JPH07210636A - Bending test instrument for card - Google Patents

Abstract

PURPOSE:To easily perform the bending test by freely moving a pressing tool, which clips front and rear faces of a card, in the direction parallel with front and rear faces of the card and freely moving it in the direction perpendicular to front and rear faces of the card in a prescribed position. CONSTITUTION:Gripping tools 20 are freely moved on a pedestal 30 and are controlled to grip both end parts of an IC memory card 10 and are fixed to the pedestal 30. A pressing tool 40 which clips front and rear faces of the IC memory card 10 is provided with a groove 41. This pressing tool 40 is freely moved in parallel with the front face of the IC memory card 10 and clips front and rear faces of the IC memory card 10 in its prescribed position. The pressing tool 40 is freely moved in the direction perpendicular to the surface of the IC memory card 10 also, and a load is applied to a prescribed position of the IC memory card 10 from both of front and rear sides of the IC memory card 10 in the direction perpendicular to the surface, thus performing the bending test.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a bending test apparatus for thin IC memory cards and the like, and particularly in a bending test, the measurement position of the card is not displaced and the front and back surfaces of the card are perpendicular to each other at a predetermined position. On the other hand, the present invention relates to a bending test device for a card that can perform a bending test by applying loads from both front and back directions.

[0002]

2. Description of the Related Art Conventionally, as shown in a perspective view of FIG. 5, as a bending test apparatus for a card of this type, a card X is mounted on a support Z, Z fixed to a pedestal Y, and a card is mounted. X
The bending test is performed by pressing the card X with the pressing tool S that presses.

The above-mentioned conventional device has a problem that the card X is displaced from the supporting portions Z and Z during the bending test, or the card X is dropped from the supporting portions Z and Z.

Further, since the card X is placed on the supporting portions Z, Z, the bending test can be performed by pressing the card X only from above the card X with the pressing tool S, and below the card X at the same position. When the bending test is performed by pressing from above, there is a problem that it is necessary to turn over the card X and re-align it, which requires time and labor.

[0005]

DISCLOSURE OF THE INVENTION The present invention is to solve the above-mentioned problems, and its gist is a bending test apparatus for a card, in which both ends of the card are held by a pair of holding tools. The pressing tool that holds the front and back surfaces of the card can be moved in parallel with the front and back surfaces of the card, and can also be moved in the vertical direction with respect to the front and back surfaces of the card at a predetermined position of the card. The bending test can be easily performed by applying loads from both front and back directions to the vertical direction of the card surface at a predetermined position of the card without shifting.

[0006]

Embodiments of the present invention will be specifically described below with reference to the drawings. 1 is an exploded perspective view showing a bending test apparatus for a card of the present invention, FIG. 2 is a side view showing a bending test apparatus for a card of the present invention, and FIG. 3 is a plan view showing another bending test apparatus for a card of the present invention. 4 is a perspective view showing a gripping tool used in the bending test apparatus for a card shown in FIG.

As shown in an exploded perspective view in FIG. 1 and a side view in FIG. 2, 10 is an IC memory card,
The memory card 10 includes an IC memory 11 and an IC memory 1.
1 has an external connection terminal 12 connected to the IC memory 1
1 is an external connection terminal 1 via a printed wiring (not shown)
It is connected to 2. Reference numerals 20 and 20 denote a pair of grips, which are grooves 21 for gripping both ends of the IC memory card 10.
21.

The gripping tools 10 and 20 are movable with respect to the base 30, and are adjusted to grip both ends of the IC memory card 10 and then fixed to the base 30. 22 is groove 2
When the conductive rubber material 22 is formed in the conductive rubber materials 22 and 21, the elastic force of the conductive rubber material 22 allows the both ends of the IC memory card 10 to be gripped without difficulty. This is preferable because it is possible to discharge the generated static electricity.

Reference numeral 40 denotes a pressing tool that holds the front and back surfaces of the IC memory card 10, and a groove 41 is formed in the pressing tool 40. The pressing tool 40 is movable in parallel with the surface of the IC memory card 10.
The front and back surfaces of the IC memory card 10 can be held at a predetermined position of 0. The pressing tool 40 is movable in the vertical direction of the front and back surfaces of the IC memory card 10.
At a predetermined position of the IC memory card 10, a bending test can be performed by applying a load from both front and back directions of the IC memory card 10 to the vertical direction of the surface.

Reference numeral 42 denotes a conductive rubber material provided in the groove 41. When the conductive rubber material 42 is formed, the elastic force of the conductive rubber materials 42, 42 ensures that the IC memory card is reasonably and surely. The front and back surfaces of 10 are sandwiched, and a load can be applied from both directions with respect to the vertical direction of the front and back surfaces of the IC memory card 10 to perform a bending test, and the generated static electricity can be released, which is preferable. is there.

FIG. 3 is a plan view showing another bending test apparatus for a card of the present invention, in which the corners of the IC memory card 10 facing each other are gripped by the grippers 20, 20. As shown in the perspective view of FIG. 4, the grippers 20, 20 are formed with triangular grooves 21, 21, and grip the corners of the IC memory card 10 facing each other.

[0012]

As described above, according to the present invention, both ends of the card are held by the pair of holding tools, and the pressing tool for holding the front and back surfaces of the card can be moved in parallel with the front and back surfaces of the card. At the same time, since it is movable in the vertical direction with respect to the front and back of the card at a predetermined position of the card, the measurement position of the card does not shift during the bending test, and at the predetermined position of the card with respect to the vertical direction of the front and back of the card,
There is an advantage in that a bending test can be easily performed by applying loads from both front and back directions.

[Brief description of drawings]

FIG. 1 is an exploded perspective view showing a bending test apparatus for a card of the present invention.

FIG. 2 is a side view showing a bending test apparatus for a card of the present invention.

FIG. 3 is a plan view showing another bending test apparatus for a card of the present invention.

FIG. 4 is a perspective view showing a gripping tool used in the bending test apparatus for a card of FIG.

FIG. 5 is a perspective view showing a conventional bending test apparatus for a card.

[Explanation of symbols]

 10 IC Memory Card 11 IC Memory 12 External Connection Terminal 20 Gripping Tool 21 Groove 22 Conductive Rubber Material 30 Pedestal 40 Pressing Tool 41 Groove 42 Conductive Rubber Material

Claims (1)

[Claims] 1. A bending test apparatus for a card, wherein both ends of the card are held by a pair of holding tools, and a pressing tool for holding the front and back surfaces of the card is movable in a direction parallel to the front and back surfaces of the card. At the same time, a bending test device for a card is characterized in that the card can be moved in a direction perpendicular to the front and back surfaces of the card at a predetermined position.