JPH0658794B2 - Charged particle beam device - Google Patents

Charged particle beam device

Info

Publication number
JPH0658794B2
JPH0658794B2 JP63206052A JP20605288A JPH0658794B2 JP H0658794 B2 JPH0658794 B2 JP H0658794B2 JP 63206052 A JP63206052 A JP 63206052A JP 20605288 A JP20605288 A JP 20605288A JP H0658794 B2 JPH0658794 B2 JP H0658794B2
Authority
JP
Japan
Prior art keywords
charged particle
particle beam
insulating rod
laminated body
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP63206052A
Other languages
Japanese (ja)
Other versions
JPH0254854A (en
Inventor
正二 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP63206052A priority Critical patent/JPH0658794B2/en
Publication of JPH0254854A publication Critical patent/JPH0254854A/en
Publication of JPH0658794B2 publication Critical patent/JPH0658794B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は電子顕微鏡等の荷電粒子線装置に関し、特に、
荷電粒子線源の機械的軸合わせ機構を備えた荷電粒子線
装置に関する。
TECHNICAL FIELD The present invention relates to a charged particle beam device such as an electron microscope, and in particular,
The present invention relates to a charged particle beam device provided with a mechanical axis alignment mechanism for a charged particle beam source.

[従来の技術] 従来、荷電粒子線装置として、第2図に示すような構成
の電子顕微鏡が知られている。第2図において、1は多
段加速管、2は加速電極、3は高圧碍子、4はベース、
5は電子銃、6はフィラメント、7はウエネルト、8上
部支持盤、9はアーム、10はベローズ、11は電子銃
保持部、12は絶縁棒、13はモータ、14は軸合わせ
機構、15は分割抵抗、16は偏向コイル、17は集束
レンズである。
[Prior Art] Conventionally, as a charged particle beam apparatus, an electron microscope having a configuration as shown in FIG. 2 is known. In FIG. 2, 1 is a multi-stage accelerating tube, 2 is an accelerating electrode, 3 is a high-voltage insulator, 4 is a base,
5 is an electron gun, 6 is a filament, 7 is a Wehnelt, 8 is an upper support plate, 9 is an arm, 10 is a bellows, 11 is an electron gun holding part, 12 is an insulating rod, 13 is a motor, 14 is an axis alignment mechanism, and 15 is A dividing resistor, 16 is a deflection coil, and 17 is a focusing lens.

加速電極2と高圧碍子3が交互に積み重ねられた多段加
速管1は接地電位にあるベース4とウエネルト電位(−
HT)にある上部支持盤8に挟持されるように設けられ
ている。そして、該上部支持盤8にはベローズ10を介
して電子銃保持部11が設けられ、該保持部11上に電
子銃5が固定されている。
The multistage accelerating tube 1 in which the accelerating electrodes 2 and the high-voltage insulators 3 are alternately stacked has a base 4 and a Wehnelt potential (-
It is provided so as to be sandwiched by the upper support plate 8 located at (HT). An electron gun holder 11 is provided on the upper support board 8 via a bellows 10, and the electron gun 5 is fixed on the holder 11.

このような構成の装置において、電子銃5から放出され
た電子線を加速管1内を通して集束レンズ17に入射さ
せるために、電子銃5の機械的軸合わせ及び偏向コイル
16による電気的軸合わせが行われる。
In the apparatus having such a configuration, in order to cause the electron beam emitted from the electron gun 5 to enter the focusing lens 17 through the accelerating tube 1, the mechanical alignment of the electron gun 5 and the electrical alignment by the deflection coil 16 are performed. Done.

ところで、加速電圧が1000KVにも及ぶ超高圧電子
顕微鏡では前記加速管の長さが2メートルにもなり、電
子銃の機械的な軸合わせが正確に行われなければ、電子
銃から放出された電子線は加速管壁に衝突するなどして
前記偏向コイルにも十分入射させることができない。そ
のため、電子銃5の機械的な軸合わせ調整は特に重要な
ものとなっている。ここで、電子銃5の機械的な軸合わ
せはベース4と上部支持盤8の間に渡した絶縁棒12
a,12bをモータ13a,13bにより駆動して、軸
合わせ機構例えば、歯車等の組み合わせにより絶縁棒の
回転をアーム9の平行移動や上下移動に変換する機構1
4X,14Yを動作させ、アーム9により電子銃5を平
行移動させたり、傾斜させたりして軸合わせを行うよう
にしている。
By the way, in an ultra-high voltage electron microscope whose accelerating voltage is as high as 1000 KV, the length of the accelerating tube is as long as 2 meters, and unless the mechanical alignment of the electron gun is accurately performed, the electrons emitted from the electron gun are emitted. The line cannot sufficiently enter the deflection coil because it collides with the acceleration tube wall. Therefore, the mechanical axial alignment adjustment of the electron gun 5 is particularly important. Here, for the mechanical axis alignment of the electron gun 5, the insulating rod 12 passed between the base 4 and the upper support board 8 is used.
a, 12b are driven by motors 13a, 13b to convert the rotation of the insulating rod into a parallel movement or a vertical movement of the arm 9 by a shaft alignment mechanism, for example, a combination of gears or the like.
4X and 14Y are operated, and the electron gun 5 is translated or tilted by the arm 9 to perform axis alignment.

[発明が解決しようとする課題] 上述したような構成の装置において、絶縁棒12a及び
12bはベース4と上部支持盤8の間に設けられている
ため、該絶縁棒の両端には接地電位とウエネルト電位が
与えられている。このように高電圧を絶縁棒の両端で支
持した場合、周辺の電位分布が不安定となり、該絶縁棒
に沿って放電(沿面放電)が発生し、装置内の部品が損
傷したり汚染されたりすることが問題となっている。ま
た、このような放電により、傷んだ部品を清掃,交換し
たりする作業が頻繁に発生することにより電子顕微鏡像
観察に支障を来たすことが問題となっている。
[Problems to be Solved by the Invention] In the device having the above-described configuration, since the insulating rods 12a and 12b are provided between the base 4 and the upper support board 8, both ends of the insulating rod are connected to the ground potential. Wehnelt potential is applied. When a high voltage is supported on both ends of the insulating rod in this way, the potential distribution around it becomes unstable, and discharge (creeping discharge) occurs along the insulating rod, which may damage or contaminate parts inside the device. Is a problem. In addition, such an electric discharge frequently causes a work of cleaning and replacing a damaged part, which causes a problem in observing an electron microscope image.

本発明は、上記問題点を考慮し、電子銃の機械的な軸合
わせ機構を備えた電子顕微鏡に用いて好適な荷電粒子線
装置を提供することを目的としている。
The present invention has been made in view of the above problems, and an object thereof is to provide a charged particle beam apparatus suitable for use in an electron microscope equipped with a mechanical axis alignment mechanism of an electron gun.

[課題を解決するための手段] 本発明は、荷電粒子線を加速するための電極が積み重ね
られた多段加速管と、該加速管上部に配置された荷電粒
子線源と、前記多段加速管の周囲に設けられ高電圧を発
生または検出するための構成部品が積み重ねられた積層
体を備えた荷電粒子線装置において、前記積層体の軸に
沿って該積層体を貫通する長穴を設け、該長穴に絶縁棒
を通し、該絶縁棒の高圧側端部を荷電粒子線源の軸合わ
せ機構に係合させ、該絶縁棒の低圧側端部を前記軸合わ
せを行うために低圧側に配置された駆動機構に係合させ
たことを特徴とする。
[Means for Solving the Problems] The present invention relates to a multistage accelerating tube in which electrodes for accelerating a charged particle beam are stacked, a charged particle beam source arranged above the accelerating tube, and the multistage accelerating tube. In a charged particle beam device provided with a laminated body in which components for generating or detecting a high voltage are stacked around the laminated body, an elongated hole penetrating the laminated body along the axis of the laminated body is provided. The insulating rod is passed through the elongated hole, the high-voltage side end of the insulating rod is engaged with the alignment mechanism of the charged particle beam source, and the low-voltage side end of the insulating rod is arranged on the low-pressure side for performing the alignment. It is characterized in that the drive mechanism is engaged.

[作用] 本発明は、高電圧を発生させるための構成部品が積み重
ねられた積層体の軸に沿って該積層体を貫通する長穴を
設け、該長穴に絶縁棒を通し、該絶縁棒の高圧側端部を
荷電粒子線源の軸合わせ機構に係合させ、該絶縁棒の低
圧側端部を前記軸合わせを行うために低圧側に配置され
た駆動機構に係合させて、該駆動機構により荷電粒子線
源の軸合わせを行なう。
[Operation] According to the present invention, an elongated hole penetrating the laminated body is provided along the axis of the laminated body in which components for generating a high voltage are stacked, and an insulating rod is passed through the elongated hole. The high-pressure side end portion of the insulating rod is engaged with the axis alignment mechanism of the charged particle beam source, and the low-voltage side end portion of the insulating rod is engaged with the drive mechanism arranged on the low pressure side for performing the axis alignment, The drive mechanism aligns the axis of the charged particle beam source.

[実施例] 以下、本発明の実施例を図面に基づいて説明する。第1
図は本発明の一実施例を説明するための装置構成図であ
る。第1図において第2図と同一の構成要素には同一番
号を付すと共に説明を省略する。
[Embodiment] An embodiment of the present invention will be described below with reference to the drawings. First
FIG. 1 is a device configuration diagram for explaining an embodiment of the present invention. In FIG. 1, the same components as those in FIG. 2 are designated by the same reference numerals and the description thereof will be omitted.

第1図において21は高電圧検出用分圧カラム、22は
高電圧安定度モニター用分圧カラム、23は分割抵抗、
24はコンデンサ、25はコロナシールド、26は絶縁
管、27は貫通長穴である。
In FIG. 1, 21 is a high voltage detecting voltage dividing column, 22 is a high voltage stability monitoring voltage dividing column, 23 is a dividing resistor,
Reference numeral 24 is a capacitor, 25 is a corona shield, 26 is an insulating tube, and 27 is an elongated through hole.

高電圧検出用分圧カラム21及び高電圧安定度モニター
用分圧カラム22は、それぞれ、分割抵抗23とコンデ
ンサ24を並列接続した回路をコロナシールド25を介
して複数個積層して直列接続したカラムである。該カラ
ム21及び22にはコロナシールド25の中心に設けら
れた穴と、積層されたコロナシールドの該穴間を接続す
る絶縁管26により、貫通長穴27が形成されている。
該貫通長穴27に絶縁棒12a,12bを通し、該絶縁
棒の上部支持盤8側端部(高圧側端部)を電子銃5の軸
合わせ機構14X,14Yに係合させ、該絶縁棒のベー
ス4側(低圧側端部)を軸合わせを行うために配置され
たモータ13a,13bに係合させる。そして、該モー
タにより軸合わせ機構例えば、歯車等の組み合わせによ
り絶縁棒の回転をアーム9の平行移動や上下移動変換す
る機構を駆動して、電子銃5の軸合わせを行なう。
Each of the high-voltage detection voltage dividing column 21 and the high-voltage stability monitoring voltage dividing column 22 is a column in which a plurality of circuits in which a dividing resistor 23 and a capacitor 24 are connected in parallel are stacked and connected in series via a corona shield 25. Is. A through hole 27 is formed in each of the columns 21 and 22 by a hole provided at the center of the corona shield 25 and an insulating pipe 26 connecting the holes of the stacked corona shields.
The insulating rods 12a and 12b are passed through the penetrating elongated holes 27, and the end portions of the insulating rods on the upper support board 8 side (high-voltage side end portions) are engaged with the axis alignment mechanisms 14X and 14Y of the electron gun 5. The base 4 side (low-pressure side end portion) is engaged with the motors 13a and 13b arranged for axial alignment. Then, the motor is used to drive an axis adjusting mechanism, for example, a mechanism for converting the rotation of the insulating rod into a parallel movement or a vertical movement of the insulating rod by a combination of gears or the like to perform the axis adjustment of the electron gun 5.

このように、分圧カラム内に絶縁棒を通すことにより、
絶縁棒の周囲の電位分布が安定するため、該絶縁棒に沿
う放電は発生し難くなる。
In this way, by passing the insulating rod through the partial pressure column,
Since the potential distribution around the insulating rod is stable, the discharge along the insulating rod is less likely to occur.

尚、上述した実施例は本発明の一実施例に過ぎず、本発
明は変形して実施することができる。
The above-described embodiment is only one embodiment of the present invention, and the present invention can be modified and implemented.

例えば、上述した実施例においては高電圧検出用分圧カ
ラム21及び高電圧安定度モニター用分圧カラム22に
貫通長穴27を設け、該長穴に絶縁棒を通して電子銃の
軸合わせ機構に係合させるようにしたが、その他に直流
高電圧を発生させるための構成部品を積層した積層体、
例えばコンデンサとダイオードの組合わせによるコック
クロフトウオルトン回路の昇圧カラムにも貫通長穴27
を設けて絶縁棒を通し、絶縁棒の高圧側端部を電子銃の
軸合わせ機構に係合させるようにしても良い。
For example, in the above-described embodiment, the through voltage slot 27 is provided in the high voltage detecting voltage dividing column 21 and the high voltage stability monitoring voltage dividing column 22, and an insulating rod is passed through the hole to engage the electron gun axis alignment mechanism. However, in addition to this, a laminated body in which components for generating a DC high voltage are laminated,
For example, a through hole 27 is also formed in the booster column of the Cockcroft-Walton circuit that combines a capacitor and a diode.
May be provided to pass the insulating rod, and the high-voltage side end portion of the insulating rod may be engaged with the axis alignment mechanism of the electron gun.

[発明の効果] 以上の説明から明らかなように、本発明によれば、高電
圧を発生または検出するための構成部品が積み重ねられ
た積層体の軸に沿って該積層体を貫通する長穴を設け、
長穴に絶縁棒を通し、該該絶縁棒の高圧側端部を荷電粒
子線源の軸合わせ機構に係合させ、該絶縁棒の低圧側端
部を前記軸合わせを行うために低圧側に配置された駆動
機構に係合させたことにより、絶縁棒の周囲の電位分布
を安定させることができる。従って、該絶縁棒に沿う放
電は発生し難くなる。また、放電が低減されることによ
り、装置内の部品が損傷したり汚染されたりすることも
なくなるので、電子顕微鏡像観察を円滑に行うことがで
きる。
[Effects of the Invention] As is apparent from the above description, according to the present invention, an elongated hole penetrating the laminated body along the axis of the laminated body in which components for generating or detecting a high voltage are stacked. Is provided
An insulating rod is passed through the long hole, the high-pressure side end of the insulating rod is engaged with the alignment mechanism of the charged particle beam source, and the low-pressure side end of the insulating rod is moved to the low-pressure side for performing the alignment. By engaging with the driving mechanism arranged, the potential distribution around the insulating rod can be stabilized. Therefore, discharge along the insulating rod is less likely to occur. Further, since the discharge is reduced, the parts in the device are not damaged or contaminated, so that the electron microscope image observation can be smoothly performed.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の一実施例を説明するための装置構成
図、第2図は従来例を説明するための図である。 1:多段加速管、4:ベース 5:電子銃、6:フィラメント 7:ウエネルト、8:上部支持盤 9:アーム、10:ベローズ 11:電子銃保持部、12:絶縁棒 13:モータ、14:軸合わせ機構 15:分割抵抗、16:偏向コイル 17:集束レンズ 21:高電圧検出用分圧カラム 22:高電圧安定度モニター用分圧カラム 23:分割抵抗、24:コンデンサ 25:コロナシールド、26:絶縁管 27:貫通長穴
FIG. 1 is a device configuration diagram for explaining an embodiment of the present invention, and FIG. 2 is a diagram for explaining a conventional example. 1: Multi-stage accelerating tube, 4: Base 5: Electron gun, 6: Filament 7: Wehnelt, 8: Upper support board 9: Arm, 10: Bellows 11: Electron gun holding part, 12: Insulating rod 13: Motor, 14: Axis alignment mechanism 15: Dividing resistor, 16: Deflection coil 17: Focusing lens 21: High voltage detecting voltage dividing column 22: High voltage stability monitoring voltage dividing column 23: Dividing resistor, 24: Capacitor 25: Corona shield, 26 : Insulation pipe 27: Through hole

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】荷電粒子線を加速するための電極が積み重
ねられた多段加速管と、該加速管上部に配置された荷電
粒子線源と、前記多段加速管の周囲に設けられ高電圧を
発生または検出するための構成部品が積み重ねられた積
層体を備えた荷電粒子線装置において、前記積層体の軸
に沿って該積層体を貫通する長穴を設け、該長穴に絶縁
棒を通し、該絶縁棒の高圧側端部を荷電粒子線源の軸合
わせ機構に係合させ、該絶縁棒の低圧側端部を前記軸合
わせを行うために低圧側に配置された駆動機構に係合さ
せたことを特徴とする荷電粒子線装置。
1. A multistage accelerating tube in which electrodes for accelerating a charged particle beam are stacked, a charged particle beam source arranged above the accelerating tube, and a high voltage generated around the multistage accelerating tube. Alternatively, in a charged particle beam device including a laminated body in which components for detection are stacked, an elongated hole penetrating the laminated body along the axis of the laminated body is provided, and an insulating rod is passed through the elongated hole, The high-voltage side end of the insulating rod is engaged with the axis alignment mechanism of the charged particle beam source, and the low-voltage side end of the insulating rod is engaged with the drive mechanism arranged on the low pressure side for performing the axis alignment. A charged particle beam device characterized by the above.
JP63206052A 1988-08-19 1988-08-19 Charged particle beam device Expired - Fee Related JPH0658794B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63206052A JPH0658794B2 (en) 1988-08-19 1988-08-19 Charged particle beam device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63206052A JPH0658794B2 (en) 1988-08-19 1988-08-19 Charged particle beam device

Publications (2)

Publication Number Publication Date
JPH0254854A JPH0254854A (en) 1990-02-23
JPH0658794B2 true JPH0658794B2 (en) 1994-08-03

Family

ID=16517080

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63206052A Expired - Fee Related JPH0658794B2 (en) 1988-08-19 1988-08-19 Charged particle beam device

Country Status (1)

Country Link
JP (1) JPH0658794B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006126054A (en) * 2004-10-29 2006-05-18 Jeol Ltd Cathode luminescence analyzing method and cathode luminescence analyzer
JP5737984B2 (en) * 2011-02-08 2015-06-17 キヤノン株式会社 Drawing apparatus and article manufacturing method

Also Published As

Publication number Publication date
JPH0254854A (en) 1990-02-23

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