JPH07170062A - Nitrogen reflow device - Google Patents

Nitrogen reflow device

Info

Publication number
JPH07170062A
JPH07170062A JP31195393A JP31195393A JPH07170062A JP H07170062 A JPH07170062 A JP H07170062A JP 31195393 A JP31195393 A JP 31195393A JP 31195393 A JP31195393 A JP 31195393A JP H07170062 A JPH07170062 A JP H07170062A
Authority
JP
Japan
Prior art keywords
concentration
deviation
supply
reflow
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP31195393A
Other languages
Japanese (ja)
Inventor
Yasuhiro Kametani
泰弘 亀谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP31195393A priority Critical patent/JPH07170062A/en
Publication of JPH07170062A publication Critical patent/JPH07170062A/en
Pending legal-status Critical Current

Links

Landscapes

  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PURPOSE:To provide an N2 reflow device capable of performing a high-accuracy O2 concentration control. CONSTITUTION:An O2 concentration measuring device 13 outputs an O2 concentration current value 14 to an N2 reflow control device 15 on the basis of a signal which is outputted from an O2 concentration sensor part 12. A deviation arithmetic means 17 compares the current value 14 with an O2 concentration set value 16 and calculates an O2 concentration deviation. A deviation mean changing rate arithmetic means 18 calculates an O2 concentration mean changing rate from the last value and present value. In an N2 feed rate arithmetic means 19, present N2 feed rate is calculated on the basis of the above values.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、プリント基板と電子部
品とを半田結合するN2リフロー装置に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an N 2 reflow device for soldering a printed circuit board and an electronic component.

【0002】[0002]

【従来の技術】従来のこの種のN2リフロー装置におい
て、O2濃度を制御するにあたって、あらかじめ所定の
2濃度に安定させる際のN2供給量を計測し、これを参
考として使用者が経験則でN2供給バルブを調節すると
いう手段が多くとられていた。また、O2濃度制御装置
を備えたN2リフロー装置においても、今日のような微
細なパターンの半田濡れ性を確保する微妙なO2濃度制
御には難を持っている。
BACKGROUND OF THE INVENTION N 2 reflow machine this type of conventional, O 2 in controlling the density, measured N 2 supply amount when stabilized in advance predetermined O 2 concentration, the user of this reference As a rule of thumb, many measures have been taken to adjust the N 2 supply valve. Further, even in the N 2 reflow apparatus equipped with the O 2 concentration control device, there is a difficulty in delicate O 2 concentration control for ensuring solder wettability of a fine pattern as in the present day.

【0003】以下、図4に基づき従来のO2濃度制御装
置について説明する。図4は従来のO2濃度制御のタイ
ミングチャートを示している。図4において、1はO2
濃度現在値、2はO2濃度設定値、3はN2供給バルブの
開閉状態を示すバルブ開閉信号である。O2濃度設定値
2に対して濃度Aを超えた時点でN2供給を減少させる
必要がある。しかしながら、O2濃度測定系では数十秒
の遅れ時間Δtが存在するため、バルブ開閉信号3にて
2供給バルブを閉じるのはΔt秒後になる。この間に
余分なN2が供給されて、図4のような濃度Aを超した
供給量波形となる。また、下方の濃度Bに対しても同様
であり、N2供給量は常に遅れた出力となり、所定のO2
濃度を得ることはできない。
A conventional O 2 concentration controller will be described below with reference to FIG. FIG. 4 shows a timing chart of the conventional O 2 concentration control. In FIG. 4, 1 is O 2
The present concentration value, 2 is the O 2 concentration set value, and 3 is a valve opening / closing signal indicating the opening / closing state of the N 2 supply valve. It is necessary to reduce the N 2 supply when the concentration A exceeds the O 2 concentration set value of 2. However, in the O 2 concentration measuring system, there is a delay time Δt of several tens of seconds, and therefore the N 2 supply valve is closed by the valve opening / closing signal 3 after Δt seconds. During this period, excess N 2 is supplied, and the supply amount waveform exceeds the concentration A as shown in FIG. The same applies to the lower concentration B as well, and the N 2 supply amount is always delayed and the predetermined O 2
No concentration can be obtained.

【0004】[0004]

【発明が解決しようとする課題】上記従来の構成では、
2濃度測定系に遅れ時間を考慮した補償手段がとられ
ていない。N2供給バルブの開閉タイミングを、O2濃度
測定値に依存している。O2濃度の変動により半田濡れ
性の品質に差異が生じる。また、常にO2濃度の安定性
の確認と調整が必要であるため、工場管理のコストが発
生しているという問題があった。
SUMMARY OF THE INVENTION In the above conventional configuration,
The O 2 concentration measuring system does not have any compensating means considering the delay time. The opening / closing timing of the N 2 supply valve depends on the measured O 2 concentration. A change in O 2 concentration causes a difference in solder wettability quality. Further, since it is always necessary to confirm and adjust the stability of the O 2 concentration, there is a problem that factory management costs are incurred.

【0005】本発明は、上記従来技術の問題を解決する
ものであり、O2濃度を常に安定させることにより半田
濡れ性の品質の差異等の問題を解決できるN2リフロー
装置を提供することを目的とする。
The present invention solves the above-mentioned problems of the prior art, and provides an N 2 reflow apparatus capable of solving problems such as difference in quality of solder wettability by always stabilizing the O 2 concentration. To aim.

【0006】[0006]

【課題を解決するための手段】この目的を達成するため
に、本発明はN2リフロー装置に、O2濃度測定装置と、
2濃度測定装置からのO2濃度現在値と外部から入力さ
れるO2濃度設定値との偏差と偏差の時間的変化率を算
出し、N2供給量を調整するバルブ開閉信号によりN2
給バルブを制御し、偏差の時間的変化率と次回単位時間
のN2供給量との関連を数式もしくはテーブルマップで
記憶する制御装置と、N2供給装置と、N2供給バルブ駆
動装置とから構成したものである。
To achieve this object, the present invention provides an N 2 reflow apparatus, an O 2 concentration measuring apparatus, and
O 2 calculates the deviation and temporal change rate of the deviation between the O 2 concentration setting of the O 2 concentration is input from the current value and the outside from the concentration measuring apparatus, N 2 by a valve closing signal for adjusting the N 2 supply amount From the control device that controls the supply valve and stores the relation between the temporal change rate of the deviation and the N 2 supply amount of the next unit time by a mathematical expression or a table map, the N 2 supply device, and the N 2 supply valve drive device. It is composed.

【0007】[0007]

【作用】上記構成によれば、前回単位時間でのO2濃度
の傾向とN2供給量を基に現在のO2濃度を推定すること
が可能になり、O2濃度を常に安定させることができ
る。
According to the above construction, the present O 2 concentration can be estimated based on the tendency of the O 2 concentration in the last unit time and the N 2 supply amount, and the O 2 concentration can always be stabilized. it can.

【0008】[0008]

【実施例】以下、図面を参照して実施例を詳細に説明す
る。図1は本発明の一実施例のN2リフロー装置の基本
構成を示している。図1において、11はN2リフロー装
置本体、12はN2リフロー装置本体内部に設置されたO2
濃度センサ部、13はO2濃度測定装置、14はO2濃度測定
装置13からの出力であるO2濃度現在値、15はN2リフロ
ー制御装置、16は外部から入力されるO2濃度設定値、1
7はO2濃度現在値14とO2濃度設定値16とからO2濃度偏
差ΔDを算出する偏差演算手段、18はO2濃度偏差ΔD
より前回値と今回値のO2濃度平均変化率を算出する偏
差平均変化率演算手段、19は今回N2供給量を算出する
2供給量演算手段、20はバルブ開閉信号出力手段、21
はバルブ開閉信号出力手段20の出力であるバルブ開閉信
号、22はN2供給バルブ駆動装置、23はN2供給開閉バル
ブ、24はN2供給装置である。
Embodiments will be described in detail below with reference to the drawings. FIG. 1 shows the basic configuration of an N 2 reflow apparatus according to an embodiment of the present invention. In FIG. 1, 11 is an N 2 reflow apparatus main body and 12 is an O 2 installed inside the N 2 reflow apparatus main body.
Concentration sensor unit, 13 O 2 concentration measuring device, 14 O 2 concentration present value output from O 2 concentration measuring device 13, 15 N 2 reflow controller, 16 O 2 concentration setting input from outside Value, 1
Reference numeral 7 is a deviation calculating means for calculating the O 2 concentration deviation ΔD from the O 2 concentration present value 14 and the O 2 concentration setting value 16, and 18 is the O 2 concentration deviation ΔD.
From the deviation average change rate calculation means for calculating the O 2 concentration average change rate of the previous value and the current value, 19 is the N 2 supply amount calculation means for calculating the current N 2 supply amount, 20 is the valve opening / closing signal output means, 21
Is a valve opening / closing signal output from the valve opening / closing signal output means 20, 22 is an N 2 supply valve driving device, 23 is an N 2 supply opening / closing valve, and 24 is an N 2 supply device.

【0009】N2リフロー装置本体11内部に設置された
2濃度センサ部12の信号から、O2濃度測定装置13は遅
れ時間を伴ったO2濃度現在値14をN2リフロー制御装置
15へ出力する。N2リフロー制御装置15では、偏差演算
手段17により先に入力されているO2濃度設定値16とO2
濃度現在値14とを比較し、O2濃度偏差ΔDを算出す
る。これにより、前回値と今回値から偏差平均変化率演
算手段18によりO2濃度平均変化率を算出する。N2供給
量演算手段19では上記の値を基に今回N2供給量を算出
する。
From the signal of the O 2 concentration sensor section 12 installed inside the N 2 reflow apparatus main body 11, the O 2 concentration measuring apparatus 13 outputs the current O 2 concentration value 14 with a delay time to the N 2 reflow control apparatus.
Output to 15. In the N 2 reflow controller 15, the deviation calculating means 17 inputs the O 2 concentration set value 16 and the O 2 concentration which are previously input.
The current concentration value 14 is compared to calculate the O 2 concentration deviation ΔD. Thus, the average deviation rate of change of O 2 concentration is calculated by the deviation average change rate calculating means 18 from the previous value and the current value. The N 2 supply amount calculation means 19 calculates the N 2 supply amount this time based on the above values.

【0010】図2は制御装置のN2供給量算出用のテー
ブルマップを示している。例えば、O2濃度平均変化率
が100%,今回の偏差が−100%,前回出力値が100%の
とき、今回出力値は75%といったテーブルマップを用意
し演算を施している。このテーブルマップは設備特性に
応じて登録追加が可能であり、また数式で一意に定義し
てもよい。
FIG. 2 shows a table map for calculating the N 2 supply amount of the control device. For example, when the average change rate of O 2 concentration is 100%, the current deviation is −100%, and the previous output value is 100%, a table map such that the current output value is 75% is prepared and the calculation is performed. This table map can be registered and added according to the equipment characteristics, and may be uniquely defined by a mathematical expression.

【0011】このようにして求められた今回N2供給量
は、バルブ開閉信号出力手段20により単位時間あたりの
バルブ開閉信号21に変換されてN2供給バルブ駆動装置2
2へ送られる。N2供給バルブ駆動装置22にてN2供給開
閉バルブ23が駆動され、N2供給装置からN2が供給され
る。
The present N 2 supply amount obtained in this way is converted into the valve opening / closing signal 21 per unit time by the valve opening / closing signal output means 20 and the N 2 supply valve driving device 2
Sent to 2. The N 2 supply valve driving device 22 drives the N 2 supply opening / closing valve 23 to supply N 2 from the N 2 supply device.

【0012】図3にはO2濃度制御のタイミングチャー
トを示している。ここで、図1と同一作用効果のものに
は同一符号を付し、その詳細な説明は省略する。図3に
おいて、25は偏差平均変化率演算手段18で算出されるO
2濃度平均変化率である。図3はO2濃度平均変化率25と
2供給のバルブ開閉信号21による開閉率(t-1〜t0斜線
部)ならびにO2濃度偏差ΔDを基に次回のN2供給のバ
ルブ開閉信号21での制御を示している(t0〜t1)。
FIG. 3 shows a timing chart of the O 2 concentration control. Here, components having the same effects as those in FIG. 1 are designated by the same reference numerals, and detailed description thereof will be omitted. In FIG. 3, 25 is O calculated by the deviation average change rate calculation means 18.
2 The average change rate of concentration. FIG. 3 shows the valve opening / closing signal for the next N 2 supply based on the average change rate 25 of O 2 concentration, the opening / closing rate by the valve opening / closing signal 21 of N 2 supply (shaded area from t −1 to t 0 ) and the O 2 concentration deviation ΔD. The control at 21 is shown (t 0 to t 1 ).

【0013】このように本実施例によれば、O2濃度偏
差ΔDと単位時間ごとのO2濃度平均変化率ならびに前
回N2供給量を算出することにより、今回N2供給量を調
整しO2濃度変動の少ないN2リフロー装置を実現するこ
とができる。
As described above, according to the present embodiment, the present N 2 supply amount is adjusted by calculating the O 2 concentration deviation ΔD, the O 2 concentration average change rate per unit time, and the previous N 2 supply amount. 2 It is possible to realize an N 2 reflow device with little fluctuation in concentration.

【0014】なお、バルブ開閉信号21は時間的なデュー
ティを有したパルス波形として表しているが、バルブ開
度を制御する出力信号であってもよい。
Although the valve opening / closing signal 21 is shown as a pulse waveform having a temporal duty, it may be an output signal for controlling the valve opening.

【0015】[0015]

【発明の効果】以上説明したように本発明によれば、O
2濃度偏差,O2濃度平均変化率,前回N2供給量から今
回N2供給量を制御することにより、O2濃度変動の少な
いN2リフロー装置を実現でき、半田濡れ性の品質の差
異等の問題を解決できるという効果を奏する。
As described above, according to the present invention, O
2 density deviation, O 2 concentration average rate, by controlling the current N 2 supply amount from the previous N 2 supply amount, O 2 can be realized with less N 2 reflow machine of density variation, the quality of solder wettability difference, etc. The effect of being able to solve the problem of.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例であるN2リフロー装置の基本
構成図である。
FIG. 1 is a basic configuration diagram of an N 2 reflow apparatus that is an embodiment of the present invention.

【図2】本実施例のN2供給量の算出用のテーブルマッ
プを示す図である。
FIG. 2 is a diagram showing a table map for calculating an N 2 supply amount according to the present embodiment.

【図3】本実施例のO2濃度制御のタイミングチャート
である。
FIG. 3 is a timing chart of O 2 concentration control according to the present embodiment.

【図4】従来のO2濃度制御のタイミングチャートであ
る。
FIG. 4 is a timing chart of conventional O 2 concentration control.

【符号の説明】[Explanation of symbols]

1,14…O2濃度現在値、 2,16…O2濃度設定値、
3,21…バルブ開閉信号、 11…N2リフロー装置本
体、 12…O2濃度センサ部、 13…O2濃度測定装置、
15…N2リフロー制御装置、 17…偏差演算手段、 1
8…偏差平均変化率演算手段、 19…N2供給量演算手
段、 20…バルブ開閉信号出力手段、 22…N2供給バ
ルブ駆動装置、 23…N2供給開閉バルブ、 24…N2
給装置、 25…O2濃度平均変化率。
1,14 ... O 2 concentration current value, 2,16 ... O 2 concentration setting value,
3, 21 ... Valve opening / closing signal, 11 ... N 2 reflow device main body, 12 ... O 2 concentration sensor part, 13 ... O 2 concentration measuring device,
15 ... N 2 reflow control device, 17 ... deviation calculation means, 1
8 ... Deviation average change rate calculation means, 19 ... N 2 supply amount calculation means, 20 ... Valve opening / closing signal output means, 22 ... N 2 supply valve driving device, 23 ... N 2 supply opening / closing valve, 24 ... N 2 supply device, 25 ... O 2 concentration average change rate.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 O2(酸素)濃度測定装置と、O2濃度の偏
差の時間的変化率を算出しN2供給量を制御する制御装
置と、N2供給装置と、N2供給バルブ駆動装置とを有す
ることを特徴とするN2(窒素)リフロー装置。
1. An O 2 (oxygen) concentration measuring device, a control device for controlling a N 2 supply amount by calculating a temporal change rate of deviation of the O 2 concentration, an N 2 supply device, and an N 2 supply valve drive. An N 2 (nitrogen) reflow device having a device.
【請求項2】 制御装置は、O2濃度測定装置からのO2
濃度現在値と外部から入力されるO2濃度設定値との偏
差と該偏差の時間的変化率を算出し、N2供給量を調整
するバルブ開閉信号によりN2供給バルブを制御するこ
とを特徴とする請求項1記載のN2リフロー装置。
2. A control device, O 2 from O 2 concentration measuring device
The present invention is characterized in that a deviation between a current concentration value and an O 2 concentration set value input from the outside and a temporal change rate of the deviation are calculated, and the N 2 supply valve is controlled by a valve opening / closing signal for adjusting the N 2 supply amount. The N 2 reflow apparatus according to claim 1.
【請求項3】 制御装置は、偏差の時間的変化率と次回
単位時間のN2供給量との関連を数式もしくはテーブル
マップで記憶する手段を有することを特徴とする請求項
1記載のN2リフロー装置。
3. A control device, N 2 according to claim 1, further comprising a means for storing a relationship between the temporal change rate and N 2 feed rate of the next unit time deviation equation or table map Reflow equipment.
JP31195393A 1993-12-13 1993-12-13 Nitrogen reflow device Pending JPH07170062A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31195393A JPH07170062A (en) 1993-12-13 1993-12-13 Nitrogen reflow device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31195393A JPH07170062A (en) 1993-12-13 1993-12-13 Nitrogen reflow device

Publications (1)

Publication Number Publication Date
JPH07170062A true JPH07170062A (en) 1995-07-04

Family

ID=18023427

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31195393A Pending JPH07170062A (en) 1993-12-13 1993-12-13 Nitrogen reflow device

Country Status (1)

Country Link
JP (1) JPH07170062A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150314401A1 (en) * 2012-12-14 2015-11-05 L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude Portable equipment for monitoring and controlling the level of oxygen in reflow oven atmosphere

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150314401A1 (en) * 2012-12-14 2015-11-05 L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude Portable equipment for monitoring and controlling the level of oxygen in reflow oven atmosphere
US9539672B2 (en) * 2012-12-14 2017-01-10 L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude Portable equipment for monitoring and controlling the level of oxygen in reflow oven atmosphere

Similar Documents

Publication Publication Date Title
KR880003229A (en) Adaptive Process Control
US5293027A (en) Electronic welding current generator for impulse arc welding
JPH02196664A (en) Flow regulator
RU2004110930A (en) REGULATION OF THE POWER SUPPLY ON THE TRANSMISSION LINE BY THE FEEDBACK CIRCUIT
JPH07170062A (en) Nitrogen reflow device
US4780254A (en) Method and apparatus for controlling the humidity in a closed chamber
RU2012034C1 (en) Method for automatic control and system for implementation of said method
JP2720414B2 (en) Adjustment device
JPS61226803A (en) Process control device
JPH0610765B2 (en) Process control equipment
JPS5967891A (en) Thyristor leonard device
JP3765044B2 (en) Excimer laser energy control device
KR910006647Y1 (en) Pin cushion control circuit for pulse with modify
JPH11214783A (en) Energy control device and method of excimer laser device
JP3539782B2 (en) Control circuit
JP2805821B2 (en) Controller
SU685459A1 (en) Ac regulator of resistance welding machine
JPS62279864A (en) Apparatus for controlling coating quantity of adhesive for temporarily clamping chip part
JPH02105906A (en) Reference voltage generating circuit
JPS6174014A (en) Adjusting device for integrating flow rate
JPS5953100A (en) Automatic voltage regulator
KR100197700B1 (en) Proportional controlled valve control circuit for a gas oven range
JP2768697B2 (en) Power output stabilization device
JPH0774462A (en) Inert gas atmosphere controller for soldering apparatus
JP2656675B2 (en) Voltage controlled oscillator