JPH0639346Y2 - IC test equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION "Industrial application field" The present invention relates to an IC tester, and more particularly to a mechanism for storing tested IC elements in a magazine and storing the magazine in a magazine storage section.

"Prior art" In the IC tester, the tested IC elements are distributed to the stocker rails by the sorter, the magazine is detachably connected to the stocker rails, and the IC elements coming from the stocker rails are stored in the magazine. It In the magazine
When the IC elements became full, the full magazine was stacked directly above the magazine combined with the stocker rail.

If a failure occurs in the unloader section, that is, the section where the magazine connected to the stocker rail is provided, it cannot be repaired without removing all the stacked magazines. The work was difficult, and there was the possibility of mixing classified magazines.

[Means for Solving the Problem] According to the present invention, the classified IC elements are supplied to the stocker rails, and the unloader magazine holds the unloader magazine detachably coupled to each stocker rail. A magazine accommodating portion is provided separately from the unloader portion, and the unloader magazine detached from the unloader portion is accommodated in the magazine accommodating portion. A magazine delivery mechanism is provided between the unloader section and the magazine accommodating section. The magazine delivery mechanism is movable in the magazine arranging direction, has a rotating portion, and can hold and rotate the magazine of the unloader portion and store it in the magazine storing portion.

"Embodiment" FIG. 1 shows an embodiment of an IC test apparatus according to the present invention. The tested IC elements (not shown) are sorted and supplied by the sorter 11 to the plurality of stocker rails 12. In the unloader unit 13, the unloader magazine 14 is detachably coupled to each stocker rail 12. A magazine stocker 15 is arranged on one side of the unloader unit 13, and an empty magazine is stored in the magazine stocker 15. A magazine accommodating portion 16 is provided separately from the unloader portion 13. In this example, a magazine accommodating portion 16 is provided inside the magazine 14 of the unloader portion 13 in front of the traveling direction of the IC element.

A magazine delivery mechanism 17 is provided between the unloader unit 13 and the magazine storage unit 16. The magazine delivery mechanism 17 moves along the rails 18 and is movable along the arrangement direction of the magazines 14. The magazine delivery mechanism 17 has a rotating portion and can rotate 180 degrees around an axis 21 and can rotate 45 degrees around an axis 21 perpendicular to the axis 19. The end of the magazine delivery mechanism 17 is a chuck 22, and the chuck 22 can hold the magazine.

In other words, the magazine delivery mechanism 17 moves to the position of the magazine stocker 15 to grab an empty magazine, bring the empty magazine to the position of the unloader unit 13, rotate it 45 degrees, and combine it with the stocker rail 12 to unload it. Place the magazine in 13. IC elements classified in the magazine 14 are supplied via the stocker rail 12. When the IC elements in the magazine 14 are full, the magazine delivery mechanism 17 is moved to the position of the full magazine, the chuck 22 is tilted 45 degrees, the full magazine is grabbed, and the magazine is erected vertically. After that, the magazine is accommodated in the magazine accommodation unit 16 by rotating 180 degrees. In this case, the classified IC elements are housed in the same housing place.

"Effect of the Invention" As described above, in the IC test apparatus of the present invention, the magazine accommodating section 16 is provided without the unloader section 13, so that even if a failure occurs in the unloader section 13, the failure can be prevented. The repair can be done immediately.

[Brief description of drawings]

 FIG. 1 is a perspective view showing an essential part of an embodiment of the present invention.

Claims (1)

[Scope of utility model registration request] 1. A stocker rail to which classified IC elements are respectively supplied, an unloader section for holding an unloader magazine detachably coupled to each stocker rail, and a unloader section which is detached from the unloader section. A magazine accommodating portion which is provided and accommodates the unloader magazine removed from the unloader portion, is provided between the unloader portion and the magazine accommodating portion, and is movable in the unloader magazine arranging direction,
An IC test apparatus having a rotating unit, and a magazine delivery mechanism for holding and rotating the magazine of the unloader unit and storing the magazine in the magazine storage unit.