JPH07193192A - Semiconductor integrated circuit device - Google Patents

Abstract

PURPOSE:To prevent even an unused function module from consuming current unnecessarily by making it possible to conduct a test such as current measurement independently every function module to enable unit current measurement. CONSTITUTION:A semiconductor integrated circuit device equipped with one or more function modules 4a, 4b... comprises a common source terminal 1 of the semiconductor integrated circuit device, test source terminals 2a, 2b... provided for every function module 4a, 4b... to make it possible to connect the test power source, and source terminal switching means 3a, 3b... select which connected to every function module 4a, 4b... the common source terminal 1 or the test source terminals 2a, 2b.... This device further comprises a source terminal setting control means 5 which instructs the source terminal switching means 3a, 3b... which is be connected every function module 4a, 4b... the common source terminal 1 or the test source terminals 2a, 2b....

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor integrated circuit device, and more particularly to a semiconductor integrated circuit device having one or more functional modules.

[0002]

2. Description of the Related Art As one of semiconductor devices, a semiconductor integrated circuit device driven by a single voltage using a single power source is generally known.

FIG. 10 is an enlarged logic diagram showing a conventional semiconductor integrated circuit device. As shown in FIG. 10, the semiconductor integrated circuit device includes a plurality of functional modules 100a, 100b,
100c, a control circuit 101 for controlling them, a power supply terminal 102 connected to a single power supply, and an input / output terminal 103
It consists of and.

[0004]

However, in the conventional semiconductor integrated circuit device having a plurality of functional modules using a single power source, current is supplied from the single power source to the functional modules all at once. Therefore, there is a problem in that a test, such as a current measurement, cannot be performed for each functional module.

Further, there is a problem in that current is unnecessarily consumed even in a functional module that is not used.

Therefore, an object of the present invention is to solve the above-mentioned problems of the prior art, to independently perform tests such as current measurement for each functional module, to enable current measurement in units, and not to use. An object of the present invention is to provide a semiconductor integrated circuit device capable of preventing unnecessary consumption of current even to a functional module.

[0007]

In order to achieve the above object, a semiconductor integrated circuit device of the present invention is a semiconductor integrated circuit device including one or more functional modules, wherein a common power supply terminal of the semiconductor integrated circuit device is provided, A test power supply terminal that can be connected to the test power supply provided for each functional module,
Power supply terminal switching means for switching which one of the common power supply terminal and the test power supply terminal is connected to each functional module, and which of the common power supply terminal and the test power supply terminal is connected to each functional module And power supply terminal setting control means for instructing each of the power supply terminal switching means.

[0008]

Each power terminal switching means receives a signal from the power terminal setting control means, and based on this signal, each power terminal switching means connects either the common power terminal or each test power terminal to each functional module. To do. When a test power supply is connected to the test power supply terminal of the functional module under test and this function module is connected to the corresponding test power supply terminal by the corresponding power supply terminal switching means, only this function module is connected to the test power supply. By conducting current only to the functional module to be tested, it is possible to perform tests such as current measurement independently for each functional module, and unnecessary consumption of current from the test power supply even to unused functional modules. You can choose not to.

[0009]

Embodiments of the semiconductor integrated circuit device of the present invention will be described below with reference to the drawings. FIG. 1 is a block diagram showing an embodiment of a semiconductor integrated circuit device of the present invention. In FIG. 1, the semiconductor integrated circuit device includes a plurality of functional modules 4
a, 4b ... And a common power supply terminal 1 to which a single power supply for supplying a current to each functional module 4a, 4b.
Each of the functional modules 4a, 4b ... Has a test power supply terminal 2a, 2b ... Connectable to a test power supply, a power supply terminal switching means 3a, 3b ..., And a power supply terminal setting control means 5. Common power supply terminal 1 and test power supply terminals 2a, 2
Various input / output terminals 6 are provided near b.

The power supply terminal switching means 3a, 3b ...
The common power supply terminal 1 or the test power supply terminals 2a, 2b ... Is switched to each functional module 4a, 4b. The power supply terminal setting control means 5 determines which of the common power supply terminal 1 and the test power supply terminals 2a, 2b ... Is connected to each functional module 4a, 4b. Instruct.

Next, a specific embodiment of the present invention will be described with reference to FIG. In FIG. 2, the power supply terminal switching means 3a is composed of two transfer gate transistors 10 and 11 formed of PMOS as gates, a D-type flip-flop 13 as a power supply path setting register, and an inverter 14. Has been done. The power supply terminal setting control means 5 is composed of a control circuit such as a CPU. The output signal of the D-type flip-flop 13 is sent to the transmission gate transistor 10 and also to the transmission gate transistor 11 via the inverter 14.

A power supply terminal switching means 3b having the same configuration as the power supply terminal switching means 3a is also provided corresponding to the functional module 4b and the like.

Next, the operation of this embodiment will be described.
After resetting the D-type flip-flop 13, the output signal of the D-type flip-flop 13 becomes "0", the transmission gate transistor 10 is turned on, the transmission gate transistor 11 is turned off, and the functional module 4a has the common power supply terminal 1 Is connected and selected.

Next, in order to connect the functional module 4a to the test power supply terminal 2a, the power supply terminal setting control means 5 sends a signal for setting the output of the D-type flip-flop 13 to "1", and the transmission gate transistor 11 is transmitted. Is turned on and the transmission gate transistor 10 is turned off.

According to the structure of this embodiment, the common power supply terminal 1 can be cut off for each functional module 4a, 4b, and the respective test power supply terminals 2a, 2b ... Can be individually connected to the test power supply. . As a result, by passing a current only through the functional module to be tested, for example, the functional module 4a, it is possible to independently perform a test such as current measurement for each functional module, and unnecessary functional modules are unnecessary. It is possible not to consume the current of the test power supply.

Next, a modification of the above-described embodiment will be described below. As shown in FIG. 3, as the power supply path setting register, an RS flip-flop 15 can be provided instead of the D-type flip-flop 13 of FIG. In this case, since the RS flip-flop 15 which is the power supply path setting register is an asynchronous circuit, the power supply path can be changed at a higher speed.

Further, as shown in FIG. 4 or FIG.
Alternatively, analog switches 16 and 17 may be provided instead of the transmission gate transistors 10 and 11 of FIG.

Further, as shown in FIG. 6, by using the input / output circuit 18 of the microcomputer, it is possible to perform control by the microcomputer in combination with the control signal from the power supply terminal setting control means 5.

Further, as shown in FIG. 7, instead of the D-type flip-flop 13 shown in FIG.
It is also possible to provide 5.

Further, as shown in FIG. 8, analog switches 16 and 17 can be provided instead of the transmission gate transistors 10 and 11 of FIG.

Further, as shown in FIG. 9, instead of the D flip-flop 13 shown in FIG.
It is also possible to provide 5.

[0022]

As described above, according to the configuration of the present invention, the test power supply is connected to the test power supply terminal of the functional module to be tested, and this functional module is handled by the corresponding power supply terminal switching means. When connected to the test power supply terminal, only this functional module is connected to the test power supply, and current can be passed only to the functional module to be tested, so that testing such as current measurement can be performed independently for each functional module. , It is possible to prevent unnecessary consumption of current from the test power supply to unused functional modules.

[Brief description of drawings]

FIG. 1 is a block diagram showing an embodiment of a semiconductor integrated circuit device of the present invention.

FIG. 2 is a block circuit diagram showing a specific example of the example shown in FIG.

FIG. 3 is a block circuit diagram showing another specific example of the same embodiment.

FIG. 4 is a block circuit diagram showing still another specific example of the same embodiment.

FIG. 5 is a block circuit diagram showing another specific example of the same embodiment.

FIG. 6 is a block circuit diagram showing still another specific example of the same embodiment.

FIG. 7 is a block circuit diagram showing another specific example of the same embodiment.

FIG. 8 is a block circuit diagram showing still another specific example of the same embodiment.

FIG. 9 is a block circuit diagram showing another specific example of the same embodiment.

FIG. 10 is an enlarged logic diagram showing a conventional semiconductor integrated circuit device.

[Explanation of symbols]

 1 common power supply terminals 2a, 2b ··· test power supply terminals 3a, 3b · · power supply terminal switching means 4a, 4b · · function module 5 power supply terminal setting control means 6 input / output terminals 10, 11 transmission gate transistor 13 D-type flip-flop 14 Inverter 15 RS Flip Flop 16, 17 Analog Switch 18 Microcomputer Input / Output Circuit

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Hideo Sakai Iwate Toshiba Electronics Co., Ltd. 6-6 Kita Industrial Park, Kitakami City, Iwate Prefecture

Claims (1)

[Claims] 1. A semiconductor integrated circuit device comprising one or more functional modules, a common power supply terminal for the semiconductor integrated circuit device, a test power supply terminal provided for each functional module, to which a test power supply can be connected, A power supply terminal switching means for switching which one of the common power supply terminal and the test power supply terminal is connected to each functional module, and which one of the common power supply terminal and the test power supply terminal is connected to each functional module. And a power supply terminal setting control means for instructing the power supply terminal switching means.