JPH06503883A - Control equipment for electronic device testing - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

[Detailed description of the invention] Control equipment for electronic device testing Background of the invention The present invention controls the environment involved when testing electronic devices at predetermined temperatures. This invention relates to a control device for electronic device testing. Here, the term "electronic device" , semiconductor devices, integrated circuits, hybrid electrical circuits packed with modular devices, etc. And it means.

There are typically two types of controllers that control testing of electronic devices. One thing is common It is characterized by "gravitational transport". This type of control device requires The child device is moved by gravity via the control device. This type of control device has There are two notable drawbacks. One is that the transfer speed is low, so the number of requests per unit time is low. Only a few electronic devices can be handled, and electronic devices are handled in a “naked” state. It means being exposed. The term "bare" means that an electronic device is means not covered. That is, the electronic device must be protected against any protective Pass through the control device uncovered by the media and be tested. That is.

Another type of control device is characterized as a “pick and place” control device. It is something that can be done. In this type of control device, the electronic device is -a, in particular It is placed on a tray and passed through a control device. From the collection, multiple electronic devices It is extracted and placed and comes into contact with the test head contactor for testing. After the exam It's brought back together.

This type of control device has a higher throughput than a gravity transfer type control device, or This is also a big problem since equipment is handling exposed electronic devices during testing. This is a major drawback. Electronic devices handled in this manner are highly susceptible to damage. For example, due to equipment failure or differences in the size of each electronic device, Easily damaged.

The invention has many advantages. The first one does not perform gravity transport This means that the processing lid is better than gravity transfer. The second advantage is that electronic The device must be placed in a protective medium and placed on a tray before being handled. and passes through a control device according to the invention. The device is in the testing phase. even if it is retained within the medium. Furthermore, the throughput can be reduced by handling multiple tray movement operations at the same time. increase by doing. Also, there are regular size trays and this tray size. By using a medium and holding the electronic device to adapt to the The control device according to the invention can be adapted to many types of devices by simply replacing parts at low cost. It becomes possible to handle chairs.

Other advantages and features will be discussed and made clear from the description that follows. cormorant.

Summary of the invention The electronic device control apparatus according to the present invention includes (1) a first carrier and at least one a second carrier, the second carrier being defined by the first carrier. The second "carrier" is placed on a seat above the first carrier, and each second "carrier" Both are electronic device carrier units that define one sheet, and are electronic device carrier units that define one sheet. Ensure that the vice leads are easily accessible from above the electronic device carrier unit. an electronic device carrier unit in which an electronic device is placed in the sheet; 2) Hands that change the temperature of electronic devices that pass through or through electronic devices. (3) A pre-test adjustment room with stages, and (3) a carrier unit that is position within the electronic device mounted on the carrier unit. (4) having a passage at a pace suitable to produce the desired temperature change; A test chamber in which a plurality of carrier units are movable along a passage, the passage at least one preparation position in which the carrier unit waits for testing; Test position where the carrier unit is inactive while the electronic devices on the unit are being tested. and at least one removal awaiting removal from the carrier unit or test chamber. and a standby position, the test chamber being disposed above the test position and below the passageway. A rad contactor and a carrier unit for testing with one summer number of contacts facing the means for moving the electronic device from the preparation position to the test position; and the electronic data on the second carrier. Test position to make electrical contact of the vise leads to the test rad contactor. means for raising a second carrier of the carrier unit located in the carrier unit; a test chamber having means for removing the test piece from the test position and moving it to a standby position; (5) Transport the carrier unit from the pre-test adjustment room into the test room and into the preparation position. (6) the temperature of the electronic device through which the electronic device passes; Returns electronic devices to a temperature where it is safe to expose them to ambient temperatures and (7) a post-test adjustment chamber with means for removing the carrier unit from the test chamber. and (8) means for transporting the carrier unit from the standby position to the post-test adjustment room. means for moving on a base suitable to achieve the desired unloading within the postconditioning chamber; ) Loading/unloading aisle and (10) Loading the carrier unit from the exit of the adjustment room after testing. ・Means for transporting the carrier unit to the loading/unloading aisle, and (11) transporting the carrier unit from the loading/unloading aisle. Means for transportation to the entrance of the pre-test conditioning room, and (12) for reinsertion into the pre-test conditioning room. The carrier unit is loaded and unloaded from the exit of the post-test conditioning room along the loading/unloading path to the pre-test conditioning room. (13) a means for moving the vehicle to the entrance of the preparation room; The unit j heads from the exit of the post-test adjustment room to the pre-test adjustment room along the passage. Remove the tested electronic device from the carrier unit as it is moved. and (14) an electronic device installed and removed along the loading/unloading path. and a means for replacing the electronic device with an untested electronic device.

The present invention is an electronic device that tests semiconductor devices with a higher pass rate than conventional ones. The purpose is to provide a device control device.

The present invention is a control device that satisfies the above objects and that occupies a small space. It also aims to provide a control device with a smaller pace than traditional systems. Ru.

The present invention is a control device that satisfies the above two objects, in which the device has a protection key. To provide a control device that can handle a device even if it is placed in a carrier. It is also aimed at

The present invention is a control device as described above, in which electronic devices are collectively moved. can be passed through the control device to create a complete chunk or a subset of the chunk. Provides an electronic device control that can be passed simultaneously to the test head contactor. It is also intended to

The present invention provides a reference size tray for supporting a set or group of electronic devices. We provide an electronic device control device that allows devices to be moved freely within the It is also intended to A second carrier in uniform contact with the standard size tray Within the housing, protection of the supported electronic devices is provided to a certain extent.

Other objects of the invention may be explained by or read from the contents of the specification. It is self-evident.

Brief description of the drawing FIG. 1 is a pictorial diagram showing the movement and passage of a carrier unit through the device; FIG. 2 is a perspective view showing one tray-shaped first carrier, and FIG. 3 is a perspective view showing one tray-shaped first carrier. A mechanism for loading and unloading the carrier unit and advancing the carrier unit. 4 is a sectional view taken along line 4-4 in FIG. 3, and FIG. 5 is a cross-sectional view taken along line 4-4 in FIG. 6 is an enlarged sectional view taken along line 6-6 in FIG. 5, and FIG. 7 is an enlarged sectional view taken along line 6-6 in FIG. 8 is a sectional view taken along line 7-7 in FIG. 7, FIG. 9 is a sectional view taken along line 8-8 in FIG. 8 is a cross-sectional view taken along line 9-9 in FIG. 8, and FIG. 10 is an enlarged cross-sectional view taken along line 10-10 in FIG. 11 is a sectional view taken along line 11-11 in FIG. 10, and FIG. 12 is a sectional view taken along line 11-11 in FIG. 13 is an enlarged cross-sectional view taken along the line 12-12, and FIG. 13 is a cross-sectional view taken along the line 13-13 in FIG. Figure 14A1 Figure 14B1 Figure 14C is a diagram showing different shapes of the second carrier; do, FIG. 15 is a diagram illustrating the control and operation of the present invention.

Description of the preferred embodiment Referring to FIGS. 1 and 2, electronic device 2 is depicted supported within sheet 4. It's dark. Seat 4 is a bag of two seats defined by a second carrier. It is one of them.

The second carrier is the device support insert 6 in this example. Device support insertion What is Iribe doing with Base 8, which is smaller in size than this? This base 8 is A boundary shoulder 1o is defined. In this example, it is the first carrier. The tray 12 is formed into a flat frame shape, and has four openings of uniform size. It stipulates 14. Each opening 14 fits into the base of the device support insert 6 do. As a result, the base can be slid into any one of the four openings. and the shoulder 10 is placed on the tray. In this way, four devices The supported insert is such that horizontal movement of the insert is regulated by the frame of the insert tray. into the insertion tray, and vertical movement is restricted by gravity. Therefore, it can be placed in the four defined openings.

As will be explained further below, the seat defined by the device support insert may be Each is shaped differently to accommodate electronic devices of any size and shape. You can do it. However, all inserts have a uniformly sized base . The device support inserts shown in Figures 1 and 2 each have two device seats. However, there may be more than two sheets, for example, there may be four sheets.

In this way, the insertion tray can support a wide variety of electronic devices. Wear.

With particular reference to FIG. 1, arrows indicate the path and movement of the insertion tray through the test controller 16. It shows the work. Referring again to FIG. 1, the rectangular plate designated T Diagrammatically shows each of the insertion trays 12 with all four openings 14 filled by the section 6. It is shown in Arrows indicate closed paths. Along this path, the tray T moves during typical operation of test controller 16. As shown in Figure 1, The iT moves from right to left along the forward platform 34. The tray has a sign When passing under the unloading mechanism indicated by U , the device support insert unloads the electronic device. The tray indicates the load When passing under the loading mechanism, the tray contains an electronic The device is reloaded.

The supply platform 18 typically depicts a predetermined means (.

By this means, the invention receives individual electronic devices, ie components.

This means, i.e., the delivery of components to or above the supply platform. The means to do so are not part of the invention. The loading mechanism is a platform that supplies individual electronic devices. Take it up from the platform and insert it with the insertion section 6 placed on the insertion tray 12. The devices are preferably loaded onto the device support sheet 4 in the order in which they are picked up. The loading mechanism is It has a permanent load pickup head 20. This head 20 is connected to the support 24A and It reciprocates along the track 22 suspended by and 24B. More details later As will be explained in , a suction means is provided at the base of the pickup head.

This suction means grips the electronic device during the loading process. In work, The load head 20 has two rest positions. These rest positions are located near the track 22. It is located on the opposite side. On the first side, the loading head 20 is attached to the supply platform. The suction means (not shown) moves downwardly and attracts one or more electronic devices. Grasp the vise and lift it up. The loading head then moves to the other side of the truck, Align the electronic device against the empty device support insert and lower it downward. Place the device in the seat by moving and releasing the suction means. Test control equipment During normal operation of the device, the loading head is moved from the supply platform to the device support. Continuously feed electronic devices to the insert sheet.

Referring again to FIG. 1, the reverse operation is performed by the unloading device 26 in a similar manner. . This unloading head 26 is located along the track 28 between supports 30A and 30B. Move at a constant pitch. This unloading head 26 similarly holds individual electronic devices. It has a suction means. In operation, the unloading head 26 is mounted near the support 30A. Move to one side of the rack 28. then move downwards and unload one or more electronic devices. Pull it out from the vise support insertion part. The unloading head is then moved to the opposite side of the truck 28. and drop the electronic device onto the transfer platform 32. transport platform 32 and remove the electronic device from the transfer platform and remove the tube or The means for packing into other support packages are not part of the invention. During operation The unloading mechanism continuously unloads the device from the device support insert and is tested. It provides a reliable flow of removed devices to the transfer platform.

Refer now to FIGS. 1 and 4. Each tray is filled with untested devices. After being fully loaded, the tray is moved to the inlet 35 of the ascending conveyor mechanism 36. is aligned to As will be explained and illustrated in more detail later, the ascending conveyor has shelves 37A and 37B. There are trays on these shelves 37A and 37B. be lifted up and lifted up. The ascending conveyor is located in a variable temperature room. hamber) 39.

This temperature-controlled room is used to store electronic devices as they pass through the temperature-controlled room along with the test head. Raise or lower the temperature.

The tray is inserted into this variable temperature room and pushed onto the shelf of the ascending conveyor by the pushing mechanism 38. It will be placed. Once each tray is at the top of the lift, it rests on the shelf and moves to the test aisle. or a truck (not shown in this diagram), the trays will be pushed off the shelf. Served. The tray designated T1 is in the ready position. That is, this Tray T1, located in the ready position, is located below the test head (not shown in this figure). waiting to be moved towards the testing position. This test head has the code T2 It is located directly above the tray indicated by . The tray marked with the symbol T3 has already been tested. and is in the take-out standby position. In other words, in this take-out standby position , tray T3 is waiting to be moved to the tray down conveyor 40.

On the other hand, two independently movable shuttles S1 and Sl are installed on the test track. It is placed. Sl is waiting for test or being tested by test head Achieve the objective of moving the tray. The second shuttle S2 was tested from below the test head to the entrance 41 (see Figure 13) to the descending conveyor. and move it to the aligned position. The tray present at that position is Waiting for an empty shelf, then pushed to an empty shelf, then chamber 43 (see Figure 12) descended through the This chamber 43 prevents the electronic device from getting wet. That is, substantially Return to ambient temperature.

The first shuttle S1 moves the tray in stages. For example, in one tray Ensure that there are enough controllers in the test head for all electronic devices mounted. If the tactor is in contact, the first shuttle will move each tray the same length as the tray. ie, each tray is indexed. However, If contact is not possible for all electronic devices on one tray or One shuttle has a length equal to the number of electronic devices that the head can handle. Move the tray (index the tray). On the other hand, the second shuttle is completely The tested tray is moved in one step to position it on the descending conveyor. let In this way, the two shuttles can be operated in parallel, and Move the tray containing all tested devices towards the waiting removal position while the tray can be moved to or within the test position. Wear.

Referring to FIGS. 3 and 10, the loading mechanism is depicted in further detail. Load head 20 is depicted as having a trunnion or carrier block 42. child The trunnion or carrier block 42 is connected to the linear actuator by a predetermined means. It is attached to the ether 44. In operation, the carrier block Essentially, it is moved by a belt in a two-stroke, single-stroke fashion. with one movement The block then moves above the loading platform 18 to pick up the device. The center position of the forward platform 34 is moved by one reciprocation. be moved to a more suitable position for loading electronic devices onto the lay. Like this In movement, the carrier block is guided by guide rods 5OA and 50B. There is. These guide rods 50A and 50B extend parallel to the movement of the belt. and slides through the opening defined by the carrier block. Carry Below the block is a pick that moves up and down by an actuator 54. Up head 52 extends. From the bottom of the pickup head, at least Also, one suction means protrudes. This suction means is attached to the neck 58. It is depicted as a pair of suction force pumps 56. The actuator 54 is a picker. Move the top head between two positions. In one position, the suction cup is electrically It contacts and presses the device, and in the second, higher position, the electrical The nozzle is located above the forward plastic, top frame and supply platform in a designated position. They are located at a distance apart. This predetermined spacing is There is sufficient realism between these when being moved by the actuator 44. It is only possible to provide the necessary information.

Referring to Figures 3.4.5 and 10, the anterior pranodoform 34 is further detailed. It is depicted in Figure 4 shows the three insertion points located above the anterior pranodoform. The forward platform with rays is shown. Each insertion tray has four Supports the device support insert. There are two denomous chair support insertion parts each. electronic devices are installed. The tray is placed on top of the forward platform. Its movement from right to left is restricted. It has multiple V-shaped grooves on the outside. By the number of guides 60A and 60B, the inner side is located in the center. It is guided by a V-shaped guide 60C. In Figure 4, the inner V-shaped A gap in which no guide exists is formed on the left side of the guide 60C. this A gear knob allows the leftmost tray to enter the ascending conveyor and infiltration chamber. Becomes Noh. A V-shaped guide is also formed on the right side of the central V-shaped guide 60C. and by the absence of this guide, the forward platform from the non-penetrating chamber This allows the tray to be ejected upwards.

Referring again to FIG. 4, the center tread of the forward platform 34 is shown. B accommodates three insertion portions 6A, 6B, and 6C. These three inserts Parts 6A, 6B, and 6C have been unloaded, in other words, electronic devices have been removed from them. has been removed. The rightmost insert in the center tray has been unloaded again. However, it still houses devices that have been tested. Figure 3 shows that the loading head is electronic. The device is shown positioned for placement in the left-most insert of the center insertion tray. Figure 3 also shows that the unloading head is located in the rightmost insertion section of the center insertion tray. shown in position to remove the remaining two tested electronic devices in the There is.

Referring to FIGS. 6-9, the ascending conveyor is depicted in great detail. two Vertical beams 70A and 70B are displaceably spaced apart. inside each beam On the face, i.e. on the side of each beam facing the other beams, there are a plurality of horizontal shelves 3. 7A and 37B are arranged. Multiple shelves located on each beam are uniformly the shelves of one beam at any time in operation are The beam is aligned with the shelf. The beam is movable and at least It has four separate parts. Multiple beams are horizontally closest to each other have. In this position, these beams are said to be contracted. Ru. In such a retracted position, the The beams are spaced close enough to each other to allow insertion of the trays. horizontal In , the beam has an extended position.

In this expanded position, the beams are spaced apart by the greatest distance. smell this position However, the gap between the shelves is so large that the tray cannot be placed on the shelves. Bee The frame has a high position and a low position in the vertical direction. In Figure 8, the transport A plurality of arrows cooperating with beam 70b on the right side of the elevator indicate horizontal actuators. 71A and 71B and the vertical actuator 69. The path and direction of beam movement is shown. The same applies to the right beam of the transport elevator. It moves counterclockwise.

Referring to FIG. 9, the insertion tray has a width greater than the length of the shelf of the beam. It is depicted. Along either side edge of each beam are turns including retention tabs 74. Rotatable posts (72A and 72B) are provided. Retaining tab beam is vertical Fixed in direction and horizontal direction. The purpose of the retention tab is to extend the shelf beam before the insertion tray is rotated. Not supported by shelves In this embodiment, the retaining tab supports the insertion tray instead of the shelf, as shown in phantom.

When the shelf beam is subsequently retracted and support is provided by the shelf, the retention tabs will be solid lines. It rotates to a position unrelated to the insertion tray as shown in .

Then, the tray is moved upward by the conveyor as follows. . First, the retention tab rotates below the insertion tray and the subsequent shelving Instead of retraction of the beam, i.e. instead of the shelf being pulled away from the tray, the insertion tray hold. The shelf beam moves down to a lower position, below the insertion tray. Contract to move the shelf backwards.

The retention tabs then attach the clear lug to the shelf with the insert tray supported by them. the shelf beam moves vertically upwards to a higher position. Thus , during the above steps, each insertion tray in the conveyor is moved up by one shelf. be moved towards This process is repeated continuously throughout the operation of the test control equipment. Ru. When the insertion tray reaches the top shelf and the shelf beam is in the high position, The top insertion tray runs the test tracks from the top shelf onto the V-shaped grooves facing each other. It is aligned so that it slides towards.

Referring to FIG. 12, the descending conveyor 40 carries insertion trays in the same manner as the ascending conveyor. However, the movement of the shelf beam and retaining tab is substantially reversed. most The beam located on the right side moves counterclockwise, when the beam is contracted, i.e. When supporting a shelf or an insert tray, the shelf will move from a high position to a low position. Or, when the beam is expanded, it moves from a lower position to a higher position. Retention The tabs function similarly to those provided on an ascending conveyor. That is, the shelf beam expands Holds the tray while in position. Referring to Figure 7, the insertion tray is It is located on the top shelf of the elevator 36. The rotating arm 80 connects the frame 82 have. This frame 82 includes a slot 84 defined by an arm; It is slidably attached to the arm 80 by a slot rider 86. times The movable arm is in a first position set in the central portion above the top shelf of the transport elevator. and a second position above the test truck 81.

The pair of guide rods 87A, 87B are independent of the angular movement of the drive arm 80. The frame movement is linear.

FIG. 8 shows a flange 88 along the outer edge of frame 82. FIG. This hula contacts the insertion tray located at the top of the transport elevator and pushes it inward. It extends downwards as if to obtain. Movement from the transport elevator to the test truck In order to keep the passage straight, 7-shaped guide rails 89A and 89B are installed on both sides of the passage. located along the outside of the When the insertion tray enters the test track, a V-shaped The guide provides lateral stability as it moves along the test track relative to the insertion tray. giving sex.

Referring to FIGS. 10 and 11, the RAD contactor 90 for testing the electronic device The movement and mechanics of the individual device support inserts in contact with the device are shown. test The helad contactor is located in a predetermined position above the test track, preferably in the center. to the length of the test truck so that the tray being placed is the one being tested. fixed in the center. In these drawings, two electrical devices are being tested at the same time. -Only rad contactors are shown. Like this, only one The movement of the device/chair support insert is necessary and the interlocking of the tray along the test track is made equal to the pitch of the device support insert in steps. The insertion tube is connected to the test head. Once placed and aligned in the contactor, the rising platform below the insertion tube 92, the button moves upwardly to push the insert into its socket in the insert tray. Lift it up and place it in contact with the rad contactor under test.

When the test is complete, the raising platform moves downwards and lifts the software in the tray. Place the insertion tube into the socket. The tray is then immediately followed by the test head. is moved forward, that is, to the right according to the east direction of the diagram, until it is located below the Shiga However, one or more buttons may be provided. For example, you can set up four buttons and use multiple buttons. electronic devices can be placed in four inserts at the same time to a test site with appropriate capabilities. It may also be brought into contact with a head contactor.

Referring to Figure 13, remove the insert tray from the test track to the top of the descending conveyor. The removal mechanism is illustrated. A pair of extraction arms 100A and 100 facing each other B is rotated.

At the end of the extraction arm remote from the rotating wheels, V rollers 102A and 102B are installed. One is provided for each arm.

■-shaped rollers engage grooves on the corresponding sides of the insertion tray. the arm rotates When the right arm rotates counterclockwise and the left arm rotates clockwise, the training A is pushed out from the test truck into the non-penetration chamber 43. Each tray is in a non-permeable room Upon reaching the bottom position of the extraction tongue 10 with an upwardly projecting flange 106 4 hooks onto the bottom tray and pulls out onto the forward platform 34.

Referring to Figure 3.5.10.15, move the tray along the forward platform. The mechanism for moving is illustrated. Normal length located below the forward platform A slidable advance bar 110 located at the center in the hand direction includes a plurality of vertically protruding bars. The bin 112 is supported. In the illustrated state, four such bins are provided. ing. These bins are pushed up and down to high and low positions respectively. It will be done. In the lower position, these bins are spaced apart from the insertion tray and The input tray is located above these. At higher positions, the bins are above these It is engaged by a notch 114 to the located insertion tray. These cutouts 114 is defined by the outer edge of each insertion tray (see FIG. 2).

In the case of the insertion tray of this embodiment, four cutouts are defined. illustrated In the embodiment shown, the cutouts are arranged along the edge of the tray, so that the tray can advance over one device support insert in one step. Wear. In operation, the advancement bar is move the bin to the far right side of its range of motion and raise the bin to remove one or two bins. A. The number of trays engaged depends on the position. The forward bar is then Move to the far left side of its range of motion and push the bottle down.

In this way, the trays are all advanced, i.e. one device support insert at a time. Start out.

Referring to Figure 5.7.10.11.12.13.15, move the tray to the test track. The mechanism for advancing inside is shown.

As mentioned above, individually movable shuttles 120A and 120B are provided. There is. These shuttles are located within their respective range of travel along the test track. by corresponding screws 122A and 122B. These screws are attached to the shuttle. Therefore, it engages with the prescribed screw. These shuttles also have openings, which guides 124A and 124 parallel to screws 122A and 122B through the openings. B provides guided interlocking of each shuttle. Each shuttle has a head 126A and 126B are supported. These heads are fixed within the head It supports at least two trays that engage bins 128. shuttle head is movable up and down between two positions. Shuttle head separates from insertion tray and the bin engages a socket 130 along the inner surface of the insertion tray. It is in a low position. In each shuttle, the space between the tray-engaging bins is Equal to the spacing between the sockets of the flank pair on the ray. Independent movement of two shuttles and providing relatively independent handling of the tray as it is removed from the test head position. . Once the first shuttle 120B has moved to the final test position, it can be released from the tray. and is in a position where it can grasp the tray in its home position, i.e., ready position. Return. However, the first shuttle 120B has a tray that is similar to the second shuttle 120B. Do not release the tray under test until it is held by B. This style , multiple trays along the test track are always controlled by one of the shuttles. It means that you are in control. The last set of electronic devices on a particular tray under test When the tray has completed the test, the second shuttle moves the tray to the standby removal position. make it move. Meanwhile, the first shuttle carries the tray on it from the ready position. Moving to test position. Usually, while testing one tray, move the other trays. can be done. The direction of this movement is either towards the test position or Either it is heading towards the machine removal position.

14A, 14B, and 14C, different configurations of device support inserts are shown. ing. FIG. 14A shows an insert 132A that supports one large device 134A. It shows. FIG. 14B shows an insert that holds four devices 134B in parallel. The portion 132B is shown. FIG. 14C shows two devices 134C arranged in parallel. The insertion portion 132C shown in FIG.

Referring to Figure 15, the control and continuity system includes a vacuum machine for the extraction head. function, tray advance function, tray engagement function, tray transport function, and tray operation device. The system is illustrated as having functions and component operation functions for the system.

international search report Continuation of front page (72) Inventor: Hawks, Malcolm Buie, California, USA state Flanders Drive Number 58 284, San Diego, 92126 (72) Inventor: Twigg, Ray G - California, United States of America 12597 Fairproutsk Road, San Diego, 92131 (72) Inventor: Krug, Mark W. California, United States of America 92131, San Diego, Lu Canes

Claims (14)

[Claims] 1. A device that provides an electronic device to a tester that performs a test, (a) a plurality of carriers each supporting a set having a plurality of electronic devices; (b) a loading stage; (c) a pre-examination room; (d) a test stage; (e) a post-test chamber; (f) an unloading stage; (g) placing a set of electronic devices on each carrier when the carriers are in the loading stage; (h) a set of electronic data when the carrier is in the unloading stage; a means for unloading the vices from each carrier; and (i) a means for unloading the devices from each carrier; When a pair of electronic devices supported by a carrier and a tester means for providing electrical contact; (j) means for periodically conveying a plurality of carriers in a closed loop; The loop runs from the cargo stage through the pre-test chamber and from the pre-test chamber to the test stage. Jihe, from the test stage to the post-test chamber, through the post-test chamber to the unloading stage, and then to the unloading stage. Loading stage to loading stage, each device carrier stopped at the loading stage long enough to load the set of electronic devices; Each carrier carries a set of electronic devices supported by the carrier. Each carrier is stopped at the test stage for sufficient time for the desired test. The transport is stopped at the unloading stage long enough to unload the electronic device. A device comprising a feeding means. 2. The carrier is a first carrier, and the device further includes a second carrier. each first carrier supports a set of second carriers, and each first carrier supports a set of second carriers. The rear supports a set of electronic devices, and the means for loading the set of electronic devices is operative to load the set of electronic devices onto the set of second carriers; The means for unloading the set of electronic devices includes unloading the set of electronic devices at the unloading stage. electronic devices of the first carrier from said set of second carriers. 2. The apparatus of claim 1, operative to. 3. Each second carrier has a seat within the seat defined by its first carrier. and held within this sheet by gravity, and by said carrier The means for providing electrical contact between the supported set of electronic devices and the tester comprises: a test head having a contactor positioned above the test position and facing downward; raising a second carrier of the set of first carriers in position to Leads of an electronic device supported by a second carrier are connected to the test head computer. and means for positioning the tactor in electrical contact with the tactor. Device. 4. defined by the first carrier at the bottom of each second carrier sheet. a set of second carriers elevated in the test position; The means for causing the second carrier placed on the through hole to pass through each through hole. comprising means for raising the seat to a predetermined position, and in the predetermined position is a set of electronic device leads supported by an elevated second carrier 4. The apparatus of claim 3, wherein the test head contactor is in electrical contact with the test head contactor. 5. The pre-test chamber defines an inlet and an outlet, and the apparatus further includes one A rising conveyor with multiple sheets holding carriers of means for moving the rear from the loading stage onto the bottom sheet of the ascending conveyor and an exit; means for progressively moving said sheet upwardly towards the top of the ascending conveyor; Remove the carrier from the outlet and remove the carrier from the pre-test chamber through the exit. 2. The device of claim 1, further comprising means for removing. 6. The post-test chamber defines an inlet and an outlet, and the apparatus further includes a A descending conveyor with multiple sheets holding carriers of means for inserting the rear onto the sheet at the top of the descending conveyor and downwardly towards the exit. means for progressively moving said sheets and carriers from the bottom sheet of the descending conveyor; Remove and remove the carrier from the test chamber via the exit station and remove it from the unloading station. 2. A device according to claim 1, comprising means for placing the device on the board. 7. A set of electronic devices is placed in each carrier when the carriers are in the loading stage. means for transporting the electrical device back and forth between the loading stage and the source of the electrical device; a load head that is attached to the load head, and an electronic device source that includes one or more electronic device sources; Pick up individual electronic devices further and release the electronic devices at the loading stage 2. A device according to claim 1, further comprising means for placing the device on a carrier. 8. A set of electronic devices is placed in each carrier when the carriers are in the unloading stage. The means for unloading from the An unloading head that moves in the direction of picks up more individual electronic devices and transfers the picked electronic devices to a transfer 2. The device of claim 1, further comprising means for releasing in a platform. 9. Placed between the pre-examination room and the exam stage, so that the exam stage is connected to other carriers. Tests that can stop carriers present in the pre-test chamber when occupied by It is located between the pre-test stage, the test stage and the post-test room, and the post-test room. while waiting for an empty seat to be transported from the testing stage to the post-testing room. A post-test stage that can stop a carrier and a pre-test stage to a test stage. means for transporting the carrier from the test stage to the post-test stage; further comprising a means for conveying the 2. The device of claim 1, wherein the device is capable of 10. The pre-test chamber defines an inlet and an outlet, and the apparatus further comprises: an ascending conveyor having a plurality of sheets holding one first carrier; Move the carrier from the loading stage through the inlet onto the bottom sheet of the rising conveyor means for gradually moving the sheet upwardly toward the exit; Remove the carrier from the top sheet of the ascending conveyor and try the first carrier. 3. The apparatus of claim 2, further comprising means for removal from the pre-test chamber via the outlet. 11. The post-test chamber defines an inlet and an outlet, and the apparatus further includes: a descending conveyor having a plurality of sheets holding one first carrier; means for inserting the carrier of the carrier through the inlet onto the sheet at the top of the descending conveyor; means for progressively moving the first carrier downwardly toward the exit; Remove the first carrier from the bottom sheet of the bear and remove the exit from the post-test chamber. 3. means for removing and placing on the unloading stage via the Device. 12. a set of electronic devices each when said first carrier is in a loading stage; means for loading each first carrier between the loading stage and the electronic device source; A loading head movable in a reciprocating manner; removes more individual electronic devices at the electronic device source and means for releasing the vise at the loading stage and placing it on the first carrier; 3. The apparatus of claim 2, comprising: 13. a set of electronic devices to each when the first carrier is in the unloading stage. The means for unloading from the first carrier includes an unloading stage and a transfer platform. An unloading head that is movable to reciprocate between or more individual electronic devices from the first carrier; and means for releasing the loaded device at the transfer platform. The apparatus according to claim 2. 14. Placed between the pre-test chamber and the test stage so that the test stage is not connected to other carriers. The first carrier present in the pre-examination room when occupied by between the test stage and the post-test room, While waiting for an empty seat in the next room, there were some people waiting to be transported from the test stage to the post-test room. Post-test stage and pre-test stage that can stop the first carrier a means for transporting the first carrier from the test stage to the test stage; and a means for transporting the first carrier from the test stage to the test stage; further comprising means for transporting the first carrier to the stage of said two transport stages. 3. Apparatus according to claim 2, wherein the means are each independently operable.