JPH07167914A - 低い帯域幅の試験装置およびプローブステーションによりデジタルマイクロ回路のサンプルおよび正確なａｃ試験を行う組込まれた試験回路 - Google Patents

低い帯域幅の試験装置およびプローブステーションによりデジタルマイクロ回路のサンプルおよび正確なａｃ試験を行う組込まれた試験回路

Info

Publication number
JPH07167914A
JPH07167914A JP4319045A JP31904592A JPH07167914A JP H07167914 A JPH07167914 A JP H07167914A JP 4319045 A JP4319045 A JP 4319045A JP 31904592 A JP31904592 A JP 31904592A JP H07167914 A JPH07167914 A JP H07167914A
Authority
JP
Japan
Prior art keywords
clock
test
data
output
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4319045A
Other languages
English (en)
Japanese (ja)
Inventor
William D Farwell
ウイリアム・デー・ファーウエル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Co
Original Assignee
Hughes Aircraft Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hughes Aircraft Co filed Critical Hughes Aircraft Co
Publication of JPH07167914A publication Critical patent/JPH07167914A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318552—Clock circuits details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318577—AC testing, e.g. current testing, burn-in
    • G01R31/31858—Delay testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
JP4319045A 1991-11-27 1992-11-27 低い帯域幅の試験装置およびプローブステーションによりデジタルマイクロ回路のサンプルおよび正確なａｃ試験を行う組込まれた試験回路 Pending JPH07167914A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US799582 1991-11-27
US07/799,582 US5181191A (en) 1991-11-27 1991-11-27 Built-in test circuitry providing simple and accurate AC test of digital microcircuits with low bandwidth test equipment and probe stations

Publications (1)

Publication Number Publication Date
JPH07167914A true JPH07167914A (ja) 1995-07-04

Family

ID=25176263

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4319045A Pending JPH07167914A (ja) 1991-11-27 1992-11-27 低い帯域幅の試験装置およびプローブステーションによりデジタルマイクロ回路のサンプルおよび正確なａｃ試験を行う組込まれた試験回路

Country Status (5)

Country Link
US (1) US5181191A (enExample)
EP (1) EP0545286A3 (enExample)
JP (1) JPH07167914A (enExample)
KR (1) KR960005606B1 (enExample)
TW (1) TW249309B (enExample)

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Publication number Priority date Publication date Assignee Title
US5291141A (en) * 1991-09-30 1994-03-01 Hughes Aircraft Company Method for continuously measuring delay margins in digital systems
EP0640986A1 (de) * 1993-08-26 1995-03-01 Siemens Aktiengesellschaft Halbleiterspeicheranordnung und Verfahren zum Testen dieser Halbleiterspeicheranordnung
US5617531A (en) * 1993-11-02 1997-04-01 Motorola, Inc. Data Processor having a built-in internal self test controller for testing a plurality of memories internal to the data processor
EP0685793A3 (en) * 1994-03-09 1999-03-03 Texas Instruments Incorporated Emulation device, system and method with distributed control of test interfaces in clock domains
US5592493A (en) * 1994-09-13 1997-01-07 Motorola Inc. Serial scan chain architecture for a data processing system and method of operation
US5606567A (en) * 1994-10-21 1997-02-25 Lucent Technologies Inc. Delay testing of high-performance digital components by a slow-speed tester
US6208172B1 (en) * 1995-01-13 2001-03-27 Vlsi, Technology, Inc. System margin and core temperature monitoring of an integrated circuit
US6055658A (en) * 1995-10-02 2000-04-25 International Business Machines Corporation Apparatus and method for testing high speed components using low speed test apparatus
DE19615745A1 (de) * 1996-04-20 1997-10-23 Philips Patentverwaltung Meßschaltung
US6466520B1 (en) * 1996-09-17 2002-10-15 Xilinx, Inc. Built-in AC self test using pulse generators
US6069849A (en) * 1996-09-17 2000-05-30 Xilinx, Inc. Method and system for measuring signal propagation delays using the duty cycle of a ring oscillator
US6219305B1 (en) 1996-09-17 2001-04-17 Xilinx, Inc. Method and system for measuring signal propagation delays using ring oscillators
US6144262A (en) * 1996-09-17 2000-11-07 Xilinx, Inc. Circuit for measuring signal delays of asynchronous register inputs
US6233205B1 (en) 1996-09-17 2001-05-15 Xilinx, Inc. Built-in self test method for measuring clock to out delays
US6232845B1 (en) 1996-09-17 2001-05-15 Xilinx, Inc. Circuit for measuring signal delays in synchronous memory elements
US6075418A (en) * 1996-09-17 2000-06-13 Xilinx, Inc. System with downstream set or clear for measuring signal propagation delays on integrated circuits
US5968192A (en) * 1997-05-09 1999-10-19 Artisan Components, Inc. Programmable universal test interface and method for making the same
US6044481A (en) * 1997-05-09 2000-03-28 Artisan Components, Inc. Programmable universal test interface for testing memories with different test methodologies
US6396887B1 (en) * 1997-10-10 2002-05-28 Rambus Incorporated Apparatus and method for generating a distributed clock signal using gear ratio techniques
US6125464A (en) * 1997-10-16 2000-09-26 Adaptec, Inc. High speed boundary scan design
US6449738B1 (en) 1998-12-03 2002-09-10 International Business Machines Corporation Apparatus for bus frequency independent wrap I/O testing and method therefor
US6324664B1 (en) 1999-01-27 2001-11-27 Raytheon Company Means for testing dynamic integrated circuits
US6452459B1 (en) 1999-07-22 2002-09-17 Xilinx, Inc. Circuit for measuring signal delays of synchronous memory elements
US6327224B1 (en) * 2000-06-16 2001-12-04 International Business Machines Corporation On-chip method for measuring access time and data-pin spread
US6694454B1 (en) 2000-06-30 2004-02-17 International Business Machines Corporation Stuck and transient fault diagnostic system
US6630838B1 (en) 2001-01-23 2003-10-07 Xilinx, Inc. Method for implementing dynamic burn-in testing using static test signals
US6656751B2 (en) * 2001-11-13 2003-12-02 International Business Machines Corporation Self test method and device for dynamic voltage screen functionality improvement
US6877123B2 (en) * 2001-12-19 2005-04-05 Freescale Semiconductors, Inc. Scan clock circuit and method therefor
US7065684B1 (en) 2002-04-18 2006-06-20 Xilinx, Inc. Circuits and methods for measuring signal propagation delays on integrated circuits
US7080298B2 (en) * 2003-02-04 2006-07-18 Toshiba America Electronic Components Circuit apparatus and method for testing integrated circuits using weighted pseudo-random test patterns
US7228476B2 (en) * 2004-11-05 2007-06-05 Stmicroelectronics, Inc. System and method for testing integrated circuits at operational speed using high-frequency clock converter
US10248520B2 (en) 2015-09-25 2019-04-02 Oracle International Corporation High speed functional test vectors in low power test conditions of a digital integrated circuit
US11749368B2 (en) * 2019-12-27 2023-09-05 Intel Corporation Quick configurable universal register for a configurable integrated circuit die

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63159773A (ja) * 1986-12-24 1988-07-02 Fujitsu Ltd 高集積回路試験方式

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8518860D0 (en) * 1985-07-25 1985-08-29 Int Computers Ltd Digital integrated circuits
US4736351A (en) * 1986-08-28 1988-04-05 Oliver Douglas E Precision semiconductor device timer
US4841500A (en) * 1988-03-17 1989-06-20 American Telephone And Telegraph Company Printed circuit board fabrication technique
US4878209A (en) * 1988-03-17 1989-10-31 International Business Machines Corporation Macro performance test
US4890270A (en) * 1988-04-08 1989-12-26 Sun Microsystems Method and apparatus for measuring the speed of an integrated circuit device
US5036230A (en) * 1990-03-01 1991-07-30 Intel Corporation CMOS clock-phase synthesizer
US5083299A (en) * 1990-07-16 1992-01-21 Unisys Corporation Tester for measuring signal propagation delay through electronic components

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63159773A (ja) * 1986-12-24 1988-07-02 Fujitsu Ltd 高集積回路試験方式

Also Published As

Publication number Publication date
KR960005606B1 (ko) 1996-04-26
KR930011489A (ko) 1993-06-24
EP0545286A2 (en) 1993-06-09
EP0545286A3 (en) 1993-07-14
TW249309B (enExample) 1995-06-11
US5181191A (en) 1993-01-19

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