JPH0715669A - Solid-state image pickup device - Google Patents

Abstract

PURPOSE:To miniaturize and lighten a portable video camera or the like by providing a transfer pulse generation means for supplying the transfer pulses of respective transfer modes to a solid-state image pickup element corresponding to the mode changeover of a switching means. CONSTITUTION:When detection signals indicating the generation of smears are supplied from a saturation detection circuit 10 and a peak detection circuit 11, a CPU 12 supplies FIT mode signals to a transfer pulse generation circuit 13 so as to switch a CCD image sensor 1 to the operation of a frame inter transfer (FIT) type and the circuit 13 supplies FIT driving pulses to the sensor 1. By controlling the sensor 1 so as to perform an interline transfer(IT) operation normally and controlling the sensor 1 so as to perform the FIT operation only when the smears are generated in such a manner, the solid-state image pickup device provided with both low power consumption characteristics of the CCD image sensor of an IT type and low smear characteristics of the CCD image sensor of the FIT type can be obtained.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a solid-state image pickup device suitable for use in, for example, a video camera device, a camera device or the like, which picks up an image of a subject with a solid-state image pickup device.

[0002]

2. Description of the Related Art Today, portable video camera devices are becoming popular because they are small, lightweight and easy to carry. This video lamella device converts the image pickup light received by the CCD image sensor into an image pickup signal, performs a predetermined process process on the image pickup signal, and records it on a magnetic tape.

Here, as the CCD image sensor, an interline transfer type (I
A T-type) CCD image sensor is known.

The IT type CCD image sensor shown in FIG. 3 has a plurality of pixels 50 provided for each horizontal line.
Receives the above-mentioned image pickup light and accumulates electric charges according to this image pickup light. The charges accumulated in each pixel 50 are read during the vertical blanking period and transferred to the vertical transfer path 51 at once. The charges transferred to the vertical transfer path 51 are transferred to the horizontal transfer path 52 line by line during the horizontal blanking period. The charges transferred to the horizontal transfer path 52 are transferred to a signal processing unit (not shown) according to the horizontal scanning speed.

The above-mentioned IT type CCD image sensor can be manufactured at low cost with a simple structure and has low power consumption.
A CD image sensor is provided.

However, in the IT type CCD image sensor, the charges read from the pixels 50 to the vertical transfer path 51 are slowly transferred to the horizontal transfer path 52 (transfer line by line during the horizontal blanking period). As a result, when each pixel 50 is irradiated with strong imaging light, the charge accumulated in each pixel 50 leaks into the vertical transfer path 51, causing a so-called smear. When this smear occurs, only a reproduced image with only vertical stripes can be obtained.

Therefore, in order to prevent this smear, a frame image transfer type (FIT type) CCD image sensor as shown in FIG. 4 has been developed.

The FIT type CCD image sensor is
The vertical transfer path 61 is shielded from light, and the vertical transfer path 61 is shielded.
It is characterized in that a light-shielding storage transfer path 63 is provided underneath, and the excess charge on the vertical transfer path 61 is swept away and transferred before the charge stored in each pixel 60 is read out.

That is, in the FIT type CCD image sensor, a plurality of pixels 6 are provided for each horizontal line.
At 0, the image pickup light is received, and charges corresponding to the image pickup light are accumulated, but before the charge accumulated in each pixel is read out,
The charges on the vertical transfer path 61 are swept away and transferred. And
After the sweep-out transfer, the electric charge accumulated in each pixel 60 is read out and transferred at once to the shielded vertical transfer path 61. The charges transferred to the vertical transfer path 61 are transferred at high speed to the light-shielding transfer path 63 for storage and are temporarily stored. The charges stored in the storage transfer path 63 are transferred to the horizontal transfer path 64 line by line during the horizontal blanking period. The charges transferred to the horizontal transfer path 64 are transferred to a signal processing unit (not shown) according to the speed of horizontal scanning.

This FIT type CCD image sensor is
Before reading the charge accumulated in each pixel 60, the excess charge on the vertical transfer path 61 is swept away and transferred, and the charge transferred to the vertical transfer path 61 is transferred to the storage transfer path 63 at high speed. Since the image data is transferred, the smear can be reduced to 1/40 to 1/60 as compared with the IT type CCD image sensor.

[0011]

However, although the FIT type CCD image sensor is preferably capable of reducing the smear, it is provided with the vertical transfer path 61 and the storage transfer path 63. As compared with the IT type CCD image sensor, the number of stages of the vertical transfer path is doubled, and the number of vertical transfer times is tripled due to increase in the number of sweep transfer, high-speed transfer to the storage transfer path 63, etc. There is a problem that becomes. Note that the sweep-out transfer is usually performed carefully (takes time), so the number of times of the vertical transfer is substantially three times or more.

Specifically, the vertical transfer path 61 and the storage transfer path 63 are capacitive loads because they are usually constituted by MOS capacitors. Therefore, the vertical transfer path 61 and the storage transfer path 63 are driven (registers are driven).
The power consumed by is the power consumption = register capacity x
(Amplitude of transfer pulse) ² x transfer frequency, and the above IT
Power consumption is several times that of a CCD image sensor of the type.

Therefore, when the FIT type CCD image sensor is provided in a portable video camera device, there is a problem that a large capacity battery pack must be provided as a power source because the power consumption is large. Since the large capacity battery pack is large and heavy,
There is a problem in that the portable video camera device becomes large and heavy, and the portability is lost.

The present invention has been made in view of the above problems, and a FIT type CCD image sensor is driven with low power consumption to reduce the power consumption of a battery pack, so that a portable video camera device is provided. It is an object of the present invention to provide a solid-state imaging device that can be made smaller and lighter.

[0015]

A solid-state image pickup device according to the present invention includes a frame-intertransfer type solid-state image pickup device which outputs an image pickup signal corresponding to received image pickup light, and a frame-intertransfer type transfer mode and intertransfer. And a transfer pulse generating means for supplying a transfer pulse of each transfer mode to the solid-state image pickup device in accordance with the mode switching of the switching means. To do.

Further, the solid-state image pickup device according to the present invention has a smear detecting means for detecting whether or not smear is generated based on an image pickup signal from the solid-state image pickup element, and the switching means is the smear detecting means. According to the detection output from the detection means, when the smear occurs, the frame inter transfer type transfer mode is switched to, and when the smear is not generated, the inter transfer type transfer mode is switched to. To solve.

Further, in the solid-state image pickup device according to the present invention, shading correction means for performing shading correction on the image pickup signal from the solid-state image pickup element, and the correction characteristic of the shading correction means are switched according to the mode switching of the switching means. The above problem is solved by having a shading characteristic switching unit.

Further, in the solid-state image pickup device according to the present invention, the blackset means for performing blackset processing on the image pickup signal from the solid-state image pickup element, and the processing characteristic of the blackset processing means in accordance with the mode switching of the switching means. And a black set processing characteristic switching means for switching the above.

The solid-state image pickup device according to the present invention comprises shading correction means for performing shading correction on the image pickup signal from the solid-state image pickup element, and blackset means for performing blackset processing on the image pickup signal from the solid-state image pickup element. The problem is solved by having a characteristic switching unit that switches the correction characteristic of the shading correction unit according to the mode switching of the switching unit and that switches the processing characteristic of the black set processing unit.

[0020]

In the solid-state image pickup device according to the present invention, when the smear does not occur, the frame-intertransfer type solid-state image pickup element is driven in the intertransfer-type transfer mode, and when the smear occurs, the solid-state image pickup device is operated. The image sensor is driven in the frame-inter transfer type transfer mode.
This mode switching can be performed manually, for example, after recognizing the occurrence of smear, but a smear detecting means for detecting the occurrence of the smear is provided, and a switching means for switching the mode based on the detection output is provided. By providing, it can be automatically performed.

Further, in the solid-state image pickup device according to the present invention, the shading characteristic and / or the black set processing characteristic are switched by the shading correction means and / or the black set processing means in response to the mode switching.

[0022]

Embodiments of the solid-state image pickup device according to the present invention will be described below with reference to the drawings.

In the solid-state image pickup device according to the present embodiment, as shown in FIG. 1, a central processing unit (CPU) 12 controls the operation of a FIT type CCD image sensor (hereinafter, simply referred to as a CCD image sensor) 1. Frame generation circuit 8, saturation detection circuit 1
0 and the FIT operation or the IT operation is controlled according to the smear detected by the peak detection circuit 11, and the CCD image sensor 1 is accompanied by this switching.
The configuration is such that black set and white balance adjustment and shading correction of the image pickup signal obtained from the above are performed.

The CCD image sensor 1 is of a so-called three-plate type for red (R), green (G), and blue (B), and the image output from each color CCD image sensor is used. Amplifier circuit (amplifier) 2, video amplifier circuit (video amplifier) 3, black set / white balance adjustment circuit (B / W adjustment circuit) that amplifies signals
14, shading correction circuit 15 and A / D converter 4
Are provided in groups of three, respectively.

In the solid-state image pickup device according to this embodiment having such a structure, the CCD image sensor 1 is
IT type C until the occurrence of smear described later is detected
The CPU 12 controls the operation of the CD image sensor (IT mode).

That is, the CPU 12 supplies an IT mode signal to the transfer pulse generation circuit 13 when image pickup is started. When the transfer mode generating circuit 13 is supplied with the IT mode signal, the charge accumulated in each pixel 60 shown in FIG. 4 is read to the vertical transfer path 61, and the charge read to the vertical transfer path 61 is read. Drive pulse (IT drive pulse) for transferring the signal to the horizontal transfer path 64 every horizontal period is supplied to the CCD image sensor 1.

As described above, the CCD image sensor 1
Is an IT type CCD when the above IT drive pulse is supplied.
Performs the same operation as the image sensor. Therefore, in the CCD image sensor 1 in the IT mode, the storage transfer path 63 shown in FIG.
It becomes a delay line only for stage transfer, and the operation is the same as adding a delay circuit for one field to the IT type CCD image sensor.

In the IT mode, the FIT type C is used.
Like when the CD image sensor 1 is normally operated,
Excessive charge sweeping transfer of the vertical transfer path 61 and the storage transfer path 63 from the vertical transfer path 61 to the storage transfer path 63
Since it is possible to omit the high-speed transfer of electric charges to, it is possible to reduce the power consumption (for example, 0.5 W) corresponding to this.

Here, when the FIT type CCD image sensor 1 is operated for IT in this way, the transfer path 6 for storage is
Since 3 works as a 1-field delay line, normally FI
A delay of one field occurs in the image pickup signal as compared with when the T operation is performed. Therefore, the transfer pulse generation circuit 13
Supplies an IT drive pulse to the CCD image sensor 1 so as to reverse the interlace based on the horizontal and vertical sync signals from the sync signal generator 7. As a result, in the IT mode, it is possible to prevent the adverse effect caused by the delay of one field in the image pickup signal.

The image pickup signal obtained from the CCD image sensor 1 is amplified by the amplifier 2 and the video amplifier 3 and supplied to the A / D converter 4. The A / D converter 4
Forms image pickup data by digitizing the image pickup signal and supplies it to the defect correction circuit 5. The defect correction circuit 5 is, for example, a preprogrammed CC.
The image pickup data is corrected on the basis of data indicating a defect such as a scratch on the D image sensor 1 and is supplied to the signal processing circuit 6 and the low-pass filter 9.

The signal processing circuit 6 is supplied with vertical synchronizing data and horizontal synchronizing data from a synchronizing signal generator 7. The signal processing circuit 6 applies non-linear processing such as gamma and knee, and corrects frequency characteristics such as contour enhancement to the imaged data, and adds vertical synchronizing data and horizontal synchronizing data. Supply to external devices such as monitor devices.

The low pass filter (LPF) 9
Removes the high frequency noise component of the imaged data and supplies it to the saturation detection circuit 10 and the peak detection circuit 11. It should be noted that smear may occur over a small area of about several pixels. Therefore, the cutoff frequency of the LPF 9 is set to about several MHz.

On the other hand, the vertical synchronizing data and horizontal synchronizing data output from the synchronizing signal generator 7 are stored in the frame generating circuit 8.
Is supplied to. The frame generation circuit 8 outputs a frame signal indicating a frame for smear detection based on the vertical synchronization data and the horizontal synchronization data. The frame for smear detection indicates, for example, a region obtained by dividing the screen into a plurality of areas, and the solid-state imaging device is adapted to detect smear for each frame. The frame signal is supplied to the saturation detection circuit 10 and the peak detection circuit 11.

Here, when the image pickup light that is bright enough to cause smear is received, the pixels of the CCD image sensor 1 are likely to be saturated. Therefore, the saturation detection circuit 10 detects the presence or absence of the saturation for each image pickup data (each image pickup data in the video period) related to the area indicated by the frame signal, and supplies the detection signal indicating this to the CPU 12. To do.

The data during the vertical blanking period is the dark current of the vertical transfer path 61 and the storage transfer path 63 of the CCD image sensor 1 shown in FIG. 4 and the smear component data. Therefore, if the data during the vertical blanking period exceeds the predetermined reference level, it can be understood that smear has occurred. Therefore, the peak value detection circuit 11 detects the presence or absence of smear by comparing the data during the vertical blanking period with the reference level, and outputs a detection signal indicating this to the CP.
Supply to U12.

Originally, it is sufficient to detect the smear by providing only the peak value detecting circuit 11. However, as described above, the noise component removal by the LPF 9 cannot be significantly performed. Therefore, as in the solid-state imaging device according to the present embodiment, double detection of smear by the saturation detection circuit 10 and the peak detection circuit 11 can prevent malfunction due to the noise component. The frame generation circuit 8, the saturation detection circuit 10, and the peak detection circuit 1
Since 1 is conventionally provided for control of auto iris, flare correction, etc., the respective circuits 8, 10,
There is no increase in power consumption due to 11.

Next, when the CPU 12 is supplied with a detection signal indicating the occurrence of smear from the saturation detection circuit 10 and / or the peak detection circuit 11, the CPU 12 sets the CCD image sensor 1 to the FIT type CCD image sensor. In order to switch to the operation, the FIT mode signal is supplied to the transfer pulse generating circuit 13. The transfer pulse generation circuit 13 is
When the FIT mode signal is supplied, the FIT drive pulse is supplied to the CCD image sensor 1.

When the FIT drive pulse is supplied, the CCD image sensor 1 sweeps away the charges on the vertical transfer path 61 and the storage transfer path 63, and then each pixel 60.
The charge stored in the memory is read. As a result, the adverse effect of the smear can be reduced.

When the smear is no longer detected, the CPU 12 controls the CCD image sensor 1 to enter the IT mode.

As described above, the FIT type CCD image sensor 1 is controlled to normally perform the IT operation and to perform the FIT operation only when the smear occurs, whereby the IT type CCD image sensor is controlled. Of the FIT type CCD image sensor and the low smear characteristic of the FIT type CCD image sensor (the amount of smear is 1/40 to 1/60 of that of the IT type CCD image sensor). Can be realized.

Therefore, when the solid-state image pickup device is provided in a portable video camera device, it consumes low power and contributes to downsizing and weight saving of the video camera device through downsizing and weight saving of the battery pack. be able to.

In the IT mode and the FIT mode, the dark current of each pixel 60 is the same,
Since the dark currents of the vertical transfer path 61 and the storage transfer path 63 are remarkably different from each other, the problems as described below occur until this state.

That is, in the IT mode, since the sweep-out transfer is not performed, the transfer paths 61 and 63 are not provided.
The dark current of is almost constant. On the other hand, the above FIT
Since the sweep transfer is performed in the mode, there is no dark current in the transfer paths 61 and 63 immediately after the sweep transfer, and the dark current gradually increases with the passage of time. For this reason, in the FIT mode, a problem occurs that sawtooth shading occurs in the captured image. Also,
During the vertical blanking, the sweep-out transfer and the high-speed transfer from the vertical transfer path 61 to the storage transfer path 63 are performed, so that each drive pulse is supplied concentratedly during the vertical blanking. Further, since sag is likely to be superimposed on the power source and the waveform thereof is superimposed on the image pickup signal by an amplifier or the like having power source dependency, there is a problem that the waveform of shading in the vertical direction is changed.

Therefore, the CPU 12 stores in advance the adjustment data for adjusting the black set and the white balance and the shading correction data for performing the shading correction in accordance with each of the above modes. B / W according to the switching of
It is supplied to the adjustment circuit 14 and the shading correction circuit 15.

The B / W adjusting circuit 14 is the CPU 1
The DC offset value between the channels of the CCD image sensor 1 is adjusted (black set) and the gain (white balance) between the channels is adjusted according to the adjustment data supplied from 2 in each mode. The video amplifier 3 is controlled.

Specifically, the B / W adjusting circuit 14 is
For example, in the IT mode, since the dark current has a constant level, the video amplifier 3 is controlled so as to perform constant black set and white balance adjustment, and the FI is controlled.
In the T mode, the video amplifier 3 is controlled so as to adjust the black set and white balance according to the dark current that gradually increases with the passage of time.

As a result, the black set and white balance of the image pickup signal from the amplifier 2 can be adjusted according to each of the above modes.

Next, the shading correction circuit 15
Has, for example, a configuration as shown in FIG.
Under the control of the PU 12, horizontal and vertical sawtooth waves and horizontal and vertical parabolic waves are used to form a shading correction signal.

That is, the CPU 12 forms a horizontal reset pulse on the basis of the horizontal synchronizing signal, supplies the horizontal reset pulse to the first integrator 30 via the input terminal 36, and performs vertical reset on the basis of the vertical synchronizing signal. A pulse is formed and is supplied to the fourth integrator 33 via the input terminal 37.

The first integrator 30 has a first power supply 34.
Are connected to form a horizontal sawtooth wave at the timing when the horizontal reset pulse is supplied, and the horizontal sawtooth wave is supplied to the first multiplier 38 and the second integrator 31.

The second integrator 31 further integrates the horizontal sawtooth wave from the first integrator 30 to form a horizontal parabolic wave, which is supplied to the second multiplier 39. To do.

On the other hand, the second power supply 35 is connected to the fourth integrator 37, which forms a vertical sawtooth wave at the timing when the vertical reset pulse is supplied, and this is formed into a fourth multiplier. 43 and the third integrator 32.

The third integrator 32 further integrates the vertical sawtooth wave from the fourth integrator 33 to form a vertical parabolic wave, which is supplied to the third multiplier 40. To do.

The CPU 12 switches the value of the gain data for amplifying the horizontal sawtooth wave according to the switching of each mode, and supplies this to the first multiplier 38 via the input terminal 42. . The first multiplier 38 is
Amplifying the horizontal sawtooth wave based on the gain data,
This is supplied to the adder 44.

Further, the CPU 12 switches the value of the gain data for amplifying the horizontal parabolic wave according to the switching of each mode, and the gain data is sent to the second multiplier 39 via the input terminal 46. Supply. The second multiplier 39
Amplifies the horizontal parabolic wave based on the gain data and supplies it to the adder 44.

Further, the CPU 12 switches the value of the gain data for amplifying the vertical parabolic wave according to the switching of each mode, and the value of the gain data is input to the third multiplier 40 via the input terminal 47. Supply. The third multiplier 40
Amplifies the vertical parabolic wave based on the gain data and supplies it to the adder 44.

Further, the CPU 12 switches the value of the gain data for amplifying the vertical sawtooth wave in accordance with the switching of the respective modes, and the value of the gain data is input to the fourth multiplier 41 via the input terminal 43. Supply. The fourth multiplier 4
1 amplifies the vertical sawtooth wave based on the gain data and supplies it to the adder 44.

The adder 44 forms a shading correction signal by adding the horizontal sawtooth wave, the horizontal parabolic wave, the vertical sawtooth wave, and the vertical parabolic wave, and outputs the shading correction signal via the output terminal 45. The video amplifier 3 shown in FIG.

Thus, the video amplifier 3 can perform shading correction on the image pickup signal from the amplifier 2 in accordance with each mode.

As described above, by performing the shading correction of the image pickup signal according to the switching between the IT mode and the FIT mode, it is possible to prevent the waveform of the shading in the vertical direction from being changed by the switching of each of the modes. Therefore, a stable image pickup signal can be obtained.

In the description of the above embodiment, the CC
Although the image pickup signal from the D image sensor 1 is digitized by the A / D converter 4 and the subsequent processing is performed, this can be omitted if the subsequent processing is performed in an analog manner.

Further, in the above description of the embodiment, the mode switching is automatically switched by detecting the occurrence of smear, but this is provided with a manual changeover switch to confirm the occurrence of smear (screen The vertical stripes may be displayed).

[0063]

As is apparent from the above description, in the solid-state image pickup device according to the present invention, when the smear does not occur, the frame-intertransfer type solid-state image pickup device is driven in the intertransfer type transfer mode. When smear occurs, the solid-state image sensor can be driven in the frame-inter transfer type transfer mode.

Therefore, the low power consumption characteristic of the inter-transfer type solid-state image pickup device and the low smear characteristic of the frame transfer type solid-state image pickup device (the amount of smear is 1/40 of that of the inter-transfer type solid-state image pickup device). ~ 1
It is possible to realize a solid-state imaging device having both characteristics of (/ 60).

Therefore, when the solid-state imaging device is provided in a portable video camera device, low power consumption can be achieved. Therefore, the size and weight of the battery pack can be reduced and the size of the video camera device can be reduced. Weight reduction can be achieved.

Further, the solid-state image pickup device according to the present invention can switch the shading characteristic and / or the processing characteristic of the black set according to the mode switching.

Therefore, optimum shading correction and black set processing can be carried out according to the mode of the solid-state image pickup device, and it is possible to prevent the waveform of shading in the vertical direction from changing due to the mode switching, and it is stable. An image pickup signal can be obtained.

[Brief description of drawings]

FIG. 1 is a block diagram of a solid-state imaging device according to an embodiment of the present invention.

FIG. 2 is a block diagram of a shading correction circuit provided in the solid-state imaging device unit.

[Fig. 3] Interline transfer type (IT type) CC
It is a schematic diagram showing the composition of a D image sensor.

FIG. 4 is a schematic diagram showing a configuration of a frame inter transfer type (FIT type) CCD image sensor.

[Explanation of symbols]

1 ・ ・ ・ ・ ・ ・ ・ ・ FIT CCD image sensor 2 ・ ・ ・ ・ ・ ・ ・ ・ Amplifier circuit (amplifier) 3 ・ ・ ・ ・ ・... Video amplifier circuit 4 ... A / D converter 5 ... Defect correction circuit 6 ...・ ・ ・ ・ ・ ・ Camera signal processing circuit 7 ・ ・ ・ ・ ・ ・ ・ ・ Synchronous signal generator 8 ・ ・ ・ ・ ・ ・ ・ ・ Frame generation circuit 9 ・ ・ ・・ ・ ・ ・ ・ ・ ・ ・ Low-pass filter 10 ・ ・ ・ ・ ・ ・ ・ ・ ・ Saturation detection circuit 11 ・ ・ ・ ・ ・ ・ ・ ・ ・ Peak value detection circuit 12 ・ ・・ ・ ・ ・ ・ ・ ・ ・ Central processing unit (CPU) 13 ・ ・ ・ ・ ・ ・ ・ ・ ・ ・ ・ Transfer pulse generation circuit 14 ・ ・ ・ ・ ・ ・ ・ ・ ・ ・ ・ Black set / white balance adjustment Circuit 15 ... ........ Shading correction circuit 30-33 ..... Integrator 34,35 ..... Power supply circuit 36 ..・ Horizontal reset pulse input terminal 37 ・ ・ ・ ・ ・ ・ ・ ・ ・ Vertical reset pulse input terminal 38 to 41 ・ ・ ・ ・ ・ Multiplier 44 ・ ・ ・ ・・ ・ ・ Adder 45 ・ ・ ・ ・ ・ ・ ・ ・ ・ ・ Shading correction signal output terminal

Claims (5)

[Claims] 1. A frame-inter-transfer type solid-state image sensor for outputting an image-pickup signal corresponding to received image-pickup light, switching means for switching between a frame-inter-transfer type transfer mode and an inter-transfer type transfer mode, and the above-mentioned switching. Solid-state image pickup device, comprising: transfer pulse generating means for supplying a transfer pulse of each transfer mode to the solid-state image pickup element in accordance with mode switching of the means. 2. A smear detecting means for detecting whether or not smear is generated based on an image pickup signal from the solid-state image pickup element, and the switching means is responsive to a detection output from the smear detecting means. 2. The solid-state imaging device according to claim 1, wherein when the smear occurs, the frame transfer mode is switched to the frame transfer mode, and when the smear is not generated, the transfer mode is switched to the intertransfer mode. 3. A shading correction unit that performs shading correction on an image pickup signal from the solid-state image pickup device, and a shading characteristic switching unit that switches a correction characteristic of the shading correction unit according to mode switching of the switching unit. The solid-state imaging device according to claim 1 or 2, characterized in that 4. Black setting means for performing black setting processing on an image pickup signal from said solid-state image pickup device, and black setting processing characteristic switching means for switching processing characteristics of said black setting processing means in response to mode switching of said switching means. The solid-state imaging device according to claim 1 or 2, further comprising: 5. A shading correction unit that performs shading correction on an image pickup signal from the solid-state image pickup device, a blackset unit that performs a blackset process on an image pickup signal from the solid-state image pickup device, and a mode switching of the switching unit. 3. The solid-state imaging device according to claim 1, further comprising: a characteristic switching unit that switches a correction characteristic of the shading correction unit and a processing characteristic of the black set processing unit.