JPH0631430Y2 - DC test equipment - Google Patents
DC test equipmentInfo
- Publication number
- JPH0631430Y2 JPH0631430Y2 JP6043388U JP6043388U JPH0631430Y2 JP H0631430 Y2 JPH0631430 Y2 JP H0631430Y2 JP 6043388 U JP6043388 U JP 6043388U JP 6043388 U JP6043388 U JP 6043388U JP H0631430 Y2 JPH0631430 Y2 JP H0631430Y2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- load
- main amplifier
- circuit
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measurement Of Current Or Voltage (AREA)
- Control Of Voltage And Current In General (AREA)
Description
【考案の詳細な説明】 「産業上の利用分野」 この考案は電圧印加電流測定又は電流印加電圧測定を行
う直流試験装置に関し、特に負荷の損傷を防止するため
に過大負荷又は過小負荷時に過電流又は過電圧を制限す
る負荷保護用クランプ回路を備えた直流試験装置に係わ
る。[Detailed Description of the Invention] "Industrial application field" The present invention relates to a DC test device for measuring a voltage applied current or a current applied voltage, and in particular, to prevent damage to the load, an overcurrent may occur during overload or underload. Alternatively, the present invention relates to a DC test device equipped with a load protection clamp circuit that limits overvoltage.
「従来の技術」 第４図に従来の直流試験装置を示す。電圧設定用ＤＡ変
換器１１よりの電圧Viは抵抗素子１２を通じて主増幅器
１３へ供給され、主増幅器１３の出力は電流検出用抵抗
素子１４を通じて負荷１５へ供給される。その負荷１５
の電圧Voはバッファ回路１６を通じ、更に抵抗素子１７
を通じて主増幅器１３の入力側に帰還されている。"Prior Art" Fig. 4 shows a conventional DC test apparatus. The voltage V i from the voltage setting DA converter 11 is supplied to the main amplifier 13 through the resistance element 12, and the output of the main amplifier 13 is supplied to the load 15 through the current detection resistance element 14. Its load 15
The voltage V o of the
Is fed back to the input side of the main amplifier 13 through.
過大負荷、つまり過電流を検出してこれを制限するた
め、電流検出用抵抗素子１４の両端電圧が負荷保護用ク
ランプ回路１８へ供給される。つまり電流検出用抵抗素
子１４の両端電圧は増幅器１９へ供給され、増幅器１９
の出力は比較回路２１へ供給されてクランプ用ＤＡ変換
器２２の出力と比較され、その比較回路２１の出力側は
クランプ用ダイオード２３を通じて主増幅器１３の入力
側に接続される。また増幅器１９の出力は反転増幅器２
４を通じて比較回路２５へ供給されてクランプ用ＤＡ変
換器２６の出力と比較され、その比較回路２５の出力側
はクランプ用ダイオード２７を通じて主増幅器１３の入
力側に接続される。In order to detect and limit an excessive load, that is, an overcurrent, the voltage across the current detection resistor element 14 is supplied to the load protection clamp circuit 18. That is, the voltage across the current detecting resistor element 14 is supplied to the amplifier 19, and the amplifier 19
Is supplied to the comparison circuit 21 and compared with the output of the clamping DA converter 22, and the output side of the comparison circuit 21 is connected to the input side of the main amplifier 13 through the clamping diode 23. The output of the amplifier 19 is the inverting amplifier 2
4 is supplied to the comparison circuit 25 through 4 to be compared with the output of the clamp DA converter 26, and the output side of the comparison circuit 25 is connected to the input side of the main amplifier 13 through the clamp diode 27.
この直流試験装置は抵抗素子１２，１７の抵抗値をR1,R
2とすると出力電圧Voは となり、電圧設定用ＤＡ変換器１１の設定電圧Viに応じ
た電圧が負荷１５に印加され、この時負荷１５に流れる
電流i0が測定される。In this DC test apparatus, the resistance values of the resistance elements 12 and 17 are set to R 1 and R
The output voltage V o is 2 Then, a voltage according to the set voltage V i of the voltage setting DA converter 11 is applied to the load 15, and the current i 0 flowing in the load 15 at this time is measured.
今出力電圧Voが正電圧の場合に過大負荷が接続されると
電流検出用抵抗素子１４で過電流が検出され、比較回路
２１の出力側が負電圧から正電圧になり、クランプ用ダ
イオード２３に電流iC1が流れて出力電圧Voを下げるよ
うに動作する。出力電圧Voが負電圧の場合に過負荷にな
ると、比較回路２５の出力側が正電圧から負電圧にな
り、クランプ用ダイオード２７に電流iC2が流れて出力
電圧Voを下げる。If an overload is connected when the output voltage V o is a positive voltage, an overcurrent is detected by the current detection resistance element 14, the output side of the comparison circuit 21 changes from a negative voltage to a positive voltage, and the clamp diode 23 is connected. The current i C1 flows and operates to reduce the output voltage V o . When the output voltage V o is a negative voltage and is overloaded, the output side of the comparison circuit 25 changes from a positive voltage to a negative voltage, a current i C2 flows through the clamping diode 27, and the output voltage V o is lowered.
主増幅器１３の利得の周波数特性は第５図の曲線２８で
あり、クランプ回路１８の利得の周波数特性は曲線２９
であり、クランプ回路１８が動作した時の系全体の周波
数特性は曲線３１となり、クランプ回路１８が動作して
いない時よりも帯域が延び、容量性負荷時などの安定度
が低くなる。この安定度を保つためには主増幅器１３の
周波数帯域を落さざるを得なかった。このため応答速度
が遅くなる欠点があった。つまり系の安定性を保つため
には系全体の応答速度を下げなければならないという欠
点があった。The frequency characteristic of the gain of the main amplifier 13 is a curve 28 in FIG. 5, and the frequency characteristic of the gain of the clamp circuit 18 is a curve 29.
Therefore, the frequency characteristic of the entire system when the clamp circuit 18 is operating becomes the curve 31, the band is extended as compared to when the clamp circuit 18 is not operating, and the stability becomes low when a capacitive load is applied. In order to maintain this stability, the frequency band of the main amplifier 13 had to be lowered. Therefore, there is a drawback that the response speed becomes slow. In other words, there was a drawback that the response speed of the entire system had to be lowered in order to maintain the stability of the system.
「課題を解決するための手段」 この考案においては負荷保護用クランプ回路のクランプ
動作により制御されてコンデンサが主増幅器の帰還回路
に接続される。つまり負荷保護用クランプ回路が動作す
ると、その時だけ主増幅器の帰還回路にコンデンサが接
続されて主増幅器の周波数帯域が制限され、クランプ回
路が接続されているが安定に動作する。負荷保護用クラ
ンプ回路が動作していない状態では主増幅器の周波数帯
域が広く、しかもこの時、負荷保護用クランプ回路が主
増幅器から切離されているため安定に動作し、かつ応答
速度も速いものとなる。"Means for Solving the Problem" In the present invention, the capacitor is connected to the feedback circuit of the main amplifier under the control of the clamp operation of the load protection clamp circuit. That is, when the load protection clamp circuit operates, the capacitor is connected to the feedback circuit of the main amplifier only at that time to limit the frequency band of the main amplifier, and the clamp circuit is connected, but operates stably. The frequency band of the main amplifier is wide when the load protection clamp circuit is not operating, and the load protection clamp circuit is disconnected from the main amplifier at this time, so it operates stably and has a fast response speed. Becomes
「実施例」 第１図はこの考案の実施例を示し、第４図と対応する部
分には同一符号を付けてある。この実施例ではクランプ
用ダイオード２３，２７の各比較回路２１，２５側がそ
れぞれコンデンサ３２，３３を通じて主増幅器１３の出
力側に接続される。[Embodiment] FIG. 1 shows an embodiment of the present invention, in which parts corresponding to those in FIG. 4 are designated by the same reference numerals. In this embodiment, the comparison circuits 21 and 25 of the clamping diodes 23 and 27 are connected to the output side of the main amplifier 13 through capacitors 32 and 33, respectively.
この構成によれば負荷保護用クランプ回路１８が動作し
ていない場合はクランプ用ダイオード２３，２７には電
流が流れず共にオフであるため、コンデンサ３２，３３
は共に主増幅器１３の帰還ループから外れ、主増幅器１
３の利得周波数特性の帯域が制限されない、従って広帯
域特性であり、速い応答特性を示す。According to this configuration, when the load protection clamp circuit 18 is not operating, no current flows in the clamp diodes 23 and 27 and both are off, so that the capacitors 32 and 33 are turned off.
Are both out of the feedback loop of the main amplifier 13 and the main amplifier 1
The band of the gain frequency characteristic of No. 3 is not limited, so that it is a wide band characteristic and shows a quick response characteristic.
しかし負荷保護用クランプ回路１８が動作すると、クラ
ンプ用ダイオード２３又は２７が導通状態になるため、
コンデンサ３２又は３３が主増幅器１３の帰還ループに
入り主増幅器１３の周波数帯域が制限され、クランプ回
路１８が主増幅器１３に接続されているが系全体の帯域
が延びず安定に動作する。However, when the load protection clamp circuit 18 operates, the clamp diode 23 or 27 becomes conductive.
The capacitor 32 or 33 enters the feedback loop of the main amplifier 13, the frequency band of the main amplifier 13 is limited, and the clamp circuit 18 is connected to the main amplifier 13, but the band of the entire system does not extend and it operates stably.
第２図はこの考案の他の実施例を示し、この例では負荷
保護用クランプ回路１８が動作したことを、クランプ用
ダイオード２３，２７に接続されたコンパレータ３４に
より検出し、コンパレータ３４の出力でスイッチ３５を
制御してコンデンサ３６を主増幅器１３の帰還ループに
挿入する。このようにして負荷保護用クランプ回路１８
が動作した時のみ主増幅器１３の帯域を制限する。FIG. 2 shows another embodiment of the present invention. In this example, the operation of the load protection clamp circuit 18 is detected by the comparator 34 connected to the clamp diodes 23 and 27, and the output of the comparator 34 is used. The switch 35 is controlled to insert the capacitor 36 into the feedback loop of the main amplifier 13. In this way, the load protection clamp circuit 18
The band of the main amplifier 13 is limited only when is operated.
第３図はこの考案を電流印加電圧測定試験装置に適用し
た場合であり、負荷１５に電流を供給し、その時の負荷
電圧をバッファ回路３７で検出し、そのバッファ回路３
７の出力を電圧測定回路３８で測定する。バッファ回路
３７の出力が負荷保護用クランプ回路１８へ供給され
る。この動作は電圧印加電流測定の場合と同様であるか
ら説明は省略する。FIG. 3 shows a case in which the present invention is applied to a current applied voltage measuring and testing apparatus, in which a current is supplied to the load 15, the load voltage at that time is detected by the buffer circuit 37, and the buffer circuit 3
The output of No. 7 is measured by the voltage measuring circuit 38. The output of the buffer circuit 37 is supplied to the load protection clamp circuit 18. Since this operation is the same as in the case of voltage applied current measurement, its explanation is omitted.
「考案の効果」 以上述べたようにこの考案によれば負荷保護用クランプ
回路１８が動作するとコンデンサが主増幅器１３の帰還
回路に接続されて帯域が制限されて安定に動作し、負荷
保護用クランプ回路１８が動作しない状態では主増幅器
１３の帯域が制限されずに広帯域であるため応答速度が
速いものとなる。[Advantage of the Invention] As described above, according to the present invention, when the load protection clamp circuit 18 operates, the capacitor is connected to the feedback circuit of the main amplifier 13 and the band is limited to operate stably. In a state where the circuit 18 does not operate, the band of the main amplifier 13 is not limited and is a wide band, so that the response speed is fast.
第１図はこの考案を電圧印加電流測定に適用した場合の
実施例を示す接続図、第２図はその他の例を示す接続
図、第３図はこの考案を電流印加電圧測定に適用した場
合の実施例を示す接続図、第４図は従来の直流試験装置
を示す接続図、第５図は利得周波数特性図である。FIG. 1 is a connection diagram showing an embodiment when the present invention is applied to voltage applied current measurement, FIG. 2 is a connection diagram showing other examples, and FIG. 3 is a case where the present invention is applied to current applied voltage measurement. FIG. 4 is a connection diagram showing a conventional DC test apparatus, and FIG. 5 is a gain frequency characteristic diagram.
Claims (1)
を供給する主増幅器と、 上記負荷の過電流又は過電圧を検出して負荷への電流又
は電圧をクランプする負荷保護用クランプ回路と、 その負荷保護用クランプ回路のクランプ動作で制御され
て上記主増幅器の帰還回路に接続されて帯域を制限する
コンデンサとを具備する直流試験装置。1. A DA converter for setting voltage or current, a main amplifier which is supplied with the output of the DA converter and supplies voltage or current to a load, and an overcurrent or overvoltage of the load is detected to the load. A DC test apparatus comprising: a load protection clamp circuit for clamping the current or voltage of 1. and a capacitor which is controlled by the clamp operation of the load protection clamp circuit and is connected to the feedback circuit of the main amplifier to limit the band.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6043388U JPH0631430Y2 (en) | 1988-05-06 | 1988-05-06 | DC test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6043388U JPH0631430Y2 (en) | 1988-05-06 | 1988-05-06 | DC test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01163878U JPH01163878U (en) | 1989-11-15 |
| JPH0631430Y2 true JPH0631430Y2 (en) | 1994-08-22 |
Family
ID=31286138
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6043388U Expired - Lifetime JPH0631430Y2 (en) | 1988-05-06 | 1988-05-06 | DC test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0631430Y2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4707608B2 (en) * | 2006-05-19 | 2011-06-22 | 株式会社アドバンテスト | Measurement circuit and test equipment |
| JP4746489B2 (en) * | 2006-06-28 | 2011-08-10 | 株式会社リコー | Semiconductor measuring equipment |
-
1988
- 1988-05-06 JP JP6043388U patent/JPH0631430Y2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01163878U (en) | 1989-11-15 |
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