JPH07175726A - Memory device detecting mounting state and presence/ absence of fault - Google Patents

Memory device detecting mounting state and presence/ absence of fault

Info

Publication number
JPH07175726A
JPH07175726A JP5318810A JP31881093A JPH07175726A JP H07175726 A JPH07175726 A JP H07175726A JP 5318810 A JP5318810 A JP 5318810A JP 31881093 A JP31881093 A JP 31881093A JP H07175726 A JPH07175726 A JP H07175726A
Authority
JP
Japan
Prior art keywords
memory
signal
mounting state
mounting
absence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5318810A
Other languages
Japanese (ja)
Inventor
潔 ▲高▼橋
Kiyoshi Takahashi
Takehiko Ogura
健彦 小倉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
NEC Data Terminal Ltd
Original Assignee
NEC Corp
NEC Data Terminal Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, NEC Data Terminal Ltd filed Critical NEC Corp
Priority to JP5318810A priority Critical patent/JPH07175726A/en
Publication of JPH07175726A publication Critical patent/JPH07175726A/en
Pending legal-status Critical Current

Links

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

PURPOSE:To provide a memory device which can easily detect the mounting state of a memory and also can make clear the factor of an error if detected. CONSTITUTION:This memory device is provided with a mounting state detecting part 2 which detects the mounting state and the presence/absence of faults of the memory and an error detecting part 3 which sends the detection information received from the part 2 to a microprocessor. Then the part 2 includes a sensor part 7 which detects the memory mounting state, a monitoring part 8 which always monitors the current flowing through a memory part 5 and notifies a fault is occurs, and a storage part 9 which stores the information on both parts 7 and 8.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は実装状態および故障有無
を検出するメモリ装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a memory device for detecting the mounting state and the presence / absence of a failure.

【0002】[0002]

【従来の技術】従来、この種のメモリ装置は、たとえば
特開平02−170767号公報に示されるように、実
装メモリアドレスに不連続がないようにメモリ増設を行
いメモリ増設、変更の簡単化を図っている。この装置
は、基本メモリブロックを2分割してその境界を挟んで
増設メモリをアドレスが大きくなる方向とアドレスが小
さくなる方向に対して上下両側に各実装メモリブロック
を増やして行き、増設完了時の実装メモリの全体的なア
ドレスが連続するようにすることで、メモリの増設や変
更を簡単にするというものである。
2. Description of the Related Art Conventionally, in this type of memory device, as shown in, for example, Japanese Patent Laid-Open No. 02-170767, memory expansion is performed so that there is no discontinuity in mounted memory addresses to simplify memory expansion and modification. I am trying. This device divides the basic memory block into two, and expands the installed memory on both upper and lower sides with respect to the direction of increasing the address and the direction of decreasing the address across the boundary, and when the expansion is completed, By making the overall addresses of the mounted memory consecutive, it is easy to add or change the memory.

【0003】しかし、実装したメモリアドレスの連続性
という面では増設メモリが故障していないという条件の
もとで成立するもので、増設メモリの有無を知るために
はマイクロプロセッサによるメモリアクセス手段によ
り、メモリの特定アドレスにデータ書込みを行い、次に
同じアドレスのデータ読取りを行い、読取りデータと書
込みデータとの比較を行い、データが一致した場合にメ
モリが実装されていると判断する。
However, in terms of the continuity of the mounted memory addresses, the condition is satisfied under the condition that the additional memory is not broken down. In order to know the presence or absence of the additional memory, the memory access means by the microprocessor is used. Data is written to a specific address in the memory, then data is read from the same address, read data and write data are compared, and when the data match, it is determined that the memory is mounted.

【0004】[0004]

【発明が解決しようとする課題】この従来のメモリ装置
は、増設メモリが実装されているにもかかわらずメモリ
自体が故障している場合メモリ未実装であると判断して
いる。このため、メモリを増設したときに、メモリの故
障有無を検出することが困難である。
This conventional memory device determines that the memory is not mounted when the memory itself has failed even though the additional memory is mounted. Therefore, it is difficult to detect the presence or absence of a memory failure when the memory is added.

【0005】[0005]

【課題を解決するための手段】本発明の実装状態および
故障有無を検出するメモリ装置は、メモリ実装状態およ
び故障有無を検出する実装状態検出部と、この実装状態
検出部からの情報をマイクロプロセッサに出力するエラ
ー検出部とを備える。
According to the present invention, there is provided a memory device for detecting the mounting state and the presence / absence of a failure. And an error detection unit for outputting to.

【0006】また、本発明の実装状態および故障有無を
検出するメモリ装置は、前記実装状態検出部は、前記メ
モリ実装状態を検出するセンサ部と、前記メモリに流れ
る電流量を常に監視し異常を知らせる監視部と、前記セ
ンサ部と前記監視部との情報を記憶しておく記憶部とを
備える。
Further, in the memory device for detecting the mounting state and the presence / absence of failure of the present invention, the mounting state detecting section constantly monitors the sensor section for detecting the memory mounting state and the amount of current flowing in the memory to detect an abnormality. A monitoring unit for notifying and a storage unit for storing information on the sensor unit and the monitoring unit are provided.

【0007】[0007]

【実施例】次に、本発明について図面を参照して説明す
る。図1は本発明の一実施例の構成を示すブロック図で
あり、図2はこの実施例の実装状態検出部の構成図であ
る。図1および図2を参照すると、この実施例の実装状
態および故障有無を検出するメモリ装置は、メモリ実装
状態および故障有無を検出する実装状態検出部2と、こ
の実装状態検出部2からの情報をマイクロプロセッサに
出力するエラー検出部3とから構成される。また実装状
態検出部2は、メモリ実装状態を検出するセンサ部7
と、メモリ部5に流れる電流量を常に監視し異常を知ら
せる監視部8と、センサ部7と監視部8との情報を記憶
しておく記憶部9とから構成される。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described with reference to the drawings. FIG. 1 is a block diagram showing the configuration of an embodiment of the present invention, and FIG. 2 is a configuration diagram of a mounting state detection unit of this embodiment. Referring to FIG. 1 and FIG. 2, the memory device for detecting the mounting state and the presence / absence of a failure of this embodiment includes a mounting state detection unit 2 for detecting the memory mounting state and the presence / absence of a failure, and information from the mounting state detection unit 2. Is output to the microprocessor. In addition, the mounting state detection unit 2 includes a sensor unit 7 that detects a memory mounting state.
And a monitoring unit 8 that constantly monitors the amount of current flowing in the memory unit 5 to notify an abnormality, and a storage unit 9 that stores information on the sensor unit 7 and the monitoring unit 8.

【0008】メモリ部5から出力されるメモリ実装信号
11およびメモリ状態信号17は、常時実装状態検出部
2に入力される。メモリ実装信号11は、拡張メモリ用
ソケットに拡張メモリが実装されているか否かをフォト
センサを用いて非接触に検出し、フォトセンサを拡張メ
モリがさえぎるか否かの電位の差としてセンサ部7に伝
える。センサ部7はメモリ実装信号11を実装検出信号
12として出力する。メモリ状態信号17は、拡張メモ
リ用ソケットの電源およびグランド間に流れる電流値と
して監視部8に伝える。この電流値は、メモリが正常の
場合は一定量の増加が見込まれるが、メモリが故障の場
合は極端に大きな値もしくは未実装時とほとんど変化が
ない値を示す。監視部8はこの電流値をうけて正常範囲
の上限値と下限値とを比較し、範囲内であれば正常、そ
うでなければ異常として2値信号の状態検出信号18と
して出力する。
The memory mounting signal 11 and the memory status signal 17 output from the memory unit 5 are always input to the mounting status detecting unit 2. The memory mounting signal 11 non-contactly detects whether or not the expansion memory is mounted in the socket for the expansion memory by using the photo sensor, and the sensor unit 7 as a potential difference indicating whether or not the expansion sensor blocks the photo sensor. Tell. The sensor unit 7 outputs the memory mounting signal 11 as the mounting detection signal 12. The memory status signal 17 is transmitted to the monitoring unit 8 as a current value flowing between the power supply and the ground of the expansion memory socket. This current value is expected to increase by a certain amount when the memory is normal, but shows an extremely large value when the memory is faulty or a value that hardly changes from that when not mounted. The monitoring unit 8 receives this current value and compares the upper limit value and the lower limit value of the normal range, and outputs a binary signal state detection signal 18 as normal if within the range and abnormal if not.

【0009】実装状態検出部2は、センサ部7、監視部
8および記憶部9から構成されている。センサ部7はメ
モリ実装信号11から得られるアナログ信号を2値信号
に変換する。変換された2値信号はメモリの有無を示
し、実装検出信号12として記憶部9およびエラー検出
部3に出力される。監視部8はメモリ状態信号17から
得られる電流値を比較器を用いてアナログ量を2値信号
に変換する。変換された2値信号はメモリが正常である
か故障しているかを示し、状態検出信号18として記憶
部9およびエラー検出部3に出力される。記憶部9はセ
ンサ部7および監視部8から得られた実装検出信号12
および状態検出信号18およびメモリセレクト信号15
をメモリアクセス終了信号10に同期してラッチするラ
ッチ回路とメモリの有無および故障の状態を判断する論
理回路と実装メモリ容量を計算する加算回路から成り、
増設メモリ容量を検出する。この増設メモリ容量検出方
法は、メモリアクセスが行なわれる毎にラッチ回路にデ
ータがラッチされ、これを受けて論理回路は実装メモリ
サイズ毎にメモリ実装判断を行ない、メモリが実装され
ている場合は加算回路にメモリサイズを伝え、これを受
けて加算回路は実装容量を計算する。計算されたメモリ
実装容量はマイクロプロセッサ4から周辺装置をアクセ
スするのと同様の方法でアドレス信号13で指定したア
ドレスからデータバス信号16を介して読み出すことが
できる。
The mounting state detecting section 2 comprises a sensor section 7, a monitoring section 8 and a storage section 9. The sensor unit 7 converts an analog signal obtained from the memory mounting signal 11 into a binary signal. The converted binary signal indicates the presence or absence of the memory, and is output to the storage unit 9 and the error detection unit 3 as the mounting detection signal 12. The monitoring unit 8 converts the current value obtained from the memory status signal 17 into a binary signal using a comparator. The converted binary signal indicates whether the memory is normal or defective, and is output to the storage unit 9 and the error detection unit 3 as the state detection signal 18. The storage unit 9 stores the mounting detection signal 12 obtained from the sensor unit 7 and the monitoring unit 8.
And state detection signal 18 and memory select signal 15
A latch circuit that latches in synchronization with the memory access end signal 10, a logic circuit that determines the presence or absence of a memory and a failure state, and an adder circuit that calculates the mounted memory capacity.
Detects additional memory capacity. In this additional memory capacity detection method, data is latched in the latch circuit each time a memory access is performed, and the logic circuit receives the data and judges the memory mounting for each mounted memory size, and if the memory is mounted, the addition is performed. The memory size is transmitted to the circuit, and in response to this, the adder circuit calculates the mounting capacity. The calculated memory mounting capacity can be read via the data bus signal 16 from the address designated by the address signal 13 in the same manner as when accessing the peripheral device from the microprocessor 4.

【0010】エラー検出部3はセンサ部7および監視部
8から得られる実装検出信号12および状態検出信号1
8を基にメモリの故障を知る。この実装検出信号12お
よび状態検出信号18は、メモリセレクト信号15が選
択したメモリ実装信号11およびメモリ状態信号17の
みを有効とする。これはメモリ実装信号11およびメモ
リ状態信号17が常時出力されるためメモリアクセスを
した時のみこのメモリ実装信号11およびメモリ状態信
号17を有効とするためである。実装検出信号12およ
び状態検出信号18を受けた記憶部9はメモリアクセス
終了信号10に同期してメモリセレクト信号15と共に
内部に値を取り込み保持する。メモリアクセス終了信号
10に同期させてデータを取り込むのは、センサ部7と
監視部8とにより出力される実装検出信号12および状
態検出信号18の遅延時間を考慮するためと次のメモリ
アクセスが行なわれるまで値を保持するためである。実
装検出信号12および状態検出信号18を受けたエラー
検出部3は、エラー判断を行なった結果をステータス信
号14としてマイクロプロセッサ4に返す。マイクロプ
ロセッサ4は、従来メモリ実装状態の検出を行うのにメ
モリに対してデータの書込み、読出し、比較という処理
が必要であったが、本発明を用いることによりデータの
書込みもしくは読出しを行うだけでメモリ実装状態の検
出が行える。またステータス信号14を割り込み信号と
して処理することでエラーが発生したとき、即時にエラ
ー処理が行なえる。また、記憶部9はメモリと同様、特
定のアドレスを指定することによりデータバス信号16
を介して実装検出信号12および状態検出信号18を得
ることができる。
The error detecting section 3 includes a mounting detection signal 12 and a state detection signal 1 obtained from the sensor section 7 and the monitoring section 8.
Know the memory failure based on 8. The mounting detection signal 12 and the state detection signal 18 make only the memory mounting signal 11 and the memory state signal 17 selected by the memory select signal 15 valid. This is because the memory mounting signal 11 and the memory status signal 17 are always output, so that the memory mounting signal 11 and the memory status signal 17 are valid only when the memory is accessed. Upon receiving the mounting detection signal 12 and the state detection signal 18, the storage unit 9 fetches and holds the value inside together with the memory select signal 15 in synchronization with the memory access end signal 10. Data is fetched in synchronization with the memory access end signal 10 because the delay time of the mounting detection signal 12 and the state detection signal 18 output by the sensor unit 7 and the monitoring unit 8 is taken into consideration so that the next memory access is performed. This is because the value is retained until it is reached. Upon receiving the mounting detection signal 12 and the state detection signal 18, the error detection unit 3 returns the result of the error determination to the microprocessor 4 as the status signal 14. Conventionally, the microprocessor 4 has been required to write, read, and compare data to and from the memory in order to detect the mounted state of the memory, but by using the present invention, it is only necessary to write or read data. The memory mounting status can be detected. When an error occurs by processing the status signal 14 as an interrupt signal, the error processing can be performed immediately. Further, like the memory, the storage unit 9 can specify the data bus signal 16 by designating a specific address.
The mounting detection signal 12 and the state detection signal 18 can be obtained via.

【0011】図3はこの実施例の信号の時系列関係を示
したものである。図3を図1に併せて参照すると、まず
メモリをアクセスする場合、マイクロプロセッサ4はア
ドレス信号13を出力し、メモリアドレスを指定する。
それを受けてメモリセレクト信号15は指定されさメモ
リ部5のみアクセスを許可する信号を出す。実装検出信
号12および状態検出信号18はメモリアクセス信号1
5によって有効とされたメモリ部5の信号をエラー検出
部3に伝える。それを受けて、エラー検出部3はステー
タス信号14をマイクロプロセッサ4に出力する。次に
アクセスするデータがデータバス信号16としてマイク
ロプロセッサ4から出力される。メモリアクセス終了信
号10はメモリアクセスが完了した時点でマイクロプロ
セッサ4から出力される。メモリ実装信号11およびメ
モリ状態信号17は他の信号とは無関係に常にメモリ実
装状態により変化する。
FIG. 3 shows the time series relationship of signals in this embodiment. Referring to FIG. 3 together with FIG. 1, when the memory is first accessed, the microprocessor 4 outputs the address signal 13 to specify the memory address.
In response to this, the memory select signal 15 outputs a signal permitting access only to the designated memory section 5. The mounting detection signal 12 and the state detection signal 18 are the memory access signal 1
The signal of the memory unit 5 which is validated by 5 is transmitted to the error detection unit 3. In response to this, the error detector 3 outputs the status signal 14 to the microprocessor 4. The data to be accessed next is output from the microprocessor 4 as the data bus signal 16. The memory access end signal 10 is output from the microprocessor 4 when the memory access is completed. The memory mounting signal 11 and the memory status signal 17 always change according to the memory mounting status regardless of other signals.

【0012】[0012]

【発明の効果】以上説明したように、本発明によれば、
メモリ実装状態および故障有無を検出する実装状態検出
部と、この実装状態検出部からの情報をマイクロプロセ
ッサに出力するエラー検出部とを備えることにより、メ
モリ増設されているにもかかわらず故障している場合に
おけるメモリ実装有無を的確に行うことができる。また
メモリ故障の有無をマイクロプロセッサのメモリ書込み
データと比較する手段を行なわずとも常時検出でき、メ
モリ故障から引き起こされる2次障害を未然に防ぐこと
ができる。
As described above, according to the present invention,
By installing a mounting state detection unit that detects the mounted state of the memory and the presence or absence of a fault, and an error detection unit that outputs the information from this mounting state detection unit to the microprocessor, even if the memory is expanded, the fault occurs. Whether or not the memory is mounted can be accurately performed. Further, the presence or absence of a memory failure can always be detected without performing a means for comparing the memory write data of the microprocessor, and the secondary failure caused by the memory failure can be prevented.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の構成を示すブロック図であ
る。
FIG. 1 is a block diagram showing the configuration of an embodiment of the present invention.

【図2】この実施例の実装状態検出部の構成図である。FIG. 2 is a configuration diagram of a mounting state detection unit of this embodiment.

【図3】この実施例の信号の時系列関係を示す図であ
る。
FIG. 3 is a diagram showing a time-series relationship of signals in this embodiment.

【符号の説明】[Explanation of symbols]

1 メモリ実装検出回路 2 実装状態検出部 3 エラー検出部 4 マイクロプロセッサ 5 メモリ部 6 メモリ制御部 7 センサ部 8 監視部 9 記憶部 10 メモリアクセス終了信号 11 メモリ実装信号 12 実装検出信号 13 アドレスバス信号 14 ステータス信号 15 メモリセレクト信号 16 データバス信号 17 メモリ状態信号 18 状態検出信号 1 memory mounting detection circuit 2 mounting state detection unit 3 error detection unit 4 microprocessor 5 memory unit 6 memory control unit 7 sensor unit 8 monitoring unit 9 storage unit 10 memory access end signal 11 memory mounting signal 12 mounting detection signal 13 address bus signal 14 status signal 15 memory select signal 16 data bus signal 17 memory status signal 18 status detection signal

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 メモリ実装状態および故障有無を検出す
る実装状態検出部と、この実装状態検出部からの情報を
マイクロプロセッサに出力するエラー検出部とを備える
ことを特徴とする実装状態および故障有無を検出するメ
モリ装置。
1. A mounting state and presence / absence of failure, comprising a mounting state detecting section for detecting a memory mounting state and presence / absence of failure, and an error detecting section for outputting information from the mounting state detecting section to a microprocessor. Memory device for detecting.
【請求項2】 前記実装状態検出部は、前記メモリ実装
状態を検出するセンサ部と、前記メモリに流れる電流量
を常に監視し異常を知らせる監視部と、前記センサ部と
前記監視部との情報を記憶しておく記憶部とを備えるこ
とを特徴とする請求項1記載の実装状態および故障有無
を検出するメモリ装置。
2. The mounting state detection unit includes a sensor unit that detects the mounting state of the memory, a monitoring unit that constantly monitors the amount of current flowing in the memory and reports an abnormality, and information on the sensor unit and the monitoring unit. The memory device for detecting the mounting state and the presence / absence of a failure according to claim 1, further comprising:
JP5318810A 1993-12-20 1993-12-20 Memory device detecting mounting state and presence/ absence of fault Pending JPH07175726A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5318810A JPH07175726A (en) 1993-12-20 1993-12-20 Memory device detecting mounting state and presence/ absence of fault

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5318810A JPH07175726A (en) 1993-12-20 1993-12-20 Memory device detecting mounting state and presence/ absence of fault

Publications (1)

Publication Number Publication Date
JPH07175726A true JPH07175726A (en) 1995-07-14

Family

ID=18103201

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5318810A Pending JPH07175726A (en) 1993-12-20 1993-12-20 Memory device detecting mounting state and presence/ absence of fault

Country Status (1)

Country Link
JP (1) JPH07175726A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009276814A (en) * 2008-05-12 2009-11-26 Mitsubishi Electric Corp Memory malfunction detecting device for image processing, image display device using the same, and memory malfunction detecting method for image processing

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009276814A (en) * 2008-05-12 2009-11-26 Mitsubishi Electric Corp Memory malfunction detecting device for image processing, image display device using the same, and memory malfunction detecting method for image processing

Similar Documents

Publication Publication Date Title
US7774690B2 (en) Apparatus and method for detecting data error
JP3879492B2 (en) Control device failure diagnosis method
JPH07175726A (en) Memory device detecting mounting state and presence/ absence of fault
EP0482527B1 (en) A normal to spare switching control system
JPH0322298A (en) Semiconductor memory device
JPH08263394A (en) Bus test system
JP3173648B2 (en) Failure detection method
JP2002073375A (en) Software operation monitoring method in system that contains microcomputer
KR100247033B1 (en) Apparatus for detecting of data communication channel clock fail in sdh transmission system
JPH0950305A (en) Programmable controller and fault detection method therefor
JP2827573B2 (en) Error detection timing control method
JPH05231977A (en) Diagnostic system for pressure detector failure
KR960012981B1 (en) Transmission system
JPH04367003A (en) Abnormality detecting circuit for sequence control circuit
KR940007908B1 (en) Anti-normal state checking circuit for multi-sensor
JPH01217664A (en) Fault detecting system for multiprocessor system
JPH0428100A (en) Rom test circuit
JPH0561701A (en) Monitoring device for address control memory
JP2000131366A (en) Device and method for detecting state of waveform
JPS63118953A (en) System for detecting parity abnormality
JPS63208964A (en) Bus competition detecting system
JPH0528052A (en) Method for restoration from abnormality of memory access control
JPH06215279A (en) Fire sensor including cpu
JPS62172221A (en) Apparatus for accumulating abnormality information of sensor
JP2002183107A (en) Operation monitoring method for microcomputer

Legal Events

Date Code Title Description
A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20001024