JPH06166511A - Coating liquid for silicon oxide-based film formation - Google Patents

Coating liquid for silicon oxide-based film formation

Info

Publication number
JPH06166511A
JPH06166511A JP33944892A JP33944892A JPH06166511A JP H06166511 A JPH06166511 A JP H06166511A JP 33944892 A JP33944892 A JP 33944892A JP 33944892 A JP33944892 A JP 33944892A JP H06166511 A JPH06166511 A JP H06166511A
Authority
JP
Japan
Prior art keywords
silicon oxide
coating
coating liquid
forming
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP33944892A
Other languages
Japanese (ja)
Inventor
Toshihiro Nishimura
俊博 西村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Ohka Kogyo Co Ltd
Original Assignee
Tokyo Ohka Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Ohka Kogyo Co Ltd filed Critical Tokyo Ohka Kogyo Co Ltd
Priority to JP33944892A priority Critical patent/JPH06166511A/en
Publication of JPH06166511A publication Critical patent/JPH06166511A/en
Pending legal-status Critical Current

Links

Landscapes

  • Silicon Compounds (AREA)
  • Formation Of Insulating Films (AREA)

Abstract

PURPOSE:To provide a coating liquid capable of forming films causing no crack even in the case of being thick and excellent in adhesiveness, uniformity and electrical insulation, thus suitably usable for the formation of interlayer electrical insulating films, flattened films and protective films in semiconductor elements or liquid crystal display elements. CONSTITUTION:The objective coating liquid composed of (A) an organic solvent- contg. solution and (B) poly-silicon oxide obtained by forming an adduct by reaction between silicon tetrachloride or trichlorosilane and a base free from active hydrogen-bearing functional group followed by reaction of the adduct with water while suppressing gelation.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は新規な酸化ケイ素系被膜
形成用塗布液、さらに詳しくは、厚膜でもクラックが発
生せず、かつ密着性、均質性及び絶縁性に優れる被膜を
形成することができ、半導体素子や液晶表示素子などに
おける層間絶縁膜、平坦化膜、保護膜の形成や、多層レ
ジスト法用積層材及び位相シフタ材などとして好適に用
いられる酸化ケイ素系被膜形成用塗布液に関するもので
ある。
FIELD OF THE INVENTION The present invention relates to a novel coating liquid for forming a silicon oxide film, and more specifically to form a film which is free from cracks even in a thick film and which is excellent in adhesion, homogeneity and insulation. A coating liquid for forming a silicon oxide film, which is suitable for forming an interlayer insulating film, a flattening film, a protective film in a semiconductor device or a liquid crystal display device, or as a multilayer material for a multi-layer resist method and a phase shifter material. It is a thing.

【0002】[0002]

【従来の技術】各種電子部品材料の製造においては、固
体表面に層間絶縁膜、平坦化膜、保護膜などを形成させ
る必要性がしばしば生じる。これらの膜としては、従
来、酸化ケイ素系被膜が一般的に用いられ、そして気相
成長法、分散塗布法、被膜形成液塗布法などによって固
体表面に形成されている。
2. Description of the Related Art In the production of various electronic component materials, it is often necessary to form an interlayer insulating film, a flattening film, a protective film, etc. on a solid surface. As these films, a silicon oxide type coating film has been generally used conventionally, and is formed on a solid surface by a vapor phase growth method, a dispersion coating method, a film forming liquid coating method or the like.

【0003】しかしながら気相成長法は、特殊な装置を
用いて固体表面に酸化ケイ素を蒸着させ、成長させる方
法であって、高価な装置を必要とする上、大量生産が困
難であるという欠点を有している。また、分散塗布法
は、酸化ケイ素粉末やガラス粉末を高分子化合物中に分
散させたものを固体表面に塗布する方法であり、簡便な
ため近年注目されるようになってきたが、均質な分散を
行うことが困難な上に、膜厚が不均一となりやすく、か
つピンホールが発生しやすいなどの欠点がある。さら
に、被膜形成液塗布法としては、例えばハロゲノシラン
をカルボン酸及びアルコールで反応させた反応生成物を
塗布液として用いることが知られているが(特公昭52
−16488号公報)、このような塗布液から形成され
た酸化ケイ素系被膜は吸湿性を有するため、雰囲気中の
水分を吸収して密着性及び絶縁特性が低下し、実用的な
層間絶縁膜が得られない上に、厚膜にするとクラックが
発生しやすいという欠点があった。
However, the vapor phase growth method is a method for depositing and growing silicon oxide on a solid surface using a special apparatus, which requires an expensive apparatus and is difficult to mass-produce. Have Further, the dispersion coating method is a method of coating a solid compound with a silicon oxide powder or a glass powder dispersed in a polymer compound, and it has been attracting attention in recent years because it is simple, but it is a homogeneous dispersion. However, there are drawbacks such that the film thickness is not uniform, and pinholes are easily generated. Further, as a method for coating a film-forming solution, for example, it is known to use a reaction product obtained by reacting halogenosilane with a carboxylic acid and an alcohol as a coating solution (JP-B-52).
No. 16488 gazette), a silicon oxide-based coating formed from such a coating liquid has hygroscopicity, so that it absorbs moisture in the atmosphere to lower the adhesiveness and insulating properties, and a practical interlayer insulating film is formed. In addition to being unobtainable, there is a drawback in that a thick film tends to cause cracks.

【0004】また、前記ハロゲノシランの反応生成物に
よる塗布液は、反応物の分子量が比較的大きく、粘度も
高いので、最近の超LSIのように0.5μm以下の溝
をもつファインパターンの間に充分浸透せず、絶縁膜の
形成には不適当である。
Further, since the coating liquid of the reaction product of the halogenosilane has a relatively large molecular weight of the reaction product and a high viscosity, it has a fine pattern having a groove of 0.5 μm or less like the recent LSI. Is not suitable for forming an insulating film.

【0005】このような酸化ケイ素系被膜が有する欠点
を克服するため、式
In order to overcome the drawbacks of the silicon oxide type coating,

【化4】 で表わされる構造単位を基本とする無機ポリシラザンを
用いた被膜が提案されているが(特開平3−23270
9号公報)、この被膜は窒化ケイ素繊維を形成するため
のものであって、層間絶縁膜としては誘電率が高く適用
できない。
[Chemical 4] A coating using an inorganic polysilazane based on the structural unit represented by the following formula has been proposed (JP-A-3-23270).
No. 9), this film is for forming silicon nitride fibers and cannot be applied as an interlayer insulating film because of its high dielectric constant.

【0006】[0006]

【発明が解決しようとする課題】本発明は、このような
従来技術が有する欠点を克服し、厚膜でもクラックが発
生せず、かつ密着性、均質性及び絶縁性に優れる被膜を
形成することができ、半導体素子や液晶表示素子などに
おける層間絶縁膜、平坦化膜、保護膜などの形成に好適
に用いられる塗布液を提供することを目的としてなされ
たものである。
DISCLOSURE OF THE INVENTION The present invention overcomes the drawbacks of the prior art and forms a coating film which does not crack even in a thick film and which is excellent in adhesion, homogeneity and insulation. Therefore, the present invention has been made for the purpose of providing a coating liquid which is suitably used for forming an interlayer insulating film, a flattening film, a protective film and the like in a semiconductor device, a liquid crystal display device and the like.

【0007】[0007]

【課題を解決するための手段】本発明者らは、前記の好
ましい性質を有する塗布液を開発すべく鋭意研究を重ね
た結果、四塩化ケイ素や三塩化シランを原料とし、特定
の方法で得られたポリ酸化ケイ素及び有機溶媒を含有す
る溶液から成る塗布液により、その目的を達成しうるこ
とを見出し、この知見に基づいて本発明を完成するに至
った。
Means for Solving the Problems As a result of intensive studies to develop a coating solution having the above-mentioned preferable properties, the present inventors have obtained silicon tetrachloride or silane trichloride as a raw material and obtain it by a specific method. It has been found that the object can be achieved by the coating solution composed of the solution containing the polysilicon oxide and the organic solvent thus obtained, and the present invention has been completed based on this finding.

【0008】すなわち、本発明は、(A)四塩化ケイ素
又は三塩化シランあるいはそれらの混合物と活性水素を
有する官能基をもたない塩基とを反応させてアダクトを
生成させたのち、該アダクトと水とをゲル化を抑制しな
がら反応させて得られたポリ酸化ケイ素、及び(B)有
機溶媒を含有する溶液から成る酸化ケイ素系被膜形成用
塗布液を提供するものである。
That is, according to the present invention, (A) silicon tetrachloride or silane trichloride or a mixture thereof is reacted with a base having no functional group having active hydrogen to form an adduct, and then the adduct is added. The present invention provides a coating liquid for forming a silicon oxide film, which comprises a solution containing poly (silicon oxide) obtained by reacting with water while suppressing gelation, and (B) an organic solvent.

【0009】本発明の塗布液は(A)ポリ酸化ケイ素と
(B)有機溶媒を含有する溶液から成るものであって、
該(A)成分のポリ酸化ケイ素は、本発明においては次
のようにして製造される。
The coating solution of the present invention comprises a solution containing (A) polysilicon oxide and (B) an organic solvent,
In the present invention, the component (A) component poly (silicon oxide) is produced as follows.

【0010】一般に四塩化ケイ素(SiCl)や三塩
化シラン(HSiCl)は反応性が大きく、空気中の
水分や酸素などと激しく反応するため、所望の重合度及
び均質性を有するポリ酸化ケイ素を与えにくいことが知
られている。したがって、本発明においては、まず、四
塩化ケイ素又は三塩化シランあるいはその混合物を、活
性水素を有する官能基をもたない塩基と反応させてアダ
クトを形成させ、次いでこのアダクトと水とを徐々に反
応させる。
In general, silicon tetrachloride (SiCl 4 ) and silane trichloride (HSiCl 3 ) are highly reactive and react violently with moisture and oxygen in the air, and thus have a desired degree of polymerization and homogeneity. It is known to be difficult to give. Therefore, in the present invention, first, silicon tetrachloride or silane trichloride or a mixture thereof is reacted with a base having no functional group having active hydrogen to form an adduct, and then the adduct and water are gradually added. React.

【0011】前記の活性水素を有する官能基をもたない
塩基としては、例えばピリジン、ピリダジン、ピリミジ
ン、ピラジン、ピコリン、N‐メチルヒペリジン及びト
リアルキルアミンのような第三級アミン類などが挙げら
れる。これらの塩基の使用量は、後の水との反応で副生
する塩化水素の捕捉剤として利用されることを考慮し
て、使用する四塩化ケイ素や三塩化シランの2〜10化
学当量倍の範囲で選ぶのが望ましい。
Examples of the base having no functional group having active hydrogen include pyridine, pyridazine, pyrimidine, pyrazine, picoline, N-methylhyperidine, and tertiary amines such as trialkylamine. Considering that it is used as a scavenger of hydrogen chloride produced as a by-product in the subsequent reaction with water, the amount of these bases used is 2 to 10 chemical equivalent times that of silicon tetrachloride or silane trichloride used. It is desirable to select within the range.

【0012】該アダクトを形成させるには、常温で液体
の前記塩基中に四塩化ケイ素や三塩化シランを滴下して
もよいし、あるいは非反応性かつ非水溶性溶剤中に前記
塩基を溶解させた溶液中に、四塩化ケイ素や三塩化シラ
ンを滴下してもよい。この際の反応温度は−50〜20
℃の範囲が好ましく、また、反応は乾燥窒素や乾燥アル
ゴンなどの乾燥した不活性ガス雰囲気下で行われる。こ
の場合、反応容器中の空気を該不活性ガスで置換して反
応を行ってもよいし、反応液中に該不活性ガスをバブル
しながら反応を行ってもよい。
To form the adduct, silicon tetrachloride or silane trichloride may be added dropwise to the base that is liquid at room temperature, or the base may be dissolved in a non-reactive, non-water-soluble solvent. Silicon tetrachloride or silane trichloride may be added dropwise to the solution. The reaction temperature at this time is -50 to 20.
The range of 0 ° C. is preferred, and the reaction is carried out in a dry inert gas atmosphere such as dry nitrogen or dry argon. In this case, the air in the reaction vessel may be replaced with the inert gas to carry out the reaction, or the reaction may be carried out while the inert gas is bubbled in the reaction solution.

【0013】前記の非反応性かつ非水溶性溶剤として
は、常圧で沸点が35〜200℃の脂肪族炭化水素類、
芳香族炭化水素類、ケトン類及びエーテル類などを挙げ
ることができる。これらの溶剤は1種用いてもよいし、
2種以上を組み合わせて用いてもよい。
The above-mentioned non-reactive and non-water-soluble solvent includes aliphatic hydrocarbons having a boiling point of 35 to 200 ° C. under normal pressure,
Aromatic hydrocarbons, ketones, ethers, etc. can be mentioned. You may use 1 type of these solvents,
You may use it in combination of 2 or more type.

【0014】次に、このようにして生成したアダクトと
水とをゲル化を抑制しながら反応させて、ポリ酸化ケイ
素を生成させる。このゲル化の抑制は、水の添加量と温
度の制御によって行われる。これは、例えば該アダクト
が浮遊する液体塩基中に、あるいはアダクトと塩基と非
反応性かつ非水溶性溶剤とを含有する混合液中に、水の
蒸気を窒素やアルゴンなどの不活性ガスと共に吹き込み
ながら反応を行うのが有利である。この際、急激な発熱
を伴うので、冷却を充分に行い、反応温度を−50〜2
0℃の範囲に保持するのが望ましく、また反応は、窒素
やアルゴンなどの不活性ガス雰囲気下で行われる。
Next, the adduct thus produced and water are reacted while suppressing gelation to produce poly silicon oxide. This gelation is suppressed by controlling the amount of water added and the temperature. This is, for example, by blowing water vapor together with an inert gas such as nitrogen or argon into a liquid base in which the adduct is suspended or into a mixed liquid containing the adduct and the base and a non-reactive, non-water-soluble solvent. It is advantageous to carry out the reaction while. At this time, a rapid heat is generated, so that the reaction temperature is -50 to 2 by sufficiently cooling.
It is desirable to keep the temperature in the range of 0 ° C., and the reaction is carried out under an atmosphere of an inert gas such as nitrogen or argon.

【0015】このようにして生成したポリ酸化ケイ素
は、式
The poly-silicon oxide thus produced has the formula

【化5】 で表わされる結合を基本骨格とし、末端に式[Chemical 5] The basic skeleton is the bond represented by

【化6】 又は[Chemical 6] Or

【化7】 で表わされる基を有し、通常重量平均分子量が500〜
3000の範囲にあるものであって、溶剤中に溶解して
おり、また反応により生成した塩酸と塩基から成る塩類
はろ過などの手段により除去される。この溶液から溶剤
を揮散させると粘稠な無色透明な液体が得られ、このも
のは室温で長時間放置するか、高温空気中で焼成すると
透明固体状の被膜を形成する。
[Chemical 7] And has a weight average molecular weight of 500 to
It is in the range of 3,000, is dissolved in a solvent, and salts formed from the reaction by hydrochloric acid and a base are removed by means such as filtration. When the solvent is volatilized from this solution, a viscous, colorless and transparent liquid is obtained, which is left at room temperature for a long time or baked in high temperature air to form a transparent solid film.

【0016】さらに、塗布液として使用するには、前記
溶液をそのまま用いてもよいが、過剰の塩基を除去する
ため、大量の非水溶性溶剤を加えたのち、減圧するか又
は加熱を行い塩基を揮散させる。この過程において塩基
が完全に除去されない場合、前記操作を繰り返し行う。
あるいは、窒素やアルゴンなどの減圧雰囲気中において
低温処理して粘稠な液体を得たのち、非水溶性溶剤を加
えて塗布液を作成してもよい。
Further, for use as a coating solution, the above solution may be used as it is, but in order to remove an excess base, a large amount of a non-water-soluble solvent is added, and then the pressure is reduced or heated to effect the base. Volatilize. If the base is not completely removed in this process, the above operation is repeated.
Alternatively, the coating liquid may be prepared by adding a non-water-soluble solvent after performing a low temperature treatment in a reduced pressure atmosphere such as nitrogen or argon to obtain a viscous liquid.

【0017】本発明の塗布液においては、その中の有機
溶媒が、特に常圧での沸点が90〜200℃の範囲の非
水溶性溶剤であるものが好適である。本発明の塗布液
は、固体表面上に塗布し、室温で長期間放置しても酸化
ケイ素系被膜を形成するが、該塗布液を固体表面上に塗
布し、乾燥させて塗膜を形成させたのち、空気中にて3
50℃以上の温度範囲で焼成することにより、優れた物
性を有する酸化ケイ素系被膜が形成される。さらに、こ
の焼成において水蒸気を付与することにより、SiO結
合が進行し、より物性の優れた酸化ケイ素系被膜が形成
される。このようにして形成された酸化ケイ素系被膜
は、厚膜にしてもクラックが発生せず、かつ密着性、均
質性及び絶縁性に優れている。
In the coating liquid of the present invention, it is preferable that the organic solvent therein is a water-insoluble solvent having a boiling point of 90 to 200 ° C. under normal pressure. The coating solution of the present invention forms a silicon oxide type coating even when applied on a solid surface and left at room temperature for a long period of time, but the coating solution is applied on the solid surface and dried to form a coating film. Afterwards, 3 in the air
By firing in a temperature range of 50 ° C. or higher, a silicon oxide coating film having excellent physical properties is formed. Furthermore, by applying water vapor in this firing, SiO bond progresses, and a silicon oxide-based coating having more excellent physical properties is formed. The silicon oxide-based coating thus formed has no cracks even if it is a thick film, and is excellent in adhesion, homogeneity and insulation.

【0018】[0018]

【発明の効果】本発明の酸化ケイ素系被膜形成用塗布液
は、厚膜でもクラックが発生せず、かつ密着性、均質性
及び絶縁性に優れる酸化ケイ素系被膜を形成することが
でき、半導体素子や液晶表示素子などにおける層間絶縁
膜、平坦化膜、保護膜の形成や多層レジスト法用積層材
として好適に用いられる。また、形成される被膜が均質
性に優れているため、光の散乱が抑制され、LSI用の
マスク上に形成する位相シフタ材としても有用である。
EFFECT OF THE INVENTION The coating solution for forming a silicon oxide type coating of the present invention can form a silicon oxide type coating having excellent adhesion, homogeneity and insulation without cracking even in a thick film. It is preferably used as a layered material for forming an interlayer insulating film, a flattening film, a protective film in a device or a liquid crystal display device or for a multilayer resist method. Further, since the formed film has excellent homogeneity, light scattering is suppressed, and it is also useful as a phase shifter material formed on a mask for LSI.

【0019】[0019]

【実施例】次に、実施例により本発明をさらに詳細に説
明する。
EXAMPLES Next, the present invention will be described in more detail by way of examples.

【0020】実施例1 あらかじめ乾燥窒素ガスで空気を置換したグローボック
ス中において、ガス吹き込み管、温度計、スタラー、分
液漏斗及び冷却コンデンサーを装置した400ミリリッ
トルの五ツ口フラスコ中に、ピリジン約150ミリリッ
トルを入れて水冷しながらかきまぜ、ガス吹き込み管を
通して乾燥窒素をピリジン中に導入し続け、四塩化ケイ
素及び三塩化シランの重量比1:1の混合物約30gを
分液漏斗から、反応温度が5〜20℃になるように冷却
しながら滴下した。この際、反応が激しく温度が上昇す
る場合は、滴下する速度を遅くして、反応温度を前記範
囲に調節する。
Example 1 Pyridine was added to a 400 ml five-necked flask equipped with a gas blowing tube, a thermometer, a stirrer, a separating funnel and a cooling condenser in a glow box in which air was previously replaced with dry nitrogen gas. Add 150 ml and stir while cooling with water, continue introducing dry nitrogen into pyridine through a gas blowing tube, and add about 30 g of a mixture of silicon tetrachloride and silane trichloride in a weight ratio of 1: 1 from a separating funnel to a reaction temperature It was added dropwise while cooling so as to be 5 to 20 ° C. At this time, when the temperature of the reaction is violently increased, the dropping speed is slowed down to adjust the reaction temperature within the above range.

【0021】この反応により、白色の析出物が浮遊する
ピリジン懸濁液が得られた。次に、この懸濁液中にガス
吹き込み管を通して導入していた乾燥窒素に変えて、水
中に通して水蒸気を含ませた窒素を懸濁液の温度5〜2
0℃に保持しながら、該懸濁液中に少量ずつバブルリン
グさせた。この際温度が急上昇する場合には、窒素のバ
ブルを弱めるか、止めて温度の上昇を抑えて、反応温度
を前記範囲に調節する。
By this reaction, a pyridine suspension in which a white precipitate floats was obtained. Next, the dry nitrogen, which had been introduced into the suspension through a gas blowing tube, was changed to nitrogen which was passed through water to contain steam, and the temperature of the suspension was adjusted to 5 to 2.
While maintaining the temperature at 0 ° C., bubbles were bubbled into the suspension little by little. In this case, if the temperature rises rapidly, the bubble of nitrogen is weakened or stopped to suppress the temperature rise, and the reaction temperature is adjusted within the above range.

【0022】窒素をバブルさせていた水の量が13ミリ
リットル減少した時点で、乾燥窒素と切り換え、さらに
1時間かきまぜ続けた。その後、固体沈殿物をろ過によ
り除去したのち、ろ液に非水溶性溶剤としてm‐キシレ
ン50ミリリットルを加え、20Torrの減圧下、2
5〜30℃でピリジンを除去した。この操作を4回繰り
返してピリジンが除去された固形分濃度10重量%の酸
化ケイ素系被膜形成用塗布液が得られた。
When the amount of water bubbled with nitrogen decreased by 13 ml, the nitrogen was switched to dry nitrogen, and stirring was continued for another hour. Then, after removing the solid precipitate by filtration, 50 ml of m-xylene as a water-insoluble solvent was added to the filtrate, and the pressure was reduced to 20 Torr under reduced pressure.
Pyridine was removed at 5-30 ° C. This operation was repeated 4 times to obtain a coating liquid for forming a silicon oxide film having a solid content concentration of 10% by weight, in which pyridine was removed.

【0023】このようにして得られた塗布液を深さ1.
0μm、幅1.0μmの溝を有する6インチシリコンウ
エハー上に3ミリリットル滴下し、2000rpmで2
0秒間スピンコートしたのち、140℃、30分間乾燥
し、次いで400℃、60分間窒素雰囲気下で焼成する
ことでシリコンウエハー上に酸化ケイ素系被膜を形成し
た。この被膜を200倍の光学顕微鏡及び15000倍
の電子顕微鏡で観察したところ、表面にクラックの発生
は認められず、平坦化率85%の均一な平坦化膜であっ
た。
The coating solution obtained in this manner was applied to a depth of 1.
3 ml was dropped on a 6-inch silicon wafer having a groove of 0 μm and a width of 1.0 μm, and 2 times at 2000 rpm.
After spin coating for 0 seconds, it was dried at 140 ° C. for 30 minutes, and then baked at 400 ° C. for 60 minutes in a nitrogen atmosphere to form a silicon oxide based coating film on the silicon wafer. When this coating film was observed with a 200 × optical microscope and a 15000 × electron microscope, no cracks were observed on the surface, and it was a uniform flattened film with a flattening rate of 85%.

【0024】実施例2 実施例1で用いた塗布液中にガラス基板(80×120
mm、厚さ1.1mm)を浸漬し、ガラス基板の両面を
塗布液でディップコートしたのち、140℃、30分間
乾燥し、次いで500℃、60分間焼成することでガラ
ス基板の全面に膜厚0.5μmの酸化ケイ素系被膜を形
成した。
Example 2 A glass substrate (80 × 120) was used in the coating solution used in Example 1.
mm, thickness 1.1 mm), dip coat both surfaces of the glass substrate with the coating solution, dry at 140 ° C. for 30 minutes, and then bake at 500 ° C. for 60 minutes to form a film on the entire surface of the glass substrate. A 0.5 μm silicon oxide coating was formed.

【0025】このようにして得られたガラス基板を5重
量%塩酸水溶液で5分間洗浄したのち、10重量%塩酸
水溶液の入った容器に入れ、60℃で100分間浸漬
し、ガラス基板から滲出されるナトリウムの滲出試験を
行ったところ、ナトリウムの滲出量は0.02ppmで
あった。また、比較のため酸化ケイ素系被膜を形成して
いないガラス基板に対して同様の滲出試験を行ったとこ
ろ、ナトリウムの滲出量は0.32ppmであり、ガラ
ス基板の保護膜として有効性が確認された。
The glass substrate thus obtained was washed with a 5 wt% hydrochloric acid aqueous solution for 5 minutes, then placed in a container containing a 10 wt% hydrochloric acid aqueous solution, immersed at 60 ° C. for 100 minutes, and exuded from the glass substrate. When a sodium leaching test was performed, the amount of sodium leached was 0.02 ppm. For comparison, a similar leaching test was conducted on a glass substrate on which a silicon oxide-based film was not formed. As a result, the amount of sodium leached was 0.32 ppm, confirming its effectiveness as a protective film for the glass substrate. It was

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 (A)四塩化ケイ素又は三塩化シランあ
るいはそれらの混合物と活性水素を有する官能基をもた
ない塩基とを反応させてアダクトを生成させたのち、該
アダクトと水とをゲル化を抑制しながら反応させて得ら
れたポリ酸化ケイ素、及び(B)有機溶媒を含有する溶
液から成る酸化ケイ素系被膜形成用塗布液。
1. (A) Silicon tetrachloride or trichlorosilane or a mixture thereof is reacted with a base having no active hydrogen-containing functional group to form an adduct, and then the adduct and water are gelled. A coating liquid for forming a silicon oxide coating film, which comprises a solution containing poly (silicon oxide) obtained by reacting while suppressing the formation of an organic solvent, and (B) an organic solvent.
【請求項2】 ポリ酸化ケイ素が、式 【化1】 で表わされる結合を基本骨格とし、末端に式 【化2】 又は 【化3】 で表わされる基を有する重量平均分子量が500〜30
00のものである請求項1記載の酸化ケイ素系被膜形成
用塗布液。
2. Polysilicon oxide has the formula: The bond represented by is the basic skeleton, and the terminal is represented by the formula: Or Having a group represented by
The coating solution for forming a silicon oxide film according to claim 1, which is 00.
【請求項3】 有機溶媒が、常圧での沸点が120〜2
00℃の非水溶性溶剤である請求項1又は2記載の酸化
ケイ素系被膜形成用塗布液。
3. The organic solvent has a boiling point of 120 to 2 at atmospheric pressure.
The coating liquid for forming a silicon oxide film according to claim 1 or 2, which is a water-insoluble solvent at 00 ° C.
JP33944892A 1992-11-27 1992-11-27 Coating liquid for silicon oxide-based film formation Pending JPH06166511A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33944892A JPH06166511A (en) 1992-11-27 1992-11-27 Coating liquid for silicon oxide-based film formation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33944892A JPH06166511A (en) 1992-11-27 1992-11-27 Coating liquid for silicon oxide-based film formation

Publications (1)

Publication Number Publication Date
JPH06166511A true JPH06166511A (en) 1994-06-14

Family

ID=18327563

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33944892A Pending JPH06166511A (en) 1992-11-27 1992-11-27 Coating liquid for silicon oxide-based film formation

Country Status (1)

Country Link
JP (1) JPH06166511A (en)

Similar Documents

Publication Publication Date Title
JP2575540B2 (en) Planarization of silsesquioxane copolymer coating
US7381441B2 (en) Low metal porous silica dielectric for integral circuit applications
TWI303834B (en) Mixtures and processes for preparing low dielectric films, films prepared therefrom and semiconductor devices comprising the film
KR100298100B1 (en) Polysilazane-based coating solution for the formation of interlayer insulating coating film and Method for the formation of silicon dioxide-based interlayer insulating coating film using the same
KR20010020178A (en) Organohydridosiloxane resins with low organic content
JP2001522536A (en) Improved method for producing nanoporous silica thin films
WO2006016672A1 (en) Siliceous film with smaller flat band shift and method for producing same
KR100898158B1 (en) Etch-stop resins
JP5551885B2 (en) Method for forming low dielectric constant silica-based coating and low dielectric constant silica-based coating obtained from the method
JP3904691B2 (en) Polysilazane-containing composition and method for forming siliceous film
JP3998979B2 (en) Method for forming low dielectric constant silica-based film and semiconductor substrate with low dielectric constant film
JPH09157544A (en) Production of substrate provided with silica coating film and substrate provided with silica coating film produced thereby
KR100451044B1 (en) Method for preparing organic silicate polymer and method for preparing insulating film using the same
WO2004074355A1 (en) Low-permittivity material, and production and use thereof
US6011167A (en) Polyorganosiloxazanes and process for the preparation thereof
JP4251927B2 (en) Method for producing porous silica membrane
JPH09125006A (en) Polysilazane coating liquid and formation of ceramic coating layer using the same
US5508062A (en) Method for forming an insoluble coating on a substrate
JPH06166511A (en) Coating liquid for silicon oxide-based film formation
JP3912697B2 (en) Interlayer insulating film forming coating solution and insulating film forming method using the same
JP4734815B2 (en) Composition, method of forming low dielectric constant film using the composition, low dielectric constant film, and electronic component having the low dielectric constant film
JPH0691081B2 (en) Method for forming silicon dioxide glass film
JPH0827420A (en) Coating liquid for forming silica-based insulating film
KR100315629B1 (en) Silica-based binder and its preparation method
JPH05179202A (en) Coating solution for forming silica coating film