CN115308517B - Aging detection method and system for components, storage medium and equipment - Google Patents
Aging detection method and system for components, storage medium and equipment Download PDFInfo
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Abstract
The invention is suitable for the technical field of measurement and provides a method, a system, a storage medium and equipment for detecting the aging of a component, wherein the method for detecting the aging of the component comprises the following steps: acquiring a first preset fluctuation amount of a component to be tested corresponding to first electronic equipment and a second preset fluctuation amount of second electronic equipment respectively; connecting a component to be tested with first electronic equipment to obtain a first fluctuation amount of the component to be tested, and connecting the component to be tested with second electronic equipment to obtain a second fluctuation amount of the component to be tested; and judging whether the component to be tested is aged or not according to the obtained first fluctuation amount, the first preset fluctuation amount, the second fluctuation amount and the second preset fluctuation amount. By the method, the aging condition of the component to be tested is prevented from being misjudged due to the difference between the electronic equipment and the component to be tested.
Description
Technical Field
The invention relates to the technical field of measurement, in particular to a method, a system, a storage medium and equipment for detecting aging of a component.
Background
With the progress of science and technology and the rapid development of electronic technology, electronic products are widely applied to various industries such as aviation, aerospace, ships, weapons, civil industry and the like as the core and important components of a system. Meanwhile, with the continuous emergence of complex use requirements and working conditions, the requirements on the precision and the reliability of the whole electronic equipment are higher and higher, and workers are required to continuously test the performance of the electronic equipment, so that the normal operation of electronic products is ensured.
In the processing process of products of electronic equipment, due to the complex processing and the large use of components, defects of the electronic equipment, such as processing defects and component defects, can be divided into obvious defects and potential defects, wherein the obvious defects refer to defects which cause the products to not work normally, such as short circuit/open circuit. However, the potential defects cause the product to be temporarily usable, but in use, the defects are quickly exposed and the product cannot work normally. The potential defects can not be found by the conventional inspection means, but are removed by an aging method.
As described in patent CN 114088128A: the invention discloses a sensor determination method, a sensor determination device, a storage medium and equipment, which relate to the technical field of sensors and are used for determining whether a sensor is aged or not so as to save human resources, and the method comprises the following steps: acquiring current acquisition data sent by a target sensor; acquiring current acquisition data of a target reference sensor under the condition that the current acquisition data of the target sensor meets corresponding alarm conditions; a correlation coefficient between the target reference sensor and the target sensor is greater than a first threshold; and under the condition that the current acquired data of the target reference sensor does not meet the corresponding alarm condition, determining that the target sensor is an aging sensor.
As described in patent CN 111750925A: the embodiment of the invention provides a system, a method and a device for predicting equipment aging, and relates to the technical field of detection. The equipment aging prediction system comprises a data acquisition module and a processor, wherein the data acquisition module is electrically connected with the processor; the data acquisition module is used for acquiring reference data and real-time data of a target device in the tested equipment and transmitting the reference data and the real-time data to the processor; the processor is used for obtaining factory characteristic data, current characteristic data, experience time and experience working strength data according to the reference data and the real-time data; and the device is also used for inputting the factory characteristic data, the current characteristic data, the elapsed time, the elapsed working strength data and the preset working strength data into the prediction model to obtain the aging prediction data of the tested device. Therefore, the equipment aging prediction system can accurately predict the aging degree of the tested equipment.
In the prior art, the following problems occur in the aging detection process of components, and when each electronic device leaves a factory, an allowable error range of the components installed in the electronic device is correspondingly set; even if each electronic device aims at the same component, the set error ranges are different, in the process of performing the aging test, even if the same component is measured in the same device produced in different batches, the measurement results are different, if the parameters of the component measured in the electronic device A do not accord with the error ranges, the component is thrown away, but the parameters of the component measured in the electronic device B also accord with the error ranges; if the component is only detected once in any electronic equipment and the detection result is not qualified, the component is thrown away, and the situation of throwing errors may occur.
Disclosure of Invention
The invention aims to provide a method, a system, a storage medium and equipment for detecting aging of a component, which are used for solving the technical problems in the prior art and mainly comprise the following four aspects:
the application provides in a first aspect a method for detecting aging of a component, comprising the steps of:
step S100: acquiring a first preset fluctuation amount of a component to be tested in a first electronic device and a second preset fluctuation amount of a second electronic device respectively;
step S200: connecting a component to be tested with first electronic equipment to acquire a first fluctuation amount of the component to be tested, and connecting the component to be tested with second electronic equipment to acquire a second fluctuation amount of the component to be tested; the first fluctuation amount is a first difference value formed by a first actual measurement value and a first theoretical value obtained after the component to be tested is connected with the first electronic equipment, and the second fluctuation amount is a second difference value formed by a second actual measurement value and a second theoretical value obtained after the component to be tested is connected with the second electronic equipment;
step S300: and judging whether the component to be tested is aged or not according to the obtained first fluctuation amount, the first preset fluctuation amount, the second fluctuation amount and the second preset fluctuation amount.
Further, step S300 includes:
step S310: if the first fluctuation amount is smaller than a first preset fluctuation amount, judging that the component to be detected is not aged;
step S320: and if the first fluctuation amount is not less than the first preset fluctuation amount, judging whether the component to be detected is aged or not according to a first actual measurement value and a first preset theoretical value of the component to be detected.
Further, step S320 includes:
step S321: if the first actual measurement value is smaller than a first preset theoretical value; judging that the component to be tested is not aged;
step S322: and if the first actual measurement value is not smaller than the first preset theoretical value, judging whether the component to be tested is aged or not according to the first preset fluctuation amount and the second preset fluctuation amount.
Further, step S322 includes:
the second electronic device includes a plurality of second electronic device units; acquiring a second sub-preset fluctuation amount of each electronic equipment unit;
acquiring a minimum difference value between the first preset fluctuation amount and the second sub-preset fluctuation amount, and taking the second sub-preset fluctuation amount of the second electronic equipment unit corresponding to the minimum difference value as a second preset fluctuation amount;
and if the second fluctuation amount is smaller than the second preset fluctuation amount, judging that the component to be detected is not aged.
Further, step S322 includes:
the second electronic device includes a plurality of second electronic device units; acquiring a second sub-preset fluctuation amount of each electronic equipment unit;
acquiring a minimum difference value between the first preset fluctuation amount and a second sub-preset fluctuation amount, and taking the second sub-preset fluctuation amount of the second electronic equipment unit corresponding to the minimum difference value as a second preset fluctuation amount;
calculating to obtain a second fluctuation amount according to the first preset fluctuation amount and the second preset fluctuation amount;
and if the second fluctuation amount is smaller than the second preset fluctuation amount, judging that the component to be detected is not aged.
The application second aspect provides an ageing detection system of components and parts, its characterized in that includes following module:
a first acquisition module: the device comprises a first electronic device, a second electronic device and a control unit, wherein the first electronic device is used for acquiring a first preset fluctuation amount of a component to be tested and a second preset fluctuation amount of the second electronic device;
a second obtaining module: the device to be tested is connected with the first electronic equipment to obtain a first fluctuation amount of the device to be tested, and is connected with the second electronic equipment to obtain a second fluctuation amount of the device to be tested; the first fluctuation amount is a first difference value formed by a first actual measurement value and a first theoretical value obtained after the component to be tested is connected with the first electronic equipment, and the second fluctuation amount is a second difference value formed by a second actual measurement value and a second theoretical value obtained after the component to be tested is connected with the second electronic equipment;
a judging module: and the device is used for judging whether the component to be detected is aged or not according to the obtained first fluctuation amount, the first preset fluctuation amount, the second fluctuation amount and the second preset fluctuation amount.
Further, the judging module further comprises:
if the first fluctuation amount is smaller than a first preset fluctuation amount, judging that the component to be tested is not aged;
and if the first fluctuation amount is not smaller than the first preset fluctuation amount, judging whether the component to be detected is aged or not according to a first actual measurement value and a first preset theoretical value of the component to be detected.
Further, the judging module further specifically includes:
if the first actual measurement value is smaller than a first preset theoretical value; judging that the component to be tested is not aged;
and if the first actual measurement value is not smaller than the first preset theoretical value, judging whether the component to be tested is aged or not according to the first preset fluctuation amount and the second preset fluctuation amount.
A third aspect of the present application provides a readable storage medium for storing a program, where the stored program is executed to implement the aging detection method for a component as described above.
The present application in a fourth aspect provides an electronic device, comprising: one or more processors; a memory having one or more programs stored thereon; the one or more programs, when executed by the one or more processors, cause the one or more processors to implement a method for burn-in detection of components as described above.
Compared with the prior art, the invention at least has the following technical effects:
(1) Through the aging detection method of the components, the components to be detected are placed in different electronic devices for aging detection, the components to be detected are placed in first electronic devices for detection, whether the components to be detected are aged in the first electronic devices is judged through the first fluctuation amount and the first preset fluctuation amount, if the components to be detected are aged, whether the components to be detected are aged is further judged according to the second fluctuation amount and the second preset fluctuation amount, through the aging detection, the situation that the components to be detected are mistakenly judged due to the difference between the electronic devices due to the fact that the components to be detected are not aged is mistaken, the components to be detected which are not aged are considered to be aged, the situation that the components to be detected are not qualified is avoided, and the waste situation is thrown away.
(2) According to the component aging method, whether the component to be measured is aged or not is judged by comparing a first fluctuation amount obtained by the component to be measured in first electronic equipment with a first preset fluctuation amount, if the component to be measured is aged, whether the component to be measured is aged or not is judged further according to a first actual measured value and a first preset theoretical value of the component to be measured in the first electronic equipment, the component to be measured is detected twice in the first electronic equipment, whether the component to be measured is aged or not is finally determined, the accuracy of the detection method is high, and the data quantity needing to be measured in the judging process is small.
(3) In the application, when the component to be tested is judged to be aged in the first electronic device, in order to avoid the situation that the component to be tested is not aged essentially and is misjudged to be aged due to the reason of the first electronic device, the reason why the aging result of the component to be tested is inaccurate is avoided; and then connecting the component to be tested with second electronic equipment, further carrying out aging detection, calculating second electronic equipment with performance similar to that of the first electronic equipment, and then comparing a second fluctuation amount of the component to be tested in the second electronic equipment with a second preset fluctuation amount to judge whether the component to be tested is aged or not.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments of the present invention or in the description of the prior art will be briefly described below, and it is obvious that the drawings described below are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a first schematic flow chart of a component aging detection method according to the present invention;
FIG. 2 is a schematic flow chart of a component aging detection method in the present invention;
FIG. 3 is a schematic diagram of a readable storage medium according to the present invention;
fig. 4 is a schematic structural diagram of an electronic device in the present invention.
Detailed Description
The following description provides many different embodiments, or examples, for implementing different features of the invention. The particular examples set forth below are illustrative only and are not intended to be limiting.
Aspects of the present invention will be described more fully hereinafter with reference to the accompanying drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to any specific structure or function presented throughout this disclosure. Rather, these aspects are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. Based on the teachings herein one skilled in the art should appreciate that the scope of the present invention is intended to cover any aspect disclosed herein, whether alone or in combination with any other aspect of the invention to achieve any aspect disclosed herein. For example, it may be implemented using any number of the apparatus or performing methods set forth herein. In addition, the scope of the present invention is intended to cover apparatuses or methods implemented with other structure, functionality, or structure and functionality in addition to the various aspects of the invention set forth herein.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. The terms "comprises," "comprising," and the like, as used herein, specify the presence of stated features, steps, operations, and/or components, but do not preclude the presence or addition of one or more other features, steps, operations, or components.
All terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs, unless otherwise defined. It is noted that the terms used herein should be interpreted as having a meaning that is consistent with the context of this specification and should not be interpreted in an idealized or overly formal sense.
The first embodiment is as follows:
as shown in fig. 1 to fig. 2, a first embodiment of the present application provides a method for detecting aging of a component, including the following steps:
step S100: acquiring a first preset fluctuation amount of a component to be tested in a first electronic device and a second preset fluctuation amount of a second electronic device respectively;
step S200: connecting a component to be tested with first electronic equipment to obtain a first fluctuation amount of the component to be tested, and connecting the component to be tested with second electronic equipment to obtain a second fluctuation amount of the component to be tested; the first fluctuation amount is a first difference value formed by a first actual measurement value and a first theoretical value obtained after the component to be tested is connected with the first electronic equipment, and the second fluctuation amount is a second difference value formed by a second actual measurement value and a second theoretical value obtained after the component to be tested is connected with the second electronic equipment;
step S300: and judging whether the component to be tested is aged or not according to the obtained first fluctuation amount, the first preset fluctuation amount, the second fluctuation amount and the second preset fluctuation amount.
In the above scheme, after different electronic devices leave a factory, corresponding error fluctuation ranges (i.e., preset fluctuation amounts) can be set according to comprehensive consideration of conditions such as a factory environment, and the like, and different components are in the same electronic device, and the error fluctuation ranges set by the electronic device are also different; therefore, when testing, the type of the device to be tested is first obtained, and then the corresponding error fluctuation range is obtained by performing connection tests on the device to be tested in different electronic devices. If the component to be tested needs to be connected with the first electronic device and the second electronic device, at this time, a first preset fluctuation amount of the component to be tested in the first electronic device and a second preset fluctuation amount of the component to be tested in the second electronic device need to be obtained.
After first predetermined fluctuation amount and second predetermined fluctuation amount have been obtained, can be connected the components and parts that await measuring with first electronic equipment respectively and be connected with second electronic equipment, detect and judge whether should await measuring components and parts take place ageing, specifically do: connecting a component to be measured with first electronic equipment, measuring a first actual measurement value of the component to be measured in the first electronic equipment, simultaneously obtaining a first theoretical value of the component to be measured in the first electronic equipment, and taking a difference value between the first actual measurement value and the first theoretical value as a first fluctuation amount; connecting the component to be measured with second electronic equipment, measuring a second actual measurement value of the component to be measured in the second electronic equipment, simultaneously obtaining a second theoretical value of the component to be measured in the second electronic equipment, and taking a difference value between the second actual measurement value and the second theoretical value as a second fluctuation amount;
and judging whether the component to be tested is aged in the first electronic equipment or not according to the obtained first fluctuation amount and the first preset fluctuation amount, and if the component to be tested is aged, further judging whether the component to be tested is aged in the second electronic equipment or not according to the second fluctuation amount and the second preset fluctuation amount.
Preferably, the first preset fluctuation amount and the second preset fluctuation amount may be set by an operator according to experience, may be obtained by calculation according to parameters such as a factory environment, and may further be obtained according to a preset historical fluctuation amount of the component in the electronic device, which is not limited herein.
It should be noted that the component to be tested in the present application may be a capacitor, a resistor, a diode, or other components that may need to be subjected to an aging test, and the type of the specific component is not limited herein.
Therefore, according to the aging detection method of the components, the components to be detected are placed in different electronic devices for aging detection, the components to be detected are placed in first electronic devices for detection, whether the components to be detected are aged in the first electronic devices is judged through the first fluctuation amount and the first preset fluctuation amount, if the components to be detected are aged, whether the components to be detected are aged is judged according to the second fluctuation amount and the second preset fluctuation amount, through the aging detection, the situation that the components to be detected are mistakenly judged due to differences among the electronic devices is avoided, the components to be detected which are not aged are mistakenly considered to be aged, the components to be detected do not meet the standard, and the waste situation is thrown away.
Further, step S300 includes:
step S310: if the first fluctuation amount is smaller than a first preset fluctuation amount, judging that the component to be tested is not aged;
step S320: and if the first fluctuation amount is not smaller than the first preset fluctuation amount, judging whether the component to be detected is aged or not according to a first actual measurement value and a first preset theoretical value of the component to be detected.
Further, step S320 includes:
step S321: if the first actual measurement value is smaller than a first preset theoretical value; judging that the component to be tested is not aged;
step S322: and if the first actual measurement value is not smaller than the first preset theoretical value, judging whether the component to be tested is aged or not according to the first preset fluctuation amount and the second preset fluctuation amount.
In the above scheme, after the component to be tested is connected with the first electronic device, whether the component to be tested is aged or not is judged according to the comparison between the first fluctuation amount and the first preset fluctuation amount, and if the first fluctuation amount is smaller than the first preset fluctuation amount, it can be judged that the component to be tested is not aged; if the first fluctuation amount is greater than or equal to the first preset fluctuation amount, whether the component to be tested is aged or not needs to be further judged according to the first actual measurement and the first preset theoretical value, so that the condition that the component to be tested is not accurately aged only through the primary fluctuation amount is avoided, when the first actual measurement value of the component to be tested in the first electronic device is smaller than the first preset theoretical value, the component to be tested can be judged not to be aged, the method can ensure that the first measurement value of the component to be tested is always smaller than the first preset theoretical value, and the accuracy of whether the component to be tested is aged or not is ensured.
It should be noted that the first actual measurement value may be an actual measurement value of the component to be measured in the first electronic device at the current time, or may be an average value of actual measurement values of the component to be measured in the first electronic device for multiple times within a period of time.
According to the component aging method, whether the component to be measured is aged or not is judged by comparing a first fluctuation amount obtained by the component to be measured in first electronic equipment with a first preset fluctuation amount, if the component to be measured is aged, whether the component to be measured is aged or not is judged further according to a first actual measured value and a first preset theoretical value of the component to be measured in the first electronic equipment, the component to be measured is detected twice in the first electronic equipment, whether the component to be measured is aged or not is finally determined, the accuracy of the detection method is high, and the data quantity needing to be measured in the judging process is small.
Further, step S322 includes:
the second electronic device includes a plurality of second electronic device units; acquiring a second sub-preset fluctuation amount of each electronic equipment unit;
acquiring a minimum difference value between the first preset fluctuation amount and a second sub-preset fluctuation amount, and taking the second sub-preset fluctuation amount of the second electronic equipment unit corresponding to the minimum difference value as a second preset fluctuation amount;
and if the second fluctuation amount is smaller than the second preset fluctuation amount, judging that the component to be detected is not aged.
In the above scheme, after the component to be tested is judged in the first electronic device according to the first fluctuation amount and the first actual measurement value, if the first actual measurement value is not smaller than the first preset theoretical value, it is necessary to judge whether the component to be tested is aging due to the reason of the first electronic device, and at this time, the component to be tested is connected with the second electronic device, so as to further judge whether the component to be tested is aging due to the difference between the electronic devices. The specific implementation method comprises the following steps:
the second electronic device B includes B1, B2, B3,. Ang BN second electronic device units, obtains second sub-predetermined fluctuation amounts corresponding to each of the second electronic device units B1, B2, B3, and.
In the application, when the component to be tested is judged to be aged in the first electronic device, in order to avoid the situation that the component to be tested is not aged essentially and is misjudged to be aged due to the reason of the first electronic device, the reason why the aging result of the component to be tested is inaccurate is avoided; and then connecting the component to be tested with second electronic equipment, further carrying out aging detection, calculating second electronic equipment with performance similar to that of the first electronic equipment, and then comparing a second fluctuation amount of the component to be tested in the second electronic equipment with a second preset fluctuation amount to judge whether the component to be tested is aged or not.
Further, step S322 includes:
the second electronic device includes a plurality of second electronic device units; acquiring a second sub-preset fluctuation amount of each electronic equipment unit;
acquiring a minimum difference value between the first preset fluctuation amount and the second sub-preset fluctuation amount, and taking the second sub-preset fluctuation amount of the second electronic equipment unit corresponding to the minimum difference value as a second preset fluctuation amount;
calculating to obtain a second fluctuation amount according to the first preset fluctuation amount and the second preset fluctuation amount;
and if the second fluctuation amount is smaller than the second preset fluctuation amount, judging that the component to be detected is not aged.
In the above scheme, when the device to be tested is placed in the second electronic device to determine whether aging occurs, there is a method:
the second electronic device B includes B1, B2, B3,. Ang BN second electronic device units, obtains second sub-preset fluctuation amounts corresponding to each of the second electronic device units B1, B2, B3,. Ang BN, calculates a difference between each of the second sub-preset fluctuation amounts and the first preset fluctuation amount, compares the difference between each of the second sub-preset fluctuation amounts and the first preset fluctuation amount, and calculates a minimum difference, so that a second electronic device similar to the first electronic device in terms of performance and the like can be found out, thereby avoiding a situation that a determination of an aging result of a component to be tested is erroneous due to an excessively large difference in performance and the like between the second electronic device and the first electronic device, and after obtaining the minimum difference, takes the second electronic device unit corresponding to the minimum difference as the second electronic device, and finally takes a difference between a second actual measurement value and a second theoretical value obtained by the component to be tested in the second electronic device as the second fluctuation amount.
Then, according to a first preset fluctuation amount T1 and a first fluctuation amount S1 obtained by the component to be tested in the first electronic device and a second preset fluctuation amount T2 in the second electronic device corresponding to the component to be tested, calculating a second fluctuation amount S2 according to the following method:
and finally, judging whether the component to be detected is aged or not according to the size between the second fluctuation amount and the second preset fluctuation amount, if the second fluctuation amount is smaller than the second preset fluctuation amount, judging that the component to be detected is not aged, otherwise, judging that the component to be detected is aged, and throwing away the component to be detected.
Example two:
the embodiment of the application provides an ageing detecting system of components and parts, its characterized in that, including following module:
a first obtaining module: the device comprises a first electronic device, a second electronic device and a control unit, wherein the first electronic device is used for acquiring a first preset fluctuation amount of a component to be tested and a second preset fluctuation amount of the second electronic device;
a second obtaining module: the device to be tested is connected with the first electronic equipment to acquire a first fluctuation amount of the device to be tested, and is connected with the second electronic equipment to acquire a second fluctuation amount of the device to be tested; the first fluctuation amount is a first difference value formed by a first actual measurement value and a first theoretical value obtained after the component to be tested is connected with the first electronic equipment, and the second fluctuation amount is a second difference value formed by a second actual measurement value and a second theoretical value obtained after the component to be tested is connected with the second electronic equipment;
a judging module: and the device is used for judging whether the component to be detected is aged or not according to the obtained first fluctuation amount, the first preset fluctuation amount, the second fluctuation amount and the second preset fluctuation amount.
Further, the judging module further comprises:
if the first fluctuation amount is smaller than a first preset fluctuation amount, judging that the component to be tested is not aged;
and if the first fluctuation amount is not smaller than the first preset fluctuation amount, judging whether the component to be detected is aged or not according to a first actual measurement value and a first preset theoretical value of the component to be detected.
Further, the judging module further specifically includes:
if the first actual measured value is smaller than a first preset theoretical value, judging that the component to be measured is not aged;
and if the first actual measured value is not smaller than the first preset theoretical value, judging whether the component to be measured is aged or not according to the first preset fluctuation amount and the second preset fluctuation amount.
Further, the judging module further specifically includes:
the second electronic device includes a plurality of second electronic device units; acquiring a second sub-preset fluctuation amount of each electronic equipment unit;
acquiring a minimum difference value between the first preset fluctuation amount and the second sub-preset fluctuation amount, and taking the second sub-preset fluctuation amount of the second electronic equipment unit corresponding to the minimum difference value as a second preset fluctuation amount;
and if the second fluctuation amount is smaller than the second preset fluctuation amount, judging that the component to be detected is not aged.
Further, the judging module further specifically includes:
the second electronic device includes a plurality of second electronic device units; acquiring a second sub-preset fluctuation amount of each electronic equipment unit;
acquiring a minimum difference value between the first preset fluctuation amount and the second sub-preset fluctuation amount, and taking the second sub-preset fluctuation amount of the second electronic equipment unit corresponding to the minimum difference value as a second preset fluctuation amount;
calculating to obtain a second fluctuation amount according to the first preset fluctuation amount and the second preset fluctuation amount;
and if the second fluctuation amount is smaller than the second preset fluctuation amount, judging that the component to be detected is not aged.
It can be clearly understood by those skilled in the art that, for convenience and simplicity of description, the specific working processes of the system and the unit described above may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In addition, functional modules in the embodiments of the present application may be integrated into one processing module, or each of the modules may exist alone physically, or two or more modules are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode.
Example three:
the third embodiment of the present application provides a readable storage medium, which is used for storing a program, and when the stored program is executed, the method for detecting aging of the component is implemented.
Fig. 3 shows a block diagram of a computer-readable storage medium according to a third embodiment of the present application. The computer readable storage medium 1200 has stored therein a program code 1210, said program code 1210 being invokable by a processor for performing the method described in the above method embodiments.
The computer-readable storage medium 1200 may be an electronic memory such as a flash memory, an EEPROM (electrically erasable programmable read only memory), an EPROM (erasable programmable read only memory), a hard disk, or a ROM. Optionally, the computer-readable storage medium 1200 comprises a non-volatile computer-readable storage medium. The computer readable storage medium 1200 has storage space for program code 1210 that performs any of the method steps described above. The program code can be read from or written to one or more computer program products. The program code 1210 may be compressed, for example, in a suitable form.
Example four:
the fourth embodiment of the present application provides an electronic device, which includes: one or more processors; a memory having one or more programs stored thereon; the one or more programs, when executed by the one or more processors, cause the one or more processors to implement a method for burn-in detection of components as described above.
Fig. 4 is a block diagram of an electronic device 1100 according to a fourth embodiment of the present disclosure. The electronic device 1100 in the present application may include one or more of the following components: memory 1110, processor 1120, and one or more applications, wherein the one or more applications may be stored in memory 1110 and configured to be executed by the one or more processors 1120, the one or more programs configured to perform a method as described in the aforementioned method embodiments.
The Memory 1110 may include a Random Access Memory (RAM) or a Read-Only Memory (ROM). The memory 1110 may be used to store instructions, programs, code sets, or instruction sets. The memory 1110 may include a program storage area and a data storage area, wherein the program storage area may store instructions for implementing an operating system, instructions for implementing at least one function (such as a histogram equalization function, etc.), instructions for implementing various method embodiments described below, and the like. The stored data area may also store data created during use by the electronic device 1100 (such as image matrix data, etc.).
Processor 1120 may include one or more processing cores. The processor 1120 interfaces with various parts throughout the electronic device 1100 using various interfaces and lines to perform various functions of the electronic device 1100 and process data by executing or performing instructions, programs, code sets, or instruction sets stored in the memory 1110 and invoking data stored in the memory 1110. Alternatively, the processor 1120 may be implemented in hardware using at least one of Digital Signal Processing (DSP), field-Programmable Gate Array (FPGA), and Programmable Logic Array (PLA). The processor 1120 may integrate one or more of a Central Processing Unit (CPU), a modem, and the like. Wherein, the CPU mainly processes an operating system, an application program and the like; the modem is used to handle wireless communications. It is understood that the modem may not be integrated into the processor 1120, but may be implemented by a communication chip.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative components and steps have been described above generally in terms of their functionality in order to clearly illustrate this interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (4)
1. A method for detecting aging of a component is characterized by comprising the following steps:
step S100: acquiring a first preset fluctuation amount of a component to be tested in a first electronic device and a second preset fluctuation amount of a second electronic device respectively;
step S200: connecting a component to be tested with first electronic equipment to acquire a first fluctuation amount of the component to be tested, and connecting the component to be tested with second electronic equipment to acquire a second fluctuation amount of the component to be tested; the first fluctuation amount is a first difference value formed by a first actual measurement value and a first theoretical value obtained after the component to be tested is connected with the first electronic equipment, and the second fluctuation amount is a second difference value formed by a second actual measurement value and a second theoretical value obtained after the component to be tested is connected with the second electronic equipment;
step S300: judging whether the component to be tested is aged or not according to the obtained first fluctuation amount, the first preset fluctuation amount, the second fluctuation amount and the second preset fluctuation amount;
step S300 includes:
step S310: if the first fluctuation amount is smaller than a first preset fluctuation amount, judging that the component to be tested is not aged;
step S320: if the first fluctuation amount is not smaller than the first preset fluctuation amount, judging whether the component to be detected is aged or not according to a first actual measured value and a first preset theoretical value of the component to be detected;
the step S320 includes:
step S321: if the first actual measurement value is smaller than a first preset theoretical value; judging that the component to be tested is not aged;
step S322: if the first actual measurement value is not smaller than the first preset theoretical value, judging whether the component to be tested is aged or not according to the first preset fluctuation amount and the second preset fluctuation amount;
the step S322 includes:
the second electronic device includes a plurality of second electronic device units; acquiring a second sub-preset fluctuation amount of each electronic equipment unit;
acquiring a minimum difference value between the first preset fluctuation amount and the second sub-preset fluctuation amount, taking the second electronic equipment unit corresponding to the minimum difference value as second electronic equipment, and taking the second sub-preset fluctuation amount of the second electronic equipment unit corresponding to the minimum difference value as a second preset fluctuation amount;
and if the second fluctuation amount is smaller than the second preset fluctuation amount, judging that the component to be detected is not aged.
2. The aging detection system of the component is characterized by comprising the following modules:
a first obtaining module: the device comprises a first electronic device, a second electronic device and a control unit, wherein the first electronic device is used for acquiring a first preset fluctuation amount of a component to be tested and a second preset fluctuation amount of the second electronic device;
a second obtaining module: the device to be tested is connected with the first electronic equipment to obtain a first fluctuation amount of the device to be tested, and is connected with the second electronic equipment to obtain a second fluctuation amount of the device to be tested; the first fluctuation amount is a first difference value formed by a first actual measurement value and a first theoretical value obtained after the component to be tested is connected with the first electronic equipment, and the second fluctuation amount is a second difference value formed by a second actual measurement value and a second theoretical value obtained after the component to be tested is connected with the second electronic equipment;
a judging module: the device comprises a first fluctuation value acquisition unit, a second fluctuation value acquisition unit, a first control unit and a second control unit, wherein the first fluctuation value acquisition unit is used for acquiring a first fluctuation value and a second fluctuation value;
the judging module further comprises:
if the first fluctuation amount is smaller than a first preset fluctuation amount, judging that the component to be detected is not aged;
if the first fluctuation amount is not smaller than the first preset fluctuation amount, judging whether the component to be detected is aged or not according to a first actual measured value and a first preset theoretical value of the component to be detected;
the judging module further comprises:
if the first actual measurement value is smaller than a first preset theoretical value; judging that the component to be tested is not aged;
if the first actual measurement value is not smaller than the first preset theoretical value, judging whether the component to be tested is aged or not according to the first preset fluctuation amount and the second preset fluctuation amount;
the second electronic device includes a plurality of second electronic device units; acquiring a second sub-preset fluctuation amount of each electronic equipment unit;
acquiring a minimum difference value between the first preset fluctuation amount and the second sub-preset fluctuation amount, taking the second electronic equipment unit corresponding to the minimum difference value as second electronic equipment, and taking the second sub-preset fluctuation amount of the second electronic equipment unit corresponding to the minimum difference value as a second preset fluctuation amount;
and if the second fluctuation amount is smaller than the second preset fluctuation amount, judging that the component to be detected is not aged.
3. A readable storage medium storing a program which, when executed, implements a method for detecting degradation of a component according to any one of claims 1 to 2.
4. An electronic device, comprising: one or more processors; a memory having one or more programs stored thereon; the one or more programs, when executed by the one or more processors, cause the one or more processors to implement a method for aging detection of a component as claimed in any of claims 1-2.
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| US7539593B2 (en) * | 2007-04-27 | 2009-05-26 | Invensys Systems, Inc. | Self-validated measurement systems |
| CN103245825A (en) * | 2012-02-07 | 2013-08-14 | 鸿富锦精密工业（深圳）有限公司 | Voltage detecting system and method |
| CN110596633A (en) * | 2019-10-16 | 2019-12-20 | 上海市计量测试技术研究院 | Calibration system and calibration method of analog input type electronic transformer calibrator |
| CN111750925B (en) * | 2019-12-24 | 2022-11-08 | 广州极飞科技股份有限公司 | Equipment aging prediction system, method and device |
| CN211741445U (en) * | 2019-12-31 | 2020-10-23 | 武汉精立电子技术有限公司 | Display panel aging device and aging detection equipment |
| CN113271231B (en) * | 2020-02-14 | 2023-01-13 | 华为技术有限公司 | Detection device, detection method and processor |
| CN111596254B (en) * | 2020-06-12 | 2021-11-09 | 杭州万高科技股份有限公司 | Anomaly detection method, device, equipment and medium for energy metering chip |
| CN112151106B (en) * | 2020-09-09 | 2023-07-11 | 深圳佰维存储科技股份有限公司 | SSD aging test method and device, storage medium and electronic equipment |
| CN112101662A (en) * | 2020-09-16 | 2020-12-18 | 珠海格力电器股份有限公司 | Equipment health condition and life cycle detection method, storage medium and electronic equipment |
| CN114764774A (en) * | 2021-01-12 | 2022-07-19 | 富泰华工业（深圳）有限公司 | Defect detection method, device, electronic equipment and computer readable storage medium |
| CN114088128B (en) * | 2021-11-22 | 2023-11-17 | 中国联合网络通信集团有限公司 | Sensor determination method, device, storage medium and equipment |
| CN114859197A (en) * | 2022-04-06 | 2022-08-05 | 国网江苏省电力有限公司电力科学研究院 | Online monitoring device and method for thyristor aging evaluation |
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Address after: 311100 Building 13, No. 25, Xianxing Road, Xianlin Street, Yuhang District, Hangzhou, Zhejiang Patentee after: Hangzhou Sanhai Electronic Technology Co.,Ltd. Address before: 311100 Building 13, No. 25, Xianxing Road, Xianlin Street, Yuhang District, Hangzhou, Zhejiang Patentee before: HANGZHOU SANHAI ELECTRONICS Co.,Ltd. |