JPH06249834A - Correctness judging device for terminal electrode of electronic part - Google Patents

Abstract

PURPOSE:To provide a correctness judging device for the terminal electrode of an electronic part which can judge the correctness of each terminal electrode without disarraying the arrangement of electronic parts. CONSTITUTION:A terminal electrode correctness judging device is equipped with a transport means 15 for transporting an electronic part having the terminal electrodes 13a and 13b covered with the magnetic metal, magnet 16 which is installed on the transport passage for the electronic part and magnetizes the magnetic metal, magnetic sensor 18 which is installed on the transport passage for the electronic part and detects the magnetic field of the magnetic metal which is magnetized, and a judging means 19 which judges the correctness by receiving the output signal of the magnetic sensor 18.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device for determining the quality of a terminal electrode of an electronic component.

[0002]

2. Description of the Related Art Electrode plating of a resistor of a semi-fixed VR chip, which is one of conventional electronic components, using magnetic metal will be described with reference to FIGS. In FIG. 4, 1 is a ceramic substrate, 2 is a first conductive layer printed on the terminals 2a, 2b of the ceramic substrate 1 with a silver-based paint, and 3 is a bridge between the terminals 2a, 2b. The resistance path is formed by printing and firing a metal glaze-based resistance material. Four
Is a second conductive layer made of a nickel layer formed on the terminal portions 2a and 2b by electroplating, and 5 is a third conductive layer made of a solder layer also formed on the second conductive layer 4 by electroplating. And the resistor 6 is formed by the above configuration.

As shown in FIG. 6, the resistor 6 is not produced as a single resistor, but is formed on the ceramic substrate 7 with a V groove 8
Is provided, and after the electroplating of the second conductive layer 4 and the third conductive layer 5 is completed, the resistor 6 is completed by dividing along the V groove 8. Then, the resistor 6 undergoes an inspection process as a resistor before being supplied to the assembly process as the chip semi-fixed VR which is the next process. In particular, the terminal part 2
First conductive layer 2 and second conductive layer 4 formed on a and 2b
Also, of the third conductive layer 5, the quality of the second conductive layer 4 is an important point that greatly affects the mounting reliability of the product such as soldering.

Conventionally, the quality judgment means of the second conductive layer 4 has generally been an adsorption test using a permanent magnet by utilizing the characteristics of nickel metal as a magnetic material. That is, the electronic component to be subjected to the test is brought close to the permanent magnet, and the electronic component attracted to the permanent magnet is determined as a good product.

[0005]

However, in this quality judging device, the terminal electrodes are independently provided in one product.
When there are more than one piece, the individual pieces of the product cannot be detected because the product pieces are attracted by the resultant force of the attraction forces of the magnetic metals. Further, when the substrate 1 of the resistor 6 of the semi-fixed VR chip is manufactured in a large number on the ceramic substrate 7, not only the individual terminal electrodes of the electronic component but also the individual terminal electrodes of the product cannot be inspected. It will be possible.

Further, in the adsorption method using a magnet, it is difficult to adsorb and desorb the products in an aligned state, and inevitably they become bulky (separated), and realignment after the inspection is required. Therefore, an object of the present invention is to provide a device for determining the quality of a terminal electrode of an electronic component, which can determine the quality of each terminal electrode without disturbing the alignment of the electronic component.

[0007]

According to another aspect of the present invention, there is provided a device for determining the quality of a terminal electrode of an electronic component, wherein the device is provided with a transporting means for transporting an electronic component having a terminal electrode coated with a magnetic metal, and on the way of transporting the electronic component. A magnet that magnetizes the magnetic metal, a magnetic sensor that is provided on the way of transporting the electronic component to detect the magnetic field of the magnetized magnetic metal, and a determination unit that inputs the output signal of the magnetic sensor and determines whether the magnetic material is good or bad. Be prepared.

According to a second aspect of the present invention, there is provided a device for determining the quality of a terminal electrode of an electronic component, wherein a transporting means for transporting an electronic component having a terminal electrode coated with a magnetic metal, and a magnetic flux provided to the magnetic metal when the electronic component is being transported. A magnet including a magnet to be supplied, a magnetoresistive element which is disposed in the magnetic flux and detects the disturbance of the magnetic flux due to the movement of the magnetic metal, and a determination unit which inputs the output signal of the magnetoresistive element and determines the quality. Is.

[0009]

According to the quality determining device for the terminal electrode of the electronic component of claim 1, the magnetic metal of the terminal electrode is magnetized by the magnet during the transportation of the electronic component by the transporting means, and the magnetic field due to the residual magnetism is sensed by the magnetic sensor. Whether or not a signal larger than the reference signal is inputted is judged by the judging means which receives the output signal and is judged as good or bad.

In this case, since the magnetic flux of each magnetic metal is detected by the magnetic sensor and the quality is judged by the judging means, the quality can be accurately judged for each individual terminal electrode even if the electronic component has a plurality of terminal electrodes. can do. Therefore,
Even if a large number of electronic components are integrally formed, it is possible to inspect each individual terminal electrode. In addition, since the magnetic field is detected by the magnetic sensor, the product can be inspected in an aligned state without being disturbed, and the product form can be inspected without any restrictions. Therefore, the flexibility of the manufacturing process can be increased and more efficient electronic parts can be manufactured. Can be produced.

According to the quality determining device for the terminal electrode of the electronic component of claim 2, the magnetic field disturbance of the magnet due to the movement of the magnetic metal is detected by the magnetoresistive element in the process of transporting the electronic component. Has the same effect.

[0012]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A first embodiment of the present invention will be described with reference to FIG. In FIG. 1, reference numeral 7 denotes a sheet-shaped ceramic substrate provided with a V-shaped groove 8, which is of a metal glaze type that bridges between the terminal electrodes 13a and 13b, which are electrodes printed with silver-based paint, and the terminal electrodes 13a and 13b. A plurality of resistors are formed by the resistance paths 14 made of a material. This terminal electrode 1
As described with reference to FIG. 4, the nickel metal layer 3a and 13b is coated with a nickel metal layer by electroplating, and a solder layer is further formed. Reference numeral 15 is a means for transporting the ceramic substrate 11 of individual resistors, 16 is a magnet which is a permanent magnet for generating a magnetic field 17, and 18 is a magnet 1.
6 is a magnetic sensor such as a Hall element arranged so as to most efficiently detect the magnetic flux generated from the magnetic metal of the terminal electrodes 13a and 13b magnetized by 6. Also, 19
Is an output signal sent from the magnetic sensor 18, and is converted into an analog signal so that the thickness and amount of the terminal electrodes 13a and 13b can be quantitatively compared and determined with respect to a reference value,
This is a quality determination means in which an electric circuit is configured so as to improve the quality determination accuracy of a product by amplifying the difference in the thickness and amount of the terminal electrodes 13a and 13b.

The device for determining the quality of a terminal electrode of an electronic component according to this embodiment has a terminal electrode 13 coated with a magnetic metal.
Transporting means 15 for transporting electronic components having a and 13b
A magnet 16 provided on the way of transporting the electronic component to magnetize the magnetic metal; a magnetic sensor 18 provided on the way of transport of the electronic component to detect a magnetic field of the magnetized magnetic metal; and an output of the magnetic sensor 18. It is provided with a determination means 19 for inputting a signal and determining pass / fail.

The mechanism for detecting the terminal electrodes 13a and 13b formed on the resistor of the electronic component is the transport means 15
While the electronic component is being transported by the terminal electrode 13
The magnetic metals a and 13b are magnetized by the magnet 16, and the magnetic field due to the residual magnetism is detected by the magnetic sensor 18,
The accepting unit 19 which receives the output signal makes a pass / fail decision based on, for example, whether a signal larger than the reference signal is input.

According to the first embodiment, since the magnetic flux of each magnetic metal is detected by the magnetic sensor 18 and the quality of the judgment is judged by the judgment means 19, a plurality of terminal electrodes 13a, 1 are attached to the electronic component.
Even if 3b is provided, the quality can be accurately determined for each of the individual terminal electrodes 13a and 13b. Therefore, even if a large number of electronic components are integrally formed, it is possible to inspect each individual terminal electrode 13a, 13b. Further, since the magnetic field is detected by the magnetic sensor 18, the product can be inspected in an aligned state without being disturbed, and further, the product form can be inspected without any restriction. Therefore, the degree of freedom in the manufacturing process can be increased and a more efficient electronic device can be provided. It becomes possible to produce parts.

The magnetic head of the magnetic sensor may detect a change in magnetic flux. Further, the transporting means 15 may be provided with a means for receiving a signal from the determining means 19 and selecting good or bad electronic components. A second embodiment of the present invention will be described with reference to FIGS. That is, this device for determining the quality of a terminal electrode of an electronic component is configured to convey an electronic component having the terminal electrodes 13a and 13b coated with a magnetic metal, and a conveying unit 15, which is provided on the way of conveying the electronic component to apply a magnetic flux to the magnetic metal. The magnet 16 to be supplied, the magnetoresistive element 21 arranged in the magnetic flux to detect the disturbance of the magnetic flux due to the movement of the magnetic metal, and the judging means 19 for judging the acceptability by inputting the output signal of the magnetoresistive element 21. It has and.

The magnet 16 is a permanent magnet as an example, and generates a magnetic field larger than the detection region area of the magnetoresistive element 21. When the electronic component is carried by the carrying means 15 and its terminal electrodes 13a and 13b pass near the magnetoresistive element 21, as shown in FIGS.
The magnetic field 17 of 6 is disturbed. The disordered state of the magnetic field 17 changes depending on the size and amount of the thickness of the terminal electrodes 13a and 13b. Therefore, the magnetic resistance change is detected by the magnetoresistive element 21, and the obtained electric signal is processed by the judging means 19,
By setting conditions such as the reference value of the judging means 19, the thickness and amount of the magnetic metal can be quantitatively compared and judged and selected.
Others are the same as those in the first embodiment.

The same result can be obtained by disposing the magnetoresistive element 21 on the lower surface of the conveying means 15 for conveying the magnetic metal. Further, in the present invention, the electronic component is exemplified by the resistor having the chip semi-fixed VR, but it may be a chip resistor, a multilayer chip capacitor or the like.

[0019]

According to the quality determining device of the terminal electrode of the electronic component of the first aspect, the magnetic flux of each magnetic metal of the electronic component is detected by the magnetic sensor and the quality is determined by the determining means.
Even if the electronic component has a plurality of terminal electrodes, the quality can be accurately determined for each individual terminal electrode. Therefore, even if a large number of electronic components are integrally formed, it is possible to inspect each individual terminal electrode. In addition, since the magnetic field is detected by the magnetic sensor, the product can be inspected in an aligned state without being disturbed, and the product form can be inspected without any restrictions. Therefore, the flexibility of the manufacturing process can be increased and more efficient electronic parts can be manufactured. The effect is that the production of

According to the quality determining device for the terminal electrode of the electronic component of the second aspect, since the magnetic resistance element detects the disturbance of the magnetic field of the magnet due to the movement of the magnetic metal in the process of transporting the electronic component, It has the same effect.

[Brief description of drawings]

FIG. 1 is an explanatory diagram of a first embodiment of the present invention.

FIG. 2 is an explanatory diagram of a second embodiment.

FIG. 3 is an explanatory diagram illustrating disturbance of a magnetic field of a magnet due to magnetic metal.

FIG. 4 is a cross-sectional view of a resistor of a semi-fixed chip VR of an electronic component.

FIG. 5 is a perspective view thereof.

FIG. 6 is a plan view of a plurality of electronic components formed on a ceramic substrate.

[Explanation of symbols]

 11 substrate 13a, 13b terminal electrode 15 carrier means 16 magnet 17 magnetic field 18 magnetic sensor 19 judging means

Front page continued (72) Inventor Osamu Mitsumura 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. (72) Kaoru Mikami 1006 Kadoma, Kadoma City, Osaka Matsushita Electric Industrial Co., Ltd. (72) Inventor Koji Yamada 1-301-19-19 Miyuki-cho, Sabae-shi, Fukui Prefecture C, And, M Co., Ltd. (72) Inventor Takehito Shirasaki 1-1209, Shirasaki Special Machine Trading Association, Fukui City, Fukui Prefecture

Claims (2)

[Claims] 1. A carrying means for carrying an electronic component having a terminal electrode coated with a magnetic metal, a magnet provided on the way of carrying the electronic component to magnetize the magnetic metal, and provided on the way of carrying the electronic component. A device for determining the quality of a terminal electrode of an electronic component, comprising: a magnetic sensor for detecting a magnetic field of the magnetized and magnetized magnetic metal; 2. A carrying means for carrying an electronic component having a terminal electrode coated with a magnetic metal, a magnet provided on the way of carrying the electronic component for supplying a magnetic flux to the magnetic metal, and arranged in the magnetic flux. Device for determining the quality of a terminal electrode of an electronic component, which includes a magnetoresistive element for detecting the disturbance of the magnetic flux due to the movement of the magnetic metal, and a determination means for determining the quality by inputting an output signal of the magnetoresistive element. .