JPH07151826A - System for distributing test program - Google Patents

System for distributing test program

Info

Publication number
JPH07151826A
JPH07151826A JP29790693A JP29790693A JPH07151826A JP H07151826 A JPH07151826 A JP H07151826A JP 29790693 A JP29790693 A JP 29790693A JP 29790693 A JP29790693 A JP 29790693A JP H07151826 A JPH07151826 A JP H07151826A
Authority
JP
Japan
Prior art keywords
test program
production
manufacturing
condition information
information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP29790693A
Other languages
Japanese (ja)
Inventor
Akihiro Nishishita
哲広 西下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP29790693A priority Critical patent/JPH07151826A/en
Publication of JPH07151826A publication Critical patent/JPH07151826A/en
Pending legal-status Critical Current

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30Computing systems specially adapted for manufacturing
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/80Management or planning

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • General Factory Administration (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)

Abstract

PURPOSE:To make a system for distributing a test program to an inspection process from a design department efficient. CONSTITUTION:In a design department 1, a test-program generation means 4 automatically generates a test program from design information. A production- condition-information registration means 5 generates production-condition information on the loading method, the setting condition or the like of the test program. A production-information storage device 3 stores the test program and the production-condition information which have been generated for every product name and every test program number. A data transfer means 6 integrally data-transfers the test program and the production-condition information which have been held in the production-information storage device 3. In a production department 2, a production-information storage device 7 stores the test program and the production-condition information which have been data- transferred. A test-program readout means 8 downloads the test program to an inspection device from the production-information storage device 7. A production-condition-information retrieval means 9 retrieves the production- condition information from the production-information storage device 7 and sets the condition in the inspection device.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はテストプログラム配布方
式に関し、特に半導体製造での設計部門から検査工程へ
のテストプログラムの配布方式に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test program distribution method, and more particularly to a test program distribution method from a design department in a semiconductor manufacturing process to an inspection process.

【0002】[0002]

【従来の技術】従来のテストプログラム配布方法につい
て図面を参照して説明する。図2は、従来のテストプロ
グラム配布方法の一例を示す説明図である。
2. Description of the Related Art A conventional test program distribution method will be described with reference to the drawings. FIG. 2 is an explanatory diagram showing an example of a conventional test program distribution method.

【0003】設計部門21では、製品が流れる前にその
製品のテストプログラム23と製造条件情報24を作成
し、テストプログラムはFDやMTで、製造条件情報は
帳票で生産部門22の検査工程に配布する。製造部門で
の検査工程で作業者は、製品が流れてきたとき、予め配
布されている製造条件情報26を参照し、流れてきた製
品名に該当するテストプログラム25を検査装置に読み
込ませ、検査装置を稼働する。
The design department 21 creates a test program 23 and manufacturing condition information 24 for the product before the product flows, and the test program is FD or MT, and the manufacturing condition information is distributed to the inspection process of the production department 22 in a form. To do. In the inspection process in the manufacturing department, when the product comes in, the worker refers to the manufacturing condition information 26 distributed in advance, causes the inspection device to read the test program 25 corresponding to the product name, and performs the inspection. Operate the device.

【0004】従来技術に近い公知資料としては公開特許
公報「平2−276978」が挙げられる。
As a publicly known material close to the prior art, there is Japanese Unexamined Patent Publication No. Hei 2-276978.

【0005】[0005]

【発明が解決しようとする課題】上述した従来のテスト
プログラム配布方法は、作業者が検査工程の検査装置を
稼働するにあたり、テストプログラムと製造条件情報が
必ず同じタイミングで作業者の手元に揃わなければなら
ない。しかし設計部門から生産部門へテストプログラム
はFDやMT、製造条件情報は帳票という異なる媒体で
配布されるため、必ずしも同じタイミングで作業者の手
元に揃わず、生産の遅れをきたす恐れがあるという欠点
があった。
In the above-mentioned conventional test program distribution method, when the operator operates the inspection device in the inspection process, the test program and the manufacturing condition information must be available to the operator at the same timing. I have to. However, since the test program is distributed from the design department to the production department in different media such as FD and MT, and the manufacturing condition information is a form, it is not always available to the operator at the same timing, which may cause a delay in production. was there.

【0006】[0006]

【課題を解決するための手段】本発明は、設計部門から
配布されたテストプログラムを用いて生産部門で検査装
置を検査する場合のテストプログラム配布方式におい
て、前記設計部門では、前記テストプログラムを予め与
えられた設計情報から自動生成するテストプログラム生
成手段と、前記テストプログラムのロード方法や設定条
件などの製造条件情報を生成する製造条件情報登録手段
と、製品名とテストプログラム番号毎に前記生成された
テストプログラムと前記生成された製造条件情報を保持
する第1の製造情報記憶装置と、前記第1の製造情報記
憶装置に保持された前記テストプログラム及び前記製造
条件情報を一体としてデータ転送するデータ転送手段を
有し、前記生産部門には、前記データ転送された前記テ
ストプログラムと製造条件情報を保持する第2の製造情
報記憶装置と、前記第2の製造情報記憶装置から前記テ
ストプログラムを前記検査装置にダウンロードするテス
トプログラム読込手段と、前記第2の製造情報記憶装置
から前記製造条件情報を検索し前記検査装置に条件を設
定する製造条件情報検索手段とを含むことを特徴とす
る。
The present invention provides a test program distribution method for inspecting an inspection apparatus in a production department using a test program distributed from a design department, wherein the design department pre-installs the test program. A test program generating means for automatically generating from given design information, a manufacturing condition information registering means for generating manufacturing condition information such as the loading method of the test program and setting conditions, and the above-mentioned generated for each product name and test program number. And a first manufacturing information storage device that holds the generated manufacturing condition information, and data that integrally transfers the test program and the manufacturing condition information held in the first manufacturing information storage device. A transfer means is provided, and the production department is provided with the test program to which the data is transferred. A second manufacturing information storage device that holds condition information, a test program reading unit that downloads the test program from the second manufacturing information storage device to the inspection device, and the manufacturing from the second manufacturing information storage device. Manufacturing condition information retrieving means for retrieving condition information and setting conditions in the inspection device.

【0007】[0007]

【実施例】次に、本発明について図面を参照して詳細に
説明する。
The present invention will be described in detail with reference to the drawings.

【0008】図1は、本発明の一実施例を示すブロック
構成図である。図1に示すブロック構成図は、設計部門
1には、製品名とテストプログラム番号毎にテストプロ
グラム、製造条件情報を保持する製造情報記憶装置3
と、テストプログラム生成手段4と、製造条件情報登録
手段5と、テストプログラム及び製造条件情報をデータ
転送するデータ転送手段6とを含み、生産部門2には、
同じく製品名とテストプログラム番号毎にテストプログ
ラム、製造条件情報を保持する製造情報記憶装置7と、
テストプログラムを検査装置にダウンロードするテスト
プログラム読込手段8と、製造条件情報検索手段9とを
含んで構成される。
FIG. 1 is a block diagram showing an embodiment of the present invention. In the block diagram shown in FIG. 1, the design department 1 has a manufacturing information storage device 3 for holding a test program and manufacturing condition information for each product name and test program number.
The production department 2 includes a test program generation means 4, a manufacturing condition information registration means 5, and a data transfer means 6 for transferring the test program and the manufacturing condition information.
Similarly, a manufacturing information storage device 7 that holds a test program and manufacturing condition information for each product name and test program number,
The test program reading means 8 for downloading the test program to the inspection apparatus and the manufacturing condition information searching means 9 are included.

【0009】設計部門においてまず、テストプログラム
生成手段4を用いて、設計情報よりある製品のテストプ
ログラムを自動生成し製造情報記憶装置3に格納し、次
にテストプログラムのロード方法や設定条件などの製造
条件情報を、製造条件情報登録手段5を用いて同じ製造
情報記憶装置3に登録する。このとき製造情報記憶装置
3では、テストプログラムと製造条件情報を製品名とテ
ストプログラム番号をキーとして関係付る。
In the design department, first, the test program generating means 4 is used to automatically generate a test program for a certain product from the design information and store it in the manufacturing information storage device 3, and then the test program loading method and setting conditions are set. The manufacturing condition information is registered in the same manufacturing information storage device 3 using the manufacturing condition information registration means 5. At this time, in the manufacturing information storage device 3, the test program and the manufacturing condition information are related by using the product name and the test program number as keys.

【0010】次に、生成されたテストプログラム及び製
造条件情報は同じタイミングで、データ転送手段6によ
り、設計部門1の製造情報記憶装置3から生産部門2の
製造情報記憶装置7にデータ転送される。
Next, the generated test program and manufacturing condition information are transferred at the same timing by the data transfer means 6 from the manufacturing information storage device 3 of the design department 1 to the manufacturing information storage device 7 of the production department 2. .

【0011】生産部門2においては、製造条件情報検索
手段9により、転送済みのデータを確認し、同時にテス
トプログラム読込手段8により、テストプログラムを検
査装置にダウンロードする。このとき検査装置の各種条
件設定も製造条件情報検索機能を用いて速やかに行うこ
とができる。
In the production department 2, the manufacturing condition information searching means 9 confirms the transferred data, and at the same time, the test program reading means 8 downloads the test program to the inspection device. At this time, various condition settings of the inspection device can be promptly performed using the manufacturing condition information search function.

【0012】[0012]

【発明の効果】本発明のテストプログラム転送方式は、
テストプログラムと製造条件情報を同じデータべースで
管理し、さらに設計部門から生産部門へデータ転送する
ため、テストプログラムと製造条件情報が生産部門の作
業者へ必ず同じタイミングで伝達されるので、作業者に
よる検査装置テストプログラムの読み込み、及び条件設
定の省力化、製造条件情報の高品質化、設計から生産へ
の製造条件情報の伝達時間の短縮等の効果が期待でき
る。
According to the test program transfer method of the present invention,
Since the test program and manufacturing condition information are managed in the same database, and data is transferred from the design department to the production department, the test program and manufacturing condition information are always transmitted to the workers in the production department at the same timing. It is expected that the operator can read the inspection device test program and save the labor for setting the conditions, improve the quality of the manufacturing condition information, and shorten the transmission time of the manufacturing condition information from design to production.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例を示すブロック図である。FIG. 1 is a block diagram showing an embodiment of the present invention.

【図2】従来技術の一実施例を示す説明図である。FIG. 2 is an explanatory diagram showing an example of a conventional technique.

【符号の説明】[Explanation of symbols]

1,21 設計部門 2,22 生産部門 3,7 製造情報記憶装置 4 テストプログラム生成手段 5 製造条件情報登録手段 6 データ転送手段 8 テストプログラム読込手段 9 製造条件情報検索手段 23,25 テストプログラム 24,26 製造条件情報 1, 21 Design department 2, 22 Production department 3, 7 Manufacturing information storage device 4 Test program generating means 5 Manufacturing condition information registering means 6 Data transfer means 8 Test program reading means 9 Manufacturing condition information searching means 23, 25 Test program 24, 26 Manufacturing condition information

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/66 Z 7630−4M ─────────────────────────────────────────────────── ───Continued from the front page (51) Int.Cl. 6 Identification code Internal reference number FI Technical indication H01L 21/66 Z 7630-4M

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 設計部門から配布されたテストプログラ
ムを用いて生産部門で検査装置を検査する場合のテスト
プログラム配布方式において、前記設計部門では、前記
テストプログラムを予め与えられた設計情報から自動生
成するテストプログラム生成手段と、前記テストプログ
ラムのロード方法や設定条件などの製造条件情報を生成
する製造条件情報登録手段と、製品名とテストプログラ
ム番号毎に前記生成されたテストプログラムと前記生成
された製造条件情報を保持する第1の製造情報記憶装置
と、前記第1の製造情報記憶装置に保持された前記テス
トプログラム及び前記製造条件情報を一体としてデータ
転送するデータ転送手段を有し、前記生産部門には、前
記データ転送された前記テストプログラムと製造条件情
報を保持する第2の製造情報記憶装置と、前記第2の製
造情報記憶装置から前記テストプログラムを前記検査装
置にダウンロードするテストプログラム読込手段と、前
記第2の製造情報記憶装置から前記製造条件情報を検索
し前記検査装置に条件を設定する製造条件情報検索手段
とを含むことを特徴とするテストプログラム転送方式。
1. A test program distribution method for inspecting an inspection device in a production department using a test program distributed from a design department, wherein the design department automatically generates the test program from design information given in advance. Test program generating means, manufacturing condition information registering means for generating manufacturing condition information such as the loading method and setting conditions of the test program, the generated test program for each product name and test program number, and the generated The manufacturing method includes: a first manufacturing information storage device that holds manufacturing condition information; and a data transfer unit that integrally transfers the test program and the manufacturing condition information held in the first manufacturing information storage device. The department stores a second program that holds the test program and manufacturing condition information that have been transferred. A manufacturing information storage device, a test program reading means for downloading the test program from the second manufacturing information storage device to the inspection device, and the inspection device by retrieving the manufacturing condition information from the second manufacturing information storage device. And a manufacturing condition information retrieving means for setting conditions to the test program transfer method.
JP29790693A 1993-11-29 1993-11-29 System for distributing test program Pending JPH07151826A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29790693A JPH07151826A (en) 1993-11-29 1993-11-29 System for distributing test program

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29790693A JPH07151826A (en) 1993-11-29 1993-11-29 System for distributing test program

Publications (1)

Publication Number Publication Date
JPH07151826A true JPH07151826A (en) 1995-06-16

Family

ID=17852630

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29790693A Pending JPH07151826A (en) 1993-11-29 1993-11-29 System for distributing test program

Country Status (1)

Country Link
JP (1) JPH07151826A (en)

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