality detection circuit 3 is 2.
It becomes 5 V, and the comparison outputs S4, S5 and S6 from the comparators CP4, CP5 and CP6 are logical values "0",
Since they are “1” and “1”, the abnormality detection circuit 4 detects a short circuit abnormality of the sneak-prevention diode D22.

As described above, according to the present embodiment, the circuit does not have to have a double structure as in the conventional case. Therefore, the number of parts is smaller than in the conventional case, the required space can be reduced, and the cost can be reduced. Can be achieved. Also, because the connection location of the sneak-proof diode with a short circuit abnormality can be specified,
Maintenance work becomes easy.

Further, since the operation abnormality detecting means is provided, the first and second power source line selection switches S10 and S2 are provided.
It is possible to detect whether the relay element selected by 0, S01, S02 is operating normally, and
It is possible to identify a relay element that has an abnormal operation. Therefore, the maintenance work becomes easier. In the above embodiment, each of the two first power supply lines LV1, L
Although V2 and the second power supply lines LH1 and LH2 are provided, three or more power supply lines are provided, and a relay element and a sneak prevention diode are inserted between both power supply lines in the vicinity of the intersection where they intersect. May be. When two power supply lines are provided, it is possible to identify the connection location of the diode for preventing short circuit abnormality as described above. However, when three or more power supply lines are provided, short circuit abnormality is detected. The location of the second power supply line where the prevention diode is present can be specified, and the first power supply line where the short circuit abnormality sneak-in prevention diode is present can be specified to be other than the selected first power supply line.

Further, even when three or more power supply lines are provided, if the means for detecting the voltage of the first power supply line is provided, the connection location of both power supply lines of the diode for preventing the short circuit abnormality from sneaking in can be specified. it can. Further, in the above embodiment, the relay elements RY11 _, RY21, and
Although description has been made using RY12 and RY22, other elements or devices may be used as long as they can be activated by energization.

Further, the voltage values of the DC power supplies E and E ₁ , the resistors R1 and R2, the base resistor R8, and the voltage dividing resistors R3 to R6 and R1.
The resistance values of 1 to R16 and the additional resistors R17 to R20 are not limited to those listed in the above embodiment.

[0043]

As described above, according to the matrix type selection circuit of the present invention, the voltage of the second power supply line to which the cathode side of the sneak prevention diode is directed is taken out, and the sneak prevention is performed by the change of this voltage. Since it is equipped with an abnormal point detecting means for detecting a short circuit abnormality of the diode for use, it is not necessary to double the circuit configuration as in the conventional case, the number of parts is reduced, the required space is small, and the cost is low. Furthermore, since the connection location of the diode for preventing the short circuit abnormality from flowing around can be specified, the effect of facilitating the maintenance work can be obtained.

Further, in the case where the operation abnormality detecting means is provided, the operation state of the operation means is also detected, and the operation means having the operation abnormality can be specified, so that the maintenance work is further facilitated. Further, in the case where the abnormality location detecting means and the operation abnormality detecting means are provided, the number of parts of the circuit as described above is reduced, and it is possible to identify the connection location of the diode for preventing the sneak-in of the short circuit abnormality, and The effect that a certain operation means can be specified is obtained.

[Brief description of drawings]

FIG. 1 is a circuit configuration diagram showing a first embodiment of the present invention.

FIG. 2 is an explanatory diagram of a conventional matrix type selection circuit.

[Explanation of symbols]

RY11, RY21, RY12, RY22 Relay element (operating means) D11, D21, D12, D22 Leakage prevention diode r11, r21, r12, r22 Relay element contact (switching element) R8 Base resistance R17, R18, R19, R20 Addition Resistor P, P ₁ Positive line N, N ₁ Negative line PA Operation detection circuit E, E ₁ DC power supply E ₀₁ , E ₀₂ , E ₀₃ , E ₀₄ , E ₀₅ Reference voltage LV1, LV2 First power line LH1, LH2 Second power supply line S10, S20 First power supply line selection switch (selection switch means) S01, S02 Second power supply line selection switch (selection switch means)

Claims (3)

[Claims] 1. A plurality of first power supply lines and second power supply lines, which are individually connected to a positive electrode side line and a negative electrode side line of a DC power supply and are arranged so as to intersect each other, in the vicinity of an intersection of both power supply lines. A series circuit of a sneak prevention diode having a second power source line side and an actuating means that is activated by energization interposed between the first power source line and the second power source line, and the positive electrode side line and the negative electrode side In a matrix type selection circuit including a line and a switch means for selection arranged at a connection portion of each of the first power supply line and the second power supply line, the voltage of each second power supply line is set to a high-potential reference voltage. First comparing means for comparing, second comparing means for comparing the voltage of each of the second power supply lines with a low-potential reference voltage, and comparison outputs from the first comparing means and the second comparing means. A matrix type selection circuit, comprising: an abnormal portion detecting means for detecting a short circuit abnormality of the sneak-in prevention diode based on a selection state of the selection switch. 2. A plurality of first power supply lines and second power supply lines, which are individually connected to a positive electrode side line and a negative electrode side line of a DC power supply and arranged to intersect each other, in the vicinity of an intersection of both power supply lines. A series circuit of a sneak prevention diode having a second power source line side and an actuating means that is activated by energization interposed between the first power source line and the second power source line, and the positive electrode side line and the negative electrode side In a matrix type selection circuit including a line and a selection switch means arranged at a connecting portion between each of the first power supply line and the second power supply line, an operating state of each of the operation means connected to a DC power source is individually A series circuit of an operation detection circuit and a base resistance in which a series circuit of a switching element and an additional resistance that responds to is connected in parallel, and a connection point of the operation detection circuit and the base resistance of the series circuit And a fourth comparing means for comparing the operating voltage with a reference voltage having a low potential, a fourth comparing means for comparing the operating voltage with a reference voltage having a medium potential, and comparing the operating voltage with a reference voltage having a high potential. An abnormal selection operation state of the actuating means is detected based on the comparison outputs from the fifth comparison means, the third comparison means, the fourth comparison means and the fifth comparison means and the selection state of the selection switch. A matrix type selection circuit, comprising: 3. A plurality of first power supply lines and second power supply lines, which are individually connected to a positive electrode side line and a negative electrode side line of a DC power supply and arranged to intersect each other, in the vicinity of the intersection of both power supply lines. A series circuit of a sneak-prevention diode having a cathode side as a second power source line side and an operating means that is activated by energization interposed between the first power source line and the second power source line, and the positive electrode side line and the negative electrode In a matrix type selection circuit including a side line and a switch means for selection arranged at a connecting portion between each of the first power supply lines and the second power supply line, the voltage of each of the second power supply lines is a high-potential reference voltage. And a second comparison means for comparing the voltage of each of the second power supply lines with a low-potential reference voltage, and comparison outputs from the first comparison means and the second comparison means. And an abnormal point detecting means for detecting a short circuit abnormality of the sneak-prevention diode based on the selection state of the selection switch, and further responding individually to the operating state of each operating means connected to the DC power supply. A series circuit of an operation detection circuit and a base resistance in which a series circuit of a switching element and an additional resistance is connected in parallel, and an operation voltage at a connection point of the operation detection circuit and the base resistance of the series circuit is a low-potential reference voltage. Third comparing means for comparing, fourth comparing means for comparing the operating voltage with a reference voltage of medium potential, and fifth comparing means for comparing the operating voltage with a reference voltage of high potential.
Operation for detecting an abnormal operation of the selecting operation of the actuating means based on the comparison output from the comparing means, the third comparing means, the fourth comparing means and the fifth comparing means and the selection state of the selecting switch. A matrix type selection circuit comprising: abnormality detecting means.