JP3014015B2 - Tested IC element classification method - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention uses a horizontal transfer device to move an IC element to a test position, and sorts the tray on which the tested IC element is loaded into a storage tray according to the test result, and stores the IC element in a storage tray. The present invention relates to an IC element classification method.

[0002]

2. Description of the Related Art As shown in FIG. 4, a test tray 11 has tested IC elements 12 arranged in a matrix. In the figure, ten IC elements are arranged in the X direction and four IC elements are arranged in the Y direction.
The C element 12 indicates a state in which the C element 12 is placed on the tray 11, and the numbers 1 to 4 attached to the tested IC elements 12 indicate test results.
, And those of the second grade are indicated by adding 2. The tested IC elements 12 are stored in individual storage trays 13 to 16 according to the test results. For this reason, the head 17 of the mechanism for picking up and moving the IC element picks up a part of the IC elements in the arrangement state of the IC elements on the test tray 11 at the same time. In this example, four heads arranged in the X direction are arranged. A head capable of simultaneously picking up IC elements is used.

Conventionally, when such tested heads are used to classify and store tested IC elements in storage trays, the same class of IC elements are taken out of the test tray in a predetermined arrangement order and four same-class IC elements are taken out. When the IC element is picked up, it is stored in the corresponding storage tray. Y Thus conventionally, the order of fixed arrays of IC elements on the test tray 11, looking for those same class, for example, looking into 0 th or et Y direction of the X-direction, then from the first X-direction
Looking for directions. For example, when taking out a second-class IC element, as shown in FIG.
1) That is, take the IC element at the position of X = 0, Y = 1,
Next, the IC element at the position (1, 0) is taken, and then (1, 0).
The IC element at the position 2) is taken, and the I element at the position (1, 3) is
After taking the C element, the head 17 is stored in the storage tray 1 in that state.
4 and move four of the second-class IC elements to tray 1 at the same time.
Store in 4. Thus, the first-class IC elements are stored in the storage tray 13, the third-class IC elements are stored in the storage tray 15, and the fourth-class IC elements are stored in the storage tray 16.

[0004]

As described above, in the prior art, the same test result, that is, the tested IC elements of the same class are sequentially searched in a predetermined order on the test tray, and the tested IC elements are found one by one. And the head 17 has 4
When they were picked, they were moved to the storage tray and stored. Since the time for picking up the IC element is relatively long, the time required for classification and storage as a whole is relatively long.

[0005]

According to the present invention, the same number of the same test results as the number that can be simultaneously stored in the storage tray are provided.
Storing, giving priority to IC elements in which fruits are continuously arranged
Reach the maximum number that can be stored simultaneously in the tray
Pick up the head until it is
Classify and store in a storage tray for each test result.

[0006]

FIG. 1 shows a case where the number X of simultaneously movable IC elements is 4, that is, the number of tested IC elements that can be picked up simultaneously by the head 17 and the number that can be stored in the storage tray is 4. In this example, FIG. An example in which a conventional head shown in FIG. 4 which can pick up four IC elements arranged in the X direction at the same time is used will be described. First, four IC elements 12 arranged in the X direction are searched. For example, in the example shown in FIG.
The position on 1 is (6, 1), (7, 1), (8, 1),
(9, 1) is searched, and four IC elements in which the same test result is arranged four are picked up at the same time due to, for example, a vacuum difference and stored in a storage tray. After the storage, the process returns to step 1 again, and the process of taking out and carrying the largest IC element that can be moved simultaneously by the head 17 is repeated.

[0007] When there is no more arrangement state that can be carried to the maximum, the process proceeds to step S2. Next, one less than the maximum arrangement state, that is, in this example, three pieces having the same test result are arranged. First, three heads are simultaneously taken by the head 17, and one of the same grade as that of the head 17 is searched for and taken up in the rest of the head 17 (S
3), carry this to the storage tray. When the item is carried to the storage tray, the process returns to step S1 and repeats the same operation.
In the case where the one-row arrangement is lost in 3, only one of the two-row arrangements of the same grade is picked up and transported to the storage tray (S 4). In the same way, after picking up three pieces, if there is no one or two pieces with the same test result, one piece is taken out of three pieces of the same grade and transported to the storage tray. (S5).
If there is no three in the step S5, only the three picked up simultaneously by the head 17 in the step S2 are carried to the storage tray and the process returns to the step S1.

In this way, if there is no longer any one that picks up the same three test results in step S2, the process proceeds to step S6, where the two same test results are searched for, and the two are simultaneously checked. Then, two pieces of the same test result are searched again, picked up and transported to the storage tray (S7). If it is not possible to detect a two-row arrangement in step S7,
One of the same test results is searched for and picked up (S8), and one of the same test results is searched for (S9), and four heads 17 are picked up and transported to the storage tray. .

If there is no single test result of the same test result in step S8, it is transported to the storage tray with two heads picked up. If there is no one with the same test result in step S9, the three picked up by the head are transported to the storage tray. After repeating the process of picking up two items at the same time,
Next, if it is determined in step S6 that no two test pieces can be detected, the process proceeds to step S10 to search for and pick up one test result of the same test result, and then in step S11 one test result of the same test result. Then, in steps S12 and S13, one row of the same test result is sequentially picked up and transported to the storage tray with four heads 17 aligned. However, in step S11, if there is no one-lined item, only the picked-up item is carried to the storage tray. In step S13, if one line is not detected, the three items picked up to that point are transferred to the storage tray. In this way, all the tested IC elements having the same test result are classified and stored in a state where one array is not detected in step S10. Other results of the same test are stored in the storage tray in the same manner.

Next, when four heads can be carried at the same time, but only three heads can be received at a time, that is, when only three heads can be stored at the same time, a process such as that shown in FIG. do. That is, first, three pieces of the same test result are searched, and the three
Simultaneously pick up the pieces and carry them to the storage tray (S1). When the three-rows are no longer present, pick up three of the four-rows at the same time and carry them to the storage tray (S1).
2). When there are no more four-row objects, the next two-row objects are detected and picked up at the same time (S
3). Further, after that, one of the same test results is searched for (S4), and if there is one, it is picked up and transported to the storage tray with three picked up. If there is no one arranged in step S4, two arranged ones are searched by the same test result, one of them is picked up, and three IC elements are simultaneously transferred to the storage tray. If no two IC elements are aligned in step S4, the two IC elements picked up in step S3 are transported to the storage tray.

If it is determined in step S3 that no two-rows can be detected, the process proceeds to step S5, where the one-rows are searched for as in the case shown in FIG. Carry it to one
Repeat until no more pieces can be detected. Next, a case where the number that can be received on the storage side is two or a case where the head can pick up two at the same time will be described with reference to FIG. In this case, first, two identical test results are detected, and these are simultaneously picked up and transported to the storage tray (S1). When there are no more items to be picked up at the same time, search for 4
The individual is picked up and carried to the storage tray at the same time (S2). In the case of the arrangement of four, two from the left or two from the right
Pick up the individuals at the same time. If the four-row array cannot be detected, the three-row array is searched, and two of the three rows are simultaneously picked up and transported to the storage tray (S3). If the three-row arrangement cannot be detected, the one-row arrangement is searched (S
4) Further, one is arranged, and if there is one, two are carried to the storage tray and stored (S5). If no one is detected in step S5, only one picked up to that point is transported to the storage tray. When there is no longer one in step S4, the storage for the same test result ends.

In the above description, four heads that can be picked up at the same time are used. However, the number of picked up heads is not limited to four. In addition, a head having the same arrangement direction as a plurality of elements arranged in the X direction on the test tray is taken as a head having the same arrangement direction. A head that simultaneously picks up four × 2 IC elements may be used.

[0013]

As described above, according to the present invention, a plurality of tested IC elements can be picked up at the same time, so that the tested ICs are conventionally picked up one by one. In comparison, the time required to pick it up is significantly shorter. The detection of the elements having the same test result in a row of four can be performed very quickly because the processing is performed on software, that is, the time required for picking up the IC elements to the head is extremely short. For this reason, classification and storage speed can be performed in a shorter time as compared with the conventional method.

[Brief description of the drawings]

FIG. 1 is a flowchart showing an embodiment of the present invention.

FIG. 2 is a flowchart showing another embodiment.

FIG. 3 is a flowchart showing still another example.

FIG. 4 is a view for explaining classification and distribution of tested IC elements and conventional classification and distribution.

Claims (1)

(57) [Claims] 1. A test tray in which tested IC elements arranged in a matrix on a test tray are simultaneously stored in a storage tray.
Until the maximum number n that can be reached is reached.
Or picked up one by one with the head and picked up IC elements
In the storage tray according to the same test result and storing them in the storage tray , the same number of the same test results arranged in succession close to the above n
A method for classifying tested IC elements, wherein the resulting IC elements are preferentially picked up by the head .