JP3093264B2 - Control device for electronic device test - Google Patents

Description

Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electronic device test control apparatus for controlling an environment associated with testing an electronic device at a predetermined temperature. Here, the term "electronic device" indicates and means a semiconductor device, an integrated circuit, a hybrid electric circuit in which a modular is packed, and the like.

Usually, the control device for controlling the test of the electronic device includes 2
There are types. One is commonly characterized by "gravity transfer". In this type of control device, the electronic device is moved by gravity via the control device. This type of control has two significant disadvantages. One is that due to the low transport speed, only a few electronic devices can be handled per unit time, and the electronic devices are handled "naked". The term "bare" refers to a condition in which the electronic device is not covered by anything. That is, the electronic device passes through the controller and is tested without being covered by any protective medium.

Another type of control device is the “sampling and placing”
It is characterized as a control device. In this type of control device, the electronic devices are grouped together, in particular on a tray, and pass through the control device. From the group, a plurality of electronic devices are extracted and placed, and come into contact with a test head contactor for testing. After the test, they will be put back together.

This type of controller has a higher throughput than a gravity-transfer-type controller, but this is also a major drawback because it also handles the electronic device naked during the testing phase. Electronic devices handled in this way are very susceptible to damage, for example, due to equipment failure or differences in the size of each electronic device.

The present invention has many advantages. The first is that there is no gravity transfer, so the throughput is higher than with gravity transfer. A second advantage is that the electronic device is placed in a protective medium before being handled, transported on a tray and passed through a control device according to the invention. The device is held in the medium during the test phase. Further, the throughput increases by performing a plurality of tray moving operations simultaneously. Also, by using a normal sized tray and a medium that holds the electronic device to accommodate the size of the tray, the control device according to the present invention allows a number of parts to be replaced simply by inexpensively replacing parts. It is possible to handle various types of devices.

Other advantages and features will be discussed and apparent from the description that follows.

SUMMARY OF THE INVENTION An electronic device control apparatus according to the present invention has (1) a first carrier and at least one second carrier,
A second carrier mounted on the sheet defined by the first carrier above the first carrier, each second carrier being an electronic device carrier unit defining at least one sheet; An electronic device carrier unit in which the electronic device is placed in the sheet so that the device leads are easily accessible from above the electronic device carrier unit; and (2) changing the temperature of the electronic device passing through the electronic device. And (3) sequentially moving the carrier unit through the pre-test conditioning chamber, the movement causing a desired temperature change in the electronic device mounted on the carrier unit. (4) having a passage, and a plurality of carrier units can move along the passage. A test room, wherein the passage includes at least one preparation position where the carrier unit waits for a test, a test position where the carrier unit pauses while an electronic device on the carrier unit is being tested, At least one waiting for removal from
A test head contactor disposed above the test position of the passage and having a plurality of downwardly facing contacts; and means for moving the carrier unit from the ready position to the test position. Means for raising the second carrier of the carrier unit at the test position to electrically contact the leads of the electronic device on the second carrier to the test head contactor; and removing the carrier unit from the test position and waiting. A test chamber having means for moving the carrier unit to a position, (5) means for moving the carrier unit from the pre-test adjustment chamber into the test chamber, and transporting the carrier unit to the preparation position, and (6) an electronic device passing therethrough. Means for returning the temperature of the electronic device to a temperature at which it is safe to expose the electronic device to the ambient temperature (7) means for transporting the carrier unit from the stand-by position for removing the test chamber to the post-test adjustment chamber, and (8) the carrier unit for achieving a desired unloading in the post-test adjustment chamber. Means for moving at a suitable pace; (9) loading / unloading passage; (10) means for transporting the carrier unit from the exit of the adjustment chamber to the loading / unloading passage after the test; and (11) loading / unloading the carrier unit.・
Means for transporting from the unloading passage to the entrance of the pre-test conditioning chamber;
(12) means for moving the carrier unit along the loading / unloading path from the outlet of the post-test adjustment chamber to the entrance of the pre-test adjustment chamber for reinsertion into the pre-test adjustment chamber; and (13) loading / unloading. Means provided along the cargo passage, for removing the tested electronic device from the carrier unit as the unit moves along the passage from the outlet of the post-test conditioning chamber toward the pre-test conditioning chamber; 14) means for replacing the removed electronic device with an untested electronic device provided along the loading / unloading path.

SUMMARY OF THE INVENTION An object of the present invention is to provide an electronic device control apparatus that performs a test of a semiconductor device at a higher pass ratio than a conventional one.

Another object of the present invention is to provide a control device that satisfies the above-mentioned object, and that occupies a small space that is smaller than that of a conventional system.

Another object of the present invention is to provide a control device that satisfies the above two objects, and that can handle a device even when the device is placed in a protection carrier.

The present invention is a control device as described above, wherein the electronic devices can be moved together and moved through the control device, and the complete bundle or a subset of the bundle can be passed simultaneously to the test head contactor. Another object is to provide a device control device.

It is another object of the present invention to provide an electronic device control device that can freely move devices within a standard-size tray that supports one set or a group of electronic devices. Within the second carrier that is in uniform contact with the reference size tray, the supported electronic devices are protected to a certain degree.

Other objects of the present invention will be explained by the contents of the specification or will be obvious from reading it.

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a pictorial diagram showing the movement and passage of a carrier unit through an apparatus, FIG. 2 is a perspective view showing one tray-shaped first carrier, and FIG. FIG. 4 is a front view showing a mechanism for loading / unloading the device and moving the carrier unit forward. FIG. 4 is a cross-sectional view taken along line 4-4 in FIG. 3. FIG. 5 is an enlarged cross-sectional view taken along line 5-5 in FIG. 6 is a sectional view taken along line 6-6 in FIG. 5, FIG. 7 is a sectional view taken along line 7-7 in FIG. 5, FIG. 8 is a sectional view taken along line 8-8 in FIG. 8, FIG. 10 is an enlarged sectional view taken along line 10-10 in FIG. 3, FIG. 11 is a sectional view taken along line 11-11 in FIG. 10, and FIG. FIG. 13 is a sectional view taken along line 13-13 in FIG. 12, FIG. 14A, FIG. 14B, and FIG. Figure shows the turned shape And, FIG. 15 is a diagram showing the control and operation of the present invention.

DESCRIPTION OF THE PREFERRED EMBODIMENTS Referring to FIGS. 1 and 2, an electronic device 2 is depicted supported within a sheet 4. Sheet 4 is one of the two sheets defined by the second carrier. The second carrier is the device support insertion section 6 in this embodiment. The device support insert has a smaller base 8. This base 8
Defines the boundary shoulder 10. In this embodiment, the tray 12 serving as the first carrier is formed in a flat frame shape, and defines four openings 14 having a uniform size. Each opening 14 is provided in the device support insert 6
Fits the base of As a result, the base is slidably inserted into any one of the four openings, and the shoulder 10 is placed on the tray. In this manner, the four device support inserts are defined by the insertion tray in a state where the movement of the insertion unit in the horizontal direction is restricted by the frame of the insertion tray and the movement in the vertical direction is restricted by gravity. Can be placed in the four openings.

As will be further described below, the sheets defined by the device support inserts may be formed differently to accommodate electronic devices of any size and shape. However, all inserts have a uniformly sized base. The device support inserts shown in FIGS. 1 and 2 each have two device sheets,
Instead of one, it may have more, for example, four sheets. In this way, the insertion tray can support a wide variety of electronic devices.

With particular reference to FIG. 1, the arrows indicate the path and operation of the insertion tray through the test controller 16. Referring again to FIG. 1, a rectangular flat plate indicated by a symbol T schematically shows each of the insertion trays 12 in which all four openings 14 are filled by the insertion portions 6. Arrows indicate closed paths. Along this path, the tray T
Move between 16 typical moves. As shown in FIG.
The tray T moves along the front platform 34 from right to left. The tray is unloaded in U.
Passing below the g mechanism), the device support insert unloads the electronic device. As the tray passes below the loading mechanism, indicated by L, the tray is reloaded with electronic devices.

The supply platform 18 typically depicts a predetermined means. By this means, the present invention receives individual electronic devices, ie components. This type of stage, ie, the means by which the components arrive at or above the supply platform, is not part of the present invention. The loading mechanism L picks up the individual electronic devices from the supply platform and loads the device supporting sheets 4 in the order in which the electronic devices are picked up with the insertion section 6 placed on the insertion tray 12. The loading mechanism usually has a load pickup head 20. The head 20 reciprocates along a track 22 suspended by supports 24A and 24B. As will be described later in detail, suction means is provided at the base of the pickup head. This suction means grips the electronic device during the loading process. At work, loading head
20 has two rest positions. These rest positions are located substantially opposite the track 22. On the first side, the loading head 20 is located above the supply platform,
A suction means (not shown) moves downward to grip and lift one or more electronic devices. The load head then moves to the opposite side of the truck, aligning the electronic device with the empty device support insert sheet, and moving down to release the suction means to put the device into the sheet. During normal operation of the test controller, the loading head continuously supplies electronic devices from the supply platform to the device support insert sheet.

Referring again to FIG. 1, the reverse operation is performed by the unloading device 26 in a similar manner. The unloading head 26 has a support 30
It moves at a predetermined pitch along the track 28 between A and B. The unloading head 26 also has suction means for gripping individual electronic devices. In operation, the unloading head 26 moves to one side of the track 28 near the support 30A. Then, it moves downward and pulls out one or more electronic devices from the device support insert. And the unloading head is truck 28
And drop the electronic device onto the transfer platform 32. The transfer platform 32 and the means for removing the electronic device from the transfer platform and packing it in a tube or other support package are not part of the present invention. In operation, the unloading mechanism continuously unloads the device from the device support insert and provides a reliable flow of the tested device to the transfer platform.

Next, reference is made to FIGS. After each tray is fully loaded by the untested device, the trays are moved and aligned with the entrance 35 of the ascending conveyor mechanism 36. As will be described and illustrated in further detail below, the lift conveyor has shelves 37A and 37B. A tray is placed on these shelves 37A and 37B and raised. The ascending conveyor is arranged in an environmental chamber 39. The variable temperature chamber raises or lowers the temperature of the electronic device as it passes through the variable temperature chamber toward the test head. The tray is inserted into this temperature change chamber, and is placed on a shelf of an ascending conveyor by an extruding mechanism 38. As each tray comes to the top of the lift, the trays resting on the shelves and guided to a test path or track (not shown in this view) are pushed out of the shelves.
The tray indicated by reference numeral T1 is located at the preparation position.
That is, the tray T1 located at the preparation position is waiting to be moved toward the test position below the test head (not shown in this drawing). This test head is labeled T2
It is located directly above the tray indicated by. The tray indicated by reference symbol T3 has been tested and is located at the unloading standby position. That is, at the take-out standby position, the tray T3 is waiting to be moved to the tray lowering conveyor 40. On the other hand, two independently movable shuttles S1 and S2 are installed on the test track. S1 serves the purpose of moving the tray waiting for the test or being tested by the test head. The second shuttle S2 moves the tested tray from below the test head to a position aligned with the entrance 41 to the descending conveyor (see FIG. 13). The tray present at that position is waiting for an empty shelf, then pushed out to an empty shelf and subsequently lowered through the chamber 43 (see FIG. 12). This chamber 43 keeps the electronic device from getting wet. That is, the temperature is substantially returned to the ambient temperature.

The first shuttle S1 moves the tray stepwise.
For example, if a sufficient number of contactors on the test head are in contact with all the electronic devices mounted on one tray, the first shuttle will make each tray the same as the length of the tray. The trays are moved at once at intervals, that is, each tray is indexed. However, if the head cannot contact all the electronic devices on one tray, the first shuttle moves the tray by the length of the number of electronic devices that the head can handle (tray). Index). The second shuttle, on the other hand, moves the fully tested tray in one step to position it on the down conveyor. In this way, the two shuttles can be operated in parallel, and the tray containing all tested devices can be moved toward the standby removal position while the tray is moved to the test position or It can move within the test position.

Referring to FIGS. 3 and 10, the loading mechanism is depicted in further detail. The loading head 20 is depicted as having a trunnion or carrier block 42. The trunnion or carrier block 42 is attached to the linear actuator 44 by a predetermined means. In operation, the carrier block is basically moved in a two-stroke manner by a belt. With one movement, the block is moved above the loading platform 18 picking up the device, and in a single reciprocating movement, into a position more suitable for loading electronic devices onto a tray centrally located on the forward platform 34. Be moved. In such a movement, the carrier block is guided by the guide rods 50A and 50B. These guide rods 50A and 50B extend parallel to the movement of the belt and slide through openings defined by the carrier block. A pickup head 52 that reciprocates up and down by an actuator 54 extends below the carrier block. At least one suction means protrudes from the bottom of the pickup head. This suction means includes a pair of suction cups attached to the neck 58.
Pictured as 56. Actuator 54 moves the pick-up head between the two positions, in one position the suction cup contacts and presses against the electrical device, and in the second, higher position, the electrical device connects to the front platform And at a predetermined distance above the supply platform. This predetermined spacing is only sufficient to provide sufficient clearance between the load head as it is being moved by the linear actuator 44.

Referring to FIGS. 3, 4, 5 and 10, the front platform 34 is depicted in more detail. FIG. 4 shows a front platform with three insertion trays located above the front platform. Each insertion tray supports four device support inserts. These device support inserts each carry two electronic devices. The tray is restricted from its right to left movement at the top of the front platform. A plurality of guides 60A and 60B having a plurality of V-shaped grooves on the outside
On the inside, it is guided by a V-shaped guide 60C located at the center. In FIG. 4, a gap where no guide exists is formed on the left side of the inner V-shaped guide 60C. This gap allows the leftmost tray to enter the lift conveyor and permeate chamber. No V-shaped guide is also formed on the right side of the central V-shaped guide 60C, and the absence of this guide allows the tray to be discharged from the non-penetrable chamber onto the front platform.

Referring again to FIG. 4, the central tray of the front platform 34, as shown, houses three inserts 6A, 6B, and 6C. These three inserts 6A, 6B, and 6C have been unloaded, in other words, the electronic device has been removed therefrom. The rightmost insert in the middle tray has not yet been unloaded, but still contains the tested device. FIG. 3 shows that the loading head places the electronic device on the leftmost insertion part of the central insertion tray, and FIG. 3 shows that the unloading head is one of the central insertion trays. The rightmost insert is shown in position to remove the remaining two electronic devices tested.

Referring to FIGS. 6-9, the lift conveyor is depicted in greater detail. The two vertical beams 70A and 70B are displaceably spaced. The inner surface of each beam,
A plurality of horizontal shelves 37A and 37B are arranged on the side surface of each beam facing the other beams. The shelves located on each beam are evenly spaced, so that at any time in operation one beam shelf is aligned with the opposing beam shelf. The beam is movable and has at least four other parts.
The plurality of beams have positions closest to each other horizontally. In this position, these beams can be said to be contracted. In such a contracted position,
The beams are close to each other with sufficient spacing to allow insertion of trays located on a pair of aligned shelves. Horizontally, the beam has an extended position. In this extended position, the beams are separated by the largest distance. In this position, the tray cannot be placed on the shelf because the gap between the shelves is large. The beam has a high position and a low position in the vertical direction. In FIG. 8, the arrows cooperating with beam 70b on the right side of the transport elevator indicate the path and direction of the inherent beam motion when driven by horizontal actuators 71A and 71B and vertical actuator 69. The beam on the right side of the transport elevator moves similarly, but also moves counterclockwise.

Referring to FIG. 9, the insertion tray is depicted as having a width greater than the length of the beam shelf. Along each side edge of each beam are disposed rotatable posts (72A and 72B) that include retaining tabs 74. The holding tab beam is fixed vertically and horizontally.
The purpose of the retaining tab is to rotate below the insertion tray before expansion of the shelf beam takes place. Without support by the shelf, the retaining tabs support the insertion tray instead of the shelf, as shown by phantom lines. When the shelf beam subsequently contracts to provide support by the shelf, the retaining tabs rotate to a position unrelated to the insertion tray, as shown by the solid line.

Considering the insertion tray indicated by a virtual line with reference to FIG. 8, the upward movement of the tray by the transport conveyor is performed as follows. First, the retaining tabs rotate below the insert tray to hold the insert tray instead of the subsequent contraction of the shelf beam, i.e., instead of pulling the shelf away from the tray. The shelf beam moves downward toward a lower position and contracts to move the shelf backwards below the insertion tray. The holding tabs provide clearance to the shelf while the insertion tray is supported by them, and the shelf beam moves vertically upward to be at a higher position. Thus, during the steps described above, each insertion tray in the conveyor is moved up by one shelf. This process is repeated continuously throughout the operation of the test controller. When the insert tray reaches the top shelf and the shelf beam is at an elevated position, the top insert tray is aligned to slide toward the test track from the top shelf onto opposing V-shaped grooves. You.

Referring to FIG. 12, the descending conveyor 40 moves the insertion tray in the same manner as the ascending conveyor, but the operation of the shelf beams and holding tabs is substantially reversed. The rightmost beam moves counterclockwise, and when the beam is contracted, i.e., when the shelf is supporting the insertion tray, the shelf moves from a higher position to a lower position, but the beam expands. When it is done, it moves from a low position to a high position. The retaining tabs function similarly to those provided on a lifting conveyor. That is, the tray is held while the shelf beam is in the extended position. Referring to FIG. 7, the insertion tray is located on a shelf at the top of the transport elevator 36. The rotating arm 80 has a frame 82. This frame 82
The arm 70 is slidably mounted by a slot 84 defined by the arm and a slot rider 86. The pivot arm is movable between a first position set in a central portion above a shelf at the top of the transport elevator and a second position above a test track 81. The pair of guide rods 87A and 87B make the movement of the frame linear regardless of the angular movement of the drive arm 80.
FIG. 8 shows a flange 88 along the outer edge of the frame 82. The flange extends downwardly so as to contact and push the insertion tray located on top of the transport elevator. V-shaped guide rails 89A and 89B are provided along the outside of both side edges of the passage to keep the movement from the transport elevator to the test track linear. As the insertion tray enters the test track, the V-shaped guide provides lateral stability to the insertion tray as it moves along the test track.

Referring to FIGS. 10 and 11, the motion and mechanism of the individual device support inserts that bring the electronic device into contact with the test head contactor 90 are shown. The test head contactor is preferably located at a predetermined position above the test track,
The centrally located tray is fixed centrally with respect to the length of the test track such that it is the one being tested.
In these figures, only a test head contactor capable of testing two electrical devices simultaneously is shown.
Thus, movement of only one device support insert is required, and movement of the tray along the test track is stepwise equalized to the pitch of the device support insert. When the insert is located and aligned with the test head contactor,
The lifting platform 92, or pusher, below the insert moves upward to lift the insert from its socket in the insertion tray and contact the test head contactor.
When the test is completed, the lifting platform moves down to position the insert in the socket in the tray.
The tray is then moved forward, ie, to the right according to the east of the figure, until the next instantaneous insert is below the test head. However, one or more pushers may be provided. For example, four pushers may be provided so that a plurality of electronic devices are simultaneously placed in the four inserts and contact a test head contactor having appropriate capabilities.

Referring to FIG. 13, a mechanism for removing the insertion tray from the test track to the top of the descending conveyor is depicted. A pair of extraction arms 100A and 100B facing each other are rotated. At the end of the extraction arm away from the rotation axis, V rollers 102A and 102B are provided for each arm. The V-shaped rollers engage in grooves on the corresponding side of the insertion tray. When the arm is rotated, the right arm rotates counterclockwise and the left arm rotates clockwise, and the tray is pushed out of the test track into the non-penetrating chamber 43. As each tray arrives at the bottom position in the impervious chamber, the extraction tongue 104 with the upwardly projecting flange 106 hooks onto the bottom tray and pulls out to the front platform 34.

Referring to FIGS. 3, 5, 10, and 15, the mechanism for moving the tray along the front platform is illustrated.
A slidable advance bar 110 located below the front platform and typically centered longitudinally supports a plurality of vertically projecting pins 112. In the state shown, four such pins are provided. These pins are pushed up and down respectively to a high position and a low position. In the lower position, the pins are spaced from the insertion tray, and the insertion tray is located above them. In the elevated position, the pins are engaged by notches 114 in the insert trays located above them. These notches 114 are defined by the outer edges of each insertion tray (see FIG. 2). In the case of the insertion tray of this embodiment, four notches are defined. In the illustrated embodiment, the cutouts are located along the edges of the tray, so that the tray can be advanced over one device support insert in one step. In operation, where the tray needs to be advanced, the advance bar moves to the far right of its range of motion and raises the pins to engage one or two trays. The number of engaged trays depends on the location. The advance bar then moves to the far left of its range of motion and depresses the pin. Thus, the trays are all advanced, ie, indexing one device support insert at a time.

Referring to FIGS. 5, 7, 10, 11, 12, 13, and 15, there is shown a mechanism for advancing a tray in a test track. As previously mentioned, individually movable shuttles 120A and 120B
Is provided. The shuttles are moved along their test tracks within their respective ranges of travel by corresponding screws 122A and 122B. These screws engage the screws defined by the shuttle. The shuttles also have openings through which the screws 122A and 122A are connected.
Guides 124A and 124B parallel to 2B provide guided movement of each shuttle. Each shuttle has 12 heads
Supports 6A and 126B. These heads support at least two trays that engage pins 128 fixed in the heads. The shuttle head is movable up and down between two positions. A high position where the shuttle head is spaced from the insertion tray and a low position where the pins engage the socket 130 along the inside surface of the insertion tray. In each shuttle, the space between the tray engagement pins is equal to the spacing between the adjacent pairs of sockets on the tray. The independent movement of the two shuttles provides for quick operation and relatively independent handling of the tray moving toward the test position and the tray being removed from the test head position. First
When the shuttle 120B has moved to the final test position, it can be released from the tray and returns to its home position, a position where the tray can be gripped in the ready position. However, the first shuttle 120B does not
Do not release the tray under test until held by OB. In this manner, multiple trays along the test track will always be controlled by either shuttle. When the last set of electronic devices on a particular tray under test has completed the test, a second
Shuttle moves the tray to the standby removal position. On the other hand, the first shuttle moves the tray on it from the preparation position to the test position. Typically, while one tray is being tested, the other tray can be moved. The direction of this movement is either toward the test position or toward the standby removal position.

14A, 14B, and 14C, different shapes of the device support insertion portion are shown. FIG. 14A shows an insert 132A that supports one large device 134A. FIG.
Insertion section 132B for holding four devices 134B arranged in parallel
Is shown. FIG. 14C shows an insertion section 132C that holds two devices 134C arranged in parallel.

Referring to FIG. 15, the control and continuation system includes a vacuum function for a take-out head, a tray advance function, a tray engagement function, a tray transport function, a tray operation function,
It is shown to have component operating functions for the system.

Continuing the front page (72) Inventor Zwig, Lazy, USA, 92131, California, San Diego, Fairbrook Road 12597 (72) Inventor Krug, Mark W. United States, California, 92131, San Diego Reference: JP-A-63-151038 (JP, A) U.S. Pat. No. 3,97,676 (JP, U) US Pat. No. 4,908,126 (US, A) (58) Fields investigated (Int. . ^7, DB name) G01R 31/26 G01R 31/28 H01L 21/66

Claims (14)

(57) [Claims] An apparatus for providing an electronic device to a tester performing a test, comprising: (a) a plurality of carriers each supporting a set having a plurality of electronic devices; (b) a loading stage; (D) a test stage; (e) a post-test room; (f) an unloading stage; and (g) a set of electronic devices when the carrier is in the loading stage. Means for loading the carrier; (h) means for unloading a set of electronic devices from each carrier when the carrier is at the unloading stage; and (i) supported by the carrier when the carrier is at the test stage. Means for providing electrical contact between the set of electronic devices and the tester, and (j) means for periodically transporting the plurality of carriers in a closed loop, wherein the loop comprises a load. From the stage to the test stage, from the pre-test room to the test stage, from the test stage to the test stage, from the test stage to the unloading stage via the post-test room, from the unloading stage to the loading stage Wherein each device carrier is stopped at the loading stage for a time sufficient to load a set of electronic devices, and each carrier is driven to a set of electronic devices supported by the carrier. Transport means stopped at the test stage for a time sufficient for the testing of the electronic device, each carrier being stopped at the unloading stage for a time sufficient to unload the electronic device. 2. The apparatus of claim 1, wherein the carrier is a first carrier, and the apparatus further comprises a second carrier, each first carrier supporting a set of second carriers, and each second carrier. Supports a set of electronic devices, and the means for loading the set of electronic devices operates to load the set of electronic devices onto the set of second carriers; The apparatus of claim 1, wherein the means for unloading is operable to unload the set of electronic devices from the set of second carriers of a first carrier at the unloading stage. 3. Each of the second carriers is disposed in a sheet defined by the first carrier, held in the sheet by gravity, and includes a set of electronic devices supported by the carrier. The means for providing said target contact with the tester includes a test head having a contactor positioned above the test location and facing downwards, and raising a set of second carriers of the first carrier at the test location. Means for positioning the leads of an electronic device carried by the set of second carriers in electrical contact with the test head contactor. 4. The apparatus according to claim 1, further comprising a through hole defined by the first carrier at each second carrier sheet and at the bottom, wherein the means for raising the set of second carriers at the test position comprises: Means for elevating the second carrier mounted thereon from the sheet to a predetermined position through each through-hole, wherein at the predetermined position,
4. The apparatus of claim 3, wherein the set of electronic device leads supported by the raised second carrier are in electrical contact with the test head contactor. 5. The pre-test chamber defines an inlet and an outlet, the apparatus further comprising an ascending conveyor having a plurality of devices each holding a carrier, and transferring the carrier from the loading stage through the inlet. Means for moving the sheet on the bottom sheet of the ascending conveyor, means for gradually moving the sheet upward toward the outlet, removing the carrier from the sheet on the top of the ascending conveyor, and removing the carrier from the chamber before testing via the outlet. And means for removing
An apparatus according to claim 1. 6. The post-test chamber defines an inlet and an outlet, and the apparatus further comprises: a descending conveyor having a plurality of sheets each holding a carrier; and a carrier descending the carrier through the inlet. Means for inserting on the top sheet, means for progressively moving said sheet downward towards the outlet, removing the carrier from the bottom sheet of the descending conveyor and removing the carrier from the chamber after the test via the outlet. Means for resting on an unloading stage. 7. The means for loading each of a set of electronic devices and a carrier when the carrier is on the loading stage, the loading head transporting the carrier back and forth between the loading stage and the source of the electrical device, and the loading head. Means for picking up one or more individual electronic devices at the electronic device source and releasing the electronic devices on the carrier at the loading stage. 8. The means for unloading a set of electronic devices from each carrier when the carriers are at the unload stage.
An unloading head that moves back and forth between the unloading stage and the transfer platform, and one or more individual electronic devices attached to the unloading head that are removed from the carrier and transferred Means for releasing at the platform. 9. A pre-test stage disposed between the pre-test chamber and the test stage, wherein the pre-test stage can stop carriers present in the pre-test chamber when the test stage was occupied by another carrier; A post-test stage that is arranged between the test stage and the post-test chamber and that can stop the carrier being transported from the test stage to the post-test chamber while waiting for an empty sheet in the post-test chamber; Means for transporting the carrier from the stage before the test to the test stage, and means for transporting the carrier from the test stage to the stage after the test, wherein the two transport means are operable independently of each other, The device according to claim 1. 10. The pre-test chamber defines an inlet and an outlet, and the apparatus further comprises a rising conveyor having a plurality of sheets each holding a single first carrier; Means for moving the carrier from the loading stage through the inlet onto the bottom sheet of the ascending conveyor, means for progressively moving the sheet upwardly toward the outlet, removing the first carrier from the sheet at the top of the ascending conveyor, and ,
Means for removing the first carrier from the pre-test chamber via an outlet. 11. The post-test chamber defines an inlet and an outlet, and the apparatus further comprises: a descending conveyor having a plurality of sheets each holding one first carrier; Means for inserting the carrier through the inlet onto the sheet at the top of the descending conveyor, means for progressively moving the sheet downwardly toward the outlet, removing the first carrier from the bottom sheet of the descending conveyor, and Means for removing the carrier from the chamber after the test via the outlet and placing the carrier on the unloading stage. 12. The means for loading a set of electronic devices onto each first carrier when said first carriers are at a loading stage moves back and forth between the loading stage and an electronic device source. A possible loading head and one or more individual electronic devices attached to the loading head are removed at the electronic device source, and the electronic devices are released at the loading stage and mounted on the first carrier. 3. The apparatus of claim 2, comprising means. 13. The means for unloading a set of electronic devices from each first carrier when the first carrier is at the unloading stage so as to reciprocate between the unloading stage and the transfer platform. A movable unloading head and means attached to the unloading head for removing one or more individual electronic devices from the first carrier and releasing the removed devices at the transfer platform. An apparatus according to claim 2. 14. A pre-test stage disposed between the pre-test chamber and the test stage, wherein the first carrier present in the pre-test chamber can be stopped when the test stage is occupied by another carrier. And a test disposed between the test stage and the post-test chamber, wherein the first carrier being transported from the test stage to the post-test chamber is stopped while waiting for an empty sheet in the post-test chamber. A stage after, a means for transporting the first carrier from the stage before test to the test stage, and a means for transporting the first carrier from the test stage to the stage after test,
The two transporting means are independently operable,
An apparatus according to claim 2.