JPH0674933U - Weight measuring device - Google Patents

Weight measuring device

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Publication number
JPH0674933U
JPH0674933U JP1482393U JP1482393U JPH0674933U JP H0674933 U JPH0674933 U JP H0674933U JP 1482393 U JP1482393 U JP 1482393U JP 1482393 U JP1482393 U JP 1482393U JP H0674933 U JPH0674933 U JP H0674933U
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JP
Japan
Prior art keywords
sample
probe
weight
value
reference body
Prior art date
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Pending
Application number
JP1482393U
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Japanese (ja)
Inventor
栄治 中務
一平 山内
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Shimadzu Corp
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Shimadzu Corp
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Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP1482393U priority Critical patent/JPH0674933U/en
Publication of JPH0674933U publication Critical patent/JPH0674933U/en
Pending legal-status Critical Current

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Abstract

(57)【要約】 【目的】ゲインドリフトの影響を排して試料の重量を正
確に測定できるようにする。 【構成】設置台2上、プローブ3によって単独で又は試
料Aとともに持ち上げられる位置に既知重量WR*の参照
体5を配設し、検出手段4による参照体5の測定値WR
とその既知の値WR*との比からドリフト率WR/WR*を定
め、そのドリフト率WR/WR*によって試料Aの測定値W
S を補償し、真の値WS*を得るようにした。
(57) [Summary] [Purpose] To eliminate the influence of gain drift so that the weight of a sample can be measured accurately. [Structure] A reference body 5 having a known weight WR * is arranged on a mounting table 2 at a position where it can be lifted by a probe 3 alone or together with a sample A, and a measurement value WR of the reference body 5 by a detection means 4 is provided.
The drift rate WR / WR * is determined from the ratio of the known value WR * to the measured value W of the sample A by the drift rate WR / WR *.
S was compensated to obtain the true value WS *.

Description

【考案の詳細な説明】[Detailed description of the device]

【0001】[0001]

【産業上の利用分野】[Industrial applications]

本考案は、炉などの特殊雰囲気下に配置される試料に適用可能な重量測定装置 に関し、その測定精度の向上を図った重量測定装置に関するものである。 The present invention relates to a weight measuring device applicable to a sample placed in a special atmosphere such as a furnace, and more particularly to a weight measuring device with improved measurement accuracy.

【0002】[0002]

【従来の技術】[Prior art]

例えば、炉に置かれる試料としてプレス成形体がある。このプレス成形体は原 料にワックスを混練し所要形状にプレスしたグリーン体を炉において先ずデワッ クスし、しかる後、焼結処理することにより最終製品に仕上げられる。デワック ス処理工程は、真空排気した炉内でグリーン体を加熱し、成形体中に含まれるワ ックスを徐々に蒸発させて除去する工程である。この際、温度制御や圧力制御が 早急に過ぎると、ワックスの抜けが速く、したがって成形体の脱脂や焼結収縮が 予想以上に速く進行し、成形体に変形やひび割れ等を惹起する原因になる。しか して、従来では炉内における成形体の変化を実際にモニタするのは困難とされて いたため、焼結完了後、あるいは脱脂を中断して、炉から取り出された成形体の 状態を検査し、温度制御や圧力制御がいかにあるべきかを経験や感に頼って評価 するようにしてきた。そのため、評価に客観性が乏しく、処理工程を確立するの に長い時間を要していた。また、製品の品質を向上させることも難しいという問 題があった。 For example, a press-molded body is a sample placed in a furnace. This press-molded body is finished into a final product by first dewaxing a green body, which is obtained by kneading a raw material with wax and pressing it into a desired shape, in a furnace, and then sintering it. The dewaxing process is a process in which the green body is heated in a vacuum-exhausted furnace to gradually evaporate and remove the wax contained in the green body. At this time, if the temperature control or pressure control is passed too quickly, the wax will escape quickly, and therefore degreasing and sintering shrinkage of the molded body will progress faster than expected, causing deformation and cracking of the molded body. . However, in the past, it was difficult to actually monitor changes in the compact in the furnace.Therefore, after the completion of sintering or interruption of degreasing, the condition of the compact taken out from the furnace was inspected. However, I have tried to evaluate how temperature control and pressure control should be based on experience and feeling. Therefore, the evaluation was not very objective and it took a long time to establish the treatment process. There was also the problem that it was difficult to improve the quality of products.

【0003】 そこで、本考案者は、炉への悪影響を最少限に抑止しつつ、成形体の寸法およ び重量を高い精度で測定できるようにした重量・寸法測定装置を開発し、特願平 3−63590号において提案した。このものは、図5に示すように、上向面1 a上に試料Aを保持する受皿1と、この受皿1が設置される設置台2と、受皿1 および試料Aに交互に接触し得る位置に配設され受皿1の下面1bに支持面3b を添接させて該受皿1を試料Aとともに持ち上げ設置台2から離間させ得るプロ ーブ3と、このプローブ3を試料Aと受皿1の間で相対変位させたときの該プロ ーブ3の上端部の移動量Xを該上端部に掛かる荷重Wとともに検出する検出手段 4とを具備してなる。そして、例えば次のような測定原理に基づいて試料Aの重 量変化および寸法変化を測定する。先ず、プローブ3をその突起部3aが試料A に接触するP1 位置まで降下させ、次に該プローブ3を上昇させていくと、プロ ーブ3が受皿1の下面1bに接触するP2 位置で受皿1を試料Aとともに持ち上 げ、設置台2から離間させる。この間、検出手段4が検出する変位Xおよび荷重 Wの関係は図6に示すようになる。P1 位置からP2 位置までのプローブ移動量 ΔXは、試料Aと受皿1の寸法Lに対応しており、試料Aの寸法変化はΔXの変 化として測定できる。また、P2 位置の前後において検出手段4により検出され るプローブ荷重差ΔWは、試料Aと受皿1の重量に対応しており、試料Aの重量 変化はΔWの変化として測定できる。かくして、同装置は、試料Aの寸法変化と 重量変化をほぼ同時に求める機能を発揮する。Therefore, the present inventor has developed a weight / dimension measuring device capable of measuring the dimensions and weight of a compact with high accuracy while suppressing adverse effects on the furnace to a minimum. Proposed in No. 3-63590. As shown in FIG. 5, this can contact the saucer 1 holding the sample A on the upward surface 1 a, the installation base 2 on which the saucer 1 is installed, and the saucer 1 and the sample A alternately. A probe 3 which is arranged at a position so that the supporting surface 3b is attached to the lower surface 1b of the saucer 1 and the saucer 1 can be lifted together with the sample A and separated from the installation base 2, and the probe 3 of the sample A and the saucer 1. And a detection means 4 for detecting the movement amount X of the upper end of the probe 3 when the probe 3 is relatively displaced between the probe 3 and the load W applied to the upper end. Then, for example, the weight change and dimensional change of the sample A are measured based on the following measurement principle. First, the probe 3 is lowered to the position P1 where the protrusion 3a contacts the sample A, and then the probe 3 is raised, and the probe 3 contacts the lower surface 1b of the tray 1 at the position P2. 1 is lifted together with the sample A and separated from the installation base 2. During this time, the relationship between the displacement X and the load W detected by the detecting means 4 is as shown in FIG. The probe movement amount ΔX from the P1 position to the P2 position corresponds to the dimension L of the sample A and the pan 1, and the dimensional change of the sample A can be measured as the change of ΔX. The probe load difference ΔW detected by the detecting means 4 before and after the P2 position corresponds to the weight of the sample A and the pan 1, and the weight change of the sample A can be measured as the change of ΔW. Thus, the device exhibits the function of obtaining the dimensional change and the weight change of the sample A almost at the same time.

【0004】[0004]

【考案が解決しようとする課題】[Problems to be solved by the device]

ところが、このような装置は、重量測定に関して常に正確なキャリブレーショ ン(校正)が必要である。具体的に説明すると、ロードセル等の検出手段4は図 7に示すように実際の荷重Wにゲイン(利得)が掛かった形で検出値Yを出力す る。そして、この検出手段4を利用に供する際には、同図中実線で示すように、 ゲイン(傾き)の正確な設定と、荷重を加えないときに0を出力させるための零 点調整とがなされる。しかし、検出手段4は経年変化などの原因で同図中想像線 で示すようなナルドリフトやゲインドリフトを生じる。そして、前述した構成の ものは、ナルドリフトについては測定値の差をとったときにキャンセルされるが 、ゲインドリフトについては何ら補償がされない。そのため、同装置は、定期的 なキャリブレーションが必要である。 However, such devices always require accurate calibration for weighing. More specifically, the detection means 4 such as the load cell outputs the detection value Y in a form in which the actual load W is multiplied by the gain as shown in FIG. When the detecting means 4 is used, as shown by the solid line in the figure, accurate setting of the gain (slope) and zero adjustment for outputting 0 when no load is applied are required. Done. However, the detecting means 4 causes a null drift and a gain drift as shown by the imaginary line in the figure due to a change over time. Then, in the configuration described above, null drift is canceled when the difference between the measured values is taken, but gain drift is not compensated at all. Therefore, the device requires regular calibration.

【0005】 本考案は、このような課題に着目してなされたものであって、ゲインドリフト が生じても重量測定精度のキャリブレーションを不要にした重量測定装置を提供 することを目的としてる。The present invention has been made in view of such a problem, and an object thereof is to provide a weight measuring device which does not require calibration of the weight measuring accuracy even if a gain drift occurs.

【0006】[0006]

【課題を解決するための手段】 本考案は、かかる目的を達成するために、次のような構成を採用したものであ る。[Means for Solving the Problems] The present invention adopts the following configuration in order to achieve such an object.

【0007】 すなわち、本考案に係る重量測定装置は、試料を支持する設置台と、この試料 を持ち上げ設置台から離間させるプローブと、このプローブの上端部に掛かる荷 重を検出する検出手段とを具備してなるものにおいて、前記設置台上、前記プロ ーブによって単独で又は前記試料とともに持ち上げられる位置に重量が既知であ る参照体を配設し、前記検出手段による参照体の測定値と既知の値との比からド リフト率を定め、そのドリフト率によって前記検出手段による試料の測定値を補 償し得るようにしたことを特徴とする。That is, the weight measuring apparatus according to the present invention comprises an installation table for supporting the sample, a probe for lifting the sample and separating it from the installation table, and a detection means for detecting the load applied to the upper end of the probe. A reference body having a known weight is provided on the installation table, at a position where it can be lifted by the probe alone or together with the sample. It is characterized in that the drift rate is determined from a ratio with a known value, and the measured value of the sample by the detecting means can be compensated by the drift rate.

【0008】[0008]

【作用】[Action]

このような構成のものであれば、ゲインドリフトがない時は試料の測定値は検 出手段を通じて真の値のまま検出される。このときドリフト率は1であるため、 補償後の試料の重量値は補償がなされないときと同じ値になる。一方、ゲインド リフトが生じ、試料の測定値が真の値から変動すると、参照体の測定値も同じ比 率で変動するため、その比率は参照体のドリフト率から求められる。したがって 、そのドリフト率で試料の測定値を補償(乗除計算)すれば、ゲインドリフトの 影響を取り除いて試料の真の値を求めることができる。 With such a configuration, when there is no gain drift, the measured value of the sample is detected as the true value through the detection means. At this time, since the drift rate is 1, the weight value of the sample after compensation becomes the same value as when the compensation is not performed. On the other hand, when gained lift occurs and the measured value of the sample fluctuates from the true value, the measured value of the reference body also fluctuates at the same ratio. Therefore, the ratio can be obtained from the drift rate of the reference body. Therefore, if the measured value of the sample is compensated by the drift rate (multiplication / division calculation), the true value of the sample can be obtained by removing the influence of gain drift.

【0009】[0009]

【実施例】【Example】

以下、本考案の一実施例を、図1〜図4を参照して説明する。なお、図5と共 通する部分には同一符号を付している。 Hereinafter, an embodiment of the present invention will be described with reference to FIGS. The parts common to those in FIG. 5 are designated by the same reference numerals.

【0010】 この重量測定装置は、図1に示すように、試料Aを支持する設置台2の上端近 傍部に設けた段部2aに環状の参照体5を配設しており、その参照体5から上方 へ突出した設置台2の上端部に受皿1を介して試料Aを設置するようにしている 。参照体5は炉材と同じグラファイト製のものか、或いはモリブデン製のもの等 が好適に用いられる。プローブ3は図示しない昇降機構に担持させてあり、その 突起部3aが試料Aに添接するPa 位置(図1参照)まで降下させると、その昇 降機構により上昇動作に切換えられる。そして、先ず図2に示すPb 位置におい て支持面3bを参照体5の下面5aに接触させ、以降この参照体5を単独で持ち 上げて若干距離移動後に、図3に示すPc 位置で参照体5を受皿1の下面1bに 接触させ、しかる後、参照体5を介して受皿1および試料Aを持ち上げ設置台2 から離間させるようになっている。前述した駆動機構の周辺にはプローブ3の上 端部に掛かる荷重Wを該プローブ3の変位Xと共に検出する検出手段4が付帯し て設けられている。そして、プローブ3が図1のPa 位置から図3のPc 位置ま で変位したときに検出手段4が検出する図4のようなX−W信号を、信号処理手 段6に入力するようにしている。As shown in FIG. 1, this weight measuring device is provided with an annular reference body 5 on a stepped portion 2a provided near the upper end of an installation table 2 for supporting a sample A. The sample A is set on the upper end of the installation table 2 protruding upward from the body 5 via the saucer 1. The reference body 5 is preferably made of the same graphite as the furnace material or molybdenum. The probe 3 is carried by an elevating mechanism (not shown), and when its protrusion 3a is lowered to the position Pa (see FIG. 1) in contact with the sample A, the ascending / descending mechanism switches it to an ascending operation. Then, first, the supporting surface 3b is brought into contact with the lower surface 5a of the reference body 5 at the Pb position shown in FIG. 5 is brought into contact with the lower surface 1b of the saucer 1, and then the saucer 1 and the sample A are lifted via the reference body 5 to be separated from the installation base 2. A detection means 4 for detecting the load W applied to the upper end of the probe 3 together with the displacement X of the probe 3 is provided around the drive mechanism described above. Then, when the probe 3 is displaced from the position Pa in FIG. 1 to the position Pc in FIG. 3, the XW signal as shown in FIG. 4 detected by the detecting means 4 is inputted to the signal processing means 6. There is.

【0011】 信号処理手段6は、例えば通常の機能を備えたマイクロコンピュータシステム により構成されるもので、予め参照体5の既知の重量値WR*と受皿1の重量値W 1 が与えられている。そして、先ずPb 位置の前後の荷重変化から参照体5の重 量WR を算出し、Pc 位置の前後の荷重変化から受皿1を含めた試料Aの重量W S を算出する。次に、前述した既知の値WR*と前記測定値WR との比すなわちド リフト率WR/WR*を求める。そして、そのドリフト率WR/WR*と、受皿1を含め た試料Aの重量WS とから、 WS*=WS/(WR/WR*) … によって、受皿1を含めた試料Aの真の重量値WS*を求める。最後にこの重量値 WS*から受皿1の重量値W1 を差し引いて試料Aの重量を算出する。The signal processing means 6 is composed of, for example, a microcomputer system having a normal function, and the known weight value WR * of the reference body 5 and the weight value W 1 of the pan 1 are given in advance. . Then, first, the weight WR of the reference body 5 is calculated from the load change before and after the Pb position, and the weight W S of the sample A including the saucer 1 is calculated from the load change before and after the Pc position. Next, the ratio of the above-mentioned known value WR * and the measured value WR, that is, the lift ratio WR / WR * is obtained. Then, from the drift rate WR / WR * and the weight WS of the sample A including the saucer 1, the true weight value of the sample A including the saucer 1 is expressed as WS * = WS / (WR / WR *). Ask for WS *. Finally, the weight value W1 of the saucer 1 is subtracted from the weight value WS * to calculate the weight of the sample A.

【0012】 このような構成のものであれば、ゲインドリフトがない時は受皿1を含む試料 Aの測定値Ws は真の値WS*そのものになる。このときドリフト率(WR/WR*) も1になるため、式による補償を行った値は補償を行わない値に一致し、補償 により悪影響が出る事はない。一方、ゲインドリフトが生じ、試料Aの測定値W S が真の値WS*から比率(WS/WS*)で変動すると、参照体5の測定値WR も同 じ比率で変動し、その比率は参照体5のドリフト率(WR/WR*)から求められる 。したがって、そのドリフト率(WR/WR*)と試料Aの測定値WS とから式の 計算を行うことにより、ゲインドリフトがないときの受皿1を含めた試料Aの真 の値WS*を求めることができ、ひいては試料Aの真の重量を求めることが可能に なる。With such a configuration, the measured value Ws of the sample A including the saucer 1 becomes the true value WS * itself when there is no gain drift. At this time, the drift rate (WR / WR *) also becomes 1, so the value compensated by the formula matches the value not compensated, and the compensation does not have any adverse effect. On the other hand, when a gain drift occurs and the measured value WS of the sample A fluctuates from the true value WS * by a ratio (WS / WS *), the measured value WR of the reference object 5 also fluctuates at the same ratio, and the ratio is It is obtained from the drift rate (WR / WR *) of the reference body 5. Therefore, by calculating the formula from the drift rate (WR / WR *) and the measured value WS of the sample A, the true value WS * of the sample A including the saucer 1 when there is no gain drift can be obtained. Therefore, it becomes possible to obtain the true weight of the sample A.

【0013】 なお、参照体の形状や設置構造などは図示例に限定されるものではなく、本考 案の趣旨を逸脱しない範囲で種々変形が可能である。また、試料Aの上下寸法は 、図3および図4に示すようにプローブ突起部3が試料Aに接するPa 位置と参 照体5が受皿1に接するPc 位置との間のプローブ3の変位δおよび試料Aの置 かれる空間の長さLから測定できるが、プローブ3のフレーム部と参照体5の各 膨脹率αL1 、αL2 を適切に調整することにより、試料Aの置かれる空間の長 さLを温度によらず一定に保ち、L−δにより補償された寸法も得ることもでき る。この場合、フレーム部の温度が容易に測定できる時には、参照体5を重量補 償のみに使用し、寸法補償は計算によってもよい。The shape and installation structure of the reference body are not limited to the illustrated examples, and various modifications can be made without departing from the spirit of the present invention. The vertical dimension of the sample A is, as shown in FIGS. 3 and 4, the displacement δ of the probe 3 between the position Pa at which the probe protrusion 3 contacts the sample A and the position Pc at which the reference body 5 contacts the saucer 1. It can be measured from the length L of the space in which the sample A is placed, but by appropriately adjusting the expansion coefficients αL 1 and αL 2 of the frame portion of the probe 3 and the reference body 5, the length of the space in which the sample A is placed can be measured. It is also possible to keep the length L constant regardless of the temperature and obtain a dimension compensated by L-δ. In this case, when the temperature of the frame portion can be easily measured, the reference body 5 may be used only for weight compensation, and the dimensional compensation may be calculated.

【0014】[0014]

【考案の効果】[Effect of device]

本考案に係る重量測定装置は、以上説明したように、プローブによって単独で 又は試料とともに持ち上げられる位置に重量が既知である参照体を配設し、参照 体の重量の測定値と既知の値との比からドリフト率を定め、そのドリフト率によ って試料の重量の測定値を補償するようにしたものである。そのため、重量を検 出する検出手段にゲインドリフトが生じた場合にも、そのドリフトによる影響を 排して正確な重量測定を行うことが可能になる。 As described above, the weight measuring device according to the present invention is provided with a reference body of known weight at a position where it can be lifted by the probe alone or together with the sample. The drift rate is determined from the ratio of the, and the measured value of the weight of the sample is compensated by the drift rate. Therefore, even if a gain drift occurs in the detection means for detecting the weight, it is possible to eliminate the influence of the drift and perform accurate weight measurement.

【図面の簡単な説明】[Brief description of drawings]

【図1】本考案の一実施例を示す一部破断した正面図。FIG. 1 is a partially cutaway front view showing an embodiment of the present invention.

【図2】図1に対応した作用説明図。FIG. 2 is an operation explanatory view corresponding to FIG.

【図3】図1に対応した作用説明図。FIG. 3 is an operation explanatory view corresponding to FIG.

【図4】同実施例においてプローブが移動したとき検出
手段が検出する変位Xおよび荷重Wの関係を示すグラ
フ。
FIG. 4 is a graph showing the relationship between the displacement X and the load W detected by the detection means when the probe moves in the embodiment.

【図5】従来例を示す図1に対応した正面図。FIG. 5 is a front view corresponding to FIG. 1 showing a conventional example.

【図6】同従来例においてプローブが移動したとき検出
手段が検出する変位Xおよび荷重Wの関係を示すグラ
フ。
FIG. 6 is a graph showing the relationship between the displacement X and the load W detected by the detection means when the probe moves in the conventional example.

【図7】ゲインドリフトを説明するためのグラフ。FIG. 7 is a graph for explaining gain drift.

【符号の説明】[Explanation of symbols]

1…受皿 1a…上向面 2…設置台 3…プローブ 4…検出手段 5…参照体 A…試料 WR/WR*…ドリフト率 WS …試料の測定値 1 ... saucer 1a ... upward surface 2 ... installation stand 3 ... probe 4 ... detection means 5 ... reference body A ... sample WR / WR * ... drift rate WS ... measured value of sample

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】試料を支持する設置台と、この試料を持ち
上げ設置台から離間させるプローブと、このプローブの
上端部に掛かる荷重を検出する検出手段とを具備してな
る重量測定装置において、 前記設置台上、前記プローブによって単独で又は前記試
料とともに持ち上げられる位置に重量が既知である参照
体を配設し、前記検出手段による参照体の測定値と既知
の値との比からドリフト率を定め、そのドリフト率によ
って前記検出手段による試料の測定値を補償し得るよう
にしたことを特徴とする重量測定装置。
1. A weight measuring apparatus comprising: a mounting table for supporting a sample; a probe for lifting the sample and separating it from the mounting table; and a detection means for detecting a load applied to an upper end portion of the probe, A reference body having a known weight is disposed on the installation table alone or at a position where it is lifted up together with the sample by the probe, and the drift rate is determined from the ratio between the measured value of the reference body by the detection means and the known value. A weight measuring device characterized in that the measured value of the sample by the detecting means can be compensated by the drift rate.
JP1482393U 1993-03-29 1993-03-29 Weight measuring device Pending JPH0674933U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1482393U JPH0674933U (en) 1993-03-29 1993-03-29 Weight measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1482393U JPH0674933U (en) 1993-03-29 1993-03-29 Weight measuring device

Publications (1)

Publication Number Publication Date
JPH0674933U true JPH0674933U (en) 1994-10-21

Family

ID=11871767

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1482393U Pending JPH0674933U (en) 1993-03-29 1993-03-29 Weight measuring device

Country Status (1)

Country Link
JP (1) JPH0674933U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015087191A (en) * 2013-10-29 2015-05-07 岩井機械工業株式会社 Tank support housing used for weighing apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04297801A (en) * 1991-03-27 1992-10-21 Shimadzu Corp Weight displacement measuring apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04297801A (en) * 1991-03-27 1992-10-21 Shimadzu Corp Weight displacement measuring apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015087191A (en) * 2013-10-29 2015-05-07 岩井機械工業株式会社 Tank support housing used for weighing apparatus

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