JPH06148273A - Classification of tested ic element - Google Patents

Abstract

PURPOSE:To shorten classification and distribution times. CONSTITUTION:A head capable of simultaneously adsorbing four IC elements is provided and the IC elements in the same arrangement state as the head are searched on a test tray on the basis of the same test result and four tested ICs are simultaneously taken up to be carried to a receiving tray. When the ICs arranged in the same way as the ICs on the head of the same test result are lost, three arranged IC elements are searched to be simultaneously taken up and, next, one IC elements of the same test result are searched and taken up to be carried to the receiving tray as four ones. In this step, if there is no one IC element of the same test result, the arrangement of two IC elements of the same test result is searched and one of the IC element thereof is taken up to simultaneously carry four IC elements.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention moves an IC element to a test position by using a horizontal transfer device, and tests the IC element according to the test result. The present invention relates to an IC device classification method.

[0002]

2. Description of the Related Art As shown in FIG. 4, tested IC elements 12 are arranged in a matrix on a test tray 11. In the figure, 10 IC elements are arranged in the X direction and 4 IC elements are arranged in the Y direction, and a total of 40 tested I
The C element 12 is placed on the tray 11, and the numbers 1 to 4 attached to the tested IC element 12 indicate the test result, that is, 1 is assigned to the test result of the first grade.
Is labeled with 2 for the second grade. The tested IC element 12 is stored in individual storage trays 13 to 16 according to the test result. Therefore, the head 17 of the mechanism for picking up and moving the IC element picks up a part of the IC elements on the test tray 11 at the same time. In this example, four heads arranged in the X direction are arranged. A head capable of picking up IC elements at the same time is used.

Conventionally, when the tested IC elements are sorted and stored in a storage tray by using such a head, IC elements of the same class are taken from the test tray in a predetermined arrangement order and four of the same class are stored. When the IC element is picked up, it is stored in a storage tray corresponding to it. For this reason, conventionally, the IC elements on the test tray 11 are searched for the same class in a predetermined order, for example, in the Y direction from the 0th position in the X direction, and then from the 1st position in the X direction. Search for directions. For example, when taking out a second-class IC element, as shown in FIG. 4B, the IC element at the leftmost position (0, 1) of the head 17, that is, the position of X = 0, Y = 1 is taken, and then (1 , 0), the IC element at the (1, 2) position, and the IC element at the (1, 3) position. To the tray 14 at the same time. In this way, the first-class IC element is stored in the storage tray 13 and the third-class IC element is stored in the storage tray 15.
In addition, the fourth-class IC elements were classified and stored in the storage tray 16.

[0004]

As described above, in the prior art, tested IC elements of the same test result, that is, the same class, are sequentially searched for in a predetermined order on the test tray, and tested IC elements are tested one by one. Take the head 17, 4 in this example
When I picked them up, they moved to the storage tray and stored. Since the time for picking up the IC element is relatively long, the time required for sorting and storing as a whole was relatively long.

[0005]

According to the present invention, the tested IC elements on the test tray are moved to the storage tray in order from the IC elements in the arrangement state that is close to the maximum arrangement state that can be simultaneously moved to the storage tray. Sort and store.

[0006]

EXAMPLE FIG. 1 shows a case where the number X of simultaneously movable IC elements is 4, that is, the tested IC elements can be simultaneously picked up by the head 17 and can be stored in the storage tray. In this example, An example will be described in which a conventional head shown in FIG. 4 that can simultaneously pick up four IC elements arranged in the X direction is used. First, four IC elements 12 arranged in the X direction are searched. For example, in the example shown in FIG. 4, the tray 1 is used for the IC element whose test result is grade 2.
The positions on 1 are (6, 1), (7, 1), (8, 1),
A location (9, 1) is searched for, and four IC elements in which four identical test results are lined up are simultaneously picked up by, for example, a vacuum difference, and are stored in a storage tray. After the storage, the process returns to step 1 again, and the process of taking out and carrying the one in which the maximum IC elements that can be simultaneously moved by the head 17 are lined up is repeated.

[0007] When there is no more line-up state that can be carried to the maximum, the process moves to step S2, and next, one less than the maximum line-up state, in this example, three lines with the same test result are lined up. First, three heads 17 are simultaneously picked up, and one of the same grade as that which is independent is searched for and picked up in the rest of the head 17 (S
3), carry this to the storage tray. When carried to the storage tray, the process returns to step S1 and the same operation is repeated, but step S
When the one lined up in 3 is gone, only one of the two lined up of the same grade is picked up and carried to the storage tray (S4). Similarly, after picking up three rows, if there is neither one row nor two rows with the same test result, pick one from the same three rows and convey it to the storage tray. (S5).
If there are no three arranged in this step S5, only three picked up by the head 17 at the same time in step S2 are carried to the storage tray and the process returns to step S1.

In this way, when there is no more picking up the same test result in three rows at the same time in step S2, the process goes to step S6 to search for the same test result in two rows and simultaneously search for those two rows. After picking up, two pieces of the same test result in line are searched again, picked up and carried to the storage tray (S7). If two lines cannot be detected in step S7,
The one with the same test result is searched for and picked up (S8), the one with the same test result is searched (S9), and four heads 17 are picked up and carried to the storage tray. .

If there is no one having the same test result in step S8, the two heads are picked up and carried to the storage tray. If there is no one having the same test result as that in step S9, the three picked up by the head are carried to the storage tray. In this way, after repeating picking up two pieces at the same time,
Next, in the case where two rows of the same test result cannot be detected in step S6, the process moves to step S10 to search for and pick up one row of the same test result, and then in step S11 one row of the same test result. Are picked up and picked up, and in steps S12 and S13, one line of the same test result is picked up one by one and carried to the storage tray in a state where four heads are aligned. However, if there is no one lined up in step S11, only the one picked up is carried to the storage tray, and if one lined up cannot be detected in step S12, only the two picked up so far are stored in the storage tray. If one lined up item cannot be detected in step S13, the three items picked up to that point are brought to the storage tray. In this way, all the tested IC elements having the same test result are sorted and stored in the state where one lined up cannot be detected in step S10. The other same test results are also stored in the storage tray in the same manner.

Next, when four heads can be carried at the same time but only three can be received at a time, that is, when only a maximum of three heads can be received at the same time, for example, a process as shown in FIG. do. That is, first of all, search for the one in which three of the same test results are lined up, and
Pick up the pieces at the same time and carry them to the storage tray (S1), and when these three rows are lost, pick up three rows out of the four rows at the same time and carry them to the storage tray (S1).
2). When the four-row one is gone, the next two-row one is detected and the two-row one is picked up at the same time (S
3). After that, one line of the same test result is searched for (S4), and if there is one, three are picked up and carried to the storage tray. If there is no one lined up in step S4, a lineup of two lines is searched for by the same test result, one of them is picked up, and three IC elements are simultaneously carried to the storage tray. If there is no two arranged in step S4, the two IC elements picked up in step S3 are carried to the storage tray.

When it is not possible to detect the two-row-arranged ones in step S3, the process proceeds to step S5, and the one-row-arranged ones are searched for as in the case shown in FIG. Carry it to 1
Repeat until only one cannot be detected. Next, a case in which the number that can be received on the storage side is two, or a case in which the number that the head can simultaneously pick up is two will be described with reference to FIG. In this case, first, two lined up objects are detected by the same test result, and they are picked up at the same time and carried to the storage tray (S1). When there are no more items to pick up at the same time, search for the one with 4 lines
The pieces are picked up at the same time and carried to the storage tray (S2). In the case of four rows, two from the left or two from the right.
Pick up individual pieces at the same time. When the four-lined one cannot be detected, next, the three-lined one is searched and two of them are picked up at the same time and carried to the storage tray (S3). If 3 rows are not detected, search for 1 row (S
4) Further, one in line is searched for, and if there is one, two are carried to the storage tray and stored (S5). If one lined up is not detected in step S5, only the one picked up to that time is carried to the storage tray. Further, when there is no one lined up in step S4, the storage for the same test result ends.

The order of steps S1 and S2 in FIG. 2 and steps S1, S2 and S3 in FIG. 3 does not matter, and the point is to take up and store the largest items that can be carried at the same time. In the above description, a carrying head that can pick up four at a time was used, but the number of picking up at the same time is not limited to four. Also, as a head whose arrangement direction is the same, X on the test tray is used.
Although a head having the same state as a plurality of elements arranged in the same direction has been taken up, a head picking up one in the Y direction or one arranged in the XY direction at the same time, for example, 4 × 2 × 2 IC elements may be used.

[0013]

As described above, according to the present invention, a plurality of tested IC elements can be picked up at the same time. Therefore, in the conventional case, the tested ICs are picked up one by one. In comparison, the time it takes to take up is much shorter. The detection of elements having the same test result in a row of four can be performed remarkably quickly because it is performed by software, that is, it is remarkably short as compared with the time for picking up the IC elements by the head. Therefore, the sorting and storing speed can be shortened as compared with the conventional method.

[Brief description of drawings]

FIG. 1 is a flow chart showing an embodiment of the present invention.

FIG. 2 is a flowchart showing another embodiment.

FIG. 3 is a flowchart showing still another example.

FIG. 4 is a diagram for explaining classification and distribution of tested IC elements and conventional classification and distribution.

Claims (1)

[Claims] 1. A plurality of tested IC elements arranged in a matrix on a test tray are picked up by a head capable of picking up a plurality of IC elements at the same time while maintaining the same arrangement, and are classified into storage trays according to the same test result. In the storage method, I is close to the maximum arrangement that can be moved to the storage tray at the same time.
A tested IC element classification method, characterized in that the C elements are sequentially moved to a storage tray.