JPH0666534A - Soldering appearance inspection method - Google Patents

Soldering appearance inspection method

Info

Publication number
JPH0666534A
JPH0666534A JP4242819A JP24281992A JPH0666534A JP H0666534 A JPH0666534 A JP H0666534A JP 4242819 A JP4242819 A JP 4242819A JP 24281992 A JP24281992 A JP 24281992A JP H0666534 A JPH0666534 A JP H0666534A
Authority
JP
Japan
Prior art keywords
ring
light source
shaped light
camera
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4242819A
Other languages
Japanese (ja)
Other versions
JP2741463B2 (en
Inventor
Koichi Kobayashi
剛一 小林
Fumihiko Koido
文彦 小井戸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Iwaki Electronics Co Ltd
Original Assignee
Iwaki Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Iwaki Electronics Co Ltd filed Critical Iwaki Electronics Co Ltd
Priority to JP4242819A priority Critical patent/JP2741463B2/en
Publication of JPH0666534A publication Critical patent/JPH0666534A/en
Application granted granted Critical
Publication of JP2741463B2 publication Critical patent/JP2741463B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95684Patterns showing highly reflecting parts, e.g. metallic elements

Abstract

PURPOSE:To control blinking of each ring-shaped light source speedily, transmit obtained image information speedily, and achieve a high-resolution detection. CONSTITUTION:Ring-shaped light sources 20a,..., 20c are placed in three steps at the upper part of a part to be inspected, at the same time a black and white camera 22 is laid out, each light source is allowed to blink at different timings successively, the image information obtained at each lighting timing is stored at corresponding frame memories 26a,..., 26, and then it is judged whether soldering is proper or not according to the image characteristics. In each ring- shaped light source, a number of light emitting diodes 32 are aligned in a downward channel-shaped cover material 30. An interlace scanning system is adopted. the ring-shaped light source lights up only at a half cycle where odd/even image pick-up times are superposed for exposing to the black and white camera, and then the odd/even image pick-up signal is transferred to a frame memory during a next one cycle.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、光学疑似3次元式の半
田付け外観検査方法の改良に関し、更に詳しく述べる
と、複数のリング状光源を時分割的に点灯し、各点灯タ
イミングで得たカメラからの画像情報を、対応するフレ
ームメモリに効率よく転送して格納し、それらの画像特
徴から半田付けの良否を判定する方法に関するものであ
る。この検査技術は、プリント配線基板上に実装した電
子部品の半田付け状態の良否を自動的に判定するのに有
用である。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an improvement of an optical pseudo three-dimensional soldering appearance inspection method. More specifically, it is obtained by lighting a plurality of ring-shaped light sources in a time-division manner and at each lighting timing. The present invention relates to a method of efficiently transferring and storing image information from a camera to a corresponding frame memory, and determining the quality of soldering from those image features. This inspection technique is useful for automatically determining the quality of the soldered state of the electronic component mounted on the printed wiring board.

【0002】[0002]

【従来の技術】プリント配線基板上に実装した電子部品
について、その半田付け状態の良否を自動的に検査する
技術が、既に種々提案されている。光学式の自動半田付
け外観検査装置に関しては、現在、立体的(疑似3次
元)な視点で検査できる疑似3次元照明方式が優位にあ
るとされている。その代表的な例としては、時分割照明
式とカラー照明式がある。
2. Description of the Related Art Various technologies have already been proposed for automatically inspecting the quality of the soldered state of electronic components mounted on a printed wiring board. Regarding the optical automatic soldering appearance inspection apparatus, it is said that a pseudo three-dimensional illumination system that can inspect from a three-dimensional (pseudo three-dimensional) viewpoint is predominant at present. Typical examples thereof include a time division illumination type and a color illumination type.

【0003】時分割照明方式では、ドーム状に配置した
複数段のリング状照明手段を順次点灯・消灯して照明角
度を切り換えて半田付け部位を照明し、工業用テレビカ
メラにより撮像して画像処理を行う(例えば特開昭61−
293657号公報参照)。ここで照明手段としては、ドーム
状のホルダに多数本の光ファイバーケーブルを各段毎に
取り付け、該光ファイバーケーブルの他端には各段毎に
光源となるハロゲンランプを配置する構成が採用されて
いる。そしてハロゲンランプからの光を点滅させること
により、各段についてリング状の照明光を投射する。異
なる点灯タイミングで得た各画像は、それぞれフレーム
メモリに格納され、必要な画像処理を施して半田付け部
位の良否を判定する。
In the time-division illumination system, a plurality of stages of ring-shaped illumination means arranged in a dome shape are sequentially turned on / off to switch the illumination angle to illuminate a soldering portion, and an image is taken by an industrial television camera to perform image processing. (For example, JP-A-61-1
See Japanese Patent No. 293657). Here, as the illuminating means, a configuration is adopted in which a large number of optical fiber cables are attached to a dome-shaped holder for each stage, and a halogen lamp serving as a light source is arranged for each stage at the other end of the optical fiber cable. . Then, by blinking the light from the halogen lamp, a ring-shaped illumination light is projected on each stage. The images obtained at different lighting timings are stored in the frame memories respectively, and necessary image processing is performed to determine the quality of the soldered portion.

【0004】カラー照明方式では、赤色光、緑色光、青
色光を発生する3個のリング状発光体からなるカラー3
色リング照明器で半田付け部位を照明し、反射光像をカ
ラーテレビカメラにより各色相別に撮像する(例えば特
開平1-282410号参照)。この場合、各発光体による光を
合成したときに白色光となるように光量を調整する。従
って時分割制御する必要はなく、同一タイミングで分離
して検出できる。
In the color illumination system, a color 3 which is composed of three ring-shaped light emitting bodies which emit red light, green light and blue light.
The soldering area is illuminated with a color ring illuminator, and a reflected light image is captured for each hue by a color television camera (see, for example, Japanese Patent Laid-Open No. 1-282410). In this case, the light amount is adjusted so that white light is obtained when the lights from the respective light emitters are combined. Therefore, it is not necessary to perform time-division control, and detection can be performed separately at the same timing.

【0005】[0005]

【発明が解決しようとする課題】従来の時分割照明方式
の場合、ハロゲンランプによるリング状照明光を光学的
に切り換えるのは時間がかかり実用的ではない。また通
常の方式では、1画面当たり3枚のフレームメモリに画
像情報を伝送するのに時間がかかり、現在の高速化のニ
ーズには対応できない。因に、この方式により撮影に要
する時間は、秒オーダーであった。
In the case of the conventional time division illumination system, it is time consuming and impractical to optically switch the ring-shaped illumination light by the halogen lamp. Further, in the normal method, it takes time to transmit image information to three frame memories per screen, and it is not possible to meet the current needs for speeding up. Incidentally, the time required for photographing by this method was on the order of seconds.

【0006】カラー照明方式でテレビカメラにカラー単
板CCDカメラを使用する場合は、CCDセル部をカラ
ー3色に割り振ってあるため、実質的な分解能が白黒カ
メラの場合のほぼ1/2に低下する。またカラー3枚分
離CCDを使用しても、3枚に分離したCCDの物理的
位相を調整するのが困難なため、白黒カメラと同等の分
解能を得ることは非常に困難である。
When a color single-plate CCD camera is used as a television camera in a color illumination system, the CCD cell portion is divided into three colors, so that the actual resolution is reduced to about half that of a monochrome camera. To do. Even if a three-color CCD is used, it is difficult to adjust the physical phase of the three-color CCD, and it is very difficult to obtain a resolution equivalent to that of a monochrome camera.

【0007】本発明の目的は、上記のような従来技術の
欠点を解消し、高速で各リング状光源の点滅を制御で
き、しかも得られる画像情報を高速で伝送でき、且つ高
分解能で検出できる半田付け外観検査方法を提供するこ
とである。
The object of the present invention is to eliminate the above-mentioned drawbacks of the prior art, to control the blinking of each ring-shaped light source at high speed, to transmit the obtained image information at high speed, and to detect with high resolution. It is to provide a soldering appearance inspection method.

【0008】[0008]

【課題を解決するための手段】本発明は、半田付け部位
に対して入射角が異なるように複数のリング状光源を配
設すると共に半田付け部位に対向するようにテレビカメ
ラを配置し、各光源を時間的に異なるタイミングで順次
点灯・消灯させて、各点灯タイミングで得た画像情報を
対応するフレームメモリに記憶させ、それらの画像特徴
から半田付けの良否を判定する半田付け外観検査方法で
ある。本発明では上記の構成において、前記リング状光
源は多数の発光ダイオードをリング状に配列した構造で
あり、テレビカメラはCCD単板の白黒カメラであっ
て、撮像にインターレス走査方式を採用し、奇数画面撮
像時間と偶数画像撮像時間が重畳した半周期のみリング
状光源を点灯して白黒カメラに露光し、その奇数画面撮
像信号と偶数画面撮像信号を次の1周期の間にフレーム
メモリに転送しており、その点に特徴がある。
According to the present invention, a plurality of ring-shaped light sources are arranged so that the incident angles are different from each other with respect to a soldering portion, and a television camera is arranged so as to face the soldering portion. A soldering visual inspection method that sequentially turns on and off the light source at different timings in time, stores the image information obtained at each lighting timing in the corresponding frame memory, and determines the quality of soldering from those image features. is there. In the present invention, in the above configuration, the ring-shaped light source has a structure in which a large number of light-emitting diodes are arranged in a ring shape, the television camera is a CCD single-plate black-and-white camera, and an interlace scanning system is adopted for image pickup. The ring-shaped light source is turned on and the monochrome camera is exposed only for a half cycle in which the odd screen image capturing time and the even image capturing time are superimposed, and the odd screen image capturing signal and the even screen image capturing signal are transferred to the frame memory during the next one period. And, there is a feature in that point.

【0009】ここで好ましくは、直径が順に大きくなる
ような3種類のリング状光源を、中心軸が一致するよう
に上段、中段、下段に配置して、中心軸線上に白黒カメ
ラを設置し、前記各リング状光源は、下端が開放したチ
ャンネル状カバー部材内に、多数の発光ダイオードを下
向きに近接整列した構造の装置を用いる。
Preferably, three types of ring-shaped light sources whose diameters increase in order are arranged in the upper, middle and lower stages so that the central axes coincide with each other, and a black and white camera is installed on the central axis. Each of the ring-shaped light sources uses a device having a structure in which a large number of light emitting diodes are closely aligned downward in a channel-shaped cover member having an open lower end.

【0010】[0010]

【作用】多数の発光ダイオードの整列体からなるリング
光源は、電気的に高速に点滅可能である。また白黒カメ
ラを用いることで画素分解能が向上する。更にカメラの
奇数画面撮像時間と偶数画像撮像時間は半周期だけずれ
ているが、半周期は重畳することを利用し、その共通タ
イミングでリング状光源を点灯することにより、同じ条
件でCCD上の奇数/偶数走査画面上に露光される。且
つ、その時の撮像信号は、奇数/偶数画像信号に分けて
次の1周期の間に出力でき、画像信号転送時間は約0.
13秒まで短縮される。
The ring light source consisting of an array of a large number of light emitting diodes can be blinked electrically at high speed. In addition, the pixel resolution is improved by using a monochrome camera. Furthermore, the odd screen image capturing time and the even image capturing time of the camera are deviated by a half cycle, but by utilizing the overlapping of the half cycle and turning on the ring-shaped light source at the common timing, the CCD on the same condition Exposed on odd / even scan screen. Further, the image pickup signal at that time can be divided into odd / even image signals and output during the next one cycle, and the image signal transfer time is about 0.
It is reduced to 13 seconds.

【0011】[0011]

【実施例】図1は本発明で使用する半田付け外観検査装
置の概略構成図である。被検査体であるプリント配線基
板10上に実装した電子部品12の上方に、直径が順に
大きくなる3種類のリング状光源20a,20b,20
cを、それらの中心軸が一致するように上段、中段、下
段にそれぞれ配置し、更に前記中心軸上に1台の白黒カ
メラ22を配置する。白黒カメラ22からの画像信号
は、画像処理プロセッサ24を介して対応する3枚の画
像用のフレームメモリ26a,26b,26cに送られ
る。また各リング状光源20a,…,20cの点灯・消
灯動作は、白黒カメラ22による撮像動作に同期して、
切換え制御回路28によって制御する。ここで各リング
状光源20a,…,20cは、下端が開放したチャンネ
ル状カバー部材30内に、多数の発光ダイオード32を
一列に下向きに近接整列した構造である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a schematic block diagram of a soldering appearance inspection apparatus used in the present invention. Three types of ring-shaped light sources 20a, 20b, 20 having diameters that increase in order are provided above the electronic component 12 mounted on the printed wiring board 10 that is the object to be inspected.
c are arranged in the upper, middle, and lower stages so that their central axes coincide with each other, and one black and white camera 22 is further arranged on the central axes. The image signal from the monochrome camera 22 is sent to the corresponding frame memories 26a, 26b and 26c for three images via the image processor 24. Further, the turning on / off operation of each of the ring-shaped light sources 20a, ..., 20c is synchronized with the image pickup operation by the monochrome camera 22,
It is controlled by the switching control circuit 28. Here, each of the ring-shaped light sources 20a, ..., 20c has a structure in which a large number of light-emitting diodes 32 are arranged in close proximity in a row downward in a channel-shaped cover member 30 having an open lower end.

【0012】このように光源として多数の発光ダイオー
ド32の整列体を使用し、且つテレビカメラに白黒カメ
ラ22を使用する点が、本発明の特徴の一つである。こ
こでCCD単板の白黒カメラ22を使用する理由は、画
素数が多く分解能の点で有利だからである。またリング
状光源20a,…,20cに発光ダイオードを使用して
いる理由は、応答が速く構造が簡素化されるためであ
る。
One of the features of the present invention is that the array of a large number of light emitting diodes 32 is used as the light source and the monochrome camera 22 is used as the television camera. The reason for using the monochrome CCD black-and-white camera 22 is that the number of pixels is large and the resolution is advantageous. Further, the reason why the light emitting diodes are used for the ring-shaped light sources 20a, ..., 20c is that the response is fast and the structure is simplified.

【0013】本装置による照射・検査状態を図2に示
す。まず上段のリング状光源20aのみを点灯し、その
時の画像を白黒カメラ22で撮像し、画像情報を対応す
るフレームメモリ26aに格納する。次いで中段のリン
グ状光源20bのみ、下段のリング状光源20cのみを
順次点灯し、それぞれ対応するフレームメモリ26b,
26cに画像情報を格納する。この時、被検査体である
電子部品(LSI)12のリードの半田付け部34を見
た代表的な画像を図3に示す。図面左から上段光源画
像、中段光源画像、下段光源画像である。これらの画像
情報を画像処理することによって半田付け部位の良否を
判定することになる。
The irradiation / inspection state of this apparatus is shown in FIG. First, only the upper ring-shaped light source 20a is turned on, an image at that time is captured by the monochrome camera 22, and the image information is stored in the corresponding frame memory 26a. Next, only the ring-shaped light source 20b in the middle stage and only the ring-shaped light source 20c in the lower stage are sequentially turned on, and the corresponding frame memories 26b, 26b,
The image information is stored in 26c. At this time, a representative image of the soldering portion 34 of the lead of the electronic component (LSI) 12 which is the object to be inspected is shown in FIG. From the left of the drawing, an upper light source image, a middle light source image, and a lower light source image. Image processing of these pieces of image information will determine the quality of the soldered portion.

【0014】さて本発明の他の特徴は、撮像動作と光源
点滅動作の同期を効率よく行い、撮像時間の短縮を図る
点である。カメラ画像の信号は、一般的に画像情報量に
対して画質の良いインターレス走査(図4に示す)方式
が採用されており、図5に示すように画像信号は、奇数
走査線の画面と偶数走査線の画面に分け、交互に転送さ
れる。図5から、1画面を撮像する時間は、奇数画面撮
像時間(O1,…)、又は偶数画面撮像時間(E1 ,
…)単独では2/60秒であるが、完全な画面にするに
は両方を合成しなければならないので、3/60秒かか
ることになる。また奇数画面撮像時間後に奇数画面画像
信号(o1,…)を転送し、偶数画面撮像時間後に奇数
画面画像信号(e1,…)を転送する。普通に考える
と、上段光源を点灯して3/60秒間で上段光源画像を
撮像し、次に光源を中段に切り換えて次の完全なサイク
ルから中段光源画像を撮る。最後に光源を下段に切り換
え、9/60秒目から下段光源画像を撮り、3枚の画像
を撮り終える。信号が完全に転送を終えるまでには12
/60秒(0.2秒)かかることになる。
Another feature of the present invention is that the imaging operation and the light source blinking operation are efficiently synchronized to shorten the imaging time. For the signal of the camera image, the interlace scanning (shown in FIG. 4) method, which has a good image quality with respect to the image information amount, is generally adopted. As shown in FIG. It is divided into screens of even scanning lines and transferred alternately. From FIG. 5, the time for imaging one screen is the odd screen imaging time (O1, ...) Or the even screen imaging time (E1,
...) It takes 2/60 seconds by itself, but it takes 3/60 seconds because both have to be combined to form a complete screen. Further, the odd screen image signals (o1, ...) Are transferred after the odd screen image pickup time, and the odd screen image signals (e1, ...) Are transferred after the even screen image pickup time. In general terms, the upper light source is turned on to capture the upper light source image in 3/60 seconds, then the light source is switched to the middle light stage and the middle light source image is taken from the next complete cycle. Finally, the light source is switched to the lower stage, and the lower stage light source image is taken from 9/60 seconds, and the three images are finished. 12 by the time the signal is completely transferred
/ 60 seconds (0.2 seconds).

【0015】本発明でもインターレス走査方式を採用し
ているが、画像信号の転送方式は、前記図5の場合とは
異なっている。図6に本発明による動作タイミングを示
す。白黒カメラのエリアCCD上の奇数画像走査用セル
と偶数画像走査用セルの撮像時間は半周期ずれている
が、残りの半周期は重畳しており共通である。この共通
タイミングで発光ダイオードを点灯することにより、同
じ条件で奇数/偶数走査画面上に露光できる。
The present invention also employs the interlace scanning method, but the image signal transfer method is different from that in the case of FIG. FIG. 6 shows the operation timing according to the present invention. The imaging times of the odd-numbered image scanning cells and the even-numbered image scanning cells on the area CCD of the monochrome camera are shifted by a half cycle, but the remaining half cycles are overlapped and are common. By lighting the light emitting diodes at this common timing, exposure can be performed on the odd / even scanning screen under the same conditions.

【0016】まず奇数画面撮像時間の半周期は消灯した
ままであり、偶数画面撮像時間の開始から奇数画面撮像
時間の終了までのA−a間に上段のリング状光源20a
を点灯する。この時の撮像信号は、奇数走査画像信号、
偶数走査画像信号のタイミングで出力する。光源が消灯
している時間は暗いのでCCDに充電される画像の光量
は殆ど無視できる値であり、撮像信号の殆どは上段のリ
ング状光源20cを点灯した時のものである。続いてB
−b間に中段のリング状光源20bを点灯し、中段光源
による画像を撮る。最後にC−c間に下段のリング状光
源20cを点灯し、下段光源による画像を得る。この
間、無駄な露出時間を見送る必要もなく、3枚の画像を
取り込むに必要な時間は8/60秒(約0.13秒)で
済む。
First, half of the odd screen image pickup time remains off, and the upper ring light source 20a is provided between Aa from the start of the even screen image pickup time to the end of the odd screen image pickup time.
Lights up. The image pickup signal at this time is an odd scan image signal,
Output at the timing of the even scan image signal. Since the time when the light source is off is dark, the light amount of the image charged in the CCD is a value that can be almost ignored, and most of the image pickup signals are when the upper ring-shaped light source 20c is turned on. Then B
The ring-shaped light source 20b in the middle stage is turned on between -b, and an image is taken by the middle-stage light source. Finally, the lower ring-shaped light source 20c is turned on between C and c to obtain an image by the lower light source. During this time, there is no need to forgo the unnecessary exposure time, and the time required to capture the three images is 8/60 seconds (about 0.13 seconds).

【0017】上記の実施例ではリング状光源を3段に配
置しているが、2段あるいは4段等でもよい。
Although the ring-shaped light sources are arranged in three stages in the above embodiment, they may be arranged in two stages or four stages.

【0018】[0018]

【発明の効果】本発明は上記のように、多数の発光ダイ
オードを並べた複数段の光源と白黒カメラとを組み合わ
せたことにより、各光源の点滅切り換えを高速で行うこ
とができ、且つ画素分解能が高く、高品質の画像が得ら
れる。しかも本発明では、各光源の点滅動作とCCDセ
ルの画像露出時間の同期を効率よく行っているため、撮
影時間を大幅に短縮でき、例えば画像3枚の場合に約
0.13秒となり、充分実用に耐えうる速度で画像信号
が転送可能である。
As described above, according to the present invention, by combining a plurality of light sources in which a large number of light emitting diodes are arranged and a monochrome camera, blinking switching of each light source can be performed at high speed, and pixel resolution is high. High quality images can be obtained. Moreover, in the present invention, since the blinking operation of each light source and the image exposure time of the CCD cell are efficiently synchronized, the photographing time can be greatly shortened. For example, in the case of 3 images, it takes about 0.13 seconds, which is sufficient. Image signals can be transferred at a speed that can be used practically.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明で用いる半田付け外観検査装置の一例の
説明図。
FIG. 1 is an explanatory diagram of an example of a soldering appearance inspection device used in the present invention.

【図2】その照明・検査動作の説明図。FIG. 2 is an explanatory diagram of the illumination / inspection operation.

【図3】各光源による半田付け部位の画像の説明図。FIG. 3 is an explanatory diagram of an image of a soldered portion by each light source.

【図4】カメラ画像と走査線との関係を示す説明図。FIG. 4 is an explanatory diagram showing a relationship between a camera image and scanning lines.

【図5】カメラ画像の出力シーケンス図。FIG. 5 is an output sequence diagram of a camera image.

【図6】本発明による撮像と画像信号転送の動作タイミ
ングの説明図。
FIG. 6 is an explanatory diagram of operation timings of image pickup and image signal transfer according to the present invention.

【符号の説明】[Explanation of symbols]

10 プリント配線基板 12 電子部品 20a,20b,20c リング状光源 22 白黒カメラ 24 画像処理プロセッサ 26a,26b,26c フレームメモリ 28 切換え制御回路 10 Printed Wiring Board 12 Electronic Components 20a, 20b, 20c Ring Light Source 22 Monochrome Camera 24 Image Processor 26a, 26b, 26c Frame Memory 28 Switching Control Circuit

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 // H05K 3/34 W 9154−4E ─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 5 Identification number Office reference number FI technical display location // H05K 3/34 W 9154-4E

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 半田付け部位に対して入射角が異なるよ
うに複数のリング状光源を配設すると共に半田付け部位
に対向するようにテレビカメラを配置し、各光源を時間
的に異なるタイミングで順次点灯・消灯させて、各点灯
タイミングで得た画像情報を対応するフレームメモリに
格納し、それらの画像特徴から半田付けの良否を判定す
る方法において、前記リング状光源は多数の発光ダイオ
ードをリング状に配列した構造であり、テレビカメラは
CCD単板の白黒カメラであって、撮像にインターレス
走査方式を採用し、奇数画面撮像時間と偶数画像撮像時
間が重畳した半周期のみリング状光源を点灯して白黒カ
メラに露光し、その奇数画面撮像信号と偶数画面撮像信
号を次の1周期の間にフレームメモリに転送することを
特徴とする半田付け外観検査方法。
1. A plurality of ring-shaped light sources are arranged so that the incident angles are different with respect to the soldering portion, and a TV camera is arranged so as to face the soldering portion. In the method of sequentially turning on / off the light, storing the image information obtained at each lighting timing in the corresponding frame memory, and judging the quality of soldering from those image features, in the ring-shaped light source, a large number of light-emitting diodes are ringed. The TV camera is a black and white CCD single-panel camera, and the interlaced scanning method is used for imaging, and the ring-shaped light source is used only for a half cycle in which odd screen image capturing time and even image capturing time are superimposed. Soldering characterized by lighting and exposing to a black-and-white camera, and transferring the odd screen image pickup signal and the even screen image pickup signal to the frame memory during the next one cycle Appearance inspection method.
【請求項2】 直径が順に大きくなる3種類のリング状
光源を、それらの中心軸が一致するように上段、中段、
下段に配置して、中心軸線上に白黒カメラを設置し、前
記各リング状光源は、下端が開放したチャンネル状カバ
ー部材内に、多数の発光ダイオードを下向きに近接整列
した構造の装置を用いる請求項1記載の半田付け外観検
査方法。
2. Three types of ring-shaped light sources whose diameters increase in order are arranged so that their central axes coincide with each other.
A device having a structure in which a black-and-white camera is installed on the lower axis and a black-and-white camera is installed on the central axis, and each of the ring-shaped light sources has a structure in which a large number of light-emitting diodes are closely aligned downward in a channel-shaped cover member having an open lower end Item 1. The soldering appearance inspection method according to Item 1.
JP4242819A 1992-08-19 1992-08-19 Solder appearance inspection method Expired - Lifetime JP2741463B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4242819A JP2741463B2 (en) 1992-08-19 1992-08-19 Solder appearance inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4242819A JP2741463B2 (en) 1992-08-19 1992-08-19 Solder appearance inspection method

Publications (2)

Publication Number Publication Date
JPH0666534A true JPH0666534A (en) 1994-03-08
JP2741463B2 JP2741463B2 (en) 1998-04-15

Family

ID=17094767

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4242819A Expired - Lifetime JP2741463B2 (en) 1992-08-19 1992-08-19 Solder appearance inspection method

Country Status (1)

Country Link
JP (1) JP2741463B2 (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0835933A (en) * 1994-07-22 1996-02-06 Nippon Components Kk Camera apparatus for tube-inside inspection
WO2001029542A1 (en) * 1999-10-18 2001-04-26 Mv Research Limited Machine vision
WO2002018913A3 (en) * 2000-09-01 2003-02-27 Color Kinetics Inc Systems and methods for providing illumination in machine vision systems
WO2004029548A1 (en) * 2002-09-26 2004-04-08 Intek Plus Co., Ltd Apparatus and method for capturing images from a camera
WO2007046601A1 (en) * 2005-10-19 2007-04-26 Intekplus Co., Ltd. Apparatus for and method of measuring image
JP2008084330A (en) * 2007-10-18 2008-04-10 Fujitsu Ltd Photographing device and personal identification system
KR101293547B1 (en) * 2011-12-19 2013-08-07 주식회사 포스코 Hole detecting apparatus and method using cross light source
CN104568964A (en) * 2014-12-24 2015-04-29 昆山元茂电子科技有限公司 Printed circuit board appearance detection device and method
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Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0835933A (en) * 1994-07-22 1996-02-06 Nippon Components Kk Camera apparatus for tube-inside inspection
WO2001029542A1 (en) * 1999-10-18 2001-04-26 Mv Research Limited Machine vision
US6983066B2 (en) 1999-10-18 2006-01-03 Mv Research Limited Machine vision
WO2002018913A3 (en) * 2000-09-01 2003-02-27 Color Kinetics Inc Systems and methods for providing illumination in machine vision systems
WO2004029548A1 (en) * 2002-09-26 2004-04-08 Intek Plus Co., Ltd Apparatus and method for capturing images from a camera
WO2007046601A1 (en) * 2005-10-19 2007-04-26 Intekplus Co., Ltd. Apparatus for and method of measuring image
KR100752758B1 (en) * 2005-10-19 2007-08-29 (주) 인텍플러스 Apparatus and method for measuring image
JP2008084330A (en) * 2007-10-18 2008-04-10 Fujitsu Ltd Photographing device and personal identification system
KR101293547B1 (en) * 2011-12-19 2013-08-07 주식회사 포스코 Hole detecting apparatus and method using cross light source
CN104568964A (en) * 2014-12-24 2015-04-29 昆山元茂电子科技有限公司 Printed circuit board appearance detection device and method
CN110702031A (en) * 2019-11-19 2020-01-17 四川长虹电器股份有限公司 Three-dimensional scanning device and method suitable for dark surface

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