JPH0629758B2 - How to calibrate the basis weight - Google Patents
How to calibrate the basis weightInfo
- Publication number
- JPH0629758B2 JPH0629758B2 JP31253387A JP31253387A JPH0629758B2 JP H0629758 B2 JPH0629758 B2 JP H0629758B2 JP 31253387 A JP31253387 A JP 31253387A JP 31253387 A JP31253387 A JP 31253387A JP H0629758 B2 JPH0629758 B2 JP H0629758B2
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- Japan
- Prior art keywords
- radiation source
- measurement
- calibration
- basis weight
- time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Analysing Materials By The Use Of Radiation (AREA)
Description
【発明の詳細な説明】 <産業上の利用分野> 本発明は、ほとりの堆積、線源の減衰、或は温度変化以
外の原因によるドリフトの補償が可能な坪量計の校正方
法に関する。The present invention relates to a method for calibrating a grammage meter capable of compensating for drifts due to causes other than bank deposition, radiation source attenuation, or temperature change.
<従来の技術> 従来、紙、フィルム等のシート状材料の坪量を測定する
装置として、第4図に示すような装置が使用される。即
ち、フレーム1上にに所定間隔置いて対峙する線源2及
び検出器3を設け、これらの間にシート状材料4を矢印
A方向に走行させ、線源2と検出器3とをこのシート状
材料の幅方向(矢印B方向)に往復走行させて検出を行
うものである。<Prior Art> Conventionally, an apparatus as shown in FIG. 4 is used as an apparatus for measuring the basis weight of a sheet-shaped material such as paper or film. That is, the radiation source 2 and the detector 3 facing each other at a predetermined interval are provided on the frame 1, and the sheet-shaped material 4 is made to run in the direction of the arrow A between them, and the radiation source 2 and the detector 3 are connected to this sheet. Detection is performed by reciprocating the material in the width direction (direction of arrow B).
このような装置の場合、線源2の減衰、並びに線源2と
検出器3との間の放射線通路にほこりが堆積してドリフ
トを発生させるため、所定の周期で校正を行う必要があ
る。In the case of such an apparatus, since the radiation of the radiation source 2 is reduced and dust is accumulated in the radiation passage between the radiation source 2 and the detector 3 to cause drift, it is necessary to perform calibration at a predetermined cycle.
このような校正方法に次のような方法がある。先ず、放
射線を遮断するシャッター機構を設けた線源2を使用
し、工場出荷時、ほこりが堆積していない状態で、坪量
既知の各種標準サンプルを用いて次のような校正作業を
行う。There is the following method as such a calibration method. First, a radiation source 2 provided with a shutter mechanism for blocking radiation is used, and at the time of factory shipment, the following calibration work is performed using various standard samples of known grammage in a state where dust is not accumulated.
前記シャッター機構を閉じた状態で行う測定(そのと
きの放射線強度:IBo)、前記シャッター機構を開
け空気層のみで行う測定(そのときの放射線強度:I
Ao)、前記シャッター機構が開の状態で、前記標準
サンプルによって行う測定(そのときの放射線強度:I
s)。Measurement performed with the shutter mechanism closed (radiation intensity at that time: I Bo ), measurement performed with the shutter mechanism open only in the air layer (radiation intensity at that time: I Bo )
Ao ), measurement with the standard sample with the shutter mechanism open (radiation intensity at that time: I
s ).
これにより、IBoは検出器3の電気的ドリフトを表わ
し、IAo−IBoは検出信号のフルスパンを表わし、
Is−IBoは前記標準サンプルを用いて測定した信号
変化を表わす。これら測定結果から、第5図に示す検量
線Coを得る。Thereby, I Bo represents the electrical drift of the detector 3, I Ao −I Bo represents the full span of the detected signal,
I s -I Bo represents the signal change measured using the standard sample. From these measurement results, a calibration curve C o shown in FIG. 5 is obtained.
測定後、所定の周期で測定を中断して次の校正を行う。
前記の状態における測定(そのときの放射線強度:I
B)、前記の状態における測定(そのときの放射線強
度:IA)。After the measurement, the measurement is interrupted at a predetermined cycle to perform the next calibration.
Measurement under the above conditions (radiation intensity at that time: I
B ), measurement under the above-mentioned conditions (radiation intensity at that time: I A ).
線源2にはβ線源が用いられるが、最初の校正の時点よ
り経過時間tと共に減衰を続け(第5図のA1はそのと
きの減衰量)、IA−IBは以下の式で表わすることが
できる。尚、説明を簡略化するため温度変化はないもの
とする。A β-ray source is used as the radiation source 2, but the attenuation continues with the elapsed time t from the time of the first calibration (A 1 in FIG. 5 is the attenuation amount at that time), and I A −I B is expressed by the following equation. Can be expressed as It should be noted that there is no temperature change for the sake of simplification of the description.
IA−IB=(IAo−IBo)−λt …(1) 但し、:自然対数の底、λ:β線源の半減期に対応し
た定数。 I A -I B = (I Ao -I Bo) -λt ... (1) where: base of natural logarithm, lambda: corresponding to the half-life of β-ray source constant.
若し、(1)式の関係が成立たない場合には、ほこりの
堆積による減衰A2が加わったものと見做して以下の式
に基づき演算によりほこりDを求める。If the relationship of the expression (1) is not established, it is considered that the attenuation A 2 due to the accumulation of dust is added, and the dust D is calculated by the calculation based on the following expression.
IA−IB=(IAo−IBo)−λt ・−μD …(2) 但し、μ:吸収係数。 I A -I B = (I Ao -I Bo) -λt · -μD ... (2) However, μ: absorption coefficient.
このようにしてほこりの補正が行なわれたあと、次の校
正が行われる迄、この状態で測定が行われ、以下の式に
基づきシート状材料4の坪量Xが測定される。After the dust correction is performed in this way, the measurement is performed in this state until the next calibration is performed, and the basis weight X of the sheet material 4 is measured based on the following equation.
I−IB=(IAo−IBo)−λt ・−μ(D+X) …(3) 但し、I:通常測定時の検出出力。 I-I B = (I Ao -I Bo) -λt · -μ (D + X) ... (3) where, I: detection output of the normal measurement.
特公昭54−18148号には、前記した従来装置と構
成が異なるが、坪量計におけるほこりの補正方法につい
て開示されている。Japanese Examined Patent Publication No. 54-18148 discloses a method for correcting dust in a grammometer, which has a different configuration from the above-mentioned conventional device.
<発明が解決しようとする問題点> しかしながら、これら従来方法では、線源2と検出器3
との間の放射線通路にほこりが堆積して起こるドリフ
ト、線源2が経過時間と共に減衰して起こるドリフト、
或は温度変化によるドリフトの補償は行えるが、それ以
外の原因で起こるドリフトは補償できない。<Problems to be Solved by the Invention> However, in these conventional methods, the source 2 and the detector 3 are used.
Drift caused by the accumulation of dust in the radiation path between and, drift caused by the decay of the radiation source 2 over time,
Alternatively, the drift due to the temperature change can be compensated, but the drift caused by other causes cannot be compensated.
本発明で解決しようとする技術的課題は、前記坪量計に
おいて、ほこりの堆積、線源の減衰、或は温度変化以外
の原因によって起こるドリフトを補償することにある。The technical problem to be solved by the present invention is to compensate drift in the grammometer caused by dust accumulation, source attenuation, or a cause other than temperature change.
<問題点を解決するための手段> 本発明方法は、下記a乃至dの工程より構成される。<Means for Solving Problems> The method of the present invention comprises steps a to d below.
a.最初の校正時に、前記線源のシャッターを閉じた状
態、空気層のみの状態、及び坪量既知の各種標準サンプ
ルを用いた状態で測定を行い検量線を求める工程 b.前記最初の校正時から所定時間経過後に、前記線源
のシャッター機構を閉じた状態、及び空気層のみの状態
で測定を行い、経過時間に従って減衰した線源の理論値
を求める一方、この理論値と実測値とに基づいて放射線
通路のほこりの堆積量を演算により求める工程 c.前記最初の校正時から所定時間経過後に、坪量既知
(S)の内蔵標準サンプルを用いて測定を行い、この測
定値と、前記線源の減衰補正、並びに前記ほこりの堆積
補正を行った演算式とに基づき誤った坪量S′を求める
工程、及び d.前記内蔵標準サンプルの坪量SとS′とより誤差係
数を求め、これにより前記演算式を補正しこの式を用い
て前記シート状材料の真の坪量を求める工程。a. At the time of the first calibration, a step of performing a measurement with a shutter of the radiation source closed, a state of only an air layer, and a state of using various standard samples of known basis weights to obtain a calibration curve b. After a lapse of a predetermined time from the time of the first calibration, the shutter mechanism of the radiation source is closed and the measurement is performed only in the air layer, and the theoretical value of the radiation source attenuated according to the elapsed time is obtained, while the theoretical value is obtained. Calculating the amount of dust accumulation in the radiation path based on the measured value and the measured value c. After a lapse of a predetermined time from the time of the first calibration, measurement is performed using a built-in standard sample having a known basis weight (S), and the measurement value, the attenuation correction of the radiation source, and the accumulation correction of the dust are performed. Determining an incorrect basis weight S ′ based on the equation, and d. A step of obtaining an error coefficient from the basis weights S and S'of the built-in standard sample, correcting the arithmetic expression thereby, and using this equation to obtain the true basis weight of the sheet-shaped material.
<作用> 前記の技術手段は次のように作用する。即ち、前記検量
線が不変ならば、前記最初の校正時から所定時間経過後
に測定を行った場合、前記内蔵標準サンプルの測定値I
Sと坪量Sとは、線源の減衰補正、並びにほこりの堆積
補正を施した下記演算式を満足する筈である。<Operation> The above-mentioned technical means operates as follows. That is, if the calibration curve is unchanged, the measurement value I of the built-in standard sample is measured when the measurement is performed after a predetermined time has elapsed from the time of the first calibration.
S and grammage S should satisfy the following calculation formulas in which radiation source attenuation correction and dust accumulation correction are performed.
IS−IB=(IAo−IBo)−λt ・−μ(D+S) …(4) 若し、(4)式が満足されない場合、線源の減衰、或は
ほこりの堆積以外の原因で前記検量線が変化しているこ
とを表わしている。 I S -I B = (I Ao -I Bo) -λt · -μ (D + S) ... (4) Wakashi, (4) If equation is not satisfied, the damping of the source, or other dust deposition Indicates that the calibration curve has changed due to.
そこで、測定値ISより上記式を用いて演算により誤っ
た坪量S′を求め、SとS′とより誤差係数k=S′/
Sを求め、上記式を補正し、通常測定時において以下の
式によって正しい坪量Xを求める。Therefore, the erroneous basis weight S ′ is calculated from the measured value I S using the above equation, and the error coefficient k = S ′ / is calculated from S and S ′.
S is obtained, the above equation is corrected, and the correct basis weight X is obtained by the following equation during normal measurement.
<実施例> 以下図面に従い本発明の実施例を説明する。第1図は本
発明方法を説明するためのフローチャート、第2図は本
発明方法を実施するために使用される線源2の平面図で
ある。先ず、第2図において、201はβ線源を収容す
るボックス、202は放射線照射窓、203はサンプル
ホルダーで、内蔵標準サンプル204が載置され、駆動
用モータ205に軸支されたアーム206によって照射
窓202部分に出入する。207はサンプルホルダー2
03のガイドである。208は本図では図示されていな
いシャッター機構の駆動用モータで、このシャッター機
構もサンプルホルダー203と同様な動きをする。 <Example> An example of the present invention will be described below with reference to the drawings. FIG. 1 is a flow chart for explaining the method of the present invention, and FIG. 2 is a plan view of a radiation source 2 used for carrying out the method of the present invention. First, in FIG. 2, 201 is a box for accommodating a β-ray source, 202 is a radiation irradiation window, 203 is a sample holder, and a built-in standard sample 204 is placed by an arm 206 pivotally supported by a drive motor 205. Enter and exit the irradiation window 202. 207 is a sample holder 2
03's guide. Reference numeral 208 denotes a drive motor for a shutter mechanism, which is not shown in the figure, and this shutter mechanism also operates similarly to the sample holder 203.
次に、本発明方法を第1図のフローチャート、並びに第
3図の説明図に従い説明する。ステップ(1)におい
て、工場出荷時のような最初の校正時、線源と検出器3
との間の放射線通路にほこりが堆積していない状態で、
坪量既知の各種標準サンプルを照射窓202部分に当て
て測定を行い、第3図の検量線Coを得る。Next, the method of the present invention will be described with reference to the flowchart of FIG. 1 and the explanatory view of FIG. In step (1), at the time of initial calibration such as factory shipment, the source and detector 3
With no dust accumulated in the radiation passage between
The basis weight of various known standard sample was measured against the irradiation window 202 parts, obtaining a calibration curve C o in Figure 3.
ステップ(2)において、所定時間経過後、前記シャッ
ター機構を閉じた状態での測定、及び空気層のみの測定
を行い、(1),(2)式のところで説明したような、
線源の減衰補正、ほこりの堆積補正を行う。In step (2), after a lapse of a predetermined time, measurement with the shutter mechanism closed and measurement of only the air layer are performed, and as described in the expressions (1) and (2),
Correction of radiation source attenuation and dust accumulation.
ステップ(3)において、坪量既知(S)の内蔵標準サ
ンプル204を用いて測定を行う。測定値Isと坪量S
とは、線源の減衰補正、ほこりの堆積補正を施した
(4)式を満足する筈であるが、満足しない場合には、
他の原因でドリフトが生じ、第3図に示すごとく、検量
線がCoからC1に変化していることを表わしてい。
尚、C2は測定値のカーブを示す。In step (3), the measurement is performed using the built-in standard sample 204 whose basis weight is known (S). Measured value I s and basis weight S
Is supposed to satisfy the equation (4) with the attenuation correction of the radiation source and the dust accumulation correction, but if not,
This indicates that drift has occurred due to other causes, and as shown in FIG. 3, the calibration curve changes from Co to C 1 .
Incidentally, C 2 represents a curve of the measured values.
第3図において、最初の校正時には内蔵標準サンプル2
04を用いた測定点は検量線CO上のP1にある。P2
は、t時間経過後、ほこりDが堆積した状態で内蔵標準
サンプル204を用いて行った測定点である。この点
は、線源の減衰補正(A1)、ほこりの堆積補正
(A2)を行えばP1点に戻る筈であるが、何等かの原
因による誤差E1が加わって、点P3に戻ってしまう場
合である。In Fig. 3, built-in standard sample 2 at the first calibration
The measurement point using 04 is at P 1 on the calibration curve C O. P 2
Is a measurement point measured with the built-in standard sample 204 in a state where dust D is deposited after the lapse of t time. This point should return to the point P 1 if the radiation source attenuation correction (A 1 ) and dust accumulation correction (A 2 ) are performed, but an error E 1 due to some cause is added to the point P 3 That is the case of returning to.
このような場合、ステップ(4)において、測定値IS
と(4)式とより、誤った坪量S′を求め、更に、ステ
ップ(5)において、SとS′とより誤差係数k=S′
/Sを求める。In such a case, in step (4), the measured value I S
And the equation (4), the erroneous basis weight S ′ is obtained, and in step (5), the error coefficient k = S ′ is obtained from S and S ′.
/ S is calculated.
次いで、(4)式に誤差係数kの補正を施し、通常測定
時、(5)式を用いて、測定値Iからシート状材料4の
真の坪量Xを求める(ステップ(6))。Then, the error coefficient k is corrected in the equation (4), and the true basis weight X of the sheet-shaped material 4 is obtained from the measured value I using the equation (5) during the normal measurement (step (6)).
<発明の効果> 本発明によれば、前記線源と検出器との間の放射線通路
にほこりが堆積して起こるドリフト、線源が経過時間と
共に減衰して起こるドリフト、或は温度変化によるドリ
フトの補正が行える他、それ以外の原因で起こるドリフ
トについても補償することができる。<Advantages of the Invention> According to the present invention, a drift caused by accumulation of dust in the radiation passage between the radiation source and the detector, a drift caused by decay of the radiation source with time, or a drift caused by a temperature change. Can be corrected, and drift caused by other causes can be compensated.
第1図は本発明方法を説明するためのフローチャート、
第2図は本発明方法を実施するために使用される線源の
平面図、第3図は本発明方法を説明するための説明図、
第4図は坪量測定装置の全体斜視図、第5図は従来方法
を説明するための説明図である。 2……線源、204……内蔵標準サンプル、3……検出
器、4……シート状材料、Co……最初の校正時の検量
線、D……ほこりの堆積、S……内蔵標準サンプルの坪
量FIG. 1 is a flow chart for explaining the method of the present invention,
FIG. 2 is a plan view of a radiation source used for carrying out the method of the present invention, FIG. 3 is an explanatory view for explaining the method of the present invention,
FIG. 4 is an overall perspective view of the grammage measuring device, and FIG. 5 is an explanatory diagram for explaining a conventional method. 2 ... Ray source, 204 ... Built-in standard sample, 3 ... Detector, 4 ... Sheet material, C0 ... Calibration curve at the first calibration, D ... Dust accumulation, S ... Built-in standard Sample basis weight
Claims (1)
を対向配置しこのシート状材料の坪量を測定する坪量計
の校正方法であって下記a乃至dの工程を行うことを特
徴とする坪量計の校正方法。 a.最初の校正時に、前記線源のシャッターを閉じた状
態、空気層のみの状態、及び坪量既知の各種標準サンプ
ルを用いた状態で測定を行い検量線を求める工程 b.前記最初の校正時から所定時間経過後に、前記線源
のシャッター機構を閉じた状態、及び空気層のみの状態
で測定を行い、経過時間に従って減衰した線源の理論値
を求める一方、この理論値と実測値とに基づいて放射線
通路のほこりの堆積量を演算により求める工程 c.前記最初の校正時から所定時間経過後に、坪量既知
(S)の内蔵標準サンプルを用いて測定を行い、この測
定値と、前記線源の減衰補正、並びに前記ほこりの堆積
補正を行った演算式とに基づき誤った坪量S′を求める
工程、及び d.前記内蔵標準サンプルの坪量SとS′とより誤差係
数を求め、これにより前記演算式を補正しこの式を用い
て前記シート状材料の真の坪量を求める工程。1. A method for calibrating a grammometer in which a radiation source and a detector are arranged to face each other across a sheet material and the basis weight of the sheet material is measured, and the steps a to d below are performed. The calibration method of the grammage featured. a. At the time of the first calibration, a step of performing a measurement with a shutter of the radiation source closed, a state of only an air layer, and a state of using various standard samples of known basis weights to obtain a calibration curve b. After a lapse of a predetermined time from the time of the first calibration, the shutter mechanism of the radiation source is closed and the measurement is performed only in the air layer, and the theoretical value of the radiation source attenuated according to the elapsed time is obtained, while the theoretical value is obtained. Calculating the amount of dust accumulation in the radiation path based on the measured value and the measured value c. After a lapse of a predetermined time from the time of the first calibration, measurement is performed using a built-in standard sample having a known basis weight (S), and the measurement value, the attenuation correction of the radiation source, and the accumulation correction of the dust are performed. Determining an incorrect basis weight S ′ based on the equation, and d. A step of obtaining an error coefficient from the basis weights S and S'of the built-in standard sample, correcting the arithmetic expression accordingly, and using this equation to obtain the true basis weight of the sheet-shaped material.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP31253387A JPH0629758B2 (en) | 1987-12-10 | 1987-12-10 | How to calibrate the basis weight |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP31253387A JPH0629758B2 (en) | 1987-12-10 | 1987-12-10 | How to calibrate the basis weight |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH01153917A JPH01153917A (en) | 1989-06-16 |
JPH0629758B2 true JPH0629758B2 (en) | 1994-04-20 |
Family
ID=18030369
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP31253387A Expired - Lifetime JPH0629758B2 (en) | 1987-12-10 | 1987-12-10 | How to calibrate the basis weight |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0629758B2 (en) |
-
1987
- 1987-12-10 JP JP31253387A patent/JPH0629758B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH01153917A (en) | 1989-06-16 |
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