JPH06163390A - Plama baking oven - Google Patents

Plama baking oven

Info

Publication number
JPH06163390A
JPH06163390A JP33355692A JP33355692A JPH06163390A JP H06163390 A JPH06163390 A JP H06163390A JP 33355692 A JP33355692 A JP 33355692A JP 33355692 A JP33355692 A JP 33355692A JP H06163390 A JPH06163390 A JP H06163390A
Authority
JP
Japan
Prior art keywords
chamber
plasma
heating device
electrode
base plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP33355692A
Other languages
Japanese (ja)
Other versions
JP3346809B2 (en
Inventor
Hirohito Sago
宏仁 佐合
Hideya Kobari
英也 小針
Hidenori Miyamoto
英典 宮本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Ohka Kogyo Co Ltd
Original Assignee
Tokyo Ohka Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Ohka Kogyo Co Ltd filed Critical Tokyo Ohka Kogyo Co Ltd
Priority to JP33355692A priority Critical patent/JP3346809B2/en
Publication of JPH06163390A publication Critical patent/JPH06163390A/en
Application granted granted Critical
Publication of JP3346809B2 publication Critical patent/JP3346809B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To produce plasma in a processing chamber by disposing a heating device outside the processing chamber and providing between the heating device and the chamber a plasma producing electrode of a shape with which radiation heat from the heating device to the chamber is not interrupted. CONSTITUTION:A plasma baking oven has an opening 2 formed in a base plate 1 and includes an article holding synthetic quartz tool 4 fixed to stride the opening 2 for holding an article to be processed. A beljer type synthetic quartz chamber 7 is fixed at a lower end thereof to an inside portion of an elevator 5, and a heating device 8 is fixed onto the elevator 5. The heating device 8 includes a heater wire 10 disposed on an inside surface a heat insulation wall 9, and the outside of the heat insulation wall 9 is surrounded by a stainless casing and the like. In contrast, a plasma producing electrode 11 is disposed on an outer periphery of the chamber 7. The plasma producing electrode 11 is composed of a plurality of band electrodes 11a... extending vertically and disposed circumferentially.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体ウェハやガラス基
板等の被処理物表面に塗布した膜のキュアリング等に用
いるプラズマベーク炉に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a plasma baking furnace used for curing a film applied on the surface of an object to be processed such as a semiconductor wafer or a glass substrate.

【0002】[0002]

【従来の技術】半導体ウェハ上にSiO2、ホスフォシリ
ケートガラス(PSG)、ボロンホスフォシリケートガ
ラス(BPSG)、チッ化膜等を、又ガラス基板表面に
SiO2膜を形成する方法として、これら基板表面に上記
被膜の形成用塗布液を塗布した後、ベーク炉でキュアリ
ングする方法が従来から行なわれている。
2. Description of the Related Art As a method for forming SiO 2 , phosphosilicate glass (PSG), boron phosphosilicate glass (BPSG), a nitride film, etc. on a semiconductor wafer, or a SiO 2 film on the surface of a glass substrate, A method of applying a coating solution for forming the above-mentioned coating on the surface of a substrate and then curing it in a baking oven has been conventionally used.

【0003】そして、従来のベーク炉の構造は、ベース
プレート上に反応チャンバーを固定し、この反応チャン
バーの外周にヒータを配置し、更に反応チャンバー内に
は下方から多数の被処理物を収納した保持具を挿入可能
とし、反応チャンバー内を減圧することで、被処理物表
面に形成された塗膜中の溶剤を蒸発せしめて除去し、こ
の後加熱してキュアリングを行なうようにしている。
In the structure of the conventional baking furnace, a reaction chamber is fixed on a base plate, a heater is arranged on the outer periphery of the reaction chamber, and a large number of objects to be processed are held in the reaction chamber from below. A tool can be inserted and the inside of the reaction chamber is depressurized to evaporate and remove the solvent in the coating film formed on the surface of the object to be treated, and then heat to perform curing.

【0004】[0004]

【発明が解決しようとする課題】ところで、上記のキュ
アリングを行なう場合、プラズマ雰囲気で行なうと、膜
質の改善がなされることが判明した。しかしながら従来
のプラズマ処理装置は、チャンバーの外周に筒状或いは
半割り筒状の電極を配置した構造になっている。このよ
うなプラズマ処理装置の外側にヒータを配置した場合、
ヒータからの熱が電極によって遮断されチャンバー内を
高温にすることができない。尚、ヒータの外側に電極を
配置した場合にはチャンバー内にプラズマを発生せしめ
ることが困難となる。
By the way, it has been found that when the above curing is performed in a plasma atmosphere, the film quality is improved. However, the conventional plasma processing apparatus has a structure in which a cylindrical or half-split cylindrical electrode is arranged on the outer periphery of the chamber. When a heater is arranged outside such a plasma processing apparatus,
The heat from the heater is blocked by the electrodes, and the temperature inside the chamber cannot be raised. When the electrodes are arranged outside the heater, it becomes difficult to generate plasma in the chamber.

【0005】[0005]

【課題を解決するための手段】上記課題を解決すべく本
発明は、ベースプレート上に設けられる処理チャンバー
の外側に加熱装置を配置するとともに、この加熱装置と
チャンバーとの間に加熱装置からチャンバーへの放射熱
を遮断しない形状のプラズマ発生用電極、例えば複数の
帯状または棒状電極からなるプラズマ発生用電極を設け
た。
SUMMARY OF THE INVENTION In order to solve the above-mentioned problems, according to the present invention, a heating device is arranged outside a processing chamber provided on a base plate, and the heating device is connected to the chamber between the heating device and the chamber. A plasma generating electrode having a shape that does not block the radiant heat is provided, for example, a plasma generating electrode including a plurality of strip-shaped or rod-shaped electrodes.

【0006】[0006]

【作用】チャンバーの外側に配置した加熱装置によりチ
ャンバー内が高温に加熱されるとともに、プラズマ発生
用電極にてチャンバー内にはプラズマが発生し、チャン
バー内の被処理物は、高真空、高温及びプラズマ雰囲気
下でキュアリング処理される。
[Function] While the inside of the chamber is heated to a high temperature by the heating device arranged outside the chamber, the plasma is generated in the chamber by the electrode for plasma generation, and the object to be processed in the chamber is exposed to high vacuum, high temperature and Curing is performed in a plasma atmosphere.

【0007】[0007]

【実施例】以下に本発明の実施例を添付図面に基づいて
説明する。ここで、図1は本発明に係るプラズマベーク
炉の縦断面図、図2はチャンバーの斜視図、図3はプラ
ズマ発生用電極の配置例を示す平面図である。
Embodiments of the present invention will be described below with reference to the accompanying drawings. Here, FIG. 1 is a vertical cross-sectional view of a plasma baking furnace according to the present invention, FIG. 2 is a perspective view of a chamber, and FIG. 3 is a plan view showing an arrangement example of electrodes for plasma generation.

【0008】プラズマベーク炉はベースプレート1に開
口2を形成し、この開口2に真空引き装置につながる図
示しない配管を取り付け、また開口2を跨ぐように合成
石英等からなる被処理物保持具4を固定し、この被処理
物保持具4に半導体ウェハやガラス基板等の被処理物W
をセットしている。
In the plasma bake furnace, an opening 2 is formed in a base plate 1, a pipe (not shown) connected to a vacuuming device is attached to the opening 2, and a workpiece holder 4 made of synthetic quartz or the like is provided so as to straddle the opening 2. The workpiece W such as a semiconductor wafer or a glass substrate is fixed to the workpiece holder 4
Is set.

【0009】また、被処理物保持具4の外側には昇降体
5を配置している。この昇降体5は図示しないシリンダ
ユニットにより上下動可能とされ、その下面には円環状
のシール部材6を取り付けている。
An elevating body 5 is disposed outside the workpiece holder 4. The elevating body 5 can be moved up and down by a cylinder unit (not shown), and an annular seal member 6 is attached to the lower surface thereof.

【0010】昇降体5の内側部分には合成石英等からな
るベルジャー型のチャンバー7の下端を固定し、昇降体
5の上には加熱装置8を固定している。この加熱装置8
は断熱壁9の内側面にヒータ線10を配置し、断熱壁9
の外側をステンレスケース等で囲うようにしている。
A lower end of a bell jar type chamber 7 made of synthetic quartz or the like is fixed to the inside of the lifting body 5, and a heating device 8 is fixed on the lifting body 5. This heating device 8
Arranges the heater wire 10 on the inner surface of the heat insulating wall 9,
The outside of the is surrounded by a stainless steel case.

【0011】尚、図1においてはチャンバー7及び加熱
装置8をベースプレート1に対して昇降自在とし、被処
理物保持具4をベースプレート1に固定したが、チャン
バー7及び加熱装置8をベースプレート1に固定し、被
処理物保持具4をベースプレート1に形成した開口2を
介して昇降自在としてもよい。
In FIG. 1, the chamber 7 and the heating device 8 are vertically movable with respect to the base plate 1 and the workpiece holder 4 is fixed to the base plate 1. However, the chamber 7 and the heating device 8 are fixed to the base plate 1. However, the workpiece holder 4 may be movable up and down through the opening 2 formed in the base plate 1.

【0012】一方、チャンバー7の外周にはプラズマ発
生用電極11を配置している。このプラズマ発生用電極
11は上下方向に伸び且つ周方向に配置される複数本
(図示例では6本)の帯状電極11a…からなる。そし
て、帯状電極11a…のうちの所定の本数(図示例では
4本)を高周波電源12に接続し、残りの帯状電極(図
示例では2本)をアースしている。また帯状電極11a
…の上端はチャンバー7の一部に形成した係止部13に
嵌め込まれ、更に係止部13の内側に入り込む部分には
熱膨張によって係止部13を破損するのを防止するため
のスリット11bを形成している。尚、帯状電極11a
の本数は任意であり、またどの帯状電極を高周波電源1
2に接続するかも任意であり、更に帯状電極の代わりに
棒状電極としてもよい。
On the other hand, a plasma generating electrode 11 is arranged on the outer periphery of the chamber 7. The plasma generating electrode 11 is composed of a plurality of (six in the illustrated example) strip-shaped electrodes 11a ... Which extend in the vertical direction and are arranged in the circumferential direction. Then, a predetermined number (four in the illustrated example) of the strip-shaped electrodes 11a are connected to the high frequency power source 12, and the remaining strip-shaped electrodes (two in the illustrated example) are grounded. Also, the strip electrode 11a
The upper end of ... is fitted into the locking portion 13 formed in a part of the chamber 7, and the portion that enters the inside of the locking portion 13 has a slit 11b for preventing the locking portion 13 from being damaged by thermal expansion. Is formed. The strip electrode 11a
The number of electrodes is arbitrary, and which strip electrode is used for the high frequency power source 1
It may be connected to 2 as well, and a rod-shaped electrode may be used instead of the strip-shaped electrode.

【0013】図4及び図5はプラズマ発生用電極11の
別実施例を示し、図4に示すプラズマ発生用電極11に
あっては高周波電源12に接続する帯状電極11a…の
上下の端部間及びアースされた帯状電極11a…の上下
の端部間を電気的に接続し、チャンバー7内にプラズマ
がより均一に発生するようにしている。また、図5に示
すプラズマ発生用電極11は筒状のメッシュ電極として
いる。尚、メッシュ電極の代わりにパンチングメタルに
て筒状のプラズマ発生用電極11を構成してもよい。
4 and 5 show another embodiment of the plasma generating electrode 11. In the plasma generating electrode 11 shown in FIG. 4, between the upper and lower end portions of the strip electrodes 11a connected to the high frequency power source 12. , And the upper and lower ends of the grounded strip electrodes 11a ... Are electrically connected to generate plasma more uniformly in the chamber 7. The plasma generating electrode 11 shown in FIG. 5 is a cylindrical mesh electrode. The tubular plasma generating electrode 11 may be formed of punching metal instead of the mesh electrode.

【0014】図6はチャンバー7と加熱装置8とを独立
して昇降させるようにした別実施例を示す。即ち、加熱
装置8をチャンバー7を支持する昇降体5とは別の昇降
体14上に支持し、キュアリング後に直ちに加熱装置8
のみを上昇させることで、チャンバー7内の温度を速や
かに低下せしめることができ、低温下(200℃程度)
つまり縮合反応を起こさない温度で溶剤のみを蒸発させ
ることができ、膜強度を高めることができる。
FIG. 6 shows another embodiment in which the chamber 7 and the heating device 8 are independently moved up and down. That is, the heating device 8 is supported on an elevating / lowering body 14 different from the elevating / lowering body 5 supporting the chamber 7, and immediately after the curing, the heating device 8 is supported.
By raising only the temperature inside the chamber 7, the temperature inside the chamber 7 can be quickly lowered, and at low temperature (about 200 ° C.)
That is, only the solvent can be evaporated at a temperature at which the condensation reaction does not occur, and the film strength can be increased.

【0015】[0015]

【発明の効果】以上に説明したように本発明によれば、
処理チャンバーの外周にプラズマ発生用の電極を設ける
とともに、この電極よりも外側に加熱装置を配置し、し
かも電極の形状を帯状、棒状、パンチング或いはメッシ
ュ等のように、加熱装置からチャンバーへの放射熱を遮
断しないものとしたので、プラズマ雰囲気下でキュアリ
ング処理することができ、膜質の改善等が有効に行なえ
る。
As described above, according to the present invention,
An electrode for plasma generation is provided on the outer circumference of the processing chamber, and a heating device is arranged outside this electrode. Moreover, the shape of the electrode is radiated from the heating device to the chamber such as a band, rod, punching or mesh. Since the heat is not shielded, the curing process can be performed in the plasma atmosphere, and the film quality can be effectively improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係るプラズマベーク炉の縦断面図FIG. 1 is a vertical sectional view of a plasma baking furnace according to the present invention.

【図2】チャンバーの斜視図FIG. 2 is a perspective view of a chamber

【図3】プラズマ発生用電極の配置例を示す平面図FIG. 3 is a plan view showing an arrangement example of plasma generation electrodes.

【図4】プラズマ発生用電極の別実施例を示す図2と同
様の図
FIG. 4 is a view similar to FIG. 2 showing another embodiment of the plasma generating electrode.

【図5】プラズマ発生用電極の別実施例を示す図2と同
様の図
5 is a view similar to FIG. 2 showing another embodiment of the plasma generating electrode.

【図6】別実施例に係るプラズマベーク炉の縦断面図FIG. 6 is a vertical sectional view of a plasma bake furnace according to another embodiment.

【符号の説明】[Explanation of symbols]

1…ベースプレート、2…開口、4…被処理物保持具、
5,14…昇降体、7…チャンバー、8…加熱装置、1
1…プラズマ発生用電極、11a…帯状電極、12…高
周波電源。
1 ... Base plate, 2 ... Aperture, 4 ... Object holder
5, 14 ... Elevating body, 7 ... Chamber, 8 ... Heating device, 1
DESCRIPTION OF SYMBOLS 1 ... Plasma generating electrode, 11a ... Strip electrode, 12 ... High frequency power supply.

─────────────────────────────────────────────────────
─────────────────────────────────────────────────── ───

【手続補正書】[Procedure amendment]

【提出日】平成5年11月17日[Submission date] November 17, 1993

【手続補正1】[Procedure Amendment 1]

【補正対象書類名】明細書[Document name to be amended] Statement

【補正対象項目名】0014[Correction target item name] 0014

【補正方法】変更[Correction method] Change

【補正内容】[Correction content]

【0014】図6はチャンバー7と加熱装置8とを独立
して昇降させるようにした別実施例を示す。即ち、加熱
装置8をチャンバー7を支持する昇降体5とは別の昇降
体14上に支持し、キュアリング前に加熱装置8のみを
上昇させることで、チャンバー7内の温度を速やかに低
下せしめることができ、低温下(200℃程度)つまり
縮合反応を起こさない温度で溶剤のみを蒸発させること
ができ、膜強度を高めることができる。
FIG. 6 shows another embodiment in which the chamber 7 and the heating device 8 are independently moved up and down. That is, the heating device 8 is supported on another lift 14 and the lifting member 5 for supporting the chamber 7, by raising only the pressure heat system 8 before curing, quickly lowering the temperature in the chamber 7 In addition, the solvent can be evaporated at a low temperature (about 200 ° C.), that is, at a temperature at which the condensation reaction does not occur, and the film strength can be increased.

【手続補正2】[Procedure Amendment 2]

【補正対象書類名】明細書[Document name to be amended] Statement

【補正対象項目名】0015[Name of item to be corrected] 0015

【補正方法】変更[Correction method] Change

【補正内容】[Correction content]

【0015】[0015]

【発明の効果】以上に説明したように本発明によれば、
処理チャンバーの外周にプラズマ発生用の電極を設ける
とともに、この電極よりも外側に加熱装置を配置し、し
かも電極の形状を帯状、棒状、パンチング或いはメッシ
ュ等のように、加熱装置からチャンバーへの放射熱を遮
断しないものとしたので、プラズマ雰囲気下でキュアリ
ング処理することができ、膜質の改善等が有効に行なえ
る。なお、本発明のプラズマベーク炉を用いれば、塗布
された被膜にまずプラズマ処理することによって被膜を
改質し、続いて加熱処理することによって被膜中の溶剤
を揮発除去せしめることもできる。 ─────────────────────────────────────────────────────
As described above, according to the present invention,
An electrode for plasma generation is provided on the outer circumference of the processing chamber, and a heating device is arranged outside this electrode. Moreover, the shape of the electrode is radiated from the heating device to the chamber such as a band, rod, punching or mesh. Since the heat is not shielded, the curing process can be performed in the plasma atmosphere, and the film quality can be effectively improved. If the plasma bake furnace of the present invention is used, coating
The treated coating is first plasma treated to
Solvent in the coating by modification and subsequent heat treatment
Can also be removed by volatilization. ─────────────────────────────────────────────────── ───

【手続補正書】[Procedure amendment]

【提出日】平成5年12月17日[Submission date] December 17, 1993

【手続補正1】[Procedure Amendment 1]

【補正対象書類名】明細書[Document name to be amended] Statement

【補正対象項目名】0014[Correction target item name] 0014

【補正方法】変更[Correction method] Change

【補正内容】[Correction content]

【0014】図6はチャンバー7と加熱装置8とを独立
して昇降させるようにした別実施例を示す。即ち、加熱
装置8をチャンバー7を支持する昇降体5とは別の昇降
体14上に支持し、キュアリング前に加熱装置8のみを
上昇させることで、チャンバー7内の温度を速やかに低
下せしめることができ、低温下(200℃程度)つまり
縮合反応を起こさない温度で溶剤のみを蒸発させること
ができ、膜強度を高めることができる。
FIG. 6 shows another embodiment in which the chamber 7 and the heating device 8 are independently moved up and down. That is, the heating device 8 is supported on an elevating / lowering body 14 different from the elevating / lowering body 5 that supports the chamber 7, and only the heating device 8 is raised before curing, so that the temperature in the chamber 7 can be rapidly lowered. It is possible to evaporate only the solvent at a low temperature (about 200 ° C.), that is, at a temperature at which the condensation reaction does not occur, and the film strength can be increased.

【手続補正2】[Procedure Amendment 2]

【補正対象書類名】明細書[Document name to be amended] Statement

【補正対象項目名】0015[Name of item to be corrected] 0015

【補正方法】変更[Correction method] Change

【補正内容】[Correction content]

【0015】[0015]

【発明の効果】以上に説明したように本発明によれば、
処理チャンバーの外周にプラズマ発生用の電極を設ける
とともに、この電極よりも外側に加熱装置を配置し、し
かも電極の形状を帯状、棒状、パンチング或いはメッシ
ュ等のように、加熱装置からチャンバーへの放射熱を遮
断しないものとしたので、プラズマ雰囲気下でキュアリ
ング処理することができ、膜質の改善等が有効に行なえ
る。なお、本発明のプラズマベーク炉を用いれば、塗布
された被膜に、まずプラズマ処理することによって被膜
を改質し、続いて加熱処理することによって被膜中の溶
剤を揮発除去せしめることもできる。
As described above, according to the present invention,
An electrode for plasma generation is provided on the outer circumference of the processing chamber, and a heating device is arranged outside this electrode. Moreover, the shape of the electrode is radiated from the heating device to the chamber such as a band, rod, punching or mesh. Since the heat is not shielded, the curing process can be performed in the plasma atmosphere, and the film quality can be effectively improved. If the plasma bake furnace of the present invention is used, coating
The coated film is first treated by plasma treatment.
Of the melt in the coating by modifying the
It is also possible to volatilize and remove the agent.

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 ベースプレートに形成した開口を囲むよ
うにベースプレート上に固設されるかベースプレートに
対して昇降可能とされたチャンバーと、ベースプレート
に形成した開口を介して前記チャンバー内に臨むかベー
スプレートに形成した開口を跨ぐように固設された被処
理物保持具と、前記チャンバーの外側に配置される加熱
装置と、前記チャンバーと前記加熱装置との間に配置さ
れ且つ加熱装置からチャンバーへの放射熱を遮断しない
形状とされたプラズマ発生用電極とからなることを特徴
とするプラズマベーク炉。
1. A chamber fixedly mounted on the base plate so as to surround the opening formed in the base plate or capable of moving up and down with respect to the base plate, and facing the inside of the chamber through the opening formed in the base plate or the base plate. A workpiece holder fixedly installed so as to straddle the formed opening, a heating device arranged outside the chamber, and radiation from the heating device to the chamber arranged between the chamber and the heating device. A plasma bake furnace comprising a plasma generating electrode having a shape that does not block heat.
【請求項2】 前記プラズマ発生用電極は上下方向に伸
びる複数本の帯状または棒状電極からなり、これら帯状
または棒状電極はチャンバーの外側面に周方向に配置さ
れていることを特徴とする請求項1に記載のプラズマベ
ーク炉。
2. The plasma generating electrode is composed of a plurality of strip-shaped or rod-shaped electrodes extending in the vertical direction, and these strip-shaped or rod-shaped electrodes are circumferentially arranged on the outer surface of the chamber. 1. The plasma bake oven according to 1.
【請求項3】 前記プラズマ発生用電極を構成する複数
本の帯状または棒状電極のうち高周波電源に接続される
電極同士は上端部間及び下端部間が電気的に接続され、
またアースされる電極同士は上端部間及び下端部間が電
気的に接続されていることを特徴とする請求項2に記載
のプラズマベーク炉。
3. Among the plurality of strip-shaped or rod-shaped electrodes forming the plasma generating electrode, electrodes connected to a high frequency power source are electrically connected between upper end portions and between lower end portions,
The plasma bake furnace according to claim 2, wherein the electrodes to be grounded are electrically connected between upper end portions and between lower end portions.
【請求項4】 前記プラズマ発生用電極はチャンバー外
周を囲むように配置される筒状のパンチング電極または
メッシュ電極であることを特徴とする請求項1に記載の
プラズマベーク炉。
4. The plasma baking furnace according to claim 1, wherein the plasma generating electrode is a cylindrical punching electrode or mesh electrode arranged so as to surround the outer circumference of the chamber.
JP33355692A 1992-11-19 1992-11-19 Plasma bake oven Expired - Fee Related JP3346809B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33355692A JP3346809B2 (en) 1992-11-19 1992-11-19 Plasma bake oven

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33355692A JP3346809B2 (en) 1992-11-19 1992-11-19 Plasma bake oven

Publications (2)

Publication Number Publication Date
JPH06163390A true JPH06163390A (en) 1994-06-10
JP3346809B2 JP3346809B2 (en) 2002-11-18

Family

ID=18267365

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33355692A Expired - Fee Related JP3346809B2 (en) 1992-11-19 1992-11-19 Plasma bake oven

Country Status (1)

Country Link
JP (1) JP3346809B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006006831A1 (en) * 2004-07-15 2006-01-19 Joung Yeol Cho Method for manufacturing external electrode fluorescent lamps having various shapes and sizes and glass tube unit structure used for the method
JP2007324477A (en) * 2006-06-02 2007-12-13 Hitachi Kokusai Electric Inc Substrate processing device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006006831A1 (en) * 2004-07-15 2006-01-19 Joung Yeol Cho Method for manufacturing external electrode fluorescent lamps having various shapes and sizes and glass tube unit structure used for the method
JP2007324477A (en) * 2006-06-02 2007-12-13 Hitachi Kokusai Electric Inc Substrate processing device

Also Published As

Publication number Publication date
JP3346809B2 (en) 2002-11-18

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