JPH068801B2 - Pinhole inspection device for sealed packages - Google Patents
Pinhole inspection device for sealed packagesInfo
- Publication number
- JPH068801B2 JPH068801B2 JP62274366A JP27436687A JPH068801B2 JP H068801 B2 JPH068801 B2 JP H068801B2 JP 62274366 A JP62274366 A JP 62274366A JP 27436687 A JP27436687 A JP 27436687A JP H068801 B2 JPH068801 B2 JP H068801B2
- Authority
- JP
- Japan
- Prior art keywords
- inspected
- low
- electrodes
- high voltage
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Description
【発明の詳細な説明】 産業上の利用分野 本発明は、輸液容器やレトルト食品などのような密封包
装体のピンホール有無の検査に使用される検査装置に関
する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection device used for inspecting a sealed package such as an infusion container or a retort food for pinholes.
従来の技術とその問題点 従来輸液容器などのピンホール検査装置として、左右１
対の電極間に高周波高電圧を印加し、之等電極間に配置
された被検査体上に放電電流を生ぜしめ、この生じた放
電電流を検出して合否を判定するような方式の装置が知
られている。ところが上記従来装置は、被検査体の内容
物の比抵抗が高くなるに従って良品信号対不良品信号の
比が小さくなる傾向があり、性能的に尚満足すべきもの
でなかった。Conventional technology and its problems As a conventional pinhole inspection device for infusion containers, left and right 1
A device that applies a high-frequency high voltage between a pair of electrodes to generate a discharge current on the object to be inspected placed between the electrodes, and detects the generated discharge current to judge whether the device is acceptable or not. Are known. However, the above-mentioned conventional device tends to have a smaller ratio of the non-defective signal to the non-defective signal as the specific resistance of the content of the object to be inspected increases, and the performance is still unsatisfactory.
本発明者等は、上記従来装置の問題解決を目的として鋭
意研究を重ねた結果、電極間に印加される電圧として、
従来の高周波高電圧に代え低周波高電圧を利用するとき
は、従来装置の性能を大幅に改善し得ることを見出し、
茲に本発明を完成するに至ったものである。The present inventors, as a result of repeated studies for the purpose of solving the problems of the conventional device, as a voltage applied between the electrodes,
When using a low frequency high voltage instead of the conventional high frequency high voltage, it was found that the performance of the conventional device can be significantly improved,
That is, the present invention has been completed.
問題点を解決するための手段 本発明は、被検査体の一端に接続される高圧側電極と、
同他端に接続される低圧側電極と、之等電極間に周波数
１〜１００Ｈｚの低周波高電圧を印加するための低周波
高電圧発生器と、上記電極間に上記発生器よりの低周波
高電圧を印加することによって生じた上記被検査体上の
放電電流を検出して合否を判別する判別器を、具備して
いることを特徴とする密封包装体のピンホール検査装置
に係る。Means for Solving the Problems The present invention includes a high-voltage side electrode connected to one end of a device under test,
A low-frequency electrode connected to the other end, a low-frequency high-voltage generator for applying a low-frequency high voltage with a frequency of 1 to 100 Hz between the electrodes, and a low-frequency from the generator between the electrodes. A pinhole inspection device for a hermetically sealed package, comprising: a discriminator that detects pass / fail by detecting a discharge current on the inspected object generated by applying a high voltage.
実施例 以下に本発明の一実施例を添附図面にもとづき説明する
と、次の通りである。EXAMPLE An example of the present invention will be described below with reference to the accompanying drawings.
第１図は本発明装置の全体を概略的に示す説明図であ
り、被検査体（ａ）の一端側に接続される高圧側電極
（１）と、同他端側に接続される低圧側電極（２）
（２′）と、之等電極（１）及び（２）（２′）間に周
波数１〜１００Ｋｚの低周波高電圧を印加するための低
周波高電圧発生装置（３）と、上記電極（１）及び
（２）（２′）間に低周波高電圧を印加することによっ
て生じた上記被検査体（ａ）上の放電電流を検出して合
否を判別する判別器（４）を具備している。FIG. 1 is an explanatory view schematically showing the whole of the device of the present invention, in which a high voltage side electrode (1) connected to one end side of a device under test (a) and a low voltage side connected to the other end side thereof. Electrode (2)
(2 '), a low frequency high voltage generator (3) for applying a low frequency high voltage having a frequency of 1 to 100 Kz between the electrodes (1) and (2) (2'), and the electrode ( 1) and (2) and (2 ') are provided with a discriminator (4) for discriminating the pass / fail by detecting the discharge current on the inspected body (a) generated by applying a low frequency high voltage. ing.
低圧側電極（２）（２′）は、被検査体（ａ）上に生ず
る放電電流を２系統独立して個別に検出するためのもの
であり、之等電極（２）（２′）は、電流を電圧に変換
するための抵抗器及びコンデンサ（５）（５′）を介し
て上記判別器（４）に個別に接続されている。The low voltage side electrodes (2) and (2 ') are for independently detecting the discharge current generated on the object (a) to be inspected, independently of the two systems, and the uniform electrodes (2) and (2') are , Are individually connected to the discriminator (4) through resistors and capacitors (5) (5 ') for converting current into voltage.
判別器（４）は、２系統独立して送られてくる電圧の大
小を比較し、之等の間にあらかじめ定めた値よりも大き
い電圧差が生ずると、不良品信号を出すような構成にな
っている。The discriminator (4) compares the magnitudes of the voltages sent independently of the two systems, and if there is a voltage difference larger than a predetermined value between them, it outputs a defective product signal. Has become.
第１図に示す状態で、電極（１）及び（２）（２′）間
に電圧を印加すると、ピンホールなしの場合は被検査体
（ａ）上にコロナ放電電流を生じ、而して判別器（４）
に２系統独立して送られる電圧間には実質的に大小の差
がなく、よって判別器（４）は作動しない。尚電極
（２）（２′）は被検査体（ａ）の内容物との間の静電
容量が等しくなるように設置されている。When a voltage is applied between the electrodes (1), (2) and (2 ') in the state shown in FIG. 1, a corona discharge current is generated on the object (a) to be inspected without a pinhole. Discriminator (4)
There is substantially no difference between the voltages sent to the two independent systems, so that the discriminator (4) does not operate. The electrodes (2) and (2 ') are installed so that the capacitance between the electrodes (2) and (2') is the same as that of the contents of the inspection object (a).
一方ピンホールありの場合は被検査体（ａ）上にコロナ
放電電流と火花放電電流を生じ、火花放電電流はコロナ
放電電流に比較して大きく、而して判別器（４）に２系
統独立して送られる電圧間に大小の差を生じ、よって判
別器（４）は作動して不良品信号を発する。尚第１図に
於て、（６）はシフトレジスター、（７）はパルス発生
器、（８）は電磁弁であり、之等は本発明装置の組込ま
れた下記の検査装置を自動制御するためのものである。On the other hand, when there is a pinhole, a corona discharge current and a spark discharge current are generated on the inspected body (a), and the spark discharge current is larger than the corona discharge current. Therefore, the discriminator (4) has two independent systems. Then, the discriminator (4) operates and emits a defective product signal. In FIG. 1, (6) is a shift register, (7) is a pulse generator, and (8) is a solenoid valve, and the like automatically controls the following inspection device incorporating the device of the present invention. It is for.
本発明は上記形式の検査装置に於て、従来の高周波高電
圧発生装置に代え、特に周波数１〜１００Ｈｚの低周波
高電圧発生装置（３）を設置したことを特徴とし、上記
発生装置（３）より、電極（１）及び（２）（２′）間
に低周波高電圧を印加することにより、ピンホール有の
場合、火花放電電流とコロナ放電電流の比が大きくな
り、良品と不良品の正確確実に判別できる。The present invention is characterized in that, in the inspection apparatus of the above type, a low frequency high voltage generator (3) having a frequency of 1 to 100 Hz is installed in place of the conventional high frequency high voltage generator, and the generator (3 ), By applying a low frequency high voltage between the electrodes (1) and (2) (2 '), the ratio of the spark discharge current to the corona discharge current is increased when there is a pinhole, and the good product and the defective product are Can be accurately and reliably determined.
次表は高周波高電圧を印加した比較例と、低周波高電圧
を印加した本発明との比較実験結果である。尚内溶液と
して蒸留水を用いた。The following table shows the results of comparative experiments between the comparative example to which a high frequency high voltage was applied and the present invention to which a low frequency high voltage was applied. Distilled water was used as the inner solution.
上表から明らかなように、良品を不良品に誤判定する率
は、印加電圧１３ＫＶｏ−ｐ及び２５ＫＶｏ−ｐとも
に、比較例の５００Ｈｚでは２．０〜２．５％とかなり
高いのに対し本発明の６０Ｈｚでは、０．２〜０．３％
と遥かに小さくなり、従来装置よりも性能を各段と向上
できる。 As is clear from the above table, the rate of erroneously determining a non-defective product as a defective product is as high as 2.0 to 2.5% at 500 Hz of the comparative example for both applied voltages of 13 KVo-p and 25 KVo-p. At 60 Hz of the invention, 0.2-0.3%
It is much smaller, and the performance can be improved much more than the conventional device.
本発明において周波数は１〜１００Ｋｚ程度の低周波数
の範囲内から選択決定され、特に５０Ｈｚ又は６０Ｈｚ
の商用周波数を適用するときは、周波数変換器の備付け
を省略できる。In the present invention, the frequency is selected and determined from the low frequency range of about 1 to 100 Kz, and particularly 50 Hz or 60 Hz.
When applying the commercial frequency of, the provision of the frequency converter can be omitted.
本発明に於ては、低圧側電極（２）（２′）は、必ずし
も２系統独立して備える必要はなく、通常行なわれてい
るような１系統のものであってもよい。In the present invention, the low-voltage side electrodes (2) and (2 ') do not necessarily have to be provided independently in two systems, and may be one system which is generally used.
第２〜４図に本発明装置の一使用例が示されている。本
使用例に於ては、被検査体（ａ）は原動器（９）により
駆動されるチェーンコンベア（１０）上に等間隔に設置
固定された送り爪（１１）に支持された状態で、入口部
に於ては、供給コンベア（１２）との協同のもとに、ま
た供給コンベア（１２）に後続するガイドレール（１
３）上に於ては、チェーンコンベア（１０）の単独送り
の案内で前端から後方に向けて搬送されて行く。2 to 4 show an example of use of the device of the present invention. In this example of use, the object to be inspected (a) is supported by feed claws (11) fixed and installed at equal intervals on a chain conveyor (10) driven by a motor (9), At the entrance, in cooperation with the feed conveyor (12) and on the guide rail (1) following the feed conveyor (12).
3) On the upper side, the chain conveyor (10) guides the individual feed, and the sheet is conveyed from the front end toward the rear.
送り爪（１１）は第４図の拡大図に示されるように、被
検査体（ａ）の頸部（ａ１）に嵌入係止される溝付爪部
（１１ａ）と、同底部の吊り孔（ａ２）に挿入係止され
るピン状爪部（１１ｂ）から構成されている。As shown in the enlarged view of FIG. 4, the feed claw (11) has a grooved claw (11a) fitted and locked in the neck (a 1 ) of the object (a) to be inspected, and the bottom of the claw (11a). The pin-shaped claw portion (11b) is inserted and locked in the hole (a 2 ).
ガイドレール（１３）は第３図に詳細が示されるように
前半部（１３ａ）と後半部（１３ｂ）に分かれ、之等
は、前、後で半ピッチずれるように間隔（１４）を存し
て平行配置された複数本の電気絶縁性例えば合成樹脂製
のレール（１５）から構成され、前半部（１３ａ）と後
半部（１３ｂ）に、それぞれ、本発明装置が設置され、
第１検査部（１６）と第２検査部（１７）を構成してい
る。The guide rail (13) is divided into a front half (13a) and a rear half (13b), as shown in detail in FIG. Composed of a plurality of electrically insulating rails (15) made of, for example, synthetic resin arranged in parallel with each other, and the device of the present invention is installed in each of the front half (13a) and the rear half (13b),
The 1st inspection part (16) and the 2nd inspection part (17) are comprised.
第１検査部（１６）の詳細が第４図に拡大して示され、
被検査体（ａ）の上面側に於ては、本発明装置の電極
（１）及び（２）が被検査体（ａ）が通過するごとにそ
の略々全面に接触し、また下面側に於ては、電極（１）
及び（２′）が各レール（１５）間の間隔（１４）の部
分に於て接触されるようになっている。この場合上記レ
ール（１５）の平行配置は、前半部（１３ａ）と後半部
（１３ｂ）で半ピッチずれているので、第１検査部（１
６）で検査されなかった被検査体（ａ）の下面の残部
は、第２検査部（１７）に於て検査される。The details of the first inspection section (16) are shown enlarged in FIG.
On the upper surface side of the object to be inspected (a), the electrodes (1) and (2) of the device of the present invention make contact with substantially the entire surface of the object to be inspected (a) each time the object to be inspected (a) passes, and also to the lower surface side. In the electrode (1)
And (2 ') are contacted at the interval (14) between the rails (15). In this case, the parallel arrangement of the rails (15) is shifted by a half pitch between the front half (13a) and the rear half (13b), so that the first inspection unit (1)
The remaining portion of the lower surface of the inspected body (a) that has not been inspected in 6) is inspected in the second inspection section (17).
このように被検査体（ａ）は、チェーンコンベア（１
０）の送り案内でガイドレール（１３）上を移動され、
この移動中、第１検査部（１６）及び第２検査部（１
７）を順次通過してピンホール有無の検査がなされる。Thus, the inspection object (a) is the chain conveyor (1
Moved on the guide rail (13) with the feed guide of 0),
During this movement, the first inspection unit (16) and the second inspection unit (1
7) is sequentially passed to inspect for pinholes.
検査の結果ピンホール無しの場合は、被検査体（ａ）は
ガイドレール（１３）の後端で送り爪（１１）より解放
され、該レール（１３）に後続する受取りコンベア（１
８）、排出コンベア（１９）及び送り出しコンベア（２
０）を順次経て次工程に送り出されて行く。When there is no pinhole as a result of the inspection, the object to be inspected (a) is released from the feed claw (11) at the rear end of the guide rail (13) and the receiving conveyor (1) following the rail (13).
8), discharge conveyor (19) and delivery conveyor (2
0) is sequentially sent to the next process.
一方ピンホール有の場合は、その信号が第１図に示され
るように判別器（４）よりシフトレジスター（６）に送
られる。On the other hand, when there is a pinhole, the signal is sent from the discriminator (4) to the shift register (6) as shown in FIG.
シフトレジスター（６）はパルス発生器（７）より一定
の間隔、例えば被検査体（ａ）が１ピッチ（送り爪の間
隔）移動されるごとに送られてくるクロックパルスによ
り各被検査体の位置を記憶しており、而して判別器
（４）より不良品信号を受け取ると、これに該当する不
良品が排出コンベア（１９）上に至ると、電磁弁（８）
に信号を発し、電磁弁（８）及びエアシリンダ（２１）
（第２図参照）の働きで排出コンベア（１９）の一端を
持ち上げ、不良品を自動でその下方のシュート（２２）
に落下させ系外へ排出する。排出後は、例えば電磁弁
（８）用に備えたタイミングカム（図示せず）の働き
で、再び元の状態に復帰する。このようにして、被検査
体の検査を連続的に行うことができる。The shift register (6) outputs a pulse signal from the pulse generator (7) at a constant interval, for example, a clock pulse sent every time the object (a) is moved by one pitch (interval between the feed claws). The position is stored, and when a defective product signal is received from the discriminator (4), the solenoid valve (8) is reached when the corresponding defective product reaches the discharge conveyor (19).
Signal to the solenoid valve (8) and air cylinder (21)
(Refer to FIG. 2), one end of the discharge conveyor (19) is lifted, and the defective product is automatically chute (22) below it.
And discharge it to the outside of the system. After the discharge, the original state is restored again by the action of a timing cam (not shown) provided for the solenoid valve (8), for example. In this way, the inspection of the inspection object can be continuously performed.
効果 このように本発明に於ては、電極間に、特に周波数１〜
１００Ｈｚの低周波高電圧を印加するような構成となし
たことにより、ピンホール有無の検査に際し不良品の確
実な検出に加え良品と不良品と誤判定することが殆んど
なくなり、その検査性能を格段と向上し得る特徴を有す
る。Effect As described above, in the present invention, particularly between the electrodes, the frequency 1 to
By applying a low-frequency high voltage of 100 Hz, in addition to reliable detection of defective products when inspecting for pinholes, there is almost no erroneous determination of good products and defective products, and the inspection performance It has a feature that can significantly improve.
第１図は本発明の一実施例の概略的に示す全体図、第２
図は本発明装置の一使用例を概略的に示す側面図、第３
図は同平面図、第４図は第２図に於ける第１検査部の拡
大図である。 図に於て（１）及び（２）（２′）は電極、（３）は低
周波高電圧発生器、（４）は判別器、（５）（５′）は
低抗及びコンデンサ、（６）はシフトレジスター、
（７）はパルス発生器、（８）は電磁弁である。FIG. 1 is an overall view schematically showing an embodiment of the present invention, and FIG.
FIG. 3 is a side view schematically showing an example of use of the device of the present invention.
FIG. 4 is a plan view of the same, and FIG. 4 is an enlarged view of the first inspection unit in FIG. In the figure, (1), (2) and (2 ') are electrodes, (3) is a low frequency high voltage generator, (4) is a discriminator, (5) and (5') are resistors and capacitors, 6) is a shift register,
(7) is a pulse generator, and (8) is a solenoid valve.
Claims (1)
と、同他端に接続される低圧側電極と、之等電極間に周
波数１〜１００Ｈｚの低周波高電圧を印加するための低
周波高電圧発生器と、上記電極間に上記発生器よりの低
周波高電圧を印加することによって生じた上記被検査体
上の放電電流を検出して合否を判別する判別器を、具備
していることを特徴とする密封包装体のピンホール検査
装置。1. A low-frequency high voltage having a frequency of 1 to 100 Hz is applied between a high-voltage side electrode connected to one end of an object to be inspected, a low-voltage side electrode connected to the other end, and an equal electrode. A low-frequency high-voltage generator, and a discriminator that detects a discharge current on the object to be inspected generated by applying a low-frequency high voltage from the generator between the electrodes and determines pass / fail. A pinhole inspection device for hermetically sealed packages.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62274366A JPH068801B2 (en) | 1987-10-29 | 1987-10-29 | Pinhole inspection device for sealed packages |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62274366A JPH068801B2 (en) | 1987-10-29 | 1987-10-29 | Pinhole inspection device for sealed packages |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01114744A JPH01114744A (en) | 1989-05-08 |
| JPH068801B2 true JPH068801B2 (en) | 1994-02-02 |
Family
ID=17540657
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62274366A Expired - Fee Related JPH068801B2 (en) | 1987-10-29 | 1987-10-29 | Pinhole inspection device for sealed packages |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH068801B2 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2852572B2 (en) * | 1991-07-04 | 1999-02-03 | 株式会社大塚製薬工場 | Insulation failure inspection device between independent chambers of a multi-chamber container |
| JP2006300541A (en) * | 2005-04-15 | 2006-11-02 | Jiyooben Denki Kk | Inspection method of hermetically sealed package and its inspection device |
| JP4943084B2 (en) * | 2006-08-02 | 2012-05-30 | ニッカ電測株式会社 | Electrode for pinhole inspection equipment |
| DE102012207736B4 (en) * | 2012-05-09 | 2023-05-17 | Syntegon Technology Gmbh | Device and method for conveying filled containers and checking them for leaking liquid |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5737027A (en) * | 1980-08-11 | 1982-03-01 | Toshiba Corp | Trolley wire for remotely controlled vehicle in nuclear power plant |
-
1987
- 1987-10-29 JP JP62274366A patent/JPH068801B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01114744A (en) | 1989-05-08 |
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| LAPS | Cancellation because of no payment of annual fees |