JPH0634974B2 - Sorting device using transmitted light - Google Patents
Sorting device using transmitted lightInfo
- Publication number
- JPH0634974B2 JPH0634974B2 JP1258240A JP25824089A JPH0634974B2 JP H0634974 B2 JPH0634974 B2 JP H0634974B2 JP 1258240 A JP1258240 A JP 1258240A JP 25824089 A JP25824089 A JP 25824089A JP H0634974 B2 JPH0634974 B2 JP H0634974B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- sorted
- output
- comparator
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/3416—Sorting according to other particular properties according to radiation transmissivity, e.g. for light, x-rays, particle radiation
Landscapes
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Sorting Of Articles (AREA)
Description
【発明の詳細な説明】 ［産業上の利用分野］ 本発明は透過光によってナッツ等の被選別物の良否を決
定し選別する選別装置に関する。Description: TECHNICAL FIELD The present invention relates to a sorting apparatus for determining the quality of a to-be-sorted object such as nuts by means of transmitted light and sorting.
［従来技術及びその問題点］ ナッツ、コーン等の中にはカビ類によって変質したもの
がある。またカビによっては強力な発ガン性物質である
Aflatoxinを生産するものがあり、そのようなカビによ
って汚染されたナッツは食用には適さず予め選別して取
り除いておかなければならない。[Prior Art and Problems Thereof] Some nuts, corn, and the like have been altered by molds. It is also a powerful carcinogen depending on the mold.
Some produce Aflatoxin, and nuts contaminated by such molds are not edible and must be pre-sorted and removed.
従来ナッツ類の選別方法としては、被選別物（ナッツ）
の表面の変色を検出して選別を行う色彩選別法があっ
た。しかしながらこの色彩選別は、内部の変質によって
表面が変色しているものに対しては有効ではあるが、内
部が変質しても表面が変色しておらず、外観は良品と区
別がつかないものについては有効ではない。またこのよ
うに内部が変質しているにも拘わらず表面が変色してい
ないものについては、人手によっても選別が困難であっ
た。Conventionally, nuts are selected as the method for selecting nuts.
There was a color selection method for detecting the discoloration of the surface of the and selecting. However, this color selection is effective for those whose surface is discolored due to internal deterioration, but for those whose appearance is indistinguishable from that of a good product, even if the inside is deteriorated Is not valid. In addition, it is difficult to manually select those whose surface is not discolored even though the inside is deteriorated.
本発明は上記事情に鑑みてなされたもので、内部が変質
しているが、表面は変色していない不良品をも選別する
ことができる選別装置を提供することを目的とする。The present invention has been made in view of the above circumstances, and it is an object of the present invention to provide a sorting device that can sort defective products whose inside is deteriorated but whose surface is not discolored.
［問題点の解決手段］ 上記目的を達成するために、本発明は、被選別物の良否
を決定し、不良な被選別物を除去する透過光を利用した
選別装置において、 前記被選別物に対して、同被選別物よりも小さい径の光
を照射する光照射装置と、前記被選別物を透過し拡散し
た光を集光する集光装置と、集光された透過光の内、波
長の異なる２種の特定光を夫々検出する２つの光検出手
段と、同光検出手段によって検出された波長の異なる２
種の特定光の強度の比率をとり、その比率が所定値より
上か下かによって前記被選別物の良否を判断する判断手
段とを具備してなることを特徴とする。[Means for Solving Problems] In order to achieve the above object, the present invention provides a sorting apparatus that uses transmitted light for determining the quality of an object to be sorted and removing a defective object to be sorted. On the other hand, a light irradiation device that irradiates light having a diameter smaller than that of the object to be sorted, a light condensing device that condenses the light that has passed through the object to be sorted and diffused, and the wavelength of the transmitted light that has been condensed. Light detecting means for respectively detecting two types of specific light having different wavelengths, and 2 having different wavelengths detected by the light detecting means.
It is characterized by comprising a determination means for determining a ratio of the intensities of the specific light of the seeds and determining whether the selected object is good or bad depending on whether the ratio is above or below a predetermined value.
研究によれば、ナッツは５００ｎｍ〜１４００ｎｍの波
長の光を通過させるということが分かった。即ちこの波
長の光を利用すればナッツの内部の状態を調べることが
できる。Studies have shown that nuts pass light with wavelengths between 500 nm and 1400 nm. That is, the light inside this nut can be used to check the internal condition of the nut.
第１図は良品ナッツ（ａ）と不良品ナッツ（ｂ）に、各
々５００ｎｍ〜１５００ｎｍの光を当てて、光の拡散透
過率を調べたグラフである。この第１図に示すように、
良品と不良品とでは光の拡散透過率が異なる。さらに第
２図は、第１図に示す良品（ａ）と不良品（ｂ）の光の
拡散透過率の差を示すグラフである。この図から見ると
波長１１０ｎｍと波長７５０ｎｍの付近で良品と不良品
の拡散透過率の差が大きくなっている。この二つの波長
に着目して良品及び不良品の拡散透過率の比を第１図か
ら求めると、良品では、 2.1%(1100ｎｍ) / 1.2%(750ｎｍ)＝1.75 一方不良品では 2.8%(1100ｎｍ) / 0.39%(750ｎｍ)＝7.18 となる。FIG. 1 is a graph in which the non-defective nuts (a) and the defective nuts (b) are irradiated with light of 500 nm to 1500 nm, respectively, and the diffusion transmittance of light is examined. As shown in FIG.
The non-defective product and the defective product have different light diffusion transmittances. Further, FIG. 2 is a graph showing the difference in diffused light transmittance between the non-defective product (a) and the defective product (b) shown in FIG. From this figure, the difference in diffuse transmittance between the good product and the defective product is large near the wavelengths of 110 nm and 750 nm. Focusing on these two wavelengths, the ratio of the diffuse transmittance of the good product and the defective product is calculated from Fig. 1. 2.1% (1100nm) / 1.2% (750nm) = 1.75 for the good product, while 2.8% (1100nm) for the defective product. ) / 0.39% (750 nm) = 7.18.
この結果から波長１１００ｎｍと波長７５０ｎｍの光に
着目して透過率の比を調べればナッツが内部で変質して
いるか否かが分かる。From this result, if the transmittance ratio is examined by focusing on the light having a wavelength of 1100 nm and the light having a wavelength of 750 nm, it can be known whether the nut is denatured inside or not.
［実施例］ 以下図面を参照して本発明の実施例について説明する。Embodiments Embodiments of the present invention will be described below with reference to the drawings.
第３図は本発明にかかる選別装置を示すブロック図であ
る。この図において、１は光照射装置であり、電球２、
及び同電球２から遠ざかる方向に向かって配置された第
１レンズ３、第２レンズ４、スリット５及び第３レンズ
６から構成されている。電球２から照射された光は第１
レンズ３、第２レンズ４によって集光された、スリット
５によって絞られ、更に第３レンズ６によって平行な光
にされる。この結果被選別物（ナッツ）Ａよりも径が小
さいビーム光が光照射装置１から照射される。FIG. 3 is a block diagram showing a sorting device according to the present invention. In this figure, 1 is a light irradiation device, and a light bulb 2,
And a first lens 3, a second lens 4, a slit 5 and a third lens 6 which are arranged in a direction away from the light bulb 2. The light emitted from the light bulb 2 is the first
The light is condensed by the lens 3 and the second lens 4, narrowed down by the slit 5, and further collimated by the third lens 6. As a result, a light beam having a diameter smaller than that of the object (nut) A to be sorted is irradiated from the light irradiation device 1.
一方７は観察点Ｓを挟んで、前記光照射装置１と対向し
て設けられた積分球であり、この積分球７は窓８から侵
入する光を効率良く集光する。On the other hand, an integrating sphere 7 is provided so as to face the light irradiation device 1 with the observation point S interposed therebetween, and the integrating sphere 7 efficiently collects the light entering through the window 8.
まら積分球７にはフィルタ及びフォトダイオードからな
る一対の光電変換器９及び１０が設けられており、これ
ら光電変換器９、１０は各々７５０ｎｍの波長（λ1）
の光及び１１００ｎｍの波長（λ2）の光を検出して電
気信号に変換し、対応して設けられた増幅器１１及び１
２を介して平面分割回路１３及び判定点検出回路１４に
供給する。ここで増幅器１１、１２の出力レベルは被選
別物Ａが観察点Ｓを通過するとき都度その透過度に応じ
て低下する信号となる。A pair of photoelectric converters 9 and 10 including a filter and a photodiode are provided on the integrating sphere 7, and these photoelectric converters 9 and 10 each have a wavelength (λ 1 ) of 750 nm.
Light and a light having a wavelength (λ 2 ) of 1100 nm are detected and converted into electric signals, and amplifiers 11 and 1 provided correspondingly
It is supplied to the plane division circuit 13 and the judgment point detection circuit 14 via 2. Here, the output level of the amplifiers 11 and 12 becomes a signal which is lowered according to the transmittance of the object A to be selected each time it passes the observation point S.
平面分割回路１３において、増幅器１１から供給された
電気信号（Ｅ（λ1））は可変利得増幅器１５に供給さ
れる。増幅器１５は増幅器１１から供給された電気信号
を、所定の利得ｋ増幅して（ｋ・Ｅ（λ1））加算器１
６へ供給する。In the plane division circuit 13, the electric signal (E (λ 1 )) supplied from the amplifier 11 is supplied to the variable gain amplifier 15. The amplifier 15 amplifies the electric signal supplied from the amplifier 11 by a predetermined gain k (k · E (λ 1 )) and adds the adder 1.
Supply to 6.
また増幅器１１の出力は比較器１７の反転端子に供給さ
れる。一方同比較器１７の非反転端子には所定の正の基
準電位が加えられており、従って反転端子に供給される
信号の電圧が同基準電位よりも低いときに比較器１７は
論理“１”の信号をオアゲート１８に出力する。なお、
この基準電位は第４図のフロチャートの最上に示すよう
に極めて低く設定されており、ナッツ以外の、例えば石
等のように全く光を透過しないものが通過したときに増
幅器１１の出力（Ｅ（λ1））と交差するように設定さ
れている。The output of the amplifier 11 is supplied to the inverting terminal of the comparator 17. On the other hand, a predetermined positive reference potential is applied to the non-inverting terminal of the comparator 17, and therefore, when the voltage of the signal supplied to the inverting terminal is lower than the reference potential, the comparator 17 has a logic "1". Is output to the OR gate 18. In addition,
This reference potential is set extremely low as shown at the top of the flow chart in FIG. 4, and the output (E) of the amplifier 11 is passed when something other than nuts, such as stone, that does not transmit light at all passes. (Λ 1 )) is set to intersect.
また平面分割回路１３において、増幅器１２から供給さ
れた電気信号（Ｅ（λ2））は加算器１６に供給され、
ここで増幅器１５の出力から減算され（ｋＥ（λ1）−
Ｅ（λ2））、この減算結果が比較器１９の非反転端に
供給される。In the plane division circuit 13, the electric signal (E (λ 2 )) supplied from the amplifier 12 is supplied to the adder 16,
Here, it is subtracted from the output of the amplifier 15 (kE (λ 1 ) −
E (λ 2 )), the subtraction result is supplied to the non-inverting end of the comparator 19.
比較器１９の反転端は接地されており、従って加算器１
６の出力がプラスの時に論理“１”の信号をオアゲート
１８に供給する。ここで不良品における透過率の比（Ｅ
（λ2）／Ｅ（λ1））と良品における透過率の比（Ｅ
（λ2）／Ｅ（λ1））では不良品の比が良品の比よりも
大きいことは既に述べた。従って利得ｋの値をそれらの
比の中間値に設定しておくことにより、良品が観察点Ｓ
通過したときには加算器１６の出力がマイナスになり、
不良品が観察点Ｓを通過したときには同出力がプラスに
なる。The inverting end of the comparator 19 is grounded and therefore the adder 1
When the output of 6 is positive, a signal of logic "1" is supplied to the OR gate 18. Here, the transmittance ratio (E
(Λ 2 ) / E (λ 1 )) and the transmittance ratio (E)
It has already been mentioned that in (λ 2 ) / E (λ 1 )), the ratio of defective products is larger than that of good products. Therefore, if the value of the gain k is set to the intermediate value of those ratios, the good product becomes the observation point S.
When it passes, the output of the adder 16 becomes negative,
When the defective product passes the observation point S, the output becomes positive.
更に平面分割回路１３において、増幅器１２の出力は比
較器２０に供給される。この比較器２０の機能は前述し
た比較器１７の機能と同一であり、説明を省略する。Further, in the plane division circuit 13, the output of the amplifier 12 is supplied to the comparator 20. The function of the comparator 20 is the same as the function of the comparator 17 described above, and a description thereof will be omitted.
以上説明した平面分割回路１３の機能をまとめると、第
５図に示すようになる。第５図は縦軸にＥ（λ2）をと
り、横軸にＥ（λ1）をとった座標である。まず増幅器
１１から出力される信号Ｅ（λ1）については、この信
号が基準値よりも低いときに比較器１７の出力が“１”
となる。また増幅器１２から出力される信号Ｅ（λ2）
については、この信号が基準値よりも低いときに比較器
２０の出力が“１”となる。また増幅器１１、１２の出
力についてＥ（λ1）、Ｅ（λ2）がｋＥ（λ1）−Ｅ
（λ2）＞０のときに比較器１９の出力が“１”とな
る。即ち第５図において、増幅器１１、１２の出力Ｅ
（λ1）、Ｅ（λ2）が、直線ａ，ｂ及びｃによって画成
される斜線が施された領域内に位置するときにオアゲー
ト１８の出力が“１”となり、この時被選別物が排除さ
れる。The functions of the plane division circuit 13 described above can be summarized as shown in FIG. In FIG. 5, the vertical axis represents E (λ 2 ) and the horizontal axis represents E (λ 1 ). First, regarding the signal E (λ 1 ) output from the amplifier 11, the output of the comparator 17 is “1” when this signal is lower than the reference value.
Becomes Further, the signal E (λ 2 ) output from the amplifier 12
For, the output of the comparator 20 becomes "1" when this signal is lower than the reference value. Regarding the outputs of the amplifiers 11 and 12, E (λ 1 ) and E (λ 2 ) are kE (λ 1 ) −E.
When (λ 2 )> 0, the output of the comparator 19 becomes “1”. That is, in FIG. 5, the output E of the amplifiers 11 and 12 is
When (λ 1 ) and E (λ 2 ) are located in the shaded area defined by the straight lines a, b and c, the output of the OR gate 18 becomes "1", and at this time the object to be sorted is selected. Are eliminated.
このオアゲート１８の出力はアンドゲート１９に供給さ
れる。The output of the OR gate 18 is supplied to the AND gate 19.
一方、判定点検出回路１４において、増幅器１１、１２
の出力は加算器２１に供給される。加算器２１は増幅器
１１、１２の出力を加算して微分回路２２に供給する。On the other hand, in the decision point detection circuit 14, the amplifiers 11 and 12
Is output to the adder 21. The adder 21 adds the outputs of the amplifiers 11 and 12 and supplies it to the differentiating circuit 22.
微分回路２２は加算器２１の出力を微分してその結果を
各々比較器２３の非反転端及び比較器２４の反転端に供
給する。The differentiating circuit 22 differentiates the output of the adder 21 and supplies the result to the non-inverting end of the comparator 23 and the inverting end of the comparator 24, respectively.
比較器２３の反転端及び比較器２４の反転端には基準電
圧が供給されており、比較器２３は加算器２１の信号が
立ち下がるとき、即ち微分回路２２の出力がマイナスの
ときに論理“１”の信号を出力し、比較器２４は加算器
２１の信号が立ち上がるとき、即ち微分回路２２の信号
がプラスのときに論理“１”の信号を出力する。The reference voltage is supplied to the inverting end of the comparator 23 and the inverting end of the comparator 24, and the comparator 23 outputs a logic "when the signal of the adder 21 falls, that is, when the output of the differentiating circuit 22 is negative. The comparator 24 outputs the signal of 1 ", and the comparator 24 outputs the signal of logic" 1 "when the signal of the adder 21 rises, that is, when the signal of the differentiating circuit 22 is positive.
比較器２３及び２４の出力は各々フリップフロップ（Ｆ
Ｆ）２５のセット端及びリセット端に供給され、ＦＦ２
５をセットしリセットする。即ちＦＦ２５は、被選別物
が観察点Ｓに入り、光照射装置１からの光を遮り、増幅
器１１、１２の出力が低下し始めると、比較器２３の出
力が“１”となってセットされ、被選別物が観察点Ｓを
通過することにより、増幅器１１、１２の出力が上昇を
始めると比較器２４の出力が“１”となってリセットさ
れる。The outputs of the comparators 23 and 24 are flip-flops (F
F) 25 is supplied to the set end and the reset end of FF2
Set 5 and reset. That is, the FF 25 sets the output of the comparator 23 to "1" when the object to be sorted enters the observation point S and blocks the light from the light irradiation device 1 and the outputs of the amplifiers 11 and 12 start to decrease. When the objects to be sorted pass the observation point S and the outputs of the amplifiers 11 and 12 start to rise, the output of the comparator 24 is reset to "1".
このＦＦ２５からの信号はアンドゲート１９に供給さ
れ、オアゲート１８から供給される良否判断信号に対し
て被選別物の通過時期を画定する役割を果たす。即ち、
アンドゲート１９からは不良品が観察位置Ｓを通過した
ときに論理“１”の信号が出力され、これが遅延回路２
６によって所定の時間遅らされてドライバ２７に供給さ
れる。The signal from the FF 25 is supplied to the AND gate 19 and plays a role of defining the passage time of the objects to be selected with respect to the pass / fail judgment signal supplied from the OR gate 18. That is,
A signal of logic "1" is output from the AND gate 19 when the defective product passes the observation position S, and this is the delay circuit 2
It is delayed by a predetermined time by 6 and supplied to the driver 27.
ドライバ２７は遅延回路２６から不良信号を受けるとイ
ジェクタ２８を駆動して通過する被選別物を排除する。When the driver 27 receives the defective signal from the delay circuit 26, the driver 27 drives the ejector 28 to eliminate the objects to be passed therethrough.
以上の構成を有する選別装置の構成について説明する。
第４図のα，β，γ，δは各々、観察部Ｓに被選別物を
存在しないとき、観察点Ｓに良品が存在するとき、観察
部Ｓに不良品が存在するとき、観察点Ｓに異種の選別
物、例えば石等が存在するときを示しており、第５図に
はα，β，γのＥ（λ1）−Ｅ（λ2）座標上での位置が
示されている。The configuration of the sorting device having the above configuration will be described.
In FIG. 4, α, β, γ, and δ are the observation points S when there is no object to be sorted, when there is a good product at the observation point S, when there is a defective product at the observation portion S, Fig. 5 shows the case where different kinds of sorted materials such as stones exist, and Fig. 5 shows the positions of α, β, γ on the E (λ 1 ) -E (λ 2 ) coordinates. .
まずナッツＡが観察位置Ｓにないとき、光照射装置１か
らの光は積分球７によって直接集光され、その内の２種
類の異なる特定波長（λ1、λ2）の光が光電変換器９、
１０によって検出され、各々増幅器１１、１２によって
増幅される。これら増幅信号は変化のない平旦な信号で
あり（第４図Ｉ、IIのα部分参照）、従って微分回路２
２の出力はゼロに維持され、比較器２３、２４の出力は
共に“０”となり、ＦＦ２５は作動しない。この結果ア
ンドゲート１９の出力は“０”となり、イジェクタ２８
は作動しない。First, when the nut A is not at the observation position S, the light from the light irradiation device 1 is directly condensed by the integrating sphere 7, and two kinds of light having different specific wavelengths (λ 1 , λ 2 ) are photoelectric converters. 9,
Detected by 10 and amplified by amplifiers 11 and 12, respectively. These amplified signals are flat signals that do not change (refer to the α portion of I and II in FIG. 4). Therefore, the differentiating circuit 2
The output of 2 is maintained at zero, the outputs of the comparators 23 and 24 are both "0", and the FF 25 does not operate. As a result, the output of the AND gate 19 becomes "0", and the ejector 28
Does not work.
次に良品が観察位置Ｓを通過したときについて説明す
る。光照射装置１から照射される光の径はナッツＡより
も小さいので、ナッツが観察位置Ｓに位置するときに
は、ナッツは照射される光の全てを遮り、これによって
光照射装置１から積分球７に直接光が達することはな
い。Next, the case where the non-defective product passes the observation position S will be described. Since the diameter of the light emitted from the light irradiation device 1 is smaller than that of the nut A, when the nut is located at the observation position S, the nut blocks all of the light emitted, thereby causing the light irradiation device 1 to move to the integrating sphere 7. No direct light reaches.
ナッツＡに照射された光はナッツの内部を拡散しながら
透過して積分球７に達する。この透過光の内上述の特定
光が光電変換器９、１０によって検出され、増幅器１
１、１２によって増幅される。この信号（Ｅ（λ1）、
Ｅ（λ2））は加算器２１に供給され、加算されて（第
４図VI参照）微分回路２２に供給される。微分回路２２
で加算器２１の出力が微分され（第４図VII参照）、比
較器２３、２４に供給される。この結果微分回路２２の
出力が立ち下がったときに比較器２３によってＦＦ２５
がセットされ、次いで微分回路２２の出力が立ち上がっ
たときに比較器２４によってＦＦ２５がリセットさ（第
４図VIII、IX、Ｘ参照）。これによってＦＦ２５からア
ンドゲート１９に被選別物が観察部Ｓを通過したことを
知らせる信号が供給される。The light applied to the nut A is diffused and transmitted through the inside of the nut and reaches the integrating sphere 7. Of the transmitted light, the above-mentioned specific light is detected by the photoelectric converters 9 and 10, and the amplifier 1
Amplified by 1 and 12. This signal (E (λ 1 ),
E (λ 2 )) is supplied to the adder 21, added (see FIG. 4 VI), and supplied to the differentiating circuit 22. Differentiator circuit 22
The output of the adder 21 is differentiated (see VII in FIG. 4) and supplied to the comparators 23 and 24. As a result, when the output of the differentiating circuit 22 falls, the comparator 23 causes the FF 25
Is set and then the comparator 24 resets the FF 25 when the output of the differentiating circuit 22 rises (see VIII, IX and X in FIG. 4). As a result, the FF 25 supplies the AND gate 19 with a signal notifying that the object to be sorted has passed the observation section S.
一方増幅器１１、１２からの信号（Ｅ（λ1）、Ｅ
（λ2））のレベルは、観察位置Ｓにナッツがないとき
に比べて低くなる（第４図のＩ、IIのβ参照）。この場
合、積分球７に達する僅かな透過光によって信号の底レ
ベルは比較器１７、２０の基準電圧よりも高く、比較器
１７、２０の出力は“０”となる。また通過するナッツ
Ａは良品なのでｋＥ（λ1）−Ｅ（λ2）＜０となり、比
較器１９の出力も“０”となり（第４図のIV参照）、従
ってオアゲート１８及びアンドゲート１９からは“０”
の論理信号が出力される。この結果良品が観察位置Ｓを
通過するときはイジェクタ２８は作動せず、通過するナ
ッツＡを排除しない。On the other hand, signals from the amplifiers 11 and 12 (E (λ 1 ), E
The level of (λ 2 )) is lower than that when there is no nut at the observation position S (see β in I and II in FIG. 4). In this case, the bottom level of the signal is higher than the reference voltage of the comparators 17 and 20 due to the slight transmitted light reaching the integrating sphere 7, and the outputs of the comparators 17 and 20 are "0". Further, since the nut A passing through is a good product, kE (λ 1 ) −E (λ 2 ) <0, and the output of the comparator 19 also becomes “0” (see IV in FIG. 4). Therefore, from the OR gate 18 and the AND gate 19. Is "0"
Is output. As a result, when the non-defective product passes the observation position S, the ejector 28 does not operate and the passing nut A is not removed.
次に不良品が観察位置Ｓを通過したときについて説明す
る（第４図γ）。不良品が観察位置Ｓを通過したとき、
比較器１７、２０の出力は“０“であるが、 ｋＥ（λ1）−Ｅ（λ2）＞０となり、比較器１９の出力
が“１”となる（第４図IV参照）。この信号がアンドゲ
ート１９に供給される。Next, a case where the defective product has passed the observation position S will be described (γ in FIG. 4). When a defective product passes the observation position S,
The outputs of the comparators 17 and 20 are “0”, but kE (λ 1 ) −E (λ 2 )> 0, and the output of the comparator 19 is “1” (see IV in FIG. 4). This signal is supplied to the AND gate 19.
一方上述したようにＦＦ２５からは被選別物の通過信号
がアンドゲート１９に供給され、この結果アンドゲート
１９から排除信号が遅延回路２６に出力され（第４図XI
参照）、所定の時間遅れてドライバ２７が起動されてイ
ジェクタ２８が駆動される。この結果不良なナッツが排
除される。On the other hand, as described above, the passing signal of the object to be sorted is supplied from the FF 25 to the AND gate 19, and as a result, the exclusion signal is output from the AND gate 19 to the delay circuit 26 (see FIG. 4 XI).
The driver 27 is activated and the ejector 28 is driven after a predetermined time delay. This results in the elimination of bad nuts.
また石等の異物が観察物Ｓを通過した場合には（第４図
δ）、光が全く透過しないため、増幅器１１、１２のレ
ベルが比較器１７、２０の基準電圧以下になる（第４図
II参照）。この結果比較器１７、２０から論理“１”の
信号が出力され（第４図Ｖ参照）、オアゲート１８を介
してアンドゲート１９に供給される。こうしてＦＦ２５
からは被選別物の通過信号がアンドゲート１９に供給さ
れることにより、アンドゲート１９から論理“１”の信
号が出力され（第４図XI参照）、この結果イジェクタ２
８によって異物が排除される。Further, when a foreign substance such as a stone passes through the observation object S (δ in FIG. 4), the level of the amplifiers 11 and 12 becomes equal to or lower than the reference voltage of the comparators 17 and 20 because the light is not transmitted at all (fourth time). Figure
II). As a result, a signal of logic "1" is output from the comparators 17 and 20 (see FIG. 4V) and supplied to the AND gate 19 via the OR gate 18. Thus FF25
Is supplied with the passing signal of the object to be sorted from the AND gate 19, and the AND gate 19 outputs a signal of logic "1" (see FIG. 4 XI). As a result, the ejector 2
Foreign matter is eliminated by 8.
次に第６図（ａ）及び（ｂ）は光照射装置の他の実施例
を示すブロック図である。第６（ａ）図では、それぞれ
上述した特定波長（λ1、λ2）の光を発生するレーザ発
生装置３０、３１からの光がレンズ３２、３３を介して
絞られて光ビームとなり、ダイクロイイックミラー３４
に供給されて合成され、被選別物Ａに照射される。Next, FIGS. 6A and 6B are block diagrams showing another embodiment of the light irradiation device. In FIG. 6 (a), the lights from the laser generators 30 and 31 for generating the lights of the above-described specific wavelengths (λ 1 and λ 2 ) are focused through the lenses 32 and 33 to become a light beam, and the dichroic light is emitted. Ic mirror 34
And is synthesized and irradiated on the object A to be sorted.
第６（ｂ）図では、第３図に示す光照射装置に更にレン
ズ４０が設けられ、照射される光を更に絞って被選別物
に照射する。In FIG. 6 (b), the light irradiation device shown in FIG. 3 is further provided with a lens 40 to further squeeze the irradiation light and irradiate the object to be selected.
第７は被選別物を透過した光の収集装置の他の実施例を
示している。被選別物Ａを透過した光はレンズ５０、５
１、５２によって集光されてダイクロイックミラー５３
に供給され、２条に分離されて光電変換器９、１０に供
給される。The seventh embodiment shows another embodiment of the collecting apparatus for collecting the light transmitted through the object to be sorted. The light transmitted through the object A to be sorted is the lenses 50, 5
Dichroic mirror 53 is focused by 1, 52
Is supplied to the photoelectric converters 9 and 10.
［発明の効果］ 以上説明したように本発明によれば、被選別物の良否を
決定し、不良な被選別物を除去する透過光を利用した選
別装置において、 前記被選別物に対して、同被選別物よりも小さい径の光
ビームを照射する光照射装置と、前記被選別物を透過し
拡散した光を集光する集光装置と、集光された透過光の
内、波長の異なる２種の特定光を夫々検出する２つの光
検出手段と、同光検出手段によって検出された波長の異
なる２種の特定光の強度の比率をとり、その比率が所定
値より上か下かによって前記被選別物の良否を判断する
判断手段とを具備したので、内部が変質しているにもか
かわらず表面が変色していない被選別物をも選別するこ
とができる。[Effects of the Invention] As described above, according to the present invention, in a sorting apparatus that uses transmitted light to determine the quality of an object to be sorted and remove a defective object to be sorted, A light irradiation device that irradiates a light beam having a diameter smaller than that of the object to be sorted, a condensing device that condenses the light that has passed through the object to be sorted and diffused, and a different wavelength of the collected transmitted light. The ratio of the intensities of two types of specific light having different wavelengths detected by the two types of specific light that detect the two types of specific light respectively, and the ratio is determined to be above or below a predetermined value. Since the determination means for determining the quality of the article to be sorted is provided, it is possible to sort the article to be sorted whose surface is not discolored even though the inside is deteriorated.
また本発明では、前記光検出手段によって検出された前
記特定光の強度が所定値以下に低下したことを検出して
異種の被選別物を判別をする判別手段を設けたので、石
等の光を全く透過しない異物が混在しているときでもそ
れを排除することをできる。Further, in the present invention, since the discriminating means for discriminating different kinds of objects to be detected by detecting that the intensity of the specific light detected by the light detecting means is reduced to a predetermined value or less, light such as stones is provided. Even when there is a mixture of foreign matter that does not penetrate through, it can be eliminated.
第１図及び第２図は各々良品と不良品の光の透過率、及
びその差を示したグラフ、第３図は本発明にかかる選別
装置の構成を示すブロック図、第４図は同選別装置の動
作を説明するためのタイミングチャート、第５図は特定
波長の光の強度を関数として選別区分を示したグラフ、
第６図（ａ）、（ｂ）は各々本発明にかかる光照射装置
の他の実施例を示すブロック図、第７図は本発明に係る
集光装置の他の実施例を示すブロック図である。 １：光照射装置、７：積分球（集光装置）、９、１０：
光電変換器（光検出器）、１５：可変利得増幅器、１
６：加算器、１９：比較器（以上１５、１６、１９が判
断手段）。FIG. 1 and FIG. 2 are graphs showing the light transmittances of non-defective products and defective products, respectively, and the difference between them, FIG. 3 is a block diagram showing the configuration of the sorting apparatus according to the present invention, and FIG. FIG. 5 is a timing chart for explaining the operation of the device, FIG. 5 is a graph showing selection classification as a function of the intensity of light of a specific wavelength,
6 (a) and 6 (b) are block diagrams showing another embodiment of the light irradiation device according to the present invention, and FIG. 7 is a block diagram showing another embodiment of the light concentrating device according to the present invention. is there. 1: light irradiation device, 7: integrating sphere (light collecting device), 9, 10:
Photoelectric converter (photodetector), 15: variable gain amplifier, 1
6: Adder, 19: Comparator (the above 15, 16, and 19 are determination means).
───────────────────────────────────────────────────── フロントページの続き (72)発明者 平野 進 神奈川県横浜市鶴見区下末吉２―１―１ 森永製菓株式会社品質検査部内 (72)発明者 佐々木 元 神奈川県横浜市鶴見区下末吉２―１―１ 森永製菓株式会社プロセス研究室内 (56)参考文献 特開 昭58−8577（ＪＰ，Ａ) 特公 昭59−2546（ＪＰ，Ｂ２) ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Susumu Hirano 2-1-1 Shimosueyoshi, Tsurumi-ku, Yokohama-shi, Kanagawa Morinaga & Co., Ltd. Quality Inspection Department (72) Inventor Hajime Sasaki, Tetsumi-ku, Yokohama-shi, Kanagawa ―1-1 Process Research Laboratory, Morinaga & Co., Ltd. (56) Reference JP-A-58-8577 (JP, A) JP-B-59-2546 (JP, B2)
Claims (2)
を除去する透過光を利用した選別装置において、 前記被選別物に対して、同被選別物よりも小さい径の光
ビームを照射する光照射装置と、 前記被選別物を挟んで前記光照射装置と反対側に設けら
れ、被選別物を透過し拡散した光を集光する積分球と、 前記積分球によって集光された透過光のうち、波長の異
なる２種の特定光をそれぞれ検出する２つの光検出手段
と、 同光検出手段によって検出された波長の異なる２種の特
定光の強度の比率をとり、その比率が所定値より上か下
かによって前記被選別物の良否を判断する判断手段と、 を具備してなることを特徴とする透過光を利用した選別
装置。1. A sorting apparatus using transmitted light for determining the quality of an article to be sorted and removing a defective article to be sorted, wherein a light beam having a diameter smaller than that of the article to be sorted is provided. A light irradiating device for irradiating the object to be sorted, an integrating sphere provided on the opposite side of the light irradiating device with the object to be sorted interposed therebetween, and collecting light that has passed through the object to be sorted and diffused; The ratio of the intensities of the two types of specific light having different wavelengths and the two types of specific light having different wavelengths, respectively, of the transmitted light, and the ratio thereof are calculated. A sorting device using transmitted light, comprising: a determining unit that determines whether the object to be sorted is good or bad depending on whether is above or below a predetermined value.
定光の強度が所定値以下に低下したことを検出して異種
の被選別物を判別する判別手段を有することを特徴とす
る、請求項第１項記載の選別装置。2. A discriminating unit for discriminating different kinds of objects to be sorted by detecting that the intensity of the specific light detected by the light detecting unit has dropped below a predetermined value. The sorting apparatus according to item 1.
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1258240A JPH0634974B2 (en) | 1989-10-03 | 1989-10-03 | Sorting device using transmitted light |
| GB9014816A GB2236848B (en) | 1989-10-03 | 1990-07-04 | Sorting apparatus utilizing transmitted light |
| DE19904023979 DE4023979A1 (en) | 1989-10-03 | 1990-07-25 | SORTING DEVICE USING TRANSMITTED RADIATION |
| US07/873,875 US5190163A (en) | 1989-10-03 | 1992-04-22 | Sorting apparatus utilizing transmitted light |
| SG146194A SG146194G (en) | 1989-10-03 | 1994-10-10 | Sorting apparatus utilizing transmitted light |
| HK127194A HK127194A (en) | 1989-10-03 | 1994-11-17 | Sorting apparatus utilizing transmitted light |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1258240A JPH0634974B2 (en) | 1989-10-03 | 1989-10-03 | Sorting device using transmitted light |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03118886A JPH03118886A (en) | 1991-05-21 |
| JPH0634974B2 true JPH0634974B2 (en) | 1994-05-11 |
Family
ID=17317476
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1258240A Expired - Lifetime JPH0634974B2 (en) | 1989-10-03 | 1989-10-03 | Sorting device using transmitted light |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JPH0634974B2 (en) |
| DE (1) | DE4023979A1 (en) |
| GB (1) | GB2236848B (en) |
| HK (1) | HK127194A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0694342A2 (en) | 1994-07-27 | 1996-01-31 | Satake Corporation | Colour sorting apparatus for beans |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2274165B (en) * | 1990-04-24 | 1994-10-26 | Gersan Ets | Method and apparatus for examining a diamond |
| GB9009132D0 (en) * | 1990-04-24 | 1990-06-20 | Gersan Ets | Method and apparatus for examining an object |
| US5835200A (en) * | 1990-04-24 | 1998-11-10 | Gersan Establishment | Method and apparatus for examining an object |
| JPH0796253A (en) * | 1993-06-30 | 1995-04-11 | Satake Eng Co Ltd | Bean color classifier |
| DE29511344U1 (en) * | 1995-07-13 | 1996-11-14 | Byk-Gardner GmbH, 82538 Geretsried | Device for measuring optical parameters of transparent materials |
| JP4839441B2 (en) * | 2006-09-08 | 2011-12-21 | 国立大学法人岩手大学 | Method and apparatus for detecting pollen soot |
| GB2466621A (en) * | 2008-12-23 | 2010-06-30 | Buhler Sortex Ltd | Sorting matter in a flow by comparing reflectance intensities at different wavelengths |
| BE1018793A3 (en) * | 2009-06-17 | 2011-09-06 | Best 2 N V | METHOD FOR DISTINCTING AND SORTING PRODUCTS DETERMINING THE CONCENTRATION OF A COMPONENT OF THESE PRODUCTS |
| CN111229649B (en) * | 2020-01-20 | 2023-09-01 | 湖北民族大学 | Article grading method and automatic grading system |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2147611A1 (en) * | 1970-09-26 | 1972-05-25 | Nii Konservna Promischlenost | Method and device for sorting tomatoes by color |
| DE2533873C3 (en) * | 1975-07-29 | 1979-01-25 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Device for recognizing bottle colors |
| DE2538884A1 (en) * | 1975-09-02 | 1977-03-03 | Sunkist Growers Inc | Automatic sorting of citrus fruits from internal characteristics - uses light beam scanning and measuring transparency of fruit flesh for sorting control |
| JPS5283274A (en) * | 1975-12-30 | 1977-07-12 | Yamamura Glass Co Ltd | Inner quality analyzer |
| DE2722294A1 (en) * | 1976-05-19 | 1977-12-01 | Ultra Sort Corp | DEVICE FOR SORTING ITEMS |
| ZA765149B (en) * | 1976-08-27 | 1978-04-26 | De Beers Ind Diamond | Measurement of optical properties |
| JPS588577A (en) * | 1981-07-08 | 1983-01-18 | 株式会社 サタケ | Chute device for body crack detector of cereal grain |
| JPH0239175B2 (en) * | 1982-06-25 | 1990-09-04 | Matsushita Electric Works Ltd | KOIRUNOSEIZOHOHO |
| GB2151018B (en) * | 1983-12-06 | 1987-07-22 | Gunsons Sortex Ltd | Sorting machine and method |
| US4919534A (en) * | 1988-09-30 | 1990-04-24 | Environmental Products Corp. | Sensing of material of construction and color of containers |
-
1989
- 1989-10-03 JP JP1258240A patent/JPH0634974B2/en not_active Expired - Lifetime
-
1990
- 1990-07-04 GB GB9014816A patent/GB2236848B/en not_active Expired - Lifetime
- 1990-07-25 DE DE19904023979 patent/DE4023979A1/en not_active Ceased
-
1994
- 1994-11-17 HK HK127194A patent/HK127194A/en not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0694342A2 (en) | 1994-07-27 | 1996-01-31 | Satake Corporation | Colour sorting apparatus for beans |
Also Published As
| Publication number | Publication date |
|---|---|
| DE4023979A1 (en) | 1991-04-18 |
| GB2236848A (en) | 1991-04-17 |
| JPH03118886A (en) | 1991-05-21 |
| GB9014816D0 (en) | 1990-08-22 |
| GB2236848B (en) | 1994-05-11 |
| HK127194A (en) | 1994-11-25 |
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