JPH0715091A - Semiconductor laser - Google Patents

Semiconductor laser

Info

Publication number
JPH0715091A
JPH0715091A JP15254893A JP15254893A JPH0715091A JP H0715091 A JPH0715091 A JP H0715091A JP 15254893 A JP15254893 A JP 15254893A JP 15254893 A JP15254893 A JP 15254893A JP H0715091 A JPH0715091 A JP H0715091A
Authority
JP
Japan
Prior art keywords
semiconductor laser
electronic cooler
diode chip
laser diode
laser device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15254893A
Other languages
Japanese (ja)
Other versions
JP2546146B2 (en
Inventor
Yoshihiro Idei
義浩 出井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP5152548A priority Critical patent/JP2546146B2/en
Publication of JPH0715091A publication Critical patent/JPH0715091A/en
Application granted granted Critical
Publication of JP2546146B2 publication Critical patent/JP2546146B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To realize a thin semiconductor laser by disposing a semiconductor laser diode chip, a lens holder, a monitor photodiode, a thermister, and an electronic cooler for temperature control on the surface of one metal board. CONSTITUTION:A lens holder 2 containing a lens, a semiconductor laser diode chip 1, a monitor photodiode 3, are arranged sequentially in a row on the surface of a metal boar 4. A thermister 5 is disposed contiguously to the semiconductor laser diode chip 1 and an electronic cooler 6 is disposed on the rear of the monitor photodiode. The electronic cooler 6 is bonded, on the heat suction side thereof, to the metal board 4 and bonded, on the heat dissipation side, to a heat sink 7. The heat sink 7 has fins on the rear side of the electronic cooler. This structure realized a thin semiconductor laser device.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体レーザー装置に
関し、特に温度制御用の電子冷却器を備えた半導体レー
ザー装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor laser device, and more particularly to a semiconductor laser device having an electronic cooler for temperature control.

【0002】[0002]

【従来の技術】従来の半導体レーザー装置は、図5に示
す様に、半導体レーザーダイオードチップ1と、半導体
レーザーダイオードチップ1からの発振光を光ファイバ
へ効率良く光結合させるためのレンズを有したレンズホ
ルダ2と、図示してはいないがレンズホルダ2に接続さ
れる光ファイバと、半導体レーザーダイオードチップ1
の後方出射光をモニタするためのモニタ用フォトダイオ
ード3と、温度センサとして半導体レーザーダイオード
チップ1周辺の温度を検出するためのサーミスタ5と
が、金属製基板4の上面にソルダ或いはろう付等にて固
定されている。さらにこれら固定物、特に半導体レーザ
ーダイオードチップ1を冷却し一定温度に制御するため
に、金属製基板4の下面に電子冷却器6が配置され、電
子冷却器6の放熱側すなわち下側に放熱板7が取付けて
あり、電子冷却器6の上面の配置物から吸熱した熱が放
熱板7により外気へ放出される様になっている。
2. Description of the Related Art As shown in FIG. 5, a conventional semiconductor laser device has a semiconductor laser diode chip 1 and a lens for efficiently optically coupling oscillation light from the semiconductor laser diode chip 1 into an optical fiber. A lens holder 2, an optical fiber (not shown) connected to the lens holder 2, and a semiconductor laser diode chip 1
A monitoring photodiode 3 for monitoring the backward emission light of the, and a thermistor 5 for detecting the temperature around the semiconductor laser diode chip 1 as a temperature sensor are used for soldering or brazing on the upper surface of the metal substrate 4. It is fixed. Further, in order to cool these fixed objects, particularly the semiconductor laser diode chip 1, and control them at a constant temperature, an electronic cooler 6 is arranged on the lower surface of the metal substrate 4, and a heat radiating plate is provided on the heat radiating side of the electronic cooler 6, that is, on the lower side. 7 is attached, and the heat absorbed from the arrangement on the upper surface of the electronic cooler 6 is radiated to the outside air by the heat dissipation plate 7.

【0003】この半導体レーザー装置は金属製基板とレ
ンズホルダが別体に構成した例であるが、金属製基板と
レンズホルダとを一体に構成して上記構造を実現したモ
ジュール型の半導体レーザー装置もある。この例を図6
(a),(b),(c)、図7(a),(b),(c)
に示す。なお、図6(a)は上面図、図6(b)は側面
図、図6(c)は下面図、図7(a),(b),(c)
はそれぞれ、パッケージ側板を取りはずして見た後面
図、側面図、正面図である。レンズホルダと一体化した
金属製基板4の上面に半導体レーザーダイオードチップ
1とモニタ用フォトダイオード3と、図示してはいない
がサーミスタとが金一錫(Au−Sn)等のソルダによ
って固定されており、金属製基板4に光の入出力に対し
一方向性の機能を有した光アイソレータ8が固定され、
更に光アイソレータ8に光ファイバ9に接続されること
により光結合系が金属製基板4の上面に形成されてい
る。金属製基板4上の半導体レーザーダイオードチップ
1近傍の温度を一定の温度に制御するために、サーミス
タによって温度を検出し、半導体レーザー装置外部に構
築された温度制御回路により電子冷却器6を駆動させる
と電子冷却器6の上面で吸熱された熱は電子冷却器6の
下面に輸送され、半導体レーザー装置のパッケージの一
部である放熱板7から外部へ放射される。
This semiconductor laser device is an example in which the metal substrate and the lens holder are separately formed, but a module type semiconductor laser device in which the above structure is realized by integrally forming the metal substrate and the lens holder is also available. is there. This example is shown in FIG.
(A), (b), (c), FIG. 7 (a), (b), (c)
Shown in. 6A is a top view, FIG. 6B is a side view, FIG. 6C is a bottom view, and FIGS. 7A, 7B, and 7C.
FIG. 4A is a rear view, a side view, and a front view, respectively, in which a package side plate is removed and viewed. The semiconductor laser diode chip 1, the monitor photodiode 3, and a thermistor (not shown) are fixed to the upper surface of the metal substrate 4 integrated with the lens holder by a solder such as gold-tin (Au-Sn). An optical isolator 8 having a unidirectional function for inputting and outputting light is fixed to the metal substrate 4.
Further, an optical coupling system is formed on the upper surface of the metal substrate 4 by connecting the optical isolator 8 to the optical fiber 9. In order to control the temperature in the vicinity of the semiconductor laser diode chip 1 on the metal substrate 4 to a constant temperature, the temperature is detected by a thermistor, and the electronic cooler 6 is driven by a temperature control circuit built outside the semiconductor laser device. The heat absorbed by the upper surface of the electronic cooler 6 is transported to the lower surface of the electronic cooler 6 and radiated to the outside from the heat dissipation plate 7 which is a part of the package of the semiconductor laser device.

【0004】近年、半導体レーザー装置の薄型化の要求
が高まり、高さhを8mm以下程度にするために、レン
ズ結合系の薄型化及び電子冷却器6の薄型化が図られて
いるが、前者はレンズ径によって決まるレンズホルダ寸
法によって制限され、後者は冷却能力を維持するために
必要なペルチェ素子寸法によって制限されるため、半導
体レーザー装置全体としての大幅な薄型化は困難であっ
た。これを解決するための半導体レーザー装置が特開平
2−299281号公報に記載されている。図8
(a),(b)及び図9(a),(b)にその概略図を
示す。これは、図9(a),(b)に示すように、金属
製基板4が凹型に成形されており、図8(a),(b)
に示すように、半導体レーザーダイオード1,モニタ用
フォトダイオード3,レンズ等が凹みの部分に配置さ
れ、金属製基板4は2つの電子冷却器6によってささえ
られる構造になっているため、金属製基板4の下面位置
が電子冷却器6の上面位置よりも下になるため、その分
だけ薄型化が図れる様になっている。なお図8(a)は
側面断面図、図8(b)は図8(a)のA−A′線で矢
印方向に見た図である。また図9(a),(b)はそれ
ぞれ異なる態様の金属製基板4の斜視図である。
In recent years, there has been an increasing demand for thinner semiconductor laser devices, and in order to reduce the height h to about 8 mm or less, the lens coupling system and the electronic cooler 6 have been made thinner. Is limited by the size of the lens holder determined by the lens diameter, and the latter is limited by the size of the Peltier element required to maintain the cooling capacity, so it has been difficult to make the semiconductor laser device as a whole thin. A semiconductor laser device for solving this is disclosed in Japanese Patent Laid-Open No. 2-299281. Figure 8
9A and 9B and FIGS. 9A and 9B show schematic diagrams thereof. As shown in FIGS. 9 (a) and 9 (b), this is because the metal substrate 4 is formed in a concave shape, as shown in FIGS.
As shown in FIG. 3, the semiconductor laser diode 1, the monitor photodiode 3, the lens, etc. are arranged in the recessed portion, and the metal substrate 4 has a structure supported by the two electronic coolers 6. Since the lower surface position of 4 is lower than the upper surface position of the electronic cooler 6, the thickness can be reduced accordingly. Note that FIG. 8A is a side sectional view, and FIG. 8B is a view as seen in the direction of the arrow along the line AA ′ in FIG. 9 (a) and 9 (b) are perspective views of the metal substrates 4 of different modes.

【0005】[0005]

【発明が解決しようとする課題】従来の半導体レーザー
装置は、半導体レーザーダイオードチップと、モニタ用
フォトダイオードと、サーミスタと、レンズを用いた光
学結合系とが金属製基板上に配置され、更に金属製基板
下に電子冷却器が配置された構造になっているため、こ
の半導体レーザー装置を薄型化するためには、(1)金
属製基板を含む上部配置物、特にレンズ及びレンズホル
ダの薄型化、(2)電子冷却器の薄型化の両方が必要で
ある。しかし、(1)については、半導体レーザーダイ
オードチップの放射角、レンズの焦点距離・形状・増倍
率等を考慮し、光学設計上高結合効率を達成するために
は、適切な径を有するレンズを固定するためのレンズホ
ルダ径は、製造上のバラツキを考慮すると、約3mm以
上が必要であり、このレンズホルダを有する金属製基板
の高さは、放熱性を考慮するとレンズホルダの高さを合
わせて4〜5mm程度の高さが必要となる。一方、
(2)については、電子冷却器の構成部材であるセラミ
ック板及びペルチェ素子を薄くする必要があるが、電子
冷却器上面と下面の温度差による電子冷却器自身へのス
トレスが大きくなる上に、冷却能力が低下するため、信
頼性及び高冷却能力を確保するためには、電子冷却器の
高さは現在のところ約1.65mm以下にできない。従
って、従来の構造では、パッケージ放熱板厚、電子冷却
器高さ、レンズホルダ込の金属製基板高さ、及びパッケ
ージ筐体を合せると、半導体レーザー装置の高さは約8
mmが限度となり、それ以下の高さにするのは困難であ
る。
In a conventional semiconductor laser device, a semiconductor laser diode chip, a monitor photodiode, a thermistor, and an optical coupling system using a lens are arranged on a metal substrate, and further a metal substrate is used. Since the electronic cooler is arranged under the substrate to be manufactured, in order to reduce the thickness of this semiconductor laser device, (1) the upper arrangement including the metal substrate, in particular, the lens and the lens holder are reduced in thickness. (2) It is necessary to make the electronic cooler thinner. However, regarding (1), in consideration of the radiation angle of the semiconductor laser diode chip, the focal length, shape, and multiplication factor of the lens, in order to achieve high coupling efficiency in optical design, a lens with an appropriate diameter should be used. The diameter of the lens holder for fixing should be about 3 mm or more in consideration of manufacturing variations. The height of the metal substrate having this lens holder should match the height of the lens holder in consideration of heat dissipation. Therefore, a height of about 4 to 5 mm is required. on the other hand,
Regarding (2), it is necessary to thin the ceramic plate and the Peltier element, which are the constituent members of the electronic cooler, but the stress on the electronic cooler itself increases due to the temperature difference between the upper surface and the lower surface of the electronic cooler. Since the cooling capacity decreases, the height of the electronic cooler cannot be set to about 1.65 mm or less at present in order to secure reliability and high cooling capacity. Therefore, in the conventional structure, the height of the semiconductor laser device is about 8 when the package heat dissipation plate thickness, the electronic cooler height, the metal substrate height including the lens holder, and the package housing are combined.
mm is the limit, and it is difficult to make the height less than that.

【0006】又、特開平2−299281号公報記載の
構造にすると、半導体レーザー装置の高さを上述従来構
造のものより更に1mm程度低くできると推測される
が、金属製基板が薄く凹型形状になっているため、半導
体レーザーダイオードは電子冷却器の発熱部の近くに位
置すると共に、半導体レーザーダイオードチップから電
子冷却器上面までの放熱経路が長く狭いため、電子冷却
器の冷却能力が低下するという欠点を有している。又、
半導体レーザー装置の高さは7mm程度にまではできる
と考えられるが、この構造でそれ以下にするのは困難で
ある。
Further, it is presumed that the height of the semiconductor laser device can be made lower by about 1 mm than that of the above-mentioned conventional structure if the structure described in JP-A-2-299281 is used, but the metal substrate has a thin concave shape. Therefore, the semiconductor laser diode is located near the heat generation part of the electronic cooler, and the heat dissipation path from the semiconductor laser diode chip to the top surface of the electronic cooler is long and narrow, which reduces the cooling capacity of the electronic cooler. It has drawbacks. or,
It is considered that the height of the semiconductor laser device can be as high as about 7 mm, but it is difficult to make it less than this with this structure.

【0007】[0007]

【課題を解決するための手段】本発明の半導体レーザー
装置は、図1に示す様に、半導体レーザーダイオードチ
ップ1と、光結合系の一部であるレンズを有するレンズ
ホルダ2と、モニタ用フォトダイオード3と、サーミス
タ5とが、金属製基板4の同一面上に配置され、更に同
一面上に電子冷却器6の吸熱側が接着する様に配置さ
れ、電子冷却器6の放熱側に放熱板7が配置された構造
となっている。
As shown in FIG. 1, a semiconductor laser device of the present invention includes a semiconductor laser diode chip 1, a lens holder 2 having a lens which is a part of an optical coupling system, and a monitor photo. The diode 3 and the thermistor 5 are arranged on the same surface of the metal substrate 4, and the heat absorption side of the electronic cooler 6 is bonded on the same surface, and the heat dissipation plate is arranged on the heat dissipation side of the electronic cooler 6. 7 is arranged.

【0008】[0008]

【実施例】本発明について図面を参照して説明する。本
発明の第1の実施例を図1に示す。この半導体レーザー
装置は、金属製基板4の上面にレンズを収納したレンズ
ホルダ2、半導体レーザーダイオードチップ1、モニタ
用フォトダイオード3がこの順序で1列に設置され、さ
らに半導体レーザーダイオードチップ1に隣接してサー
ミスタ5が設置され、モニタ用フォトダイオード後方に
電子冷却器6が設置されている。電子冷却器6は吸熱側
を金属製基板4に接着・固定され、上方の放熱側に放熱
板7が接着・固定されている。放熱板7は、図1に示す
ように、放熱フィンが電子冷却器後方に位置するように
設置され、半導体レーザー装置の高さが低くなるよう配
慮されている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described with reference to the drawings. A first embodiment of the present invention is shown in FIG. In this semiconductor laser device, a lens holder 2 in which a lens is housed on an upper surface of a metal substrate 4, a semiconductor laser diode chip 1, and a monitor photodiode 3 are installed in a row in this order, and further adjacent to the semiconductor laser diode chip 1. Then, the thermistor 5 is installed, and the electronic cooler 6 is installed behind the monitor photodiode. The heat sink side of the electronic cooler 6 is adhered and fixed to the metal substrate 4, and the heat dissipation plate 7 is adhered and fixed to the upper heat dissipation side. As shown in FIG. 1, the heat dissipation plate 7 is installed so that the heat dissipation fins are located behind the electronic cooler, and the height of the semiconductor laser device is reduced.

【0009】このように本発明の半導体レーザー装置は
金属製基板の同一面上にレンズホルダ、半導体レーザー
ダイオードチップ、モニタ用フォトダイオード、電子冷
却器が配置されているため、従来に比べて薄型化が実現
できる。
As described above, since the semiconductor laser device of the present invention has the lens holder, the semiconductor laser diode chip, the monitor photodiode, and the electronic cooler arranged on the same surface of the metal substrate, it is thinner than the conventional one. Can be realized.

【0010】第2の実施例を図3(a),(b),
(c)に示す。同図(b)は側面透過図を示し、同図
(a)は電子冷却器6からファイバー9の方向にみた透
過図を示し、同図(c)は同図(a)の逆方向からみた
透過図である。この実施例は、金属製基板とレンズホル
ダとが一体に構成されたモジュール型の半導体レーザー
装置の例である。図3の半導体レーザー装置に用いてい
る金属製基板4の詳細図を図2(a),(b),(c)
に示す。図2(a)は上面図、図2(b)は側面図、図
2(c)は下面図である。金属製基板4は、図2に示す
ように、レンズホルダ2と一体に形成され、半導体レー
ザー装置の構成要素である半導体レーザーダイオードチ
ップ1と、モニタ用フォトダイオード3と、サーミスタ
5とが金属製基板下面(レンズホルダが形成されている
面)に配置され、更にモニタ用フォトダイオード設置領
域後方の同下面に電子冷却器搭載部11を有している。
図3に示すように、金属製基板4の電子冷却搭載部11
の面に、電子冷却器6の吸熱側を接着固定させ、電子冷
却器6の放熱側をパッケージの放熱板7に接着固定させ
ることにより、本発明の半導体レーザー装置が実現でき
る。金属製基板下面に配置された半導体レーザーダイオ
ードチップ1と、モニタ用フォトダイオード3と、サー
ミスタ5の電極は、金属製基板4にろう付によって取付
けられたセラミック基板10の配線パターン12上に引
き出されるようになっている。従って、図3のモジュー
ル型の半導体レーザー装置は、放熱板7の厚さ0.5m
m、電子冷却器6の高さ1.65mm、金属製基板厚を
放熱性を考慮して2〜3mmにすれば、全体の高さは
5.5mm以下にすることができる。又、電子冷却器6
の高信頼性及び高冷却能力を確保するため、電子冷却器
6の高さを2.1mm程度にまで高くしても、半導体レ
ーザー装置全体の高さは6mm以下にすることができ、
従来に比べ薄型化される。
The second embodiment is shown in FIGS. 3 (a), 3 (b),
It shows in (c). The same figure (b) shows the side view, the same figure (a) shows the view seen from the electronic cooler 6 toward the fiber 9, and the same figure (c) looks from the opposite direction of the same figure (a). FIG. This embodiment is an example of a module type semiconductor laser device in which a metal substrate and a lens holder are integrally formed. 2A, 2B, and 2C are detailed diagrams of the metal substrate 4 used in the semiconductor laser device of FIG.
Shown in. 2A is a top view, FIG. 2B is a side view, and FIG. 2C is a bottom view. As shown in FIG. 2, the metal substrate 4 is formed integrally with the lens holder 2, and the semiconductor laser diode chip 1, which is a component of the semiconductor laser device, the monitor photodiode 3, and the thermistor 5 are made of metal. The electronic cooler mounting portion 11 is provided on the lower surface of the substrate (the surface on which the lens holder is formed) and further on the lower surface behind the monitor photodiode installation area.
As shown in FIG. 3, the electronic cooling mounting portion 11 of the metal substrate 4 is provided.
The semiconductor laser device of the present invention can be realized by adhering and fixing the heat absorbing side of the electronic cooler 6 and the heat radiating side of the electronic cooler 6 to the heat radiating plate 7 of the package. The semiconductor laser diode chip 1 arranged on the lower surface of the metal substrate, the monitor photodiode 3, and the electrodes of the thermistor 5 are drawn out onto the wiring pattern 12 of the ceramic substrate 10 attached to the metal substrate 4 by brazing. It is like this. Therefore, in the module type semiconductor laser device of FIG. 3, the thickness of the heat dissipation plate 7 is 0.5 m.
m, the height of the electronic cooler 6 is 1.65 mm, and if the thickness of the metal substrate is set to 2 to 3 mm in consideration of heat dissipation, the total height can be set to 5.5 mm or less. In addition, electronic cooler 6
In order to ensure high reliability and high cooling capacity, even if the height of the electronic cooler 6 is increased to about 2.1 mm, the height of the entire semiconductor laser device can be 6 mm or less,
It is thinner than before.

【0011】本発明の半導体レーザー装置の第3の実施
例を図4(a),(b)に示す。図4(a)は側板を取
りはずして見た後面図、図4(b)は(a)のA−A′
線で切断した断面図である。図3のモジュール型半導体
レーザー装置では、電子冷却器6にて冷却すべき半導体
レーザーダイオードチップ1が電子冷却器6の吸熱側面
の真上に位置していないため、半導体レーザーダイオー
ドチップ1−金属製基板4−電子冷却器6の吸熱側面間
の熱抵抗が大きくなり、放熱性がやや劣るために、全体
としての冷却能力がやや低下してしまう。そこで、第3
の実施例は、図4に示す如く、電子冷却器6を2個用い
て、その間に半導体レーザーダイオードチップ1を各々
の電子冷却器に最も近い位置(2つの電子冷却器の中
央)である金属製基板4の下面に配置して、図3に示す
モジュール型半導体レーザー装置と同じ高さでさらに冷
却能力を上げた構造となっている。この他の部分は第2
の実施例と同じである。
A third embodiment of the semiconductor laser device of the present invention is shown in FIGS. 4 (a) and 4 (b). FIG. 4 (a) is a rear view with the side plate removed, and FIG. 4 (b) is A-A 'in (a).
It is sectional drawing cut | disconnected by the line. In the module type semiconductor laser device of FIG. 3, since the semiconductor laser diode chip 1 to be cooled by the electronic cooler 6 is not located right above the heat absorption side surface of the electronic cooler 6, the semiconductor laser diode chip 1-metal Since the thermal resistance between the substrate 4 and the heat-absorbing side surface of the electronic cooler 6 becomes large and the heat dissipation is slightly inferior, the cooling capacity as a whole is slightly lowered. Therefore, the third
In the embodiment of the present invention, as shown in FIG. 4, two electronic coolers 6 are used, and the semiconductor laser diode chip 1 is placed between them at the position closest to each electronic cooler (the center of the two electronic coolers). It is arranged on the lower surface of the substrate 4 and has the same height as the module type semiconductor laser device shown in FIG. The other part is the second
Is the same as the embodiment described above.

【0012】又、本発明の半導体レーザー装置は、上記
実施例以外にも、表面実装型の半導体レーザー装置とし
ての実施も可能である。
Further, the semiconductor laser device of the present invention can be embodied as a surface mount type semiconductor laser device other than the above embodiment.

【0013】[0013]

【発明の効果】以上説明したように、本発明の半導体レ
ーザー装置は、半導体レーザーダイオードチップと、半
導体レーザーダイオードチップからの発振光を光ファイ
バに光学結合させるためのレンズを有したレンズホルダ
と、モニタ用フォトダイオードと、温度センサとしての
サーミスタ素子と、温度制御用の電子冷却器とが、同一
の金属基板面側に配置した構造になっているので薄型化
できるという効果を有する。
As described above, the semiconductor laser device of the present invention comprises a semiconductor laser diode chip, a lens holder having a lens for optically coupling oscillation light from the semiconductor laser diode chip to an optical fiber, Since the monitor photodiode, the thermistor element as the temperature sensor, and the temperature control electronic cooler are arranged on the same metal substrate surface side, there is an effect that the thickness can be reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の半導体レーザー装置の第1の実施例の
斜視図。
FIG. 1 is a perspective view of a first embodiment of a semiconductor laser device of the present invention.

【図2】本発明の第2の実施例に使用する金属製基板を
示す図。
FIG. 2 is a diagram showing a metal substrate used in a second embodiment of the present invention.

【図3】本発明の第2の実施例を示す図。FIG. 3 is a diagram showing a second embodiment of the present invention.

【図4】本発明の第3の実施例を示す図。FIG. 4 is a diagram showing a third embodiment of the present invention.

【図5】従来の半導体レーザー装置の斜視図。FIG. 5 is a perspective view of a conventional semiconductor laser device.

【図6】従来のモジュール型半導体レーザー装置に使用
する金属製基板を示す図。
FIG. 6 is a view showing a metal substrate used in a conventional module type semiconductor laser device.

【図7】従来のモジュール型半導体レーザー装置を示す
図。
FIG. 7 is a diagram showing a conventional module type semiconductor laser device.

【図8】特開平2−299281号公報記載の半導体レ
ーザー装置を示す図。
FIG. 8 is a diagram showing a semiconductor laser device described in Japanese Patent Laid-Open No. 2-299281.

【図9】特開平2−299291号公報記載の半導体レ
ーザー装置に使用する金属製基板の斜視図。
FIG. 9 is a perspective view of a metal substrate used in the semiconductor laser device described in JP-A-2-299291.

【符号の説明】[Explanation of symbols]

1 半導体レーザーダイオードチップ 2 レンズホルダ 3 モニタ用フォトダイオード 4 金属製基板 5 サーミスタ 6 電子冷却器 7 放熱板 8 光アイソレータ 9 ファイバー 10 セラミック基板 11 電子冷却器搭載部 12 配線パターン 13 パッケージリード 1 Semiconductor Laser Diode Chip 2 Lens Holder 3 Monitor Photodiode 4 Metal Substrate 5 Thermistor 6 Electronic Cooler 7 Heat Sink 8 Optical Isolator 9 Fiber 10 Ceramic Substrate 11 Electronic Cooler Mount 12 Wiring Pattern 13 Package Lead

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 半導体レーザーダイオードチップと、該
半導体レーザーダイオードチップからの発振光を光ファ
イバに光学結合させるためのレンズを有したレンズホル
ダと、半導体レーザーダイオードチップからの後方出射
光を受光するモニタ用フォトダイオードと、温度センサ
としてのサーミスタと、温度制御用の電子冷却器とが、
同一の金属基板面上に配置された構造を少くとも有する
ことを特徴とする半導体レーザー装置。
1. A semiconductor laser diode chip, a lens holder having a lens for optically coupling oscillation light from the semiconductor laser diode chip to an optical fiber, and a monitor for receiving backward emission light from the semiconductor laser diode chip. Photodiode, a thermistor as a temperature sensor, and an electronic cooler for temperature control,
A semiconductor laser device characterized by having at least a structure arranged on the same metal substrate surface.
JP5152548A 1993-06-24 1993-06-24 Semiconductor laser device Expired - Fee Related JP2546146B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5152548A JP2546146B2 (en) 1993-06-24 1993-06-24 Semiconductor laser device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5152548A JP2546146B2 (en) 1993-06-24 1993-06-24 Semiconductor laser device

Publications (2)

Publication Number Publication Date
JPH0715091A true JPH0715091A (en) 1995-01-17
JP2546146B2 JP2546146B2 (en) 1996-10-23

Family

ID=15542875

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5152548A Expired - Fee Related JP2546146B2 (en) 1993-06-24 1993-06-24 Semiconductor laser device

Country Status (1)

Country Link
JP (1) JP2546146B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6791150B2 (en) 2001-12-27 2004-09-14 Mitsubishi Denki Kabushiki Kaisha Optical module and optical transceiver apparatus
JP4965781B2 (en) * 1999-09-02 2012-07-04 インテル・コーポレーション Double enclosure optoelectronic package
JP2018195752A (en) * 2017-05-19 2018-12-06 住友電気工業株式会社 Light emitting device
CN113867448A (en) * 2021-10-27 2021-12-31 北京工业大学 Temperature control device of nonlinear optical crystal

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02299281A (en) * 1989-05-15 1990-12-11 Fujitsu Ltd Laser module structure

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02299281A (en) * 1989-05-15 1990-12-11 Fujitsu Ltd Laser module structure

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4965781B2 (en) * 1999-09-02 2012-07-04 インテル・コーポレーション Double enclosure optoelectronic package
US6791150B2 (en) 2001-12-27 2004-09-14 Mitsubishi Denki Kabushiki Kaisha Optical module and optical transceiver apparatus
JP2018195752A (en) * 2017-05-19 2018-12-06 住友電気工業株式会社 Light emitting device
CN113867448A (en) * 2021-10-27 2021-12-31 北京工业大学 Temperature control device of nonlinear optical crystal

Also Published As

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