JPH06215222A - Shape discriminating device for metal chip - Google Patents

Shape discriminating device for metal chip

Info

Publication number
JPH06215222A
JPH06215222A JP5004408A JP440893A JPH06215222A JP H06215222 A JPH06215222 A JP H06215222A JP 5004408 A JP5004408 A JP 5004408A JP 440893 A JP440893 A JP 440893A JP H06215222 A JPH06215222 A JP H06215222A
Authority
JP
Japan
Prior art keywords
metal piece
peak
waveform
shape
coin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5004408A
Other languages
Japanese (ja)
Inventor
Mitsuhiro Nakamura
光宏 中村
Takahiro Suzuki
孝宏 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP5004408A priority Critical patent/JPH06215222A/en
Publication of JPH06215222A publication Critical patent/JPH06215222A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To make it possible to identify thinner shapes such as surface ruggedness and holes in addition to the judgement of quality, thickness and size based upon the convensional peak detection of a waveform outputted from a detection circuit in the case of identifying a metal chip such as a coin by a coil sensor. CONSTITUTION:A feature extraction value (Va1-Vb1)X(Tb1-Ta1)<1/2> or the like obtained by differentiating an output waveform 19 outputted from a detection circuit 14 by a differential circuit 72 and correcting the number of peaks or a level difference between a peak and a trough in a differential waveform 23 by a metal chip passing speed is compared with a corresponding feature value stored in a memory 12 by a microcomputer 11, or the peak part of the waveform 19 is extracted and expanded through a peak expanding circuit 73 and the numbers of peaks and troughs, a level difference between a peak and a trough, the time width of a trough, etc., are extracted and compared with feature data stored in the memory 12.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は自動販売機などで使用さ
れる硬貨選別装置のように、コイルセンサを使用して金
属片の形状を識別する装置に関する。なお以下各図にお
いて同一の符号は同一もしくは相当部分を示す。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for identifying the shape of a metal piece using a coil sensor, such as a coin sorting apparatus used in a vending machine. In the drawings below, the same reference numerals indicate the same or corresponding parts.

【0002】[0002]

【従来の技術】金属片識別装置として応用されている硬
貨選別装置に関して従来の技術を述べる。図1は従来の
硬貨選別装置のセンサ部分の原理的な構造の一例を示す
断面図である。即ち図1のように硬貨1より径が小さい
フェライトコア2にコイル3を入れたものを金属片通路
4の壁面に取り付け、センサとして使用している。この
センサは交番磁界を発生している。この硬貨選別装置は
硬貨1の特徴、例えば材質・大きさ・厚さなどを抽出す
る。このためセンサはこのそれぞれの特徴に対して1つ
ずつ配置され、それぞれ別々の検出回路に接続されてい
る。これらのセンサは金属片の片面や両面側に配置さ
れ、その接続方式(同相、逆相)や検出回路方式が異な
るものが使用されている。
2. Description of the Related Art A conventional technique for a coin sorting device applied as a metal piece identifying device will be described. FIG. 1 is a sectional view showing an example of a principle structure of a sensor portion of a conventional coin sorting device. That is, as shown in FIG. 1, a ferrite core 2 having a diameter smaller than that of a coin 1 and a coil 3 inserted therein is attached to the wall surface of the metal piece passage 4 and used as a sensor. This sensor produces an alternating magnetic field. This coin sorting device extracts characteristics of the coin 1, for example, material, size and thickness. For this reason, one sensor is arranged for each of these features, and each sensor is connected to a separate detection circuit. These sensors are arranged on one side or both sides of the metal piece, and those having different connection methods (in-phase and anti-phase) and detection circuit methods are used.

【0003】図2は図1のセンサの回路(波形検出回
路)と出力波形の説明図である。図2において15は図
1に述べたコイルセンサ、16はコンデンサとアクティ
ブ素子からなる回路、17は包絡線検波回路である。即
ちコイルセンサ15はコンデンサとアクティブ素子16
と組合わされて発振回路13を構成している。このとき
コイルセンサ15の発生する交番磁界は、硬貨1が硬貨
通路4を通りセンサの間を通過することによって変化す
る。その交番磁界は検出回路14で電圧に変換される
が、硬貨の通過時には減衰し、発振波形18のようにな
る。その振幅を包絡線波回路17で検波・平滑すること
で硬貨の特徴を有した出力波形19が取り出される。
FIG. 2 is an explanatory diagram of the circuit (waveform detection circuit) and output waveform of the sensor of FIG. In FIG. 2, 15 is the coil sensor described in FIG. 1, 16 is a circuit composed of a capacitor and an active element, and 17 is an envelope detection circuit. That is, the coil sensor 15 includes a capacitor and an active element 16
The oscillator circuit 13 is configured in combination with the above. At this time, the alternating magnetic field generated by the coil sensor 15 changes as the coin 1 passes through the coin passage 4 and between the sensors. The alternating magnetic field is converted into a voltage by the detection circuit 14, but is attenuated when a coin passes, and becomes an oscillating waveform 18. An output waveform 19 having the characteristics of a coin is taken out by detecting and smoothing the amplitude by the envelope wave circuit 17.

【0004】図3は硬貨の識別方法の説明図である。図
3のメモリ12には図2で述べた検出回路14の異なる
組から夫々得られる選別したい硬貨の波形のピーク値デ
ータ63が予め記憶されている。3組の検出回路14は
或る硬貨の通過に対して夫々波形19a,19b,19
cを出力する。マイコン11は各出力波形19a,19
b,19cの電圧値をサンプリングし、電圧のピーク値
V1,V2,V3を検出する。そしてメモリ12にある
各硬貨のピーク値データ63と1つずつ比較する。この
ときサンプリングした電圧ピーク値V1,V2,V3
が、夫々硬貨Aについての対応する記憶ピーク値データ
a,b,cと同じかまたは誤差範囲内にあった場合、被
判別硬貨1を硬貨Aであると判別する。
FIG. 3 is an explanatory diagram of a coin identifying method. In the memory 12 of FIG. 3, peak value data 63 of the waveform of coins to be selected, which are respectively obtained from different sets of the detection circuit 14 described in FIG. 2, are stored in advance. The three sets of detection circuits 14 have waveforms 19a, 19b, 19 for the passage of a coin, respectively.
Output c. The microcomputer 11 outputs each output waveform 19a, 19
The voltage values of b and 19c are sampled, and the peak values V1, V2 and V3 of the voltage are detected. Then, it compares the peak value data 63 of each coin in the memory 12 one by one. Voltage peak values V1, V2, V3 sampled at this time
However, if the corresponding stored peak value data a, b, c for the coin A is within the same range or within the error range, the discriminated coin 1 is discriminated as the coin A.

【0005】[0005]

【発明が解決しようとする課題】しかしながら図2の検
出回路で検出される電圧のピーク値は硬貨の材質・大き
さ・厚さなどを表すもので硬貨1の表面の細部形状の特
性を表すものではなかった。そのため模様や縁の形状は
違っているが材質・大きさ・厚さが似ている硬貨を誤選
別することがあった。
However, the peak value of the voltage detected by the detection circuit of FIG. 2 represents the material, size, thickness, etc. of the coin, and represents the characteristics of the detailed shape of the surface of the coin 1. Was not. As a result, coins with similar patterns, edges, and similar material, size, and thickness were sometimes mistakenly selected.

【0006】そこで本発明は上記問題点である材質・大
きさ・厚さが似ているが、模様や縁の形状が異なる金属
片を選別可能にする金属片の形状識別装置を提供するこ
とを課題とする。
Therefore, the present invention is to provide a metal piece shape identifying device capable of selecting metal pieces which are similar in material, size and thickness, but have different patterns and edge shapes, which are the above problems. It is an issue.

【0007】[0007]

【課題を解決するための手段】前記の課題を解決するた
めに、請求項1の形状識別装置は、高周波の交番磁界を
少なくとも金属片(1Aなど)が通過する通路(硬貨通
路4など)に生成するコイルセンサ(15など)と、前
記コイルセンサの出力を検波平滑化し、この出力波形の
包絡線を表す平滑化信号(出力波形19など)を出力す
る手段(検出回路14など)とを備え、前記金属片の通
過に伴う前記平滑化信号のピーク値から前記金属片の性
質を識別する識別装置において、さらに前記平滑化信号
を微分演算する手段(微分回路72など)を備え、前記
金属片の表面の凹凸等の特徴を識別するようにする。
In order to solve the above-mentioned problems, the shape identifying apparatus of claim 1 provides a high-frequency alternating magnetic field to a passage (such as a coin passage 4) through which at least a metal piece (such as 1A) passes. A coil sensor (15 or the like) to be generated and means (detection circuit 14 or the like) for detecting and smoothing the output of the coil sensor and outputting a smoothed signal (output waveform 19 or the like) representing the envelope of the output waveform. In the identification device for identifying the property of the metal piece from the peak value of the smoothed signal accompanying the passage of the metal piece, a means (differential circuit 72 etc.) for differentiating the smoothed signal is further provided, Features such as irregularities on the surface of are identified.

【0008】また請求項2の形状識別装置は、請求項1
に記載の形状識別装置において、前記金属片の通過速度
の違いを吸収するために、通過時間または通過時間の平
方根で前記の演算した微分信号を正規化するようにす
る。また請求項3の形状識別装置は、請求項1または請
求項2に記載の形状識別装置において、前記金属片を硬
貨(1など)とし、前記微分信号波形の山および谷のピ
ーク点を検出してこの金属片に関わる特徴データを抽出
するようにする。
The shape identification device of claim 2 is the same as that of claim 1.
In the shape identifying apparatus described in (1), in order to absorb the difference in the passing speed of the metal piece, the calculated differential signal is normalized by the passing time or the square root of the passing time. A shape identifying apparatus according to claim 3 is the shape identifying apparatus according to claim 1 or 2, wherein the metal piece is a coin (1 or the like) and peak points of peaks and valleys of the differential signal waveform are detected. Feature data related to the lever metal piece is extracted.

【0009】また請求項4の形状識別装置は、高周波の
交番磁界を少なくとも金属片(1Aなど)が通過する通
路(硬貨通路4など)に生成するコイルセンサ(15な
ど)と、前記コイルセンサの出力を検波平滑化し、この
出力波形の包絡線を表す平滑化信号(出力波形19な
ど)を出力する手段(検出回路14など)とを備え、前
記金属片の通過に伴う前記平滑化信号の山および谷のピ
ーク点を検出して前記金属片の形状を識別するようにす
る。
Further, the shape identifying device according to claim 4 is a coil sensor (15 or the like) for generating a high frequency alternating magnetic field in a passage (the coin passage 4 or the like) through which at least a metal piece (1A or the like) passes, and the coil sensor. Means for detecting and smoothing the output and outputting a smoothed signal (such as the output waveform 19) representing the envelope of the output waveform, the peak of the smoothed signal accompanying the passage of the metal piece. And the peak point of the valley is detected to identify the shape of the metal piece.

【0010】また請求項5の形状識別装置は、請求項4
に記載の形状識別装置において前記金属片を硬貨(1な
ど)とする。
The shape identifying device of claim 5 is the same as that of claim 4.
In the shape identifying device described in (1), the metal piece is a coin (1 or the like).

【0011】[0011]

【作用】[Action]

(1)微分方式の場合:従来技術で説明した図2のコイ
ルセンサ15と検出回路14を用いて得られる出力波形
19を微分演算すると、単位時間当りの電圧レベルの変
化量を検出できるため、金属片の細部形状、表面の凹凸
による特徴が大きく表れる。
(1) Differentiation method: When the output waveform 19 obtained using the coil sensor 15 and the detection circuit 14 of FIG. 2 described in the prior art is differentiated, the amount of change in the voltage level per unit time can be detected. The features due to the detailed shape of the metal piece and the unevenness of the surface are greatly shown.

【0012】図4は金属片の通過速度の遅速に夫々対応
する出力波形19やその微分波形を比較したものであ
る。ここで19−1と19−2は夫々硬貨の通過速度の
遅い場合と速い場合に図2の検出回路14から出力され
る波形19に対応し、23−1,23−2は夫々波形1
9−1,19−2の微分波形である。即ち出力波形19
−1,19−2のレベルは硬貨通過速度(従って通過時
間20−1,20−2)によって変化はしないが微分波
形のレベルは金属片がセンサの間を通過する速度によっ
て異なり、速度が遅い場合は微分波形23−1のように
レベルは低くなり、通過速度が速い場合は微分波形23
−2のようにレベルは高くなる。本発明ではこの微分波
形23−1,23−2を通過時間20−1,20−2で
演算して正規化後の微分波形25−1,25−2のよう
な、通過速度によらない一定の波形を得るように正規化
する。この正規化された波形は金属片の細部形状と表面
の特徴によってのみ異なる。この特徴を利用することで
金属片の種類を識別する。
FIG. 4 is a comparison of the output waveform 19 and its differential waveform corresponding to the slow speed of passage of the metal piece. Here, 19-1 and 19-2 correspond to the waveform 19 output from the detection circuit 14 of FIG. 2 when the coin passing speed is slow and fast, respectively, and 23-1, 23-2 are waveform 1 respectively.
9-1 and 19-2 are differential waveforms. That is, the output waveform 19
The levels of -1, 19-2 do not change depending on the coin passing speed (thus the passing times 20-1, 20-2), but the level of the differential waveform differs depending on the speed at which the metal piece passes between the sensors, and the speed is slow. In this case, the level becomes low like the differential waveform 23-1, and when the passing speed is fast, the differential waveform 23
The level becomes higher like -2. In the present invention, the differential waveforms 23-1 and 23-2 are calculated with the passage times 20-1 and 20-2, and are constant regardless of the passage speed like the normalized differential waveforms 25-1 and 25-2. Normalize to obtain the waveform of. This normalized corrugation depends only on the detailed shape of the metal piece and the surface features. The type of metal piece is identified by utilizing this feature.

【0013】(2)ビーク形状方法の場合:従来技術で
説明した図2のコイルセンサ15と検出回路14から得
られる出力波形19のピーク部の拡大波形は、金属片の
表面の情報を表しており、金属表面が深く彫られていれ
ばその部分での出力信号は低下し、金属表面が出っぱっ
ていればその部分での出力波形は増大する。この出力信
号は金属表面の細かな模様というより、センサの面積に
対して平均化した表面情報を表す。この例を図5に示
す。図5において29は出力波形19をしきい値Vth
で切取ったピーク部分の拡大波形である。このように、
ピーク部波形29の凹凸は金属片の形状、表面の凹凸に
対応して変化する。この波形の特徴を利用することで金
属片の種類を識別する。
(2) In the case of the beak shape method: The enlarged waveform of the peak portion of the output waveform 19 obtained from the coil sensor 15 and the detection circuit 14 of FIG. 2 described in the prior art represents information on the surface of the metal piece. However, if the metal surface is deeply carved, the output signal at that portion decreases, and if the metal surface is exposed, the output waveform at that portion increases. This output signal represents surface information averaged over the area of the sensor rather than a fine pattern on the metal surface. An example of this is shown in FIG. In FIG. 5, 29 indicates the output waveform 19 as the threshold value Vth.
It is an enlarged waveform of the peak part cut out in. in this way,
The unevenness of the peak waveform 29 changes in accordance with the shape of the metal piece and the unevenness of the surface. The type of metal piece is identified by utilizing the characteristics of this waveform.

【0014】[0014]

【実施例】図6は本発明の実施例としての構成を示すブ
ロック回路図である。本発明では図2で述べた検出回路
14のほかに、この検出回路14の出力19を微分する
微分回路72およびピーク拡大回路73が設けられ、こ
れら検出回路14,微分回路72,ピーク拡大回路73
の出力をマイコン11が入力して金属片1Aの判定処理
を行う。なお11Aはマイコン11の本発明に関わる主
要機能部としての判定処理手段である。なお1Aは識別
対象の硬貨等の金属片である。
FIG. 6 is a block circuit diagram showing a configuration as an embodiment of the present invention. In the present invention, in addition to the detection circuit 14 described in FIG. 2, a differentiation circuit 72 and a peak expansion circuit 73 for differentiating the output 19 of the detection circuit 14 are provided, and the detection circuit 14, the differentiation circuit 72 and the peak expansion circuit 73 are provided.
The microcomputer 11 inputs the output of 1 to perform the determination process of the metal piece 1A. Note that 11A is a determination processing means as a main function part of the microcomputer 11 related to the present invention. Note that 1A is a metal piece such as a coin to be identified.

【0015】図7,図8,図9は夫々図6の検出回路1
4,微分回路72,ピーク拡大回路73の具体回路の実
施例を示す。図7の検出回路14は図2で述べたものと
構成は同じである。即ち逆相に組まれているコイルセン
サ15を含む発振回路13と包絡線検波回路17から構
成されている。以下に微分処理した場合と波形のピーク
形状処理をした場合の金属片1A特徴計算について説明
する。
FIGS. 7, 8 and 9 show the detection circuit 1 of FIG. 6, respectively.
4, an embodiment of specific circuits of the differentiating circuit 72 and the peak expanding circuit 73 will be shown. The detection circuit 14 in FIG. 7 has the same configuration as that described in FIG. That is, it is composed of an oscillating circuit 13 including a coil sensor 15 and a envelope detecting circuit 17 which are assembled in reverse phase. The feature calculation of the metal piece 1A when the differential processing is performed and when the waveform peak shape processing is performed will be described below.

【0016】(1)微分方式の場合:前述のように微分
回路72は金属片1Aの通過で得られた出力波形19を
微分し、マイコン11に出力する。マイコン11は、微
分波形から金属片1Aの形状の特徴を抽出し、予めメモ
リ12に記憶した金属片1Aの対応する特徴データと比
較し、データが同じかまたは誤差範囲内にあるかどうか
で金属片1Aを識別する。
(1) In the case of the differentiation method: As described above, the differentiation circuit 72 differentiates the output waveform 19 obtained by passing the metal piece 1A and outputs it to the microcomputer 11. The microcomputer 11 extracts the feature of the shape of the metal piece 1A from the differential waveform, compares it with the corresponding feature data of the metal piece 1A stored in the memory 12 in advance, and determines whether the data is the same or within the error range. Identify piece 1A.

【0017】次にマイコン11が実行する微分波形23
からの特徴の抽出方法について述べる。金属片1Aを硬
貨とした場合、検出回路14の出力波形19を微分する
と図10の波形23ようになり、金属片1Aの端部に起
因する特徴が生じ、十側に谷Bを挟むA,Cの2山、一
側に谷Eを挟むD,Fの2山が発生することになる。こ
の山は前述のように金属片1Aの通過速度によって大き
さが変わるが、補正すれば特徴として抽出できる。ここ
で補正方法として金属片1Aの通過時間20,または通
過時間の平方根で演算する方法を用いる。
Next, the differential waveform 23 executed by the microcomputer 11
The method of extracting features from is described. When the metal piece 1A is a coin, the output waveform 19 of the detection circuit 14 is differentiated to obtain a waveform 23 in FIG. 10, which has a characteristic attributed to the end of the metal piece 1A and has a valley B on the ten side. Two peaks of C and two peaks of D and F sandwiching the valley E on one side are generated. As described above, this mountain changes in size depending on the passing speed of the metal piece 1A, but can be extracted as a feature if corrected. Here, as the correction method, a method of calculating the passage time 20 of the metal piece 1A or the square root of the passage time is used.

【0018】次式(1)〜(4)で示される微分特徴値
DF1〜DF4は硬貨形状の特徴抽出に利用可能な特徴
値の例である。
The differential feature values DF1 to DF4 represented by the following equations (1) to (4) are examples of feature values that can be used for feature extraction of coin shapes.

【0019】[0019]

【数1】 微分特徴値 DF1=(Va1−Vb1)×(Tb1−Ta1)………(1) 微分特徴値 DF2=(Vc1−Vb1)×(Tc1−Tb1)………(2) 微分特徴値 DF3=(Va1−Vb1)×(Tb1−Ta11/2 …(3) 微分特徴値 DF4=(Vc1−Vb1)×(Tc1−Tb11/2 …(4) 但し Va1:山Aのピーク値(最大値) Vb1:谷Bのピーク値(最小値) Vc1:山Cのピーク値(最大値) Ta1:Va1の検出時間 Tb1:Vb1の検出時間 Tc1:Vc1の検出時間 なお式(3),(4)のように平方根で補正するのは、
実験的に最も安定した信号が得られたことを理由に本発
明で提案するものである。
[Formula 1] Differential feature value DF1 = (V a1 −V b1 ) × (T b1 −T a1 ) ... (1) Differential feature value DF2 = (V c1 −V b1 ) × (T c1 −T b1 ). … (2) Differential feature value DF3 = (V a1 −V b1 ) × (T b1 −T a1 ) 1/2 (3) Differential feature value DF4 = (V c1 −V b1 ) × (T c1 − T b1 ) 1/2 (4) where V a1 : Peak value of peak A (maximum value) V b1 : Peak value of valley B (minimum value) V c1 : Peak value of peak C (maximum value) T a1 : Detection time of V a1 T b1 : Detection time of V b1 T c1 : Detection time of V c1 Correction by the square root as in equations (3) and (4)
This is proposed in the present invention because the most stable signal is obtained experimentally.

【0020】これらの計算を用いることで金属片1Aの
形状の特徴を補正抽出し、金属片1Aを選別する。な
お、金属片1の形状の凹凸が激しく、微分波形に大きな
特徴があればVa1,Vb1,Vc1をそのまま利用して金属
片1Aを選別することも可能である。そのほか図6に示
すように微分波形23中の山の数や、山と谷のレベル差
a1−Vb1なども特徴値として利用できる可能性があ
る。
By using these calculations, the characteristic of the shape of the metal piece 1A is corrected and extracted, and the metal piece 1A is selected. If the shape of the metal piece 1 is highly uneven and the differential waveform has a great feature, it is possible to select the metal piece 1A using V a1 , V b1 , and V c1 as they are. In addition, as shown in FIG. 6, the number of peaks in the differential waveform 23, the level difference between peaks and valleys V a1 −V b1, and the like may be used as feature values.

【0021】(2)ピーク形状方式の場合:ピーク拡大
回路73は金属片1Aの通過で得られた出力波形19の
ピークを増幅し、ピーク拡大波形29をマイコン11に
出力する。マイコン11はピーク波形の形状から金属片
1Aの形状の特徴を抽出し、予めメモリ12に記憶した
金属片1Aの特徴データと比較し、データが同じかまた
は誤差範囲内にあるかどうかで金属片1Aを識別する。
次にマイコン11によるピーク波形からの特徴抽出方法
について述べる。
(2) In case of the peak shape method: The peak expanding circuit 73 amplifies the peak of the output waveform 19 obtained by passing the metal piece 1A and outputs the peak expanding waveform 29 to the microcomputer 11. The microcomputer 11 extracts the characteristic of the shape of the metal piece 1A from the shape of the peak waveform, compares it with the characteristic data of the metal piece 1A stored in the memory 12 in advance, and determines whether the data is the same or within the error range. Identify 1A.
Next, a method of extracting a feature from the peak waveform by the microcomputer 11 will be described.

【0022】図11は金属片を硬貨とした場合における
検出回路14の出力波形19のピークをスレッショルド
電圧Vth34で切取って反転増幅したピーク拡大波形
29を示す。このピーク波形29は金属片1Aの形状を
表しており金属片1Aが平らであれば図11の極値B,
C,Dも凹まずに平になり、金属片1Aに凹凸があれば
極値B,C,Dも、その形状にあわせて凹凸となる。一
般にその信号は円形の金属片、例えば硬貨などでは巨視
的に見ると同心円状に均一に模様が配置されていること
が多いので、ピーク波形29も中央が凹み、その周囲が
出っぱる波形になる。なお、もし金属片の中央に穴など
があれば中央の凹みは更に大きく硬貨に特有なものとな
り、外形の影響も見ることができる。また、図11の波
形の谷Bと谷Dの幅Td2−Tb2は金属片の凹凸の間隔を
表している。ただし、時間は金属片の通過速度によって
変化するため有効時間31(=Te2−Ta2)を金属片の
大きさで補正することによって抽出できる。なお金属片
の大きさは従来のピークレベル方式によって検出するこ
とができる。補正式は次式(5)のようになる。
FIG. 11 shows a peak expansion waveform 29 in which the peak of the output waveform 19 of the detection circuit 14 when the metal piece is a coin is cut at the threshold voltage Vth34 and inverted and amplified. This peak waveform 29 represents the shape of the metal piece 1A. If the metal piece 1A is flat, the extreme value B in FIG.
C and D also become flat without recessing, and if the metal piece 1A has unevenness, the extreme values B, C, and D also become uneven according to the shape. Generally, in the case of a circular metal piece, for example, a coin, a pattern is often arranged in a concentric uniform pattern when viewed macroscopically. Therefore, the peak waveform 29 also has a concave shape in the center and a peripheral shape. Become. If there is a hole in the center of the metal piece, the dent in the center becomes larger and is peculiar to coins, and the influence of the outer shape can be seen. Further, the width T d2 −T b2 between the valley B and the valley D of the waveform in FIG. 11 represents the interval between the irregularities of the metal piece. However, since the time changes depending on the passing speed of the metal piece, it can be extracted by correcting the effective time 31 (= T e2 −T a2 ) with the size of the metal piece. The size of the metal piece can be detected by the conventional peak level method. The correction formula is as shown in the following formula (5).

【0023】[0023]

【数2】金属片の凹凸の間隔=(Td2−Tb2)×(金属
片の大きさ)/(有効時間31)……(5) このように金属片の形状により色々な波形が得られるの
で山の数,山と谷のレベル差、谷の時間的幅などの情報
を抽出することで金属片の表面形状の差異を検出するこ
とができる。
[Equation 2] Interval of unevenness of metal piece = (T d2 −T b2 ) × (size of metal piece) / (effective time 31) (5) As described above, various waveforms are obtained depending on the shape of the metal piece. Therefore, the difference in the surface shape of the metal piece can be detected by extracting the information such as the number of peaks, the level difference between peaks and valleys, and the temporal width of valleys.

【0024】[0024]

【発明の効果】本発明によれば、コイルセンサの出力を
検波平滑化し、この出力波形の包絡線を示す平滑化信号
を求めそのピーク値から硬貨等の金属片を識別する装置
において、さらに前記平滑化信号を微分演算してなる信
号あるいは前記平滑化信号の山および谷を検出して金属
片の、より細かな特徴を抽出するようにし、また必要に
応じこの抽出データに金属片の移動速度の補正を施する
ようにしたので、従来のピーク値検出のみでは検出でき
なかった金属片の細部の形状が識別でき、金属片の選別
がより正確になり、様々な形の金属片の選別ができる。
According to the present invention, the output of the coil sensor is detected and smoothed, a smoothed signal indicating the envelope of the output waveform is obtained, and a metal piece such as a coin is identified from the peak value thereof. A signal obtained by differentiating the smoothed signal or peaks and valleys of the smoothed signal is detected to extract finer features of the metal piece, and if necessary, the moving speed of the metal piece is included in the extracted data. Since the correction of is performed, it is possible to identify the detailed shape of the metal piece that could not be detected only by conventional peak value detection, the selection of metal pieces becomes more accurate, and the selection of metal pieces of various shapes can be performed. it can.

【図面の簡単な説明】[Brief description of drawings]

【図1】コイルセンサ部の原理的な構造の1例を示す断
面図
FIG. 1 is a cross-sectional view showing an example of the principle structure of a coil sensor unit.

【図2】コイルセンサ回路は出力波形を示す図FIG. 2 is a diagram showing an output waveform of a coil sensor circuit.

【図3】硬貨識別方法の説明図FIG. 3 is an explanatory diagram of a coin identifying method.

【図4】金属片の通過速度の違いに対応するコイルセン
サ出力の微分波形を示す図
FIG. 4 is a diagram showing a differential waveform of a coil sensor output corresponding to a difference in passing speed of metal pieces.

【図5】コイルセンサ出力のピーク拡大波形を示す図FIG. 5 is a diagram showing a peak expansion waveform of a coil sensor output.

【図6】本発明の実施例としての機能構成図FIG. 6 is a functional configuration diagram as an embodiment of the present invention.

【図7】同じく検出回路の具体回路図FIG. 7 is a concrete circuit diagram of the detection circuit.

【図8】同じく微分回路の具体回路図FIG. 8 is a concrete circuit diagram of the differentiating circuit.

【図9】同じくピーク拡大回路の具体回路図FIG. 9 is a concrete circuit diagram of the peak expansion circuit.

【図10】同じく微分波形の詳細図FIG. 10 is a detailed diagram of the differential waveform as well.

【図11】同じくピーク拡大波形の詳細図FIG. 11 is a detailed diagram of a peak expansion waveform.

【符号の説明】[Explanation of symbols]

1 硬貨 1A 金属片 2 フェライトコア 3 コイル 4 硬貨通路 11 マイコン 11A 判定処理手段 12 メモリ 13 発振回路 14 検出回路 15 コイルセンサ 17 包絡線検波回路 19(19a〜19c,19−1,19−2)出力波形 20(20−1,20−2)硬貨通過時間 23 微分波形 29 ピーク拡大波形 31 有効時間 63 ピーク値データ 72 微分回路 73 ピーク拡大回路 1 Coin 1A Metal Piece 2 Ferrite Core 3 Coil 4 Coin Passage 11 Microcomputer 11A Judgment Processing Means 12 Memory 13 Oscillation Circuit 14 Detection Circuit 15 Coil Sensor 17 Envelope Detection Circuit 19 (19a-19c, 19-1, 19-2) Output Waveform 20 (20-1, 20-2) Coin transit time 23 Differential waveform 29 Peak expansion waveform 31 Effective time 63 Peak value data 72 Differentiation circuit 73 Peak expansion circuit

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】高周波の交番磁界を少なくとも金属片が通
過する通路に生成するコイルセンサと、前記コイルセン
サの出力を検波平滑化し、この出力波形の包絡線を表す
平滑化信号を出力する手段とを備え、前記金属片の通過
に伴う前記平滑化信号のピーク値から前記金属片の性質
を識別する識別装置において、 さらに前記平滑化信号を微分演算する手段を備え前記金
属片の表面の凹凸等の特徴を識別するようにしたことを
特徴とする金属片の形状識別装置。
1. A coil sensor for generating a high-frequency alternating magnetic field in a passage through which at least a metal piece passes, and means for detecting and smoothing an output of the coil sensor and outputting a smoothed signal representing an envelope of the output waveform. In the identification device for identifying the property of the metal piece from the peak value of the smoothed signal accompanying the passage of the metal piece, further comprising means for differentiating the smoothed signal, and the like on the surface of the metal piece. A shape identification device for a metal piece, characterized in that the features of the metal piece are identified.
【請求項2】請求項1に記載の形状識別装置において、 前記金属片の通過速度の違いを吸収するために、通過時
間または通過時間の平方根で前記の演算した微分信号を
正規化することを特徴とする金属片の形状識別装置。
2. The shape identifying apparatus according to claim 1, wherein in order to absorb a difference in passing speed of the metal piece, the differential signal calculated as above is normalized by a passing time or a square root of the passing time. Characteristic shape identification device for metal pieces.
【請求項3】請求項1または請求項2に記載の形状識別
装置において、前記金属片を硬貨とし、前記微分信号波
形の山および谷のピーク点を検出してこの金属片に関わ
る特徴データを抽出するようにしたことを特徴とする金
属片の形状識別装置。
3. The shape identifying apparatus according to claim 1 or 2, wherein the metal piece is a coin, peak points of peaks and valleys of the differential signal waveform are detected, and characteristic data relating to the metal piece is detected. A shape identifying device for a metal piece, characterized by being extracted.
【請求項4】高周波の交番磁界を少なくとも金属片が通
過する通路に生成するコイルセンサと、前記コイルセン
サの出力を検波平滑化し、この出力波形の包絡線を表す
平滑化信号を出力する手段とを備え、前記金属片の通過
に伴う前記平滑化信号の山および谷のピーク点を検出し
て前記金属片の形状を識別するようにしたことを特徴と
する金属片の形状識別装置。
4. A coil sensor for generating a high frequency alternating magnetic field in a passage through which at least a metal piece passes, and means for detecting and smoothing an output of the coil sensor and outputting a smoothed signal representing an envelope of the output waveform. A shape identifying device for a metal piece, comprising: a peak of a peak and a valley of the smoothed signal when the metal piece passes; and the shape of the metal piece is identified.
【請求項5】請求項4に記載の形状識別装置において前
記金属片を硬貨としたことを特徴とする金属片の形状識
別装置。
5. The shape identifying device for a metal piece according to claim 4, wherein the metal piece is a coin.
JP5004408A 1993-01-14 1993-01-14 Shape discriminating device for metal chip Pending JPH06215222A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5004408A JPH06215222A (en) 1993-01-14 1993-01-14 Shape discriminating device for metal chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5004408A JPH06215222A (en) 1993-01-14 1993-01-14 Shape discriminating device for metal chip

Publications (1)

Publication Number Publication Date
JPH06215222A true JPH06215222A (en) 1994-08-05

Family

ID=11583497

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5004408A Pending JPH06215222A (en) 1993-01-14 1993-01-14 Shape discriminating device for metal chip

Country Status (1)

Country Link
JP (1) JPH06215222A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000051085A1 (en) * 1999-02-24 2000-08-31 Kabushiki Kaisha Nippon Conlux Coin sorting method and device
KR20010010272A (en) * 1999-07-19 2001-02-05 김상태 Pile up check method of cushion spring for clutch disk in vehicle and it's check system
JP2008033694A (en) * 2006-07-28 2008-02-14 Nippon Conlux Co Ltd Coin identification device and program
JP2010134657A (en) * 2008-12-03 2010-06-17 Glory Ltd Device and method for coin identification
KR101365003B1 (en) * 2012-12-31 2014-02-21 제이에스스틸(주) Core classification apparatus
JP2015097654A (en) * 2013-11-19 2015-05-28 株式会社オーイズミ Game media carrier device
JP2015217198A (en) * 2014-05-20 2015-12-07 日本電産サンキョー株式会社 Coin-shaped detected object identification device

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000051085A1 (en) * 1999-02-24 2000-08-31 Kabushiki Kaisha Nippon Conlux Coin sorting method and device
US6374980B1 (en) 1999-02-24 2002-04-23 Kabushiki Kaisha Nippon Conclux Coin sorting method and device
AU751567B2 (en) * 1999-02-24 2002-08-22 Kabushiki Kaisha Nippon Conlux Coin sorting method and device
CN100351872C (en) * 1999-02-24 2007-11-28 日本功勒克斯股份有限公司 Coin sorting method and device
KR20010010272A (en) * 1999-07-19 2001-02-05 김상태 Pile up check method of cushion spring for clutch disk in vehicle and it's check system
JP2008033694A (en) * 2006-07-28 2008-02-14 Nippon Conlux Co Ltd Coin identification device and program
JP2010134657A (en) * 2008-12-03 2010-06-17 Glory Ltd Device and method for coin identification
KR101365003B1 (en) * 2012-12-31 2014-02-21 제이에스스틸(주) Core classification apparatus
JP2015097654A (en) * 2013-11-19 2015-05-28 株式会社オーイズミ Game media carrier device
JP2015217198A (en) * 2014-05-20 2015-12-07 日本電産サンキョー株式会社 Coin-shaped detected object identification device

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