JPH06180732A - Measuring data storing system for comprehensive ratio in logical simulation - Google Patents

Abstract

PURPOSE:To prevent the reliability of a comprehensive ratio from being reduced due to an logical error at the time of measuring the comprehensive ratio of hardware in addition to logical simulation. CONSTITUTION:While executing the logical simulation of test data 101, a logical simulation means 10 measures the degree of comprehension. A comparing means 11 compares the execution result 102 of the test data 101 with an expected value result 104 at the time. A comprehensive information data storing means 12 stores hardware comprehensive information data 103 outputted from the means 10 in accumulative comprehensive information data 106 when both the results coincide with each other. When the results are different from each other, the data 103 outputted from the means 10 are canceled. An accumulated result 107 is displayed by an accumulated result display means 13.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a data storage system for measuring coverage in logic simulation, and in particular, an operation test of hardware by test data or hardware and firmware is performed while measuring the coverage of hardware or firmware. The present invention relates to a method for accumulating measurement data of coverage in logic simulation.

[0002]

2. Description of the Related Art Conventionally, in this type of logic simulation, a coverage percentage measurement data storage method is used to determine the coverage information data, which is the result of measuring the coverage percentage of the hardware or firmware to be measured, to end the execution of logic simulation. After that, the accumulation processing side receives it, and the comprehensive information data of the hardware or the firmware is directly accumulated in the comprehensive information data.

[0003]

The measurement data storage method of the coverage ratio in the above-mentioned conventional logic simulation operates with the test data used when there is a logic error in the hardware or firmware to be measured. The expected logic element may not operate, or the logic element that should not operate may operate, and the reliability of the measurement result indicating that the operation is performed is low. The reliability here means that the expected logic element worked because the hardware or firmware malfunctioned.
It means that it is an incorrect measurement result that is not correctly measured with respect to the measurement result that is not measured. However,
In the above-mentioned conventional hardware or firmware coverage measurement data storage method, since the coverage information data is accumulated as it is in the coverage information data, unreliable coverage information data is stored. However, there is a problem that the reliability of the comprehensive information data of the hardware and the firmware is low.

[0004]

According to the present invention, there is provided a data storage method for measuring coverage of a logic simulation in which the operation test of hardware by test data is carried out while measuring the coverage of the hardware. In the measurement data storage method, the logic simulation means that generates the hardware coverage information data that is the measurement result of the hardware coverage measured at the same time as the test data is input and the logic simulation is performed, and the logic simulation is performed using the test data. A comparison means for inputting an expected result at the time of execution and comparing the execution result of the logic simulation with the expected result, and if the comparison result by the comparison means is the same, the hardware generated at the time of executing the logic simulation Wear comprehensive information data In the cumulative coverage information data which is obtained by accumulating the hardware coverage information data generated in, the coverage information data accumulating means for discarding the hardware coverage information data generated when the logical simulation is executed, if they do not match, And a display unit for displaying the cumulative coverage information data obtained by accumulating the hardware coverage information data generated during execution of the logic simulation by the coverage information data accumulation unit,
Further, in this configuration, the logic simulation is a logic simulation in which an operation test of hardware and firmware is performed while measuring the coverage rate of the firmware, and the coverage rate of the hardware in the logic simulation means is the coverage rate of the firmware. The data is the logical simulation means that is the firmware coverage information data, the hardware coverage information data in the coverage information accumulation means is the coverage information accumulation means that is the firmware coverage information data, and the hardware coverage information data in the display means is the firmware coverage information The display means is information data.

[0005]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described with reference to the drawings.

FIG. 1 is a block diagram of an embodiment of the present invention.
The embodiment shown in FIG. 1 comprises a logic simulation means 10, a comparison means 11, a comprehensive information data accumulation means 12, and an accumulation result display means 13.

In the above configuration, the logic simulation means 10 inputs the test data 101 and executes the logic simulation. Logic simulation means 10
Measures the coverage rate of hardware at the same time as executing the logic simulation. When the execution of the logic simulation on the input test data 101 is completed, the logic simulation means 10 outputs the execution result 102, which is the execution result of the logic simulation, and the hardware coverage information data 103, which is the result of measuring the hardware coverage ratio. Output. Next, the comparison means 11 uses the used test data 1
The expected result 104 when the logic simulation means 10 executes the logic simulation with respect to 01 and the execution result 102 are input, and the results are compared to determine whether they match. 105 is sent to the comprehensive information data accumulating means 12. The comprehensive information data accumulating unit 12 receives the comparison result 105 output from the comparing unit 11.

Here, when the received comparison result 105 is a match, the coverage information data accumulating hand 12 first inputs the hardware coverage information data 103 output from the logic simulation means 10, and then the cumulative coverage. Information data 1
Enter 06. The coverage information data accumulating means 12 accumulates the hardware coverage information data 103 in the cumulative coverage information data 106 and sets the accumulated result as new cumulative coverage information data 106, and also to the cumulative result display means 13 as a cumulative result 107. send.

Next, when the received comparison result 105 does not match, the exhaustive information data accumulating means 12 does not input the cumulative exhaustive information data 106, and the hardware exhaustive information data 103 output from the logic simulation means 10.
Discard. Further, the discarding result is sent to the cumulative result display means 13 as the cumulative result 107.

The cumulative result display means 13 uses the cumulative result 107 received from the comprehensive information data accumulating means 12 to calculate the hardware comprehensive information data 103 which is the result of the measurement this time.
Shows whether was accumulated or discarded.

As described above, the coverage of the hardware that does not reduce the reliability of the already accumulated data is eliminated by discarding and not accumulating the measurement result of the coverage ratio when the execution result of the logic simulation is incorrect. A method for accumulating rate measurement data is realized.

Next, a specific example of the hardware comprehensive information data will be described. FIG. 2 is a diagram showing an example of a logic circuit in the logic simulation means 10. FIG. 3 is a diagram showing a table for measuring hardware coverage information data provided in the logic simulation means 10 for measuring the coverage ratio of the logic circuit of FIG. 2, in which the state value of each logic element changes from 0 to 1. It records 1 to 0 changes. Now, while the logic simulation means 10 is executing the logic simulation, as shown in FIG.
When there is a change in the state values of B, C, and D, as shown in the measurement result example of the measurement table of FIG.
In response to the change of the state value of 0 to 1, the flag 1 is set in the 0 → 1 change field of the logic element A and the flag 1 is set in the 1 → 0 change field of the logic element C in the measurement table. The logic element B does not have a flag because the state value to be measured does not change from 1 to 1. Next, when the execution result 102 and the expected result 104 of the logic simulation match, the comprehensive information data accumulating means 12 takes the logical sum of the flags for each field of the cumulative comprehensive information data 106 and the measurement result of FIG. New cumulative comprehensive information data 106
Accumulate as. FIG. 5 is a diagram showing an example of cumulative comprehensive information data up to that point, and FIG. 6 is a diagram showing an example of new cumulative comprehensive information data.

FIG. 7 is a block diagram of another embodiment of the present invention. In the embodiment of FIG. 7, the logic simulation means 20,
The comparison means 11, the comprehensive information data accumulating means 12, and the accumulation result displaying means 13 are included.

In the above structure, the logic simulation means 20 inputs the test data 201 and executes the logic simulation. Logic simulation means 20
Measures the coverage rate of the firmware at the same time as executing the logic simulation. Input test data 201
When the execution of the logic simulation is completed, the logic simulation means 20 executes the execution result 202 of the logic simulation and the firmware coverage information data 203 of the result of measuring the coverage rate of the firmware.
And output. Next, the comparison means 11 outputs the expected result 204 when the logic simulation means 20 executes the logic simulation on the used test data 201.
And the execution result 202 are input to compare whether or not there is a match, and whether the comparison result is a match or a mismatch does not result in a comparison result 105.
Is sent to the comprehensive information data accumulating means 12. The comprehensive information data accumulating unit 12 receives the comparison result 105 output from the comparing unit 11.

Here, when the received comparison result 105 is a match, the coverage information accumulating means 12 first inputs the firmware coverage information data 203 output by the logic simulation means 20. Next, cumulative comprehensive information data 2
Enter 06. Then, the firmware coverage information data 203 is accumulated in the accumulated coverage information data 206, and the accumulated result is set as new accumulated coverage information data 206, and the accumulated result 207 is sent to the accumulated result display unit 13.

Next, when the received comparison result 105 does not match, the coverage information data accumulating means 12 discards the firmware coverage information data 203 output by the logic simulation means 20, and the discarding result 207 is accumulated.
Is sent to the cumulative result display means 13.

The cumulative result display means 13 uses the cumulative result 207 received from the comprehensive information data accumulating means 12 to obtain the firmware comprehensive information data 20 which is the result of the measurement this time.
Displays whether 3 has been accumulated or discarded.

As described above, by discarding and not accumulating the coverage ratio measurement results when the execution result of the logic simulation is incorrect, the coverage ratio of the firmware that does not reduce the reliability of the already accumulated data. The measurement data storage method of is realized.

Next, a specific example of the firmware comprehensive information data will be described. When measuring the coverage rate for the firmware as shown in the instruction configuration diagram in FIG. 8, first, in the logic simulation means 20, for measuring the firmware coverage information data for recording the execution of each instruction as shown in FIG. Prepare a table. Then, when the logic simulation means 20 executes the instructions at the address 000 and the address 002 among the respective instructions shown in FIG. 8 during the execution of the logic simulation, the logic simulation means 20 in FIG.
Address 000 and address 0 in the table as shown in
Flag 1 is set in the field of 02. Address 00
Since the instruction of 1 and the address 003 is not executed, the flag is not set. Next, when the execution result 202 of the logical simulation matches the expected result 204, the coverage information data accumulating means 12 and the coverage information data shown in FIG. With the measurement result shown in (1), the logical sum of the flags is calculated for each address and accumulated as new accumulated comprehensive information data 206 as shown in FIG.

[0020]

As described above, according to the present invention, the logic simulation is executed before the hardware or firmware exhaustive information data measured at the time of executing the logical simulation is accumulated in the cumulative exhaustive information data. It is possible to determine whether the result is as expected, and if the execution result is incorrect, discard the data without accumulating it, which has the effect of preventing a decrease in data reliability.

Further, since the non-operating part of the hardware or the firmware is clarified, respectively, the logical simulation can be successively executed with the test data targeting the non-operating part, and the entire hardware and the entire firmware can be efficiently executed. There is an effect that the operation test can be performed.

[Brief description of drawings]

FIG. 1 is a configuration diagram of an embodiment of the present invention.

FIG. 2 is a diagram showing an example of a logic circuit for explaining a specific example of the embodiment shown in FIG.

FIG. 3 is a diagram showing an example of a table for measuring hardware coverage information data in FIG. 1.

FIG. 4 is a diagram showing an example after measurement results of the table of FIG.

5 is a diagram showing an example of contents of cumulative comprehensive information data of FIG. 1. FIG.

FIG. 6 is a diagram showing a content example of new cumulative comprehensive data after the accumulation result of the content example of FIG. 5;

FIG. 7 is a configuration diagram of another embodiment of the present invention.

FIG. 8 is a diagram showing a command configuration example of firmware for explaining a specific example of the embodiment in FIG.

9 is a diagram showing an example of a table for measuring the firmware coverage information data of FIG.

FIG. 10 is a diagram showing an example after the measurement result of the table of FIG. 9;

FIG. 11 is a diagram showing an example of the contents of the cumulative comprehensive information data of FIG. 7.

12 is a diagram showing a content example of new cumulative comprehensive data after the accumulation result of the content example of FIG.

[Explanation of symbols]

 10, 20 Logic simulation means 11 Comparison means 12 Coverage information data accumulation means 13 Accumulation result display means 101, 102 Test data 102, 202 Execution results 103 Hardware coverage information data 104, 204 Expected results 105 Comparison results 106, 206 Cumulative coverage information Data 107 Cumulative result 203 Firmware coverage information data

Claims (2)

[Claims] 1. A hardware operation test based on test data, which is performed while measuring a hardware coverage ratio. A measurement coverage ratio in a logic simulation. In a data storage method, test data is input and measured simultaneously with a logic simulation. The logic simulation means that generates the hardware coverage information data, which is the measurement result of the hardware coverage ratio, and the expected result when the logic simulation is performed with the test data are input, and the execution result of the logic simulation and this expected result are input. When the comparison result of the comparison means and the comparison result by this comparison means match, the hardware coverage information data generated at the time of executing the logic simulation is accumulated with the hardware coverage information data generated up to that time. The cumulative comprehensive information data If not, the coverage information data accumulating means for discarding the hardware coverage information data generated at the time of executing the logic simulation, and the hardware coverage information data generated at the time of executing the logic simulation by this coverage information data accumulating means are accumulated. And a display unit for displaying the cumulative coverage information data described above. 2. The logic simulation according to claim 1 is a logic simulation in which an operation test of hardware and firmware is performed while measuring the coverage rate of the firmware, and the coverage rate of the hardware in the logic simulation means is the coverage rate of the firmware. The hardware coverage information data is a logical simulation means that is firmware coverage information data, and the hardware coverage information data in the coverage information accumulation means is a coverage information accumulation means that is firmware coverage information data. The coverage data measurement method for logic simulation according to claim 1, wherein the coverage information data is a display means that is firmware coverage information data.