JP3014015B2 - Tested ic element classification method - Google Patents

Tested ic element classification method

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Publication number
JP3014015B2
JP3014015B2 JP29496792A JP29496792A JP3014015B2 JP 3014015 B2 JP3014015 B2 JP 3014015B2 JP 29496792 A JP29496792 A JP 29496792A JP 29496792 A JP29496792 A JP 29496792A JP 3014015 B2 JP3014015 B2 JP 3014015B2
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ic
same
tray
test
head
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JPH06148273A (en )
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邦昭 坂内
稔 馬場
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株式会社アドバンテスト
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Description

【発明の詳細な説明】 DETAILED DESCRIPTION OF THE INVENTION

【0001】 [0001]

【産業上の利用分野】この発明は水平搬送装置を用いてIC素子を試験位置に移動し、その試験結果に応じて試験済IC素子が乗せられたトレイから収納トレイに分類、収納する試験済IC素子分類方法に関する。 BACKGROUND OF THE INVENTION This invention moves to a test position IC device using a horizontal conveying device, the test results classified tray which is placed the test IC devices in the storage tray in response to, Tested for housing It relates to an IC element classification method.

【0002】 [0002]

【従来の技術】図4に示すように、試験トレイ11には試験済IC素子12がマトリックス状に配列されている。 As shown in Prior Art FIG. 4, test IC element 12 are arranged in a matrix form on the test tray 11. 図においてはX方向に10個のIC素子が、Y方向に4個のIC素子が並べられ、全体で40個の試験済I 10 IC elements in the X direction in figure, four IC elements in the Y direction are aligned, a total of 40 pieces of post-test I
C素子12がトレイ11上に乗せられている状態を示し、試験済IC素子12上に付けた1乃至4の番号は試験結果を示しており、即ち試験結果が1級のものには1 Shows a state in which the C element 12 is placed on the tray 11, the number of 1 to 4 applied over test IC element 12 shows the test results, the words test results include the primary 1
を、2級のものには2を付けて表示してある。 A, to those of the secondary are displayed with a 2. この試験済IC素子12をその試験結果に応じて個別の収納トレイ13乃至16に収納する。 The test IC element 12 accommodated in a separate storage tray 13 through 16 in accordance with the test results. このため、そのIC素子を取り上げて移動させる機構のヘッド17は、その試験トレイ11上のIC素子の配列状態の一部のIC素子を同時に取り上げる、この例ではX方向において並べられた4個のIC素子を同時に取り上げることができるヘッドが用いられている。 Thus, the head 17 of the mechanism for moving by taking the IC element, take up part of the IC device arrangement of IC elements on the test tray 11 at the same time, four ordered in the X direction in this example head capable of taking up IC elements simultaneously are used.

【0003】従来において、このようなヘッドを用いて試験済IC素子を収納トレイに分類、収納する場合、その試験トレイから同一級のIC素子を決められた配列順番に取って4つの同一級のIC素子を取り上げると、これと対応する収納トレイに収納している。 In a conventional, classify test IC device using such a head in the storage tray, when receiving, the four identical class taking the sequence order determined by the same class of the IC element from the test tray Taking an IC element, it is accommodated in the storage tray and the corresponding thereto. このため従来においては、試験トレイ11上におけるIC素子の配列を決まった順に、同一級のものを探し、例えばX方向の0番目からY方向に探して、次にX方向の1番目からY Y Thus conventionally, the order of fixed arrays of IC elements on the test tray 11, looking for those same class, for example, looking into 0 th or et Y direction of the X-direction, then from the first X-direction
方向を探していく。 Go looking for a direction. 例えば2級のIC素子を取り出す場合は、図4Bに示すようにヘッド17の一番左に(0、 For example, when taking out the secondary of the IC element, the leftmost head 17 as shown in FIG. 4B (0,
1)、つまりX=0、Y=1の位置のIC素子を取り、 1), i.e. taking the X = 0, Y = 1 position of the IC element,
次に(1、0)の位置のIC素子を取り、次に(1、 Then take the IC element positions (1,0), then (1,
2)の位置のIC素子を取り、更に(1、3)位置のI Take the IC element position 2), and (1,3) position of the I
C素子を取って、その状態でヘッド17を収納トレイ1 Taking C element, housing the head 17 in this state the tray 1
4上に移動して2級のIC素子の4個を同時にトレイ1 4 Go on simultaneously tray 1 Grade 2 of the four IC elements
4に収納する。 Housed in the 4. このようにして1級のIC素子は収納トレイ13に、3級のIC素子は収納トレイ15に、4級のIC素子は収納トレイ16にと言うように分類して収納していた。 Thus the primary of the IC elements in the storage tray 13, tertiary IC device to the storage tray 15, the quaternary IC element was housed classified as saying that the storage tray 16.

【0004】 [0004]

【発明が解決しようとする課題】以上述べたように、従来においては同一試験結果、即ち同一級の試験済IC素子を試験トレイ上の予め決まった順に順次探して1個ずつ試験済IC素子を取り、ヘッド17に、この例では4 As described above [0006] In the conventional same test results, i.e. the pre-fixed sequence locate one by one test IC devices in the order on the test tray test IC devices of the same class taken, the head 17, in this example 4
個取ると収納トレイに移動して収納していた。 It had been housed by moving take pieces and the storage tray. IC素子を取り上げるための時間が比較的長いため、全体として分類、収納にかかる時間が比較的長かった。 Since a relatively long time for picking up the IC element, classified as a whole, the time required for storage is relatively long.

【0005】 [0005]

【課題を解決するための手段】この発明によれば、収納トレイに同時に収納可能な数に最も近い数の同一試験結 Means for Solving the Problems] According to the present invention, the closest number of identical test binding to the number of simultaneously can be stored in the storage tray
果が連続して配列されているIC素子を優先して、収納 The IC element results are arranged in succession with priority, storage
トレイに同時に収納することができる最大の数に到達で In reached the maximum number of which can be trays simultaneously receiving
きるまでヘッドに取上げ、取上げられたIC素子を、同 Pick to head to kill, the IC element that has been taken up, the
一試験結果別に収納トレイに分類、収納する。 One test result separately classified in the storage tray, for housing.

【0006】 [0006]

【実施例】図1に同時に移動可能のIC素子の数Xが4、つまりヘッド17で同時に試験済IC素子を取り上げることができ、かつ収納トレイに収納できる数が4の場合で、この例では従来の図4に示した、X方向に4個並んだIC素子を同時に取り上げることができるヘッドを使用した場合を例として説明する。 EXAMPLES The number X of simultaneously movable in IC element 1 is 4, i.e. it is possible to simultaneously address the test IC devices in the head 17, and in the case of the number that can be accommodated in the accommodation tray 4, in this example It is shown in prior art FIG. 4, will be described as an example case of using a head which can be taken up at the same time four aligned IC elements in the X direction. 先ずX方向に4個並んだIC素子12を探す。 First X direction Find four IC element 12 aligned. 例えば図4に示した例においては、試験結果が2級のIC素子についてはトレイ1 In the example shown in FIG. 4, for example, for the test results 2 class IC element Tray 1
1上の位置が(6、1)、(7、1)、(8、1)、 Position on the 1 (6,1), (7,1), (8,1),
(9、1)の箇所を探し、この同一試験結果が4個並んだ4つのIC素子を、例えば真空的差により同時に取り上げて、これを収納トレイに収納する。 Locate the position of (9,1), the same test results are four IC elements arranged four, for example by taking simultaneously by vacuum specific differences, housing it in the storage tray. その収納したのち再びこのステップ1に戻って、このヘッド17で同時に移動することができる最大のIC素子が並んだ状態のものを取り出して運ぶことを繰り返す。 Returning to step 1 again later that the housing is repeated to carry removed those states lined up the IC element can be moved simultaneously in the head 17.

【0007】この最大に運ぶことができる並び状態が無くなるとステップS2に移り、次に最大の並び状態より1個少ない、この例では同じ試験結果のものが3個並んでいるものを探し、その3個をヘッド17で同時に先ず取り、更にそれと同一級のもので1個独立しているものを探してそれをヘッド17の残りの箇所に取り上げ(S [0007] proceeds to step S2 when aligned condition ends can carry this maximum, then one less than the maximum line state, in this example looks for those of the same test results are arranged three, that three simultaneously taken first by the head 17, further therewith pick it looking for something that one independent of the same class to the remaining portion of the head 17 (S
3)、これを収納トレイに運ぶ。 3), carry this to the storage tray. 収納トレイに運ぶとステップS1に戻って同じことを繰り返すが、ステップS Returning to step S1 Carrying the storage tray repeat the same thing, but the step S
3において1個並びのものが無くなった場合はそれと同一級の2個並びのものからその内の1個だけを取り上げて収納トレイに運ぶ(S4)。 If one of one sequence is used up in three pick up only one of them from those of the two sequences of the same class as it carries a storage tray (S4). 同様にして3個並びのものを取り上げた後に、それと同一試験結果のものが1個並びも、2個並びもない場合は、それと同一級の3個並びから1個取り上げて収納トレイに搬送する(S5)。 After taken those three aligned in the same manner, therewith also have one row of the same test results, when two list no is therewith transported from three sequence of identical class to one taken in the storage tray (S5).
このステップS5において3個並びのものがない場合はステップS2でヘッド17に同時に取り上げた3個だけを収納トレイに運んでステップS1に戻る。 If none of the three sequence in step S5 returns to the step S1 carrying only three took up simultaneously to the head 17 in step S2 to the storage tray.

【0008】このようにしてステップS2で同一試験結果の3個並びのものを同時に取り上げるものがなくなるるとステップS6に移り、同一試験結果の2個並びのものを探して、その2個を同時に取り上げ、その後再び同一試験結果のものについて2個並びのものを探して、取り上げてこれを収納トレイに運ぶ(S7)。 [0008] In this manner proceeds to step S6 and that there is no one to pick up simultaneously those three sequences of the same test results at step S2, looking for those two sequences of the same test results, two that simultaneously I picked up, and then again looking for something of the two row about things of the same test result, taken in carry this to the storage tray (S7). このステップS7において2個並びのものを検出できない場合は、 If you can not detect those two row in this step S7,
それと同一試験結果の1個並びのものを探し、これを取り上げ(S8)、更に同一試験結果の1個並びのものを探し(S9)、ヘッド17に4個を取り上げた状態で収納トレイに運ぶ。 At the same look for things one row of identical test results, which is taken up (S8), further find one of one row of the same test result (S9), carries a storage tray in a state in which took up four head 17 .

【0009】ステップS8で同一試験結果の1個並びのものが無い場合は、ヘッドに2個取り上げた状態のまま収納トレイに運ぶ。 [0009] When there is nothing of one row of the same test results at step S8, carries left storage trays two featured state to the head. 又ステップS9においてそれと同一試験結果の1個並びのものが無い場合は、ヘッドに取り上げた3個を収納トレイに運ぶ。 Also if the same do not include the one row of the same test results at step S9, it conveys the three took up the head storage tray. このようにして2個並びのものを同時に取り上げることを繰り返し行った後、 After repeated that take up this way of two well as those at the same time,
次にステップS6で2個並びのものが検出できなくなった場合はステップS10に移って同一試験結果の1個並びのものを探して取り上げ、次にステップS11で同一試験結果で1個並びのものを探して取り上げ、更にステップS12、S13で順次同一試験結果の1個並びのものをそれぞれ取り上げてヘッド17に4個揃った状態で収納トレイに運ぶ。 Then if one of the two sequence can no longer be detected in step S6 taken looking for something of one row of identical test results proceeds to step S10, and then those of the one row with the same test results at step S11 the locate taken further steps S12, S13 sequentially things one row of identical test results to the head 17 taken up respectively by four uniform state carrying the storage tray. しかしスッテプS11で1個並びのものが無い場合は、その取り上げた1個だけを収納トレイに運び、ステップS12において1個並びのものを検出できない場合はそれまでに取り上げた2個だけを収納トレイに運び、ステップS13において1個並びのものを検出できない場合はそれまでに取り上げた3個のものを収納トレイに運ぶ。 However, if in Suttepu S11 is not intended one arrangement carries only one that the taken up in the storage tray, housing only two cases that can not be detected that was taken up far things one sequence in step S12 tray to carry, if you can not detect those one sequence in step S13 carries those three took up so far to the storage tray. このようにしてステップS10において1個並びのものを検出できない状態でその同一試験結果の全ての試験済IC素子を分類、収納したことになる。 In this way it classifies all test IC device of the same test result in a state unable to detect those one sequence in step S10, so that the housing. 他の同一試験結果のものも同様にして収納トレイに収納する。 It is similarly accommodated in the accommodating trays others of the same test results.

【0010】次に、ヘッドは4個同時に運ぶことができるが、収納は3個ずつしか受け取ることができない場合は、つまりヘッドが最大3個しか同時に収納できない場合は例えば図2に示すような処理をする。 [0010] Next, the head can carry four simultaneously, if the storage can not receive only three each, that is, as if the head can not be accommodated only three up simultaneously shown in FIG. 2 for example process do. 即ち先ず同一試験結果のものが3個並んでいるものを探して、その3 That first looking for those of the same test results are arranged three, the 3
個を同時に取り上げて収納トレイに運び(S1)、この3個並びのものが無くなったら4個並びのものからその内の3個並びを同時に取り上げて収納トレイに運ぶ(S Number at the same time taken in carrying on the storage tray (S1), carry on the storage tray pick up the three sequence of them from those of the four row When is no longer one of the three sequence at the same time (S
2)。 2). 4個並びのものが無くなったら次に2個並びのものを検出して2個並びのものを同時に取り上げる(S Four sequence of things is to detect those of the next two sequence Once you run out at the same time pick up a thing of two sequence (S
3)。 3). 更にその後それと同一試験結果のものの1個並びのものを探し(S4)、あればそれを取り上げて3個取り上げた状態で収納トレイに運ぶ。 Thereafter the same look for things one sequence of of the same test result (S4), carries a storage tray with three featured state taken up, if any. ステップS4で1個並びのものが無い場合は同一試験結果で2個並びのものを探し、その内の1個を取り上げて3つのIC素子を同時に収納トレイに運ぶ。 If at no thing one sequence is step S4 looking for something of two aligned on the same test results, carrying three IC elements by taking one of them at the same time accommodating tray. ステップS4で2個並びのものが無ければ、それまでにステップS3で取り上げた2個のIC素子を収納トレイに運ぶ。 Without in step S4 those two arrangement carries two IC elements covered in step S3 so far in the storage tray.

【0011】ステップS3で2個並びのものが検出できなくなったらステップS5に移り、図1で示した場合と同様に1個並びのものを探し、しかも1個ずつなるべく多く取り上げるようにして収納トレイに運び、それを1 [0011] The process proceeds to step S5 when it is no longer able to detect those of two sequence in step S3, looking for something of one line in the same manner as shown in FIG. 1, moreover housed as pick up as many as possible one by one tray to carry, it 1
個だけを検出できなくなるまで行う。 Do only until it becomes impossible to detect pieces. 次に収納側で受け取ることができる数が2個の場合について、或いはヘッドが同時に取り上げることができる数が2個の場合を図3で説明する。 Case number can then receive a retracted side is two, or head number that can be taken up simultaneously describing the case of two in FIG. この場合、先ず同一試験結果で2個並んでいるものを検出して、これを同時にそれを取り上げて収納トレイに運ぶ(S1)。 In this case, first to detect what are arranged two identical test results, carry storage tray which simultaneously pick up it (S1). この2個同時に取り上げるものが無くなると、4個並びのものを探してその内の2 When the thing to pick up the two at the same time is eliminated, 2 of them looking for something of four row
個を同時に取り上げて収納トレイに運ぶ(S2)。 Number at the same time taken in carrying on the storage tray (S2). この4個並びの場合は、その左からの2個或いは右からの2 In the case of the four line, 2 from two or right from the left
個を同時に取り上げる。 Pick up pieces at the same time. この4個並びのものも検出できなくなると、次に3個並びのものを探してその内2個を同時に取り上げて収納トレイに運ぶ(S3)。 When it becomes impossible to detect that the four sequence, then find one of three aligned carry storage tray taken up the inner two simultaneously (S3). 3個並びのものが検出できなくなると1個並びのものを探し(S Three line things can not be detected when looking for something of one sequence (S
4)、更に1個並びのものを探して、有れば2個を収納トレイに運び収納する(S5)。 4), further looking for something of one sequence, the two carry housed in the storage tray if any (S5). ステップS5において1個並びのものが検出されなければそれまでに取り上げた1個のみを収納トレイに運ぶ。 1 if sequence of what is detected in step S5 carries only one was taken up so far to the storage tray. 又ステップS4において1個並びのものが無くなった時は、その同一試験結果に対する収納は終わりとなる。 Also when those one list is exhausted in step S4, the end is accommodated for the same test results.

【0012】上述においては、運ぶヘッドとして4個同時に取り上げることができるものを使用したが、その同時に取り上げる個数は4に限らない。 [0012] In the above description, it was used which can be taken up to four at the same time as a head carrying, number of picking the same time is not limited to four. 又その配列方向が一致しているヘッドとして試験トレイ上のX方向の配列の複数の素子と同一状態のものを取り上げたが、Y方向のもの或いはXYの方向に並んだものを同時に、例えば2×2の4個のIC素子を同時に取り上げるヘッドでも良い。 Also took up those plurality of identities and the element in the X-direction of the sequence on the test tray as head arrangement direction thereof is coincident, at the same time those arranged in one or XY direction along the Y-direction, for example 2 × may simultaneously pick head four IC devices 2.

【0013】 [0013]

【発明の効果】以上述べたように、この発明によれば複数の試験済IC素子を同時に取り上げることができるものから運び、そのため従来においては試験済ICの取り上げは1個ずつ行っていた場合と比べて、その取り上げに要する時間がすこぶる短くなる。 As described above, according to the present invention carries from those that can be taken up a plurality of the test IC devices simultaneously according to the present invention, a case for which carried out one by one takes up the test IC in the conventional compared to the time required for the pick it is exceedingly short. 4個並びの同一試験結果の素子の検出などは、ソフトウエアー上で行うために著しく迅速に行うことができ、つまりIC素子をヘッドに取り上げる時間と比べれば著しく短い。 Such as four row detection of elements of the same test results, it can be performed significantly faster in order to carry on softwares, i.e. significantly shorter in comparison with the time to take up an IC element on the head. このため従来の方法と比較して分類、収納速度を短時間で行うことができる。 Therefore classification in comparison with the conventional method, it is possible to perform a receiving rate in a short time.

【図面の簡単な説明】 BRIEF DESCRIPTION OF THE DRAWINGS

【図1】この発明の実施例を示す流れ図。 Figure 1 is a flow diagram illustrating an embodiment of the present invention.

【図2】他の実施例を示す流れ図。 Figure 2 is a flow diagram illustrating another embodiment of the present invention.

【図3】更に他の例を示す流れ図。 Figure 3 is a flow diagram showing still another example.

【図4】試験済IC素子の分類、分配の様子と従来の分類、分配を説明する図。 [4] Classification of test IC devices, the distribution of a state of the conventional classification diagram illustrating the distribution.

Claims (1)

    (57)【特許請求の範囲】 (57) [the claims]
  1. 【請求項1】 試験トレイ上にマトリックス状に配列された試験済IC素子を、 収納トレイに同時に収納するこ 1. A post-test IC elements arranged in a matrix on the test tray, at the same time accommodating the child in the storage tray
    とができる最大の数nに到達できるまで、同時に複数個 Until it reached the maximum number n which bets can, plural simultaneously
    又は1個ずつヘッドで取上げ、取上げられたIC素子 Or one by one picked up by the head, taken up was IC element
    を、同一試験結果別に収納トレイに分類、収納する方法において、 上記nに近い最大の数の連続して配列された同一試験結 The same test results classified by the storage tray, in the method for storing the maximum number of consecutively arrayed same test formation close to the n
    果のIC素子を、優先して上記ヘッドで取り上げることを特徴とする試験済IC素子分類方法。 The IC device of fruit, preferentially test IC device classification wherein the covered in the head.
JP29496792A 1992-11-04 1992-11-04 Tested ic element classification method Expired - Fee Related JP3014015B2 (en)

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DE19680913T1 (en) * 1995-09-04 1997-12-11 Advantest Corp Semiconductor device transport and handling device

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