JPH0661341A - Analog array mode integrated circuit - Google Patents

Analog array mode integrated circuit

Info

Publication number
JPH0661341A
JPH0661341A JP20891192A JP20891192A JPH0661341A JP H0661341 A JPH0661341 A JP H0661341A JP 20891192 A JP20891192 A JP 20891192A JP 20891192 A JP20891192 A JP 20891192A JP H0661341 A JPH0661341 A JP H0661341A
Authority
JP
Japan
Prior art keywords
layout
integrated circuit
potential
analog array
elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20891192A
Other languages
Japanese (ja)
Inventor
Teruya Nakajima
輝也 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Engineering Co Ltd
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Engineering Co Ltd
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Engineering Co Ltd, Mitsubishi Electric Corp filed Critical Mitsubishi Electric Engineering Co Ltd
Priority to JP20891192A priority Critical patent/JPH0661341A/en
Publication of JPH0661341A publication Critical patent/JPH0661341A/en
Pending legal-status Critical Current

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  • Semiconductor Integrated Circuits (AREA)
  • Element Separation (AREA)

Abstract

PURPOSE:To enable the freedom on the layout of element connection layout in wiring step to be enhanced furthermore, the isolated potential to be picked-up in arbitrary positions. CONSTITUTION:Within the analog array mode integrated circuit, a diffused part 4 for isolated potential contact is laid out in the whose region of isolated parts 1 between elements 2 in a chip. Through these procedures, any more complicated wirings than those of conventional ones can be eliminated thereby enabling the delivery time cut down for the layout design.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、素子間分離電位コン
タクトを拡散部によりとるようにしたアナログアレイ方
式集積回路に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an analog array type integrated circuit in which element isolation potential contacts are provided by diffusion portions.

【0002】[0002]

【従来の技術】図2は従来のアナログアレイ方式集積回
路の製造工程に用いられるチップ上のレイアウトを示す
平面図であり、図において、2はバイポーラトランジス
タ,抵抗等の素子、3は素子2を取囲むエピ部(エピタ
キシャル部)、1は素子2間を分離する分離部、5は分
離部1に設けられる配線部、4は分離部1に設けられる
分離電位コンタクト用の拡散部、6は拡散部4に設ける
分離電位用のコンタクトホール部である。
2. Description of the Related Art FIG. 2 is a plan view showing a layout on a chip used in a manufacturing process of a conventional analog array type integrated circuit. In the figure, 2 is an element such as a bipolar transistor and a resistor, and 3 is an element 2. Surrounding epi part (epitaxial part), 1 is a separation part for separating the elements 2, 5 is a wiring part provided in the separation part 1, 4 is a diffusion part for a separation potential contact provided in the separation part 1, and 6 is a diffusion This is a contact hole portion for the separation potential provided in the portion 4.

【0003】次に動作について説明する。従来のレイア
ウト設計の手法では、素子間分離に電流を流し出す素子
2や、隣接する素子間分離の電位が変動すると不具合を
生じる素子2は、予めレイアウトされた分離電位コンタ
クト用の拡散部4に隣接しかつ配線部5のレイアウトが
可能な場所に限定されていた。
Next, the operation will be described. According to the conventional layout design method, the element 2 which sends out a current for element isolation and the element 2 which causes a problem when the potential of the element isolation adjacent to each other fluctuates in the diffusion section 4 for the isolation potential contact which is laid out in advance. It has been limited to a place adjacent to and in which the layout of the wiring portion 5 is possible.

【0004】[0004]

【発明が解決しようとする課題】従来のアナログアレイ
方式集積回路は以上のように構成されているので、レイ
アウト設計を行う場合、素子間分離とその分離電位を取
るための配線とのコンタクトを取ることが可能なのは、
予めレイアウトされた分離電位コンタクト用の拡散部4
に隣接してレイアウトしなければならないといった制限
が生じるため、このような素子2が回路設計上多くなる
と、予め準備されたレイアウトでの対応が困難になり、
予め準備されたレイアウト上に使用できない素子2が増
えるなどの問題点があった。また予めレイアウトされた
分離電位コンタクト用の拡散部4の電位を取るための配
線工程においてもレイアウト上の制限が発生しやすい等
の問題点があった。
Since the conventional analog array type integrated circuit is constructed as described above, when the layout is designed, the element isolation and the wiring for obtaining the isolation potential are contacted. It is possible to
Diffusion part 4 for separation potential contact which is laid out in advance
However, if the number of such elements 2 increases in the circuit design, it becomes difficult to deal with the layout prepared in advance.
There is a problem that the number of elements 2 that cannot be used increases on the layout prepared in advance. In addition, there is a problem that the layout is likely to be restricted even in the wiring process for taking the potential of the diffusion portion 4 for the separated potential contact which is laid out in advance.

【0005】この発明は上記のような問題点を解消する
ためになされたもので、分離電位を隣接して取らなけれ
ばならない素子などのレイアウト上の自由度を向上し、
また、任意の場所で分離電位を取ることのできるアナロ
グアレイ方式集積回路を得ることを目的とする。
The present invention has been made in order to solve the above-mentioned problems, and improves the degree of freedom in layout of elements or the like which must have isolation potentials adjacent to each other,
Another object of the present invention is to obtain an analog array integrated circuit capable of taking a separation potential at any place.

【0006】[0006]

【課題を解決するための手段】この発明に係るアナログ
アレイ方式集積回路は、素子間分離電位コンタクト用の
拡散部をチップ内全域の素子間分離上にレイアウトした
ものである。
In the analog array integrated circuit according to the present invention, a diffusion portion for element isolation potential contact is laid out on element isolation over the entire area of the chip.

【0007】[0007]

【作用】この発明におけるアナログアレイ方式集積回路
は、分離電位を隣接して取らなければならない素子など
のレイアウト上の自由度が向上し、また、任意の場所で
分離電位を取ることが可能になるため、予め準備された
素子を配線工程で結線する場合に素子を有効に使用で
き、かつ、分離電位を取るための配線部のレイアウトも
極めて容易になる。
In the analog array integrated circuit according to the present invention, the degree of freedom in the layout of elements or the like that must be separated adjacent to each other is improved, and the separated potential can be taken at any place. Therefore, the elements can be effectively used when connecting the elements prepared in advance in the wiring step, and the layout of the wiring portion for taking the separation potential becomes extremely easy.

【0008】[0008]

【実施例】実施例1.以下、この発明の一実施例を図に
ついて説明する。図1において、1〜6は図1の従来の
レイアウトにおける各部と同一のものである。図1との
違いは、分離部1の全域に斜線で示すように分離電位コ
ンタクト用の拡散部4をレイアウトした点にある。
EXAMPLES Example 1. An embodiment of the present invention will be described below with reference to the drawings. In FIG. 1, 1 to 6 are the same as those in the conventional layout of FIG. The difference from FIG. 1 is that a diffusion portion 4 for isolation potential contact is laid out as shown by hatching in the entire area of the isolation portion 1.

【0009】次に動作について説明する。図1は、図2
で説明した分離部1の全域に分離電位コンタクト用の拡
散部4をレイアウトしたものである。これにより、トラ
ンジスタや抵抗を予めレイアウトされたマスター工程で
のウエハに、配線部5等のスライス工程でのレイアウト
により素子2を接続し回路を構成する場合に、素子間分
離に電流を流し出す素子や隣接する素子間分離の電位が
変動すると不具合を生じる素子が多くなっても、それら
の素子のレイアウト上の自由度が増し、上記マスター工
程で用いられるマスター素子の利用率が向上する。さら
に任意の場所で分離電位を取ることが可能になるので配
線部5のレイアウトも容易になる。
Next, the operation will be described. 1 is shown in FIG.
The diffusion portion 4 for the separation potential contact is laid out in the entire area of the separation portion 1 described in 1. Thus, when a circuit is formed by connecting the element 2 to the wafer in the master step in which transistors and resistors are laid out in advance in the master step by the layout in the slicing step of the wiring portion 5 and the like, an element for sending out a current for element isolation. Even if the number of elements that become defective when the potential of separation between adjacent elements changes, the degree of freedom in layout of these elements increases, and the utilization rate of the master element used in the master process is improved. Furthermore, since the separation potential can be taken at any place, the layout of the wiring section 5 can be facilitated.

【0010】[0010]

【発明の効果】以上のように、この発明によれば、素子
間分離電位コンタクト用の拡散部をチップ用全域の素子
間分離部に設ける構成としたので、分離電位を隣接して
取らなければならない素子などのレイアウトの自由度が
増すため、マスター素子の利用率が向上する。さらに任
意の場所で分離電位を取ることが可能になるので、配線
部のレイアウトも容易になる等の効果がある。
As described above, according to the present invention, since the diffusion portion for the element isolation potential contact is provided in the element isolation portion over the entire area of the chip, the isolation potential must be taken adjacently. Since the degree of freedom in the layout of elements that cannot be used is increased, the utilization rate of the master element is improved. Further, since it is possible to take the separation potential at an arbitrary place, there is an effect that the layout of the wiring portion is easy.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の一実施例を示す平面図である。FIG. 1 is a plan view showing an embodiment of the present invention.

【図2】従来のアナログアレイ方式集積回路の製造工程
におけるレイアウトを示す平面図である。
FIG. 2 is a plan view showing a layout in a manufacturing process of a conventional analog array integrated circuit.

【符号の説明】[Explanation of symbols]

1 分離部 2 素子 4 拡散部 1 Separation part 2 element 4 Diffusion part

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 チップ上に複数個の素子を分離部を介し
て配設したアナログアレイ方式集積回路において、素子
間分離電位をとるための分離電位コンタクト用の拡散部
を上記チップ上の全域における上記分離部に設けたこと
を特徴とするアナログアレイ方式集積回路。
1. An analog array integrated circuit in which a plurality of elements are arranged on a chip via a separation section, and a diffusion section for a separation potential contact for taking a separation potential between elements is provided in the entire area on the chip. An analog array integrated circuit provided in the separation section.
JP20891192A 1992-08-05 1992-08-05 Analog array mode integrated circuit Pending JPH0661341A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20891192A JPH0661341A (en) 1992-08-05 1992-08-05 Analog array mode integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20891192A JPH0661341A (en) 1992-08-05 1992-08-05 Analog array mode integrated circuit

Publications (1)

Publication Number Publication Date
JPH0661341A true JPH0661341A (en) 1994-03-04

Family

ID=16564165

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20891192A Pending JPH0661341A (en) 1992-08-05 1992-08-05 Analog array mode integrated circuit

Country Status (1)

Country Link
JP (1) JPH0661341A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100890978B1 (en) * 2001-02-15 2009-03-27 아이피알 라이센싱, 인코포레이티드 A dual proxy approach to tcp performance improvements over a wireless interface

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100890978B1 (en) * 2001-02-15 2009-03-27 아이피알 라이센싱, 인코포레이티드 A dual proxy approach to tcp performance improvements over a wireless interface

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