JPH0675028B2 - Method and apparatus for evaluating surface hardness of coating film - Google Patents

Method and apparatus for evaluating surface hardness of coating film

Info

Publication number
JPH0675028B2
JPH0675028B2 JP28792086A JP28792086A JPH0675028B2 JP H0675028 B2 JPH0675028 B2 JP H0675028B2 JP 28792086 A JP28792086 A JP 28792086A JP 28792086 A JP28792086 A JP 28792086A JP H0675028 B2 JPH0675028 B2 JP H0675028B2
Authority
JP
Japan
Prior art keywords
coating film
hardness
surface hardness
coating
contact area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP28792086A
Other languages
Japanese (ja)
Other versions
JPS63140936A (en
Inventor
正樹 廣幸
秀明 向江
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP28792086A priority Critical patent/JPH0675028B2/en
Publication of JPS63140936A publication Critical patent/JPS63140936A/en
Publication of JPH0675028B2 publication Critical patent/JPH0675028B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Instruments For Measurement Of Length By Optical Means (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 本発明は塗膜の表面硬度を評価する方法に関するもので
あり、たとえば塗布型磁気記録媒体の表面硬度を比較評
価するために利用されるものである。
Description: TECHNICAL FIELD The present invention relates to a method for evaluating the surface hardness of a coating film, and is used for comparatively evaluating the surface hardness of a coating type magnetic recording medium, for example. .

従来の技術 近年の磁気記録技術の進歩によって記録密度は向上し、
その記録波長は短かくなっている。この高密度化の進展
において媒体やヘッドの磁気特性もさる事ながら媒体自
体の走行性も重要な因子として注目されはじめている。
ところがこの媒体の走行性は今だに不明確な点が多い。
これは主に媒体の表面の状態が非常に把握しにくいとい
う点にある。特に表面硬度については、その評価法すら
整備されているとはいえない。
Conventional Technology With recent advances in magnetic recording technology, recording density has improved,
The recording wavelength has become shorter. In the progress of the higher density, the running property of the medium itself has begun to be noticed as an important factor in addition to the magnetic characteristics of the medium and the head.
However, the runnability of this medium is still unclear.
This is mainly because it is very difficult to grasp the state of the surface of the medium. Especially regarding surface hardness, it cannot be said that even the evaluation method is prepared.

従来、塗膜の表面硬度の測定には、ビッカース法等のよ
うにダイヤモンド針を押しあてその圧痕を測定したり、
マイクロビッカース法のようにダイヤモンド針を押しあ
ててその荷重を変化させ、深み込んだ変位と荷重変化の
履歴を測定したり、又ひっぱり試験法や振動試験法等に
よって媒体のヤング率を測定する事で表面硬度の代用評
価としていた。これらの方法は、磁気記録媒体の場合、
蒸着やメッキによる薄膜媒体に比べ、塗布型媒体の場合
は膜の弾性的な性質から満足できるものではなかった。
Conventionally, for measuring the surface hardness of a coating film, pressing a diamond needle like the Vickers method or measuring the indentation thereof,
Like a micro-Vickers method, press a diamond needle to change the load, measure the displacement of the deepened part and the history of load change, or measure the Young's modulus of the medium by the pull test method or vibration test method. Was used as a substitute for surface hardness. In the case of magnetic recording media, these methods
Compared with a thin film medium formed by vapor deposition or plating, the coating type medium was not satisfactory due to the elastic properties of the film.

発明が解決しようとする問題点 すなわち、上記の様な従来法に対しては次の様な問題点
があった。まずビッカース法のように圧痕を測定する場
合においては、磁気記録媒体の膜厚が非常に薄く、又塗
膜部分の弾性率が金属等に比べ高いために、荷重が重い
と塗膜がやぶれ、荷重が軽い場合は圧痕が残らないため
に測定ができなかった。次にマイクロビッカース法にお
いては、その測定変位量が媒体の表面粗さのオーダーに
なるので、測定の再現性に難点があった。又媒体のヤン
グ率を測定しようとする時、媒体の厚みが数十μmある
場合には安定した測定が行なえるものの、実際のテープ
等のように数μmの塗布厚になった場合には、やはり精
度と再現性に問題があった。本発明は従来技術の問題点
に対し、簡単に精度よく再現性のある塗布型媒体の表面
硬度を評価しようとするものである。
Problems to be Solved by the Invention That is, there are the following problems with respect to the above conventional methods. First, in the case of measuring the indentation like the Vickers method, the film thickness of the magnetic recording medium is very thin, and since the elastic modulus of the coating film part is higher than that of metal etc., the coating film shakes when the load is heavy, When the load was light, the measurement could not be performed because no indentation remained. Next, in the micro-Vickers method, since the measured displacement amount is on the order of the surface roughness of the medium, there is a problem in the reproducibility of the measurement. Further, when trying to measure the Young's modulus of the medium, stable measurement can be performed when the thickness of the medium is several tens of μm, but when the coating thickness of several μm is obtained, such as with an actual tape, After all there was a problem in accuracy and reproducibility. The present invention intends to easily and accurately evaluate the surface hardness of a coating type medium with respect to the problems of the prior art.

問題点を解決するための手段 上記の問題点解決のため、本発明の塗膜の表面硬度評価
方法は、測定しようとする塗膜より硬度の高い透明体を
前記塗膜に押しつけ、前記透明体の背後から照射され接
触部で反射した光の干渉縞によってその接触面積を測定
し、前記塗膜の硬度を評価するものである。
Means for Solving the Problems In order to solve the above problems, the method for evaluating the surface hardness of a coating film of the present invention is such that a transparent body having a hardness higher than that of the coating film to be measured is pressed against the coating film. The hardness of the coating film is evaluated by measuring the contact area by the interference fringes of the light that is irradiated from the backside and reflected at the contact portion.

作用 上記の構成により、たとえば塗布型磁気記録媒体の塗膜
を本発明の方法で評価する場合には、塗布型磁気記録媒
体の塗膜部分よりも硬度の高い透明体(たとえばガラ
ス,ダイヤモンド,サファイヤ,石英等)の先端部を半
球状又は複合曲率面又は平面等に加工し、その反体面を
鏡面に仕上げ加工先端部を裏からのぞけるようにしてお
き、数百mgから数gの間にコントロールされた荷重で媒
体面に押しつけ、光の干渉縞を調べる事で媒体と透明体
の接触面積を測定し、表面硬度を評価することができ
る。
With the above configuration, when the coating film of the coating type magnetic recording medium is evaluated by the method of the present invention, a transparent body (for example, glass, diamond, sapphire) having a hardness higher than that of the coating layer of the coating type magnetic recording medium is used. , Quartz, etc.) is processed into a hemispherical shape or a compound curvature surface or a flat surface, etc., and its reaction body surface is finished into a mirror surface so that the tip can be seen from the back, and controlled between several hundred mg to several g. The surface hardness can be evaluated by measuring the contact area between the medium and the transparent body by pressing against the medium surface with the applied load and examining the interference fringes of light.

2つの物質の真実接触面積は荷重とやわらかい方の塑性
流動圧力の比によって決まる事が知られている。本発明
装置は上記の様な手段によって透明物質と磁気媒体を押
しつけ合い、その微小な接触面積をほぼ真実接触面積に
比例すると判断する事で媒体表面の塑性流動圧力を表面
硬さとして比較評価するためのものである。これはあら
かじめ塑性流動圧力のわかっている標準サンプルに対し
てその接触面積の大きさがどのようになっているかを調
べる事で達成される。すなわち表面硬度が標準サンプル
に対して高い場合は接触面積は小さく、又低い場合は接
触面積が大きく観測される。
It is known that the real contact area of two materials is determined by the ratio of load and softer plastic flow pressure. The apparatus of the present invention presses the transparent material and the magnetic medium against each other by the means as described above, and judges the minute contact area of the transparent material and the magnetic contact area to be almost proportional to the true contact area, thereby making comparative evaluation of the plastic flow pressure of the medium surface as the surface hardness. It is for. This can be achieved by examining the size of the contact area of a standard sample whose plastic flow pressure is known in advance. That is, when the surface hardness is higher than that of the standard sample, the contact area is small, and when it is low, the contact area is large.

実施例 以下に本発明の具体的な実施例を説明する。第1図は本
発明の方法を模式的に示す図である。第1図において、
支持台1の上に固定された塗膜サンプル2の上方から、
マイクロメータ3で上下に移動可能なステージ4にとり
つけられたアーム5の先端に取りつけられた透明体6を
近づけてゆく事ができるようにした。透明体6はここで
は通常のガラスを使用し、先端を2mmRの半円状に仕上
げ、その反対面は平たんに鏡面仕上を行った。アーム5
の根本には歪ゲージ7をはりつけてあり、あらかじめ標
準分銅で校正しておく事により歪ゲージの出力で押しつ
け加重を検知する事ができるようにした。透明体6の先
端を1gの加重でサンプル2に押しつけ、それを対物レン
ズ8,プリズム9,接眼レンズ10を通して観測者11が透明体
6の先端とサンプル2の接触面積を測定した。この接触
面積は鏡筒12の上方の光源13からの光を光路14の様に観
測すれば、光の干渉によってO次の黒縞の面積として観
測する事ができる。
Example Hereinafter, a specific example of the present invention will be described. FIG. 1 is a diagram schematically showing the method of the present invention. In FIG.
From above the coating film sample 2 fixed on the support 1,
The transparent body 6 attached to the tip of the arm 5 attached to the stage 4 movable up and down by the micrometer 3 can be brought closer to it. The transparent body 6 used here was ordinary glass, and the tip was finished in a semicircular shape of 2 mmR, and the opposite surface was flatly mirror-finished. Arm 5
A strain gauge 7 is attached to the root of the, and it is possible to detect the load by pressing with the output of the strain gauge by calibrating with a standard weight beforehand. The tip of the transparent body 6 was pressed against the sample 2 with a weight of 1 g, and the observer 11 measured the contact area between the tip of the transparent body 6 and the sample 2 through the objective lens 8, the prism 9 and the eyepiece lens 10. If the light from the light source 13 above the lens barrel 12 is observed like the optical path 14, this contact area can be observed as an area of an O-th order black stripe due to light interference.

このような構成の測定装置を用いて第1表に示す組成を
もつ磁性塗膜の表面硬度を比較評価した。
The surface hardness of the magnetic coating film having the composition shown in Table 1 was comparatively evaluated using the measuring device having such a configuration.

第1表に示すような組成で混練した磁性塗料を厚さ15μ
mのPET上に厚み3μmで塗布し、カレンダー仕上げす
る事でほぼ同じ表面粗さに仕上げ製作した。ここで、第
1表のポリウレタンを次のように変えてサンプルA,B,C
とした。
The magnetic paint kneaded with the composition shown in Table 1 has a thickness of 15μ.
It was applied to a PET film of 3 m in thickness of 3 μm and calendered to give almost the same surface roughness. Here, the polyurethanes in Table 1 were changed as follows to obtain samples A, B and C.
And

サンプルA……Tg=−20℃のポリウレタン使用 サンプルB……Tg=20℃のポリウレタン使用 サンプルC……Tg=80℃のポリウレタン使用 但しTgはガラス転移温度を示す。Sample A: Tg = -20 ° C polyurethane used Sample B: Tg = 20 ° C polyurethane used Sample C: Tg = 80 ° C polyurethane used Tg indicates the glass transition temperature.

このサンプルについて、上記の方法で接触面積を測定し
た。
The contact area of this sample was measured by the method described above.

第2表に測定結果を示すが、表では接触部分はほぼ円形
となるので接触面積の代りにその直径で比較している。
また、同じ組成で膜厚を約15μmに仕上げた各サンプル
につき、引っぱり試験法を用いて測定したそれぞれのヤ
ング率を第2表に参考に示した。
Table 2 shows the measurement results. In the table, the contact area is almost circular, so the diameter is used instead of the contact area.
Table 2 shows the Young's modulus of each sample having the same composition and having a film thickness of about 15 μm measured by the pulling test method for reference.

第2表より膜のヤング率の上昇に伴ない接触面積が小さ
くなってゆく、すなわち硬度が大きくなるのがわかる。
これによって数μmの厚さの塗膜の硬度を比較評価する
事ができた。
It can be seen from Table 2 that the contact area decreases with increasing Young's modulus of the film, that is, the hardness increases.
As a result, the hardness of a coating film having a thickness of several μm could be comparatively evaluated.

発明の効果 以上のように本発明によれば、接触面積を調べる事で膜
の硬度を比較評価でき、これによって数μmの塗布厚に
した時従来は測定しにくかった塗膜硬度を標準サンプル
に対して比較評価する事ができるという効果が得られ、
塗膜開発などの上で大いに有益となるものである。
EFFECTS OF THE INVENTION As described above, according to the present invention, it is possible to compare and evaluate the hardness of the film by examining the contact area. As a result, when the coating thickness is several μm, the hardness of the coating film, which was conventionally difficult to measure, was used as the standard sample. The effect that it can be compared and evaluated is obtained,
It will be very useful for coating film development.

【図面の簡単な説明】[Brief description of drawings]

図は本発明の方法を示す模式図である。 1……支持台、2……塗膜サンプル、3……マイクロメ
ータ、4……ステージ、5……アーム、6……透明体、
7……歪ゲージ、8……対物レンズ、9……プリズム、
10……接眼レンズ、11……観測者、12……鏡筒、13……
光源、14……光路。
The figure is a schematic view showing the method of the present invention. 1 ... Support base, 2 ... Coating sample, 3 ... Micrometer, 4 ... Stage, 5 ... Arm, 6 ... Transparent body,
7 ... Strain gauge, 8 ... Objective lens, 9 ... Prism,
10 …… eyepiece, 11 …… observer, 12 …… lens barrel, 13 ……
Light source, 14 ... optical path.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】測定しようとする塗膜より硬度の高い透明
体を前記塗膜に押しつけ、前記透明体の背後から照射さ
れ接触部で反射した光の干渉縞によってその接触面積を
測定し、前記塗膜の硬度を評価する事を特徴とする塗膜
の表面硬度評価方法。
1. A transparent body having a hardness higher than that of a coating to be measured is pressed against the coating, and the contact area is measured by interference fringes of light irradiated from the back of the transparent body and reflected at a contact portion, A method for evaluating the surface hardness of a coating film, which comprises evaluating the hardness of the coating film.
【請求項2】測定しようとする塗膜より硬度の高い透明
体よりなる押しつけ部材、上記押しつけ部材を上下に移
動させ塗膜に押しつけるアーム、上記押しつけ部材の背
後に配置した光源、および上記光源より上記押しつけ部
材を通り塗膜との接触部で反射された光の干渉縞を観測
して接触部の面積を測定する測定手段よりなることを特
徴とする塗膜の表面硬度評価装置。
2. A pressing member made of a transparent body having a hardness higher than that of the coating film to be measured, an arm for moving the pressing member up and down to press the coating film, a light source arranged behind the pressing member, and a light source. An apparatus for evaluating the surface hardness of a coating film, which comprises a measuring means for observing an interference fringe of light reflected by the contact portion with the coating film that passes through the pressing member to measure the area of the contact portion.
JP28792086A 1986-12-03 1986-12-03 Method and apparatus for evaluating surface hardness of coating film Expired - Lifetime JPH0675028B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28792086A JPH0675028B2 (en) 1986-12-03 1986-12-03 Method and apparatus for evaluating surface hardness of coating film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28792086A JPH0675028B2 (en) 1986-12-03 1986-12-03 Method and apparatus for evaluating surface hardness of coating film

Publications (2)

Publication Number Publication Date
JPS63140936A JPS63140936A (en) 1988-06-13
JPH0675028B2 true JPH0675028B2 (en) 1994-09-21

Family

ID=17723438

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28792086A Expired - Lifetime JPH0675028B2 (en) 1986-12-03 1986-12-03 Method and apparatus for evaluating surface hardness of coating film

Country Status (1)

Country Link
JP (1) JPH0675028B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02140449U (en) * 1989-04-27 1990-11-26
US4997276A (en) * 1989-12-21 1991-03-05 Hughes Aircraft Company Apparatus and method for determining elastic properties of optical fibers by contact area measurement
JPH07325029A (en) * 1994-05-31 1995-12-12 Nec Corp Physical property of thin film evaluating apparatus

Also Published As

Publication number Publication date
JPS63140936A (en) 1988-06-13

Similar Documents

Publication Publication Date Title
Bhushan Surface roughness analysis and measurement techniques
US5965896A (en) Apparatus and method for scratch wear testing of thin films
IE45575L (en) Scale for calibrating electron beam instruments
Steinchen et al. Strain analysis by means of digital shearography: potential, limitations and demonstration
Bhushan et al. Real contact area measurements on magnetic rigid disks
Connor et al. Extending the surface force apparatus capabilities by using white light interferometry in reflection
Huntley et al. Measurement of crack tip displacement field using laser speckle photography
JPH0675028B2 (en) Method and apparatus for evaluating surface hardness of coating film
King et al. A comparison of methods for accurate film thickness measurement
JP2551931B2 (en) Thin film hardness tester
JPS62245131A (en) Scratch testing machine
CN101839707A (en) Film thickness testing method based on nano indentation unloading curve
Li et al. High-precision large deflection measurements of thin films using time sequence speckle pattern interferometry
Quiney et al. The measurement of surface roughness and profiles on metals
JPS6336132A (en) Measuring instrument for young's modulus and internal stress of thin film
Sanford et al. An improved strain gauge method for measuring K ID for a propagating crack
US2402926A (en) Method of quantitatively evaluating roughness of metals
Wyant et al. Three-dimensional surface metrology using a computer controlled non-contact instrument
Bhushan et al. Solid surface characterization
CN2356314Y (en) Laser scanning force microscope
CA1333752C (en) Universal interferometric strain gauge
Williams A scanning gauge for measuring the form of spherical and aspherical surfaces
JP2620955B2 (en) Thin film internal stress measurement device
Nadimpalli et al. Pole tip recession: investigation of factors affecting its measurement and its variation with contact start-stop and constant speed drag testing
JPS6144308A (en) Magnetic disk measuring head and method for measuring characteristics of magnetic disk