JPH07147149A - Flat plate image display device and its manufacture - Google Patents

Flat plate image display device and its manufacture

Info

Publication number
JPH07147149A
JPH07147149A JP29309293A JP29309293A JPH07147149A JP H07147149 A JPH07147149 A JP H07147149A JP 29309293 A JP29309293 A JP 29309293A JP 29309293 A JP29309293 A JP 29309293A JP H07147149 A JPH07147149 A JP H07147149A
Authority
JP
Japan
Prior art keywords
electron beam
display device
image display
electron
crystallized
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP29309293A
Other languages
Japanese (ja)
Inventor
Masaki Ikeda
正樹 池田
Yasuo Mizuno
康男 水野
Haruhiko Handa
晴彦 半田
Akihiko Yoshida
昭彦 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP29309293A priority Critical patent/JPH07147149A/en
Publication of JPH07147149A publication Critical patent/JPH07147149A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To provide a display device using electron beams Which is excellent in life characteristic by constituting a holder for linear cathode from a metal base and an electric insulating layer of crystallized hyaline in which at least a MgO crystal phase is precipitated on the metal base. CONSTITUTION:A flat type image display device has linear beam sources 3, electron beam taking means 5, 6, 7, an electron beam control means 8, electron beam polarizing means 9, 10, and a light emitting means 11. A linear cathode holder 4 for fixing and positioning the linear beam sources 3 arranged in a plurality of lines is formed of an electric insulating base, and the electric insulating base is formed of a metal base 12 and an electric insulating layer 14 of crystallized hyaline in which at least a MgO crystal phase is precipitated on the metal base 12.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、平面な電子源から放出
される電子ビームを電子ビーム制御電極によって制御
し、加速して蛍光体面上に射突させ画像表示する平板型
画像表示装置及びその製造法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a flat plate type image display device for displaying an image by controlling an electron beam emitted from a flat electron source by an electron beam control electrode and accelerating and projecting it onto a phosphor surface. Regarding manufacturing method.

【0002】[0002]

【従来の技術】テレビに代表されるAVとパソコンに代
表されるOAの分野において、ディスプレイ新時代を迎
えて、その要求に応える新しいディスプレイの開発が求
められている。例えば、ラップトップパソコンやワープ
ロに見られる個人用/家庭用の情報機器においては、視
認性の良い大画面でありながら、薄型、軽量のディスプ
レイが要求されている。従来、マトリックス型平板状の
表示装置として、EL、プラズマ、液晶等を用いた装置
が開発されているが、輝度、発光効率、カラー表示、大
型化などの点において、一長一短があり、どれも主力方
式になっていない。一方、上記課題を解決できる方式と
期待される電子ビームを用いた平板状画像表示装置を構
成する試みがなされている。しかしながら、未だ実用化
されていない。
2. Description of the Related Art In the fields of AV typified by televisions and OA typified by personal computers, a new era of displays is approaching, and there is a demand for the development of new displays to meet the demand. For example, in personal / household information devices found in laptop computers and word processors, thin and lightweight displays are required while having large screens with good visibility. Conventionally, devices using EL, plasma, liquid crystal, etc. have been developed as matrix type flat panel display devices, but they have advantages and disadvantages in terms of brightness, luminous efficiency, color display, large size, etc. It is not a method. On the other hand, attempts have been made to construct a flat image display device using an electron beam, which is expected to be a method capable of solving the above problems. However, it has not yet been put to practical use.

【0003】[0003]

【発明が解決しょうとする課題】従来の電子ビームを用
いた平板状画像表示装置の基本的な構成例を図2に示し
て説明する。この表示素子は、後方から前方に向かって
順に背面容器1、電子ビームを制御する背面電極2、ビ
ーム源としての線陰極3、線陰極を固定位置決めする線
陰極用ホールダー4、電子ビームを加速するグリッド電
極5、6、7、8、電子ビームを偏向する水平偏向電極
9、垂直偏向電極10、および電子ビームの衝突により
発光するスクリーン11が配置されて構成されており、
これらが偏平なガラスバルブの真空になされた内部に収
納されている。ここで、線陰極3はタングステンにBa
SrCa(CO32が被覆されている。また、線陰極用
ホールダー4にアルミナセラミックス基板が用いられて
いる。
A basic configuration example of a conventional flat plate image display device using an electron beam will be described with reference to FIG. This display device has a back container 1, a back electrode 2 for controlling an electron beam, a line cathode 3 as a beam source, a line cathode holder 4 for fixing and positioning the line cathode, and an electron beam accelerated in this order from the rear to the front. Grid electrodes 5, 6, 7, and 8, a horizontal deflection electrode 9 that deflects an electron beam, a vertical deflection electrode 10, and a screen 11 that emits light by collision of an electron beam are arranged.
These are housed inside the evacuated interior of a flat glass bulb. Here, the wire cathode 3 is made of tungsten and Ba.
SrCa (CO 3 ) 2 is coated. An alumina ceramics substrate is used for the wire cathode holder 4.

【0004】ところで、画像表示装置のオン−オフ時に
線陰極が振動する。これを繰り返し行うと、線陰極が摩
耗し、ついには線陰極が断線する現象が見られる。この
理由は、タングステンのビッカース硬度が700に対
し、アルミナ基板4が1500と高いため、両者の摩耗
では硬度の低いタングステン線が断線するためである。
By the way, the line cathode vibrates when the image display device is turned on and off. When this is repeated, there is a phenomenon that the wire cathode is worn and finally the wire cathode is broken. The reason for this is that the Vickers hardness of tungsten is 700 and the alumina substrate 4 is as high as 1500, and the tungsten wire with low hardness is broken due to wear of both.

【0005】すなわち、従来の平板型画像装置は寿命特
性に課題がある。
That is, the conventional flat panel image device has a problem in life characteristics.

【0006】本発明は、従来の平板型画像表示装置の課
題を考慮し、寿命特性に優れた電子ビームを用いた平板
状画像表示装置を提供することを目的とする。
An object of the present invention is to provide a flat image display device using an electron beam having excellent life characteristics in consideration of the problems of the conventional flat image display device.

【0007】[0007]

【課題を解決するための手段】本発明の平板型画像表示
装置の線陰極用ホルダーは、金属基板と、金属基板上に
少なくとも、MgO系の結晶相を析出した結晶化ガラス
質の電気絶縁層とで構成されたものである。
A holder for a line cathode of a flat panel image display device according to the present invention comprises a metal substrate and a crystalline glass vitreous electric insulating layer in which at least a MgO-based crystal phase is deposited on the metal substrate. It is composed of and.

【0008】[0008]

【作用】上記構成にすることにより、従来に比べ、寿命
特性に優れた電子ビームを用いた平板状画像表示装置を
提供することができる。
With the above structure, it is possible to provide a flat-panel image display device using an electron beam, which is superior in life characteristics to the conventional one.

【0009】[0009]

【実施例】以下、本発明の実施例について図面を参照し
て説明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0010】本発明の一実施例にかかる平板型画像表示
装置は、図2に示すように、複数列に配置された線状の
ビーム源3と、その電子源3から電子ビームを取り出す
ための電子ビーム取り出し手段5、6、7と、前記複数
列に配置された線状電子源と交差した方向に配列された
電子ビームを制御するための電子ビーム制御手段8とそ
の電子ビームを偏向するための電子ビーム偏向手段9、
10と、電子ビームの射突により発光する発光手段11
とを備え、前記ビーム源3を固定、位置決めする線陰極
ホルダー4が電気絶縁性基板であって、その電気絶縁性
基板は金属基板12と、金属基板12上に少なくとも、
MgO系の結晶相を析出した結晶化ガラス質の電気絶縁
層13とで構成されている。その詳細な構成は次の通り
である。 (1)金属基板 本実施例に使用される金属基板はホーロ用鋼板、ステン
レス鋼板、珪素鋼板、ニッケルークロムー鉄、ニッケル
ー鉄、コバール、インバーなどの各種合金、クラッド材
などが選択される。
As shown in FIG. 2, the flat panel image display apparatus according to one embodiment of the present invention is provided with linear beam sources 3 arranged in a plurality of rows and an electron beam for extracting the electron beams from the electron sources 3. Electron beam extraction means 5, 6, 7 and electron beam control means 8 for controlling an electron beam arranged in a direction intersecting the linear electron sources arranged in the plurality of rows and for deflecting the electron beam. Electron beam deflecting means 9 of
10 and a light emitting means 11 for emitting light by electron beam bombardment
And a wire cathode holder 4 for fixing and positioning the beam source 3 is an electrically insulating substrate, and the electrically insulating substrate is a metal substrate 12, and at least on the metal substrate 12,
It is composed of a crystallized vitreous electric insulating layer 13 in which a MgO-based crystal phase is deposited. The detailed structure is as follows. (1) Metal Substrate The metal substrate used in this embodiment is selected from various types of alloys such as hollow steel plates, stainless steel plates, silicon steel plates, nickel-chromium-iron, nickel-iron, kovar, invar, and clad materials.

【0011】基材材質が決定されれば、所望の形状加
工、穴加工等が通常の機械加工、エッチング加工、レー
ザ加工等で施される これら金属基板はホーロ層の密着性を向上させる目的
で、表面脱脂された後、ニッケル、コバルトなどの各種
メッキを施したり、熱酸化処理によって酸化被覆層を形
成したりする。 (2)電気絶縁層 電気絶縁層の電気絶縁性、耐熱性の観点から、本発明に
用いられるガラス質層は無アルカリ結晶化ガラス(焼成
によって、少なくとも、2MgO・B23の結晶相を析
出)で構成されるほうが好ましい。そのガラス組成は、
例えば SiO2 7〜23重量% B23 10〜34重量% MgO 16〜50重量% CaO 0〜20重量% BaO 0〜50重量% ZrO2 0〜5 重量% P25 0〜5 重量% La23 0〜40重量% の組成である。この様に、上記組成範囲のガラス質層が
選択される理由は、後述する線陰極の加熱による、耐熱
性要求があるからである。
Once the material of the base material is determined, the desired shape processing, hole processing, etc. are performed by ordinary mechanical processing, etching processing, laser processing, etc. These metal substrates are used for the purpose of improving the adhesion of the holo layer. After the surface is degreased, various platings such as nickel and cobalt are applied, or an oxide coating layer is formed by thermal oxidation treatment. (2) Electrical Insulation Layer From the viewpoint of electrical insulation and heat resistance of the electrical insulation layer, the vitreous layer used in the present invention is a non-alkali crystallized glass (when fired, a crystalline phase of at least 2MgO.B 2 O 3 is formed. It is preferable to be composed of (precipitation). Its glass composition is
For example SiO 2 7 to 23 wt% B 2 O 3 10~34 wt% MgO 16 to 50 wt% CaO 0 to 20 wt% BaO 0 to 50 wt% ZrO 2 0 to 5 wt% P 2 O 5 0~5 wt % La 2 O 3 0 to 40 wt% composition. The reason why the vitreous layer having the above composition range is selected is that there is a demand for heat resistance due to heating of the wire cathode described later.

【0012】さらに、上記結晶化ガラス質を金属基板上
に被覆する方法として、通常のスプレー法、粉末静電塗
装法、電気泳動電着法等がある。被膜のち密性、電気絶
縁性等の観点から、電気泳動電着法が、最も好ましい。
Further, as a method for coating the above-mentioned crystallized glass on a metal substrate, there are a usual spray method, a powder electrostatic coating method, an electrophoretic electrodeposition method and the like. The electrophoretic electrodeposition method is the most preferable from the viewpoint of the denseness of the coating film, the electric insulation property, and the like.

【0013】この方法は、ガラスとアルコールおよび少
量の水を入れてボールミル中で約20時間粉砕、混合
し、ガラスの平均粒径を1〜5μm程度にする。得られ
たスラリーを電解槽に入れて、液を循環する。そこで、
(1)で準備された金属基板を、このスラリー中に浸漬
し、100〜400Vで陰分極させることにより、金属
基板表面にガラス粒子を析出させる。これを乾燥後、8
50〜900℃で10分〜1時間焼成する。これによっ
て、電気絶縁層が得られる。
According to this method, glass, alcohol and a small amount of water are added, and the mixture is crushed and mixed in a ball mill for about 20 hours to make the average particle diameter of glass about 1 to 5 μm. The obtained slurry is put in an electrolytic cell and the liquid is circulated. Therefore,
The metal substrate prepared in (1) is immersed in this slurry and negatively polarized at 100 to 400 V to deposit glass particles on the surface of the metal substrate. After drying this, 8
Baking is performed at 50 to 900 ° C. for 10 minutes to 1 hour. This gives an electrically insulating layer.

【0014】この電気絶縁層は焼成によって、少なくと
も、MgO系の結晶相を析出する必要がある。その理由
は図3の熱膨張曲線に示す如く、上記組成であっても、
ガラス状態(アモルファス状態)の(イ)の場合、60
0〜700℃で屈伏点を有する。しかし、これを熱処理
(焼成)し、少なくとも、MgO系の結晶相を析出させ
ると、(ロ)のように屈伏点が900℃以上となり、耐
熱性が向上する。
It is necessary that at least the MgO-based crystal phase be deposited in the electrically insulating layer by firing. The reason is as shown in the thermal expansion curve of FIG.
In the case of (a) in the glass state (amorphous state), 60
It has a yield point at 0 to 700 ° C. However, when this is heat-treated (baked) to precipitate at least the MgO-based crystal phase, the yield point becomes 900 ° C. or higher as shown in (b), and the heat resistance is improved.

【0015】次に、更に具体的に本実施例を説明する。Next, the present embodiment will be described more specifically.

【0016】(実施例1)(表1)〜(表3)に示すよ
うな、結晶化ガラスを合成し、前述の工程に従い、SU
S430基材(300mm×300mm×0.5mm)の表面
に、厚さ100μmの結晶化ガラス質層を電気泳動電着
し、880℃で10分焼成しサンプルの表面粗度、うね
り性、耐熱性等の諸特性の結果を示した。
Example 1 Crystallized glass as shown in (Table 1) to (Table 3) was synthesized, and SU was prepared according to the above-mentioned steps.
A 100 μm thick crystallized glassy layer is electrophoretically electrodeposited on the surface of S430 base material (300 mm × 300 mm × 0.5 mm) and baked at 880 ° C for 10 minutes to obtain sample surface roughness, waviness and heat resistance. The results of various characteristics such as

【0017】[0017]

【表1】 [Table 1]

【0018】[0018]

【表2】 [Table 2]

【0019】[0019]

【表3】 [Table 3]

【0020】なお、表面粗度はタリサーフ表面粗さ計で
測定し、表面中心線平均粗さRaで示し、うねり性はタ
リサーフ表面粗さ計で得られた山と谷の差Rmaxで表わし
た。
The surface roughness was measured with a Talysurf surface roughness meter and indicated by the surface center line average roughness Ra, and the waviness was expressed by the difference Rmax between the peak and the valley obtained by the Talysurf surface roughness meter.

【0021】耐熱性は、サンプルを850℃の電気炉中
に10分入れ、炉から取り出し30分間、自然放冷するサ
イクルを繰り返すスポーリングテストを行って、サンプ
ルのクラックや剥離の状態を調べた。なお、クラックは
赤インク中に浸漬し、その後、表面を拭き取って、目視
観察によって、その有無を調べた。表中の○、△、×
は、○が10サイクル以上行っても、異常が認められな
いもの、△は5〜9サイクルで発生したもの、×は4サ
イクル以下で発生したものを示す。
Regarding the heat resistance, the sample was put in an electric furnace at 850 ° C. for 10 minutes, taken out of the furnace, and allowed to cool naturally for 30 minutes. A spalling test was repeated, and the state of cracking and peeling of the sample was examined. . The cracks were immersed in the red ink, the surface was wiped off, and the presence or absence of the cracks was checked by visual observation. ○, △, × in the table
Indicates that no abnormality was observed even after 10 cycles or more, Δ indicates that the abnormality occurred in 5 to 9 cycles, and x indicates that the abnormality occurred in 4 cycles or less.

【0022】以上の評価にもとずき総合評価を行い、そ
の結果を○、△、×で示した。No1〜5は他の成分を
一定として、SiO2とB23 を変化させたもの、No
6〜12は、SiO2/B23 をほぼ一定にし、MgO
量を変化させたもの、No13〜16は同じく、CaO
量を変化させたもの。No17〜21は、同じく、Ba
O量を変化させたもの。No22〜26は、同じく、L
23量を変化させたもの。No27〜41はそれぞ
れ、ZrO2、TiO2、SnO2、P25、ZnOの影
響を示す。
Based on the above evaluations, a comprehensive evaluation was performed, and the results are shown by ◯, Δ, and x. Nos. 1 to 5 are those in which SiO 2 and B 2 O 3 are changed while keeping other components constant, No.
6 to 12 make SiO 2 / B 2 O 3 almost constant and MgO
No. 13 to 16 that changed the amount are the same as CaO.
What changed the amount. No. 17 to 21 are also Ba
The amount of O changed. No22 to 26 are also L
a The amount of 2 O 3 was changed. No27~41 respectively show the effect of ZrO 2, TiO 2, SnO 2 , P 2 O 5, ZnO.

【0023】(表1)〜(表3)から明らかなように、
SiO2を増加していけば、耐熱性は向上するが、表面
性が悪くなる。逆に、B23量を増加していけば、たし
かに表面性は向上するが、耐熱性は低下する。したがっ
て、本発明では、SiO27〜23重量%、 B23
0〜34重量%の範囲内が好ましい。
As is clear from (Table 1) to (Table 3),
If the amount of SiO 2 is increased, the heat resistance will improve, but the surface properties will deteriorate. On the contrary, if the amount of B 2 O 3 is increased, the surface property is certainly improved, but the heat resistance is decreased. Therefore, in the present invention, SiO 2 7 to 23 wt%, B 2 O 3 1
It is preferably in the range of 0 to 34% by weight.

【0024】MgO量は結晶性と相関があり、16重量
%以下では結晶析出が不十分で、耐熱性に劣る。また、
50重量%以上では、結晶析出しやすく、ガラス溶融時
に簡単に結晶化し、均質なガラスを得ることが難しい点
と表面粗度が大きくなる。
The amount of MgO has a correlation with the crystallinity, and if it is 16% by weight or less, the precipitation of crystals is insufficient and the heat resistance is poor. Also,
If it is 50% by weight or more, crystals tend to be precipitated and easily crystallize when the glass is melted, and it is difficult to obtain a homogeneous glass, and the surface roughness becomes large.

【0025】CaO量は、20重量%以上入れると、表
面性が悪くなり好ましくない。
When the amount of CaO is 20% by weight or more, the surface property is deteriorated, which is not preferable.

【0026】BaO量は、50重量%以上では、耐熱性
が劣化し好ましくない。
When the amount of BaO is 50% by weight or more, the heat resistance is deteriorated, which is not preferable.

【0027】La23量は、40重量%以上では、耐熱
性が劣化し好ましくない。
When the amount of La 2 O 3 is 40% by weight or more, heat resistance deteriorates, which is not preferable.

【0028】その他の添加可能な成分はZrO2、Ti
2、SnO2、P25、ZnOなどが挙げられるが、5
重量%以下までなら添加可能である。
Other components that can be added are ZrO 2 , Ti
O 2 , SnO 2 , P 2 O 5 , ZnO and the like can be mentioned, but 5
It can be added up to a weight% of less.

【0029】(実施例2)透孔10箇所を有したSUS
430(100mm×100mm×0.5mm)基材表面に、
実施例1、No3組成のガラスを用いて、電気泳動電着
法、スプレイ法、粉体靜電法で100μmの膜厚に形
成、焼成したサンプルを作製した。これらの透孔周辺部
の絶縁性を、絶縁耐圧計を用いて、1mAブレークダウ
ン電圧値を測定した。その結果を(表4)に示す。
(Example 2) SUS having 10 through holes
430 (100 mm x 100 mm x 0.5 mm) substrate surface,
Example 1 Using the glass of No. 3 composition, a sample was formed by electrophoretic electrodeposition, spraying, and powder electrolysis to have a film thickness of 100 μm and fired to prepare a sample. With respect to the insulation properties of these peripheral portions of the through holes, a 1 mA breakdown voltage value was measured using a withstand voltage meter. The results are shown in (Table 4).

【0030】[0030]

【表4】 [Table 4]

【0031】(表4)より明らかなように、本発明の要
件である電気泳動電着法が電気絶縁性にすぐれている。
As is clear from (Table 4), the electrophoretic electrodeposition method, which is a requirement of the present invention, is excellent in electrical insulation.

【0032】(実施例3)インバー(230mm×10mm
×5mm)基材表面に、実施例1、No3組成のガラスを
用いて、実施例1と同様な方法で陰電極ホールダーサン
プルを試作した。それを、図2に示す如く、平板型画像
表示装置に搭載した。なお、比較のために、同一形状の
アルミナ基板を用いて、同様に平板画像表示装置を試作
した。
(Embodiment 3) Invar (230 mm × 10 mm)
(5 mm) A negative electrode holder sample was experimentally manufactured in the same manner as in Example 1 by using glass having the composition of Example 1 and No3 on the surface of the substrate. It was mounted on a flat panel image display device as shown in FIG. For comparison, a flat panel image display device was similarly prototyped using alumina substrates of the same shape.

【0033】試験方法として、ビカース硬度計を用いて
それぞれのサンプルのマイクロビカース硬度の測定を行
い、平板画像装置の通電オン1分、オフ1分を1サイク
ルとして、繰り返し試験を行い、陰電極の断線に至るま
での繰り返し回数を調べた。
As a test method, the micro-Vickers hardness of each sample was measured by using a Vickers hardness meter, and repeated tests were carried out with one cycle of energization of the flat panel imager for one minute and one minute off as one cycle. The number of repetitions up to the disconnection was investigated.

【0034】これら試験結果を(表5)に示す。The results of these tests are shown in (Table 5).

【0035】[0035]

【表5】 [Table 5]

【0036】(表5)より明らかなように、本実施例の
陰電極ホールダーのビッカース硬度はタングステン陰電
極のビッカース硬度700に近似している。これによ
り、本実施例の陰電極ホールダーを用いれば、硬度差に
よる摩耗は少ないため、平板画像装置のオン−オフ試験
でも、陰電極が断線に至らない。
As is clear from Table 5, the Vickers hardness of the negative electrode holder of this embodiment is close to the Vickers hardness of 700 of the tungsten negative electrode. As a result, when the negative electrode holder of the present embodiment is used, wear due to the difference in hardness is small, and therefore the negative electrode is not broken even in the on-off test of the flat panel image device.

【0037】[0037]

【発明の効果】以上述べたところから明らかなように、
本発明の陰電極ホールダーを用いれば、従来に比べ、陰
電極の断線がなく、寿命特性に優れた電子ビームを用い
た平板状画像表示装置を提供することができる。
As is apparent from the above description,
By using the negative electrode holder of the present invention, it is possible to provide a flat image display device using an electron beam, which is free from disconnection of the negative electrode and excellent in life characteristics as compared with the conventional case.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例にかかる平板状画像表示装置
用線陰極ホールダーの構成図。
FIG. 1 is a configuration diagram of a line cathode holder for a flat image display device according to an embodiment of the present invention.

【図2】従来例の平板状画像表示装置の構成図。FIG. 2 is a configuration diagram of a conventional flat image display device.

【図3】本発明の結晶化ガラス質およびガラス質の線膨
張曲線図。
FIG. 3 is a diagram of linear expansion curves of crystallized glass and glass according to the present invention.

【符号の説明】[Explanation of symbols]

1 背面容器 2 背面電極 3 線陰極 4 線陰極ホールダー 5 グリッド電極 6 グリッド電極 7 グリッド電極 8 グリッド電極 9 水平偏向電極 10 垂直偏向電極 11 電子ビームの衝突により発光するスクリーン 12 金属基板 13 結晶化ガラス質の電気絶縁層 1 Back Container 2 Back Electrode 3 Wire Cathode 4 Wire Cathode Holder 5 Grid Electrode 6 Grid Electrode 7 Grid Electrode 8 Grid Electrode 9 Horizontal Deflection Electrode 10 Vertical Deflection Electrode 11 Screen Emitting by Electron Beam Collision 12 Metal Substrate 13 Crystallized Glass Electrical insulation layer

───────────────────────────────────────────────────── フロントページの続き (72)発明者 吉田 昭彦 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Akihiko Yoshida 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 複数列に配置された線状のビーム源と、
その電子源から電子ビームを取り出すための電子ビーム
取り出し手段と、前記複数列に配置された線状電子源と
交差した方向に配列された電子ビームを制御するための
電子ビーム制御手段とその電子ビームを偏向するための
電子ビーム偏向手段と、電子ビームの射突により発光す
る発光手段とを備えた平板型画像表示装置において、前
記ビーム源を固定、位置決めする線陰極ホルダーが、電
気絶縁性基板であって、その電気絶縁性基板は、金属基
板と、その金属基板上に少なくとも、MgO系の結晶相
を析出した結晶化ガラス質の電気絶縁層とで構成されて
いることを特徴とする平板型画像表示装置。
1. A linear beam source arranged in a plurality of rows,
Electron beam extraction means for extracting an electron beam from the electron source, electron beam control means for controlling the electron beam arranged in a direction intersecting the linear electron sources arranged in the plurality of rows, and the electron beam In a flat panel image display device provided with an electron beam deflecting means for deflecting an electron beam and a light emitting means for emitting light by electron beam bombardment, a wire cathode holder for fixing and positioning the beam source is an electrically insulating substrate. The electrically insulating substrate is composed of a metal substrate and at least a crystallized glassy electrical insulating layer in which a MgO-based crystal phase is deposited on the metal substrate. Image display device.
【請求項2】 結晶化ガラス質の電気絶縁層の主成分
が、少なくとも、重量%で、MgO;16〜50%、B
aO;0〜50%、CaO;0〜20%、La23;0
〜40%、B23;10〜34%、SiO2;7〜23
%、MO2(MはZr、Ti、Snの少なくとも1
種);0〜5%、P25;0〜5%であることを特徴と
する請求項1記載の平板型画像表示装置。
2. The crystallized vitreous electrical insulation layer comprises, as a main component, at least wt% MgO; 16-50%, B
aO; 0 to 50%, CaO; 0 to 20%, La 2 O 3 ; 0
~40%, B 2 O 3; 10~34%, SiO 2; 7~23
%, MO 2 (M is at least 1 of Zr, Ti and Sn)
Species); 0~5%, P 2 O 5; flat panel display device according to claim 1, characterized in that 0 to 5%.
【請求項3】 請求項1の前記結晶化ガラス質の電気絶
縁層を、電気泳動電着法で形成し、焼成することを特徴
とする平板型画像表示素子の製造法。
3. A method for manufacturing a flat panel image display device, comprising forming the crystallized glassy electric insulating layer according to claim 1 by an electrophoretic electrodeposition method and baking the same.
JP29309293A 1993-11-24 1993-11-24 Flat plate image display device and its manufacture Pending JPH07147149A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29309293A JPH07147149A (en) 1993-11-24 1993-11-24 Flat plate image display device and its manufacture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29309293A JPH07147149A (en) 1993-11-24 1993-11-24 Flat plate image display device and its manufacture

Publications (1)

Publication Number Publication Date
JPH07147149A true JPH07147149A (en) 1995-06-06

Family

ID=17790331

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29309293A Pending JPH07147149A (en) 1993-11-24 1993-11-24 Flat plate image display device and its manufacture

Country Status (1)

Country Link
JP (1) JPH07147149A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1667190A1 (en) * 2003-09-26 2006-06-07 Pioneer Corporation Plasma display panel and method for producing same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1667190A1 (en) * 2003-09-26 2006-06-07 Pioneer Corporation Plasma display panel and method for producing same
EP2360710A1 (en) * 2003-09-26 2011-08-24 Panasonic Corporation Plasma display panel and method of manufacturing same
EP2360709A1 (en) * 2003-09-26 2011-08-24 Panasonic Corporation Plasma display panel and method of manufacturing same
EP2369611A1 (en) * 2003-09-26 2011-09-28 Panasonic Corporation Plasma display and method of manufacturing same
EP1667190B1 (en) * 2003-09-26 2011-11-16 Panasonic Corporation Plasma display panel and method for producing same

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