JPH0652585A - Magneto-optic disk - Google Patents

Magneto-optic disk

Info

Publication number
JPH0652585A
JPH0652585A JP22481592A JP22481592A JPH0652585A JP H0652585 A JPH0652585 A JP H0652585A JP 22481592 A JP22481592 A JP 22481592A JP 22481592 A JP22481592 A JP 22481592A JP H0652585 A JPH0652585 A JP H0652585A
Authority
JP
Japan
Prior art keywords
filler
layer
resin layer
film thickness
magneto
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22481592A
Other languages
Japanese (ja)
Inventor
Takeshi Kyoda
豪 京田
Toshiyuki Shibata
俊幸 柴田
Hisao Arimune
久雄 有宗
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP22481592A priority Critical patent/JPH0652585A/en
Publication of JPH0652585A publication Critical patent/JPH0652585A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a magneto-optic disk which has a small tilting angle, no adsorption, no contact of a floating magnetic head, no corrosion of a magneto- optic layer, and no double refraction malfunction in a board by forming a resin protective layer of a two-layer configuration, and specifying a thickness of a film, concentration-particle size of filler. CONSTITUTION:A magneto-optic layer 2 is formed on a main surface of a board 1 made or resin, such as polycarbonate, glass, etc., by sputtering, and a lower resin layer 3 with no filler and an upper resin layer 4 with filler 5 are formed by spin coating. Similarly, a hard coating layer 6 of ultraviolet curable resin is formed on the other main surface of the board 1 by spin coating. An average particle size (a) of the filler is set to 1-9mum, a concentration (x) of the filler is set to 0.5-40wt.%, a film thickness (y) of the layer 4 is so set to 2-13mum as to satisfy y/a >=1.45+0.033x.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の利用分野】この発明は、磁界変調記録方式で用
いる光磁気ディスクの、樹脂保護層に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a resin protective layer for a magneto-optical disk used in a magnetic field modulation recording system.

【0002】[0002]

【従来技術】光磁気ディスクの樹脂保護層にフィラーを
含有させ、適度な表面粗さを付与することが知られてい
る。 (1) 特開平2−40149号公報: 紫外線硬化樹
脂に潤滑剤とフィラーを混入する。 (2) 特開平3−157836号公報: 紫外線硬化樹
脂にフィラーと静電防止剤と潤滑剤を含有させる。 (3) 特開平3−157837号公報: 紫外線硬化樹
脂にフィラーと静電防止剤と潤滑剤を含有させ、樹脂保
護層はフィラーなしの下部層とフィラー等を含有させた
上部層の2層とする。 (4) 特開平4−64936号公報: 紫外線硬化樹
脂にフィラーを添加し、表面粗さRaを10〜50nm
とする。
2. Description of the Related Art It is known that a resin protective layer of a magneto-optical disk contains a filler to impart an appropriate surface roughness. (1) Japanese Patent Application Laid-Open No. 2-40149: A lubricant and a filler are mixed in an ultraviolet curable resin. (2) JP-A-3-157836: An ultraviolet curable resin contains a filler, an antistatic agent and a lubricant. (3) JP-A-3-157837: An ultraviolet curable resin contains a filler, an antistatic agent and a lubricant, and a resin protective layer comprises two layers, a lower layer without filler and an upper layer containing filler and the like. To do. (4) Japanese Patent Application Laid-Open No. 4-64936: A filler is added to an ultraviolet curable resin to have a surface roughness Ra of 10 to 50 nm.
And

【0003】上記の(1)〜(3)の技術では、フィラーの平
均粒径が1μm以下と小さいため必要な表面粗さが得ら
れず、潤滑剤を樹脂保護層に添加して、浮上式磁気ヘッ
ドのヘッドクラッシュやヘッド吸着を防止する。しかし
潤滑剤を添加すると、樹脂保護層の表面硬度が低下する
ため、好ましくない。次に特開平4−64936号公報
では適切な表面粗さが得られるが、樹脂保護層をフィラ
ーを含有させた樹脂の単層とするため、フィラーによっ
て基板に複屈折異常が発生するとともに、高温高湿中等
で光磁気録層に腐食が発生する。
In the above techniques (1) to (3), since the average particle size of the filler is as small as 1 μm or less, the required surface roughness cannot be obtained. Therefore, a lubricant is added to the resin protective layer and the floating type is used. Prevents head crash and magnetic attraction of the magnetic head. However, the addition of a lubricant is not preferable because it lowers the surface hardness of the resin protective layer. Next, in JP-A-4-64936, an appropriate surface roughness can be obtained, but since the resin protective layer is a single layer of resin containing a filler, birefringence abnormality occurs in the substrate due to the filler, and high temperature Corrosion occurs in the magneto-optical recording layer in high humidity.

【0004】[0004]

【発明の課題】この発明の課題は、(1) 表面粗さへの
上部樹脂層の膜厚変動の影響が小さく、(2) 潤滑剤な
しで適切な表面粗さを得ることができるとともに、上部
樹脂層の成膜が可能で、(3) 表面粗さがほぼ全面に渡
って均一で、局所的な突起がなく、(4) これらのため
に浮上式磁気ヘッドの吸着やクラッシュがなく、(5)
チルト角が小さく、かつ光磁気記録層の腐食や、基板に
複屈折異常が生じない、光磁気ディスクを提供すること
にある。
An object of the present invention is (1) the influence of the film thickness variation of the upper resin layer on the surface roughness is small, and (2) an appropriate surface roughness can be obtained without a lubricant, The upper resin layer can be formed, (3) the surface roughness is almost uniform over the entire surface, there are no local protrusions, and (4) because of these, there is no attraction or crash of the levitation type magnetic head, (Five)
An object of the present invention is to provide a magneto-optical disk which has a small tilt angle and which is free from corrosion of the magneto-optical recording layer and abnormal birefringence of the substrate.

【0005】[0005]

【発明の構成】この発明は、合成樹脂基板の一方の面
に、少なくとも光磁気記録層と樹脂保護層とを、この順
に積層した光磁気ディスクにおいて、前記樹脂保護層
を、フィラー無添加の下部樹脂層と、フィラーを添加し
た上部樹脂層の2層で構成するとともに、下部樹脂層の
膜厚を2〜13μmとし、フィラーの濃度をwt%単位
でx,上部樹脂層の膜厚をμm単位でy,フィラーの平
均粒径をμm単位でaとして、 0.5≦x≦40, 2≦y≦13, 1≦a≦9, y/a≧1.45+0.033x としたことを特徴とする。
According to the present invention, in a magneto-optical disk in which at least a magneto-optical recording layer and a resin protective layer are laminated in this order on one surface of a synthetic resin substrate, the resin protective layer is a filler-free lower portion. It is composed of two layers, a resin layer and an upper resin layer to which a filler is added, the thickness of the lower resin layer is 2 to 13 μm, the concentration of the filler is x in wt% and the thickness of the upper resin layer is μm. And y is the average particle diameter of the filler in μm unit, 0.5 ≦ x ≦ 40, 2 ≦ y ≦ 13, 1 ≦ a ≦ 9, y / a ≧ 1.45 + 0.033x To do.

【0006】[0006]

【発明の作用】発明者の知見によれば、磁界変調記録方
式の光磁気ディスクでは、ディスクの浮上式磁気ヘッド
との接触面の表面粗さRaは、中心線平均粗さで10n
mRa以上が必要である。10nmRa未満では、特に
樹脂保護層表面にタバコのやに等の付着物があるとヘッ
ドの吸着が発生し易い。一方磁気ヘッドの浮上特性を安
定させるには、10nmRa以上の表面粗さがあるだけ
でなく、ディスクの表面粗さが均一であることが必要で
ある。またディスクの量産性を向上させるには、上部樹
脂層の膜厚に対する表面粗さの依存性が小さい方が良
い。表面粗さを均一にしかつ表面粗さの膜厚依存性を小
さくするには、上部樹脂層の膜厚y(μm単位)とフィ
ラーの平均粒径(μm単位)とに、 y/a≧1.45+0.033x (1) の関係を持たせれば良い。式(1)が成立する範囲では、
上部樹脂層の膜厚yがフィラーの平均粒径aに比べて充
分大きいため、上部樹脂層にフィラーによる局部的な突
起がなくなり、ディスクの表面粗さが全面に渡ってほぼ
均一となる。このため浮上量が2μm程度と小さな浮上
式磁気ヘッドを用いても、ディスクのどの点でもヘッド
吸着やヘッドクラッシュがなく、安定にヘッドを浮上さ
せることができる。しかも表面粗さの上部樹脂層の膜厚
への依存性が小さく、膜厚変動による表面粗さの変動を
防止することができる。
According to the knowledge of the inventor, in the magneto-optical disk of the magnetic field modulation recording system, the surface roughness Ra of the contact surface of the disk with the floating magnetic head is 10n in terms of the center line average roughness.
mRa or more is required. If it is less than 10 nmRa, the adsorption of the head is likely to occur especially when there is an adhering substance such as tobacco dust on the surface of the resin protective layer. On the other hand, in order to stabilize the floating characteristics of the magnetic head, not only the surface roughness of 10 nmRa or more but also the surface roughness of the disk must be uniform. Further, in order to improve the mass productivity of the disc, it is preferable that the dependence of the surface roughness on the film thickness of the upper resin layer is small. In order to make the surface roughness uniform and reduce the film thickness dependency of the surface roughness, the film thickness y of the upper resin layer (unit: μm) and the average particle size of the filler (unit: μm) should be y / a ≧ 1. It suffices to have a relationship of 0.45 + 0.033x (1). In the range where equation (1) holds,
Since the film thickness y of the upper resin layer is sufficiently larger than the average particle diameter a of the filler, local protrusions due to the filler are eliminated in the upper resin layer, and the surface roughness of the disk becomes substantially uniform over the entire surface. For this reason, even if a flying magnetic head having a small flying height of about 2 μm is used, there is no head adsorption or head crash at any point of the disk, and the head can be stably floated. Moreover, the dependence of the surface roughness on the film thickness of the upper resin layer is small, and the fluctuation of the surface roughness due to the fluctuation of the film thickness can be prevented.

【0007】表面粗さは、フィラーの平均粒径aと濃度
x,上部樹脂層の膜厚yで定まる。表面粗さを10nm
Ra以上とするには、フィラー含有量xを0.5wt%
以上で平均粒径aを1μm以上とする必要がある。次に
フィラー含有量xが40wt%を超過すると、スピンコ
ート前の粘度が激増しスピンコート不能となる。上部樹
脂層の製法をスピンコートに限定するものではないが、
上部樹脂層の成膜の容易さの点から、フィラー含有量x
の上限を40wt%とする。このためフィラー含有量x
は、0.5〜40wt%となる。フィラーの平均粒径a
が1μm未満では、前記のように10nmRa以上の表
面粗さが得られない。平均粒径aが9μmを越えると、
樹脂保護層の膜厚(下部樹脂層と上部樹脂層の合計)が
15μmを超過する。以下に示すように下部樹脂層には
最低でも2μm以上の膜厚が必要であり、平均粒径aが
9μmを超過すると式(1)を満たすために必要な上部樹
脂層の膜厚yが13μmを超過し、合計膜厚が15μm
を超過する。合計膜厚が15μmを上回ると、チルト角
が5mradを超過する。
The surface roughness is determined by the average particle diameter a and the concentration x of the filler and the film thickness y of the upper resin layer. Surface roughness of 10 nm
To achieve Ra or higher, the filler content x is 0.5 wt%
As described above, it is necessary to set the average particle diameter a to 1 μm or more. Next, if the filler content x exceeds 40 wt%, the viscosity before spin coating increases drastically and spin coating becomes impossible. Although the manufacturing method of the upper resin layer is not limited to spin coating,
From the viewpoint of ease of forming the upper resin layer, the filler content x
Is 40 wt%. Therefore, the filler content x
Is 0.5 to 40 wt%. Average particle size a of filler
Is less than 1 μm, a surface roughness of 10 nmRa or more cannot be obtained as described above. When the average particle size a exceeds 9 μm,
The film thickness of the resin protective layer (the total of the lower resin layer and the upper resin layer) exceeds 15 μm. As shown below, the lower resin layer must have a film thickness of at least 2 μm or more, and if the average particle size a exceeds 9 μm, the film thickness y of the upper resin layer required to satisfy the formula (1) is 13 μm. And the total film thickness exceeds 15 μm
Exceed. If the total film thickness exceeds 15 μm, the tilt angle exceeds 5 mrad.

【0008】樹脂保護層の膜厚は、下部樹脂層に2μm
以上が必要で、2μm未満では上部樹脂層のフィラーの
影響で基板に複屈折異常が発生するとともに、光磁気記
録層の腐食が生じ易くなる。また上部樹脂層にも2μm
以上の膜厚が必要で、2μm未満ではクラッシュ時等の
ヘッドとの接触で上部樹脂層が剥離する。次に下部樹脂
層と上部樹脂層の合計膜厚が15μmを越えると、ディ
スクの機械特性の一つであるチルト角が5mradを越
えてしまった。なおISO規格ではチルト角を5mra
d以下と定めている。これらのことから下部樹脂層の膜
厚は2〜13μmとなり、上部樹脂層の膜厚yも2〜1
3μmとなる。
The film thickness of the resin protective layer is 2 μm in the lower resin layer.
If the thickness is less than 2 μm, birefringence anomaly occurs in the substrate due to the influence of the filler in the upper resin layer, and corrosion of the magneto-optical recording layer easily occurs. 2 μm on the upper resin layer
The above film thickness is required, and if it is less than 2 μm, the upper resin layer is peeled off due to contact with the head during a crash or the like. Next, when the total film thickness of the lower resin layer and the upper resin layer exceeded 15 μm, the tilt angle, which is one of the mechanical characteristics of the disc, exceeded 5 mrad. According to the ISO standard, the tilt angle is 5 mra
It is defined as d or less. From these facts, the film thickness of the lower resin layer becomes 2 to 13 μm, and the film thickness y of the upper resin layer also becomes 2-1.
It becomes 3 μm.

【0009】フィラーの材料には例えば、SiO2,A
l2O3,Si3N4,SiC,CdS,ZnSなどの絶縁
性のセラミック材料や、ITO,Sb−SnO2,Sb2
O3,IrO2,MoO2,NbO2,PtO2,RuO2,
WO2等の導電性酸化物、MoC,NbC,TaC,T
iC,WC等の導電性炭化物、NbN,Ta2N,Ti
N,ZrN,VN等の導電性窒化物等や、メラミンホル
ムアルデヒド,ポリエチレンテレフタレート,ポリウレ
タン,ABS,ポリエチレンホモポリマー,アクリル樹
脂セルロース,ナイロン,ポリカーボネート,ポリエス
テル,ポリエチレン・ステレン重合体,ビニル重合体,
各種共重合体等の樹脂を用い、単独もしくは2種以上混
合して用いる。
The filler material is, for example, SiO2, A
Insulating ceramic materials such as l2O3, Si3N4, SiC, CdS, ZnS, ITO, Sb-SnO2, Sb2
O3, IrO2, MoO2, NbO2, PtO2, RuO2,
Conductive oxides such as WO2, MoC, NbC, TaC, T
Conductive carbide such as iC, WC, NbN, Ta2N, Ti
Conductive nitrides such as N, ZrN, VN, melamine formaldehyde, polyethylene terephthalate, polyurethane, ABS, polyethylene homopolymer, acrylic resin cellulose, nylon, polycarbonate, polyester, polyethylene-sterene polymer, vinyl polymer,
Resins such as various copolymers may be used alone or in combination of two or more.

【0010】また下部樹脂層、上部樹脂層の樹脂材料
は、アクリル系、エポキシ系、ポリエステル系、アクリ
ル酸エステル系、ウレタンアクリル系等の、紫外線硬化
樹脂や、熱硬化樹脂等があるが、硬化処理が簡単で量産
性に富んだ紫外線硬化樹脂が好ましい。
The resin material for the lower resin layer and the upper resin layer includes acrylic, epoxy, polyester, acrylic ester, urethane acrylic, and other ultraviolet curable resins, thermosetting resins, etc. An ultraviolet curable resin that is easy to process and has high mass productivity is preferable.

【0011】[0011]

【実施例】図3に光磁気ディスクの構造を示す。図にお
いて、1はポリカーボネート等の樹脂やガラス等の基板
で、一方の主面上に光磁気記録層2を例えばスパッタリ
ングで形成する。スピンコーティングにより、フィラー
無添加の単味の樹脂からなる下部樹脂層3と、フィラー
を添加した上部樹脂層4を形成する。5は上部樹脂層4
に添加したフィラーである。同様に基板1の他の主面上
に、スピンコーティングにより紫外線硬化樹脂のハード
コート層6を形成する。
EXAMPLE FIG. 3 shows the structure of a magneto-optical disk. In the figure, reference numeral 1 is a resin such as polycarbonate or a substrate such as glass, and a magneto-optical recording layer 2 is formed on one main surface by, for example, sputtering. By spin coating, a lower resin layer 3 made of a plain resin without a filler and an upper resin layer 4 with a filler added are formed. 5 is the upper resin layer 4
It is a filler added to. Similarly, a hard coat layer 6 of an ultraviolet curable resin is formed on the other main surface of the substrate 1 by spin coating.

【0012】実施例では、光磁気記録層2に、窒化ケイ
素の第1誘電体層,Gd−Dy−Fe系の光磁気記録
層,窒化ケイ素の第2誘電体層、及びAl反射層を順次
積層したものを用いた。またハードコート層6には、導
電性のアクリル系樹脂を用いた。樹脂保護層は下部樹脂
層3と上部樹脂層4からなり、下部樹脂層3にはウレタ
ンアクリル系の紫外線硬化樹脂を2〜13μm厚に形成
したものを用い、上部樹脂層4にはアクリル系紫外線硬
化樹脂にSiO2フィラー5を含有させて2〜13μm
厚に形成したものを用いた。
In the embodiment, the magneto-optical recording layer 2 includes a silicon nitride first dielectric layer, a Gd-Dy-Fe based magneto-optical recording layer, a silicon nitride second dielectric layer, and an Al reflective layer in that order. A laminated product was used. For the hard coat layer 6, a conductive acrylic resin was used. The resin protective layer is composed of a lower resin layer 3 and an upper resin layer 4. The lower resin layer 3 is made of urethane acrylic UV curable resin having a thickness of 2 to 13 μm, and the upper resin layer 4 is made of acrylic UV light. 2 to 13 μm by including SiO2 filler 5 in the cured resin
A thick film was used.

【0013】下部樹脂層3と上部樹脂層4の合計膜厚は
4〜15μmが好ましく、15μm以上ではチルト角が
増加する。またフィラー5の平均粒径は1〜9μmと
し、上部樹脂層4の膜厚yとフィラー5の平均粒径a、
フィラー5の濃度xは、式(1)を満たすように定める。
なおこの明細書では、膜厚yや平均粒径aはμm単位
で、濃度xはwt%単位で示す。
The total film thickness of the lower resin layer 3 and the upper resin layer 4 is preferably 4 to 15 μm, and if it is 15 μm or more, the tilt angle increases. Further, the average particle size of the filler 5 is set to 1 to 9 μm, the film thickness y of the upper resin layer 4 and the average particle size a of the filler 5,
The concentration x of the filler 5 is determined so as to satisfy the formula (1).
In this specification, the film thickness y and the average particle size a are shown in μm unit, and the concentration x is shown in wt% unit.

【0014】光磁気ディスクの特性を評価するため、下
部樹脂層3や上部樹脂層4の膜厚、フィラー5の粒径a
と濃度xを変化させ、表1,表2,図2に示すサンプル
を作製した。なお表面粗さは、触針式の表面粗さ計で1
mm走査し、中心線平均粗さRaを測定した。
In order to evaluate the characteristics of the magneto-optical disk, the film thickness of the lower resin layer 3 and the upper resin layer 4 and the particle diameter a of the filler 5 are evaluated.
And the concentration x were changed, and the samples shown in Table 1, Table 2 and FIG. 2 were produced. The surface roughness is 1 with a stylus type surface roughness meter.
mm scanning was performed and the center line average roughness Ra was measured.

【0015】[0015]

【膜厚とフィラー濃度】下部樹脂層3の膜厚を5μmと
し、上部樹脂層4に含有させるフィラー5の平均粒径a
を1〜9μm、フィラー濃度xを0.3〜45wt%の
範囲で変化させ、上部樹脂層4の膜厚yと表面粗さ(R
a)の関係を調べた。結果の一部を表1に示す。
[Film Thickness and Filler Concentration] The film thickness of the lower resin layer 3 is 5 μm, and the average particle diameter a of the filler 5 contained in the upper resin layer 4 is a.
Of 1 to 9 μm and the filler concentration x in the range of 0.3 to 45 wt%, the film thickness y of the upper resin layer 4 and the surface roughness (R
The relationship of a) was investigated. Some of the results are shown in Table 1.

【0016】[0016]

【表1】 表 1 試料 フィラー平均 濃度 上部樹脂層 y/a y/a 表面粗さ 接触音 判定 粒径a x 膜厚y 実際 理論値 (nmRa) 有無 A−1 1 40 2.5 2.5 2.77 132 有 × A−2 1 40 3.1 3.1 2.77 43 無 ○ A−3 1 40 5.2 5.2 2.77 42 無 ○ A−4 4 10 6.7 1.7 1.78 147 有 × A−5 4 10 7.4 1.9 1.78 90 無 ○ A−6 4 10 10.1 2.5 1.78 82 無 ○ A−7 9 0.5 9.8 1.1 1.47 96 有 × A−8 9 0.5 13.3 1.5 1.47 17 無 ○ A−9 9 0.5 16.2 1.8 1.47 15 無 ○ A−10 4 0.3 6.3 1.6 8 2) × A−11 4 45 1) × A−12 0.5 40 1.5 3.0 7 2) × 1) 粘度が高すぎ、スピンコート不能 2) 樹脂層表面にタバコのやにを付着させた際にヘッド
吸着発生 3) 接触音は浮上テスト時の、磁気ヘッドとの接触によ
る音の有無を示す 4) y/aの理論値は、式(1)でのy/aの下限を示す 5) 判定は、表面粗さと接触音の有無、磁気ヘッドの吸
着の有無、スピンコートの可否に関するもので、最終判
定にはこれ以外にチルト角の検討が必要。
[Table 1] Table 1 Sample Filler average concentration Upper resin layer y / a y / a Surface roughness Contact noise Judgment particle size a x Film thickness y Actual theoretical value (nmRa) Presence / absence A-1 1 40 2.5 2.5 2.77 132 Yes x A-2 1 40 3.1 3.1 2.77 43 No ○ A-3 1 40 5.2 5.2 5.2 2.77 42 No ○ A-4 4 10 6.7 1. 7 1.78 147 Yes × A-5 4 10 7.4 1.9 1.78 90 No ○ A-6 4 10 10.1 2.5 1.78 82 No ○ A-7 9 0.5 9. 8 1.1 1.47 96 Yes × A-8 9 0.5 13.3 1.5 1.57 17 No ○ A-9 9 0.5 16.2 1.8 1.8 1.47 15 No ○ A- 10 4 0.3 6.3 1.6 8 2) × A-11 445 1) × A-12 0.5 40 40 1.5 3.0 7 2) × 1) Viscosity is too high and spin coating is not possible. 2) When the tobacco mist is adhered to the resin layer surface Head adsorption 3) Contact noise indicates the presence or absence of noise due to contact with the magnetic head during the levitation test 4) The theoretical value of y / a indicates the lower limit of y / a in equation (1) 5) Judgment Is related to surface roughness and presence or absence of contact noise, presence or absence of magnetic head adsorption, and spin coating availability. In addition to this, the tilt angle must be examined for final determination.

【0017】フィラー濃度xが0.3wt%のA−10
では濃度が低いために表面粗さが10nmRa未満であ
り、45wt%のA−11では濃度が高いために樹脂の
粘度が急激に増加しスピンコートが不能となった。この
ことからフィラー濃度xは、0.5〜40wt%に限ら
れた。A−1〜9は表面粗さが10nmRa以上である
が、A−1〜2,A−4〜5,A−7〜8の間で急激な
表面粗さの変化があり、これは式(1)の範囲外から範囲
内の膜厚への変化に対応する。そして式(1)を満たすA
−2〜3,A−5〜6,A−8〜9の中では、上部樹脂
層の膜厚yに対する表面粗さの依存性が小さく、安定な
表面粗さが得られる。これらの試料に浮上量の小さい浮
上式磁気ヘッドを用いて浮上テストを行い、ディスク回
転数を3000rpm,ヘッド荷重を6gf、浮上量を
2μmとすると、式(1)を満たさず膜厚yにより急激な
表面粗さの変化が生じるA−1,4,7ではヘッドとデ
ィスクの接触音が微小に発生した。これに対して式(1)
を満たし、膜厚yに対して表面粗さが安定なA−2,
3,5,6,8,9では接触音は発生せず、安定な浮上
特性を示した。
A-10 having a filler concentration x of 0.3 wt%
The surface roughness was less than 10 nmRa due to the low concentration, and the resin viscosity rapidly increased at 45 wt% of A-11 due to the high concentration, which made spin coating impossible. Therefore, the filler concentration x was limited to 0.5 to 40 wt%. The surface roughness of A-1 to 9 is 10 nmRa or more, but there is a rapid change in the surface roughness between A-1 to 2, A-4 to 5, and A-7 to 8, which is expressed by the formula ( It corresponds to the change from outside the range of 1) to the film thickness within the range. And A that satisfies equation (1)
Among -2 to 3, A-5 to 6, and A-8 to 9, the dependence of the surface roughness on the film thickness y of the upper resin layer is small, and a stable surface roughness can be obtained. A levitation test was performed on these samples using a levitation type magnetic head with a small levitation amount. When the disk rotation speed was 3000 rpm, the head load was 6 gf, and the levitation amount was 2 μm, the formula (1) was not satisfied and the film thickness y rapidly increased. In A-1, 4, and 7 where various changes in surface roughness occur, a slight contact noise between the head and the disk is generated. On the other hand, equation (1)
And A-2, which has a stable surface roughness with respect to the film thickness y,
No contact noise was generated in Nos. 3, 5, 6, 8 and 9 and stable floating characteristics were exhibited.

【0018】図2に、フィラー5の平均粒径aを4μm
とした場合について、濃度xや膜厚yと表面粗さとの関
係を示す。なおこれ以外の平均粒径でも、同様の結果が
得られた。図2の枠で示した領域がこの発明の範囲であ
り、領域の左上の曲線は膜厚と表面粗さの関係に急激な
変化が生じる点をつないだものである。図2から明らか
なように、この曲線上の点よりも膜厚yを増すと、表面
粗さの膜厚yへの依存性が減少し、表面粗さがほぼ一定
になる。この曲線上の点をプロットしたものが、式(1)
である。
In FIG. 2, the average particle diameter a of the filler 5 is 4 μm.
The relationship between the concentration x, the film thickness y, and the surface roughness is shown. Similar results were obtained with other average particle sizes. The region shown by the frame in FIG. 2 is the range of the present invention, and the upper left curve of the region connects the points at which the relationship between the film thickness and the surface roughness changes abruptly. As is clear from FIG. 2, when the film thickness y is increased beyond the point on this curve, the dependence of the surface roughness on the film thickness y decreases, and the surface roughness becomes almost constant. A plot of the points on this curve is shown in equation (1).
Is.

【0019】図1に、式(1)の意味を示す。図2での表
面粗さと膜厚yとの関係の変曲点の値をプロットする
と、図1の直線付近の7点が得られる。これらの点を直
線近似したものが式(1)であり、その意味は図2の曲線
よりも右側に膜厚があることと同じである。なお発明者
は、フィラー5の平均粒径aを4μm以外として同様の
実験を行ったが、やはり式(1)が成立した。次に表1の
データを実施例と比較例(表1での判定結果)に従って
プロットしたものが、○や▲の記号である。式(1)によ
り、光磁気ディスクの表面粗さに関する特性を表現する
ことができる。表1で示したように、上部樹脂層4の膜
厚yが2μm未満の領域はヘッドの吸着や上部樹脂層4
の剥離が生じ易い領域である。またフィラー濃度が40
%超は、粘度が増しスピンコートが困難になる領域であ
る。さらに膜厚yが13μm超は、膜厚の増加によりチ
ルト角に問題が生じる領域である。
FIG. 1 shows the meaning of the equation (1). When the values of the inflection points of the relationship between the surface roughness and the film thickness y in FIG. 2 are plotted, seven points near the straight line in FIG. 1 are obtained. Equation (1) is a linear approximation of these points, and its meaning is the same as the fact that the film thickness is on the right side of the curve in FIG. The inventor conducted a similar experiment except that the average particle diameter a of the filler 5 was other than 4 μm, and the formula (1) was established. Next, the data in Table 1 are plotted according to Examples and Comparative Examples (judgment results in Table 1), and the symbols ◯ and ▲. The equation (1) can be used to express the characteristics relating to the surface roughness of the magneto-optical disk. As shown in Table 1, in the region where the film thickness y of the upper resin layer 4 is less than 2 μm, head adsorption or upper resin layer 4
Is a region where peeling is likely to occur. The filler concentration is 40
% Is a region where the viscosity increases and spin coating becomes difficult. Further, when the film thickness y exceeds 13 μm, the tilt angle has a problem due to the increase in the film thickness.

【0020】図2に戻り、枠で囲んだ領域の中の鎖線の
右側を示す領域を考える。これは式(1)をさらに限定し
た領域である。フィラー平均粒径をa,フィラー濃度を
x,上部樹脂層4の膜厚をyとすると、この領域は、以
下の不等式(2)で示される。 0.5≦x≦ 1wt%の時 y≧1.4a 1<x≦ 5wt%の時 y≧1.6a 5<x≦10wt%の時 y≧1.9a 10<x≦20wt%の時 y≧2.2a 20<x≦30wt%の時 y≧2.5a 30<x≦40wt%の時 y≧2.8a
Returning to FIG. 2, let us consider the area shown on the right side of the chain line in the area surrounded by the frame. This is a more limited area of equation (1). If the average particle diameter of the filler is a, the concentration of the filler is x, and the film thickness of the upper resin layer 4 is y, this region is represented by the following inequality (2). When 0.5 ≦ x ≦ 1 wt% y ≧ 1.4a When 1 <x ≦ 5 wt% y ≧ 1.6a When 5 <x ≦ 10 wt% y ≧ 1.9a When 10 <x ≦ 20 wt% y ≧ 2.2a When 20 <x ≦ 30 wt% y ≧ 2.5a When 30 <x ≦ 40 wt% y ≧ 2.8a

【0021】[0021]

【膜厚とフィラーの平均粒径】下部樹脂層3と上部樹脂
層4の膜厚を変え、不等式(2)を満たす試料B−1〜6
を作製した。これに関する試験結果を表2に示す。ディ
スクの読み出し面を偏光顕微鏡で観察したところ、下部
樹脂層のないB−6ではフィラー5の存在位置で複屈折
異常が見られたが、他の下部樹脂層のある試料では見ら
れなかった。次に浮上式磁気ヘッドを用いて、コンタク
ト・スタート・ストップテスト(ディスク回転数300
0rpm,ヘッド荷重4gf)を1サイクル13秒で1
0万回行った。上部樹脂層4の膜厚を1.5μmとした
B−1では上部樹脂層4の剥離が生じたが、他の2μm
以上の試料では見られなかった。機械特性の一つである
チルト角は、樹脂保護層の膜厚が15μmを越えるB−
5では5mradを越えたが、膜厚が15μm以下の試
料ではチルト角は5mrad以下であった。なおISO
規格ではチルト角は5mrad以下である。次にこれら
の試料を80℃,90%RHで1000時間投入して、
外観検査を行ったところ、B−6で光磁気記録層2に腐
食が発生したが、他の下部樹脂層3がある試料では腐食
は見られなかった。以上により、信頼性を得るためには
下部樹脂層3の膜厚を2〜13μmとし、上部樹脂層4
の膜厚を2〜13μmとする必要があることが判明し
た。
[Film Thickness and Average Particle Size of Filler] Samples B-1 to 6 satisfying the inequality (2) by changing the film thickness of the lower resin layer 3 and the upper resin layer 4
Was produced. The test results for this are shown in Table 2. When the read surface of the disk was observed with a polarizing microscope, birefringence anomaly was observed at the position where the filler 5 was present in B-6 without the lower resin layer, but it was not seen in the other samples with the lower resin layer. Next, using a floating magnetic head, contact start / stop test (disk rotation speed 300
0 rpm, head load 4 gf) 1 cycle 13 seconds 1
I've done it 100,000 times. In B-1 in which the film thickness of the upper resin layer 4 was 1.5 μm, peeling of the upper resin layer 4 occurred, but other 2 μm
It was not seen in the above samples. The tilt angle, which is one of the mechanical characteristics, is B- when the film thickness of the resin protective layer exceeds 15 μm.
5 exceeded 5 mrad, but the tilt angle was 5 mrad or less in the sample having a film thickness of 15 μm or less. ISO
According to the standard, the tilt angle is 5 mrad or less. Next, put these samples at 80 ° C. and 90% RH for 1000 hours,
When a visual inspection was conducted, corrosion occurred in the magneto-optical recording layer 2 at B-6, but no corrosion was found in the sample having another lower resin layer 3. From the above, in order to obtain reliability, the film thickness of the lower resin layer 3 is set to 2 to 13 μm, and the upper resin layer 4 is formed.
It was found that it is necessary to set the film thickness of 2 to 13 μm.

【0022】フィラー5の平均粒径aについては、表1
の試料A−12の平均粒径0.5μmでは、表面粗さが
10nmRa未満となった。表2の試料B−5の平均粒
径10μmでは、式(1)を満たすためには上部樹脂層4
に13μm超の膜が必要となる。このことからフィラー
5の平均粒径aは1〜9μmがよい。
The average particle diameter a of the filler 5 is shown in Table 1.
In the sample A-12 having an average particle diameter of 0.5 μm, the surface roughness was less than 10 nmRa. When the average particle size of Sample B-5 in Table 2 is 10 μm, in order to satisfy the formula (1), the upper resin layer 4
Therefore, a film having a thickness of more than 13 μm is required. Therefore, the average particle size a of the filler 5 is preferably 1 to 9 μm.

【0023】[0023]

【表2】 表2 試料 平均粒径 フィラー濃度 樹 脂 保 護 層 膜 厚 (μm) a(μm)x(wt%) 下部樹脂層 上部樹脂層 合計 B−1 1 40 10 1.5 11.5 B−2 1 40 10 2 12 B−3 1 40 12 12 14 B−4 9 0.5 2 13 15 B−5 10 0.5 2 14 16 B−6 9 0.5 0 12 12 試料 複屈折 ヘッドによる チルト角 (mrad) 判定 異常 上部層の剥離 B−1 無 有 1.4 × B−2 無 無 1.6 ○ B−3 無 無 4.5 ○ B−4 無 無 4.8 ○ B−5 無 無 5.6 × B−6 有 無 4.5 1) × 1) 腐食発生[Table 2] Table 2 Sample average particle size Filler concentration Resin protective layer Film thickness (μm) a (μm) x (wt%) Lower resin layer Upper resin layer Total B-1 1 40 10 1.5 11.5 B-2 1 40 10 2 12 B-3 1 40 12 12 14 B-4 9 0.5 2 13 15 B-5 10 0.5 0.5 2 14 16 B-6 9 0.5 0.5 0 12 12 Sample birefringent head Tilting angle (mrad) judgment abnormality due to peeling of upper layer B-1 No Yes 1.4 × B-2 No No 1.6 ○ B-3 No No 4.5 ○ B-4 No No 4.8 ○ B- 5 No No 5.6 × B-6 Yes No 4.5 1) × 1) Corrosion occurred

【0024】[0024]

【発明の効果】この発明では、(1) 表面粗さへの上部
樹脂層の膜厚変動の影響が小さく、(2) 潤滑剤なしで
適切な表面粗さを得ることができるとともに、上部樹脂
層の成膜が可能で、(3) 表面粗さがほぼ全面に渡って
均一で、局所的な突起がなく、(4) これらのために浮
上式磁気ヘッドの吸着やクラッシュがなく、(5) チル
ト角が小さく、かつ光磁気記録層の腐食や、基板に複屈
折異常が生じない、光磁気ディスクが得られる。
According to the present invention, (1) the influence of the film thickness variation of the upper resin layer on the surface roughness is small, and (2) an appropriate surface roughness can be obtained without a lubricant, and the upper resin layer Layer formation is possible, (3) surface roughness is uniform over almost the entire surface, and there are no local protrusions. (4) Because of these, there is no attraction or crash of the floating magnetic head, and (5) It is possible to obtain a magneto-optical disk having a small tilt angle and free from corrosion of the magneto-optical recording layer and birefringence abnormality of the substrate.

【図面の簡単な説明】[Brief description of drawings]

【図1】 実施例での、フィラー濃度xと上部樹脂層
の膜厚yとの関係を示す特性図
FIG. 1 is a characteristic diagram showing a relationship between a filler concentration x and a film thickness y of an upper resin layer in an example.

【図2】 実施例での、上部樹脂層の膜厚yと表面粗
さとの関係を示す特性図
FIG. 2 is a characteristic diagram showing the relationship between the film thickness y of the upper resin layer and the surface roughness in the example.

【図3】 実施例の光磁気ディスクの断面図FIG. 3 is a sectional view of the magneto-optical disk of the embodiment.

【符号の説明】[Explanation of symbols]

1 基板 2 光磁気記録層 3 下部樹脂層 4 上部樹脂層 5 フィラー 6 ハードコート層 1 substrate 2 magneto-optical recording layer 3 lower resin layer 4 upper resin layer 5 filler 6 hard coat layer

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 合成樹脂基板の一方の面に、少なくとも
光磁気記録層と樹脂保護層とを、この順に積層した光磁
気ディスクにおいて、 前記樹脂保護層を、フィラー無添加の下部樹脂層と、フ
ィラーを添加した上部樹脂層の2層で構成するととも
に、 下部樹脂層の膜厚を2〜13μmとし、 フィラーの濃度をwt%単位でx,上部樹脂層の膜厚を
μm単位でy,フィラーの平均粒径をμm単位でaとし
て、 0.5≦x≦40, 2≦y≦13, 1≦a≦9, y/a≧1.45+0.033x としたことを特徴とする光磁気ディスク。
1. A magneto-optical disk in which at least a magneto-optical recording layer and a resin protective layer are laminated in this order on one surface of a synthetic resin substrate, wherein the resin protective layer includes a lower resin layer containing no filler, It is composed of two layers of the upper resin layer to which a filler is added, the thickness of the lower resin layer is 2 to 13 μm, the concentration of the filler is x in wt% unit, the thickness of the upper resin layer is y in μm unit, the filler A magneto-optical disk characterized in that the average particle size of is 0.5 μx unit, and 0.5 ≦ x ≦ 40, 2 ≦ y ≦ 13, 1 ≦ a ≦ 9, y / a ≧ 1.45 + 0.033x. .
JP22481592A 1992-07-30 1992-07-30 Magneto-optic disk Pending JPH0652585A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22481592A JPH0652585A (en) 1992-07-30 1992-07-30 Magneto-optic disk

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22481592A JPH0652585A (en) 1992-07-30 1992-07-30 Magneto-optic disk

Publications (1)

Publication Number Publication Date
JPH0652585A true JPH0652585A (en) 1994-02-25

Family

ID=16819637

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22481592A Pending JPH0652585A (en) 1992-07-30 1992-07-30 Magneto-optic disk

Country Status (1)

Country Link
JP (1) JPH0652585A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6001953A (en) * 1999-03-18 1999-12-14 General Electric Company Polycarbonates suitable for use in optical articles
US6060577A (en) * 1999-03-18 2000-05-09 General Electric Company Polycarbonates derived from alicyclic bisphenols

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6001953A (en) * 1999-03-18 1999-12-14 General Electric Company Polycarbonates suitable for use in optical articles
US6060577A (en) * 1999-03-18 2000-05-09 General Electric Company Polycarbonates derived from alicyclic bisphenols

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