JPH0658966A - Method and equipment for wiring test - Google Patents

Method and equipment for wiring test

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Publication number
JPH0658966A
JPH0658966A JP4214397A JP21439792A JPH0658966A JP H0658966 A JPH0658966 A JP H0658966A JP 4214397 A JP4214397 A JP 4214397A JP 21439792 A JP21439792 A JP 21439792A JP H0658966 A JPH0658966 A JP H0658966A
Authority
JP
Japan
Prior art keywords
resistance
measuring
resistance value
correction
correcting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4214397A
Other languages
Japanese (ja)
Inventor
Takeo Ogawa
武男 小川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP4214397A priority Critical patent/JPH0658966A/en
Publication of JPH0658966A publication Critical patent/JPH0658966A/en
Pending legal-status Critical Current

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  • Measurement Of Resistance Or Impedance (AREA)

Abstract

PURPOSE:To measure resistance of wiring highly accurately in a short time by selecting the correcting resistance upto measuring points selected through a selecting means based on first and second selecting signals and then measuring an actual resistance between measuring points based on a measured resistance and a correcting resistance. CONSTITUTION:A wiring tester 21 delivers a FROM switch control signal and a TO switch control signal to a measuring point selecting circuit 23 based on data of a test data file 27 read in through a control section 22 in order to select an arbitrary measuring point upto measuring points o-n. At the same time, a FROM switch control signal is input to the FRM correcting resistance memory section of a correction data setting circuit 26 and a TO switch signal is input to a TO correcting resistance memory section. Consequently, a correcting resistance is selected and fed to a resistance correcting section 25. On the other hand, the control section 22 controls a resistance measuring section 24 with a measuring section control signal to measure the resistances between measuring points (1-3) and thus measured resistances are fed to a correcting section 25. The correcting section 25 subtracts the correcting resistance from the measured resistance to determine an actual wiring resistance which is then notified to the control section 22.

Description

【発明の詳細な説明】Detailed Description of the Invention

【０００１】[0001]

【産業上の利用分野】本発明は、配線板の配線状態を試
験する配線試験方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring test method for testing the wiring condition of a wiring board.

【０００２】近年、配線試験装置の主たる試験対象であ
るプリント配線板は、製品のダウンサイジング化に伴
い、小型化、高密度化しており、その配線パターンが微
細化してきている。In recent years, a printed wiring board, which is a main test object of a wiring test apparatus, has become smaller and higher in density with downsizing of products, and its wiring pattern has become finer.

【０００３】そのため、製造品質を保証するためには、
プリント配線板の配線パターン間の配線抵抗を高精度に
測定する必要があると共に、短時間による抵抗測定が望
まれている。Therefore, in order to guarantee the manufacturing quality,
It is necessary to measure the wiring resistance between the wiring patterns of the printed wiring board with high accuracy, and it is desired to measure the resistance in a short time.

【０００４】[0004]

【従来の技術】従来、プリント配線板の配線パターン間
の配線抵抗を高精度に測定するものとして、測定点ごと
に抵抗補正を行う配線試験装置が知られている（例え
ば、特開平２−２９７０７２号等）。2. Description of the Related Art Conventionally, as a device for measuring the wiring resistance between wiring patterns on a printed wiring board with high accuracy, a wiring tester for correcting resistance at each measurement point is known (for example, Japanese Patent Laid-Open No. 297072). Etc.).

【０００５】そこで、図５に、従来の配線試験装置の構
成図を示す。図５の配線試験装置１１は、大別して制御
部１２，測定点選択回路１３，抵抗測定部１４，及び抵
抗補正部１５とで構成され、制御部１２には、外部装置
として補正データファイル１６及び試験データファイル
１７が接続される。Therefore, FIG. 5 shows a block diagram of a conventional wiring test apparatus. The wiring test apparatus 11 of FIG. 5 is roughly divided into a control unit 12, a measurement point selection circuit 13, a resistance measurement unit 14, and a resistance correction unit 15, and the control unit 12 includes a correction data file 16 and an external device as an external device. The test data file 17 is connected.

【０００６】測定点選択回路１３は、（ｎ＋１）個のフ
ロム（ＦＲＯＭ）スイッチＳＦ０〜ＳＦｎ，及びトウ
（ＴＯ）スイッチＳＴ０〜ＳＴｎが各段で直列に接続さ
れて、抵抗測定部１４に並列に配線接続される。そし
て、ＦＲＯＭスイッチＳＦ０〜ＳＦｎとＴＯスイッチＳ
Ｔ０〜ＳＴｎとの接続点からは、被試験対象（図示せ
ず）に接続するための接続端子０〜ｎに配線接続され
る。The measurement point selection circuit 13 includes (n + 1) FROM (SFROM) switches SF0 to SFn and toe (TO) switches ST0 to STn connected in series at each stage, and in parallel with the resistance measuring unit 14. Wiring connected. The FROM switches SF0 to SFn and the TO switch S
From the connection point with T0 to STn, wiring is connected to the connection terminals 0 to n for connecting to the test object (not shown).

【０００７】このような配線試験装置１１は、制御部１
２で読み込んだ試験データファイル１７のデータに基づ
いて測定点選択回路１３を切替えて被試験対象に接続
し、抵抗値を測定する。制御部１２では選択した測定点
の補正抵抗値を補正データファイルより読み込み、抵抗
補正部１５に出力する。この補正抵抗値は、抵抗測定部
１４から測定点選択回路１３を介して接続端子０〜ｎま
での配線抵抗である。抵抗補正部１５では、送られてき
た補正抵抗値に基づいて抵抗測定部４から送られてきた
抵抗測定値を補正して制御部１２に送るものである。The wiring test apparatus 11 as described above includes the control unit 1
Based on the data of the test data file 17 read in 2, the measurement point selection circuit 13 is switched and connected to the test object, and the resistance value is measured. The control unit 12 reads the corrected resistance value of the selected measurement point from the correction data file and outputs it to the resistance correction unit 15. This corrected resistance value is the wiring resistance from the resistance measuring unit 14 to the connection terminals 0 to n via the measurement point selection circuit 13. The resistance correction unit 15 corrects the resistance measurement value sent from the resistance measurement unit 4 based on the sent correction resistance value and sends it to the control unit 12.

【０００８】例えば、測定点１と３の間の抵抗Ｒを測定
するという試験データが入力されたとする。For example, it is assumed that test data for measuring the resistance R between the measurement points 1 and 3 is input.

【０００９】制御部１２では、測定点１を抵抗測定部１
４のＦＲＯＭ（＋）側に接続するために、測定点選択回
路１３のスイッチＳＦ１がＯＮになるように、ＦＲＯＭ
スイッチ制御信号を送出する。同様に、測定点３をＴＯ
（−）側に接続するために、ＴＯスイッチ制御信号を送
出する。In the control unit 12, the measuring point 1 is changed to the resistance measuring unit 1
4 so that the switch SF1 of the measurement point selection circuit 13 is turned on in order to connect to the FROM (+) side of the FROM.
Send a switch control signal. Similarly, measurement point 3 is set to TO
A TO switch control signal is sent to connect to the (-) side.

【００１０】次に、補正データファイル１６より、測定
点１のＦＲＯＭ側の補正抵抗値ＲＦ１と、測定点３のＴ
Ｏ側の補正抵抗値ＲＴ３を読み出し、抵抗補正部１５に
出力後、抵抗測定部１４に測定開始信号を送出する。Next, from the correction data file 16, the correction resistance value RF1 on the FROM side of the measurement point 1 and the T of the measurement point 3 are measured.
The correction resistance value RT3 on the O side is read out, output to the resistance correction unit 15, and then a measurement start signal is sent to the resistance measurement unit 14.

【００１１】抵抗測定部１４で測定された抵抗値Ｒ
X は、抵抗測定部１４のＦＲＯＭ側からスイッチＳＦ１
を通り、測定点１まで接続される配線抵抗ＲＦ１と、測
定対象である抵抗Ｒと、ＴＯ側からスイッチＳＦ３を通
り、測定点１まで接続される配線抵抗ＲＴ３を加えたも
のなっている。この配線抵抗分の測定誤差をなくすた
め、抵抗補正部１４では、測定値ＲX から配線抵抗分の
補正抵抗値ＲＦ１＋ＲＴ３を減算して、制御部１２へ通
知するものである。The resistance value R measured by the resistance measuring unit 14
X is a switch SF1 from the FROM side of the resistance measuring unit 14.
A wiring resistance RF1 connected to the measurement point 1 through the resistor R, a resistance R to be measured, and a wiring resistance RT3 connected to the measurement point 1 from the TO side through the switch SF3. In order to eliminate the measurement error of the wiring resistance, the resistance correction unit 14 subtracts the correction resistance value RF1 + RT3 of the wiring resistance from the measured value R X and notifies the control unit 12 of the subtraction.

【００１２】[0012]

【発明が解決しようとする課題】しかしながら、上述の
ように、選択された測定点に対応する補正抵抗値を補正
データファイル１６から読み込み、その抵抗値を抵抗補
正部１５に出力している。例えば、このときに要する時
間を１ｍｓとすると、測定対象のプリント配線板上の数
千〜数万の測定点間の抵抗を測定する場合には、抵抗補
正のためだけに数秒〜数十秒もの時間がかかってしまう
という問題がある。However, as described above, the correction resistance value corresponding to the selected measurement point is read from the correction data file 16 and the resistance value is output to the resistance correction unit 15. For example, assuming that the time required at this time is 1 ms, when measuring the resistance between thousands to tens of thousands of measurement points on the printed wiring board to be measured, several seconds to several tens of seconds are required only for resistance correction. There is a problem that it takes time.

【００１３】そこで、本発明は上記課題に鑑みなされた
もので、高精度かつ短時間に配線の抵抗測定を行う配線
試験方法を提供することを目的とする。Therefore, the present invention has been made in view of the above problems, and an object thereof is to provide a wiring test method for measuring the resistance of a wiring with high accuracy and in a short time.

【００１４】[0014]

【課題を解決するための手段】図１に、本発明の原理説
明図を示す。図１において、第１のステップでは、複数
の測定点を有し、制御手段が試験データに基づいて、第
１及び第２の選択信号により測定点選択手段で該測定点
の何れかを選択する。第２のステップでは、該選択され
た測定点間の抵抗値を測定手段により測定すると共に、
予め設定されている該測定手段から対応する該測定点ま
での補正抵抗値を該第１及び第２の選択信号により選択
する。そして、第３のステップでは、該測定手段により
測定された抵抗値と該補正抵抗値とにより、該測定点間
の実際の抵抗値を算出する。FIG. 1 is a diagram for explaining the principle of the present invention. In FIG. 1, the first step has a plurality of measurement points, and the control means selects one of the measurement points by the measurement point selection means by the first and second selection signals based on the test data. . In the second step, the resistance value between the selected measurement points is measured by the measuring means, and
A correction resistance value from the preset measuring means to the corresponding measuring point is selected by the first and second selection signals. Then, in the third step, the actual resistance value between the measurement points is calculated from the resistance value measured by the measuring means and the corrected resistance value.

【００１５】この場合、上述の配線試験方法を実現する
ための配線試験装置は、複数の測定点を有し、該測定点
の何れかを選択する測定点選択手段と、試験データに基
づいて第１及び第２の選択信号により、該測定点選択手
段で何れかの該測定点を選択させる制御手段と、該制御
手段からの測定信号により、該測定点選択手段を介して
該選択された測定点間の抵抗値を測定する測定手段と、
予め、該測定手段から、該測定点選択手段を介在させた
該測定点までの補正抵抗値を対応する組合せで有すると
共に、前記第１及び第２の選択信号により、該測定手段
から選択された該測定点までの補正抵抗値を選択する補
正設定手段と、該測定手段で測定された抵抗値と、該補
正設定手段で選択された補正抵抗値とにより、該測定点
間の実際の抵抗値を算出する抵抗補正手段と、で構成さ
れる。In this case, the wiring test apparatus for realizing the above-mentioned wiring test method has a plurality of measurement points, and a measurement point selection means for selecting any one of the measurement points and a first step based on the test data. Control means for selecting one of the measurement points by the measurement point selection means by the first and second selection signals, and the selected measurement through the measurement point selection means by the measurement signal from the control means. Measuring means for measuring the resistance value between the points,
The correction resistance values from the measuring means to the measuring point via the measuring point selecting means are provided in advance in a corresponding combination, and selected from the measuring means by the first and second selection signals. The actual resistance value between the measurement points is determined by the correction setting unit that selects the correction resistance value up to the measurement point, the resistance value measured by the measurement unit, and the correction resistance value selected by the correction setting unit. And a resistance correction means for calculating

【００１６】[0016]

【作用】図１に示すように、測定点を第１及び第２の選
択信号で選択するに際し、この第１及び第２の選択信号
で、予め設定されている測定手段から選択された測定点
までの補正抵抗値を選択する。そして、測定された抵抗
値と補正抵抗値とから、測定点間の実際の抵抗値を測定
する。As shown in FIG. 1, when selecting a measurement point with the first and second selection signals, the measurement point selected from the preset measuring means by the first and second selection signals. Select the correction resistance value up to. Then, the actual resistance value between the measurement points is measured from the measured resistance value and the corrected resistance value.

【００１７】これにより、制御手段は、補正抵抗値を個
々に読み込んで補正データとして送出する必要がなく、
測定時間の短縮を図ることが可能となる。すなわち、高
精度かつ短時間に配線の抵抗測定を行うことが可能とな
るものである。As a result, the control means does not need to read the correction resistance values individually and send them as correction data.
It is possible to reduce the measurement time. That is, the resistance of the wiring can be measured with high accuracy and in a short time.

【００１８】[0018]

【実施例】図２に、本発明の一実施例の構成図を示す。
図２は、配線試験装置２１の構成を示したもので、制御
手段である制御部２２，測定点選択手段である測定点選
択回路２３，抵抗測定手段である抵抗測定部２４，抵抗
補正手段である抵抗補正部２５，補正設定手段である補
正データ設定回路２６により構成され、制御部２２には
外部装置として、試験データファイル２７が接続され
る。FIG. 2 shows a block diagram of an embodiment of the present invention.
FIG. 2 shows the configuration of the wiring test apparatus 21, which includes a control unit 22 as a control unit, a measurement point selection circuit 23 as a measurement point selection unit, a resistance measurement unit 24 as a resistance measurement unit, and a resistance correction unit. It is composed of a resistance correction unit 25 and a correction data setting circuit 26 which is a correction setting means, and a test data file 27 is connected to the control unit 22 as an external device.

【００１９】測定点選択回路２３は前述と同様に（ｎ＋
１）個のフロム（ＦＲＯＭ）スイッチＳＦ０〜ＳＦｎ，
及びトウ（ＴＯ）スイッチＳＴ０〜ＳＴｎが各段で直列
に接続されて、抵抗測定部１４に並列に配線接続され
る。そして、ＦＲＯＭスイッチＳＦ０〜ＳＦｎとＴＯス
イッチＳＴ０〜ＳＴｎとの接続点からは被試験対象（図
示せず）に接続するための接続端子（測定点）０〜ｎに
配線接続される。The measurement point selection circuit 23 has (n +
1) From (SFROM) switches SF0 to SFn,
And the toe (TO) switches ST0 to STn are connected in series at each stage, and are connected in parallel to the resistance measuring unit 14. Then, from the connection points of the FROM switches SF0 to SFn and the TO switches ST0 to STn, wiring connections are made to connection terminals (measurement points) 0 to n for connecting to an object to be tested (not shown).

【００２０】ここで、図３に図２の補正データ設定回路
の構成図を示し、図４に図３の記憶部を説明するための
図を示す。Here, FIG. 3 shows a block diagram of the correction data setting circuit of FIG. 2, and FIG. 4 shows a diagram for explaining the storage section of FIG.

【００２１】図３において、補正データ設定回路２６
は、ＦＲＯＭ補正抵抗値記憶部３１，ＴＯ補正抵抗値記
憶部３２，及び演算部３３により構成される。In FIG. 3, the correction data setting circuit 26
Is composed of a FROM correction resistance value storage unit 31, a TO correction resistance value storage unit 32, and a calculation unit 33.

【００２２】ＦＲＯＭ補正抵抗値記憶部３１は、ＲＯ
Ｍ，ＲＡＭ等のメモリで構成され、図４（Ａ）に示すよ
うに、アドレス番号と同一番号のスイッチＳＦ０からＳ
Ｆｎがオン状態になったときの補正抵抗値が記憶されて
いる。例えば、スイッチＳＦ０がオンしたときとして、
抵抗測定部ＦＲＯＭ側からスイッチＳＦ０を介して測定
点０までの抵抗値が記憶される。The FROM correction resistance value storage unit 31 stores RO
As shown in FIG. 4A, the switches SF0 to S having the same number as the address number are constituted by memories such as M and RAM.
The correction resistance value when Fn is turned on is stored. For example, when the switch SF0 is turned on,
The resistance value from the resistance measuring unit FROM side to the measurement point 0 is stored via the switch SF0.

【００２３】また、ＴＯ補正抵抗値記憶部３２も同様に
ＲＯＭ，ＲＡＭ等のメモリで構成され、図４に示すよう
に、アドレス番号を同一番号のスイッチＳＴ０〜ＳＴｎ
がオン状態になったときの補正抵抗値が予め記憶されて
いる。例えばスイッチＳＴ０がオンしたときとして測定
点０から抵抗測定部ＴＯ側までの補正抵抗値が予め記憶
されるものである。The TO correction resistance value storage section 32 is also composed of a memory such as a ROM and a RAM, and as shown in FIG. 4, switches ST0 to STn having the same address number.
The correction resistance value when is turned on is stored in advance. For example, when the switch ST0 is turned on, the corrected resistance value from the measurement point 0 to the resistance measuring unit TO side is stored in advance.

【００２４】そして、ＦＲＯＭ補正抵抗値記憶部３１
は、ＦＲＯＭスイッチ制御信号（後述する）により対応
する補正抵抗値が演算部３３に送られ、ＴＯ補正抵抗値
記憶部は、ＴＯスイッチ制御信号（後述する）により対
応する補正抵抗値が演算部３３に送られる。演算部３３
は２つの補正抵抗値を加えて、抵抗補正部２５に出力す
る。Then, the FROM correction resistance value storage unit 31
Corresponds to a correction resistance value sent from the FROM switch control signal (described later) to the calculation unit 33, and the TO correction resistance value storage unit calculates a correction resistance value corresponding to the TO switch control signal (described below). Sent to. Calculation unit 33
Outputs the corrected resistance value to the resistance correction unit 25.

【００２５】このような配線試験装置２１は、制御部２
２で読み込んだ試験データファイル２７のデータに基づ
いて、第１の選択信号であるＦＲＯＭスイッチ制御信号
と、第２の選択信号であるＴＯスイッチ制御信号とを測
定点選択回路２３に送り、測定点０〜ｎまでの任意の測
定点を選択する。The wiring test apparatus 21 as described above includes the control unit 2
Based on the data of the test data file 27 read in 2, the FROM switch control signal which is the first selection signal and the TO switch control signal which is the second selection signal are sent to the measurement point selection circuit 23, and the measurement point is selected. Select any measurement point from 0 to n.

【００２６】これと同時に、ＦＲＯＭスイッチ制御信号
が補正データ設定回路２６のＦＲＯＭ補正抵抗値記憶部
３１に入力されると共に、ＴＯスイッチ制御信号がＴＯ
補正抵抗値記憶部３２に入力される。これにより、図４
（Ａ），（Ｂ）のメモリ内から、補正抵抗値が選択さ
れ、前述のように加えられた補正抵抗値（例えばＲY ＝
ＲＦ１＋ＲＴ１）として抵抗補正部２５に送られる。At the same time, the FROM switch control signal is input to the FROM correction resistance value storage section 31 of the correction data setting circuit 26, and the TO switch control signal is TO.
The corrected resistance value is input to the storage unit 32. As a result, FIG.
The correction resistance value is selected from the memories of (A) and (B), and the correction resistance value added as described above (for example, R Y =
It is sent to the resistance correction unit 25 as RF1 + RT1).

【００２７】一方、制御部２２は、測定部制御信号によ
り抵抗測定部２４を作動させて、選択された測定点間
（１−３）の抵抗を測定させ、測定抵抗値ＲX を得る。
この抵抗値ＲX は抵抗補正部２５に送られる。On the other hand, the control unit 22 operates the resistance measuring unit 24 by the measuring unit control signal to measure the resistance between the selected measuring points (1-3) and obtain the measured resistance value R X.
This resistance value R X is sent to the resistance correction unit 25.

【００２８】抵抗補正部２５では測定抵抗値ＲX より補
正抵抗値ＲY を減算することで、測定点間（１−３）の
実際の抵抗Ｒ（＝ＲX −ＲY ）を配線抵抗値として得、
制御部２２に通知するものである。The resistance correction unit 25 subtracts the corrected resistance value R Y from the measured resistance value R X to obtain the actual resistance R (= R X −R Y ) between the measurement points (1-3). Get as
This is to notify the control unit 22.

【００２９】これにより、被試験対象の配線が、正常か
否か、切断、短絡しているか否かを試験することができ
るものである。As a result, it is possible to test whether or not the wiring to be tested is normal, disconnected or short-circuited.

【００３０】このように、測定抵抗値を補正するために
補正データを読み込みそれを抵抗補正部に出力するとい
う作業がいらないため、抵抗補正を行わない時と同じ試
験時間で、抵抗補正が行え、高精度の抵抗測定が可能と
なる。As described above, since the work of reading the correction data to correct the measured resistance value and outputting it to the resistance correction unit is not required, the resistance correction can be performed in the same test time as when the resistance correction is not performed. Highly accurate resistance measurement is possible.

【００３１】[0031]

【発明の効果】以上のように本発明によれば、測定点を
第１及び第２の選択信号で選択するに際し、この第１及
び第２の選択信号で、予め設定されている測定手段から
選択された測定点までの補正抵抗値を選択し、測定され
た抵抗値と補正抵抗値とから、測定点間の実際の抵抗値
を測定することにより、高精度かつ短時間に配線の抵抗
測定を行うことができる。As described above, according to the present invention, when the measuring point is selected by the first and second selection signals, the measuring means preset by the first and second selection signals are used. By selecting the correction resistance value up to the selected measurement point and measuring the actual resistance value between the measurement points from the measured resistance value and the correction resistance value, the resistance of the wiring can be measured with high accuracy and in a short time. It can be performed.

【図面の簡単な説明】[Brief description of drawings]

【図１】本発明の原理説明図である。FIG. 1 is a diagram illustrating the principle of the present invention.

【図２】本発明の一実施例の構成図である。FIG. 2 is a configuration diagram of an embodiment of the present invention.

【図３】図２の補正データ設定回路の構成図である。FIG. 3 is a configuration diagram of a correction data setting circuit in FIG.

【図４】図３の記憶部を説明するための図である。FIG. 4 is a diagram for explaining a storage unit in FIG.

【図５】従来の配線試験装置の構成図である。FIG. 5 is a configuration diagram of a conventional wiring test apparatus.

【符号の説明】[Explanation of symbols]

２１ 配線試験装置 ２２ 制御部 ２３ 測定点選択回路 ２４ 抵抗測定部 ２５ 抵抗補正部 ２６ 補正データ設定回路 ２７ 試験データファイル ３１ ＦＲＯＭ補正抵抗値記憶部 ３２ ＴＯ補正抵抗値記憶部 ３３ 演算部 21 Wiring test device 22 Control unit 23 Measurement point selection circuit 24 Resistance measurement unit 25 Resistance correction unit 26 Correction data setting circuit 27 Test data file 31 FROM correction resistance value storage unit 32 TO correction resistance value storage unit 33 Calculation unit

Claims (2)

【特許請求の範囲】[Claims] 【請求項１】 複数の測定点（０〜ｎ）を有し、制御手
段（２２）が試験データに基づいて、第１及び第２の選
択信号により測定点選択手段（２３）で該測定点（０〜
ｎ）の何れかを選択するステップと、 該選択された測定点間の抵抗値を測定手段（２４）によ
り測定すると共に、予め設定されている該測定手段（２
４）から対応する該測定点までの補正抵抗値を該第１及
び第２の選択信号により選択するステップと、 該測定手段（２４）により測定された抵抗値と該補正抵
抗値とにより、該測定点間の実際の抵抗値を算出するス
テップと、 を含むことを特徴とする配線試験方法。1. A measuring point selecting means (23) having a plurality of measuring points (0 to n), wherein the control means (22) uses the first and second selection signals based on the test data. (0 to
n), the resistance value between the selected measurement points is measured by the measuring means (24), and the preset measuring means (2)
4) from the corresponding measurement point to the correction resistance value selected by the first and second selection signals; and by the resistance value measured by the measuring means (24) and the correction resistance value, A wiring test method comprising: a step of calculating an actual resistance value between measurement points. 【請求項２】 複数の測定点（０〜ｎ）を有し、該測定
点（０〜ｎ）の何れかを選択する測定点選択手段（２
３）と、 試験データに基づいて第１及び第２の選択信号により、
該測定点選択手段（２３）で何れかの該測定点（０〜
ｎ）を選択させる制御手段（２２）と、 該制御手段（２２）からの測定信号により、該測定点選
択手段（２２）を介して該選択された測定点間の抵抗値
を測定する測定手段（２４）と、 予め、該測定手段（２４）から、該測定点選択手段（２
２）を介在させた該測定点（０〜ｎ）までの補正抵抗値
を対応する組合せで有すると共に、前記第１及び第２の
選択信号により、該測定手段（２４）から選択された該
測定点までの補正抵抗値を選択する補正設定手段（２
６）と、 該測定手段（２４）で測定された抵抗値と、該補正設定
手段（２６）で選択された補正抵抗値とにより、該測定
点間の実際の抵抗値を算出する抵抗補正手段（２５）
と、 を有することを特徴とする配線試験装置。2. A measuring point selecting means (2) having a plurality of measuring points (0 to n) and selecting one of the measuring points (0 to n).
3) and the first and second selection signals based on the test data,
Any one of the measurement points (0 to 0
n) and a measuring means for measuring a resistance value between the selected measuring points via the measuring point selecting means (22) by a measuring signal from the controlling means (22). (24), from the measuring means (24) in advance, the measuring point selecting means (2
2) having corresponding correction resistance values up to the measurement points (0 to n), and the measurement selected from the measurement means (24) by the first and second selection signals. Correction setting means for selecting the correction resistance value up to the point (2
6), the resistance value measured by the measuring means (24), and the correction resistance value selected by the correction setting means (26) to calculate an actual resistance value between the measurement points. (25)
And a wiring test apparatus comprising:
JP4214397A 1992-08-11 1992-08-11 Method and equipment for wiring test Pending JPH0658966A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4214397A JPH0658966A (en) 1992-08-11 1992-08-11 Method and equipment for wiring test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4214397A JPH0658966A (en) 1992-08-11 1992-08-11 Method and equipment for wiring test

Publications (1)

Publication Number Publication Date
JPH0658966A true JPH0658966A (en) 1994-03-04

Family

ID=16655115

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4214397A Pending JPH0658966A (en) 1992-08-11 1992-08-11 Method and equipment for wiring test

Country Status (1)

Country Link
JP (1) JPH0658966A (en)

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