JPH06229944A - Optical apparatus and method for inspecting surface - Google Patents

Optical apparatus and method for inspecting surface

Info

Publication number
JPH06229944A
JPH06229944A JP1555393A JP1555393A JPH06229944A JP H06229944 A JPH06229944 A JP H06229944A JP 1555393 A JP1555393 A JP 1555393A JP 1555393 A JP1555393 A JP 1555393A JP H06229944 A JPH06229944 A JP H06229944A
Authority
JP
Japan
Prior art keywords
light
inspected
bright
dark
lamp
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1555393A
Other languages
Japanese (ja)
Inventor
Takayoshi Fuchida
隆義 渕田
Tadashi Kobori
正 小堀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Lighting and Technology Corp
Original Assignee
Toshiba Lighting and Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Lighting and Technology Corp filed Critical Toshiba Lighting and Technology Corp
Priority to JP1555393A priority Critical patent/JPH06229944A/en
Publication of JPH06229944A publication Critical patent/JPH06229944A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To enable sure and quick detection of a minute variation in the state of a surface by preparing a bright-and-dark pattern by generating bright and dark parts alternately by an illuminating device. CONSTITUTION:A light diffused by a light diffusing plate 4 is separated into the part of a transmitted light and that of an intercepted light by a light control member 5 and the light reaching a light-transmitting part 51 is transmitted therethrough and irradiates a substance 6 to be inspected, while the light reaching a light-intercepting part 52 is prevented from being transmitted. On the surface of the substance 6, therefore, a bright part irradiated directly by the light and a dark part to be made a half-shade part by an indirect light are formed alternately and a bright-and-dark fringe pattern is formed. When the substance 6 is moved by a conveying device 7, the part of a flaw moves from the bright part to the dark part and further to the bright part, a reflection characteristic varies and the part can be discriminated as the flaw. In this way, a minute flaw, an indentation, a foreign matter sticking on the surface or the like can be distinguished surely and quickly without necessitating any skill, and thus the efficiency and precision of inspection are improved.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、各種物体の表面状態を
検査する光学的表面検査装置および表面検査方法に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical surface inspection device and a surface inspection method for inspecting the surface condition of various objects.

【0002】[0002]

【従来の技術】例えば、各種物体の塗装面やメッキ面、
または研磨面等の仕上がり具合を調べる場合、被検査物
の表面を直接手で触り、その手触り、つまり感触により
傷の有無を調べるようにしているが、触覚のみでは微細
な傷などを見付けることができず、検査精度が劣るとと
もに、被検査物の面積が大きな場合は検査不能になる。
また、他の表面検査方法として、被検査物の表面に光を
当て、この光の反射具合を見てこれらの表面の形、平坦
具合、傷の有無などを調べることも行われている。つま
り、綺麗に仕上げられた表面では光が揃って反射し、傷
や不所望な凹凸がある場合は光の反射特性が変化するの
で、これを調べれば表面状態を知ることができる。
2. Description of the Related Art For example, painted or plated surfaces of various objects,
Alternatively, when checking the finish of the polished surface, etc., the surface of the object to be inspected is touched directly by hand, and the presence or absence of scratches is checked by the touch, that is, the touch. If the area of the object to be inspected is large and the inspection accuracy is poor, the inspection becomes impossible.
Further, as another surface inspection method, light is applied to the surface of the object to be inspected, and the shape of these surfaces, the flatness, the presence or absence of scratches are examined by observing the reflection of this light. That is, light is uniformly reflected on a cleanly finished surface, and if there are scratches or undesired irregularities, the light reflection characteristics change. Therefore, the surface state can be known by examining this.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、上記の
ような光の反射具合によって表面を調べる場合、被検査
物の表面の明るさが全体に亘り一様で変化がないと、微
細な傷の識別が困難であり、このような傷は見落としや
すく、よって検査に熟練を要し、何度も見直す必要があ
るなど、検査に時間がかかる欠点がある。
However, when the surface is inspected by the above-mentioned light reflection condition, if the brightness of the surface of the object to be inspected is uniform and does not change, fine scratches can be identified. However, such a flaw is easy to overlook, and thus requires a lot of skill in the inspection and needs to be reviewed many times.

【0004】本発明はこのような事情にもとづきなされ
たもので、その目的とするところは、表面状態の微細な
変化を確実かつ迅速に調べることができる光学的表面検
査装置および表面検査方法を提供しようとするものであ
る。
The present invention has been made under such circumstances, and an object thereof is to provide an optical surface inspection apparatus and a surface inspection method capable of surely and quickly inspecting minute changes in the surface condition. Is what you are trying to do.

【0005】[0005]

【課題を解決するための手段】本発明は、The present invention comprises:

【0006】被検査物の表面に光を照射してこの表面の
反射具合で表面状態を検査する装置において、上記被検
査物の表面に光を照射する照明装置は、上記表面を明る
く照らす部分と、この明るい部分より暗くした部分とを
交互に発生させて明暗模様を生じさせることを特徴とす
る。また本発明は、被検査物の表面に、光を照射して明
るく照らす部分と、この明るい部分より暗くした部分と
を交互に発生させて明暗模様をつくる照明装置と、
In an apparatus for irradiating the surface of an object to be inspected with light and inspecting the surface condition by the degree of reflection of this surface, the illuminating device for irradiating the surface of the object to be inspected with light is a portion that illuminates the surface brightly. The light and dark portions are alternately generated to produce a bright and dark pattern. Further, the present invention, on the surface of the object to be inspected, a illuminating device that creates a bright and dark pattern by alternately generating a portion that is illuminated by shining light and a portion that is darker than the bright portion,

【0007】上記被検査物の表面に生じる明暗模様を上
記被検査物の表面に沿って移動させるため、上記照明装
置および被検査物の少なくともいづれか一方を移動させ
る手段と、を具備したことを特徴とする。また、本発明
の光学的表面検査方法は、
A means for moving at least one of the illumination device and the object to be inspected in order to move the light and dark pattern generated on the surface of the object to be inspected along the surface of the object to be inspected. And Further, the optical surface inspection method of the present invention,

【0008】被検査物の表面に、光を直接当てて明るく
した部分と、光を遮断して影をつくることにより暗くし
た部分とを交互に発生させ、この光の明暗による模様の
部分を上記被検査物の表面上で相対的に移動させること
により、この被検査物の表面の反射具合を変化させてこ
の反射の変化により表面状態を調べるようにしたことを
特徴とする。
[0008] On the surface of the object to be inspected, a portion which is brightened by direct application of light and a portion which is darkened by blocking light to create a shadow are alternately generated. It is characterized in that the relative condition of the surface of the object to be inspected is changed by relatively moving it on the surface of the object to be inspected, and the surface state is examined by the change in the reflection.

【0009】[0009]

【作用】本発明によれば、被検査物の表面にランプから
出た光が当たる明るい部分と、それよりも暗い部分とが
交互に形成されるようになり、これら明るい部分では拡
散しない光が照射されるようになり、この明るい部分の
表面反射具合が明確になって表面状態を容易に判別する
ことができる。
According to the present invention, bright portions on the surface of the object to be inspected, which are illuminated by the light emitted from the lamp, and dark portions, which are darker than that, are alternately formed. As the light is irradiated, the degree of surface reflection of this bright portion becomes clear and the surface state can be easily discriminated.

【0010】また、本発明は、照明装置および被検査物
の少なくともいづれかの位置を変えるようにすれば反射
具合が変化し、例えば傷などは明るい部分で反射してい
ると、暗い部分では影になったり、逆に影になっていた
部分が光を反射する等のように変化し、よって微細な傷
などを容易の見付けることができ、その識別が確実かつ
迅速に行え、被検査物の表面状態を効果的に調べること
ができる。
Further, according to the present invention, if at least one of the position of the illumination device and the object to be inspected is changed, the reflection condition is changed. Or, on the contrary, the shadowed part changes such as reflecting light, so you can easily find minute scratches etc., and you can identify them reliably and quickly, and the surface of the object to be inspected You can check the condition effectively.

【0011】[0011]

【実施例】以下本発明の一実施例について、図面を用い
て説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.

【0012】図において、符号10は照明装置を示し、
その中で1はランプハウジングであり、内面が白色など
の反射面2を有するとともに下端が開放された箱形をな
している。このランプハウジング1内には光源、例えば
複数本の直管形けい光ランプ3…が水平方向に並べて収
容されている。これらランプ3…から放射された光は、
1部はランプハウジング1の反射面2で反射され、残り
は直接に下向きに照射され、よってランプハウジング1
の下端開放部から下向きに放射されるようになってい
る。
In the drawings, reference numeral 10 indicates a lighting device,
Among them, reference numeral 1 is a lamp housing, which has a box shape with an inner surface having a reflecting surface 2 of white or the like and an open lower end. In the lamp housing 1, a light source, for example, a plurality of straight tube fluorescent lamps 3 ... Are housed side by side in the horizontal direction. The light emitted from these lamps 3 ...
One part is reflected by the reflecting surface 2 of the lamp housing 1, and the rest is directly irradiated downward, so that the lamp housing 1
It is designed to radiate downward from the open end of the bottom.

【0013】ランプハウジング1の下端開放部には、光
拡散板4が設けられている。この光拡散板4は、上記ラ
ンプハウジング1の下端開放部から下向きに放射される
光を拡散し、これにより光拡散板4を透過した光は拡散
し、光拡散板4の下面では明るさが全面に亘り略等しく
なるように制御されている。
A light diffusing plate 4 is provided at the lower end open portion of the lamp housing 1. The light diffusing plate 4 diffuses the light emitted downward from the lower end open portion of the lamp housing 1, whereby the light transmitted through the light diffusing plate 4 is diffused, and the brightness on the lower surface of the light diffusing plate 4 is reduced. It is controlled so as to be substantially equal over the entire surface.

【0014】この光拡散板4の下方には制光部材5が設
けられている。制光部材5は、例えば光遮断性の板材か
らなり、多数個の光透過部51…となるスリット部を等
間隔を存して形成してある。つまり、この制光部材5
は、上記光透過部51…となるスリット部と、光を遮断
する遮光部52…とを交互に、それぞれ等間隔を存して
形成してある。
A light control member 5 is provided below the light diffusion plate 4. The light-blocking member 5 is made of, for example, a light-blocking plate material, and has slits serving as a large number of light-transmitting portions 51 ... Formed at equal intervals. That is, this light control member 5
Are formed by alternately forming slit portions which become the light transmitting portions 51 ... And light shielding portions 52 which block light, at equal intervals.

【0015】このような制光部材5の下方には、被検査
物6が配置される。被検査物6は搬送部材7に載置され
ており、これにより被検査物6の被検査表面が制光部材
5に対向されているとともに、搬送部材7が例えば矢印
方向に等速度または間欠的に移動することにより一緒に
移動されるようになっている。
An object 6 to be inspected is arranged below the light control member 5. The object 6 to be inspected is placed on the conveying member 7, whereby the surface to be inspected of the object 6 to be inspected faces the light control member 5, and the conveying member 7 moves at a constant speed or intermittently in the arrow direction, for example. It is supposed to be moved together by moving to.

【0016】このような構成においては、光拡散板4に
より拡散された光は、制光部材5により透過光の部分と
遮光部分とに区分けられる。つまり、制光部材5に形成
した光透過部51に達した光はこの光透過部51を透過
して被検査物6を照射し、また遮光部52に達した光は
この遮光部52で透過が妨げられる。
In such a structure, the light diffused by the light diffusing plate 4 is divided by the light control member 5 into a transmitted light portion and a light shielding portion. That is, the light reaching the light transmitting portion 51 formed in the light control member 5 is transmitted through the light transmitting portion 51 to illuminate the inspection object 6, and the light reaching the light shielding portion 52 is transmitted through the light shielding portion 52. Is hindered.

【0017】このため、被検査物6の表面では、光が直
接照射された明るい部分61と、直射光が達しないが間
接光が達することにより半影部となる暗い部分62とが
交互に形成され、つまり光の明暗による縞模様が形成さ
れるようになる。
Therefore, on the surface of the object 6 to be inspected, a bright portion 61 directly irradiated with light and a dark portion 62 which becomes a penumbra due to indirect light which is not reached by direct light are alternately formed. That is, a striped pattern due to light and darkness of light is formed.

【0018】ここで、被検査物6の表面が綺麗に仕上が
っている場合、光が直接照射される明るい部分61で
は、所定の方向から見れば、全体に亘り一様に明るく反
射するとともに、暗い部分62では暗いなりにも所定の
方向から見れば、全体に亘り一様に暗くみえる。
Here, when the surface of the object 6 to be inspected is beautifully finished, in the bright portion 61 to which the light is directly irradiated, when viewed from a predetermined direction, it is uniformly brightly reflected and dark. Even if it is dark in the portion 62, when viewed from a predetermined direction, it looks uniformly dark throughout.

【0019】ところが、上記被検査物6の表面に傷があ
る場合、この傷が例えば上記光が直接照射された明るい
部分61に存在する場合(図3のA)は、傷の具合によ
ってはこの傷の表面により所定の方向に光が反射され
ず、不所望な方向に反射される。よってこの傷を見る角
度により、他の明るい部分よりも暗い影となって見える
ことがある。一方、上記傷が例えば上記光が遮られた暗
い部分62に存在する場合(図3のB)は、傷の具合に
よってはこの傷の表面では間接光が所定の方向に反射さ
れることがある。よってこの傷を見る角度により、他の
暗い部分よりも明るく輝いて見えることがある。つま
り、同じ傷であっても、明るい部分61に存在する場合
の反射特性(図3のA)と、暗い部分62に存在する場
合の反射特性(図3のB)とで差異が生じる。
However, when there is a scratch on the surface of the object 6 to be inspected, for example, when the scratch is present in the bright portion 61 directly irradiated with the light (A in FIG. 3), this may be caused depending on the condition of the scratch. The surface of the scratch does not reflect light in a predetermined direction but reflects it in an undesired direction. Therefore, depending on the angle at which the scratch is viewed, the shadow may appear darker than other bright areas. On the other hand, when the scratch is present in the dark portion 62 where the light is blocked (B in FIG. 3), indirect light may be reflected in a predetermined direction on the surface of the scratch depending on the condition of the scratch. . Therefore, depending on the angle at which this flaw is viewed, it may appear brighter than other dark areas. That is, even with the same scratch, there is a difference between the reflection characteristic when it exists in the bright portion 61 (A in FIG. 3) and the reflection characteristic when it exists in the dark portion 62 (B in FIG. 3).

【0020】したがって、搬送装置7により被検査物6
を矢印方向に移動させると、傷の部分は明るい部分61
から暗い部分62、さらに明るい部分61へと移動し、
この間に反射特性が変わるようになり、例えば傷が影に
見えたり、輝点に見えたりするので、これを傷として識
別することができる。
Therefore, the object to be inspected 6 is conveyed by the carrier device 7.
Move in the direction of the arrow,
From the dark part 62 to the brighter part 61,
During this time, the reflection characteristic changes, and for example, the flaw looks like a shadow or looks like a bright spot, which can be identified as a flaw.

【0021】よって、このような検査方法および装置に
よれば、熟練を要することなく確実にかつ迅速に微細な
傷や凹凸、または表面に付着した異物などを見分けるこ
とができ、検査能率および精度が向上する。
Therefore, according to such an inspection method and apparatus, it is possible to surely and quickly identify fine scratches and irregularities or foreign substances adhering to the surface without requiring skill, and the inspection efficiency and accuracy are improved. improves.

【0022】なお、被検査物6の表面を検査する場合、
作業員が直接目視して検査することもできるが、モニタ
ーカメラにより上記したような被検査物6の表面の反射
具合を撮影し、これをモニターテレビに映し出して遠隔
的に検査したり、またはその画像処理により不良品を見
分けて自動的に選別するなどの手段にも応用が可能であ
る。なお、被検査物6の表面に発生される明暗の模様
は、縞模様に限らず、例えば格子模様、同心的リング模
様などであってもよい。
When inspecting the surface of the inspection object 6,
Although it is possible for an operator to directly inspect it, a monitor camera takes a picture of the reflection condition of the surface of the object 6 to be inspected as described above, and this is reflected on a monitor TV for remote inspection, or It can also be applied to means for automatically identifying defective products by image processing and automatically selecting them. The bright and dark pattern generated on the surface of the inspection object 6 is not limited to the striped pattern, and may be, for example, a lattice pattern, a concentric ring pattern, or the like.

【0023】そしてまた、光源は直管形けい光ランプに
限らず、種々のランプが使用可能であり、光拡散板4に
代わって光を平行光線にして透過させる手段であっても
実施可能である。さらにまた、被検査物6を矢印方向に
移動させる代わりに、照明装置10の全体、または制光
部材5を動かすようにしてもよい。
Further, the light source is not limited to the straight tube fluorescent lamp, various lamps can be used, and the light diffusing plate 4 can be replaced with a means for transmitting light into parallel rays. is there. Furthermore, instead of moving the inspection object 6 in the direction of the arrow, the entire illumination device 10 or the light control member 5 may be moved.

【0024】また、上記説明では、被検査物6、照明装
置10、または制光部材5を相対的に移動させるように
したが、本発明はこれに限らず、被検査物6の表面に明
暗の模様を発生させる照明装置10のみを用いてもよ
い。すなわち、上記の照明装置10では明暗の模様を発
生させることから、明るい部分には拡散しない光を照射
するようになり、この明るい部分で表面の反射が明確に
なり、表面状態を容易に判別することができる。よっ
て、被検査物6と照明装置10を相対的に移動させるこ
とには制約されない。
Further, in the above description, the object 6 to be inspected, the illuminating device 10, or the light control member 5 is moved relatively, but the present invention is not limited to this, and the surface of the object 6 to be inspected is bright or dark. It is also possible to use only the lighting device 10 that generates the pattern. That is, since the lighting device 10 produces a bright and dark pattern, the bright portion is irradiated with light that does not diffuse, and the reflection of the surface becomes clear at the bright portion, so that the surface state can be easily discriminated. be able to. Therefore, relative movement of the inspection object 6 and the illumination device 10 is not restricted.

【0025】[0025]

【発明の効果】以上説明したように本発明によれば、明
るい部分では拡散しない光が照射されるようになり、こ
の明るい部分の表面の反射具合が明確になり、表面状態
を容易に判別することができる。
As described above, according to the present invention, the light which is not diffused is irradiated in the bright portion, the reflection condition of the surface of the bright portion becomes clear, and the surface condition can be easily discriminated. be able to.

【0026】また、被検査物と照明装置を相対的に移動
させるようにした場合は、被検査物の表面の反射具合が
変化するから、例えば傷などは明るい部分で反射してい
ると、暗い部分では影になったり、逆に影になっていた
部分が光を反射する等のように変化し、よって熟練を要
することなく確実にかつ迅速に微細な傷や凹凸、または
表面に付着した異物などを見分けることができ、検査能
率および精度が向上する。
When the object to be inspected and the illuminating device are moved relative to each other, the degree of reflection on the surface of the object to be inspected changes. Part of the shadow changes, or conversely, the part that is in shadow changes such as reflecting light, so that it is possible to reliably and quickly perform fine scratches or irregularities without admitting skill, or foreign matter attached to the surface. It is possible to distinguish the above, and the inspection efficiency and accuracy are improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例を示す光学的表面検査装置の
概略的構成図。
FIG. 1 is a schematic configuration diagram of an optical surface inspection apparatus showing an embodiment of the present invention.

【図2】同実施例の作用を説明する図。FIG. 2 is a view for explaining the operation of the embodiment.

【図3】同実施例の原理を説明する図。FIG. 3 is a view for explaining the principle of the same embodiment.

【符号の説明】[Explanation of symbols]

1…ランプハウゾング 3…直管形けい光ラ
ンプ 4…光拡散板 5…制光部材 6…被検査物 7…搬送装置 10…照明装置 51…制光部材の光透過部 52…制光部材の遮
光部 61…被検査物の明るく照らされた部分 62…被検査物の暗い部分
1 ... Lamp Hauzong 3 ... Straight tube type fluorescent lamp 4 ... Light diffusing plate 5 ... Light control member 6 ... Inspected object 7 ... Conveying device 10 ... Illumination device 51 ... Light transmitting part 52 of light control member ... Light control member Light-shielding portion 61 ... Brightly illuminated portion of the inspection object 62 ... Dark portion of the inspection object

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 被検査物の表面に光を照射してこの表面
の反射具合で表面状態を検査する装置において、 上記被検査物の表面に光を照射する照明装置は、上記表
面を明るく照らす部分と、この明るい部分より暗くした
部分とを交互に発生させて明暗模様を生じさせることを
特徴とする光学的表面検査装置。
1. An apparatus for irradiating light on the surface of an object to be inspected and inspecting the surface condition according to the reflection of the surface, wherein an illuminating device for irradiating light to the surface of the object to be inspected illuminates the surface brightly. An optical surface inspection device characterized in that bright and dark patterns are produced by alternately generating portions and portions darkened from the bright portions.
【請求項2】 被検査物の表面に光を照射し、明るく照
らす部分と、この明るい部分より暗くした部分とを交互
に発生させて明暗模様を生じさせる照明装置と、 上記被検査物の表面に生じる明暗模様を上記被検査物の
表面に沿って移動させるため、上記照明装置および被検
査物の少なくともいづれか一方を移動させる手段と、 を具備したことを特徴とする光学的表面検査装置。
2. An illumination device for illuminating a surface of an object to be inspected with light so as to alternately generate a portion that is illuminated brightly and a portion that is darker than the bright portion, and a surface of the object to be inspected. An optical surface inspection apparatus comprising: a means for moving at least one of the illumination device and the object to be inspected so as to move the bright and dark pattern generated on the object along the surface of the object to be inspected.
【請求項3】 上記照明装置は、 被検査物の表面に光を照射するランプと、 このランプと上記被検査物との間に設けられ、上記ラン
プから出た光を透過させて上記被検査物の表面に明るい
部分を発生させる光透過部および上記ランプから出た光
を遮光して被検査物の表面に暗い部分を生じさせる遮光
部とを交互に設けた制光部材と、 を具備したことを特徴とする請求項1または請求項2に
記載の光学的表面検査装置。
3. The illumination device is provided between a lamp for irradiating the surface of an object to be inspected with light, and between the lamp and the object to be inspected, and transmits the light emitted from the lamp to inspect the object to be inspected. And a light-shielding member alternately provided with a light-transmitting portion that generates a bright portion on the surface of the object and a light-shielding portion that shields the light emitted from the lamp to generate a dark portion on the surface of the object to be inspected. The optical surface inspection apparatus according to claim 1 or 2, wherein:
【請求項4】 上記ランプと制光部材との間に、ランプ
から出た光を拡散する拡散板を設けたことを特徴とする
請求項3に記載の光学的表面検査装置。
4. The optical surface inspection device according to claim 3, further comprising a diffusion plate provided between the lamp and the light control member for diffusing light emitted from the lamp.
【請求項5】 被検査物の表面に、光を直接当てて明る
くなる部分と、光を遮断して影をつくることにより暗く
なる部分とを交互に発生させ、この光の明暗による模様
の部分を上記被検査物の表面上で相対的に移動させるこ
とにより、この被検査物の表面の反射具合を変化させて
この反射の変化により表面状態を調べるようにしたこと
を特徴とする光学的表面検査方法。
5. The surface of the object to be inspected is alternately generated with a portion which becomes bright by directly shining light and a portion which becomes dark by blocking light to form a shadow, and a portion of a pattern due to light and dark of this light. Is relatively moved on the surface of the object to be inspected, thereby changing the reflection condition of the surface of the object to be inspected, and the surface state is examined by the change in the reflection. Inspection method.
JP1555393A 1993-02-02 1993-02-02 Optical apparatus and method for inspecting surface Pending JPH06229944A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1555393A JPH06229944A (en) 1993-02-02 1993-02-02 Optical apparatus and method for inspecting surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1555393A JPH06229944A (en) 1993-02-02 1993-02-02 Optical apparatus and method for inspecting surface

Publications (1)

Publication Number Publication Date
JPH06229944A true JPH06229944A (en) 1994-08-19

Family

ID=11891965

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1555393A Pending JPH06229944A (en) 1993-02-02 1993-02-02 Optical apparatus and method for inspecting surface

Country Status (1)

Country Link
JP (1) JPH06229944A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008256610A (en) * 2007-04-06 2008-10-23 Nikon Corp Observation apparatus
CN111272761A (en) * 2018-12-04 2020-06-12 株式会社小糸制作所 Method and apparatus for inspecting surface defect of light-transmitting member

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008256610A (en) * 2007-04-06 2008-10-23 Nikon Corp Observation apparatus
CN111272761A (en) * 2018-12-04 2020-06-12 株式会社小糸制作所 Method and apparatus for inspecting surface defect of light-transmitting member

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