JPH07181220A - Integrated circuit apparatus - Google Patents

Abstract

PURPOSE:To enable the inspection of soldering of terminals to be required to be inspected accurately even when IC devices are connected in parallel in plurality or singly by providing all terminals required to be inspected with a plurality of diodes individually connected internally and a terminal exclusively for inspection to which the plurality of diodes are connected in common. CONSTITUTION:Diodes d1-d7 of a main body part 1 have a cathode connected to respective terminals 2-1-2-7 individually inside and the cathode is connected to the side of an anode in common while being connected to a terminal -8 exclusively for inspection. In this IC apparatus, to inspect the connection of solders 4-1-4-8, for example, the continuity of wire patterns 3-1 and 3-8 is inspected. When continuity is found, it is learned that at least the solder 4-1 is connected. Likewise, the diodes d2-d-7 are connected individually to the respective terminals 2-1-2-7. So, the continuity is checked between the wire pattern 3-8 of the terminal 2-8 exclusively for inspection and the wire patterns of the respective terminals thereby enabling the inspecting of the condition of each soldering accurately.

Description

Detailed Description of the Invention

[0001]

This invention relates to an integrated circuit device (I
C), in particular, to an integrated circuit device that facilitates soldering inspection of each terminal.

[0002]

2. Description of the Related Art In a conventional integrated circuit device, a plurality of terminals (pins) 42 are provided on a main body 41 as shown in FIG. 4, and each terminal 42 is provided with a wiring pattern 4 on a circuit board.
Soldered with 3. In such an integrated circuit device, in order to inspect the soldering state of the terminals, for example, a power supply terminal 42a connected to a power supply (or GND) pattern 43a, a diode component for protection inside the main body 41, etc. Some of them have a continuity test using them, and those that cannot be electrically tested are visually inspected to perform a soldering test.

[0003]

Among the above-mentioned conventional soldering methods for integrated circuit devices, the visual inspection method cannot be found when the solder is placed but is electrically open. In some cases, and when conducting a conduction test using a protective diode, for example, in FIG. 5, between the input terminal and the output terminal of the amplifier 51 and the power supply terminal 52,
The diodes d ₁₁ and d ₁₂ are connected, and similarly, the diodes d ₁₃ and d ₁₄ are connected between the input terminal and the output terminal of the amplifier 51 and the ground GND.
When the number of integrated circuit devices 50 connected to is one, the inspection is possible, but the same integrated circuit device 5 as shown in FIG.
When 0 and 50A are connected in parallel, even if an electrical continuity check is performed, it is not possible to know whether only one of them is open.
However, depending on the integrated circuit device, the electrical continuity test cannot be performed in some cases.

The present invention has been made in view of the above problems, and soldering of each terminal requiring inspection is performed even when a plurality of integrated circuit devices are connected in parallel or in the case of a single device. It is an object of the present invention to provide an integrated circuit device capable of performing a mounting inspection with high accuracy.

[0005]

The integrated circuit device according to the present invention has a plurality of terminals such as an input signal terminal, an output signal terminal, and a power supply terminal. It is provided with a plurality of diodes that are individually connected and an inspection-only terminal to which the plurality of diodes are commonly connected inside.

In this integrated circuit device, terminals for exclusive use of inspection are provided, and between each terminal and the terminals for exclusive use of inspection,
Since a diode is provided inside the main unit, conduct a continuity test between the inspection-dedicated terminal and the inspection pad of the target terminal, and if that terminal is open by soldering, continuity can be obtained in the continuity test. Since this is not possible, this can be detected reliably.

[0007]

The present invention will be described in more detail with reference to the following examples.
Explained. FIG. 1 shows an integrated circuit device according to an embodiment of the present invention.
FIG. The integrated circuit device of this embodiment has a main body
A plurality of terminals led out from the part 1 and the body part 1
Two_-1Two _-2, ... 2_-8Is equipped with. And these ends
Child 2_-1Two_-2, ... 2_-8The times that are configured on the circuit board
Road pattern 3_-1Three_-2, ... 3_-8Solder to 4_-1,
Four_-2, ... 4_-8Are formed and connected. Terminal 2_-1,
Two_-2, ... 2_-8Of which 2_-8Is the edge dedicated to inspection
Child and terminal 2_-1Two_-2, ... 2_-7Is the input signal end
Child terminals, output signal terminals, power terminals, etc.
This is the terminal that is marked. Inspection dedicated terminal 2_-8Is external
Is open, so circuit pattern 3_-8,solder
Append 4_-8It does not have to be. These terminals 2_-1Two_-2, ...
Two_-7Although not shown, each circuit section in the main body section 1
Connected to. Further, the body 1 has a diode d₁,
d₂, ..., d₇Is provided, and these diodes d
₁, D₂, ..., d₇Is one end inside the main body 1.
(Cathode) is each terminal 2_-1Two_-2, ... 2_-7Individually contact
The anode side is commonly connected and
Inspection dedicated terminal 2_-8It is connected to the. This embodiment integrated circuit
According to the device, each soldering 4_-1, ... 4 _-8Connection status of
For inspection, for example, the wiring pattern 3_-1And wiring putter
3_-8If there is continuity,
Without soldering 4_-1But knowing that it is connected
You can Similarly, each terminal 2_-2, ... 2_-7Individually
Diode d₂, ..., d₇Is connected, so inspection
Dedicated terminal 2_-8Wiring pattern 3_-8And the other terminals
By checking the continuity between the wiring patterns,
It is possible to reliably inspect the rice paddy condition.

FIG. 2 is an integrated circuit diagram showing another embodiment of the present invention.
The circuit diagram of a circuit device is shown. In FIG. 2, the accumulation times
The path device 10 includes a terminal 5 for external lead-out._-15,_-2, ... 5_-Five
Equipped with terminal 5_-FiveIs a dedicated terminal for inspection.
Inspection dedicated terminal 5_-FiveIs a diode d₁, D₂, ...
d_FourThrough each terminal 5_-15,_-2, ... 5_-FourConnected to
There is. Besides this, the main body is protected in addition to the original amplifier 11.
Diode d₁₁, D₁₂, ..., d₁₄Are each connected
Has been. d₁₁Is the input terminal 5_-2And power terminal 5 _-1Between,
d₁₂Is the output terminal of the amplifier 11 and the power supply terminal 5_-1In between
This embodiment device is an integrated circuit device between a power supply and ground GND.
10 and an integrated circuit device 10A of the same type are connected in parallel.
And the output terminal 5 of the integrated circuit device 10._-3And input terminal 5_-2
But through the inspection pad 6 by the wiring pattern
It is connected. The device of this embodiment is
De d₁₁, D₁₂, ..., d₁₄Is an integrated circuit device 10 and an integrated circuit.
To be connected in parallel with each other in the road device 10A
In addition, it is also a dedicated terminal 5 for inspection_-FiveAnd each inspection terminal 5_-1,
5_-2, ... 5_-FourBetween each diode d₁, D₂,
…, D_FourSince they are individually connected,
Child 5_-FiveAnd terminal 5_-1If a continuity test between
If any soldering condition is bad, it will be open.
If there is continuity, at least terminal 5_-1Soldering state of
Is good, and then terminal 5_-2And inspection terminal 5_-FiveGuidance between
When checking the connection state, terminal 5_-2Inspect the soldering condition of
You can

According to the apparatus of this embodiment, each terminal is individually provided with a diode internally connected to the inspection-dedicated terminal 5 _-5 , so that the soldered state of any terminal can be accurately measured by an electrical test. It can be done reliably. FIG. 3 is a schematic plan view of an integrated circuit device showing another embodiment of the present invention. The integrated circuit device 20 of this embodiment has 16 terminals 21 _-1 , ... 21
_-16 are provided, and one of them, 21 _-16 , is used as an inspection-only terminal, and the other terminals are used as normal terminals.

[0010]

According to the present invention, terminals for inspection are provided in addition to ordinary terminals, and diodes are internally connected between the terminals for inspection and each terminal. Contrary to this, a continuity test can be performed with the inspection-dedicated terminals, and all soldering inspections of the connection terminals can be performed. Moreover, since the inspection only measures the diode component, simple measurement is sufficient, and the measurement time and cost are greatly reduced. Moreover, even in the case of parallel connection, the open state can be surely inspected individually.

Since all the pins can be soldered,
There is also an advantage that it is not necessary to perform an inaccurate visual inspection.

[Brief description of drawings]

FIG. 1 is a schematic diagram showing an integrated circuit device according to an embodiment of the present invention.

FIG. 2 is a circuit connection diagram showing an integrated circuit device according to another embodiment of the present invention.

FIG. 3 is a schematic plan view showing an integrated circuit device according to another embodiment of the present invention.

FIG. 4 is a plan view for explaining a conventional integrated circuit device.

FIG. 5 is a circuit connection diagram showing another conventional integrated circuit device.

[Explanation of symbols]

1 Main body 2 _-1 , ..., 2 _-7 terminal 2 _-8 Inspection dedicated terminal d ₁ , ..., d ₇ Diode

Claims (1)

[Claims] 1. An integrated circuit device having a plurality of terminals such as an input signal terminal, an output signal terminal, a power supply terminal, etc., and a plurality of diodes individually connected internally to all terminals requiring inspection and an internal circuit An integrated circuit device comprising: an inspection-dedicated terminal to which the plurality of diodes are commonly connected.