JPH07225777A - Method and device for determining inspection cycle - Google Patents

Abstract

PURPOSE:To determine an optimal maintenance inspection cycle by measuring various kinds of factors inside an electronic equipment, executing the processings at each step and determining the inspection cycle of the electronic equipment. CONSTITUTION:In the step 1, data is collected by measuring the temperature at a place where an electronic computer or other electronic equipment is installed, for instance, or inside the electronic equipment. In the step 2, the measured data is collated with the evaluation reference which is preliminarily fixed and stored in a temperature evaluation reference storage mans and evaluation points classified by factors are determined. In the step 3, arithmetic expressions digitizing the influence imparted by temperature environmental factors in the whole year are stored in a temperature acceleration coefficient arithmetic means according to the types of electronic equipments, the arithmetic result based on temperature measured data is integrated as the acceleration coefficient on the evaluation points classified by factors and the total of evaluation points according to the temperature factors are determined. Next, also as for temperature, etc., other than the temperature, the total evaluation point classified by factors is determined by a three-step method. The previously determined evaluation points are summed up, a comprehensive evaluation point is determined, the measured data is digitized and an inspection cycle is determined.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is suitable for measuring the installation environment of electronic equipment such as electronic calculators and electronic measurement control equipment, or the state inside the equipment, and making comprehensive judgments based on the measurement results. The present invention relates to a method and apparatus for determining a proper maintenance / inspection cycle, or determining an improvement measure for an installation environment necessary for extending the maintenance / inspection cycle.

[0002]

2. Description of the Related Art Conventionally, electronic devices such as electronic computers and electronic measurement and control devices used in the process industry have been inspected and maintained at a uniform cycle regardless of the environment in which they are installed. This method has the following problems. Maintenance intervals may be longer for equipment installed in a good environment, risking over-inspection and wasting maintenance costs.

For equipment installed in a poor environment, it is necessary to shorten the maintenance and inspection cycle, but there is a possibility that failure cannot be prevented in advance with a uniform cycle. From the viewpoint of the inspection and maintenance department, man-hours are devoted to work that is less effective and unnecessary costs are incurred. When a device deteriorates or breaks down, it is difficult to identify the environmental factors, and it is not possible to make a policy for improvement.

[0004]

SUMMARY OF THE INVENTION The present invention solves the above-mentioned problems by measuring the most important environmental factors that affect the maintenance and inspection cycle of various electronic devices and measuring the results. It is an object of the present invention to realize a method and a device for determining an optimum maintenance inspection cycle from the above, or for determining an improvement measure of an installation environment necessary for extending the maintenance inspection cycle.

[0005]

According to the present invention, as a method for determining a maintenance / inspection cycle, various factors in a place where an electronic device is installed or inside the electronic device are measured and the following steps are performed. Is executed to determine the inspection cycle of the electronic device. That is, at least 2 of the temperature, humidity, dust and corrosive film thickness of a predetermined part of the electronic device or the installation environment.
The above measurement data is collected, and the evaluation score for each factor is calculated by giving a fixed score according to the magnitude of the measured value.

For each measurement data collected by the above method, an acceleration coefficient that quantifies the effect of the measurement factor on the whole year for each type of electronic device and measurement factor is obtained, and the acceleration factor is added to the evaluation point for each factor to calculate by factor. Find the total score. Next, the total evaluation points for each factor are summed to obtain a total evaluation point. As described above, the measured data of various factors are objectively digitized.

In addition, the equipment is tested in advance for each model of the electronic equipment, the inspection cycle corresponding to the overall evaluation point is set in advance in consideration of past maintenance and inspection data, and the overall evaluation obtained in the previous stage. The points are collated with this to determine the corresponding inspection cycle. On the other hand, the device that determines the maintenance inspection cycle is
Measuring means including a sensor for measurement and a signal converter including temperature, humidity, dust and corrosive film thickness, storage means for storing evaluation reference points for each of temperature, humidity, dust and corrosive film thickness, and the measurement The 1st discriminating means to the 4th discriminating means for collating the results with the evaluation reference points and outputting them as the factor-based evaluation points, and the influences of each factor for the whole year according to the model of the electronic device are temperature, humidity, dust and corrosion. Calculation means for calculating the acceleration coefficient of each film thickness, first to fourth integration means for accumulating the acceleration coefficient to the factor-based evaluation points and outputting the result as a factor-based total evaluation point, and factor-based total evaluation points Summing and outputting as a total evaluation point, an inspection cycle storing means for presetting and storing an inspection cycle corresponding to the total evaluation point for each device, a total evaluation point obtained from the measurement data, and the inspection By matching overall score which has been stored in the period memory means, composed of a check cycle judging means for outputting a corresponding inspection period.

[0008]

The method according to the present invention, as environmental factors greatly related to deterioration and failure of electronic equipment, includes temperature, humidity, dust and corrosive film thickness at the place where the electronic equipment is installed or inside the electronic equipment. Select at least two of them and measure and collect data. From the measured data, factor-based evaluation points are obtained according to a predetermined evaluation standard.

On the other hand, the acceleration factor that quantifies the effect of the measurement factor on the whole year for each electronic device model and measurement factor is obtained,
The above-mentioned factor-based evaluation points are added up to obtain a factor-based total evaluation point. Sum the total evaluation points for each factor obtained earlier,
Obtain a comprehensive evaluation score. As described above, the measurement data of environmental factors can be objectively digitized. Therefore, it becomes possible to accumulate and widely utilize these data.

Next, the electronic equipment is preliminarily tested for each type of electronic equipment, the inspection cycle corresponding to the overall evaluation point is set in advance in consideration of past maintenance and inspection data, and the overall evaluation point previously obtained. Can be compared with this to determine the corresponding inspection cycle.

[0011]

The present invention will be described below with reference to the drawings. FIG. 1 is a flow chart showing an example of implementing the method of the present invention. FIG. 2 is a block diagram of the apparatus used for the implementation. This device is composed of various sensors and a measuring means including an input device for converting the measurement signals of the sensors into signals suitable for internal processing, and other means.

In FIG. 2, reference numeral 21 is a temperature measuring means consisting of a temperature detecting sensor and a signal converter, the output signal of which is indicated by a ₁ . Reference numeral 22 is a humidity measuring means including a humidity detecting sensor and a signal converter, and outputs the output signal b
Shown with ₁ .

Reference numeral 23 is a dust measuring means comprising a dust detecting sensor and a signal converter, and its output signal is indicated by c ₁ . Reference numeral 24 is a corrosive film thickness measuring means including a corroded film thickness detection sensor and a signal converter, and the output signal thereof is indicated by d ₁ . The measuring means includes automatic detection or means for individually detecting manually and inputting a signal by key operation.

Reference numeral 25 is a temperature evaluation standard storage means, and as shown in the temperature T column of the evaluation standard table FIG. 3, the measurement range of the temperature which is the measurement factor is 5 from low temperature to high temperature in this example.
The evaluation points 1 to 16 are divided and divided into stages and stored. Reference numeral 26 denotes a humidity evaluation standard storage means, and as shown in the humidity H column of the evaluation standard table FIG. 3, in this example, the measurement range of the humidity as a measurement factor is divided into five stages from low humidity to high humidity for evaluation. Points 1 to 32 are assigned and stored.

Numeral 27 is a dust evaluation standard storage means, and as shown in the dust D column of the evaluation standard table FIG. 3, the measurement range of dust which is a measurement factor is 5 from low to high in this example.
The evaluation points 1 to 48 are divided and divided into stages and stored. Reference numeral 28 denotes a corrosion degree evaluation standard storage means, and as shown in the corrosion degree column of the evaluation standard table FIG. 3, in this example, the measurement range of the corrosion film thickness is 5 steps from low corrosion degree to high corrosion degree. The evaluation points 1 to 64 are allocated and stored by being divided into.

Reference numeral 29 denotes a first discriminating means, which is the temperature signal a ₁ output from the temperature measuring means 21 and the measured value in the temperature T column of the evaluation standard table FIG. 3 stored in the temperature evaluation standard storage means 25. To find an evaluation point and output it as a signal a ₃ . Reference numeral 30 denotes a second determining means, which is the humidity measuring means 2
The humidity signal b ₁ which is the output of 2 and the humidity evaluation reference storage means 2
The evaluation reference table stored in FIG. 6 is collated with the measured value in the humidity H column of FIG. 3 to find an evaluation point and output as a signal b ₃ .

Reference numeral 31 denotes a third discriminating means, which is the dust signal c ₁ output from the dust measuring means 23 and the measured value in the dust D column of the evaluation standard table FIG. 3 stored in the dust evaluation standard storage means 27. To find an evaluation point and output it as a signal c ₃ . Reference numeral 32 denotes a fourth discriminating means, which is the output of the corroded film thickness measuring means 24 and the corrosive film thickness signal d ₁ and the corrosiveness evaluation standard stored in the corrosiveness evaluation standard storage means 28. The value is collated to find the evaluation point and output as a signal d ₃ .

Reference numerals 33, 34, 35, and 36 are acceleration coefficient calculation means for calculating the influence of the measurement factors throughout the year for each measurement factor of temperature, humidity, dust, and corrosion film thickness for each model of electronic equipment. Numerical examples of each are shown in the acceleration coefficient column of FIG. 37 is a first integrating means, which is a first
Output signal a ₃ of the discrimination means 29 and temperature acceleration coefficient calculation means 3
The acceleration coefficient (signal a ₄ ) for each factor calculated in step 3 is read out, integrated, and output as a total evaluation point a ₅ for each factor.

Reference numeral 38 denotes a second integrating means which reads out and integrates the output signal b ₃ of the second discriminating means 30 and the acceleration coefficient (signal b ₄ ) for each factor calculated by the humidity acceleration coefficient calculating means 34. Then, the total evaluation score b ₅ for each factor is output. 39 is a third integrating means, which is an output signal c of the third discriminating means 31.
The acceleration coefficient (signal c ₄ ) for each factor calculated by ₃ and the dust acceleration coefficient calculation means 35 is read out and integrated, and the result is output as a total evaluation point c ₅ for each factor.

Reference numeral 40 denotes a fourth integrating means, which is an output signal d ₃ of the fourth determining means 32 and a corrosion film thickness acceleration coefficient calculating means 36.
The acceleration coefficient (signal d ₄ ) for each factor calculated in step S4 is read out, integrated, and output as a total evaluation point d ₅ for each factor. Four
Reference numeral 1 denotes an adding means, which adds the outputs of the first to fourth integrating means and outputs the result as a signal e.

Reference numeral 42 denotes an inspection cycle storage means, which preliminarily tests the electronic equipment according to the model of the electronic equipment, and in consideration of past maintenance and inspection data, the inspection cycle (FIG. 5) corresponding to the comprehensive evaluation point is given in advance. Determine and store. Reference numeral 43 denotes an inspection cycle discriminating means, which compares the total evaluation point output from the adding means with the inspection cycle (FIG. 5) corresponding to the total evaluation point stored in the inspection cycle storage means 42. It is found and is output as a signal g.

Reference numeral 44 denotes an inspection cycle display section which receives the signal g and displays the inspection cycle of the electronic equipment to be inspected.
Next, the operation contents of this apparatus will be described with reference to the flowchart of FIG. In Step 1, for example, the temperature at the place where the electronic computer or other electronic equipment is installed or the temperature inside the electronic equipment is measured by the measuring means 21 and data is collected.

In step 2, for the above measurement data,
The factor-based evaluation points are obtained by collating with the evaluation standard (FIG. 3) which is predetermined and stored in the temperature evaluation standard storage means 25.
In step 3, an arithmetic expression for quantifying the effect of environmental factors of temperature on the whole year is stored in advance in the temperature acceleration coefficient calculating means 33 for each model of the electronic device, and the calculation result based on the temperature measurement data is calculated as the acceleration coefficient ( As shown in FIG. 4), the above-mentioned factor-specific evaluation points are integrated to obtain a temperature-factor-specific total evaluation point (signal a ₅ ).

Next, in the same manner, humidity other than temperature, dust,
As for the corroded film thickness, at least one or more factor-wise total evaluation points are obtained by the three-step method like the temperature. The above-obtained two or more factor-specific total evaluation points are summed by the addition calculation means 41 to obtain a total evaluation point (signal e). As described above, the measured data of environmental factors are objectively digitized.

Further, the equipment is tested in advance for each model of the electronic equipment, and the inspection cycle corresponding to the total evaluation point is determined in consideration of past maintenance inspection data and stored in the inspection cycle storage means 42 for inspection. The cycle discriminating means 43 compares the comprehensive evaluation point obtained previously with the comprehensive evaluation point stored in the inspection cycle storing means 42 to determine the corresponding inspection cycle.

[0026]

As described above, according to the present invention,
The maintenance inspection cycle can be determined for each environment in which electronic equipment is installed, so maintenance work can be performed at an optimal cycle for each equipment, reducing maintenance costs and improving equipment reliability. Extending the continuous operation period of equipment It is expected that the life of equipment will be extended.

Therefore, the number of system downs is reduced,
Direct effects such as improved productivity can be expected. In addition, by measuring the installation environment of the electronic device or the temperature, humidity, dust and corrosive film thickness inside the device, objectively evaluating the measurement results, and accumulating the data, the device specific In addition to being able to ascertain the environmental resistance characteristics of, it has the effect of being able to perform accurate failure analysis should a failure occur.

[Brief description of drawings]

FIG. 1 is a flowchart showing an example of a method of implementing the present invention.

FIG. 2 is a block diagram showing an example of an apparatus to which the method of the present invention is applied.

FIG. 3 is an example of an evaluation standard table that defines evaluation points corresponding to each measurement factor.

FIG. 4 is a diagram showing acceleration factors corresponding to respective measurement factors.

FIG. 5 is a diagram that defines an inspection cycle corresponding to a total evaluation score.

[Explanation of symbols]

21-24 Measuring Means 25-28,42 Storage Means 29-32,43 Discriminating Means 33-36 Computing Means 37-40 Accumulating Means 41 Adding Means 44 Display Parts a ₁ -a ₅ Temperature Factor Signals b ₁ -b ₅ Humidity Signals related to factors c _{1 to} c ₅ Signals related to dust factor d _{1 to} d ₅ Signals related to corrosion thickness factor e Total signal of signals related to each factor f Signal related to inspection period reference g Inspection period display signal

Claims (2)

[Claims] 1. A method for determining an inspection cycle of an electronic device, which comprises performing the following steps. Stage 1 Collect the measurement data of at least two of the temperature, humidity, dust and corrosive film thickness of the predetermined part of the electronic equipment or installation environment, and divide the measurement range according to the type of electronic equipment and the measurement factor. By comparing the points determined according to the size, the evaluation score for each factor is obtained for each measurement data collected in step 1, and the measurement data collected in step 3 is measured according to the electronic device model and measurement factor. Calculate the acceleration factor that quantifies the effect of factors throughout the year, add up to the factor-specific evaluation score obtained in step 2 to obtain the factor-specific total evaluation score, and calculate the factor-specific total evaluation score in step 4 step 3 The total evaluation point is calculated by summing up the total evaluation points obtained in step 5 and step 4 and the total evaluation points that have been set in consideration of maintenance and inspection data by testing the equipment in advance for each model of electronic equipment. With corresponding inspection cycle Determining the inspection cycle of electronic equipment by collating. 2. Including temperature, humidity, dust and corrosive film thickness,
Measurement means consisting of a measurement sensor and a signal converter, storage means for storing evaluation reference points for temperature, humidity, dust and corrosive film thickness, and evaluation by factor by collating the measurement results with the evaluation reference points First to fourth discriminating means for outputting as points, acceleration coefficient computing means for computing the effect of temperature, humidity, dust, and corrosive film thickness factors throughout the year as acceleration factors, and the factor-based evaluation points Fifth addition means to fourth addition means for accumulating the acceleration factors and outputting as a total evaluation score for each factor, and output of the first addition means to the fourth addition means to be output as a total evaluation score. Addition means, inspection cycle storage means for presetting and storing the inspection cycle corresponding to the total evaluation point for each device, total evaluation point obtained from the measurement result, and total evaluation stored in the inspection cycle storage means An inspection cycle determining device for executing the method according to claim 1, wherein the inspection cycle determining means outputs a corresponding inspection cycle by collating the valuation points.